CN109612825A - A kind of new material quality testing testing machine - Google Patents
A kind of new material quality testing testing machine Download PDFInfo
- Publication number
- CN109612825A CN109612825A CN201910000294.0A CN201910000294A CN109612825A CN 109612825 A CN109612825 A CN 109612825A CN 201910000294 A CN201910000294 A CN 201910000294A CN 109612825 A CN109612825 A CN 109612825A
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- CN
- China
- Prior art keywords
- new material
- telescopic rod
- chip microcontroller
- electric telescopic
- rack
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/04—Chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/20—Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0014—Type of force applied
- G01N2203/0016—Tensile or compressive
- G01N2203/0017—Tensile
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0014—Type of force applied
- G01N2203/0023—Bending
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/04—Chucks, fixtures, jaws, holders or anvils
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The invention discloses a kind of new material quality testing testing machines, including rack, open source single-chip microcontroller is installed at the top of the rack, the inside top of rack is equipped with CT scanner, bending mechanism is symmetrically installed at left and right sides of the rack, the side of bending mechanism is equipped with drawing mechanism, the end of the drawing mechanism is symmetrical above and below to be equipped with clamping device, the output end of the input terminal electrical connection external power supply of the open source single-chip microcontroller, the input terminal of the output end electrical connection CT scanner of open source single-chip microcontroller, this new material quality testing testing machine, new material is clamped by clamping device, its clamping is firm, it can be avoided new material during the test to fall off, it ensure that the safety in utilization of the new material quality testing testing machine, bending experiment is carried out to new material by bending mechanism, new material is drawn by drawing mechanism Test is stretched, pilot project multiplicity, ability to work is strong, convenient for sufficiently detecting the quality of new material.
Description
Technical field
The present invention relates to testing machine technical field, specially a kind of new material quality testing testing machine.
Background technique
In the prior art: the patent of authorization 207300733 U of publication No. CN discloses a kind of new material quality testing test
Machine, structure include pedestal, power switch, horizontal fixed station, column, sliding rail, slide bar, induction feeler, control panel, analysis dress
It sets, is equipped with analyzer, is connect by data connection head with control panel, then acquired device collecting data information, through locating
Reason device is effectively treated data information, then filters junk information through filter, in then cooperation analysis chip to data
Information is analyzed, is concluded, is integrated, and is being shown on the control panel later, quickly can carried out data point to detection data
Analysis, to obtain accurate and reliable analysis as a result, it tests menu one, ability to work is poor, is not easy to sufficiently detect new material
Quality, it is impossible to meet use demands.
Summary of the invention
The technical problem to be solved by the present invention is to overcome the existing defects, provides a kind of new material quality testing testing machine,
Pilot project multiplicity, ability to work is strong, and convenient for sufficiently detecting the quality of new material, safety is good, can effectively solve background skill
The problems in art.
To achieve the above object, the invention provides the following technical scheme: a kind of new material quality testing testing machine, including machine
Frame is equipped with open source single-chip microcontroller at the top of the rack, and the inside top of rack is equipped with CT scanner, the left and right of the rack
Two sides are symmetrically installed with bending mechanism, and the side of bending mechanism is equipped with drawing mechanism, right above and below the end of the drawing mechanism
Title is equipped with clamping device, the output end of the input terminal electrical connection external power supply of the open source single-chip microcontroller, single-chip microcontroller of increasing income it is defeated
The input terminal of outlet electrical connection CT scanner.
As a preferred technical solution of the present invention, the bending mechanism includes arc-shaped guide rail, and arc-shaped guide rail is welded on
On the arcwall face of rack, the arc-shaped guide rail is connected with linear motor, the output end of the open source single-chip microcontroller by sliding block
It is electrically connected the input terminal of linear motor.
As a preferred technical solution of the present invention, the drawing mechanism includes the first electric telescopic rod, and first is electronic
Telescopic rod is mounted on the side of linear motor, and the telescopic end of first electric telescopic rod is fixed with fixed frame, fixed frame and
The junction of one electric telescopic rod is installed by force sensor, the input of the output end electrical connection open source single-chip microcontroller of the force snesor
End, the output end for single-chip microcontroller of increasing income are electrically connected the input terminal of the first electric telescopic rod.
As a preferred technical solution of the present invention, the clamping device includes the second electric telescopic rod, and second is electronic
Telescopic rod is mounted on the end of fixed frame, and the telescopic end of second electric telescopic rod is fixed with fixture, the open source single-chip microcontroller
Output end be electrically connected the second electric telescopic rod input terminal.
As a preferred technical solution of the present invention, the fixture includes rubber base, and it is electronic that rubber base is fixed on second
The telescopic end of telescopic rod is fixed with bolt on the rubber base.
Compared with prior art, the beneficial effects of the present invention are: this new material quality testing testing machine, passes through clamping device
New material is clamped, it is firm to clamp, and can be avoided new material during the test and falls off, ensure that the new material quality
The safety in utilization for detecting testing machine carries out bending experiment to new material by bending mechanism, by drawing mechanism to new material
Tension test is carried out, pilot project multiplicity, ability to work is strong, convenient for sufficiently detecting the quality of new material.
Detailed description of the invention
Fig. 1 is schematic structural view of the invention；
Fig. 2 is bottom substance schematic diagram of the present invention.
In figure: 1 rack, 2 open source single-chip microcontrollers, 3 arc-shaped guide rails, 4 linear motors, 5 bolts, 6 rubber bases, 7 clamping devices, 8
Second electric telescopic rod, 9 fixtures, 10 first electric telescopic rods, 11 force snesors, 12 fixed frames, 13 bending mechanisms, 14 stretching-machines
Structure, 15 CT scanners.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
The present invention provides a kind of technical solution referring to FIG. 1-2: a kind of new material quality testing testing machine, including rack
1, the top of rack 1 is equipped with open source single-chip microcontroller 2, and the inside top of rack 1 is equipped with CT scanner 15, the left and right two of rack 1
Side is symmetrically installed with bending mechanism 13, and the side of bending mechanism 13 is equipped with drawing mechanism 14, above and below the end of drawing mechanism 14
It is symmetrically installed with clamping device 7, the output end of the input terminal electrical connection external power supply of open source single-chip microcontroller 2, the defeated of single-chip microcontroller 2 of increasing income
Outlet is electrically connected the input terminal of CT scanner 15, controls CT scanner 15 to new material in experimentation by open source single-chip microcontroller 2
In interior change be monitored, the information of monitoring pass to open source single-chip microcontroller 2, open source single-chip microcontroller 2 information is carried out at analysis
It manages and shows, intuitive is good, is sufficiently recognized convenient for quality of the related personnel to material.
Bending mechanism 13 includes arc-shaped guide rail 3, and arc-shaped guide rail 3 is welded on the arcwall face of rack 1, and arc-shaped guide rail 3 passes through
Sliding block is connected with linear motor 4, and the input terminal of the output end electrical connection linear motor 4 of open source single-chip microcontroller 2 is single by open source
Piece machine 2 controls linear motor 4 and works, and linear motor 4 is moved on arc-shaped guide rail 3 by sliding block, and linear motor 4 passes through stretching-machine
Structure 14 drives clamping device 7 to carry out bending experiment to new material.
Drawing mechanism 14 includes the first electric telescopic rod 10, and the first electric telescopic rod 10 is mounted on the side of linear motor 4,
The telescopic end of first electric telescopic rod 10 is fixed with fixed frame 12, the junction installation of fixed frame 12 and the first electric telescopic rod 10
Force sensor 11, the input terminal of the output end electrical connection open source single-chip microcontroller 2 of force snesor 11, the output end for single-chip microcontroller 2 of increasing income
It is electrically connected the input terminal of the first electric telescopic rod 10, after the completion of clamping, the first electric telescopic rod 10 is controlled by open source single-chip microcontroller 2
Work, the telescopic end of the first electric telescopic rod 10 drive clamping device 7 to be shunk by fixed frame 12, thus to new material into
Row tension test, force snesor 11 are monitored the power between fixed frame 12 and the first electric telescopic rod 10, the information of monitoring
Open source single-chip microcontroller 2 is passed to, open source single-chip microcontroller 2 is analyzed and processed and shows to information.
Bending experiment is carried out to new material by bending mechanism 13, stretching examination is carried out to new material by drawing mechanism 14
It tests, pilot project multiplicity, ability to work is strong, convenient for sufficiently detecting the quality of new material.
Clamping device 7 includes the second electric telescopic rod 8, and the second electric telescopic rod 8 is mounted on the end of fixed frame 12, and second
The telescopic end of electric telescopic rod 8 is fixed with fixture 9, and the output end of open source single-chip microcontroller 2 is electrically connected the input of the second electric telescopic rod 8
End.
Fixture 9 includes rubber base 6, and rubber base 6 is fixed on the telescopic end of the second electric telescopic rod 8, is fixed on rubber base 6
Bolt 5.
When being clamped, jack is first opened up on new material, and the second electric telescopic rod 8 is controlled by open source single-chip microcontroller 2
The telescopic end of work, the second electric telescopic rod 8 drives bolt 5 to be inserted into jack by rubber base 6, mutual by two groups of rubber bases 6
Close to clamp to new material, it is firm to clamp, and can be avoided new material during the test and falls off, and ensure that this is new
The safety in utilization of quality of materials detection testing machine.
Single-chip microcontroller 2 of increasing income controls CT scanner 15, linear motor 4, the first electric telescopic rod 10 and the second electric telescopic rod 8
It is method commonly used in the prior art, open source single-chip microcontroller 2 is MSP430 series monolithic.
When in use: when being clamped, first opening up jack on new material, pass through open source single-chip microcontroller 2 the second electricity of control
Dynamic telescopic rod 8 works, and the telescopic end of the second electric telescopic rod 8 drives bolt 5 to be inserted into jack by rubber base 6, passes through two groups of rubbers
Rubber base 6 is close to each other to clamp to new material.
After the completion of clamping, the work of the first electric telescopic rod 10 is controlled by open source single-chip microcontroller 2, the first electric telescopic rod 10
Telescopic end drives clamping device 7 to be shunk by fixed frame 12, to carry out tension test to new material, force snesor 11 is right
Power between fixed frame 12 and the first electric telescopic rod 10 is monitored, and the information of monitoring passes to open source single-chip microcontroller 2, and open source is single
Piece machine 2 is analyzed and processed and shows to information.
Linear motor 4 being controlled by open source single-chip microcontroller 2 to work, linear motor 4 is moved on arc-shaped guide rail 3 by sliding block,
Linear motor 4 drives clamping device 7 to carry out bending experiment to new material by drawing mechanism 14.
CT scanner 15 is controlled by open source single-chip microcontroller 2 to be monitored the interior change of new material during the experiment,
The information of monitoring passes to open source single-chip microcontroller 2, and open source single-chip microcontroller 2 is analyzed and processed and shows to information.
The present invention clamps new material by clamping device 7, and it is firm to clamp, and can be avoided new during the test
Material falls back ensure that the safety in utilization of the new material quality testing testing machine, be carried out by bending mechanism 13 to new material
Bending experiment carries out tension test to new material by drawing mechanism 14, and pilot project multiplicity, ability to work is strong, convenient for filling
The quality of sorting survey new material.
It although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, can be with
A variety of variations, modification, replacement can be carried out to these embodiments without departing from the principles and spirit of the present invention by understanding
And modification, the scope of the present invention is defined by the appended.
Claims (5)
1. a kind of new material quality testing testing machine, including rack (1), it is characterised in that: be equipped at the top of the rack (1)
It increases income single-chip microcontroller (2), the inside top of rack (1) is equipped with CT scanner (15), and the left and right sides of the rack (1) is symmetrically pacified
Equipped with bending mechanism (13), the side of bending mechanism (13) is equipped with drawing mechanism (14), the end of the drawing mechanism (14)
Symmetrical above and below to be equipped with clamping device (7), the output end of the input terminal electrical connection external power supply of open source single-chip microcontroller (2) is opened
The input terminal of output end electrical connection CT scanner (15) of source single-chip microcontroller (2).
2. a kind of new material quality testing testing machine according to claim 1, it is characterised in that: the bending mechanism (13)
Including arc-shaped guide rail (3), arc-shaped guide rail (3) is welded on the arcwall face of rack (1), and the arc-shaped guide rail (3) is living by sliding block
It is dynamic to be connected with linear motor (4), the input terminal of output end electrical connection linear motor (4) of open source single-chip microcontroller (2).
3. a kind of new material quality testing testing machine according to claim 1, it is characterised in that: the drawing mechanism (14)
Including the first electric telescopic rod (10), the first electric telescopic rod (10) is mounted on the side of linear motor (4), and described first is electronic
The telescopic end of telescopic rod (10) is fixed with fixed frame (12), and the junction of fixed frame (12) and the first electric telescopic rod (10) is installed
Force sensor (11), the input terminal of output end electrical connection open source single-chip microcontroller (2) of the force snesor (11), single-chip microcontroller of increasing income
(2) input terminal of output end electrical connection the first electric telescopic rod (10).
4. a kind of new material quality testing testing machine according to claim 1, it is characterised in that: the clamping device (7)
Including the second electric telescopic rod (8), the second electric telescopic rod (8) is mounted on the end of fixed frame (12), and described second electronic stretches
The telescopic end of contracting bar (8) is fixed with fixture (9), and the output end of open source single-chip microcontroller (2) is electrically connected the second electric telescopic rod (8)
Input terminal.
5. a kind of new material quality testing testing machine according to claim 4, it is characterised in that: the fixture (9) includes
Rubber base (6), rubber base (6) are fixed on the telescopic end of the second electric telescopic rod (8), are fixed with bolt on the rubber base (6)
(5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910000294.0A CN109612825A (en) | 2019-01-02 | 2019-01-02 | A kind of new material quality testing testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910000294.0A CN109612825A (en) | 2019-01-02 | 2019-01-02 | A kind of new material quality testing testing machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109612825A true CN109612825A (en) | 2019-04-12 |
Family
ID=66015564
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910000294.0A Withdrawn CN109612825A (en) | 2019-01-02 | 2019-01-02 | A kind of new material quality testing testing machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109612825A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110672360A (en) * | 2019-10-15 | 2020-01-10 | 珠海高凌信息科技股份有限公司 | Soil detection device |
| CN110806347A (en) * | 2019-11-27 | 2020-02-18 | 东台市华源复合材料有限公司 | Mechanical detection device for filter material |
| CN111256759A (en) * | 2020-02-28 | 2020-06-09 | 珠海格力电器股份有限公司 | Detection device |
-
2019
- 2019-01-02 CN CN201910000294.0A patent/CN109612825A/en not_active Withdrawn
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110672360A (en) * | 2019-10-15 | 2020-01-10 | 珠海高凌信息科技股份有限公司 | Soil detection device |
| CN110806347A (en) * | 2019-11-27 | 2020-02-18 | 东台市华源复合材料有限公司 | Mechanical detection device for filter material |
| CN111256759A (en) * | 2020-02-28 | 2020-06-09 | 珠海格力电器股份有限公司 | Detection device |
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| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20190412 |
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| WW01 | Invention patent application withdrawn after publication |