CN109597443A - A kind of quick temperature-controlling system for electron device testing and calibration - Google Patents
A kind of quick temperature-controlling system for electron device testing and calibration Download PDFInfo
- Publication number
- CN109597443A CN109597443A CN201811485269.8A CN201811485269A CN109597443A CN 109597443 A CN109597443 A CN 109597443A CN 201811485269 A CN201811485269 A CN 201811485269A CN 109597443 A CN109597443 A CN 109597443A
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- CN
- China
- Prior art keywords
- temperature
- pressurized tank
- calibration
- electron device
- air outlet
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
Abstract
The present invention relates to a kind of quick temperature-controlling systems for electron device testing and calibration.The method of the invention includes: the exits and entrances valve by adjusting pressurized tank and insulation construction, change the flow velocity and temperature of disengaging gas, rapidly a constant target environment temperature is provided for the electronic device inside pressurized tank, the efficiency of electron device testing and calibration is improved significantly, and there is high reliablity and the simple advantage of structure.The present invention is widely used in automobile, household electrical appliances, field of industrial manufacturing.
Description
Technical field
The present invention relates to micro electro mechanical system fields, and in particular to a kind of quick temperature control for electron device testing and calibration
System.
Background technique
The advantages that electronic device has size small, at low cost, low in energy consumption, is widely used in industry, aerospace, military affairs etc.
Field.Since electronic device is easy to be influenced by environment temperature and pressure, temperature drift and null offset, sensitivity can be generated
Etc. static parameters can also change, occur nonlinear object.Therefore the test and calibration of electronic device are needed in isoperibol
Lower progress.It currently provides stable isoperibol needs by means such as incubators for electronic device to take hours, time cost
It is high, it is therefore necessary to a kind of quick temperature-controlling system be provided, the efficiency of electron device testing and calibration is improved.
Summary of the invention
For above existing problem and demand, the present invention proposes a kind of quick control for electron device testing and calibration
Warm system, simple process, structure is simple, high-efficient, high reliablity.
The technical solution adopted by the present invention to solve the technical problems is: a kind of for the fast of electron device testing and calibration
Fast temperature-controlling system, includes the following steps:
To be tested and calibration electronic device is placed in pressurized tank by step S1, and pressurized tank is placed in insulation construction.
First temperature sensor is placed on inside pressurized tank by step S2, and second temperature sensor is placed on pressurized tank
Outer wall.
Step S3, opens simultaneously the first intake valve and the first air outlet valve of pressurized tank, the second intake valve of insulation construction and
Second air outlet valve enters the gas with certain temperature in pressurized tank and insulation construction.
Step S4 closes the first intake valve and first of pressurized tank when the temperature in pressurized tank reaches target temperature value T
Air outlet valve continues the second intake valve and the second air outlet valve that adjust insulation construction, temperature is remained target value T.
Further, the specific implementation of the step S1 are as follows:
Pressurized tank and insulation construction are water-tight equipment, do not allow to open in control process, and respectively contain 1 air inlet
With 1 gas outlet.
Further, the specific implementation of the step S2 are as follows:
First temperature sensor is placed on the position in pressurized tank close to electronic device, measurement temperature is made to be more nearly electricity
The temperature of sub- device.
Further, the specific implementation of the step S2 are as follows:
First temperature sensor is connected with the socket on pressure top tank structure, the air-tightness plug on socket by conducting wire with
Test equipment connection outside insulation construction, obtains pressurized tank inner wall temperature.Second temperature sensor directly passes through conducting wire and outer
The connection of portion's test equipment, obtains the temperature of pressure tank wall.
Further, the specific implementation of the step S3 are as follows:
First air intake valve and the second air intake valve possess same gas source, and are respectively positioned on outside insulation construction, in order to reduce
Heat dissipation, the aerial valve pipe of exposure is wrapped up with thermal insulation material.
Further, the specific implementation of the step S3 are as follows:
The first intake valve, the first air outlet valve, the second intake valve and the second air outlet valve are opened simultaneously, the gas of certain temperature is inputted
Original gas in pressurized tank and insulation construction is all discharged body.
Further, the specific implementation of the step S3 are as follows:
The inside and outside temperature of the pressurized tank measured according to test equipment, adjusts the aperture and air inlet temperature of each valve
Degree, the inner and outer temperatures for rapidly controlling pressurized tank reach target value T.
Further, the specific implementation of the step S4 are as follows:
When the inner and outer temperatures of pressurized tank reach T value, the first intake valve and the first air outlet valve are closed, is opened always
Second intake valve and the second air outlet valve, and aperture and air inlet temperature by adjusting the second intake valve (31) and the second air outlet valve (32)
Degree, so that the internal temperature of pressurized tank remains in the error range of T value.
The invention has the advantages that a kind of quick temperature control system for electron device testing and calibration provided by the invention
System changes the flow velocity and temperature of disengaging gas, is rapidly pressure by adjusting the exits and entrances valve of pressurized tank and insulation construction
Electronic device in power tank provides a stable target environment temperature, improves the effect of electron device testing and calibration significantly
Rate, and there is high reliablity and the simple advantage of structure.The present invention is widely used in automobile, household electrical appliances, field of industrial manufacturing.
Detailed description of the invention
Present invention will be further explained below with reference to the attached drawings and examples.
Fig. 1 is a kind of flow chart for electron device testing and the quick temperature-controlling system of calibration of the invention；
Fig. 2 is a kind of structure chart for electron device testing and the quick temperature-controlling system of calibration of the invention；
Fig. 3 is a kind of one embodiment medium temperature for electron device testing and the quick temperature-controlling system of calibration of the invention
Degree control comparison diagram；
1. electronic device in figure, 2. pressurized tanks, 21. first temperature sensors, 22. second temperature sensors, 23. first into
Air valve, 24. first air outlet valves, 25. air-tightness plugs, 3. insulation constructions, 31. second intake valves, 32. second air outlet valves, 4. survey
Test instrument.
Specific embodiment
In conjunction with following drawings, the invention is further illustrated by the examples.
Fig. 1 is a kind of flow chart for electron device testing and the quick temperature-controlling system of calibration of the invention, and Fig. 2 is this
A kind of structure chart for electron device testing and the quick temperature-controlling system of calibration of invention, it is of the invention combined with Figure 1 and Figure 2,
Specific embodiment are as follows: to be tested and calibration electronic device (1) is placed in pressurized tank (2), pressurized tank (2) is placed in guarantor
In warm structure (3).First temperature sensor (21) is placed on the internal position close to electronic device (1) of pressurized tank (2), the
Two temperature sensors (22) are placed on the outer wall of pressurized tank (2).Open simultaneously the first intake valve (23) and of pressurized tank (2)
One air outlet valve (24), the second intake valve (31) and the second air outlet valve (32) of insulation construction (3), makes the gas with certain temperature
Into in pressurized tank and insulation construction.The aperture and intake air temperature for adjusting each valve, when the temperature in pressurized tank (2) reaches
When target temperature value T, the first intake valve (23) and the first air outlet valve (24) are closed, continues to adjust the second intake valve (31) and second
The aperture and intake air temperature of air outlet valve (32), are maintained at the internal temperature of pressurized tank in the error range of target value.
At 25 DEG C of room temperature, two identical electronic devices are respectively placed in incubator and quick temperature control system of the invention
In system, target temperature value is 50 DEG C, after setting completed for incubator, and quickly each valve of temperature-controlling system is opened,
Start timing.Wherein, in quick temperature-controlling system, pressurized tank internal temperature can be examined by the test equipment being located at outside insulation construction
It surveys and obtains.It is corresponding to add when the detection temperature of the internal temperature of incubator and the first temperature sensor reaches 50 DEG C of target temperature
Hot systems stop timing, and finally obtained data are as shown in Figure 3.As can be known from Fig. 3, for identical electronic device, incubator and
The environment temperature of electronic device is heated to 50 DEG C of target temperature from 25 DEG C of room temperature respectively by quick temperature-controlling system of the invention, still
The time that incubator is spent is 15 times of fast temperature control system, it follows that one kind of the invention is used for electron device testing and mark
Fixed quick temperature-controlling system can promptly change the environment temperature of electronic device, when significantly shortening the test and calibration of device
Between, efficiency is improved,
It is finally noted that the purpose for publicizing and implementing mode is to help to further understand the present invention, but ability
The technical staff in domain is understood that without departing from the spirit and scope of the invention and the appended claims, various replacements and
What modification was all possible to.Therefore, the present invention should not be limited to embodiment disclosure of that, the scope of protection of present invention
Subject to the scope defined in the claims.
Claims (8)
1. a kind of quick temperature-controlling system for electron device testing and calibration, which comprises the steps of:
To be tested and calibration electronic device (1) is placed in pressurized tank (2) by step S1, and pressurized tank (2) is placed in heat preservation knot
In structure (3).
First temperature sensor (21) is placed on pressurized tank (2) inside by step S2, and second temperature sensor (22) is placed on pressure
On the outer wall of power tank (2).
Step S3, opens simultaneously the first intake valve (23) and the first air outlet valve (24) of pressurized tank (2), and the of insulation construction (3)
Two intake valves (31) and the second air outlet valve (32), enter the gas with certain temperature in pressurized tank and insulation construction.
Step S4, when the temperature in pressurized tank (2) reaches target temperature value T, close pressurized tank the first intake valve (23) and
First air outlet valve (24) continues the second intake valve (31) and the second air outlet valve (32) that adjust insulation construction (3), temperature is kept
For target value T.
2. a kind of quick temperature-controlling system for electron device testing and calibration as described in claim 1, which is characterized in that institute
State the specific implementation of step S1 are as follows:
Pressurized tank (2) and insulation construction (3) are water-tight equipment, do not allow to open in operating process, and respectively contain 1 air inlet
Mouth and 1 gas outlet.
3. a kind of quick temperature-controlling system for electron device testing and calibration as described in claim 1, which is characterized in that institute
State the specific implementation of step S2 are as follows:
First temperature sensor (21) is placed on the position in pressurized tank (2) close to electronic device (1), makes to measure temperature more
Close to the temperature of electronic device (1).
4. a kind of quick temperature-controlling system for electron device testing and calibration as described in claim 1, which is characterized in that institute
State the specific implementation of step S2 are as follows:
First temperature sensor (21) is connected with the socket on pressurized tank (2) inner wall, the air-tightness plug (25) on socket is logical
It crosses the conducting wire test equipment (4) external with insulation construction (3) to connect, obtains pressurized tank (2) inner wall temperature.Second temperature sensor
(22) it is directly connect by conducting wire with external testing instrument (4), obtains the temperature of pressurized tank (2) outer wall.
5. a kind of quick temperature-controlling system for electron device testing and calibration as described in claim 1, which is characterized in that institute
State the specific implementation of step S3 are as follows:
First air intake valve (23) and the second air intake valve (31) possess same gas source, and are respectively positioned on insulation construction (3) outside, are
Heat dissipation is reduced, the aerial valve pipe of exposure wrapped up with thermal insulation material.
6. a kind of quick temperature-controlling system for electron device testing and calibration as described in claim 1, which is characterized in that institute
State the specific implementation of step S3 are as follows:
The first intake valve (23), the first air outlet valve (24), the second intake valve (31) and the second air outlet valve (32) are opened simultaneously, is inputted
Original gas in pressurized tank (2) and insulation construction (3) is all discharged the gas of certain temperature.
7. a kind of quick temperature-controlling system for electron device testing and calibration as described in claim 1, which is characterized in that institute
State the specific implementation of step S3 are as follows:
The inside and outside temperature of the pressurized tank (2) measured according to test equipment (4), adjusts the aperture and air inlet temperature of each valve
Degree, the inner and outer temperatures for rapidly controlling pressurized tank (2) reach target value T.
8. a kind of quick temperature-controlling system for electron device testing and calibration as described in claim 1, which is characterized in that institute
State the specific implementation of step S4 are as follows:
When the inner and outer temperatures of pressurized tank (2) reach T value, the first intake valve (23) and the first air outlet valve (24) are closed, is begun
The second intake valve (31) and the second air outlet valve (32) are opened eventually, and by adjusting the second intake valve (31) and the second air outlet valve (32)
Aperture and intake air temperature so that the internal temperature of pressurized tank (1) remains in the error range of T value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811485269.8A CN109597443A (en) | 2018-12-06 | 2018-12-06 | A kind of quick temperature-controlling system for electron device testing and calibration |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811485269.8A CN109597443A (en) | 2018-12-06 | 2018-12-06 | A kind of quick temperature-controlling system for electron device testing and calibration |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109597443A true CN109597443A (en) | 2019-04-09 |
Family
ID=65962058
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811485269.8A Pending CN109597443A (en) | 2018-12-06 | 2018-12-06 | A kind of quick temperature-controlling system for electron device testing and calibration |
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| CN (1) | CN109597443A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113784591A (en) * | 2021-09-07 | 2021-12-10 | 横店集团东磁股份有限公司 | Temperature control adjusting system and temperature control adjusting method for IV (IV) tester |
-
2018
- 2018-12-06 CN CN201811485269.8A patent/CN109597443A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113784591A (en) * | 2021-09-07 | 2021-12-10 | 横店集团东磁股份有限公司 | Temperature control adjusting system and temperature control adjusting method for IV (IV) tester |
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