CN109410809A - GOA overhauls circuit - Google Patents
GOA overhauls circuit Download PDFInfo
- Publication number
- CN109410809A CN109410809A CN201811551308.XA CN201811551308A CN109410809A CN 109410809 A CN109410809 A CN 109410809A CN 201811551308 A CN201811551308 A CN 201811551308A CN 109410809 A CN109410809 A CN 109410809A
- Authority
- CN
- China
- Prior art keywords
- signal
- goa
- unit
- detection
- film transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Multimedia (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Abstract
The present invention provides a kind of GOA maintenance circuit.The GOA maintenance circuit includes detecting signal unit, multistage GOA unit, a plurality of detection cabling and multiple control units；The a plurality of detection cabling parallel interval arrangement, each detect the corresponding electric connection level-one GOA unit in one end of cabling, and the other end is correspondingly connected with a control unit, each control unit is electrically connected with the detecting signal unit；The GOA unit is for exporting scanning signal；Described control unit is used to that the detection cabling and detecting signal unit, the scanning signal input signal detection unit which is exported to be connected when the GOA unit for connecting the corresponding detection cabling of the control unit detects；The GOA unit that the detecting signal unit is used to export the scanning signal according to the waveform judgement of the scanning signal of input whether there is failure, can fast and accurately detect the failure of GOA circuit, guarantee the yield of GOA circuit.
Description
Technical field
The present invention relates to field of display technology more particularly to a kind of GOA to overhaul circuit.
Background technique
Liquid crystal display (Liquid Crystal Display, LCD) has thin fuselage, power saving, radiationless etc. numerous excellent
Point, is widely used.Such as: LCD TV, mobile phone, personal digital assistant (PDA), digital camera, computer screen
Curtain or laptop screen etc., occupy an leading position in flat display field.
Liquid crystal display on existing market is largely backlight liquid crystal display comprising liquid crystal display panel and back
Optical mode group (backlight module).The working principle of liquid crystal display panel is in thin-film transistor array base-plate (Thin
Film Transistor Array Substrate, TFT Array Substrate) and colored filter substrate (Color
Filter, CF) between pour into liquid crystal molecule, and apply driving voltage on two plate bases to control the rotation side of liquid crystal molecule
To, by the light refraction of backlight module come out generate picture.
In active liquid crystal display, each pixel is electrically connected a thin film transistor (TFT) (TFT), the grid of thin film transistor (TFT)
Pole (Gate) is connected to horizontal scanning line, and drain electrode (Drain) is connected to the data line of vertical direction, and source electrode (Source) then connects
To pixel electrode.Apply enough voltage on horizontal scanning line, the institute being electrically connected on this horizontal scanning line can be made
Have TFT opening, thus the signal voltage on data line can writing pixel, control the light transmittance of different liquid crystal and then reach control
The effect of color and brightness.The driving of current active liquid crystal display panel horizontal scanning line is mainly by external integrated circuit board
(Integrated Circuit, IC) is completed, and external IC can control the charging and discharging step by step of horizontal scanning lines at different levels.
And GOA technology (Gate Driver on Array) i.e. array substrate row actuation techniques, the original of liquid crystal display panel can be used
On the substrate for having array process that the driving circuit of horizontal scanning line is produced on around viewing area, makes it to substitute external IC and
At the driving of horizontal scanning line.GOA technology can be reduced welding (bonding) process of external IC, has an opportunity to promote production capacity and drop
Low product cost, and liquid crystal display panel can be made to be more suitable for making the display product of narrow frame or Rimless.
With the development of display panel, people pursue more large screen, higher resolution ratio, the visual effect more stimulated, this
Undoubtedly to panel processing procedure, material and technique, more stringent requirements are proposed, due to the labyrinth of GOA circuit itself, leads to GOA
Circuit is easy to appear failure after completing, and lacks effective maintenance means to GOA circuit at present in the prior art, unfavorable
It is repaired in the panel later period, Fault analytical and design improve.
Summary of the invention
The purpose of the present invention is to provide a kind of GOA to overhaul circuit, can fast and accurately detect the failure of GOA circuit,
Guarantee the yield of GOA circuit.
To achieve the above object, the present invention provides a kind of GOA maintenance circuit, including detecting signal unit, multistage GOA are mono-
First, a plurality of detection cabling and multiple control units；
The a plurality of detection cabling parallel interval arrangement, each detect the corresponding electric connection level-one in one end of cabling
GOA unit, the other end are correspondingly connected with a control unit, each control unit electrically connects with the detecting signal unit
It connects；
The GOA unit is for exporting scanning signal；
Described control unit is used to detect in the GOA unit for connecting the corresponding detection cabling of the control unit
When, the detection cabling and detecting signal unit, the scanning signal input signal detection list which is exported is connected
Member；
The GOA that the detecting signal unit is used to export the scanning signal according to the waveform judgement of the scanning signal of input is mono-
Member whether there is failure.
Each control unit includes a gating thin film transistor (TFT), an one way conducting device and a detection film crystal
Pipe；
The gating thin-film transistor gate receives a gating signal, and source electrode is electrically connected the corresponding detection of the control unit
One end of cabling, drain electrode are electrically connected the first end of one way conducting device；
The second end of the one way conducting device is electrically connected the source electrode of detection thin film transistor (TFT)；
The grid of the detection thin film transistor (TFT) receives detection signal, and drain electrode is electrically connected first node；
The detecting signal unit is electrically connected first node；
The one way conducting device only allows electric signal from first end to second end one-way transmission.
The detecting signal unit includes resetting thin film transistor (TFT), storage capacitance and waveform judgment module；
The grid for resetting thin film transistor (TFT) receives reset signal, and source electrode is electrically connected first node, and drain electrode receives one
Reset high voltage；
One end of the storage capacitance is electrically connected first node, and the other end receives constant voltage signal；
The waveform judgment module is electrically connected first node.
The gating signal includes the first gating signal, the second gating signal and third gating signal；
If N is positive integer, in continuously arranged 3N-2,3N-1 and the 3N control unit, the 3N control
Gating thin-film transistor gate in unit processed receives the first gating signal, the gating film crystal in the 3N-1 control unit
Tube grid receives the second gating signal, and the gating thin-film transistor gate in the 3N-2 control unit receives third gating letter
Number.
When detection, in a frame image time, the multistage GOA unit exports scanning signal, first gating step by step
Signal, the second gating signal and third gating signal control the gating thin film transistor (TFT) in all control units and are both turned on, described
Detection signal controls the detection thin film transistor (TFT) in all control units and is both turned on, and the reset signal controls the reset film
Transistor is connected in the blank time that the scanning signal of every adjacent two-stage GOA unit exports, and the waveform judgment module connects
The scanning signal of every level-one GOA unit output is received, and described output scanning signal is judged according to the waveform of each scanning signal
GOA unit whether there is failure.
When detection, in the frame image time in continuous three frames picture, the multistage GOA unit exports scanning letter step by step
Number, first gating signal controls the gating thin film transistor (TFT) conducting in the 3N-2 control unit, the detection signal control
The detection thin film transistor (TFT) made in all control units is both turned on, and the reset signal controls the reset thin film transistor (TFT) every
Conducting in the blank time of the scanning signal output of adjacent two-stage GOA unit, the waveform judgment module receive 3N-2
The scanning signal of GOA unit output, and judge that the GOA for exporting the scanning signal is mono- according to the waveform of each scanning signal
Member whether there is failure；
In another frame image time in continuous three frames picture, the multistage GOA unit exports scanning signal step by step, institute
It states the gating thin film transistor (TFT) that the second gating signal controls in the 3N-1 control unit to be connected, the detection signal control is all
Detection thin film transistor (TFT) in control unit is both turned on, and the reset signal controls the reset thin film transistor (TFT) every adjacent
Conducting in the blank time of the scanning signal output of two-stage GOA unit, the waveform judgment module receive the 3N-1 GOA unit
The scanning signal of output, and judge whether the GOA unit for exporting the scanning signal deposits according to the waveform of each scanning signal
In failure；
In another frame image time in continuous three frames picture, the multistage GOA unit exports scanning signal step by step, institute
It states the gating thin film transistor (TFT) that third gating signal controls in the 3N control unit to be connected, the detection signal controls all controls
Detection thin film transistor (TFT) in unit processed is both turned on, and the reset signal controls the reset thin film transistor (TFT) every adjacent two
Conducting in the blank time of the scanning signal output of grade GOA unit, the waveform judgment module receive the 3N GOA unit output
Scanning signal, and according to the waveform of each scanning signal judge it is described export the scanning signal GOA unit with the presence or absence of therefore
Barrier.
The one way conducting device is a P-type TFT, the grid and source series structure of the P-type TFT
At the first end of the one way conducting device, drain electrode constitutes the second end of the one way conducting device.
The one way conducting device is a N-type TFT, the grid and source series structure of the N-type TFT
At the second end of the one way conducting device, drain electrode constitutes the first end of the one way conducting device.
The GOA overhauls circuit, further includes at least one repair line intersected with the detection cabling insulation.
When repairing to the GOA unit there are failure, the GOA unit of failure is blocked to export, and electric with the GOA unit
Property connection detection cabling and the crossover location of a repair line carry out laser welding so that the detection cabling and repair line electricity
Property connection, and corresponding with the GOA unit of failure scanning signal is loaded in the repair line.
Beneficial effects of the present invention: the present invention provides a kind of GOA maintenance circuit, including detecting signal unit, multistage GOA mono-
First, a plurality of detection cabling and multiple control units；The a plurality of detection cabling parallel interval arrangement, each detect the one of cabling
End is corresponding to be electrically connected level-one GOA unit, and the other end is correspondingly connected with a control unit, each control unit is and institute
State detecting signal unit electric connection；The GOA unit is for exporting scanning signal；Described control unit is used for the control
When the GOA unit that the corresponding detection cabling of unit is connected is detected, the detection cabling and detecting signal unit is connected, with
The scanning signal input signal detection unit that the GOA unit is exported；The detecting signal unit is used for the scanning according to input
The GOA unit that the waveform judgement of signal exports the scanning signal whether there is failure, can fast and accurately detect GOA circuit
Failure guarantees the yield of GOA circuit.
Detailed description of the invention
For further understanding of the features and technical contents of the present invention, it please refers to below in connection with of the invention detailed
Illustrate and attached drawing, however, the drawings only provide reference and explanation, is not intended to limit the present invention.
In attached drawing,
Fig. 1 is the circuit diagram that GOA of the invention overhauls circuit；
Fig. 2 is the schematic diagram of the first embodiment for the middle one way conducting device that GOA of the invention overhauls circuit；
Fig. 3 is the schematic diagram of the second embodiment for the middle one way conducting device that GOA of the invention overhauls circuit；
Fig. 4 is the normal waveform figure for the first detection process that GOA of the invention overhauls circuit；
Fig. 5 is the unusual waveforms figure for the first detection process that GOA of the invention overhauls circuit；
Fig. 6 is the normal waveform figure for the second detection process that GOA of the invention overhauls circuit；
Fig. 7 is the unusual waveforms figure for the second detection process that GOA of the invention overhauls circuit；
Fig. 8 is the schematic diagram after the reparation of GOA maintenance circuit of the invention；
Fig. 9 is the waveform diagram after the reparation of GOA maintenance circuit of the invention.
Specific embodiment
Further to illustrate technological means and its effect adopted by the present invention, below in conjunction with preferred implementation of the invention
Example and its attached drawing are described in detail.
Referring to Fig. 1, the present invention provides a kind of GOA maintenance circuit, including it is detecting signal unit 1, multistage GOA unit 2, more
Item detects cabling 3 and multiple control units 4；
A plurality of 3 parallel interval of the detection cabling arrangement, each detect the corresponding electric connection level-one in one end of cabling 3
GOA unit 2, the other end are correspondingly connected with a control unit 4, each control unit 4 is electric with the detecting signal unit 1
Property connection；
The GOA unit 2 is for exporting scanning signal Scan；
Described control unit 4 is used to examine in the GOA unit 2 for connecting the corresponding detection cabling 3 of the control unit 4
When survey, the detection cabling 3 and detecting signal unit 1 is connected, the scanning signal Scan input letter which is exported
Number detection unit 1；
The detecting signal unit 1 is used to export the scanning signal according to the waveform judgement of the scanning signal Scan of input
The GOA unit 2 of Scan whether there is failure.
Specifically, as shown in Figure 1, each control unit 4 includes gating a thin film transistor (TFT) T1, an one-way conduction device
The detection of part D1 and one thin film transistor (TFT) T2；The gating thin film transistor (TFT) T1 grid receives a gating signal, and source electrode is electrically connected
One end of the corresponding detection cabling 3 of the control unit 4, drain electrode are electrically connected the first end of one way conducting device D1；It is described unidirectional
The second end of conduction device D1 is electrically connected the source electrode of detection thin film transistor (TFT) T2；The grid of the detection thin film transistor (TFT) T2 connects
Detection signal Test is received, drain electrode is electrically connected first node A；The detecting signal unit 1 is electrically connected first node A；It is described
One way conducting device D1 only allows electric signal from first end to second end one-way transmission.
Specifically, as shown in Figure 1, the detecting signal unit 1 includes resetting thin film transistor (TFT) T3, storage capacitance C1 and wave
Shape judgment module 11；The grid for resetting thin film transistor (TFT) T3 receives reset signal Reset, and source electrode is electrically connected first node
A, drain electrode receive one and reset high voltage VGH；One end of the storage capacitance C1 is electrically connected first node A, and the other end receives permanent
Signal DC is pressed, the waveform judgment module 11 is electrically connected first node A.
Further, as shown in Figure 1, the gating signal includes the first gating signal Test1, the second gating signal
Test2 and third gating signal Test3；If N is positive integer, in continuously arranged 3N-2,3N-1 and the 3N controls
In unit 4 processed, the gating thin film transistor (TFT) T1 grid in the 3N control unit 4 receives the first gating signal Test1,3N-1
Gating thin film transistor (TFT) T1 grid in a control unit 4 receives the second gating signal Test2, in the 3N-2 control unit 4
Gating thin film transistor (TFT) T1 grid receive third gating signal Test3.
Specifically, the one way conducting device D1 can according to need the corresponding device of selection, optionally, as shown in Fig. 2,
The one way conducting device D1 can be a P-type TFT, and the grid and source series of the P-type TFT are constituted
The first end of the one way conducting device D1, drain electrode constitute the second end of the one way conducting device D1.Optionally, such as Fig. 3 institute
Show, the one way conducting device D1 can also be a N-type TFT, the grid and source electrode string of the N-type TFT
Connection constitutes the second end of the one way conducting device D1, and drain electrode constitutes the first end of the one way conducting device D1.
Specifically, the waveform judgment module 11 is an oscillograph.
Specifically, there are two types of detection pattern, the detection process of the first detection pattern for GOA of the invention maintenance circuit tool are as follows:
In a frame image time, the multistage GOA unit 2 exports scanning signal Scan step by step, the first gating signal Test1,
Second gating signal Test2 and third gating signal Test3 controls the gating thin film transistor (TFT) T1 in all control units 4 and leads
Logical, the detection signal Test controls the detection thin film transistor (TFT) T2 in all control units 4 and is both turned on, the reset signal
Reset controls the reset thin film transistor (TFT) T3 in the blank that the scanning signal Scan of every adjacent two-stage GOA unit 2 is exported
Interior conducting, the waveform judgment module 11 receive the scanning signal Scan that every level-one GOA unit 2 exports, and according to each every
The waveform of one scanning signal Scan judges the GOA unit 2 of the output scanning signal Scan with the presence or absence of failure.
For example, in the first detection pattern, as shown in Figures 4 and 5, Scan1, Scan2, Scan3 and Scan4 points
Not Wei the 1st, the 2nd, the 3rd and the 4th grade of GOA unit output scanning signal, Gtest is the letter being input in waveform judgment module 11
Number, as shown in figure 4, Scan1, Scan2, Scan3 and Scan4 are normally exported, Gtest waveform the correspondence Scan1,
A low potential pulse is respectively provided with during the output of Scan2, Scan3 and Scan4, may determine that accordingly the 1st, the 2nd, the 3rd and
4th grade of GOA unit works normally, and in Fig. 5, normally output, Scan2 are not exported normally by Scan1, Scan3 and Scan4
Low potential.Gtest waveform is respectively provided with a low potential pulse during the output of correspondence described Scan1, Scan3 and Scan4,
And do not collect corresponding low potential pulse (as shown in dotted line frame in Fig. 5) then during the output of Scan2, then it may determine that
2nd grade of GOA unit does not work normally, and there are failures.
Specifically, the detection process of second of detection pattern of GOA of the invention maintenance circuit are as follows: in continuous three frames picture
In a frame image time in, it is described multistage GOA unit 2 export scanning signal Scan, the first gating signal Test1 step by step
The gating thin film transistor (TFT) T1 conducting in the 3N-2 control unit 4 is controlled, it is single that the detection signal Test controls all controls
Detection thin film transistor (TFT) T2 in member 4 is both turned on, and the reset signal Reset controls the reset thin film transistor (TFT) T3 in every phase
Conducting in the blank time of the scanning signal Scan output of adjacent two-stage GOA unit 2, the waveform judgment module 11 receive the
The scanning signal Scan of 3N-2 GOA unit 2 output, and the output judged according to the waveform of each scanning signal Scan this is swept
The GOA unit 2 of signal Scan is retouched with the presence or absence of failure；
In another frame image time in continuous three frames picture, the multistage GOA unit 2 exports scanning signal step by step
Scan, the second gating signal Test2 control the gating thin film transistor (TFT) T1 conducting in the 3N-1 control unit 4, described
Detection signal Test controls the detection thin film transistor (TFT) T2 in all control units 4 and is both turned on, the reset signal Reset control
The thin film transistor (TFT) T3 that resets is connected in the blank time that the scanning signal Scan of every adjacent two-stage GOA unit 2 is exported,
The waveform judgment module 11 receives the scanning signal Scan of the 3N-1 GOA unit 2 output, and according to each scanning signal
The waveform of Scan judges the GOA unit 2 of the output scanning signal Scan with the presence or absence of failure；
In another frame image time in continuous three frames picture, the multistage GOA unit 2 exports scanning signal step by step
Scan, the third gating signal Test3 control the gating thin film transistor (TFT) T1 conducting in the 3N control unit 4, the inspection
Survey signal Test controls the detection thin film transistor (TFT) T2 in all control units 4 and is both turned on, and the reset signal Reset controls institute
It states reset thin film transistor (TFT) T3 to be connected in the blank time that the scanning signal Scan of every adjacent two-stage GOA unit 2 is exported, institute
The scanning signal Scan that waveform judgment module 11 receives the output of the 3N GOA unit 2 is stated, and according to each scanning signal Scan's
Waveform judges the GOA unit 2 of the output scanning signal Scan with the presence or absence of failure.
For example, in second of detection pattern, as shown in FIG. 6 and 7, Scan1 and Scan4 are respectively the 1st and the 4th
The scanning signal of grade GOA unit output, Gtest ' is the signal being input in waveform judgment module 11, as shown in figure 4, Scan1
And Scan4 is normally exported, Gtest ' waveform is respectively provided with a low electricity during the output of the correspondence Scan1 and Scan4
Digit pulse, also waveform output without exception, may determine that the 1st and the 4th grade of GOA is mono- accordingly during the non-output of Scan1 and Scan4
Member works normally, and in Fig. 5, normally output, Scan1 do not export low potential normally to Scan4.Gtest ' waveform is in correspondence
There is a low potential pulse during the output of the Scan4, and be then to collect corresponding low electricity during the output of Scan1
Digit pulse and extra low potential output is also acquired during non-output between Scan1 and Scan4 (such as institute in dotted line frame in Fig. 7
Show) namely Scan1 there are multiple-pulse output (Multi-Pulse) is abnormal, may determine that the 1st grade of abnormal work of GOA unit accordingly
Make, needs to repair.
As above-mentioned, using the combination of two kinds of detection patterns of GOA maintenance circuit of the invention, GOA electricity both can detecte out
The exception of road no pulse output, also can detecte out the exception of GOA circuit multiple-pulse output, so that the accurate of detection be effectively ensured
Rate.
It specifically, further include at least one insulating and intersecting with the detection cabling 3 in GOA maintenance circuit of the invention
Repair line 5.
Further, as shown in Figure 8 and Figure 9, when repairing to the GOA unit 2 there are failure, the GOA of failure is blocked
Unit 2 exports, and carries out laser in the crossover location with the GOA unit 2 detection cabling 3 being electrically connected and a repair line 5 and melt
It connects, so that the detection cabling 3 and the repair line 5 are electrically connected, and loads the GOA unit 2 with the failure in the repair line 5
Corresponding scanning signal Scan.Wherein, as shown in figure 8, the output of GOA unit 2 for blocking failure specifically refers to disengagement failure
GOA unit 2 and its display panel driven between electric connection, and pass through the molten of detection cabling 3 and a repair line 5
It connects, the connection between the repair line 5 and the display panel, so as to by inputting substitution signal to repair line 5
The scanning signal Scan that Input replaces the GOA unit 2 of failure to export, to keep the normal driving of display panel, such as in Fig. 9
When Scan2 is without output, waveform corresponding with correct Scan2's is exported by Input, keeps the normal driving of display panel.
In conclusion the present invention provides a kind of GOA maintenance circuit, including it is detecting signal unit, multistage GOA unit, a plurality of
Detect cabling and multiple control units；The a plurality of detection cabling parallel interval arrangement, one end that each detects cabling are right
Electrotropism connects level-one GOA unit, and the other end is correspondingly connected with a control unit, each control unit with the signal
Detection unit is electrically connected；The GOA unit is for exporting scanning signal；Described control unit is used for the control unit pair
When the GOA unit that the detection cabling answered is connected is detected, the detection cabling and detecting signal unit is connected, it should
The scanning signal input signal detection unit of GOA unit output；The detecting signal unit is used for the scanning signal according to input
Waveform judgement export the scanning signal GOA unit whether there is failure, can fast and accurately detect the event of GOA circuit
Barrier guarantees the yield of GOA circuit.
The above for those of ordinary skill in the art can according to the technique and scheme of the present invention and technology
Other various corresponding changes and modifications are made in design, and all these change and modification all should belong to the claims in the present invention
Protection scope.
Claims (10)
1. a kind of GOA overhauls circuit, which is characterized in that including detecting signal unit (1), multistage GOA unit (2), a plurality of detection
Cabling (3) and multiple control units (4)；
A plurality of detection cabling (3) the parallel interval arrangement, each detect the corresponding electric connection level-one in one end of cabling (3)
GOA unit (2), the other end are correspondingly connected with a control unit (4), each control unit (4) with the signal detection
Unit (1) is electrically connected；
The GOA unit (2) is for exporting scanning signal (Scan)；
Described control unit (4) be used for the corresponding GOA unit (2) that is connected of detection cabling (3) of the control unit (4) into
When row detection, the detection cabling (3) and detecting signal unit (1) is connected, the scanning signal which is exported
(Scan) input signal detection unit (1)；
The detecting signal unit (1) is used to export the scanning signal according to the waveform judgement of the scanning signal (Scan) of input
(Scan) GOA unit (2) whether there is failure.
2. GOA as described in claim 1 overhauls circuit, which is characterized in that each control unit (4) includes that a gating is thin
Film transistor (T1), an one way conducting device (D1) and detection thin film transistor (TFT) (T2)；
Gating thin film transistor (TFT) (T1) grid receives a gating signal, and it is corresponding that source electrode is electrically connected the control unit (4)
The one end of cabling (3) is detected, drain electrode is electrically connected the first end of one way conducting device (D1)；
The second end of the one way conducting device (D1) is electrically connected the source electrode of detection thin film transistor (TFT) (T2)；
The grid of detection thin film transistor (TFT) (T2) receives detection signal (Test), and drain electrode is electrically connected first node (A)；
The detecting signal unit (1) is electrically connected first node (A)；
The one way conducting device (D1) only allows electric signal from first end to second end one-way transmission.
3. GOA as claimed in claim 2 overhauls circuit, which is characterized in that the detecting signal unit (1) includes resetting film
Transistor (T3), storage capacitance (C1) and waveform judgment module (11) grid for resetting thin film transistor (TFT) (T3) are received and are resetted
Signal (Reset), source electrode are electrically connected first node (A), and drain electrode receives one and resets high voltage (VGH)；
One end of the storage capacitance (C1) is electrically connected first node (A), and the other end receives constant voltage signal (DC)；
The waveform judgment module (11) is electrically connected first node (A).
4. GOA as claimed in claim 3 overhauls circuit, which is characterized in that the gating signal includes the first gating signal
(Test1), the second gating signal (Test2) and third gating signal (Test3)；
If N is positive integer, in continuously arranged 3N-2,3N-1 and the 3N control unit (4), the 3N control
Gating thin film transistor (TFT) (T1) grid in unit (4) receives the first gating signal (Test1), the 3N-1 control unit (4)
In gating thin film transistor (TFT) (T1) grid receive the second gating signal (Test2), the gating in the 3N-2 control unit (4)
Thin film transistor (TFT) (T1) grid receives third gating signal (Test3).
5. GOA as claimed in claim 4 overhauls circuit, which is characterized in that described more in a frame image time when detection
Grade GOA unit (2) exports scanning signal (Scan) step by step, first gating signal (Test1), the second gating signal
(Test2) and the gating thin film transistor (TFT) (T1) in all control units (4) of third gating signal (Test3) control is both turned on,
The detection thin film transistor (TFT) (T2) that detection signal (Test) controls in all control units (4) is both turned on, the reset letter
It is defeated in the scanning signal (Scan) of every adjacent two-stage GOA unit (2) that number (Reset) controls reset thin film transistor (TFT) (T3)
Conducting in blank time out, the waveform judgment module (11) receive the scanning signal of every level-one GOA unit (2) output
(Scan), and according to the waveform of each scanning signal (Scan) judge the GOA unit (2) for exporting the scanning signal (Scan)
With the presence or absence of failure.
6. GOA as claimed in claim 4 overhauls circuit, which is characterized in that when detection, the frame in continuous three frames picture is drawn
In the time of face, the multistage GOA unit (2) exports scanning signal (Scan) step by step, the first gating signal (Test1) control
Gating thin film transistor (TFT) (T1) conducting in the 3N-2 control unit (4), the detection signal (Test) control all controls
Detection thin film transistor (TFT) (T2) in unit (4) is both turned on, and the reset signal (Reset) controls the reset thin film transistor (TFT)
(T3) conducting in the blank time that the scanning signal (Scan) of every adjacent two-stage GOA unit (2) exports, the waveform judgement
Module (11) receives the scanning signal (Scan) of the 3N-2 GOA unit (2) output, and according to each scanning signal (Scan)
Waveform judges the GOA unit (2) for exporting the scanning signal (Scan) with the presence or absence of failure；
In another frame image time in continuous three frames picture, the multistage GOA unit (2) exports scanning signal step by step
(Scan), the gating thin film transistor (TFT) (T1) that second gating signal (Test2) controls in the 3N-1 control unit (4) is led
Logical, the detection thin film transistor (TFT) (T2) that detection signal (Test) controls in all control units (4) is both turned on, the reset
Signal (Reset) control reset thin film transistor (TFT) (T3) is in the scanning signal (Scan) of every adjacent two-stage GOA unit (2)
Conducting in the blank time of output, the waveform judgment module (11) receive the scanning signal of the 3N-1 GOA unit (2) output
(Scan), and according to the waveform of each scanning signal (Scan) judge the GOA unit (2) for exporting the scanning signal (Scan)
With the presence or absence of failure；
In another frame image time in continuous three frames picture, the multistage GOA unit (2) exports scanning signal step by step
(Scan), the gating thin film transistor (TFT) (T1) that the third gating signal (Test3) controls in the 3N control unit (4) is led
Logical, the detection thin film transistor (TFT) (T2) that detection signal (Test) controls in all control units (4) is both turned on, the reset
Signal (Reset) control reset thin film transistor (TFT) (T3) is in the scanning signal (Scan) of every adjacent two-stage GOA unit (2)
Conducting in the blank time of output, the waveform judgment module (11) receive the scanning signal of the 3N GOA unit (2) output
(Scan), and according to the waveform of each scanning signal (Scan) judge the GOA unit (2) for exporting the scanning signal (Scan)
With the presence or absence of failure.
7. GOA as claimed in claim 2 overhauls circuit, which is characterized in that the one way conducting device (D1) is a p-type film
Transistor, the grid and source series of the P-type TFT constitute the first end of the one way conducting device (D1), drain electrode
Constitute the second end of the one way conducting device (D1).
8. GOA as claimed in claim 2 overhauls circuit, which is characterized in that the one way conducting device (D1) is a N-type film
Transistor, the grid and source series of the N-type TFT constitute the second end of the one way conducting device (D1), drain electrode
Constitute the first end of the one way conducting device (D1).
9. GOA as described in claim 1 overhauls circuit, which is characterized in that further include at least one and the detection cabling (3)
Insulate the repair line (5) intersected.
10. GOA as claimed in claim 9 overhauls circuit, which is characterized in that there are the GOA units of failure (2) to repair
When, block the GOA unit (2) of failure to export, and in the detection cabling (3) and a repair line being electrically connected with the GOA unit (2)
(5) crossover location carries out laser welding, so that the detection cabling (3) and the repair line (5) are electrically connected, and in the reparation
Scanning signal (Scan) corresponding with GOA unit (2) of the failure is loaded on line (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811551308.XA CN109410809A (en) | 2018-12-18 | 2018-12-18 | GOA overhauls circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811551308.XA CN109410809A (en) | 2018-12-18 | 2018-12-18 | GOA overhauls circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109410809A true CN109410809A (en) | 2019-03-01 |
Family
ID=65459699
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811551308.XA Pending CN109410809A (en) | 2018-12-18 | 2018-12-18 | GOA overhauls circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109410809A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105261322A (en) * | 2015-11-13 | 2016-01-20 | 湖南普照爱伯乐平板显示器件有限公司 | Flat-panel display and drive backboard thereof |
| CN107068084A (en) * | 2017-03-20 | 2017-08-18 | 深圳市华星光电技术有限公司 | GOA drive circuits, array base palte, the method for detecting abnormality of display device and panel |
| CN108269515A (en) * | 2018-02-11 | 2018-07-10 | 武汉华星光电半导体显示技术有限公司 | It is a kind of to be used to detect the circuit of GOA circuit malfunctions and method, display panel |
| CN108389536A (en) * | 2018-03-03 | 2018-08-10 | 武汉华星光电半导体显示技术有限公司 | GOA detection circuits and detection method |
| CN108962162A (en) * | 2018-07-10 | 2018-12-07 | 武汉华星光电半导体显示技术有限公司 | A kind of GOA circuit and embedded type touch control display panel |
| CN108962160A (en) * | 2018-07-02 | 2018-12-07 | 武汉华星光电半导体显示技术有限公司 | Has the display panel of GOA circuit malfunction detection function |
| CN109147630A (en) * | 2018-09-25 | 2019-01-04 | 武汉华星光电半导体显示技术有限公司 | A kind of GOA detection circuit and its test method |
-
2018
- 2018-12-18 CN CN201811551308.XA patent/CN109410809A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105261322A (en) * | 2015-11-13 | 2016-01-20 | 湖南普照爱伯乐平板显示器件有限公司 | Flat-panel display and drive backboard thereof |
| CN107068084A (en) * | 2017-03-20 | 2017-08-18 | 深圳市华星光电技术有限公司 | GOA drive circuits, array base palte, the method for detecting abnormality of display device and panel |
| CN108269515A (en) * | 2018-02-11 | 2018-07-10 | 武汉华星光电半导体显示技术有限公司 | It is a kind of to be used to detect the circuit of GOA circuit malfunctions and method, display panel |
| CN108389536A (en) * | 2018-03-03 | 2018-08-10 | 武汉华星光电半导体显示技术有限公司 | GOA detection circuits and detection method |
| CN108962160A (en) * | 2018-07-02 | 2018-12-07 | 武汉华星光电半导体显示技术有限公司 | Has the display panel of GOA circuit malfunction detection function |
| CN108962162A (en) * | 2018-07-10 | 2018-12-07 | 武汉华星光电半导体显示技术有限公司 | A kind of GOA circuit and embedded type touch control display panel |
| CN109147630A (en) * | 2018-09-25 | 2019-01-04 | 武汉华星光电半导体显示技术有限公司 | A kind of GOA detection circuit and its test method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100253058B1 (en) | Liquid crystal display device and its driving method | |
| CN105093025B (en) | The detection circuit and detection method of In Cell touch-control display panel | |
| CN105096789B (en) | GOA tests the common circuit with removing power-off ghost shadow | |
| CN105093593B (en) | Display base plate and its test method, display device | |
| US6246385B1 (en) | Liquid crystal display device and its driving method | |
| CN102116950B (en) | display panel with touch control function and detection method thereof | |
| CN100541282C (en) | Array base palte and have the main substrate and the liquid crystal indicator of described array base palte | |
| CN103235428B (en) | The dim spot restorative procedure of liquid crystal panel and liquid crystal panel | |
| CN101719352B (en) | Device and method for detection after forming liquid crystal box | |
| JPH11167129A (en) | Liquid crystal display device having electrostatic protective circuit and display inspection method utilize this circuit | |
| CN101004490A (en) | Base plate of driving part array, liquid crystal display faceplate, and detection method | |
| CN109891313A (en) | Liquid crystal display device and failure inspection method | |
| CN104280908A (en) | Detection circuit, liquid crystal display panel and manufacturing method of liquid crystal display panel | |
| CN103197819A (en) | Touch screen and driving method thereof and display device | |
| CN108962160B (en) | Has the display panel of GOA circuit malfunction detection function | |
| US10839765B2 (en) | GOA detection circuit and testing method therefor | |
| KR20170122891A (en) | Display apparatus and driving method thereof | |
| CN110299110A (en) | The driving method and gate driving circuit of gate driving circuit, display device | |
| CN107966838B (en) | Liquid crystal display panel and display device | |
| CN100573247C (en) | The driving circuit of vertical alignment liquid crystal display device and driving method | |
| CN110459184A (en) | Driving circuit and driving method of display panel and display device | |
| CN110379387A (en) | Driving circuit, display module and display equipment | |
| CN106601163A (en) | Liquid crystal cell bright spot detection method | |
| CN109061952A (en) | Liquid crystal display panel alignment system and liquid crystal display panel alignment method | |
| CN109410809A (en) | GOA overhauls circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190301 |