CN109524102B - Method and device for checking parameter selection, computer device and readable storage medium - Google Patents
Method and device for checking parameter selection, computer device and readable storage medium Download PDFInfo
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Abstract
The invention relates to a method for checking parameter selection, which comprises the following steps: acquiring the inspection information of a user, and generating an initial inspection parameter according to the inspection information; acquiring historical inspection parameters of the user; and at least partially updating the initial inspection parameters according to the historical inspection parameters to obtain actual inspection parameters, wherein the actual inspection parameters are used for inspecting the user. Thus, the actual examination parameters used by the user for examination can be more suitable for the user. The problem of because user's initial inspection parameter and user's own physical condition mismatch, lead to that the inspection result is unsatisfactory even invalid to need the secondary inspection is solved.
Description
Technical Field
The present application relates to the field of medical technology, and in particular, to a method and an apparatus for examination parameter selection, a computer device, and a readable storage medium.
Background
In general, a user needs to register relevant examination information before performing a medical examination. The examination information can uniquely identify examination contents that the user needs to perform. An operator of the examination apparatus sets relevant examination parameters based on examination information of the user. The examination parameters to be set are generally determined based on information such as the examined region and age. If the selected parameters are not suitable for the user himself, the examination parameters need to be reset, resulting in a secondary examination by the user, which may occur with each examination by the user. Therefore, a method for selecting inspection parameters is needed to avoid the user performing multiple inspections.
Disclosure of Invention
Therefore, when the user needs to perform the inspection, a method and a device for selecting the inspection parameters, a computer device and a readable storage medium are provided, which can solve the problem that the inspection parameters are not suitable to cause secondary inspection.
A method of checking parameter selection, comprising:
acquiring the inspection information of a user, and generating an initial inspection parameter according to the inspection information;
acquiring historical inspection parameters of the user;
and at least partially updating the initial inspection parameters according to the historical inspection parameters to obtain actual inspection parameters, wherein the actual inspection parameters are used for inspecting the user.
In one embodiment, the obtaining the historical inspection parameters of the user includes:
acquiring a historical examination record corresponding to the examination information of the user;
judging whether the historical check record is zero or not;
and if the historical checking record is not zero, extracting the historical checking parameters of the user according to the historical checking record.
In one embodiment, the method for checking parameter selection further includes:
and if the historical inspection record is zero, using the initial inspection parameter as the actual inspection parameter.
In one embodiment, if the historical inspection record is not zero, extracting the historical inspection parameter of the user according to the historical inspection record, specifically including:
judging whether the history check record is one or not;
and if the historical check record is one, extracting corresponding historical check parameters according to the historical check record.
In one embodiment, the method for checking parameter selection further includes:
and if the historical check records are multiple, extracting corresponding historical check parameters according to the latest historical check record.
In one embodiment, the method for checking parameter selection further includes:
if the historical check records are multiple, checking the equipment models in the historical check records;
judging whether the historical check records of the devices with the same model are zero;
and if the historical check record of the equipment with the same model is zero, extracting corresponding historical check parameters according to the latest historical check record.
In one embodiment, the method for checking parameter selection includes:
and if the historical check record of the equipment with the same model is not zero, extracting corresponding historical check parameters according to the historical check record of the equipment with the same model.
In one embodiment, if the historical check records of the devices with the same model are not zero, extracting corresponding historical check parameters according to the historical check records of the devices with the same model, specifically including:
judging whether the historical check record of the equipment with the same model is one;
and if the historical check record of the equipment with the same model is one, extracting corresponding historical check parameters according to the historical check record.
In one embodiment, the method for checking parameter selection further includes:
if the historical check records of the equipment with the same model are multiple, extracting corresponding historical check parameters according to the latest historical check record of the equipment with the same model.
In one embodiment, the method for checking parameter selection further includes:
if the historical check records of the equipment with the same model are multiple, checking the positions of the equipment in the historical check records of the equipment with the same model, and extracting corresponding historical check parameters from the historical check records with the same positions.
In one embodiment, the method for checking parameter selection further includes:
and storing the checking data of the current user so as to be called next time.
In one embodiment, the device to which the method for checking parameter selection described in any of the above embodiments is applied includes a DR machine.
An apparatus to check parameter selection, comprising:
the parameter generating module is used for acquiring the checking information of the user and generating initial checking parameters according to the checking information;
the retrieval module is used for acquiring historical examination parameters of the user;
and the parameter updating module is used for at least partially updating the initial checking parameters according to the historical checking parameters to obtain actual checking parameters, and the actual checking parameters are used for checking the user.
A computer device comprising a memory storing a computer program and a processor implementing the steps of any of the methods described above when the processor executes the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method of any of the above.
The method for selecting the inspection parameters updates the initial inspection parameters generated according to the inspection information of the user by using the historical inspection records of the user, thereby obtaining the actual inspection parameters of the user and inspecting the user. Thus, the actual examination parameters used by the user for examination can be more suitable for the user. The problem of because user's initial inspection parameter and user's own physical condition mismatch, lead to that the inspection result is unsatisfactory even invalid to need the secondary inspection is solved.
Drawings
Fig. 1 is a schematic flowchart of a method for selecting inspection parameters according to an embodiment of the present application;
FIG. 2 is a flowchart illustrating steps for obtaining historical inspection parameters of a user according to an embodiment of the present application;
fig. 3 is a schematic flowchart of a checking parameter selection method according to an embodiment of the present application;
FIG. 4 is a flowchart illustrating a method for selecting inspection parameters according to an embodiment of the present application;
FIG. 5 is a flowchart illustrating a method for selecting inspection parameters according to another embodiment of the present application;
FIG. 6 is a flowchart illustrating a method for selecting inspection parameters according to another embodiment of the present application;
FIG. 7 is a schematic structural diagram of an apparatus for checking parameter selection according to an embodiment of the present application;
fig. 8 is an internal structural diagram of a computer device according to an embodiment of the present application.
The reference numbers illustrate:
10 device for checking parameter selection
100 parameter generation module
200 retrieval module
300 parameter updating module
Detailed Description
In order to make the aforementioned objects, features and advantages of the present application more comprehensible, embodiments accompanying the present application are described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. This application is capable of embodiments in many different forms than those described herein and those skilled in the art will be able to make similar modifications without departing from the spirit of the application and it is therefore not intended to be limited to the embodiments disclosed below.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Please refer to fig. 1. An embodiment of the present application provides a method for checking parameter selection, including:
s110, acquiring the inspection information of a user, and generating an initial inspection parameter according to the inspection information;
s120, acquiring historical inspection parameters of the user;
s130, updating the initial checking parameters at least partially according to the historical checking parameters to obtain actual checking parameters, wherein the actual checking parameters are used for checking the user.
In S110, the examination information of the user includes personal information of the user, for example, the name, age, sex, and the like of the user. The examination information of the user also includes examination site information of the user, such as lungs, stomach, etc., which is provided according to the actual needs of the user. In one embodiment, when the user's examination information is obtained, it may be obtained from information registered by the user before the examination.
In the step of generating the initial examination parameter according to the examination information, the examination parameter refers to an examined part and technical parameters related to an examination protocol related to the examined part, and mainly include KV, mA, ms, a beam limiter light field, an algorithm template, positioning related parameters, and the like. In one embodiment, the medical device has common matched parameters according to different examination positions, and the matched parameters can be selected by a computer or an operation technician according to the position needing to be examined by a user, namely the initial examination parameters. The initial examination parameters are only examination parameters mechanically selected according to the examination site, and may not be effective due to the specificity of the user. For example, when a user takes a picture of the inside of the body, the exposure dose is insufficient due to the thickness of the body of the user, so that a technician is required to manually adjust parameters and determine whether the picture can be used for diagnosis according to the shooting condition, thereby complicating the diagnosis work.
In one embodiment, in S120, the historical inspection parameter is a historical inspection parameter corresponding to the inspection information of the user, so as to be referred to and replaced. It can be understood that, when the step of updating the initial inspection parameter according to the historical inspection parameter to obtain the actual inspection parameter is performed, the historical inspection parameter needs to replace the corresponding item of the initial inspection parameter, and other items are kept unchanged. Thus, it is not necessary to completely replace the initial inspection parameters with the historical inspection parameters, depending on how well the historical inspection parameters match the initial inspection parameters. When the examination parameters are replaced, the examination parameters can be manually input by a technician or intelligently replaced by a computer.
In one embodiment, after the historical inspection parameters are obtained, the initial inspection parameters may be partially updated by selecting a part of the historical inspection parameters as needed. The historical inspection parameters used for partial updating can be preset or can be selected manually and instantly. In another embodiment, after the historical inspection parameters are obtained, all of the historical inspection parameters may be used to update all of the initial inspection parameters.
In this embodiment, the initial inspection parameters generated according to the user inspection information are updated by using the historical inspection parameters of the user, so as to obtain the actual inspection parameters of the user, and the user is inspected. Thus, the actual examination parameters used by the user for examination can be more suitable for the user. The problem of because user's initial inspection parameter and user's own physical condition mismatch, lead to that the inspection result is unsatisfactory even invalid to need the secondary inspection is solved.
Please refer to fig. 2. In one embodiment, the S120 includes:
s210, acquiring a historical examination record corresponding to the examination information of the user;
s220, judging whether the historical check record is zero or not;
and S230, if the historical check record is not zero, extracting the historical check parameters of the user according to the historical check record.
In one embodiment, in step S210, the historical exam record may be retrieved through a database, server, etc. storage channel of the medical institution. The form of existence of the history check record is not limited, and may be text, electronic data, or language description. In one embodiment, in step S230, it may be determined whether the number of history check records is zero according to the retrieval result. In one embodiment, in step S230, the historical inspection parameters may be extracted from the historical inspection records by means of scan recognition or manual recognition.
In the embodiment, the historical examination parameters are extracted from the historical examination records of the examination information corresponding to the user, so that the method is simple and convenient, and is beneficial to large-scale popularization.
It is understood that the historical examination record is an examination record that can be used as a diagnosis after being confirmed by a technician. In one embodiment, the historical inspection parameters may be extracted from inspection information in the user's historical inspection records. Assuming that the user' S historical examination information is repeatedly retrievable, the examination information that cannot be used as the diagnosis information is normally marked as "rejected" by the technician, the examination information that can be used as the diagnosis information is marked as "accepted", and the historical examination parameters acquired in S120 default to the examination parameters in the examination information that are "accepted".
Please refer to fig. 3. In one embodiment, the method for checking parameter selection further includes:
s240, if the historical check record is zero, the initial check parameter is used as the actual check parameter.
It is understood that the result of the history check record being zero is obtained after the S220. When the user makes the first examination of a certain part or the previous examination record is not included, no available historical examination record can be referred to. Therefore, the user is checked using the initial checking parameter as the actual checking parameter. In this embodiment, before the initial inspection parameters are used for inspection, the historical inspection records are retrieved, so that even if the corresponding historical inspection records are not retrieved, the situation that the existing historical inspection records may be missed is avoided.
In an embodiment, the S230 specifically includes:
s310, judging whether the history check record is one or not;
s320, if the history checking record is one, extracting the corresponding history checking parameter according to the history checking record.
In this embodiment, when only one historical inspection record is obtained, the obtained historical inspection parameters are also unique. The unique historical examination parameters can also increase the adaptability to the user, thereby avoiding multiple examinations.
In one embodiment, the method for checking parameter selection further includes:
s330, if the plurality of historical check records exist, extracting corresponding historical check parameters according to the latest historical check record.
It is understood that the result of the history check record being a plurality of pieces is obtained after the S310. When the user's historical examination record is multiple, the historical examination record closer to the current body state of the user needs to be selected, so that the historical examination parameter with stronger adaptability to the user is extracted as the actual examination parameter of the user. It can be understood that the historical examination record which is usually closest to the current examination time of the user is closest to the physical condition of the user, and the reference value is the largest. Therefore, in the embodiment, by adopting the historical examination record with the latest time, the historical examination parameter with stronger adaptability to the user is extracted as the actual examination parameter of the user, and the method has a favorable pushing effect on the accuracy of the examination result of the user.
Please refer to fig. 4. In one embodiment, the method for checking parameter selection further includes:
s410, if the history checking records are multiple, checking the equipment models in the history checking records;
s420, judging whether the historical check records of the devices with the same model are zero; and S430, if the historical check record of the equipment with the same model is zero, extracting corresponding historical check parameters according to the latest historical check record.
It is understood that the result of the history check record of S410 being a plurality of pieces is obtained after S310. In this embodiment, the history inspection records of the user are screened by adding two screening conditions, i.e., the model of the device and the time, so that the history inspection parameters with higher matching degree with the initial inspection parameters and the conditions of the user can be obtained, and the initial inspection parameters are updated by using the history inspection parameters, so that the inspection results performed by using the actual inspection parameters are more accurate.
In one embodiment, the method for checking parameter selection further includes:
s440, if the historical check records of the devices with the same model are not zero, extracting corresponding historical check parameters according to the historical check records of the devices with the same model.
The step S410 is to check whether the device model in the history check record is the same as the device model used in the current check. In one embodiment, if the models are different, the examination may choose to replace the same type of equipment, so that the historical examination parameters and the examination parameters have more matching items.
In this embodiment, by extracting the historical inspection parameters by using the historical inspection records of the devices with the same model, the matching items of the inspection parameters of the current inspection and the historical inspection can be more, so that the actual inspection parameters are closer to the self condition of the user. Further, the accuracy of the inspection result is made higher.
In an embodiment, the S440 specifically includes:
s510, judging whether the historical check record of the equipment with the same model is one;
s520, if the history check record of the equipment with the same model is one, extracting the corresponding history check parameter according to the history check record.
In this embodiment, the initial inspection parameters are updated to obtain the actual inspection parameters by using the only historical inspection parameters in the historical inspection records with the same type of equipment. And selecting a proper historical inspection record after the model of the equipment is inspected, so that the missing of the historical inspection parameters with higher matching degree with the initial inspection parameters can be avoided.
In one embodiment, the S440 further includes:
s530, if the historical check records of the equipment with the same model are multiple, extracting corresponding historical check parameters according to the latest historical check record of the equipment with the same model.
It is understood that the result of the plurality of history check records of the devices having the same model in S530 is obtained after S510. In the embodiment, the latest historical examination record is selected from a plurality of historical examination records with the same type of equipment, and the historical examination parameters are extracted from the selected historical examination records so as to update the initial examination parameters as the actual examination parameters to examine the user. The historical examination record closest to the physical state of the user can be selected, so that the accuracy of the examination result is higher.
Please refer to fig. 5. In one embodiment, the S440 includes:
s610, if the historical check records of the equipment with the same model are multiple, checking the positions in the historical check records of the equipment with the same model, and extracting corresponding historical check parameters from the historical check records with the same positions.
It can be understood that the positioning refers to the body position of the user during examination, and is usually adjusted by the doctor, and the examination parameters corresponding to different positioning are also different. In this embodiment, by comparing the positioning of the current inspection with the positioning in the history inspection record of the equipment with the same model, more accurate history inspection parameters can be obtained, and unnecessary useless parameters are avoided, so that the efficiency of updating the parameters is improved. While minimizing the chance of incorrect parameter replacements.
In one embodiment, in S610, if the historical inspection records with the same placement are zero, a most recent piece of the historical inspection records of the devices with the same model is selected, and the historical inspection parameters are extracted.
In one embodiment, in S610, if there is one history check record with the same position, the corresponding history check parameter is extracted according to the history check record.
In one embodiment, in S610, if there are multiple historical inspection records with the same placement, a most recent historical inspection record is selected from the multiple historical inspection records with the same placement, and corresponding historical inspection parameters are extracted. In this embodiment, the latest historical examination record having the same placement is selected to extract the examination parameters, and the examination parameters closest to the current physical condition of the user can be obtained. Thereby achieving the purpose of making the inspection result more accurate.
Please refer to fig. 6. In one embodiment, the method for checking parameter selection further includes S140, storing the checking data of the current user for next retrieval. In this embodiment, since the current examination is performed after the history examination records are screened, the matching degree of the user's own condition is higher. By storing the inspection data, more accurate reference of inspection information can be provided for the next inspection.
In one embodiment, the method for checking parameter selection according to any of the above embodiments is applied to an apparatus including a DR (digital direct imaging system) machine. Without being limited thereto, the method for checking parameter selection can also be applied to other medical image diagnosis equipment.
Please refer to fig. 7. An embodiment of the present application further provides an apparatus 10 for checking parameter selection, which includes a parameter generating module 100, a retrieving module 200, and a parameter updating module 300. The parameter generating module 100 is configured to obtain inspection information of a user, and generate an initial inspection parameter according to the inspection information. The retrieval module 200 is configured to obtain historical inspection parameters of the user. The parameter updating module 300 is configured to update the initial inspection parameter according to the historical inspection parameter to obtain an actual inspection parameter, where the actual inspection parameter is used to inspect a user.
In the present embodiment, the device 10 for selecting examination parameters updates the initial examination parameters with the historical examination parameters of the user, so that the actual examination parameters used by the user for examination can be more suitable for the user. The problem of because user's initial inspection parameter and user's own physical condition mismatch, lead to that the inspection result is unsatisfactory even invalid to need the secondary inspection is solved.
In one embodiment, the parameter generation module 100 includes an information collection module to obtain the examination information of the user. In one embodiment, the parameter generating module 100 further includes a selecting module, configured to select a matched inspection parameter according to the inspection information to generate the initial inspection parameter. In one embodiment, the retrieval module 200 may interface with a database to perform the retrieval. In one embodiment, the parameter update module 300 has a data processing function for updating the initial inspection parameter with the retrieved historical inspection parameter to obtain the actual inspection parameter.
For specific limitations of the apparatus 10 for checking parameter selection, reference may be made to the above limitations of the method for checking parameter selection, which are not described herein again. The various modules in the apparatus 10 for checking parameter selection described above may be implemented in whole or in part by software, hardware, and combinations thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 8. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a method of warning of a lane change of a vehicle. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 8 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
An embodiment of the present application further provides a computer device, which includes a memory and a processor, where the memory stores a computer program, and the processor implements the steps of the method for checking parameter selection in any one of the above embodiments when executing the computer program.
In one embodiment, the processor, when executing the computer program, performs the steps of:
s110, acquiring the inspection information of a user, and generating an initial inspection parameter according to the inspection information;
s120, acquiring historical inspection parameters of the user;
and S130, updating the initial checking parameters according to the historical checking parameters to obtain actual checking parameters, wherein the actual checking parameters are used for checking the user.
An embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the steps of the method for checking parameter selection as set forth in any one of the above embodiments.
In one embodiment, the computer program when executed by the processor implements the steps of:
s110, acquiring the inspection information of a user, and generating an initial inspection parameter according to the inspection information;
s120, acquiring historical inspection parameters of the user;
and S130, updating the initial checking parameters according to the historical checking parameters to obtain actual checking parameters, wherein the actual checking parameters are used for checking the user.
The computer device and the computer-readable storage medium update the initial inspection parameters generated according to the user inspection information by using the historical inspection parameters of the user, thereby obtaining the actual inspection parameters of the user, and inspecting the user. Thus, the actual examination parameters used by the user for examination can be more suitable for the user. The problem of because user's initial inspection parameter and user's own physical condition mismatch, lead to that the inspection result is unsatisfactory even invalid to need the secondary inspection is solved.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (9)
1. A method of checking parameter selection, comprising:
acquiring the inspection information of a user, and generating an initial inspection parameter according to the inspection information;
acquiring a historical examination record corresponding to the examination information of the user;
judging whether the historical check record is zero or not;
if the historical inspection record is zero, using the initial inspection parameter as an actual inspection parameter;
if the historical check record is not zero and the historical check records are multiple, judging whether the historical check record of the equipment with the same model is zero; if the historical inspection records with the same equipment model are not zero and the historical inspection records with the same equipment model are multiple, inspecting the positions in the historical inspection records with the same equipment model, and extracting corresponding historical inspection parameters from the historical inspection records with the same positions;
and at least partially updating the initial inspection parameters according to the historical inspection parameters to obtain actual inspection parameters, wherein the actual inspection parameters are used for inspecting the user.
2. The method of claim 1, wherein if the historical inspection record is not zero, and if the historical inspection record is one, extracting the corresponding historical inspection parameter according to the one historical inspection record.
3. The method of inspection parameter selection of claim 1, further comprising:
and if the historical check record of the equipment with the same model is zero, extracting corresponding historical check parameters according to the latest historical check record.
4. The method for checking parameter selection according to claim 1, wherein if the historical checking records of the devices with the same model are not zero, if there is one historical checking record of the devices with the same model, extracting the corresponding historical checking parameter according to the one historical checking record.
5. The method of inspection parameter selection of claim 1, further comprising:
and storing the checking data of the current user so as to be called next time.
6. The method of inspection parameter selection according to any of claims 1-5, wherein the device to which the method of inspection parameter selection is applied comprises a DR machine.
7. An apparatus for checking parameter selection, comprising:
the parameter generating module (100) is used for acquiring the checking information of a user and generating initial checking parameters according to the checking information;
a retrieval module (200) configured to obtain a historical check record corresponding to the check information of the user, determine whether the historical check record is zero, use the initial check parameter as an actual check parameter if the historical check record is zero, and determine whether the historical check record of devices having the same model is zero if the historical check record is not zero and the historical check record is multiple; if the historical inspection records with the same equipment model are not zero and the historical inspection records with the same equipment model are multiple, inspecting the positions in the historical inspection records with the same equipment model, and extracting corresponding historical inspection parameters from the historical inspection records with the same positions;
a parameter updating module (300) for updating the initial inspection parameter at least partially according to the historical inspection parameter to obtain an actual inspection parameter, wherein the actual inspection parameter is used for inspecting the user.
8. A computer device comprising a memory and a processor, the memory storing a computer program, wherein the processor implements the steps of the method of any one of claims 1 to 6 when executing the computer program.
9. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 6.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811287450.8A CN109524102B (en) | 2018-10-31 | 2018-10-31 | Method and device for checking parameter selection, computer device and readable storage medium |
| EP19811874.7A EP3784134A4 (en) | 2018-05-28 | 2019-05-28 | Systems and methods for determining examination parameters |
| PCT/CN2019/088886 WO2019228372A1 (en) | 2018-05-28 | 2019-05-28 | Systems and methods for determining examination parameters |
| US17/105,643 US11504083B2 (en) | 2018-05-28 | 2020-11-27 | Systems and methods for determining examination parameters |
| US18/057,734 US20230083704A1 (en) | 2018-05-28 | 2022-11-21 | Systems and methods for determining examination parameters |
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| CN201811287450.8A CN109524102B (en) | 2018-10-31 | 2018-10-31 | Method and device for checking parameter selection, computer device and readable storage medium |
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| CN109524102A CN109524102A (en) | 2019-03-26 |
| CN109524102B true CN109524102B (en) | 2021-09-21 |
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| WO2019228372A1 (en) * | 2018-05-28 | 2019-12-05 | Shenzhen United Imaging Healthcare Co., Ltd. | Systems and methods for determining examination parameters |
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| CN101721227A (en) * | 2009-10-21 | 2010-06-09 | 无锡祥生科技有限公司 | Method for selecting preset value of image-guided ultrasonic diagnostic apparatus |
| CN107122605A (en) * | 2017-04-26 | 2017-09-01 | 上海联影医疗科技有限公司 | The information input method and device of a kind of medical imaging equipment |
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| CN101721227A (en) * | 2009-10-21 | 2010-06-09 | 无锡祥生科技有限公司 | Method for selecting preset value of image-guided ultrasonic diagnostic apparatus |
| CN107122605A (en) * | 2017-04-26 | 2017-09-01 | 上海联影医疗科技有限公司 | The information input method and device of a kind of medical imaging equipment |
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