CN109496271B - Visual detection system and light field correction method thereof - Google Patents

Visual detection system and light field correction method thereof Download PDF

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CN109496271B
CN109496271B CN201780036107.3A CN201780036107A CN109496271B CN 109496271 B CN109496271 B CN 109496271B CN 201780036107 A CN201780036107 A CN 201780036107A CN 109496271 B CN109496271 B CN 109496271B
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image
light
background plate
light field
detection image
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CN109496271A (en
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阳光
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Shenzhen A&E Intelligent Technology Institute Co Ltd
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Shenzhen A&E Intelligent Technology Institute Co Ltd
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Abstract

A vision inspection system and a light field correction method thereof. The method comprises the following steps: acquiring an image of a background plate (22) illuminated by an illumination light source (21) to form a first detection image (31); acquiring images of a background plate (22) irradiated by an illumination light source (21) and an object (23) to be detected arranged on the background plate (22), and further forming a second detection image (32); the light field intensities of the corresponding positions on the second detection image (32) are subjected to light field correction by using the light field intensities of different positions of the first detection image (31). In the way, the first detection image (31) obtained by the background plate (22) under the illumination of the illumination light source (21) is used for carrying out light field correction on the background plate (22) and the second detection image (32) obtained by the object to be detected (23) under the illumination of the illumination light source (21), so that the uneven light field distribution caused by the different light emitting directions of the illumination light source (21) can be effectively eliminated.

Description

Visual detection system and light field correction method thereof
Technical Field
The embodiment of the invention relates to the field of visual detection, in particular to a visual detection system and a light field correction method thereof.
Background
Industrial vision inspection is generally to identify a predetermined target, such as a scratch, a crack, etc., from an image of an object to be inspected by image-capturing the object to be inspected, which is disposed on a background plate, and by image-recognizing the captured image. In the field of industrial vision detection, it is very important how to supplement light to an object to be detected by using an illumination light source. However, the illumination light sources all have a certain light-emitting angle, so that the light fields irradiated on the background plate and the object to be detected are not uniformly distributed, and errors are easily caused in subsequent image recognition.
In order to eliminate the optical field distribution unevenness, the current method generally adopted in the industry is to adopt an ideal planar light source as much as possible. This approach is demanding on the light source and difficult to implement.
Disclosure of Invention
In order to at least partially solve the above problem, an embodiment of the present invention provides a light field correction method for a vision inspection system, including: acquiring an image of the background plate under the irradiation of the illumination light source, and further forming a first detection image; carrying out image acquisition on a background plate irradiated by an illumination light source and an object to be detected arranged on the background plate so as to form a second detection image; and carrying out light field correction on the light field intensity of the corresponding position on the second detection image by using the light field intensity of different positions of the first detection image.
The step of performing light field correction on the light field intensity at the corresponding position on the second detection image by using the light field intensities at different positions of the first detection image comprises the following steps: the light field intensities of different locations on the second detection image are subtracted from the light field intensities of corresponding locations on the first detection image.
Wherein, the step of carrying out image acquisition to the background board under the illumination light source illumination, and then form first detection image further includes: calibrating the light emitting direction of the illumination light source relative to the background plate on the first detection image; the step of collecting images of the background plate and the object to be detected arranged on the background plate under the irradiation of the illumination light source, and further forming a second detection image further comprises: calibrating the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image; the step of performing light field correction on the light field intensity of the corresponding position on the second detection image by using the light field intensity of the different position of the first detection image comprises the following steps: and carrying out light field correction on the light field intensity of the corresponding position in the same light emergent direction on the second detection image by using the light field intensity of different positions of the first detection image.
The step of calibrating the light emitting direction of the illumination light source relative to the background plate on the first detection image comprises the following steps: forming a first calibration pattern for representing the light emitting direction of the illumination light source relative to the background plate on the background plate, and carrying out image acquisition to further form a first calibration image; and calibrating the light emitting direction of the illumination light source relative to the background plate on the first detection image by using the first calibration pattern on the first calibration image.
The method comprises the following steps of forming a first calibration pattern used for representing the light emitting direction of a lighting source relative to a background plate on the background plate, collecting an image, and forming a first calibration image, wherein the step of forming the first calibration image comprises the following steps: the background plate is irradiated by utilizing the calibration light sources arranged according to a preset mode or by utilizing the illumination light sources shielded by the light shielding plates provided with the light transmission areas arranged in the preset mode, and then a first calibration pattern is formed on the background plate.
Wherein, the step of calibrating the light-emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image comprises the following steps: forming a second calibration pattern for representing the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the background plate and the object to be detected, and acquiring images to further form a second calibration image; and calibrating the light emergent direction of the illumination light source relative to the background plate and the object to be detected on the second detection image by utilizing the second calibration pattern on the second calibration image.
The method comprises the following steps of forming a first calibration pattern for representing the light emitting direction of a lighting source relative to a background plate and an object to be detected on the background plate and the object to be detected, and acquiring an image, wherein the step of forming the first calibration pattern comprises the following steps: and irradiating the background plate by using the calibration light sources arranged in a preset mode or irradiating the background plate and the object to be detected by using the illumination light source shielded by the light shielding plate provided with the light transmission areas arranged in the preset mode, thereby forming a second calibration pattern on the background plate and the object to be detected.
The first calibration pattern and the second calibration pattern are respectively a plurality of dot patterns arranged at intervals.
The step of performing light field correction on the light field intensity of the corresponding position in the same light emitting direction on the second detection image by using the light field intensity of different positions of the first detection image comprises the following steps: and subtracting the light field intensity of the different positions of the second detection image from the light field intensity of the corresponding positions in the same light emergent direction on the first detection image.
The step of performing light field correction on the light field intensity of the corresponding position in the same light emitting direction on the second detection image by using the light field intensity of different positions of the first detection image comprises the following steps: correcting the light field intensity of a first detection image corresponding to the placement area of the object to be detected according to the height of the object to be detected; and performing light field correction on the light field intensity of the corresponding position in the same light emergent direction on the second detection image by using the corrected light field intensity of the first detection image.
In order to at least partially solve the above problems, an embodiment of the present invention further provides a vision detection system, including an illumination light source, an image acquisition device, and a processor, where the image acquisition device performs image acquisition on a background plate illuminated by the illumination light source to form a first detection image, performs image acquisition on the background plate illuminated by the illumination light source and an object to be detected disposed on the background plate to form a second detection image, and the processor performs light field correction on light field intensities at corresponding positions on the second detection image by using light field intensities at different positions of the first detection image.
Wherein the processor subtracts the light field intensity of a different location on the second detected image from the light field intensity of a corresponding location on the first detected image.
The visual detection system further comprises a calibration device, the calibration device is used for calibrating the light-emitting direction of the illumination light source relative to the background plate on the first detection image, calibrating the light-emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image, and the processor performs light field correction on the light field intensity of the corresponding position of the same light-emitting direction on the second detection image by using the light field intensity of different positions of the first detection image.
The processor utilizes the first calibration pattern on the first calibration image to calibrate the light emitting direction of the illumination light source relative to the background plate on the first detection image.
The calibration device further forms a second calibration pattern used for representing the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the background plate and the object to be detected, and image acquisition is carried out by image acquisition equipment, so that a second calibration image is formed; the processor utilizes a second calibration pattern on the second calibration image to calibrate the light-emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image.
The calibration device is a calibration light source arranged in a preset mode or a shading plate provided with a light-transmitting area arranged in a preset mode.
The first calibration pattern and the second calibration pattern are respectively a plurality of dot patterns arranged at intervals.
And the processor subtracts the light field intensity of different positions of the second detection image from the light field intensity of corresponding positions of the same light emitting direction on the first detection image.
The processor corrects the light field intensity of the first detection image corresponding to the placement area of the object to be detected according to the height of the object to be detected, and further corrects the light field intensity of the corresponding position in the same light emitting direction on the second detection image by using the corrected light field intensity of the first detection image.
By the mode, the first detection image obtained by the background plate under the irradiation of the illumination light source is used for carrying out light field correction on the background plate and the second detection image obtained by the object to be detected under the irradiation of the illumination light source, so that the uneven distribution of the light field generated by different light emitting directions of the illumination light source can be effectively eliminated.
[ description of the drawings ]
FIG. 1 is a flow chart of a light field correction method according to a first embodiment of the present invention;
FIG. 2 is a schematic diagram of a manner of forming a first detection image in a light field correction method according to a first embodiment of the present invention;
FIG. 3 is a schematic diagram of a manner of forming a second detection image in the light field correction method according to the first embodiment of the present invention;
FIG. 4 is a schematic diagram of a light field correction manner in the light field correction method according to the first embodiment of the present invention;
FIG. 5 is a schematic diagram illustrating the manner in which a first detected image is calibrated in a light field correction method according to a second embodiment of the present invention;
FIG. 6 is a schematic diagram of another way of calibrating the first detected image in the light field correction method according to the second embodiment of the present invention;
FIG. 7 is a diagram illustrating the calibration of a second inspection image in a light field correction method according to a second embodiment of the present invention;
FIG. 8 is a schematic diagram of a light field correction mode in a light field correction method according to a second embodiment of the present invention;
fig. 9 is a schematic diagram of light field intensity correction of a first detection image according to the height of an object to be detected according to the third embodiment of the present invention;
fig. 10 is a schematic view of a visual inspection system according to a fourth embodiment of the present invention.
[ detailed description ] embodiments
The present invention will be described in detail below with reference to the accompanying drawings and examples. Using the same or similar reference numbers in the figures
As shown in fig. 1, fig. 1 is a flowchart illustrating a light field correction method of a vision inspection system according to a first embodiment of the present invention. The light field correction method of the present embodiment includes the steps of:
step 11: acquiring an image of the background plate under the irradiation of the illumination light source, and further forming a first detection image;
specifically, as shown in fig. 2, in this step, the background plate 22 is irradiated with the illumination light source 21, and the background plate 22 is image-captured by an appropriate image capturing device (not shown), so that the first detection image 31 is acquired. At this time, since the light emitting directions of the illumination light source 21 are different from each other at different positions of the background plate 22, the light field distribution shown in the first detection image 31 is not uniform on the background plate 22.
Step 12: carrying out image acquisition on a background plate irradiated by an illumination light source and an object to be detected arranged on the background plate, and further forming a second detection image;
specifically, as shown in fig. 3, in this step, the background plate 22 and the object 23 to be detected disposed on the background plate 22 are irradiated by the illumination light source 21, and the background plate 22 and the object 23 to be detected are image-captured by the image capturing device, so as to obtain a second detection image 32. At this time, since the light emitting directions of the illumination light source 21 are different from each other with respect to different positions of the background plate 22 and the object 23 to be detected, the light field distribution shown in the second detection image 32 is also formed on the background plate 22 and the object 23 to be detected.
Step 13: and carrying out light field correction on the light field intensity of the corresponding position on the second detection image by using the light field intensity of different positions of the first detection image, thereby eliminating uneven light field distribution caused by different light emitting directions of the illumination light source. In particular, light field correction may be achieved by subtracting light field intensities of different locations on the second detection image from light field intensities of corresponding locations of the first detection image.
As shown in fig. 4, in this step, the light field intensities at different positions 322 and 323 on the second detection image 32 and the corresponding light field intensities at the same positions 312 and 313 on the first detection image 31 can be subtracted by a position mapping method, so that the light field maldistribution caused by the different light emitting directions of the illumination light sources can be effectively eliminated. In the present embodiment, the positions and angles of the illumination light source 21 and the image capturing device are preferably kept constant during the capturing of the first detection image 31 and the second detection image 32, thereby simplifying the position mapping process.
Through the mode, the uneven light field distribution caused by different light emitting directions of the illumination light source can be effectively eliminated under the condition that a uniform surface light source is not required to be provided.
Further, as shown in fig. 3, since the object 23 to be detected has a certain height difference with respect to the background plate 22, the corresponding region 321 of the object 23 to be detected on the second detection image 32 has a certain light field offset with respect to other regions where the object 23 to be detected is not placed. Therefore, if the light field correction is performed directly in the above steps 11-13, the light field distribution in the region 321 in the same position as the region 321 in the first detection image 31 is different from the light field distribution in the region 321, which may result in that the light field distribution unevenness in the region 321 cannot be completely or effectively eliminated. Therefore, in the second embodiment, the light field shift due to the height of the object 23 to be detected is eliminated by calibrating the light outgoing direction of the illumination light source 21 in the first detection image 31 and the second detection image 32.
Specifically, the light field correction method of the second embodiment also includes steps 11 to 13 shown in fig. 1, and further refines steps 11 to 13. Wherein step 11 further comprises calibrating the light emitting direction of the illumination light source 21 relative to the background plate 22 on the first detection image 31. In a specific implementation manner, as shown in fig. 5, a first calibration pattern for indicating the light emitting direction of the illumination light source 21 relative to the background plate 22 is formed on the background plate 22, and an image is captured, so as to form a first calibration image 33, and the light emitting direction of the illumination light source 21 relative to the background plate 22 is calibrated on the first detection image 31 by using the first calibration pattern 331 on the first calibration image 33.
In the present embodiment, the background plate 22 is illuminated with the calibration light sources 24 (e.g., point light sources) arranged in a predetermined manner, and image acquisition is performed to form a first calibration image 33. At this time, the first calibration pattern 331 formed on the background plate 22 is a plurality of dot patterns arranged at intervals. Since the first calibration patterns 331 distributed at different positions on the first calibration image 33 respectively represent the light emitting directions of the illumination light sources 21 corresponding to the positions. Further, through the position mapping between the first calibration image 33 and the first detection image 31, the different first calibration patterns 331 respectively represent the light emitting directions of the illumination light sources 21 corresponding to the corresponding positions on the first detection image 31. Further, as shown in fig. 6, in another implementation, the illumination light source 21 may be shielded by the light shielding plate 25 provided with the light transmitting regions 251 arranged in a predetermined manner, and the background plate 22 may be further irradiated by the shielded illumination light source 21 to form the first calibration pattern 331. In addition, the first calibration pattern 331 may also take other forms, such as a grid pattern, besides a dot pattern arranged at intervals. When the grid pattern is adopted, the light-emitting direction of the illumination light source 21 can be calibrated by using different intersection points, corner points, inflection points and the like on the grid pattern.
Step 12 further includes calibrating the light-emitting direction of the illumination light source 21 relative to the background plate 22 and the object 23 to be detected on the second detection image. In a specific implementation manner, as shown in fig. 7, a second calibration pattern 341 for indicating the light emitting direction of the illumination light source 21 relative to the background plate 22 and the object 23 to be detected is formed on the background plate 22 and the object 23 to be detected, and image acquisition is performed, so as to form a second calibration image 34. And then the light emitting direction of the illumination light source 21 relative to the background plate 22 and the object 23 to be detected is calibrated on the second detection image 32 by using the second calibration pattern 341 on the second calibration image 34.
In the present embodiment, the background plate 22 and the object 23 to be detected are irradiated with the calibration light sources 24 (e.g., point light sources) arranged in a predetermined manner, so that a plurality of dot-shaped second calibration patterns 341 arranged at intervals are formed on the background plate 22 and the object 23 to be detected, and image acquisition is performed to form the second calibration image 34. At this time, the second calibration patterns 341 distributed at different positions on the second calibration image 34 respectively indicate the light emitting directions of the illumination light sources 21 corresponding to the positions. Further, through the position mapping between the second calibration image 34 and the second detection image 32, different second calibration patterns 341 respectively indicate the light emitting directions of the illumination light sources 21 corresponding to the corresponding positions on the second detection image 32. Similarly, in other embodiments, the light shielding plate 25 shown in fig. 6 may be used to shield the illumination light source 21, and the shielded illumination light source 21 may further be used to illuminate the background plate 22 and the object 23 to be detected to form the second calibration pattern 341. In addition, the second calibration pattern 341 may also take other forms, such as a grid pattern, besides a dot pattern arranged at intervals.
In the above embodiment, the calibration light source 24 may be disposed inside the illumination light source 21 to simplify the calibration process of the two. In other embodiments, the calibration light source 24 may be disposed at other positions outside the illumination light source 21, and the light emitting directions of the two are calibrated in advance.
Step 13 further performs light field correction on the light field intensity at the corresponding position in the same light-emitting direction on the second detection image 32 by using the light field intensity at different positions of the first detection image 31, so as to eliminate uneven light field distribution caused by different light-emitting directions of the illumination light source, and eliminate light field offset caused by the height of the object to be detected. As shown in fig. 8, as described above, since the different first calibration patterns 331 respectively represent the light emitting directions of the illumination light sources 21 corresponding to the corresponding positions on the first detection image 31, and the different second calibration patterns 341 respectively represent the light emitting directions of the illumination light sources 21 corresponding to the corresponding positions on the second detection image 32, the corresponding positions corresponding to the same light emitting directions of the illumination light sources 21 can be determined on the first detection image 31 and the second detection image 32 according to the first calibration patterns 331 and the second calibration patterns 341, so that the light field intensities of the different positions of the second detection image 32 are subtracted from the light field intensities of the corresponding positions in the same light emitting directions on the first detection image 31, thereby implementing the light field correction. For example, in fig. 8, the light field intensity of the corresponding position of the second calibration pattern 341 on the second detection image 32 may be directly subtracted by the light field intensity of the corresponding position of the first calibration pattern 331 on the first detection image 31, and for other positions than the second calibration pattern 341, the corresponding position on the first detection image 31 relative to the same light emitting direction of the illumination light source 21 may be calculated according to the position information of the second calibration pattern 341 and the first calibration pattern 331 in combination with an appropriate conversion formula.
Further, for an illumination source with a certain divergence angle, the intensity of the light field generated by the illumination source irradiating on the object is inversely proportional to the area of the light spot formed by the illumination source. Since the object 23 to be detected has a certain height, even if it is in the same light-emitting direction with respect to the illumination light source 21, the light field intensity on the object 23 to be detected is different from the light field intensity on the background plate 22. Therefore, in the third embodiment, the placement area of the object 23 to be detected is further determined according to the height of the object 23 to be detectedThe light field intensity of the corresponding first detection image 31 is corrected; and the light field intensity of the corresponding position on the second detection image 32 in the same light outgoing direction is subjected to light field correction by using the corrected light field intensity of the first detection image 21. As shown in fig. 9, the intensity of the light field on the surface of the object 23 to be detected is inversely proportional to r within the same light-emitting angle range2Whereas the intensity of the light field on the surface of the background plate 21 is inversely proportional to R2And, at the same time, according to the trigonometric formula R/R ═ H/H, the following formula can be obtained:
I1=I2×H2/(H-h)2
wherein, I2Light field intensity, I, of the first inspection image 31 corresponding to the placement area of the object 23 to be inspected1For the corrected light field intensity, H is the height of the object 23 to be detected, and H is a constant and is determined by the distance between the illumination light source 21 and the background plate 22 and the light-emitting angle of the illumination light source 21.
Fig. 10 is a schematic view of a visual inspection system according to a fourth embodiment of the present invention, as shown in fig. 10. The vision inspection system of this embodiment includes an illumination light source 41, an image capturing device 46, and a processor 47, where the image capturing device 46 performs image capturing on a background plate irradiated by the illumination light source 41, so as to form a first inspection image, and performs image capturing on the background plate irradiated by the illumination light source and an object to be inspected disposed on the background plate, so as to form a second inspection image, and the processor 47 performs light field correction on light field intensities at corresponding positions on the second inspection image by using light field intensities at different positions of the first inspection image. In a particular implementation, the processor 47 subtracts the light field intensity at a different location on the second detected image from the light field intensity at a corresponding location on the first detected image.
The vision detection system further includes a calibration device 44, where the calibration device 44 is configured to calibrate the light-emitting direction of the illumination light source relative to the background plate on the first detection image, and calibrate the light-emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image, and the processor 47 performs light field correction on the light field intensity of the corresponding position in the same light-emitting direction on the second detection image by using the light field intensity of different positions of the first detection image.
The calibration device 44 forms a first calibration pattern on the background plate for indicating the light emitting direction of the illumination light source relative to the background plate, and the image acquisition device 46 performs image acquisition to form a first calibration image, and the processor 47 uses the first calibration pattern on the first calibration image to calibrate the light emitting direction of the illumination light source relative to the background plate on the first detection image.
The calibration device 44 further forms a second calibration pattern for indicating the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the background plate and the object to be detected, and performs image acquisition by the image acquisition equipment 46, so as to form a second calibration image; the processor 47 uses the second calibration pattern on the second calibration image to calibrate the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image.
As described above, the calibration device 44 may be a calibration light source arranged in a predetermined manner, or a light shielding plate provided with a light-transmitting region arranged in a predetermined manner, and the first calibration pattern and the second calibration pattern are a plurality of dot patterns or other patterns arranged at intervals.
Further, the processor 47 subtracts the light field intensity of the different position of the second detection image from the light field intensity of the corresponding position of the same light-emitting direction on the first detection image.
Further, the processor 47 corrects the light field intensity of the first detection image corresponding to the placement area of the object to be detected according to the height of the object to be detected, and further performs light field correction on the light field intensity of the corresponding position in the same light emitting direction on the second detection image by using the corrected light field intensity of the first detection image. The processor 47 corrects the light field intensity of the first detection image corresponding to the placement region of the object to be detected by the following formula:
I1=I2×H2/(H-h)2
wherein, I2Light field intensity, I, of a first inspection image corresponding to a placement area of an object to be inspected1H is the height of the object to be detected, and H is a constant. The operation principle and the specific implementation of the above elements have been described in detail above, and are not described in detail herein.
In summary, it is easily understood by those skilled in the art that, in the vision inspection system and the light field correction method thereof provided in the above embodiments of the present invention, the first detection image obtained by the background plate under the illumination of the illumination light source is used to perform light field correction on the background plate and the second detection image obtained by the object to be detected under the illumination of the illumination light source, so that the uneven distribution of the light field generated by the different light emitting directions of the illumination light source can be effectively eliminated.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims (17)

1. A method of light field correction for a vision inspection system, the method comprising:
acquiring an image of a background plate under the irradiation of an illumination light source to form a first detection image, and calibrating the light emitting direction of the illumination light source relative to the background plate on the first detection image;
acquiring images of the background plate and an object to be detected arranged on the background plate under the illumination of the illumination light source, so as to form a second detection image, and calibrating the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image;
and carrying out light field correction on the light field intensity of the corresponding position on the second detection image in the same light emergent direction by using the light field intensity of different positions of the first detection image.
2. The method of claim 1, wherein the step of light field correcting the light field intensity of the corresponding location on the second detected image using the light field intensity of the different location of the first detected image comprises:
and subtracting the light field intensity of the different position on the second detection image from the light field intensity of the corresponding position on the first detection image so as to perform light field correction.
3. The method of claim 1, wherein the step of calibrating the light emitting direction of the illumination source relative to the background plate on the first detection image comprises:
forming a first calibration pattern for representing the light emitting direction of the illumination light source relative to the background plate on the background plate, and carrying out image acquisition to further form a first calibration image;
and calibrating the light emitting direction of the illumination light source relative to the background plate on the first detection image by using the first calibration pattern on the first calibration image.
4. The method according to claim 3, wherein the step of forming a first calibration pattern on the background plate for indicating the light emitting direction of the illumination light source relative to the background plate and performing image acquisition to form a first calibration image comprises:
and irradiating the background plate by using the calibration light sources arranged in a preset mode or irradiating the background plate by using the illumination light sources shielded by the light shielding plate provided with the light transmission areas arranged in a preset mode, thereby forming the first calibration pattern on the background plate.
5. The method according to claim 3, wherein the step of calibrating the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image comprises:
forming a second calibration pattern for representing the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the background plate and the object to be detected, and acquiring images to further form a second calibration image;
and calibrating the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image by using the second calibration pattern on the second calibration image.
6. The method according to claim 5, wherein the step of forming a second calibration pattern for indicating the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the background plate and the object to be detected and acquiring images to form a second calibration image comprises:
and irradiating the background plate by using the calibration light sources arranged in a preset mode or irradiating the background plate and the object to be detected by using the illumination light source shielded by the light shielding plate provided with the light transmission areas arranged in a preset mode, and forming a second calibration pattern on the background plate and the object to be detected.
7. The method according to claim 5, characterized in that the first calibration pattern and the second calibration pattern are respectively a plurality of dot patterns arranged at intervals.
8. The method according to claim 1, wherein the step of performing light field correction on the light field intensity of the corresponding position of the same light-emitting direction on the second detection image by using the light field intensity of the different position of the first detection image comprises:
and subtracting the light field intensity of the different positions of the second detection image from the light field intensity of the corresponding position in the same light emergent direction on the first detection image so as to perform light field correction.
9. The method according to claim 1, wherein the step of performing light field correction on the light field intensity of the corresponding position of the same light-emitting direction on the second detection image by using the light field intensity of the different position of the first detection image comprises:
correcting the light field intensity of the first detection image corresponding to the placement area of the object to be detected according to the height of the object to be detected;
and performing light field correction on the light field intensity of the corresponding position in the same light emergent direction on the second detection image by using the corrected light field intensity of the first detection image.
10. The vision detection system is characterized by comprising an illumination light source, a calibration device, an image acquisition device and a processor, wherein the image acquisition device acquires an image of a background plate irradiated by the illumination light source to form a first detection image, acquires the image of the background plate irradiated by the illumination light source and an object to be detected arranged on the background plate to form a second detection image, the calibration device is used for calibrating the light emitting direction of the illumination light source relative to the background plate on the first detection image and calibrating the light emitting direction of the illumination light source relative to the background plate and the object to be detected on the second detection image, and the processor performs light field correction on the light field intensities of the light fields at different positions of the first detection image to the light field intensities of the light fields at the corresponding positions of the same light emitting direction on the second detection image.
11. The vision inspection system of claim 10, wherein the processor subtracts a light field intensity at a different location on the second inspection image from a light field intensity at a corresponding location on the first inspection image for light field correction.
12. The visual inspection system of claim 10, wherein the calibration device forms a first calibration pattern on the background plate for indicating the light emitting direction of the illumination light source relative to the background plate and performs image acquisition by the image acquisition device to form a first calibration image, and the processor calibrates the light emitting direction of the illumination light source relative to the background plate on the first detection image by using the first calibration pattern on the first calibration image.
13. The visual inspection system of claim 12, wherein the calibration device further forms a second calibration pattern on the background plate and the object to be inspected for indicating the light emitting direction of the illumination light source relative to the background plate and the object to be inspected, and performs image acquisition by the image acquisition device to form a second calibration image; and the processor calibrates the light emitting directions of the illumination light source relative to the background plate and the object to be detected on the second detection image by using the second calibration pattern on the second calibration image.
14. The vision inspection system of claim 13, wherein the calibration means is a calibration light source arranged in a predetermined manner or a light shielding plate provided with light transmission regions arranged in a predetermined manner.
15. The visual inspection system of claim 13, wherein the first and second calibration patterns are each a plurality of dot patterns spaced apart.
16. The vision inspection system of claim 10, wherein the processor subtracts light field intensities at different locations of the second inspection image from light field intensities at corresponding locations of the same light extraction direction on the first inspection image for light field correction.
17. The vision inspection system of claim 10, wherein the processor corrects the light field intensity of the first inspection image corresponding to the placement area of the object to be inspected according to the height of the object to be inspected, and further performs light field correction on the light field intensity of the corresponding position on the second inspection image in the same light-emitting direction by using the corrected light field intensity of the first inspection image.
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