CN109444794A - A kind of method and system of transient state verification - Google Patents
A kind of method and system of transient state verification Download PDFInfo
- Publication number
- CN109444794A CN109444794A CN201811426106.2A CN201811426106A CN109444794A CN 109444794 A CN109444794 A CN 109444794A CN 201811426106 A CN201811426106 A CN 201811426106A CN 109444794 A CN109444794 A CN 109444794A
- Authority
- CN
- China
- Prior art keywords
- transient
- standard
- wave
- transient state
- analog
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
The invention discloses a kind of method and system of transient state verification, which comprises generates the first standard transient-wave data and the second standard transient-wave data according to preset transient state parameter；By the first standard transient-wave data and the second standard transient-wave data by AD conversion, the first standard analog transient-wave and the second standard analog transient-wave are converted to；Second standard analog transient-wave is sampled and converted by predeterminated frequency, the standard digital transient-wave of FT3 agreement is generated；The first standard analog transient-wave, the second standard analog transient-wave and standard digital transient-wave are input to direct current instrument transformer transient state tester to be measured；According to the transient state parameter of three groups of transient-waves of correspondence of direct current instrument transformer transient state tester to be measured output, the direct current instrument transformer transient state tester verification assessment result to be measured is judged.
Description
Technical field
The present invention relates to transducer check fields, more particularly, to a kind of method and system of transient state verification.
Background technique
The important primary equipment that direct current instrument transformer is built and run as DC transmission system, to the control of system protection and
Accurately and reliably metrical information, operational reliability and measurement accuracy are directly related to DC transmission system for stable operation offer
Safe and stable operation.DC transmission system has faster sample rate, broader frequency bandwidth etc. to want control protection signal
It asks, especially in flexible HVDC transmission system, in flexible HVDC transmission system, in order to improve the response speed of flexible direct current system
Degree inhibits fault current, improves the security and stability of electric system, propose higher want to the transient characterisitics of direct current instrument transformer
It asks, related national standard proposes specific test requirements document to the transient characterisitics of direct current instrument transformer；
In recent years direct current instrument transformer using more and more extensive, the demand of on-the-spot test is more and more brighter urgent, direct current
Mutual-inductor tester is also widely applied as the important equipment of direct current instrument transformer calibration test, and it is temporary to have direct current instrument transformer
The direct current instrument transformer transient state tester of step response verifying function also releases one after another, and direct current instrument transformer transient characterisitics tester technology is still
It is in the primary stage, product quality and function difference are larger on the market, are not able to satisfy the relevant over-all properties of transient state in national standard
The test of index is all to upgrade software on the basis of conventional DC mutual inductor verification instrument mostly, the function of compatible transient state verification
Energy.Direct current instrument transformer transient state tester and D.C mutual-inductor tester have very big in terms of realization principle, magnitude tracing method
Difference.There is presently no related detection devices and test method to assess the performance of direct current instrument transformer transient state tester.Portion
The direct current instrument transformer transient state tester that man, subsidiary factory develops just does not carry out direct current instrument transformer transient characterisitics by calibration detection test
Detection business, the transient characterisitics data of measurement do not pass through complete magnitude tracing, are the safety and stability of DC transmission system
Operation brings threat and hidden danger.
Summary of the invention
In order to which the verification for solving to be directed to direct current instrument transformer transient state tester existing for background technique is unsound, without complete
The problem of magnitude tracing, the present invention provides a kind of method and system of transient state verification, and the method and system are according to preset
Transient state parameter generates multiple groups transient-wave, is separately input in direct current instrument transformer transient state tester to be measured, is exported according to tester
As a result judge that it verifies effect；A kind of method of the transient state verification includes:
The first standard transient-wave data and the second standard transient-wave data are generated according to preset transient state parameter；
By the first standard transient-wave data and the second standard transient-wave data by AD conversion, the is converted to
One standard analog transient-wave and the second standard analog transient-wave；
Second standard analog transient-wave is sampled and converted by predeterminated frequency, the standard digital of FT3 agreement is generated
Transient-wave；
The first standard analog transient-wave, the second standard analog transient-wave and standard digital transient-wave is defeated
Enter to direct current instrument transformer transient state tester to be measured；
According to the transient state parameter of three groups of transient-waves of correspondence of direct current instrument transformer transient state tester to be measured output, judgement should be to
It surveys direct current instrument transformer transient state tester and verifies assessment result.
Further, by the first standard analog transient-wave, the second standard analog transient-wave and standard digital
Transient-wave is input to direct current instrument transformer transient state tester to be measured, comprising:
The first standard analog transient-wave is input to the master die of the direct current instrument transformer transient state tester to be measured
Analog quantity input terminal；
The second standard analog transient-wave is input to the tested mould of the direct current instrument transformer transient state tester to be measured
Analog quantity input terminal；
The standard digital transient-wave is input to the measured number amount of the direct current instrument transformer transient state tester to be measured
Input terminal.
Further, the transient state parameter include transient state step response time, transient state step rise time or fall time,
Become steady time and overshoot.
Further, the first standard transient-wave data and the second standard transient-wave data are according to transient state parameter
It is separately provided；Standard transient-wave data are generated according to preset transient state parameter, comprising:
Generate initial time, become the steady time and overshoot be 00 to 1 ideal step climate digital sequence；
Transmission function is generated according to the transient state parameter；
By bilinearity method of changing by the Parameter Switch of the transmission function be two groups of coefficients of forward coefficients and reverse parameter
Sequence；
Two groups of coefficient sequences and the ideal step climate digital sequence are subjected to convolution algorithm, obtain corresponding transient state ginseng
Several standard transient-wave data.
Further, described to be turned the first standard transient-wave data and the second standard transient-wave data
Before changing, is transmitted by excel document form and transmitted in a manner of gpib bus.
Further, the first standard analog transient-wave and the second standard analog transient-wave are mutual by two groups
Independent and mutually isolated analog waveform output channel output.
Further, by the way that synchronised clock is arranged, guarantee the second standard analog transient-wave and the standard digital
The synchronism of transient-wave；The delay time of the synchronism is less than 1 μ s, and the uncertainty of transfer lag is less than 0.01 μ s.
Further, determine that the primary standard number transient-wave is converted into FT3 by the FPGA technology postponed by having
The standard digital transient-wave of agreement.
A kind of system of the transient state verification, the system comprises:
Temporal Data generation module, the Temporal Data generation module are temporary for the first standard of preset transient state parameter generation
State Wave data and the second standard transient-wave data；
Signal conversion module, the signal conversion module are used to mark the first standard transient-wave data and second
Quasi- transient-wave data are converted to the first standard analog transient-wave and the second standard analog transient-wave by AD conversion；
The signal conversion module exports the first output end of the first standard analog transient-wave and direct current instrument transformer transient state to be measured verifies
The master die analog quantity input terminal of instrument is connected；The signal conversion module exports the second output terminal of the second standard analog transient-wave
It is connected with the tested analog input end of direct current instrument transformer transient state tester to be measured；
Standard digital source module, the standard digital source module include AD sampling unit and coding unit；The AD is adopted
Sample unit is used to the second standard analog transient-wave obtaining primary standard number transient-wave by predeterminated frequency sampling；Institute
It is temporary to state standard digital of the coding unit for the primary standard number transient-wave to be converted into FT3 agreement according to preset rules
State waveform；The measured number amount input terminal phase of the output end of the coding unit and the direct current instrument transformer transient state tester to be measured
Even.
Further, the transient state parameter include transient state step response time, transient state step rise time or fall time,
Become steady time and overshoot.
Further, the Temporal Data generation module is temporary by the first standard transient-wave data and the second standard
The mode that state Wave data is sent to signal conversion module includes: to be transmitted by excel document form and in a manner of gpib bus
Transmission；The first standard transient-wave data and the second standard transient-wave data can be separately provided according to transient state parameter.
Further, the signal conversion module includes that two groups of mutually indepedent and mutually isolated analog waveform outputs are logical
Road.
Further, the standard digital source module further includes acquisition control unit and synchronised clock unit；
The acquisition control unit is used to the primary standard number transient-wave that AD sampling unit exports being transmitted to coding
Unit；
The synchronised clock unit is used for the clock synchronous with coding unit offer to AD sampling unit.
Further, the coding unit determines the FPGA technology postponed by the primary standard number transient state wave by having
Shape is converted into the standard digital transient-wave of FT3 agreement.
Further, the synchronised clock unit is used to monitor the second standard analog transient-wave of AD sampling unit input
Delay time with the standard digital transient-wave of coding unit output is less than 1 μ s, and the uncertainty of transfer lag is less than
0.01μs。
The invention has the benefit that technical solution of the present invention, gives a kind of method and system of transient state verification, institute
It states method and system and multiple groups transient-wave is generated according to preset transient state parameter, transient state parameter is obtained according to resolution ratio D/A technology
Adjustable standard transient signal source；The mark of low delay fast-response is obtained according to the A/D of high real-time sampling and data encoding technique
Quasi- transient state digital source；Each transient signal is input in direct current instrument transformer transient state tester to be measured respectively, is exported according to tester
As a result judge that it verifies effect；The method and system perfecting the magnitude tracing system of direct current instrument transformer and tester, are improved
The verification accuracy of direct current instrument transformer transient state tester.
Detailed description of the invention
By reference to the following drawings, exemplary embodiments of the present invention can be more fully understood by:
Fig. 1 is the flow chart for the method that a kind of transient state of the specific embodiment of the invention verifies；
Fig. 2 is the structure chart for the system that a kind of transient state of the specific embodiment of the invention verifies.
Specific embodiment
Exemplary embodiments of the present invention are introduced referring now to the drawings, however, the present invention can use many different shapes
Formula is implemented, and is not limited to the embodiment described herein, and to provide these embodiments be at large and fully disclose
The present invention, and the scope of the present invention is sufficiently conveyed to person of ordinary skill in the field.Show for what is be illustrated in the accompanying drawings
Term in example property embodiment is not limitation of the invention.In the accompanying drawings, identical cells/elements use identical attached
Icon note.
Unless otherwise indicated, term (including scientific and technical terminology) used herein has person of ordinary skill in the field
It is common to understand meaning.Further it will be understood that with the term that usually used dictionary limits, should be understood as and its
The context of related fields has consistent meaning, and is not construed as Utopian or too formal meaning.
Fig. 1 is the flow chart for the method that a kind of transient state of the specific embodiment of the invention verifies；As shown in Figure 1, the side
Method includes:
Step 110, the first standard transient-wave data and the second standard transient state wave are generated according to preset transient state parameter
Graphic data；
Further, the first standard transient-wave data and the second standard transient-wave data are according to transient state parameter
It is separately provided；The transient state parameter includes transient state step response time, transient state step rise time or fall time, becomes the steady time
And overshoot etc..
Method for generating first or second standard transient-wave data according to preset transient state parameter, comprising:
Generate initial time, become the steady time and overshoot be 00 to 1 ideal step climate digital sequence；
Transmission function is generated according to the transient state parameter；
By bilinearity method of changing by the Parameter Switch of the transmission function be two groups of coefficients of forward coefficients and reverse parameter
Sequence；
Two groups of coefficient sequences and the ideal step climate digital sequence are subjected to convolution algorithm, obtain corresponding transient state ginseng
Several standard transient-wave data.
In the present embodiment, realized using the programming software that above-mentioned principle generation transient-wave can be achieved；It specifically can be dress
It is loaded with the notebook, industrial personal computer or embedded controller etc. of programming software；Transient state step waveform data are generated by numerical expression.
Step 120, the first standard transient-wave data and the second standard transient-wave data are passed through into AD conversion,
Be converted to the first standard analog transient-wave and the second standard analog transient-wave；
In the present embodiment, it can be converted by function generator or other devices for having D/A conversion function as signal
Module is to realize；It is converted into marking by D/A switch technology by two groups of standard transient-wave data derived from programming software platform
Quasi-mode intends transient-wave, i.e. the first standard analog transient-wave and the second standard analog transient-wave；
Wherein, the first standard transient-wave data and the second standard transient-wave data are with excel file shape
Formula is transmitted and is transferred to signal conversion module in a manner of gpib bus to generate standard analog transient-wave.
At least two groups mutually indepedent and mutually isolated analog waveform output channels of the signal conversion module make described
First standard analog transient-wave and the second standard analog transient-wave pass through two groups of mutually indepedent and mutually isolated simulations
The output of waveform output channel.
Step 130, the second standard analog transient-wave is sampled and is converted by predeterminated frequency, generate FT3 agreement
Standard digital transient-wave；
In the present embodiment, the second standard analog transient-wave is sampled by AD sampling unit；Such as it can be with
Using the high-speed digitization instrument of the model PXI-5922 of NI company；Sampling obtains initial standard digital transient-wave；In order to
Direct current instrument transformer transient state tester is adapted to, also needs further to be converted the initial standard digital transient-wave；This reality
It applies in example, is converted by coding unit, i.e., initial standard digital transient-wave is converted to the standard digital of FT3 agreement
Transient-wave；The conversion is to determine that the primary standard number transient-wave is converted by the FPGA technology postponed by having
The standard digital transient-wave of FT3 agreement.
Further, by the way that synchronised clock is arranged, guarantee the second standard analog transient-wave and the standard digital
The synchronism of transient-wave；The delay time of the synchronism is less than 1 μ s, and the uncertainty of transfer lag is less than 0.01 μ s.
In the present embodiment, by the lock-out pulse trigger signal and acquisition that receive synchronised clock unit (synchronised clock)
Signal is controlled, the AD sampling unit realizes synchronized sampling, to guarantee the synchronism with coding unit conversion.
Step 140, the first standard analog transient-wave, the second standard analog transient-wave and standard digital is temporary
State Waveform Input is to direct current instrument transformer transient state tester to be measured；
Specifically, the first standard analog transient-wave is input to the direct current instrument transformer transient state tester to be measured
Master die analog quantity input terminal；
The second standard analog transient-wave is input to the tested mould of the direct current instrument transformer transient state tester to be measured
Analog quantity input terminal；
The standard digital transient-wave is input to the measured number amount of the direct current instrument transformer transient state tester to be measured
Input terminal.
Step 150, the transient state parameter of the three groups of transient-waves of correspondence exported according to direct current instrument transformer transient state tester to be measured,
Judge the direct current instrument transformer transient state tester verification assessment result to be measured.
According to the transient state parameter of three groups of transient-waves and original transient state parameter, according to preset decision rule, i.e.,
It can get verification assessment result, decision rule here can determine according to actual needs；
The first standard analog transient-wave and the second standard analog transient-wave can simulate one when generating
Fixed error amount, to simulate truth, and the second standard analog transient-wave with according to its digitized standard digital transient state
The waveform shape of waveform is almost identical；It in a practical situation, can be according to the first standard analog transient-wave (simulation of output
Tested waveform) standard of the result of output with the comparison of the second standard analog transient-wave (mock standard waveform) or according to output
Digital transient-wave (the simulating tested waveform) result of output and pair of the second standard analog transient-wave (mock standard waveform)
Than confirming the direct current instrument transformer transient state tester to be measured for the check results of simulation transient-wave and digital transient-wave.
Fig. 2 is the structure chart for the system that a kind of transient state of the specific embodiment of the invention verifies.As shown in Fig. 2, shown system
System includes:
Temporal Data generation module 210, the Temporal Data generation module generate the first mark for preset transient state parameter
Quasi- transient-wave data and the second standard transient-wave data；
Further, the Temporal Data generation module 210 includes the controller that can run default programming software program, is led to
It crosses and the transient state parameter is input to default programming software the first standard transient-wave data of acquisition and the second standard transient state wave
Graphic data；The transient state parameter include transient state step response time, transient state step rise time or fall time, become the steady time with
And overshoot.
Further, the Temporal Data generation module 210 marks the first standard transient-wave data and second
The mode that quasi- transient-wave data are sent to signal conversion module 220 include: with excel document form transmit and with GPIB it is total
Line mode is transmitted；The first standard transient-wave data and the second standard transient-wave data can be independent according to transient state parameter
Setting.
Signal conversion module 220, the signal conversion module 220 be used for the first standard transient-wave data and
Second standard transient-wave data are converted to the first standard analog transient-wave and the second standard analog transient state by AD conversion
Waveform；The signal conversion module 220 exports the first output end and direct current instrument transformer to be measured of the first standard analog transient-wave
The master die analog quantity input terminal of transient state tester is connected；The signal conversion module 220 exports the second standard analog transient-wave
Second output terminal be connected with the tested analog input end of direct current instrument transformer transient state tester to be measured；
Further, the signal conversion module 220 can be function generator or the device for having D/A conversion function；
For two groups of standard transient-wave data derived from programming software platform to be converted into standard analog transient state by D/A switch technology
Waveform need to include two groups of mutually indepedent and mutually isolated analog waveform output channels.
Standard digital source module 230, the standard digital source module 230 include AD sampling unit 231 and coding unit
232；The AD sampling unit 231 is used to the second standard analog transient-wave obtaining primary standard by predeterminated frequency sampling
Digital transient-wave；The primary standard number transient-wave for being converted by the coding unit 232 according to preset rules
The standard digital transient-wave of FT3 agreement；The output end of the coding unit 232 and the direct current instrument transformer transient state to be measured verify
The measured number amount input terminal of instrument is connected.
Further, the criterion numeral source word module further includes acquisition control unit and synchronised clock unit；
The acquisition control unit is used to the primary standard number transient-wave that AD sampling unit 231 exports being transmitted to volume
Code unit 232；
The synchronised clock unit is for providing synchronous clock with coding unit 232 to AD sampling unit 231.
Further, the coding unit 232 determines the FPGA technology postponed by the primary standard number temporarily by having
State waveform is converted into the standard digital transient-wave of FT3 agreement.
Further, the synchronised clock unit is used to monitor the second standard analog transient state of the input of AD sampling unit 231
The delay time for the standard digital transient-wave that waveform and coding unit 232 export is less than 1 μ s, and the uncertainty of transfer lag
Less than 0.01 μ s.
The AD sampling unit 231 can be using the high-speed digitization instrument of the model PXI-5922 of NI company；It is main
Function is the lock-out pulse for receiving the control signal and synchronised clock unit of acquisition control unit output of standard digital source module
Trigger signal is sampled and transformed into digital signal to the synchronous triggering of standard analog transient-wave progress AD and is output to standard digital source
Module.The conversion accuracy of AD sampling unit 231 can be guaranteed by measurement and calibration.
In the instructions provided here, numerous specific details are set forth.It is to be appreciated, however, that the implementation of the disclosure
Example can be practiced without these specific details.In some instances, well known method, structure is not been shown in detail
And technology, so as not to obscure the understanding of this specification.
Those skilled in the art will understand that can be carried out adaptively to the module in the equipment in embodiment
Change and they are arranged in one or more devices different from this embodiment.It can be the module or list in embodiment
Member or component are combined into a module or unit or component, and furthermore they can be divided into multiple submodule or subelement or
Sub-component.Other than such feature and/or at least some of process or unit exclude each other, it can use any
Combination is to all features disclosed in this specification (including adjoint claim, abstract and attached drawing) and so disclosed
All process or units of what method or apparatus are combined.Unless expressly stated otherwise, this specification is (including adjoint power
Benefit require, abstract and attached drawing) disclosed in each feature can carry out generation with an alternative feature that provides the same, equivalent, or similar purpose
It replaces.The step of being related in this specification, which numbers, is only used for distinguishing each step, and the time being not limited between each step
Or the relationship of logic, restriction unless the context clearly, otherwise the relationship between each step includes the case where various possible.
In addition, it will be appreciated by those of skill in the art that although some embodiments described herein include other embodiments
In included certain features rather than other feature, but the combination of the feature of different embodiments means to be in the disclosure
Within the scope of and form different embodiments.For example, embodiment claimed in detail in the claims is one of any
Can in any combination mode come using.
The various component embodiments of the disclosure can be implemented in hardware, or to run on one or more processors
Software module realize, or be implemented in a combination thereof.The disclosure is also implemented as executing side as described herein
The some or all equipment or system program (for example, computer program and computer program product) of method.It is such
It realizes that the program of the disclosure can store on a computer-readable medium, or can have the shape of one or more signal
Formula.Such signal can be downloaded from an internet website to obtain, and perhaps be provided on the carrier signal or with any other shape
Formula provides.
The disclosure is limited it should be noted that above-described embodiment illustrates rather than the disclosure, and ability
Field technique personnel can be designed alternative embodiment without departing from the scope of the appended claims.Word "comprising" is not arranged
Except there are element or steps not listed in the claims.Word "a" or "an" located in front of the element does not exclude the presence of more
A such element.The disclosure can be by means of including the hardware of several different elements and by means of properly programmed calculating
Machine is realized.If several in these systems can be by same in the unit claim for listing dry systems
Hardware branch embodies.
The above is only the specific embodiment of the disclosure, it is noted that for the ordinary skill people of this field
Member for, do not depart from the disclosure spirit under the premise of, can make several improvements, modify and deform, these improve, modification,
It is regarded as falling within the scope of protection of this application with deformation.
Claims (15)
1. a kind of method of transient state verification, which comprises
The first standard transient-wave data and the second standard transient-wave data are generated according to preset transient state parameter；
By the first standard transient-wave data and the second standard transient-wave data by AD conversion, the first mark is converted to
Quasi-mode intends transient-wave and the second standard analog transient-wave；
Second standard analog transient-wave is sampled and converted by predeterminated frequency, the standard digital transient state of FT3 agreement is generated
Waveform；
The first standard analog transient-wave, the second standard analog transient-wave and standard digital transient-wave are input to
Direct current instrument transformer transient state tester to be measured；
According to the transient state parameter of three groups of transient-waves of correspondence of direct current instrument transformer transient state tester to be measured output, judge that this is to be measured straight
Current transformer transient state tester verifies assessment result.
2. the method according to claim 1, wherein by the first standard analog transient-wave, the second standard
Simulation transient-wave and standard digital transient-wave are input to direct current instrument transformer transient state tester to be measured, comprising:
The first standard analog transient-wave is input to the master die analog quantity of the direct current instrument transformer transient state tester to be measured
Input terminal；
The second standard analog transient-wave is input to the tested analog quantity of the direct current instrument transformer transient state tester to be measured
Input terminal；
The standard digital transient-wave is input to the measured number amount input of the direct current instrument transformer transient state tester to be measured
End.
3. according to the method described in claim 1, it is characterized by: the transient state parameter include transient state step response time, temporarily
State step rise time or fall time, become steady time and overshoot.
4. according to the method described in claim 3, it is characterized in that, the first standard transient-wave data and the second standard
Transient-wave data are separately provided according to transient state parameter；Standard transient-wave data are generated according to preset transient state parameter, comprising:
Generate initial time, become the steady time and overshoot be 00 to 1 ideal step climate digital sequence；
Transmission function is generated according to the transient state parameter；
By bilinearity method of changing by the Parameter Switch of the transmission function be two groups of coefficient sequences of forward coefficients and reverse parameter；
Two groups of coefficient sequences and the ideal step climate digital sequence are subjected to convolution algorithm, obtain the corresponding transient state parameter
Standard transient-wave data.
5. according to the method described in claim 1, it is characterized by: described by the first standard transient-wave data and
Before two standard transient-wave data are converted, is transmitted by excel document form and transmitted in a manner of gpib bus.
6. according to the method described in claim 1, it is characterized by: the first standard analog transient-wave and the second standard
It simulates transient-wave and passes through two groups of mutually indepedent and mutually isolated analog waveform output channel outputs.
7. according to the method described in claim 1, it is characterized by: guaranteeing second master die by setting synchronised clock
The synchronism of quasi- transient-wave and the standard digital transient-wave；The delay time of the synchronism is less than 1 μ s, and conversion is prolonged
Slow uncertainty is less than 0.01 μ s.
8. according to the method described in claim 1, it is characterized by: determining the FPGA technology postponed by the initial mark by having
Quasi- number transient-wave is converted into the standard digital transient-wave of FT3 agreement.
9. a kind of system of transient state verification, which is characterized in that the system comprises:
Temporal Data generation module, the Temporal Data generation module generate the first standard transient state wave for preset transient state parameter
Graphic data and the second standard transient-wave data；
Signal conversion module, the signal conversion module are used for the first standard transient-wave data and the second standard are temporary
State Wave data is converted to the first standard analog transient-wave and the second standard analog transient-wave by AD conversion；It is described
Signal conversion module exports the first output end and direct current instrument transformer transient state tester to be measured of the first standard analog transient-wave
Master die analog quantity input terminal is connected；The signal conversion module export the second output terminal of the second standard analog transient-wave with to
The tested analog input end for surveying direct current instrument transformer transient state tester is connected；
Standard digital source module, the standard digital source module include AD sampling unit and coding unit；The AD sampling is single
Member is for obtaining primary standard number transient-wave by predeterminated frequency sampling for the second standard analog transient-wave；The volume
Code unit is used to be converted into the primary standard number transient-wave according to preset rules the standard digital transient state wave of FT3 agreement
Shape；The output end of the coding unit is connected with the measured number amount input terminal of the direct current instrument transformer transient state tester to be measured.
10. system according to claim 9, it is characterised in that: the transient state parameter include transient state step response time, temporarily
State step rise time or fall time, become steady time and overshoot.
11. system according to claim 9, it is characterised in that: the Temporal Data generation module is by first standard
It includes: with excel file that transient-wave data and the second standard transient-wave data, which are sent to the mode of signal conversion module,
Form is transmitted and is transmitted in a manner of gpib bus；The first standard transient-wave data and the second standard transient-wave number
According to can be separately provided according to transient state parameter.
12. system according to claim 9, it is characterised in that: the signal conversion module include two groups it is mutually indepedent and
Mutually isolated analog waveform output channel.
13. system according to claim 9, it is characterised in that: the standard digital source module further includes acquisition control list
Member and synchronised clock unit；
The acquisition control unit is used to the primary standard number transient-wave that AD sampling unit exports being transmitted to coding unit；
The synchronised clock unit is used for the clock synchronous with coding unit offer to AD sampling unit.
14. system according to claim 9, it is characterised in that: the coding unit is by there is the FPGA skill for determining and postponing
The primary standard number transient-wave is converted into the standard digital transient-wave of FT3 agreement by art.
15. system according to claim 13, it is characterised in that: the synchronised clock unit is for monitoring AD sampling unit
The delay time of the standard digital transient-wave of the second standard analog transient-wave and the coding unit output of input less than 1 μ s,
And the uncertainty of transfer lag is less than 0.01 μ s.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811426106.2A CN109444794B (en) | 2018-11-27 | 2018-11-27 | Transient state checking method and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811426106.2A CN109444794B (en) | 2018-11-27 | 2018-11-27 | Transient state checking method and system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109444794A true CN109444794A (en) | 2019-03-08 |
| CN109444794B CN109444794B (en) | 2022-04-22 |
Family
ID=65556318
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811426106.2A Active CN109444794B (en) | 2018-11-27 | 2018-11-27 | Transient state checking method and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109444794B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101545939A (en) * | 2009-04-28 | 2009-09-30 | 江苏省电力试验研究院有限公司 | System for verifying transient characteristics of electronic transformer compatible with IEC61850 protocol |
| CN101872004A (en) * | 2010-03-04 | 2010-10-27 | 国网电力科学研究院 | Calibrating test device of electronic type transformer checking instrument |
| JP2010268349A (en) * | 2009-05-18 | 2010-11-25 | Renesas Electronics Corp | Analog/digital conversion circuit and analog/digital conversion method |
| CN103197273A (en) * | 2013-03-28 | 2013-07-10 | 国家电网公司 | Source tracing device used for electronic mutual inductor output calibration instrument |
| CN104833941A (en) * | 2015-05-26 | 2015-08-12 | 广东电网有限责任公司电力科学研究院 | DC mutual inductor check meter combining analog quantity and digital quantity verification function |
| CN206362919U (en) * | 2017-01-05 | 2017-07-28 | 云南电网有限责任公司电力科学研究院 | A kind of DC current transformer transient state tester |
-
2018
- 2018-11-27 CN CN201811426106.2A patent/CN109444794B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101545939A (en) * | 2009-04-28 | 2009-09-30 | 江苏省电力试验研究院有限公司 | System for verifying transient characteristics of electronic transformer compatible with IEC61850 protocol |
| JP2010268349A (en) * | 2009-05-18 | 2010-11-25 | Renesas Electronics Corp | Analog/digital conversion circuit and analog/digital conversion method |
| CN101872004A (en) * | 2010-03-04 | 2010-10-27 | 国网电力科学研究院 | Calibrating test device of electronic type transformer checking instrument |
| CN103197273A (en) * | 2013-03-28 | 2013-07-10 | 国家电网公司 | Source tracing device used for electronic mutual inductor output calibration instrument |
| CN104833941A (en) * | 2015-05-26 | 2015-08-12 | 广东电网有限责任公司电力科学研究院 | DC mutual inductor check meter combining analog quantity and digital quantity verification function |
| CN206362919U (en) * | 2017-01-05 | 2017-07-28 | 云南电网有限责任公司电力科学研究院 | A kind of DC current transformer transient state tester |
Non-Patent Citations (1)
| Title |
|---|
| 章鹿华 等: "基于虚拟仪器技术的电子式互感器校验装置", 《电测与仪表》 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109444794B (en) | 2022-04-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Montenegro et al. | Real time OpenDSS framework for distribution systems simulation and analysis | |
| CN101807795B (en) | Method for forming electric energy metering simulation system and device thereof | |
| CN109407033B (en) | Calibration device of transient calibration instrument of direct current transformer | |
| CN106154202B (en) | A kind of calibration method of electrical short-circuit testing ＆ measuring system | |
| CN103901391B (en) | There is novel analog standard scale and the detection method of digitalized electrical energy meter detection function | |
| CN106526526B (en) | A kind of the digitized measurement opening machine system test device | |
| CN104698235A (en) | Method for generating transient fault waveforms in relay protection testing | |
| CN106485025B (en) | A kind of check method of direct current protecting definite value | |
| CN104062618B (en) | A kind of capacitive apparatus on-Line Monitor Device method of calibration of dual signal source | |
| CN102495290B (en) | Obtaining apparatus for port impedance characteristic of alternating current power electronic module and obtaining method thereof | |
| CN110045317A (en) | A kind of mutual inductor measurement error online test method and system | |
| CN105510859A (en) | System and method for evaluating electronic transformer | |
| CN110441724A (en) | A kind of device for being verified to DC voltage transformer secondary measuring system | |
| CN106646334A (en) | Method and system for calculating metering error of electric energy meter | |
| CN106526521A (en) | Calibration system for online monitoring device for capacitive equipment | |
| CN103901389A (en) | Verifying device and method of analog electric signal electric energy meter, analog electronic signal electric energy meter and digital signal electric energy meter | |
| CN104635146B (en) | Analog circuit fault diagnosis method based on random sinusoidal signal test and HMM (Hidden Markov Model) | |
| CN103926550B (en) | A kind of device and method that electric power mutual-inductor is verified based on virtual instrument | |
| CN101479613B (en) | Method for instantaneously determining rates of distortion of signals on an AC electrical network, and associated device | |
| CN107576904B (en) | Analog-circuit fault diagnosis method based on sawtooth wave | |
| CN109444794A (en) | A kind of method and system of transient state verification | |
| CN104597424A (en) | Verification platform and verification method for electric energy measurement of optical transformer | |
| CN110456298A (en) | A kind of adaptive alternately measuring device and the method for measurement direct-current voltage proportion magnitude error | |
| Gasch et al. | Uncertainty evaluation for the impact of measurement accuracy on power quality parameters | |
| CN103675746A (en) | High-voltage switch tester calibration device and calibration method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CB03 | Change of inventor or designer information | ||
| CB03 | Change of inventor or designer information |
Inventor after: Nie Qi Inventor after: Huang Junchang Inventor after: Wan Peng Inventor after: Xiong Qianzhu Inventor after: Guo Xianshan Inventor after: Zhang Min Inventor after: Chen Zhengguang Inventor after: Zhou Feng Inventor after: Hu Haoliang Inventor after: Yang Chunyan Inventor after: Li He Inventor after: Liu Boyang Inventor before: Nie Qi Inventor before: Hu Haoliang Inventor before: Yang Chunyan Inventor before: Li He Inventor before: Liu Boyang Inventor before: Huang Junchang Inventor before: Wan Peng Inventor before: Xiong Qianzhu |