CN109510308B - Third-generation intelligent substation switching value local module test system and application method thereof - Google Patents
Third-generation intelligent substation switching value local module test system and application method thereof Download PDFInfo
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Abstract
The invention discloses a third-generation intelligent substation switching value local module test system and an application method thereof, wherein the test system comprises a case, and a mainboard module, an HSR message communication module, an input module, an output module and a power module which are respectively installed in the case, wherein the mainboard module comprises a D/A conversion module, an HSR message analysis module, a central processing unit and an upper computer communication module which are sequentially connected, and the HSR message communication module comprises an HSR message sending port and an HSR message receiving port; the application method comprises the step of testing the switching value in-situ module by adopting the testing system. The invention can automatically test the function and performance of the switching value local module of the third-generation intelligent substation, can realize batch automatic detection of the function and performance of the switching value local module, can improve the overhauling and maintaining efficiency of the intelligent substation, and can ensure safe and efficient operation of a power grid.
Description
Technical Field
The invention relates to a switching value in-situ module of a third-generation intelligent substation, in particular to a switching value in-situ module testing system of the third-generation intelligent substation and an application method thereof.
Background
After the national grid company starts the intelligent transformer substation from 2009 to build a trial point, about 5000 intelligent transformer substations including a first-generation intelligent transformer substation and a second-generation intelligent transformer substation are built domestically at present. The intelligent substation achieves certain effect in the aspects of economy, energy conservation, environmental protection and the like due to high system integration and reasonable structural layout. However, in practical applications, many problems are also exposed. Particularly, in the aspect of operation and maintenance of the intelligent substation, the development of the intelligent substation is greatly restricted by heavy maintenance workload and high maintenance cost. In order to achieve the aims of high reliability of power supply of a power grid and high efficiency of operation and detection of a transformer substation, a national power grid company starts the third-generation intelligent transformer substation test point construction work in 2018. The control core equipment of the third-generation intelligent substation is a primary equipment on-site module, the switching value on-site module is one of key components for protecting the safety of a power grid, and how to effectively detect, monitor and manage the large-quantity switching value on-site module is a key problem to be solved urgently for the safe and stable operation of the third-generation intelligent substation.
The third-generation intelligent substation switching value in-place module has the main functions of converting the positions of the disconnecting link and the circuit breaker of hard contacts into HSR (high speed railway) ring network communication protocols and transmitting the HSR ring network communication protocols to devices such as measurement and control devices, and simultaneously converting HSR ring network protocol commands sent by the measurement and control devices to control the disconnecting link and the circuit breaker to hard contacts and transmitting the hard contacts to relevant operating mechanisms such as the disconnecting link and the circuit breaker, so that the protection and control functions of the disconnecting link and the circuit breaker of the substation. At present, a third-generation intelligent substation switching value local module is used as a new thing, and the following problems exist in the aspect of operation and maintenance: (1) the switching value on-site module is used for acquiring, transmitting and controlling switching value information such as positions of a disconnecting link and a circuit breaker, is a 'hand' and a 'foot' of intelligent control of the whole transformer substation, and is equivalent to a 'black box' for operation and maintenance staff. Meanwhile, the switching value on-site module adopts a brand-new HSR looped network communication protocol, and related testing means and testing equipment are lacked in China, so that the safe operation of the transformer substation is greatly responded. (2) The switching value on-site module has wide application scene, huge application quantity, large workload of detection personnel and huge influence on operation and detection efficiency by batch automatic detection. Therefore, how to realize the system for automatically testing the switching value local module solves the problems that the switching value local module of the third-generation intelligent substation is lack of a detection tool and the batch automatic maintenance of a plurality of switching value local modules is realized, and becomes a key technical problem to be solved urgently.
Disclosure of Invention
The technical problems to be solved by the invention are as follows: aiming at the problems in the prior art, the invention provides a switching value local module testing system of a third-generation intelligent substation and an application method thereof.
In order to solve the technical problems, the invention adopts the technical scheme that:
a third generation intelligent substation switching value local module test system comprises a case, a mainboard module, an HSR message communication module, an input module, an output module and a power module which are respectively arranged in the case, the mainboard module comprises a D/A conversion module, an HSR message analysis module, a central processing unit and an upper computer communication module which are connected in sequence, the D/A conversion module, the HSR message analysis module and the central processing unit are connected in sequence, the central processor is connected with the upper computer communication module, the input module and the output module are respectively connected with the D/A conversion module, the HSR message communication module is connected with the HSR message analysis module, the power supply module is respectively connected with the mainboard module, the HSR message communication module, the input and output module, the HSR message communication module comprises an HSR message sending port and an HSR message receiving port.
Preferably, the HSR message sending port is an LC fiber sending port.
Preferably, the HSR message receiving port is an LC fiber collection port.
Preferably, the upper computer communication module and the MMS protocol communication module are both Ethernet communication modules.
Preferably, the HSR message parsing module is an FPGA module.
Preferably, the motherboard module, the HSR message communication module, the input module, the output module and the power module are all plug-in board card structures and are installed in the chassis in a plug-in manner.
The invention also provides an application method of the third-generation intelligent substation switching value local module test system, which comprises the step of automatic test for converting the input value into the HSR message, and the detailed steps comprise:
A1) the HSR message communication module, the input quantity module and the output quantity module are respectively connected with the switching quantity local module to be tested;
A2) setting the MAC address of the tested switch local module;
A3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step a 4);
A4) outputting a module fitting position opening amount to a tested switching value on-site module through an opening amount module aiming at a current switching value measuring point, and recording the sending time T1 of the module fitting position opening amount;
A5) judging whether HSR messages corresponding to the mold fitting bit input amount can be received through the HSR message communication module according to the MAC address of the tested switching value local module, if the HSR messages corresponding to the mold fitting bit input amount cannot be received, judging that the test of the current switching value point fails, recording the test result, and skipping to execute the step A9); if the HSR message corresponding to the modulus matching bit opening amount can be received, recording the time T2 when the corresponding HSR message is received, and calculating the switching value closing conversion time | T2-T1 |;
A6) aiming at the current switch measurement point, outputting the analog branch input quantity to the tested switch quantity local module through the input and output quantity module, and recording the sending time T3 of the analog branch input quantity;
A7) judging whether HSR messages corresponding to the analog branch opening amount can be received through the HSR message communication module according to the MAC address of the tested switching amount local module, if the HSR messages corresponding to the analog branch opening amount cannot be received, judging that the test of the current switching amount point fails, recording the test result, and skipping to execute the step A9); if the HSR message corresponding to the analog quantile division input quantity can be received, recording the time T4 of receiving the corresponding HSR message, and calculating the quantile conversion time | T4-T3| of the switching quantity;
A8) checking whether the number of the current switch measurement point in the received HSR message is consistent with the actual number of the current switch measurement point, and calculating switch quantity on-position conversion time | T2-T1| and switch quantity off-position conversion time | T4-T3 |;
A9) judging whether the switch measurement point of the tested switch quantity local module is traversed or not, if not, traversing and selecting the next current switch measurement point from the tested switch quantity local module, and jumping to execute the step A4); otherwise, judging that all the switch measurement points are tested;
A10) and acquiring the test results of all the switch measurement points, generating a test report and ending.
Preferably, the method further comprises a step of automatic testing of HSR message conversion into export quantity, and the detailed steps comprise:
B1) the HSR message communication module, the input quantity module and the output quantity module are respectively connected with the switching quantity local module to be tested;
B2) setting the MAC address of the tested switch local module;
B3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step B4);
B4) for the current switching value measuring point, outputting a module fitting bit HSR message to the switching value local module to be tested through an HSR message communication module according to the MAC address of the switching value local module to be tested, and recording the sending time T5 of the module fitting bit HSR message;
B5) judging whether the module fitting bit output can be received through the input module, if the module fitting bit output cannot be received, judging that the test of the current switch measuring point fails, recording the test result, and jumping to execute the step B9); if the mold fitting position opening amount can be received, recording the time T6 of receiving the mold fitting position opening amount, and calculating the switching value closing conversion time | T6-T5 |;
B6) aiming at the current switching value measuring point, outputting an analog quantile HSR message to the switching value local module to be tested through the HSR message communication module according to the MAC address of the switching value local module to be tested, and recording the sending time T7 of the analog quantile HSR message;
B7) judging whether the simulated separation output quantity can be received through the input quantity module, if the simulated separation output quantity cannot be received, judging that the test of the current switch measurement point fails, recording the test result, and jumping to execute the step B9); if the analog branch separation amount can be received, recording the moment T8 of receiving the analog branch separation amount, and calculating the branch conversion time | T8-T7| of the switching value;
B8) calculating switching value bit-closing conversion time | T6-T5| and switching value bit-separating conversion time | T8-T7 |;
B9) judging whether the switch measurement point of the tested switch quantity local module is traversed or not, if not, traversing and selecting the next current switch measurement point from the tested switch quantity local module, and jumping to execute the step B4); otherwise, judging that all the switch measurement points are tested;
B10) and acquiring the test results of all the switch measurement points, generating a test report and ending.
Preferably, the method further comprises the step of performing a drive-in jitter test, and the detailed steps comprise:
C1) the HSR message communication module, the input quantity module and the output quantity module are respectively connected with the switching quantity local module to be tested;
C2) completing HSR message communication setting of the tested switching value local module;
C3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step C4);
C4) sending switching value bit-division switching bit jitter to a tested switching value local module through a switching value output module, and respectively jittering a preset first time length and a preset second time length, wherein the first time length is less than the jitter elimination time of the tested switching value local module, the second time length is greater than the jitter elimination time of the tested switching value local module, and respectively judging whether the jitter is recognized, if the jitter under the first time length can not be recognized and the jitter under the second time length can be recognized, judging that the switching-in jitter function of the tested switching value local module is normal; if the jitter can be identified under the first time length and the jitter can not be identified under the second time length, judging that the jitter function of the tested switching value local module is abnormal;
C5) sending switching value on-position and on-position variation bit jitter to a tested switching value on-site module through an output module, respectively jittering for a preset first time length and a preset second time length, wherein the second time length is longer than the first time length, and respectively judging whether the jitter is recognized, if the jitter under the first time length cannot be recognized and the jitter under the second time length can be recognized, judging that the on-site module of the tested switching value has a normal jitter function; if the jitter can be identified under the first time length and the jitter can not be identified under the second time length, judging that the jitter function of the tested switching value local module is abnormal;
C6) and acquiring a test result, generating a test report and ending.
Preferably, the method further comprises the step of performing a repair mechanism test, and the detailed steps comprise:
D1) the HSR message communication module, the input quantity module and the output quantity module are respectively connected with the switching quantity local module to be tested;
D2) completing HSR message communication setting of the tested switching value local module;
D3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step D4);
D4) ①, sending an on-site hard contact on/off state to the on-site module of the switching quantity to be tested, detecting whether a corresponding HSR message sent by the on-site module of the switching quantity to be tested has a maintenance bit, if so, judging that the maintenance mechanism of the on-site module of the switching quantity to be tested is normal, otherwise, judging that the maintenance mechanism of the on-site module of the switching quantity to be tested is abnormal, ②, sending an HSR message to the on-site module of the switching quantity to be tested, when the maintenance state of the on-site module of the switching quantity to be tested is consistent with the maintenance state set in the on-site module test system of the switching quantity of a third generation intelligent substation, the on-site module refuses to execute the sent HSR message command, judging that the maintenance mechanism of the on-site module of the switching quantity to be tested is abnormal, when the maintenance state of the on-site module of the switching quantity to be tested is inconsistent with the maintenance state of the measurement and control device, judging that the maintenance mechanism of the on-site module of the switching quantity to be tested is abnormal, if the maintenance state of the on-site module of the switching quantity to be tested is not consistent with the maintenance state set in-site module of the switching quantity to be tested, judging that the on-site module of the switching quantity to be tested is influenced by the maintenance mechanism, otherwise, the maintenance mechanism of the on-site module of the switching quantity to be tested is not influenced by the switching quantity to be tested, if the maintenance mechanism, the switching quantity to be tested is normal forwarding module;
D5) ①, sending an opening amount hard contact on/off state to the tested switching amount local module, detecting whether a corresponding HSR message sent by the tested switching amount local module has a maintenance bit, if so, judging that the maintenance mechanism of the tested switching amount local module is abnormal in function, otherwise, judging that the maintenance mechanism of the tested switching amount local module is normal in function, ②, sending an HSR message to the tested switching amount local module, when the maintenance state of the tested switching amount local module is consistent with the maintenance state set in the third-generation intelligent substation switching amount local module test system, refusing the HSR message command sent by the tested switching amount local module, judging that the maintenance mechanism of the tested switching amount local module is abnormal in function, when the maintenance state of the tested switching amount local module is inconsistent with the maintenance state of the measurement and control device, controlling the related switching amount command sent by the tested switching amount local module, judging that the tested switching amount local module is abnormal in function, if the maintenance state of the tested switching amount local module is influenced by other tested switching amount local module in-place switching amount forwarding mechanism, otherwise, judging that the tested switching amount local module is abnormal in function and the maintenance mechanism is influenced by other HSR message;
D6) and acquiring a test result, generating a test report, ending and exiting.
Compared with the prior art, the on-off quantity in-place module test system of the third-generation intelligent substation has the following advantages:
1. the invention relates to a switching value local module testing system of a third-generation intelligent substation, which comprises a case, and a mainboard module, an HSR message communication module, an input quantity module, an output quantity module and a power module which are respectively installed in the case, wherein the mainboard module comprises a D/A conversion module, an HSR message analysis module, a central processing unit and an upper computer communication module which are sequentially connected, the HSR message communication module comprises an HSR message sending port and an HSR message receiving port, and basic hardware can be provided for testing the switching value local module of the third-generation intelligent substation based on the components, the HSR protocol analysis simulation of the switching value on-site module can be realized, a new method is provided for batch automatic test and maintenance of the functions and the performance of the switching value on-site module, the maintenance efficiency of the third-generation intelligent substation is greatly improved, and the safe and reliable operation of a power grid is ensured.
2. The correctness of the mapping correlation of the hard contact switching value and the HSR and the rapidity of the conversion time are important function and performance indexes of a switching value on-site module and are main test items of a switching value on-site module test system, the function and the performance of the switching value on-site module of a third-generation intelligent substation are mainly automatically tested by the test system, the overhauling and maintenance efficiency of the intelligent substation is improved, and the safe and efficient operation of a power grid is guaranteed.
The application method of the switching value local module testing system of the third-generation intelligent substation can realize batch automatic detection of the switching value local module function and performance on the basis of the switching value local module testing system of the third-generation intelligent substation, can realize automatic testing, report production flow, anti-shake time testing, maintenance mechanism testing and other testing aiming at the switching value local module of the third-generation intelligent substation, can realize HSR protocol analysis and simulation of the switching value local module, provides a new method for batch automatic testing and maintenance of the switching value local module function and performance, greatly improves the maintenance efficiency of the third-generation intelligent substation, and ensures safe and reliable operation of a power grid.
Drawings
Fig. 1 is a schematic structural diagram of a system according to an embodiment of the present invention.
Fig. 2 is a schematic diagram of a test interface connection according to an embodiment of the present invention.
Fig. 3 is a flowchart of an automatic test for converting the input volume into the HSR message according to the embodiment of the present invention.
FIG. 4 is a flowchart illustrating an embodiment of an open jitter test.
FIG. 5 is a flowchart illustrating a test of a repair mechanism according to an embodiment of the present invention.
Illustration of the drawings: 1. a motherboard module; 11. a D/A conversion module; 12. an HSR message analysis module; 13. a central processing unit; 14. a monitoring unit; 15. the upper computer communication module; 2. an HSR message communication module; 21. HSR message sending port; 22. an HSR message receiving port; 3. an input amount module; 4. an output module; 5. and a power supply module.
Detailed Description
As shown in fig. 1, the third generation intelligent substation switching value in-place module testing system of this embodiment includes a chassis, and a motherboard module 1, an HSR message communication module 2, an input module 3, an output module 4 and a power module 5 which are respectively installed in the chassis, where the motherboard module 1 includes a D/a conversion module 11, an HSR message parsing module 12, a central processing unit 13 and an upper computer communication module 15 which are connected in sequence, the D/a conversion module 11, the HSR message parsing module 12 and the central processing unit 13 are connected in sequence, the central processing unit 13 is connected with the upper computer communication module 15, the input module 3 and the output module 4 are respectively connected with the D/a conversion module 11, the HSR message communication module 2 and the HSR message parsing module 12 are connected, the power module 5 is respectively connected with the motherboard module 1, the HSR message communication module 2, the input module 3 and the output module 4, the HSR message communication module 2 includes an HSR message sending port 21 and an HSR message receiving port 22.
The main board module 1 is a core component of the whole test system, and is connected with a PC (upper computer) through an upper computer communication module 15 (an ethernet module or a WiFi module) to realize the control output of upper computer software to the test system. After a control output command sent by the upper computer software is calculated and processed by the central processing unit 13, the relevant control command is transmitted to the HSR message communication module 2, the input quantity module 3 and the output quantity module 4 by the HSR message analysis module 12, so that the simulated sending and collection of the HSR message and the simulation and collection of the position of a switching quantity contact are realized. In this embodiment, the HSR message parsing module 12 is an FPGA module. The central processing unit 13 is realized by an ARM processor. In addition, the main board module 1 is further provided with a monitoring unit 14, the monitoring unit 14 is connected with the central processing unit 13 and used for outputting data to the tester for monitoring, and self-checking of the test system of the measurement and control submachine of the third-generation intelligent substation is achieved.
The HSR message sending port 21 of the HSR message communication module 2 is an LC optical fiber sending port, and the HSR message receiving port 22 is an LC optical fiber collecting port. The HSR message communication module 2 is respectively provided with 4 paths of LC optical fiber transmitting ports and 4 paths of LC optical fiber collecting ports, and all the modules adopt kilomega optical fiber modules. The LC optical fiber transmitting port mainly simulates a disconnecting link and a breaker position switching-on/off command HSR protocol message sent by the measurement and control device and other forwarded on-site module HSR protocol messages; the LC optical fiber acquisition port mainly acquires HSR protocol messages sent by the on-off on-site module.
The input quantity module 3 and the output quantity module 4 are both provided with 32 paths of switching quantity contacts, the contacts are connected with the outside by adopting a standard aviation plug, the input quantity contacts adopt an optical coupling structure, and the closing and opening time is not more than 100 ns.
The power module 5 is powered by an AC220 power supply, which converts an AC power supply into a 12V dc power supply to supply power to other plug-ins.
In this embodiment, the motherboard module 1, the HSR message communication module 2, the input module 3, the output module 4, and the power module 5 are all plug-in board card structures and are inserted into the chassis, and the plug-in board card structures are adopted to facilitate installation and maintenance.
As shown in fig. 2, in the use state of the switching value local module testing system of the third-generation intelligent substation of this embodiment, the HSR message sending port 21 is connected to the HSR message receiving port of the switching value local module to be tested, and is configured to receive the HSR messages of the disconnecting link and the circuit breaker control command HSR messages sent by the testing system, and the HSR messages of other local modules; the HSR message receiving port 22 and the HSR message sending port of the tested switching value local module are used for receiving HSR messages of other local modules forwarded by the tested switching value local module and HSR messages converted into switching positions by the disconnecting link and the circuit breaker; the input quantity module 3 is connected with a hard contact output port of the tested switching quantity local module and is used for receiving disconnecting link and circuit breaker control commands forwarded by the tested switching quantity local module; the switching output module 4 is connected with the hard contact input port of the switching value-location module to be tested and is used for sending the actual hard contact switching-on and switching-off positions of the circuit breaker and the disconnecting link to the switching value-location module to be tested.
In the embodiment, the PC upper computer software in the upper computer adopts an automatic test system to test a plurality of contact signals, realizes automatic test according to the receiving and transmitting closed-loop principle of the switching value contact position and the HSR protocol message switching value position, and can test the functions and performance indexes such as the correctness of the switching value contact mapping and the switching value position contact switching time. The related tests mainly comprise the following tests: (1) and testing the correctness of the HSR protocol message forwarded by the switching value local module. The HSR message communication module 2 of the test system simulates HSR protocol messages sent by other local test modules to the switch quantity local module to be tested, and meanwhile, the HSR protocol messages sent by the switch quantity local module are collected, and the consistency of the sent HSR protocol messages and the collected HSR protocol messages is compared by using a software system. (2) And the on-off quantity in-place testing module converts hard contact signals such as the positions of the disconnecting link and the circuit breaker into the correctness of the HSR protocol message. The switching on/off positions of the disconnecting link and the hard contact of the circuit breaker are simulated for the switching on/off on-site module of the switching value to be tested through the switching on/off module of the test system, and meanwhile, HSR protocol message position signals sent by the switching on/off on-site module are collected, and the correctness and the conversion time of the channel position correlation of the switching on/off on-site module are obtained through a software system. (3) And testing the correctness of the remote control command of the HSR protocol messages such as the positions of the disconnecting link and the circuit breaker, which is transmitted by the measurement and control device, converted into the opening amount of the hard contact. And simulating an HSR protocol message of the measurement and control device through the test system, simultaneously acquiring a corresponding switching value hard contact signal converted by the switching value local module, and acquiring the correctness and the conversion time of the channel position association of the switching value local module by using a software system.
In this embodiment, an automatic test software system is used to perform function and performance tests on all nodes of the local switching value module, and convert the HSR protocol messages into outgoing hard nodes and incoming hard nodes into HSR protocol messages to perform a comprehensive test. And testing and recording the correctness and the conversion time associated with the split-joint position mapping of each node signal, and after the test is finished, producing the test results and the records of all the nodes in a test report document form.
As shown in fig. 3, the application method of the switching value local module testing system of the third-generation intelligent substation in this embodiment includes a step of automatic testing for converting the input value into the HSR message, and the detailed steps include:
A1) the HSR message communication module 2, the input quantity module 3 and the output quantity module 4 are respectively connected with a tested on-off quantity local module;
A2) setting the MAC address of the tested switch local module;
A3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step a 4);
A4) outputting a module fitting position opening amount to a tested switching value on-site module through an opening amount module 4 aiming at a current switching value measuring point, and recording the sending time T1 of the module fitting position opening amount;
A5) judging whether HSR messages corresponding to the mold fitting bit input amount can be received through the HSR message communication module 2 according to the MAC address of the tested switching value local module, if the HSR messages corresponding to the mold fitting bit input amount cannot be received, judging that the test of the current switching value point fails, recording the test result, and skipping to execute the step A9); if the HSR message corresponding to the modulus matching bit opening amount can be received, recording the time T2 when the corresponding HSR message is received, and calculating the switching value closing conversion time | T2-T1 |;
A6) aiming at the current switch measurement point, the on-site module of the tested switch measurement outputs the simulated separation input quantity through the output quantity module 4, and records the sending time T3 of the simulated separation input quantity;
A7) judging whether HSR messages corresponding to the analog branch position opening amount can be received through the HSR message communication module 2 according to the MAC address of the tested switch position location module, if the HSR messages corresponding to the analog branch position opening amount cannot be received, judging that the test of the current switch position measuring point fails, recording the test result, and skipping to execute the step A9); if the HSR message corresponding to the analog quantile division input quantity can be received, recording the time T4 of receiving the corresponding HSR message, and calculating the quantile conversion time | T4-T3| of the switching quantity;
A8) checking whether the number of the current switch measurement point in the received HSR message is consistent with the actual number of the current switch measurement point, and calculating switch quantity on-position conversion time | T2-T1| and switch quantity off-position conversion time | T4-T3 |;
A9) judging whether the switch measurement point of the tested switch quantity local module is traversed or not, if not, traversing and selecting the next current switch measurement point from the tested switch quantity local module, and jumping to execute the step A4); otherwise, judging that all the switch measurement points are tested;
A10) and acquiring the test results of all the switch measurement points, generating a test report and ending.
The application method of the third-generation intelligent substation switching value local module testing system further comprises a step of automatic testing for converting the HSR message into the switching value, and the detailed steps comprise:
B1) the HSR message communication module 2, the input quantity module 3 and the output quantity module 4 are respectively connected with a tested on-off quantity local module;
B2) setting the MAC address of the tested switch local module;
B3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step B4);
B4) for the current switching value measuring point, outputting a module fitting bit HSR message to the switching value local module to be tested through the HSR message communication module 2 according to the MAC address of the switching value local module to be tested, and recording the sending time T5 of the module fitting bit HSR message;
B5) judging whether the module fitting bit output can be received through the input module 3, if the module fitting bit output cannot be received, judging that the test of the current switch measuring point fails, recording the test result, and jumping to execute the step B9); if the mold fitting position opening amount can be received, recording the time T6 of receiving the mold fitting position opening amount, and calculating the switching value closing conversion time | T6-T5 |;
B6) aiming at the current switching value measuring point, outputting an analog quantile HSR message to the switching value local module to be tested through the HSR message communication module 2 according to the MAC address of the switching value local module to be tested, and recording the sending time T7 of the analog quantile HSR message;
B7) judging whether the simulated branch separation output quantity can be received through the input quantity module 3, if the simulated branch separation output quantity cannot be received, judging that the test of the current switch measurement point fails, recording the test result, and jumping to execute the step B9); if the analog branch separation amount can be received, recording the moment T8 of receiving the analog branch separation amount, and calculating the branch conversion time | T8-T7| of the switching value;
B8) calculating switching value bit-closing conversion time | T6-T5| and switching value bit-separating conversion time | T8-T7 |;
B9) judging whether the switch measurement point of the tested switch quantity local module is traversed or not, if not, traversing and selecting the next current switch measurement point from the tested switch quantity local module, and jumping to execute the step B4); otherwise, judging that all the switch measurement points are tested;
B10) and acquiring the test results of all the switch measurement points, generating a test report and ending.
In the embodiment, an automatic test system software system is used for testing the jitter opening time of the switching value on-site module, the jitter opening time and the jitter elimination time are fixed to be 5ms, and when the position of the switching value is changed and the actual jitter time is within 4ms, the general on-site switching value module can be reliably unrecognized; when the actual jitter time is within 6ms, the universal local switching value module can be reliably identified. As shown in fig. 4, the application method of the third-generation intelligent substation switching value in-place module test system in this embodiment further includes a step of performing a start-in jitter test, and the detailed steps include:
C1) the HSR message communication module 2, the input quantity module 3 and the output quantity module 4 are respectively connected with a tested on-off quantity local module;
C2) completing HSR message communication setting of the tested switching value local module;
C3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step C4);
C4) sending switching value individual switching bit jitter to a tested switching value local module through an output module 4, respectively jittering a preset first time length and a preset second time length, wherein the first time length is smaller than the jitter elimination time of the tested switching value local module, the second time length is larger than the jitter elimination time of the tested switching value local module, and respectively judging whether the jitter is recognized, if the jitter under the first time length cannot be recognized and the jitter under the second time length can be recognized, judging that the switching-in jitter function of the tested switching value local module is normal; if the jitter can be identified under the first time length and the jitter can not be identified under the second time length, judging that the jitter function of the tested switching value local module is abnormal; in the embodiment, the jitter elimination time of the tested switching value on-site module is specifically 5ms, the first time length is 4ms, and the second time length is 6 ms;
C5) sending switching value on-position and off-position jitter to a tested switching value on-site module through an output module 4, respectively jittering for a preset first time length and a second time length, wherein the second time length is longer than the first time length, and respectively judging whether the jitter is recognized, if the jitter can not be recognized under the first time length and the jitter can be recognized under the second time length, judging that the on-site module of the tested switching value is normally started to jitter; if the jitter can be identified under the first time length and the jitter can not be identified under the second time length, judging that the jitter function of the tested switching value local module is abnormal;
C6) and acquiring a test result, generating a test report and ending.
In the embodiment, an automatic test system software system is used for testing the maintenance mechanism time of the switching value on-site module, and for the remote control and other commands issued by the measurement and control device, when the maintenance state of the switching value on-site module surface is consistent with the maintenance state of the measurement and control device, the universal switching value module can correctly execute the related control command of the measurement and control device; when the on-site module maintenance state of the switching value is inconsistent with the maintenance state of the measurement and control device, the general switching value device can not execute the related control command of the measurement and control device. When the switching value local module forwards the HSR protocol message of other local modules, whether the switching value local module is in the maintenance state or not, the maintenance state for forwarding the HSR protocol message of other modules should not be influenced. For the switching value local module, when the switching value local module is put into the maintenance pressing plate, the maintenance mark position of the HSR protocol message is externally sent to be 1, and when the switching value local module is withdrawn from the maintenance pressing plate, the maintenance mark position of the HSR protocol message is externally sent to be 0. As shown in fig. 5, the application method of the switching value in-place module test system of the third generation intelligent substation further includes a step of performing a maintenance mechanism test, and the detailed steps include:
D1) the HSR message communication module 2, the input quantity module 3 and the output quantity module 4 are respectively connected with a tested on-off quantity local module;
D2) completing HSR message communication setting of the tested switching value local module;
D3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step D4);
D4) ①, sending an opening quantity hard contact on/off state to the tested switching quantity local module, detecting whether a corresponding HSR message sent by the tested switching quantity local module has a maintenance bit, if the maintenance bit has the maintenance bit, judging that the maintenance mechanism function of the tested switching quantity local module is normal, otherwise, judging that the maintenance mechanism function of the tested switching quantity local module is abnormal, ②, sending an HSR message to the tested switching quantity local module, if the maintenance state of the tested switching quantity local module is consistent with the maintenance state set in the testing system of the third-generation intelligent switching quantity local module, refusing to execute the sent HSR message command by the tested switching quantity local module, judging that the maintenance mechanism function of the tested switching quantity local module is abnormal, if the maintenance state of the tested switching quantity local module is not consistent with the maintenance state of the testing device local module, refusing to execute the sent HSR message command, judging that the maintenance mechanism function of the tested switching quantity local module is abnormal, if the maintenance state of the tested switching quantity local module is not consistent with the maintenance state of the testing and testing device, judging that the tested switching quantity local module is influenced by the maintenance mechanism maintenance module, otherwise, if the tested switching quantity local module is not influenced by the maintenance mechanism is normal, judging that the tested switching quantity local module is influenced by the maintenance module by the maintenance mechanism jump of the HSR module, if the maintenance module, the tested switching quantity local module, and the maintenance module is not consistent with the maintenance mechanism is judged by the maintenance module, if the maintenance mechanism is judged by the tested switching quantity local module, and the maintenance module, and the testing module, if the maintenance module, and the maintenance module, if the tested switching quantity local module is judged that;
D5) ①, sending an opening amount hard contact on/off state to the tested switching amount local module, detecting whether a corresponding HSR message sent by the tested switching amount local module has a maintenance bit, if so, judging that the maintenance mechanism of the tested switching amount local module is abnormal in function, otherwise, judging that the maintenance mechanism of the tested switching amount local module is normal in function, ②, sending an HSR message to the tested switching amount local module, when the maintenance state of the tested switching amount local module is consistent with the maintenance state set in the third-generation intelligent substation switching amount local module test system, refusing the HSR message command sent by the tested switching amount local module, judging that the maintenance mechanism of the tested switching amount local module is abnormal in function, when the maintenance state of the tested switching amount local module is inconsistent with the maintenance state of the measurement and control device, controlling the related switching amount command sent by the tested switching amount local module, judging that the tested switching amount local module is abnormal in function, if the maintenance state of the tested switching amount local module is influenced by other tested switching amount local module in-place switching amount forwarding mechanism, otherwise, judging that the tested switching amount local module is abnormal in function and the maintenance mechanism is influenced by other HSR message;
D6) and acquiring a test result, generating a test report, ending and exiting.
The above description is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above embodiments, and all technical solutions belonging to the idea of the present invention belong to the protection scope of the present invention. It should be noted that modifications and embellishments within the scope of the invention may occur to those skilled in the art without departing from the principle of the invention, and are considered to be within the scope of the invention.
Claims (4)
1. An application method of a third-generation intelligent substation switching value local module test system is characterized in that the third-generation intelligent substation switching value local module test system comprises a case, and a mainboard module (1), an HSR message communication module (2), an input module (3), an output module (4) and a power module (5) which are respectively installed in the case, wherein the mainboard module (1) comprises a D/A conversion module (11), an HSR message analysis module (12), a central processing unit (13) and an upper computer communication module (15) which are sequentially connected, the D/A conversion module (11), the HSR message analysis module (12) and the central processing unit (13) are sequentially connected, the central processing unit (13) is connected with the upper computer communication module (15), the input module (3) and the output module (4) are respectively connected with the D/A conversion module (11), the HSR message communication module (2) is connected with the HSR message analysis module (12), the power module (5) is connected with the mainboard module (1), the HSR message communication module (2), the input quantity module (3) and the output quantity module (4) respectively, the HSR message communication module (2) comprises an HSR message sending port (21) and an HSR message receiving port (22), the application method comprises the step of converting the input quantity into the automatic test of the HSR message, and the detailed steps comprise:
A1) the HSR message communication module (2), the input quantity module (3) and the output quantity module (4) are respectively connected with a tested on-off quantity local module;
A2) setting the MAC address of the tested switch local module;
A3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step a 4);
A4) outputting a modulus fitting bit input amount to a tested switching value on-site module through an input-output module (4) aiming at a current switching value measuring point, and recording the sending time T1 of the modulus fitting bit input amount;
A5) judging whether HSR messages corresponding to the mold fitting bit input amount can be received through the HSR message communication module (2) or not according to the MAC address of the tested switching value local module, if the HSR messages corresponding to the mold fitting bit input amount cannot be received, judging that the test of the current switching value point fails, recording the test result, and skipping to execute the step A9; if the HSR message corresponding to the modulus matching bit opening amount can be received, recording the time T2 when the corresponding HSR message is received, and calculating the switching value closing conversion time | T2-T1 |;
A6) aiming at the current switching value measuring point, the on-off value module (4) outputs the analog branch on-off value to the tested switching value on-site module, and records the sending time T3 of the analog branch on-off value;
A7) judging whether HSR messages corresponding to the analog branch position opening amount can be received through the HSR message communication module (2) or not according to the MAC address of the tested switch position location module, if the HSR messages corresponding to the analog branch position opening amount cannot be received, judging that the test of the current switch position measuring point fails, recording the test result, and skipping to execute the step A9; if the HSR message corresponding to the analog quantile division input quantity can be received, recording the time T4 of receiving the corresponding HSR message, and calculating the quantile conversion time | T4-T3| of the switching quantity;
A8) checking whether the number of the current switch measurement point in the received HSR message is consistent with the actual number of the current switch measurement point, and calculating switch quantity on-position conversion time | T2-T1| and switch quantity off-position conversion time | T4-T3 |;
A9) judging whether the switch measurement point of the tested switch quantity local module is traversed or not, if not, traversing and selecting the next current switch measurement point from the tested switch quantity local module, and jumping to execute the step A4); otherwise, judging that all the switch measurement points are tested;
A10) and acquiring the test results of all the switch measurement points, generating a test report and ending.
2. The application method of the third generation intelligent substation switching value local module test system according to claim 1, further comprising a step of converting an HSR message into an automatic test of an export value, the detailed steps comprising:
B1) the HSR message communication module (2), the input quantity module (3) and the output quantity module (4) are respectively connected with a tested on-off quantity local module;
B2) setting the MAC address of the tested switch local module;
B3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step B4);
B4) aiming at the current switching value measuring point, outputting a model fitting bit HSR message to the switching value local module to be tested through an HSR message communication module (2) according to the MAC address of the switching value local module to be tested, and recording the sending time T5 of the model fitting bit HSR message;
B5) judging whether the module fitting position output can be received through the input module (3), if the module fitting position output cannot be received, judging that the test of the current switch measuring point fails, recording the test result, and jumping to execute the step B9); if the mold fitting position opening amount can be received, recording the time T6 of receiving the mold fitting position opening amount, and calculating the switching value closing conversion time | T6-T5 |;
B6) aiming at the current switching value measuring point, outputting an analog sub-position HSR message to the tested switching value local module through an HSR message communication module (2) according to the MAC address of the tested switching value local module, and recording the sending time T7 of the analog sub-position HSR message;
B7) judging whether the simulated branch separation output quantity can be received through the input quantity module (3), if the simulated branch separation output quantity cannot be received, judging that the test of the current switch measurement point fails, recording the test result, and jumping to execute the step B9); if the analog branch separation amount can be received, recording the moment T8 of receiving the analog branch separation amount, and calculating the branch conversion time | T8-T7| of the switching value;
B8) calculating switching value bit-closing conversion time | T6-T5| and switching value bit-separating conversion time | T8-T7 |;
B9) judging whether the switch measurement point of the tested switch quantity local module is traversed or not, if not, traversing and selecting the next current switch measurement point from the tested switch quantity local module, and jumping to execute the step B4); otherwise, judging that all the switch measurement points are tested;
B10) and acquiring the test results of all the switch measurement points, generating a test report and ending.
3. The method for applying the third generation intelligent substation switching value in-place module test system according to claim 1, further comprising the step of performing a run-in jitter test, the detailed steps comprising:
C1) the HSR message communication module (2), the input quantity module (3) and the output quantity module (4) are respectively connected with a tested on-off quantity local module;
C2) completing HSR message communication setting of the tested switching value local module;
C3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step C4);
C4) sending switching value bit-division switching bit jitter to a tested switching value local module through a switching value output module (4), and respectively jittering for a preset first time length and a preset second time length, wherein the first time length is less than the jitter elimination time of the tested switching value local module, the second time length is greater than the jitter elimination time of the tested switching value local module, and respectively judging whether the jitter is recognized, if the jitter under the first time length cannot be recognized and the jitter under the second time length can be recognized, judging that the switching value local module switching jitter function is normal; if the jitter can be identified under the first time length and the jitter can not be identified under the second time length, judging that the jitter function of the tested switching value local module is abnormal;
C5) sending switching value on-position and on-position variation bit jitter to a tested switching value on-site module through a switching value output module (4), respectively jittering for a preset first time length and a preset second time length, wherein the second time length is longer than the first time length, respectively judging whether the jitter is recognized, and if the jitter under the first time length cannot be recognized and the jitter under the second time length can be recognized, judging that the switching-in jitter function of the tested switching value on-site module is normal; if the jitter can be identified under the first time length and the jitter can not be identified under the second time length, judging that the jitter function of the tested switching value local module is abnormal;
C6) and acquiring a test result, generating a test report and ending.
4. The application method of the third generation intelligent substation switching value local module test system according to claim 1, characterized by further comprising the step of performing maintenance mechanism test, and the detailed steps comprise:
D1) the HSR message communication module (2), the input quantity module (3) and the output quantity module (4) are respectively connected with a tested on-off quantity local module;
D2) completing HSR message communication setting of the tested switching value local module;
D3) dynamically acquiring self-checking information of the tested switching value local module, judging whether the self-checking information contains a self-checking alarm, if so, judging that the tested switching value local module is abnormal, interrupting the test and quitting; otherwise, traversing and selecting a current switch measurement point from the tested switch in-situ module; jumping to perform step D4);
D4) ①, sending an opening quantity hard contact on/off state to the tested switching quantity local module, detecting whether a corresponding HSR message sent by the tested switching quantity local module has a maintenance bit, if the maintenance bit has the maintenance bit, judging that the maintenance mechanism function of the tested switching quantity local module is normal, otherwise, judging that the maintenance mechanism function of the tested switching quantity local module is abnormal, ②, sending an HSR message to the tested switching quantity local module, if the maintenance state of the tested switching quantity local module is consistent with the maintenance state set in the testing system of the third-generation intelligent switching quantity local module, refusing to execute the sent HSR message command by the tested switching quantity local module, judging that the maintenance mechanism function of the tested switching quantity local module is abnormal, if the maintenance state of the tested switching quantity local module is not consistent with the maintenance state of the testing device local module, refusing to execute the sent HSR message command, judging that the maintenance mechanism function of the tested switching quantity local module is abnormal, if the maintenance state of the tested switching quantity local module is not consistent with the maintenance state of the testing and testing device, judging that the tested switching quantity local module is influenced by the maintenance mechanism maintenance module, otherwise, if the tested switching quantity local module is not influenced by the maintenance mechanism is normal, judging that the tested switching quantity local module is influenced by the maintenance module by the maintenance mechanism jump of the HSR module, if the maintenance module, the tested switching quantity local module, and the maintenance module is not consistent with the maintenance mechanism is judged by the maintenance module, if the maintenance mechanism is judged by the tested switching quantity local module, and the maintenance module, and the testing module, if the maintenance module, and the maintenance module, if the tested switching quantity local module is judged that;
D5) ①, sending an opening amount hard contact on/off state to the tested switching amount local module, detecting whether a corresponding HSR message sent by the tested switching amount local module has a maintenance bit, if so, judging that the maintenance mechanism of the tested switching amount local module is abnormal in function, otherwise, judging that the maintenance mechanism of the tested switching amount local module is normal in function, ②, sending an HSR message to the tested switching amount local module, when the maintenance state of the tested switching amount local module is consistent with the maintenance state set in the third-generation intelligent substation switching amount local module test system, refusing the HSR message command sent by the tested switching amount local module, judging that the maintenance mechanism of the tested switching amount local module is abnormal in function, when the maintenance state of the tested switching amount local module is inconsistent with the maintenance state of the measurement and control device, controlling the related switching amount command sent by the tested switching amount local module, judging that the tested switching amount local module is abnormal in function, if the maintenance state of the tested switching amount local module is influenced by other tested switching amount local module in-place switching amount forwarding mechanism, otherwise, judging that the tested switching amount local module is abnormal in function and the maintenance mechanism is influenced by other HSR message;
D6) and acquiring a test result, generating a test report, ending and exiting.
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