CN109597007B - Semi-open type device, measuring system and measuring method for detecting magnetic performance of non-oriented silicon steel - Google Patents
Semi-open type device, measuring system and measuring method for detecting magnetic performance of non-oriented silicon steel Download PDFInfo
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Abstract
The invention discloses a semi-open type device for detecting the magnetic performance of non-oriented silicon steel, which comprises a magnetic yoke, two groups of magnetization induction coils and an RCP coil lined between the two groups of magnetization induction coils, wherein the two groups of magnetization induction coils and the RCP coil are both arranged in the space surrounded by the magnetic yoke, one end of the RCP coil is abutted against the end part of one group of magnetization induction coils, the other end of the RCP coil is abutted against the end part of the other group of magnetization induction coils, and the RCP coil is additionally arranged in the middle of an open magnetic field to finish direct method measurement of the magnetic field intensity of an open part, so that the magnetic field condition closer to the actual working condition is obtained; the measuring system and the measuring method are different from the traditional square ring method and the traditional single-sheet method, mainly aim at the real working condition of the non-oriented silicon steel for the rotating motor, can better represent the real magnetic performance of the non-oriented silicon steel for the rotating motor, and can select to test single sheets or laminated sheets according to the actual condition.
Description
Technical Field
The invention belongs to the technical field of non-oriented silicon steel magnetic performance detection for rotating motors, and particularly relates to a semi-open type device, a measuring system and a measuring method for non-oriented silicon steel magnetic performance detection.
Background
It has been consistently assumed that all important magnetic material parameters (power loss, permeability, hysteresis, etc.) depend on the magnetic polarization strength J and the magnetic field strength H. The most fundamental problem is therefore how to measure these two quantities, and there are two schools of priority for the field strength determination: indirect measurement and direct measurement. In the indirect measurement method, the magnetic field strength depends on the primary winding n according to ampere's law1Excitation current I of1. I.e. Hm＝I1n1L is calculated as follows. The national standards GB/T3655 and GB/T13789 which are adopted by people at present are indirect methods, the indirect measurement method has the advantages that the measured signal is relatively large, interference is avoided, the current and the magnetic field intensity are correspondingly proportional, and the main defect that the length l of a magnetic circuit cannot be accurately knownm. The average length of the magnetic circuit can be determined only in the annular sample with the recommended size; in this case, however, the material is not uniformly magnetized and a different value of magnetic induction (and magnetic field strength) is found close to the inner diameter, not the outer diameter. In direct measurement, the magnetic field strength is measured as a tangential field component in the vicinity of the magnetized body. The magnetic field to be measured and the interior of the sample to be measured can be considered to be the same by incorporating the sensor in close proximity to the magnetized surface according to maxwell's equations.
The non-oriented silicon steel adopts national standard GB/T3655 to detect and deliver the magnetic property of products, as shown in figures 1 and 2, the detection mode of the magnetic property of the existing non-oriented silicon steel adopts an Epstein method, samples of the non-oriented silicon steel are square circles of half of horizontal and vertical directions, and a magnetic circuit of the method depends on a closed loop formed by the samples. The practical application environment of the non-oriented silicon steel is shown in fig. 3 and 4, in the working process of an actual rotating motor, the part actually magnetized is the motor tooth part 1, the main magnetic circuit of the rotating motor is closed through the motor yoke 2, but the position actually needing the non-oriented silicon steel to function is only the part between a pair of tooth parts of the motor, namely the position of a motor rotor, but not the motor yoke. Therefore, the magnetic circuit scheme of the square-coil method has a large difference from the actual magnetic circuit condition of the motor, that is, the actual use condition of the non-oriented silicon steel for the rotating electric machine is not consistent with the measurement condition of the existing standard square-coil method.
Therefore, the existing non-oriented silicon steel detection method has many problems, which are greatly different from the practical application conditions, and the differences cause problems in the use process of many users, for example, the conventional performance of silicon steel is not good, the performance of the finished motor is excellent, or the contrary is just the same.
Disclosure of Invention
The invention aims to overcome the technical defects and provide a semi-open type device, a measuring system and a measuring method for detecting the magnetic performance of non-oriented silicon steel, which can obtain the magnetic field condition closer to the actual working condition.
In order to achieve the above purpose, the semi-open type device for detecting the magnetic performance of non-oriented silicon steel comprises a magnetic yoke, two sets of magnetization induction coils and an RCP coil lined between the two sets of magnetization induction coils, wherein both the two sets of magnetization induction coils and the RCP coil are arranged inside the circumference of the magnetic yoke, one end of the RCP coil abuts against the end of one set of magnetization induction coils, and the other end of the RCP coil abuts against the end of the other set of magnetization induction coils.
Furthermore, each group of the magnetization induction coils sequentially comprises a magnetization coil and an induction coil from outside to inside, the magnetization coil of one group of the magnetization induction coils is connected with the magnetization coil of the other group of the magnetization induction coils in series, and the winding direction of the magnetization induction coils is the same, and the induction coil of one group of the magnetization induction coils is connected with the induction coil of the other group of the magnetization induction coils in series, and the winding direction of the induction coils is the same.
Further, the outer diameter of the RCP coil is not less than the inner diameter of the induction coil.
A measuring system of the semi-open type device comprises an arbitrary waveform generator, a power amplifier, the semi-open type device, an RCP coil analog integral amplifier, a secondary coil analog integral amplifier, a data acquisition board and a computer; the output end of the arbitrary waveform generator is connected with the input end of the power amplifier, one output end of the power amplifier is connected with the outer end part of the magnetizing coil of one group of magnetizing induction coils of the semi-open type device, and the other output end of the power amplifier is connected with the outer end part of the magnetizing coil of the other group of magnetizing induction coils of the semi-open type device; the outer end parts of induction coils of one group of magnetization induction coils of the semi-open type device are connected with one input end of the secondary coil analog integral amplifier, and the outer end parts of induction coils of the other group of magnetization induction coils of the semi-open type device are connected with the other input end of the secondary coil analog integral amplifier; the output end of the secondary coil analog integrating amplifier is connected with the data acquisition board, the output end of the data acquisition board is connected with the input end of the computer, and the output end of the computer is connected with the input end of the arbitrary waveform generator.
Furthermore, an output end of the power amplifier is connected with a standard resistor in series and then is connected with the outer end parts of the magnetizing coils of a group of magnetizing induction coils of the semi-open type device, and two ends of the standard resistor are connected with the data acquisition board.
The device further comprises an RCP coil analog integration amplifier, wherein one end of the RCP coil is connected with one input end of the RCP coil analog integration amplifier, and the other end of the RCP coil is connected with the other input end of the RCP coil analog integration amplifier.
A measuring method of the measuring system as described above,
the magnetic induction strength testing process comprises the following steps:
1) computer determining target magnetic field intensity HmStarting an arbitrary waveform generator according to a preset waveform;
2) the data acquisition board acquires the voltage U at two ends of the standard resistorsAnd calculating the instantaneous excitation current I1Size;
3) continuous increase of instantaneous excitation current I by power amplifier1And reading the voltage U across the RCP coilrAnd simulating the U pair by an RCP coil through an integrating amplifier 11rCarrying out integral amplification;
4) sending the digital signal obtained after the processing of the data acquisition board to a computer, and adopting a formula d (H)mlr)/dt＝Urlr/μ0nr(m/2ρls) Calculating to obtain the measured actual magnetic field intensity Hm0Then according to the actual magnetic field intensity Hm0With the target magnetic field strength HmTo increase or decrease the instantaneous field current I1Up to the actual magnetic field strength Hm0Reach the target magnetic field strength HmWithin 2%, the requirement is met;
5) the voltage U of the induction coil is converted into the voltage U by a secondary coil analog integral amplifier2Amplifying by formula Bm＝U2/4.44n2f(m/2ρls) Completing the magnetic field H to the targetmMagnetic induction BmMeasurement of a value;
the iron loss testing process comprises the following steps:
1) computer determining target iron loss JmStarting an arbitrary waveform generator according to the planned waveform;
2) the data acquisition board acquires the voltage U at two ends of the standard resistorsAnd calculating the instantaneous excitation current I1Size;
3) the voltage U of the induction coil is converted into the voltage U by a secondary coil analog integral amplifier2Amplifying, then, using formula Bm＝U2/4.44n2f(m/2ρls) Completing the magnetic induction B in the transient statemiMeasurement of values and according to formula Jm＝Bm-Hmμ0Iron loss J under the transient state of completion pairmiTesting of (2);
4) sending the digital signal obtained after the processing of the data acquisition board to a computer, and comparing the iron loss J in the instantaneous state in the step 3)miAnd target iron loss JmTo increase or decrease the instantaneous field current I1Until the actual iron loss Jm0Reach the target iron loss JmWithin 1%, the requirement is met and the actual iron loss J is recordedm0Reach the target iron loss JmTarget exciting current I within 1%0；
5) At target excitation current I0Reading the voltage U of the induction coil in the target state20According to the formula Ps＝I1U2The/m completes the measurement of the specific total loss of the measurement sample;
in the formula: in the formula: mu.s0Is the vacuum permeability, nrNumber of turns of RCP coil, n2The number of turns of an induction coil of a semi-open device, m the mass of a test specimen, f the frequency, ρ the material-specific value of the test specimen, lsFor testing the length, l, of the specimenrLength of RCP coil, PsThe specific total loss of the test specimen is measured.
Compared with the prior art, the invention has the following beneficial effects: an RCP coil is added in the middle of the open-circuit magnetic field to complete direct method measurement of the magnetic field intensity of the open-circuit part, so that the magnetic field condition closer to the actual working condition is obtained; the semi-open type device, the measuring system and the measuring method are different from the traditional square ring method and the traditional single-chip method, mainly aim at the real working condition of the non-oriented silicon steel for the rotating motor, can better represent the real magnetic performance of the non-oriented silicon steel for the rotating motor, and can select to test single chips or laminated sheets according to the actual condition.
Drawings
FIG. 1 is a schematic diagram of a frame structure for measuring non-oriented magnetic properties by a square-circle method;
FIG. 2 is a schematic view of the magnetic circuit of FIG. 1;
FIG. 3 is a schematic diagram of an actual motor structure;
FIG. 4 is a schematic view of the magnetic circuit of FIG. 3;
FIG. 5 is a schematic structural view of a semi-open type apparatus for detecting the magnetic properties of non-oriented silicon steel according to the present invention;
FIG. 6 is a schematic view of the magnetic circuit of FIG. 5;
FIG. 7 is a flow chart of the semi-open type measurement system for detecting the magnetic properties of non-oriented silicon steel according to the present invention.
Wherein: the device comprises a motor tooth part 1, a motor magnetic yoke 2, a magnetic yoke 3, a magnetizing induction coil 4, an RCP coil 5, a magnetizing coil 6, an induction coil 7, a test sample 8, a computer 9, a data acquisition board 10, a secondary coil analog integral amplifier 11, an arbitrary waveform generator 12, a power amplifier 13, a standard resistor 14 and an RCP coil analog integral amplifier 15.
Detailed Description
The present invention will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings, specific examples and comparative examples, which are not intended to limit the invention.
As shown in fig. 5, the half-open device for detecting the magnetic performance of non-oriented silicon steel comprises a magnetic yoke 3, two sets of magnetization induction coils 4 and an RCP coil 5 (i.e., rogowski coil) lined between the two sets of magnetization induction coils 4, wherein both the two sets of magnetization induction coils 4 and the RCP coil 5 are arranged inside the enclosure surrounded by the magnetic yoke 3; each group of magnetization induction coils 4 sequentially comprises a magnetization coil 6 and an induction coil 7 from outside to inside, the magnetization coil 6 of one group of magnetization induction coils 4 is connected with the magnetization coil 6 of the other group of magnetization induction coils 4 in series, and the winding directions of the magnetization coils are the same, and the induction coil 7 of one group of magnetization induction coils 4 is connected with the induction coil 7 of the other group of magnetization induction coils 4 in series, and the winding directions of the induction coils are the same; one end of the RCP coil 5 abuts against the end of one set of the magnetization induction coils 4, the other end of the RCP coil 5 abuts against the end of the other set of the magnetization induction coils 4, and the outer diameter of the RCP coil 5 is not smaller than the inner diameter of the induction coil 7. A pair of test samples 8 are symmetrically inserted into the two sets of magnetization induction coils 4, that is, one end of one test sample 8 is inserted into one set of magnetization induction coils 4 until one end abuts against one end of the RCP coil 5, the other end is exposed at one end of the magnetic yoke 3, one end of the other test sample 8 is inserted into one set of magnetization induction coils 4 until one end abuts against the other end of the RCP coil 5, and the other end is exposed at the other end of the magnetic yoke 3.
As shown in fig. 6, which is a schematic view of a magnetic circuit of a half-open type device, the RCP coil is added in the middle of an open magnetic field to complete direct measurement of the magnetic field intensity of an open part, so as to obtain a magnetic field condition closer to an actual working condition.
Fig. 7 shows a semi-open type measuring system for detecting the magnetic property of non-oriented silicon steel, which comprises an arbitrary waveform generator 12, a power amplifier 13, a semi-open type device, an RCP coil analog integrating amplifier 15, a secondary coil analog integrating amplifier 11, a data acquisition board (DAQ) 10, a computer 9 and a standard resistor 14. The output end of the arbitrary waveform generator 12 is connected with the input end of a power amplifier 13, one output end of the power amplifier 13 is connected with the outer end part of a magnetizing coil 6 of one group of magnetizing induction coils 4 of the semi-open type device after being connected with a standard resistor 14 in series, the other output end of the power amplifier 13 is connected with the outer end part of a magnetizing coil 6 of the other group of magnetizing induction coils 4 of the semi-open type device, and the magnetizing coil 6 of one group of magnetizing induction coils 4 is connected with the residual port of the magnetizing coil 6 of the other group of magnetizing induction coils 4 in series; the outer end part of an induction coil 7 of one group of magnetization induction coils 4 of the semi-open type device is connected with one input end of a secondary coil analog integration amplifier 11, the outer end part of an induction coil 7 of the other group of magnetization induction coils 4 of the semi-open type device is connected with the other input end of the secondary coil analog integration amplifier 11, and the induction coil 7 of one group of magnetization induction coils 4 is connected with the rest port of the induction coil 7 of the other group of magnetization induction coils 4 in series; the output end of the secondary coil analog integral amplifier 11 is connected with a data acquisition board 10, the output end of the data acquisition board 10 is connected with the input end of a computer 9, and the output end of the computer 9 is connected with the input end of an arbitrary waveform generator 12; one end of the RCP coil 5 is connected with one input end of the RCP coil analog integral amplifier 15, and the other end of the RCP coil 5 is connected with the other input end of the RCP coil analog integral amplifier 15; both ends of the standard resistor 14 are connected to the data acquisition board 10.
The principle of the semi-open type measuring system is as follows: firstly, confirming a measurement target through a computer 9, and determining whether iron loss measurement or magnetic induction intensity measurement is carried out; then, the command is submitted to an arbitrary waveform generator 12, the waveform coefficient is smaller than 1% according to the sine waveform, and the design adjustment can be carried out if other special waveforms need to be adjusted; starting of the power amplifier 13 in a semi-open arrangementMagnetizing coil providing instantaneous exciting current I1，I1Is obtained by the formula I1＝Us/RsIs determined wherein Rs(can be adjusted according to actual design capability) as the resistance value and U of the standard resistorsObtained by reading the voltage across the standard resistor 14; finally, the computer 9 will calculate the instantaneous excitation current I1Is determined to increase or decrease the excitation current I in relation to a target value1Until reaching the target range.
The magnetic induction and the iron loss test are described in detail below.
The magnetic induction strength testing process comprises the following steps:
1) the computer 9 determines the target magnetic field strength HmAnd starting the arbitrary waveform generator 12 according to the preset waveform;
2) the data acquisition board acquires the voltage U at two ends of the standard resistor 14sAnd calculating the instantaneous excitation current I1Size;
3) increasing the instantaneous field current I continuously by means of the power amplifier 131And reading the voltage U across the RCP coil 5rAnd simulating the U pair by an RCP coil through an integrating amplifier 11rCarrying out integral amplification;
4) the digital signal obtained after processing by the data acquisition board 10 is sent to the computer 9 and the formula d (H) is adoptedmlr)/dt＝Urlr/μ0nr(m/2ρls) Calculating to obtain the measured actual magnetic field intensity Hm0Then according to the actual magnetic field intensity Hm0With the target magnetic field strength HmTo increase or decrease the instantaneous field current I1Up to the actual magnetic field strength Hm0Reach the target magnetic field strength HmWhen the content is within 2 percent, the requirement is considered to be met;
5) the voltage U of the induction coil is converted into a voltage U by a secondary coil analog integration amplifier 112Amplifying by formula Bm＝U2/4.44n2f(m/2ρls) Completing the magnetic field H to the targetmMagnetic induction BmMeasurement of a value;
in the formula: mu.s0Is the vacuum permeability, nrNumber of turns of RCP coil, n2The number of turns of an induction coil of a semi-open device, m the mass of a test specimen, f the frequency, ρ the material-specific value of the test specimen, lsFor testing the length, l, of the specimenrIs the length of the RCP coil.
The iron loss testing process comprises the following steps:
1) computer 9 determines target iron loss JmAnd starting the arbitrary waveform generator 12 according to the planned waveform;
2) the data acquisition board acquires the voltage U at two ends of the standard resistor 14sAnd calculating the instantaneous excitation current I1Size;
3) the voltage U of the induction coil is converted into a voltage U by a secondary coil analog integration amplifier 112Amplifying, then, using formula Bm＝U2/4.44n2f(m/2ρls) Completing the magnetic induction B in the transient statemiMeasurement of values and according to formula Jm＝Bm-Hmμ0Iron loss J under the transient state of completion pairmiTesting of (2);
4) sending the digital signal obtained after the processing of the data acquisition board 10 to the computer 9, comparing the iron loss J in the instantaneous state in the step 3)miAnd target iron loss JmTo increase or decrease the instantaneous field current I1Until the actual iron loss Jm0Reach the target iron loss JmWithin 1%, the requirement is considered to be met, and the actual iron loss J is recordedm0Reach the target iron loss JmTarget exciting current I within 1%0；
5) At target excitation current I0Reading the voltage U of the induction coil in the target state20According to the formula Ps＝I1U2And/m is used for measuring the specific total loss of the measurement sample.
In the formula: mu.s0Is the vacuum permeability, n2The number of turns of an induction coil of a semi-open device, m the mass of a test specimen, f the frequency, ρ the material-specific value of the test specimen, lsFor testing the test specimenLength of (B)mIs magnetic induction, HmIs a target magnetic field, PsThe specific total loss of the test specimen is measured.
The semi-open type device, the measuring system and the measuring method of the invention are further described by adopting a square circle method and the measuring method of the invention.
TABLE 1 comparison of the square circle method with the iron loss measurement results of a semi-open measurement system
TABLE 2 comparison of the magnetic induction intensity measurements of the square-turn method and the semi-open structure
As can be seen from the data in tables 1 and 2, the comparative test results of the square circles and the semi-open measuring system of the present invention show: the rule of the measurement result of the iron loss is consistent with that of the square ring, the error is mainly caused by a magnetic yoke, and the long-term problem of the result difference between the single-chip magnetic permeameter and the square ring is solved; measurement of magnetic induction due to HmThe redefinition of (2) not only obtains a more practical and accurate magnetic field result, therefore, the measurement result is generally lower than that of the square ring, but the real working condition is the result.
Claims (4)
1. A half open circuit formula device for non-oriented silicon steel magnetic property detects which characterized in that: the magnetic induction type magnetic resonance imaging device comprises a magnetic yoke (3), two groups of magnetization induction coils (4) and an RCP coil (5) lined between the two groups of magnetization induction coils (4), wherein the two groups of magnetization induction coils (4) and the RCP coil (5) are both arranged in the space surrounded by the magnetic yoke (3), one end of the RCP coil (5) abuts against the end part of one group of magnetization induction coils (4), and the other end of the RCP coil (5) abuts against the end part of the other group of magnetization induction coils (4);
each group of the magnetization induction coils (4) sequentially comprises a magnetization coil (6) and an induction coil (7) from outside to inside, the magnetization coil (6) of one group of the magnetization induction coils (4) is connected with the magnetization coil (6) of the other group of the magnetization induction coils (4) in series, the winding direction of the magnetization coil is the same, and the induction coil (7) of one group of the magnetization induction coils (4) is connected with the induction coil (7) of the other group of the magnetization induction coils (4) in series, and the winding direction of the induction coil is the same.
2. The semi-open type device for detecting the magnetic property of non-oriented silicon steel as claimed in claim 1, wherein: the outer diameter of the RCP coil (5) is not less than the inner diameter of the induction coil (7).
3. A measuring system of the semi-open type apparatus according to claim 1, wherein: the device comprises an arbitrary waveform generator (12), a power amplifier (13), a half-open type device, an RCP coil analog integral amplifier (15), a secondary coil analog integral amplifier (11), a data acquisition board (10) and a computer (9); the output end of the arbitrary waveform generator (12) is connected with the input end of the power amplifier (13), one output end of the power amplifier (13) is connected with the outer end part of the magnetizing coil (6) of one group of magnetizing induction coils (4) of the semi-open type device, and the other output end of the power amplifier (13) is connected with the outer end part of the magnetizing coil (6) of the other group of magnetizing induction coils (4) of the semi-open type device; the outer end part of an induction coil (7) of one group of magnetization induction coils (4) of the semi-open type device is connected with one input end of the secondary coil analog integral amplifier (11), and the outer end part of the induction coil (7) of the other group of magnetization induction coils (4) of the semi-open type device is connected with the other input end of the secondary coil analog integral amplifier (11); the output end of the secondary coil analog integral amplifier (11) is connected with the data acquisition board (10), the output end of the data acquisition board (10) is connected with the input end of the computer (9), and the output end of the computer (9) is connected with the input end of the arbitrary waveform generator (12);
one output end of the power amplifier (13) is connected with a standard resistor (14) in series and then is connected with the outer end part of a magnetizing coil (6) of a group of magnetizing induction coils (4) of the semi-open type device, and both ends of the standard resistor (14) are connected with the data acquisition board (10);
the device is characterized by further comprising an RCP coil analog integration amplifier (15), wherein one end of the RCP coil (5) is connected with one input end of the RCP coil analog integration amplifier (15), and the other end of the RCP coil (5) is connected with the other input end of the RCP coil analog integration amplifier (15).
4. A measuring method of the measuring system according to claim 3, characterized in that:
the magnetic induction strength testing process comprises the following steps:
1) the computer (9) determines the target magnetic field strength HmAnd starting an arbitrary waveform generator (12) according to a preset waveform;
2) the data acquisition board acquires the voltage U at two ends of a standard resistor (14)sAnd calculating the instantaneous excitation current I1Size;
3) the instantaneous exciting current I is continuously increased by the power amplifier (13)1And reading the voltage U across the RCP coil (5)rAnd the U is coupled through an RCP coil analog integral amplifier (15)rCarrying out integral amplification;
4) the digital signal obtained after the processing of the data acquisition board (10) is sent to a computer (9) and a formula d (H) is adoptedmlr)/dt＝Urlr/μ0nr(m/2ρls) Calculating to obtain the measured actual magnetic field intensity Hm0Then according to the actual magnetic field intensity Hm0With the target magnetic field strength HmTo increase or decrease the instantaneous field current I1Up to the actual magnetic field strength Hm0Reach the target magnetic field strength HmWithin 2%, the requirement is met;
5) the voltage U of the induction coil is converted into a voltage U by a secondary coil analog integral amplifier (11)2Amplifying by formula Bm＝U2/4.44n2f(m/2ρls) Completing the magnetic field H to the targetmMagnetic induction BmMeasurement of a value;
the iron loss testing process comprises the following steps:
1) the computer (9) determines the target iron loss JmAnd starting the arbitrary waveform generator (12) according to the planned waveform;
2) the data acquisition board acquires the voltage U at two ends of a standard resistor (14)sAnd calculating the instantaneous excitation current I1Size;
3) the voltage U of the induction coil is converted into a voltage U by a secondary coil analog integral amplifier (11)2Amplifying, then, using formula Bm＝U2/4.44n2f(m/2ρls) Completing the magnetic induction B in the transient statemiMeasurement of values and according to formula Jm＝Bm-Hmμ0Iron loss J under the transient state of completion pairmiTesting of (2);
4) sending the digital signal obtained after the processing of the data acquisition board (10) to a computer (9), and comparing the iron loss J in the instantaneous state in the step 3)miAnd target iron loss JmTo increase or decrease the instantaneous field current I1Until the actual iron loss Jm0Reach the target iron loss JmWithin 1%, the requirement is met and the actual iron loss J is recordedm0Reach the target iron loss JmTarget exciting current I within 1%0；
5) At target excitation current I0Reading the voltage U of the induction coil in the target state20According to the formula Ps＝I1U2The/m completes the measurement of the specific total loss of the measurement sample;
in the formula: mu.s0Is the vacuum permeability, nrNumber of turns of RCP coil, n2The number of turns of an induction coil of a semi-open device, m the mass of a test specimen, f the frequency, ρ the material-specific value of the test specimen, lsFor testing the length, l, of the specimenrLength of RCP coil, PsThe specific total loss of the test specimen is measured.
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