CN109489559A - Point light source space-location method based on time frequency analysis and optical field imaging technology - Google Patents

Point light source space-location method based on time frequency analysis and optical field imaging technology Download PDF

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Publication number
CN109489559A
CN109489559A CN201811166178.8A CN201811166178A CN109489559A CN 109489559 A CN109489559 A CN 109489559A CN 201811166178 A CN201811166178 A CN 201811166178A CN 109489559 A CN109489559 A CN 109489559A
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aperture
sub
light source
distance
point light
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CN109489559B (en
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胡摇
袁诗翥
郝群
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Beijing Institute of Technology BIT
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Beijing Institute of Technology BIT
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Abstract

Point light source space-location method disclosed by the invention based on time frequency analysis and optical field imaging technology, belongs to photoelectric measurement field.Implementation method of the present invention is as follows: establishing optical field imaging system, demarcates the optical system parameter of light field imaging system;The light field that target point light source is obtained by optical field imaging system, obtains the light field image of target point light source;Sub-aperture division is carried out to the light field image of acquisition, extracts the centre coordinate of each sub-aperture image;The distance at sub-aperture picture centre polaron aperture optical center is calculated with the change rate of sub-aperture path position;In conjunction with the optical system parameter of optical field imaging system, target point light source is calculated to the distance for setting the plane of reference;Realize the space orientation of point light source in scattering medium.The present invention also has many advantages, such as that passive measurement, structure are simple, random error is small, can real-time tracking.

Description

Point light source space-location method based on time frequency analysis and optical field imaging technology
Technical field
It is sterically defined based on time frequency analysis and optical field imaging skill for point light source in scattering medium that the present invention relates to one kind Art wears scattering medium imaging method, belongs to photoelectric measurement field.
Background technique
Scattering medium refers to a kind of medium that significant scattering effect can occur when light passes through, to traditional optical imaging system The presence of speech, scattering medium will make the picture of target thicken, and be unfavorable for the observation to target.Typical scattering medium has Cloud, mist, flue dust, frosted glass and cytoplasm etc..It is always a great problem in photoelectric measurement field across scattering medium imaging, simultaneously There is huge application value in the fields such as biomedical, remote sensing and security protection again.Point light source space orientation in scattering medium is It is a kind of exemplary requirement in the field, has broad application prospects;Its specific case has between the vehicle under the conditions of thick fog Positioning etc. away from measurement, in the tracking and positioning and fluorescence imaging to aircraft in cloud layer to cell.
Time frequency analysis, that is, time-frequency combination domain analysis abbreviation is a kind of powerful for analyzing time-varying non-stationary signal, can To reflect the temporal signatures and frequency domain character of a signal simultaneously.Traditionally, Fourier transform is commonly used to observe a signal Frequency spectrum.However the method is not suitable for being used to analyze the signal that a frequency spectrum can change with the work time.Time-Frequency Analysis Method The Joint Distribution information of time-domain and frequency domain is provided, the relationship that signal frequency changes over time is clearly illustrated.
Optical field imaging technology is a kind of novel imaging technique.Traditional optical imaging system can only record the light from scene Strong information, and have ignored the direction of light;Optical field imaging system then can simultaneously recording light strength information and directional information To record the light field of scene.Information abundant includes that some scenes are difficult to the spy reflected by conventional imaging method in light field Sign.
For optical signal, the different direction of propagation of different frequency representatives.And in light field simultaneously include optical signal Spatial information and directional information, therefore light field data can be handled with the method for time frequency analysis, in other words the time-frequency of optical signal Distribution represents a light field.And point light source can be indicated with impulse function, the propagation of light in free space is then equivalent to it The affine transformation of time-frequency distributions, and scattering effect can be equivalent to the relevant operation in time-frequency distributions to frequency, therefore can pass through The characteristic information in final time-frequency distributions is extracted to solve the space coordinate of point light source.
Summary of the invention
Point light source space-location method disclosed by the invention based on time frequency analysis and optical field imaging technology, the skill to be solved Art problem is: under conditions of point light source is located in scattering medium, obtaining target point light source by establishing optical field imaging system Light field image, and target point light source is solved to the distance for setting the plane of reference by the method for time frequency analysis, it can be avoided scattering and be situated between The influence of confrontation point light source range measurement inhibits the random error in measurement process.The present invention is based on time frequency analysis and light field at As technology realizes space orientation to point light source, have passive measurement, structure is simple, random error is small, can real-time tracking etc. it is excellent Point.
Object of the present invention is to what is be achieved through the following technical solutions.
Point light source space-location method disclosed by the invention based on time frequency analysis and optical field imaging technology, implementation method is such as Under: optical field imaging system is established, the optical system parameter of light field imaging system is demarcated;Target point is obtained by optical field imaging system The light field of light source obtains the light field image of target point light source;Sub-aperture division is carried out to the light field image of acquisition, extracts every height The centre coordinate of subaperture image;The distance at sub-aperture picture centre polaron aperture optical center is calculated with the change of sub-aperture path position Rate;In conjunction with the optical system parameter of optical field imaging system, target point light source is calculated to the distance for setting the plane of reference;Realize scattering The space orientation of point light source in medium.
Point light source space-location method disclosed by the invention based on time frequency analysis and optical field imaging technology, including walk as follows It is rapid:
Step 1: establishing optical field imaging system, demarcates to the parameter of optical system.
The calibrating parameters of optical system described in step 1 are depending on specific optical system, including at least microlens array The sub-aperture period, main lens image space focal plane to microlens array distance.
Preferably, when the optical field imaging system that step 1 is established is microlens array formula optical field imaging system, light System specifically includes main lens, microlens array, image detector.
Shown in the sub-aperture cycle parameter calibration formula of the microlens array such as formula (1):
Wherein T is the sub-aperture period of microlens array, and N is the coordinate of sub-aperture, and M is that the coordinate of sub-aperture neighborhood is inclined It moves, x is coordinate of the sub-aperture picture centre in light field image.
Shown in distance parameter calibration formula such as formula (2) of the image space focal plane of the main lens to microlens array:
(Dn+A)(B-dn)=F2 (2)
Wherein DnBe point light source to the distance for setting the plane of reference, A be the setting plane of reference to main lens object space focal plane away from From B is distance of the main lens image space focal plane to microlens array, dnIt is point light source as the distance to microlens array, F is The focal length of main lens.
Step 2: the light field of target point light source in scattering medium is obtained by optical field imaging system, obtains target point light source Light field image.
Step 3: sub-aperture division is carried out to the light field image that step 2 obtains, extracts each sub-aperture picture centre Coordinate calculates separately the distance at sub-aperture picture centre polaron aperture optical center.
Preferably, step 3 concrete methods of realizing is as follows:
Step 3.1: sub-aperture division is carried out to the light field image that step 2 obtains;
Step 3.2: the coordinate of each sub-aperture picture centre is extracted according to formula (3);
Wherein PicFor the coordinate of sub-aperture picture centre, x is the coordinate of pixel in sub-aperture, and I is pixel in sub-aperture Gray value.
Step 3.3: calculating separately the distance at sub-aperture picture centre polaron aperture optical center;
Step 4: the distance at sub-aperture picture centre polaron aperture optical center is calculated with sub-aperture by linear regression The change rate of position.
Preferably, using the distance at sub-aperture picture centre polaron aperture optical center as y-axis in step 4, with sub-aperture The position of diameter is x-axis, and the relationship of y and x should meet formula (4).It is straight that a fitting is obtained by least square method progress linear regression Line equation y=kx+b.Wherein k is the distance at sub-aperture picture centre polaron aperture optical center with the change of sub-aperture path position Rate.
Wherein △ p is the distance at sub-aperture picture centre polaron aperture optical center, and T is the sub-aperture of microlens array Period, f are the focal length of microlens array, and α is the size of image detector unit, and d is the picture point of point light source to microlens array Distance, N be sub-aperture coordinate.
Step 5: solving the distance of point light source picture point to microlens array in conjunction with the optical field imaging system parameter of foundation, then Target point light source is calculated to the distance for setting the plane of reference, i.e. realization point light source space orientation.
Preferably, the optical field imaging system parameter established is combined to solve point light source picture point to lenticule battle array described in step 5 What is arranged is as follows apart from concrete methods of realizing: in conjunction with the pixel period T of microlens array, the focal length f of microlens array and aperture figure The distance at inconocenter polaron aperture optical center acquires point light source picture point according to formula (5) with the change rate k of sub-aperture path position To the distance d of microlens array.
The distance of calculating target point light source described in step 5 to the setting plane of reference is realized by formula (6).
Wherein D is target point light source to the distance for setting the plane of reference, and A is to set the plane of reference to main lens object space focal plane Distance, B are distance of the main lens image space focal plane to microlens array, and d is distance of the picture of point light source to microlens array, F For the focal length of main lens.
The main lens is the lens group that single lens or multiple lens form.
The utility model has the advantages that
1, the point light source space-location method disclosed by the invention based on time frequency analysis and optical field imaging technology, passes through foundation Optical field imaging system solves the problems, such as point light source space orientation in scattering medium, the measurement process in the method for time frequency analysis For completely passive measurement, do not need to energy carriers such as measurement objective emission electromagnetic wave, ultrasonic waves, it can be ensured that measurement process Crypticity.
2, the point light source space-location method disclosed by the invention based on time frequency analysis and optical field imaging technology, the light Field picture processing method is for the picture centre for extracting sub-aperture, since scattering medium only leads to the fuzzy of sub-aperture image, but The picture centre of sub-aperture is not changed, therefore, present invention can apply to the space orientations to point light source in scattering medium, specific to wrap Vehicle distance measurement is included, to cases such as the positioning of cell in the tracking and positioning and fluorescence imaging to aircraft in cloud layer.
3, the point light source space-location method disclosed by the invention based on time frequency analysis and optical field imaging technology, passes through foundation Optical field imaging system obtains the light field image of target, and the method for time frequency analysis solves, due to sub-aperture each in light field image It is picture of the target point light source in different perspectives, the processing of light field image is equivalent to, average operation, energy have been carried out to image Enough random errors for effectively inhibiting optical system, improve measurement accuracy.
4, the point light source space-location method disclosed by the invention based on time frequency analysis and optical field imaging technology, passes through foundation Optical field imaging system obtains the light field image of target, and when handle light field data, sub-aperture pixel center is sought and the son Pixel in aperture is related, and unrelated with the pixel of other sub-apertures, and therefore, dependence is mutually not present in the processing of different sub-apertures Relationship, it is easy to accomplish parallelization, therefore calculating speed can be effectively improved by the modes such as multithreading or GPU calculating, with realization pair The real-time positioning and tracking of target.
Detailed description of the invention
Fig. 1 is the point light source space-location method process disclosed by the invention based on time frequency analysis and optical field imaging technology Figure.
Fig. 2 is experimental system structure chart;
Fig. 3 is light field image;
Fig. 4 is that the sub-aperture of light field image divides;
Wherein: 1-LED light source, 2-frosted glass, 3-main lens, 4-microlens arrays, 5-image detectors.
Specific embodiment
Objects and advantages in order to better illustrate the present invention with reference to the accompanying drawing do further summary of the invention with example Explanation.
Embodiment 1: by taking the LED light source 1 after frosted glass 2 measures as an example.
Point light source space-location method based on time frequency analysis and optical field imaging technology disclosed in the present embodiment, including it is as follows Step:
Step 1: microlens array formula optical field imaging system is established, the parameter of optical system is demarcated.
Microlens array formula optical field imaging system structure described in step 1 as shown in figure (2), specifically wrap by optical system Include main lens 3, microlens array 4, image detector 5.
Optical system calibrating parameters described in step 1 specifically include sub-aperture period of microlens array 4, main lens 3 Image space focal plane to microlens array 4 distance.Its sub-aperture cycle parameter calibration formula such as formula (1), the picture of main lens 3 Shown in distance parameter calibration formula such as formula (2) of the square focal plane to microlens array 4.
Step 2: the light field of target point light source in scattering medium is obtained by optical field imaging system, obtains target point light source Light field image.
Step 3: sub-aperture division is carried out to the light field image that step 2 obtains, extracts each sub-aperture picture centre Coordinate calculates separately the distance at sub-aperture picture centre polaron aperture optical center.
The concrete methods of realizing of step 3 is as follows:
Step 3.1: sub-aperture division is carried out to the light field image that step 2 obtains;
Step 3.2: the coordinate of each sub-aperture picture centre is extracted according to formula (3);
Step 3.3: calculating separately the distance at sub-aperture picture centre polaron aperture optical center;
Step 4: the distance at sub-aperture picture centre polaron aperture optical center is calculated with sub-aperture by linear regression The change rate of position.
The concrete methods of realizing of step 4 is as follows:
Using the distance at sub-aperture picture centre polaron aperture optical center as y-axis, using the position of sub-aperture as x-axis, y with The relationship of x should meet formula (4).Linear regression, which is carried out, by least square method obtains a fitting a straight line equation y=kx+b.Wherein K is the distance at sub-aperture picture centre polaron aperture optical center with the change rate of sub-aperture path position.
Step 5: solving the distance of point light source picture point to microlens array 4 in conjunction with the optical field imaging system parameter of foundation, then Target point light source is calculated to the distance for setting the plane of reference, i.e. realization point light source space orientation.
The optical field imaging system parameter established is combined to solve the distance of point light source picture point to microlens array 4 described in step 5 Concrete methods of realizing is as follows: in conjunction with the pixel period of microlens array 4, the focal length of microlens array 4 and sub-aperture picture centre The distance at polaron aperture optical center acquires point light source picture point to micro- according to formula (5) with the change rate of sub-aperture path position The distance of lens array 4.
The distance of calculating target point light source described in step 5 to the setting plane of reference is realized by formula (6).
A kind of point light source space-location method based on time frequency analysis and optical field imaging technology, passes through disclosed in the present embodiment The light field image that optical field imaging system obtains target is established, and the method for time frequency analysis solves, and can be avoided scattering medium to point The influence of light source distance measurement, inhibits the random error in measurement process.
Above-described specific descriptions have carried out further specifically the purpose of invention, technical scheme and beneficial effects It is bright, it should be understood that the above is only a specific embodiment of the present invention, the protection model being not intended to limit the present invention It encloses, all within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. done should be included in the present invention Protection scope within.

Claims (6)

1. the point light source space-location method based on time frequency analysis and optical field imaging technology, it is characterised in that: include the following steps,
Step 1: establishing optical field imaging system, demarcates to the parameter of optical system;
Step 2: the light field of target point light source in scattering medium is obtained by optical field imaging system, obtains the light of target point light source Field picture;
Step 3: sub-aperture division is carried out to the light field image that step 2 obtains, extracts the pixel of each sub-aperture picture centre Coordinate calculates separately the distance at sub-aperture picture centre polaron aperture optical center;
Step 4: the distance at sub-aperture picture centre polaron aperture optical center is calculated with sub-aperture path position by linear regression Change rate;
Step 5: the distance of point light source picture point to microlens array is solved in conjunction with the optical field imaging system parameter of foundation, then is calculated Target point light source realizes point light source space orientation to the distance for setting the plane of reference.
2. the point light source space-location method based on time frequency analysis and optical field imaging technology as described in claim 1, feature Be: the calibrating parameters of optical system described in step 1 are depending on specific optical system, including at least the son of microlens array The aperture period, main lens image space focal plane to microlens array distance;
When the optical field imaging system that step 1 is established is microlens array formula optical field imaging system, optical system is specifically included Main lens, microlens array, image detector;
Shown in the sub-aperture cycle parameter calibration formula of the microlens array such as formula (1):
Wherein T is the sub-aperture period of microlens array, and N is the coordinate of sub-aperture, and M is the coordinate shift of sub-aperture neighborhood, and x is Coordinate of the sub-aperture picture centre in light field image;
Shown in distance parameter calibration formula such as formula (2) of the image space focal plane of the main lens to microlens array:
(Dn+A)(B-dn)=F2 (2)
Wherein DnIt is point light source to the distance for setting the plane of reference, A is the distance for setting the plane of reference to main lens object space focal plane, and B is Distance of the main lens image space focal plane to microlens array, dnIt is point light source as the distance to microlens array, F is main lens Focal length.
3. the point light source space-location method based on time frequency analysis and optical field imaging technology as described in claim 1, feature Be: step 3 concrete methods of realizing is as follows,
Step 3.1: sub-aperture division is carried out to the light field image that step 2 obtains;
Step 3.2: the pixel coordinate of each sub-aperture picture centre is extracted according to formula (3);
Wherein PicFor the pixel coordinate of sub-aperture picture centre, x is the coordinate of pixel in sub-aperture, and I is pixel in sub-aperture Gray value;
Step 3.3: calculating separately the distance at sub-aperture picture centre polaron aperture optical center.
4. the point light source space-location method based on time frequency analysis and optical field imaging technology as described in claim 1, feature It is: preferably, using the distance at sub-aperture picture centre polaron aperture optical center as y-axis in step 4, with sub-aperture Position be x-axis, the relationship of y and x should meet formula (4);Linear regression, which is carried out, by least square method obtains a fitting a straight line Equation y=kx+b;Wherein k is the distance at sub-aperture picture centre polaron aperture optical center with the variation of sub-aperture path position Rate;
Wherein △ p is the distance at sub-aperture picture centre polaron aperture optical center, and T is the sub-aperture week of microlens array Phase, f be microlens array focal length, α be detector cells size, d be point light source picture point to microlens array distance, N is the coordinate of sub-aperture.
5. the point light source space-location method based on time frequency analysis and optical field imaging technology as described in claim 1, feature It is: combines the optical field imaging system parameter established to solve point light source picture point described in step 5 specific to the distance of microlens array Implementation method is as follows,
In conjunction in the pixel period T of microlens array, the focal length f of microlens array and subaperture image center deviation sub-aperture optics The distance of the heart acquires the distance d of point light source picture point to microlens array according to formula (5) with the change rate k of sub-aperture path position;
The distance of the calculating target point light source distance setting plane of reference described in step 5 is realized by formula (6);
Wherein D is the distance that target point light source distance sets the plane of reference, A be the setting plane of reference to main lens object space focal plane away from From B is distance of the main lens image space focal plane to microlens array, and d is the picture of point light source to the distance of microlens array, and F is The focal length of main lens.
6. the point light source space orientation side based on time frequency analysis and optical field imaging technology as described in claim 1,2,3,4 or 5 Method, it is characterised in that: the main lens is the lens group that single lens or multiple lens form.
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