CN109581107A - A kind of infrared receiving tube fault detection method - Google Patents
A kind of infrared receiving tube fault detection method Download PDFInfo
- Publication number
- CN109581107A CN109581107A CN201811437887.5A CN201811437887A CN109581107A CN 109581107 A CN109581107 A CN 109581107A CN 201811437887 A CN201811437887 A CN 201811437887A CN 109581107 A CN109581107 A CN 109581107A
- Authority
- CN
- China
- Prior art keywords
- receiving tube
- infrared receiving
- infrared
- tube
- voltage value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Abstract
The invention discloses a kind of infrared receiving tube fault detection methods, comprising: connects the power supply of infrared receiving tube, and first setting time that is delayed；Single-chip microcontroller carries out A/D sampling to the sampling resistor being connected between the emitter of infrared receiving tube and ground, obtains the background voltage value V under ambient lighting conditions1If background voltage value V1Greater than the background voltage threshold value V of settingthr1, then it represents that infrared receiving tube is breakdown, and detection terminates, and otherwise continues to execute；Infrared transmitting tube is powered on, on Infrared irradiation to infrared receiving tube, and second setting time that is delayed；Single-chip microcontroller carries out A/D sampling to the sampling resistor, obtains the stable illumination voltage value V under direct illumination condition2If illumination voltage value V2Greater than the illumination voltage threshold V of settingthr2, then it represents that infrared receiving tube is normal, and detection terminates, and otherwise indicates infrared receiver tube open circuit, and detection terminates.Whether this method is broken down by simpler direct mode energy accurate judgement infrared receiving tube.
Description
Technical field
The invention belongs to measure industrial application of information technology process field, and in particular to a kind of infrared receiving tube fault detection method.
Background technique
In the mechanical, electrical reading conversion process of intellectual water meter and intelligent gas meter, infrared electro direct-reading sensor is extensive
Using this sensing working method determines once there is infrared tube open circuit, it is red that signal sampling system, which can not determine bottom,
Signal will not be generated to physical location locating for no signal caused by tube open circuit failure or sensor itself outside.So as to cause
The case where mechanical character wheel reading is misfitted with electronical reading, leads to metering dispute.Therefore, infrared tube fault detection is in reality
It is a technical problem urgently to be solved in the application of border.
CN103048585A discloses a kind of infrared electro to tube open circuit failure on-line detecting method, can be to infrared electro
Transmitting tube and reception pipe to pipe carry out open-circuit fault detection, but it is utilized when carrying out open-circuit fault detection to reception pipe
Be reception pipe parasitic capacitance characteristic, but being constantly progressive with semiconductor technology, the parasitic capacitance characteristic of reception pipe are more next
It is more unobvious, therefore judge using the capacitance characteristic of reception pipe whether reception pipe opens a way and cannot not only detect the reception of open circuit
Pipe even results in the judgement of mistake.
Summary of the invention
The object of the present invention is to provide a kind of infrared receiving tube fault detection method, by more it is simple it is direct in a manner of accurately sentence
Whether disconnected infrared receiving tube breaks down.
Infrared receiving tube fault detection method of the present invention, comprising:
Step 1: connecting the power supply of infrared receiving tube, and first setting time that is delayed, step 2 is then executed.
Step 2: single-chip microcontroller carries out A/D sampling to the sampling resistor being connected between the emitter of infrared receiving tube and ground,
Obtain the background voltage value V under ambient lighting conditions1If background voltage value V1Greater than the background voltage threshold value V of settingthr1, then
Indicating that infrared receiving tube is breakdown (i.e. infrared receiving tube has been connected, and breakdown fault occurs in infrared receiving tube), detection terminates,
Otherwise (i.e. background voltage value V1Less than or equal to the background voltage threshold value V of settingthr1When) execute step 3.
Step 3: infrared transmitting tube is powered on, on the Infrared irradiation to infrared receiving tube that infrared transmitting tube issues, and
Be delayed the second setting time, then executes step 4.
Step 4: single-chip microcontroller carries out A/D sampling to the sampling resistor, the stable illumination under direct illumination condition is obtained
Voltage value V2If illumination voltage value V2Greater than the illumination voltage threshold V of settingthr2, then it represents that infrared receiving tube is normal, inspection
Survey terminates, otherwise (i.e. illumination voltage value V2Less than or equal to the illumination voltage threshold V of settingthr2When) indicate that infrared receiving tube is opened
Road (i.e. open-circuit fault occurs in infrared receiving tube), detection terminates.
Preferably, first setting time is 0.5ms~1ms；Second setting time is 0.5ms~1ms.
Preferably, if infrared receiving tube is breakdown, the power supply of infrared receiving tube is first disconnected, then terminates to examine again
It surveys；If infrared receiving tube is normal or infrared receiver tube open circuit, first infrared transmitting tube is allowed to stop working, and disconnect infrared connect
Then the power supply of closed tube terminates to detect again.
The present invention be on the basis of infrared transmitting tube emits signal and infrared receiving tube and receives signal, it is above-mentioned by designing
Reasonable testing process judges whether infrared receiving tube event occurs using the characteristic be connected after infrared receiving tube reception illumination
Barrier, is not influenced by infrared receiving tube parasitic capacitance, and detection is simpler direct；By to ambient lighting conditions in testing process
The mode that the state of lower infrared receiving tube is judged, the breakdown failure of infrared receiving tube is discharged, it is very accurate to detect,
The case where being not in erroneous judgement.
Detailed description of the invention
Fig. 1 is the detection principle diagram of embodiment.
Fig. 2 is the overhaul flow chart of embodiment.
Specific embodiment
It elaborates with reference to the accompanying drawing to the present invention.
As shown in Figure 1, infrared transmitting circuit includes triode NPN, infrared transmitting tube IS and constant-current source I, triode NPN's
Collector meets power supply VCC, base stage connects the anode that infrared transmitting tube IS is met by monolithic processor controlled first power supply, emitter, infrared
The cathode of transmitting tube IS connects one end of constant-current source I, the other end ground connection of constant-current source I.Infrared receiving circuit includes infrared receiving tube
PS and sampling resistor R, the collector of infrared receiving tube PS, which connects, meets sampling resistor R by monolithic processor controlled second source, emitter
One end, sampling resistor R the other end ground connection, the distance between infrared transmitting tube IS and infrared receiving tube PS be d, sampling resistor
The tie point of R=10K, emitter and sampling resistor R from infrared receiving tube PS sample, and form signal sampling point A.
Infrared receiving tube fault detection method as shown in Figure 2, comprising:
The first step, single-chip microcontroller control second source are opened, and are connected the power supply of infrared receiving tube PS, and the 0.5ms that is delayed, are then executed
Second step.
Starting ADC conversion, if ADC is converted, executes third step, otherwise continues to hold inside second step, single-chip microcontroller
Row second step.
Third step, single-chip microcontroller carry out A/D sampling to sampling resistor R, obtain under ambient lighting conditions at signal sampling point A
Background voltage value V1, then execute the 4th step；
4th step, single-chip microcontroller judge background voltage value V1Whether the background voltage threshold value V of setting is greater thanthr1: if it is, table
Show infrared receiving tube PS breakdown (i.e. breakdown fault occurs in infrared receiving tube PS), disconnects second source and (disconnect infrared
The power supply of reception pipe PS), then terminate to detect；Otherwise (i.e. background voltage value V1Less than or equal to the background voltage threshold value of setting
Vthr1When) execute the 5th step.
5th step, single-chip microcontroller control the first power supply opening, and infrared transmitting tube IS is powered on, what infrared transmitting tube IS was issued
On Infrared irradiation to infrared receiving tube PS, and the 0.5ms that is delayed, then execute the 6th step.
Starting ADC conversion executes the 7th step, otherwise continues to hold if ADC is converted inside 6th step, single-chip microcontroller
The 6th step of row.
7th step, single-chip microcontroller carry out A/D sampling to sampling resistor R, obtain under direct illumination condition at signal sampling point A
Stable illumination voltage value V2, then execute the 8th step；
8th step, single-chip microcontroller judge illumination voltage value V2Whether the illumination voltage threshold V of setting is greater thanthr2: if it is, table
Show that infrared receiving tube PS is normal, disconnect the first power supply (infrared transmitting tube IS is allowed to stop working), and it is (i.e. disconnected to disconnect second source
Open the power supply of infrared receiving tube PS), then detection terminates；Otherwise (i.e. illumination voltage value V2It is electric less than or equal to the illumination of setting
Press threshold value Vthr2When) indicate infrared receiving tube PS open circuit (open-circuit fault occurs in infrared receiving tube PS), disconnect the first power supply
(infrared transmitting tube IS is allowed to stop working), and second source (disconnecting the power supply of infrared receiving tube PS) is disconnected, then detect
Terminate.
In the print wheel component of intellectual water meter, infrared transmitting tube and infrared receiving tube use the side of ipsilateral cross arrangement arrangement
Formula, being shone by ipsilateral infrared transmitting tube can directly determine whether ipsilateral adjacent infrared receiving tube breaks down.
Before the print wheel component factory of intellectual water meter, above-mentioned infrared receiving tube fault detection method can use to character wheel group
Infrared receiving tube in part carries out fault detection；In the use process being assembled into after intellectual water meter, also it can use before meter reading
Above-mentioned infrared receiving tube fault detection method carries out On-line Fault Detection to the infrared receiving tube in print wheel component.
Claims (3)
1. a kind of infrared receiving tube fault detection method characterized by comprising
Step 1: connecting the power supply of infrared receiving tube, and first setting time that is delayed, step 2 is then executed；
Step 2: single-chip microcontroller carries out A/D sampling to the sampling resistor being connected between the emitter of infrared receiving tube and ground, obtain
Background voltage value V under ambient lighting conditions1If background voltage value V1Greater than the background voltage threshold value V of settingthr1, then it represents that
Infrared receiving tube is breakdown, and detection terminates, and otherwise executes step 3；
Step 3: infrared transmitting tube is powered on, on the Infrared irradiation to infrared receiving tube that infrared transmitting tube issues, and it is delayed
Second setting time, then executes step 4；
Step 4: single-chip microcontroller carries out A/D sampling to the sampling resistor, the stable illumination voltage under direct illumination condition is obtained
Value V2If illumination voltage value V2Greater than the illumination voltage threshold V of settingthr2, then it represents that infrared receiving tube is normal, detection knot
Beam, otherwise indicates infrared receiver tube open circuit, and detection terminates.
2. infrared receiving tube fault detection method according to claim 1, it is characterised in that: first setting time is
0.5ms~1ms；Second setting time is 0.5ms~1ms.
3. infrared receiving tube detection method according to claim 1 or 2, it is characterised in that: if infrared receiving tube by
Breakdown then first disconnects the power supply of infrared receiving tube, then terminates to detect again；If infrared receiving tube is normal or infrared receiving tube
Open circuit, then first allow infrared transmitting tube to stop working, and disconnect the power supply of infrared receiving tube, then terminate to detect again.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811437887.5A CN109581107A (en) | 2018-11-29 | 2018-11-29 | A kind of infrared receiving tube fault detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811437887.5A CN109581107A (en) | 2018-11-29 | 2018-11-29 | A kind of infrared receiving tube fault detection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109581107A true CN109581107A (en) | 2019-04-05 |
Family
ID=65925367
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811437887.5A Withdrawn CN109581107A (en) | 2018-11-29 | 2018-11-29 | A kind of infrared receiving tube fault detection method |
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| Country | Link |
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| CN (1) | CN109581107A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113325289A (en) * | 2021-05-20 | 2021-08-31 | 浙江华消科技有限公司 | Transmitting tube and receiving tube detection device and detection method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008180597A (en) * | 2007-01-24 | 2008-08-07 | Sanyo Electric Co Ltd | Light detection device and optical measurement unit |
| CN103048585A (en) * | 2013-01-29 | 2013-04-17 | 重庆市智能水表有限责任公司 | Infrared photoelectricity geminate transistor open-circuit fault on-line detection method |
| CN103869236A (en) * | 2014-03-31 | 2014-06-18 | 广州华欣电子科技有限公司 | Method and jig for testing infrared touch screen PCBA |
| CN105182447A (en) * | 2015-09-28 | 2015-12-23 | 深圳怡化电脑股份有限公司 | Photoelectric correlation sensor detection system and method |
| CN106226641A (en) * | 2016-08-30 | 2016-12-14 | 温岭甬岭水表有限公司 | A kind of device of quick detection infrared receiver tube open circuit |
-
2018
- 2018-11-29 CN CN201811437887.5A patent/CN109581107A/en not_active Withdrawn
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008180597A (en) * | 2007-01-24 | 2008-08-07 | Sanyo Electric Co Ltd | Light detection device and optical measurement unit |
| CN103048585A (en) * | 2013-01-29 | 2013-04-17 | 重庆市智能水表有限责任公司 | Infrared photoelectricity geminate transistor open-circuit fault on-line detection method |
| CN103869236A (en) * | 2014-03-31 | 2014-06-18 | 广州华欣电子科技有限公司 | Method and jig for testing infrared touch screen PCBA |
| CN105182447A (en) * | 2015-09-28 | 2015-12-23 | 深圳怡化电脑股份有限公司 | Photoelectric correlation sensor detection system and method |
| CN106226641A (en) * | 2016-08-30 | 2016-12-14 | 温岭甬岭水表有限公司 | A kind of device of quick detection infrared receiver tube open circuit |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113325289A (en) * | 2021-05-20 | 2021-08-31 | 浙江华消科技有限公司 | Transmitting tube and receiving tube detection device and detection method |
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| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20190405 |
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