CN109540849A - A kind of novel thin film monitoring device - Google Patents
A kind of novel thin film monitoring device Download PDFInfo
- Publication number
- CN109540849A CN109540849A CN201811412969.4A CN201811412969A CN109540849A CN 109540849 A CN109540849 A CN 109540849A CN 201811412969 A CN201811412969 A CN 201811412969A CN 109540849 A CN109540849 A CN 109540849A
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- CN
- China
- Prior art keywords
- thickness measuring
- measuring roller
- rack
- roller
- displacement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The present invention provides a kind of novel thin film monitoring device, it is characterised in that: including rack, transfer roller, light transmittance measuring part and thickness measure component；The transfer roller is rotationally connected in the rack, for transmitting film；The light transmittance measuring part includes the laser emitter and light intensity test instrument for being oppositely arranged on the film two sides；The thickness measure component includes lower thickness measuring roller, upper thickness measuring roller, displacement component and displacement sensor, the lower thickness measuring roller is rotationally connected in the rack, the upper thickness measuring roller is located above the lower thickness measuring roller, and it can rotate and can be slided up and down along the rack in the rack, the film is between the lower thickness measuring roller and the upper thickness measuring roller, and it is close to the lower thickness measuring roller and the upper thickness measuring roller always, the displacement component is set between the rack and the upper thickness measuring roller, and it can be slided up and down with the upper thickness measuring roller, institute's displacement sensors are set in the rack, for measuring the sliding distance of the displacement component.
Description
Technical field
The present invention relates to processing film fields, and in particular to film monitoring device.
Background technique
Plastic film using more and more extensive, production technology includes the processes such as mixing, extrusion, winding.It is winding
It needs to detect film at rear past contact, mainly the thickness of film, light transmittance etc. be detected, to guarantee film
Outgoing.
But additional detection process will affect production efficiency, therefore how improve production efficiency, and can guarantee product quality
It is those skilled in the art's problem urgently to be resolved.
Summary of the invention
The main purpose of the present invention is to provide a kind of novel thin film monitoring devices, can be in wrapup procedure to the thickness of film
Degree and light transmittance are monitored, and to improve production efficiency, guarantee product quality.
To achieve the above objectives, the technical solution adopted by the present invention are as follows: a kind of novel thin film monitoring device, feature exist
In: including rack, transfer roller, light transmittance measuring part and thickness measure component；The transfer roller is rotationally connected with the rack
On, for transmitting film；The light transmittance measuring part includes the laser emitter and light intensity for being oppositely arranged on the film two sides
Tester；The thickness measure component includes lower thickness measuring roller, upper thickness measuring roller, displacement component and displacement sensor, the lower thickness measuring
Roller is rotationally connected in the rack, and the upper thickness measuring roller is located above the lower thickness measuring roller, and can rotate in the rack
It can be slided up and down again along the rack, which is close to institute between the lower thickness measuring roller and the upper thickness measuring roller always
Lower thickness measuring roller and the upper thickness measuring roller are stated, the displacement component is set between the rack and the upper thickness measuring roller, and can be with
The upper thickness measuring roller slides up and down, and institute's displacement sensors are set in the rack, for measuring the cunning of the displacement component
Dynamic distance.
Preferably, the displacement component includes contact portion, reset spring and scale, described in the contact portion contacts always
Upper thickness measuring roller, the reset spring force the contact portion to be close to the upper thickness measuring roller, and the scale passes through the displacement sensing
Device, for showing the sliding distance of the displacement component.
Preferably, the laser emitter and the light intensity test instrument are respectively four, and along the width side of the film
To being uniformly distributed.
Compared with the prior art, the advantages of the present invention are as follows: light transmittance measuring part and thickness measure component can be thin
Film wrapup procedure carries out light transmittance measurement and thickness measure, can find the quality problems of product in time, both improves production effect
Rate in turn ensures product quality.
Detailed description of the invention
Fig. 1 is schematic perspective view according to a preferred embodiment of the present invention；
Fig. 2 is according to a preferred embodiment of the present invention along the cross-sectional view of lower thickness measuring roller axis direction；
Fig. 3 is the enlarged view in Fig. 2 according to a preferred embodiment of the present invention at A；
Fig. 4 is the stereochemical structure view of displacement component middle according to a preferred embodiment of the present invention.
Specific embodiment
It is described below for disclosing the present invention so that those skilled in the art can be realized the present invention.It is excellent in being described below
Embodiment is selected to be only used as illustrating, it may occur to persons skilled in the art that other obvious modifications.
As shown in figures 1-4, the embodiment of the present invention includes rack 1, transfer roller 2, light transmittance measuring part and thickness measure
Component.Specific structure is as follows:
Transfer roller 2 is rotationally connected in rack 1, for transmitting film 100.
Light transmittance measuring part includes the laser emitter 3 and light intensity test instrument 4 for being oppositely arranged on 100 two sides of film.
Laser emitter 3 and light intensity test instrument 4 are respectively four, and are uniformly distributed along the width direction of the film 100.
Thickness measure component includes lower thickness measuring roller 5, upper thickness measuring roller 6, displacement component 7 and displacement sensor 8, lower thickness measuring roller 5
It is rotationally connected in rack 1, upper thickness measuring roller 6 is located at 5 top of lower thickness measuring roller, and can rotate in rack 1 again can be along about 1 rack
Sliding, the film 100 are close to lower thickness measuring roller 5 and upper thickness measuring roller 6, position between lower thickness measuring roller 5 and upper thickness measuring roller 6 always
It moves component 7 to be set between rack 1 and upper thickness measuring roller 6, and can be slided up and down with upper thickness measuring roller 6, displacement sensor 8 is set to machine
On frame 1, for measuring the sliding distance of displacement component 7.
Specifically, displacement component 7 includes contact portion 71, reset spring 72 and scale 73, contact portion 71 contacts survey always
Thick roller 6, reset spring 72 force contact portion 71 to be close to upper thickness measuring roller 6, and scale 73 passes through displacement sensor 8, for showing displacement
The sliding distance of component 8.
The basic principles, main features and advantages of the present invention have been shown and described above.The technology of the industry
Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and what is described in the above embodiment and the description is only the present invention
Principle, various changes and improvements may be made to the invention without departing from the spirit and scope of the present invention, these variation and
Improvement is both fallen in the range of claimed invention.The present invention claims protection scope by appended claims and its
Equivalent defines.
Claims (3)
1. a kind of novel thin film monitoring device, it is characterised in that；It is surveyed including rack, transfer roller, light transmittance measuring part and thickness
Measure component；The transfer roller is rotationally connected in the rack, for transmitting film；The light transmittance measuring part includes opposite
The laser emitter and light intensity test instrument of the film two sides are set；The thickness measure component includes lower thickness measuring roller, upper thickness measuring
Roller, displacement component and displacement sensor, the lower thickness measuring roller are rotationally connected in the rack, and the upper thickness measuring roller is located at described
Above lower thickness measuring roller, and it can rotate and can be slided up and down along the rack in the rack, which is located at the lower thickness measuring
Between roller and the upper thickness measuring roller, and it is close to the lower thickness measuring roller and the upper thickness measuring roller always, the displacement component is set to
It between the rack and the upper thickness measuring roller, and can be slided up and down with the upper thickness measuring roller, institute's displacement sensors are set to institute
It states in rack, for measuring the sliding distance of the displacement component.
2. novel thin film monitoring device according to claim 1, it is characterised in that: the displacement component include contact portion,
Reset spring and scale, the contact portion contact the upper thickness measuring roller always, and the reset spring forces the contact portion to be close to
The upper thickness measuring roller, the scale passes through institute's displacement sensors, for showing the sliding distance of the displacement component.
3. novel thin film monitoring device according to claim 1, it is characterised in that: the laser emitter and the light intensity
Tester is respectively four, and is uniformly distributed along the width direction of the film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811412969.4A CN109540849A (en) | 2018-11-14 | 2018-11-14 | A kind of novel thin film monitoring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811412969.4A CN109540849A (en) | 2018-11-14 | 2018-11-14 | A kind of novel thin film monitoring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109540849A true CN109540849A (en) | 2019-03-29 |
Family
ID=65850082
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811412969.4A Pending CN109540849A (en) | 2018-11-14 | 2018-11-14 | A kind of novel thin film monitoring device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109540849A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111060033A (en) * | 2019-12-27 | 2020-04-24 | 中航复合材料有限责任公司 | Fabric prepreg bow and weft variation detection device and detection method |
| CN111805826A (en) * | 2020-07-13 | 2020-10-23 | 福建省邦手氟塑制品有限公司 | Raw material belt calendering mechanism convenient for thickness control and control method thereof |
-
2018
- 2018-11-14 CN CN201811412969.4A patent/CN109540849A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111060033A (en) * | 2019-12-27 | 2020-04-24 | 中航复合材料有限责任公司 | Fabric prepreg bow and weft variation detection device and detection method |
| CN111805826A (en) * | 2020-07-13 | 2020-10-23 | 福建省邦手氟塑制品有限公司 | Raw material belt calendering mechanism convenient for thickness control and control method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20190329 |
|
| WD01 | Invention patent application deemed withdrawn after publication |