CN109406861A - The measuring device of critical current density and critical-temperature when a kind of superconducting thin film compresses - Google Patents
The measuring device of critical current density and critical-temperature when a kind of superconducting thin film compresses Download PDFInfo
- Publication number
- CN109406861A CN109406861A CN201811512830.7A CN201811512830A CN109406861A CN 109406861 A CN109406861 A CN 109406861A CN 201811512830 A CN201811512830 A CN 201811512830A CN 109406861 A CN109406861 A CN 109406861A
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- China
- Prior art keywords
- thin film
- superconducting thin
- fixture
- beryllium copper
- critical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 63
- 239000011521 glass Substances 0.000 claims abstract description 36
- DMFGNRRURHSENX-UHFFFAOYSA-N beryllium copper Chemical compound [Be].[Cu] DMFGNRRURHSENX-UHFFFAOYSA-N 0.000 claims abstract description 33
- 238000012360 testing method Methods 0.000 claims abstract description 21
- 239000011888 foil Substances 0.000 claims abstract description 8
- 238000005057 refrigeration Methods 0.000 claims abstract description 7
- 229910000679 solder Inorganic materials 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims description 3
- 239000003292 glue Substances 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims description 2
- 238000005452 bending Methods 0.000 abstract description 5
- 230000006835 compression Effects 0.000 abstract description 5
- 238000007906 compression Methods 0.000 abstract description 5
- 239000010408 film Substances 0.000 description 7
- 238000005259 measurement Methods 0.000 description 5
- 101100495270 Caenorhabditis elegans cdc-26 gene Proteins 0.000 description 4
- 230000007812 deficiency Effects 0.000 description 3
- 229910052790 beryllium Inorganic materials 0.000 description 2
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000003365 glass fiber Substances 0.000 description 2
- 238000011068 loading method Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011094 fiberboard Substances 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
- 230000002277 temperature effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/08—Measuring current density
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Containers, Films, And Cooling For Superconductive Devices (AREA)
Abstract
The invention discloses the measuring devices of critical current density and critical-temperature when a kind of compression of superconducting thin film, including vacuum tank, pressure head of testing machine, glass mat and superconducting thin film sample the pressure fixture being set in vacuum tank, pressure head of testing machine is inserted at the top of vacuum tank, glass mat up and down is arranged in the lower section of pressure head of testing machine, superconducting thin film sample pressure fixture is clamped between two glass mats, superconducting thin film sample pressure fixture includes upper fixture, beryllium copper beam and lower fixture, beryllium copper beam is placed between upper fixture and lower fixture, the groove for placing superconducting thin film sample is provided among the top surface of beryllium copper beam, sample upper surface fixed thermometer and foil gauge；Beryllium copper beam is equipped with adding thermal resistance, and vacuum tank is equipped with refrigeration machine second level cold head, vacuum sock and vacuum valve.When the present invention is by beryllium copper beam on-load pressure, beryllium copper beam occurs pure bending and compresses superconducting thin film, to realize the test of its performance in the case where not destroying superconducting thin film structure.
Description
Technical field
Critical current when being compressed the invention belongs to superconductor technical field of performance test more particularly to a kind of superconducting thin film
The measuring device of density and critical-temperature.
Background technique
With the development of science and technology it is found that superconducting thin film critical current density with higher and superconduction critical temperature,
And there is application well in the electronic devices such as filter.Superconducting thin film inevitably will receive face internal force at low temperature
Effect, influence its critical current density JcAnd critical-temperature Tc, therefore superconducting thin film is in load, it is difficult to measure its critical electricity
Current density and critical-temperature.Currently, common loading method is divided into two kinds: clipping load and the load of non-clamping formula.It is clipping
Load is merely able to clamp the both ends of film, since substrate and film are fragile material, the chucking power of unbearable collet.It is non-clamping
When formula loads, the power that not can guarantee pressure head application is parallel with film surface, and film is broken vulnerable to eccentric force.Based on substrate and
Superconducting thin film thickness itself is less than 1mm, and conventional loading method can not be under the premise of not destroying film itself to it at present
Compression-loaded is carried out, it is even more impossible to the critical current density and critical-temperature of superconducting thin film are measured in load.
Summary of the invention
In view of the deficiency of the prior art, critical current density when being compressed the present invention provides a kind of superconducting thin film
With the measuring device of critical-temperature, using the elastic property that beryllium copper beam is excellent, when by beryllium copper beam on-load pressure, beryllium copper beam is sent out
Superconducting thin film is compressed in raw pure bending, measured in the case where not destroying superconducting thin film structure superconducting thin film critical current density and
Critical-temperature.
The invention is realized in this way the measurement of critical current density and critical-temperature dress when a kind of superconducting thin film compresses
It sets, including vacuum tank, pressure head of testing machine, glass mat and superconducting thin film sample pressure fixture, the top of the vacuum tank are inserted
Enter pressure head of testing machine, bellows is arranged on the position that pressure head of testing machine is contacted with vacuum tank, the glass mat includes upper glass
Glass fiberboard and lower glass mat, the upper glass mat are set to the lower section of pressure head of testing machine, the lower glass fibre
Plate is fixed on vacuum tank bottom, and the glass mat and superconducting thin film sample pressure fixture are set in vacuum tank, it is described on
Superconducting thin film sample pressure fixture, the superconducting thin film sample pressure fixture are placed between glass mat and lower glass mat
Including upper fixture, beryllium copper beam and lower fixture, the upper fixture and lower fixture clamp the top and bottom of beryllium copper beam, the beryllium respectively
Be provided among the top surface of Tongliang County place superconducting thin film sample groove, the upper surface fixed thermometer of the superconducting thin film sample and
Foil gauge；The beryllium copper beam is connect by copper braid with the refrigeration machine second level cold head being set on vacuum tank, and beryllium copper beam is equipped with
Adding thermal resistance, the vacuum tank are equipped with vacuum sock and vacuum valve；The superconducting thin film sample, thermometer, foil gauge and add
Thermal resistance is connected on vacuum sock by conducting wire, and the vacuum sock is connected with external collecting test instrument.
Preferably, two upper grips are arranged in the bottom surface of the upper fixture, and two lower collets are arranged in the top surface of the lower fixture,
The distance between described two lower collets are greater than the distance between described two upper grips, the distance between described two upper grips
Greater than the width of the groove.
Preferably, the cross section of the upper grip is in up-side down triangle, and the cross section of the lower collet is in equilateral triangle.
Preferably, the superconducting thin film sample is fixed in groove by glue, and the solder joint connects again after connecting with conducting wire
It is connected on vacuum sock.
Compared with the prior art the shortcomings that and deficiency, the invention has the following advantages: the present invention is excellent using beryllium copper beam
Different elastic property, the groove of setting carrying superconducting thin film sample on beryllium copper beam, by beryllium copper beam on-load pressure, beryllium copper beam
Pure bending occurs, so that the superconducting thin film sample of beryllium copper Liang Shangaocaochu is compressed, thus when measuring superconducting thin film compression
Critical current and critical-temperature the width and beryllium copper beam for changing groove can be passed through for various sizes of superconducting thin film sample
Thickness realize the measurements of different size superconducting film samples.The configuration of the present invention is simple, it is economical and practical, it is not destroyed in measurement process
The structure of superconducting thin film overcomes the deficiency of existing clipping load and non-clamping formula load measurement superconducting thin film.
Detailed description of the invention
The measuring device of critical current density and critical-temperature when Fig. 1 is superconducting thin film provided in an embodiment of the present invention compression
Structural schematic diagram.
Fig. 2 is the structural schematic diagram of superconducting thin film sample pressure fixture provided in an embodiment of the present invention.
In figure: 1- bellows；2- vacuum tank；3- pressure head of testing machine；The upper glass mat of 4-；5- superconducting thin film sample pressure
Fixture；5-1- upper fixture；5-2- upper grip；5-3- thermometer；5-4- foil gauge；5-5- superconducting thin film sample；5-6- groove；5-
7- solder joint；5-8- beryllium copper beam；Fixture under 5-9-；Collet under 5-10-；6- refrigeration machine second level cold head；7- copper braid；8- heating electricity
Resistance；9- vacuum sock；10- vacuum valve；Glass mat under 11-.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
Referring to Fig.1, the measuring device of critical current density and critical-temperature when a kind of superconducting thin film compresses, including vacuum tank
2, pressure head of testing machine 3 is inserted at pressure head of testing machine 3, glass mat and superconducting thin film sample pressure fixture 5, the top of vacuum tank 2,
Bellows 1, glass mat and superconducting thin film sample pressure fixture 5 are arranged on the position that pressure head of testing machine 3 is contacted with vacuum tank 2
It is set in vacuum tank 2, G10 glass mat can be used in glass mat, and glass mat includes upper glass mat 4 under
Glass mat 11, upper glass mat 4 are set to the lower section of pressure head of testing machine 3, and lower glass mat 11 is fixed on vacuum tank 2
Bottom, between upper glass mat 4 and lower glass mat 11 place superconducting thin film sample press fixture 5.Referring to Fig. 2, surpass
Leading film sample pressure fixture 5 includes upper fixture 5-1, beryllium copper beam 5-8 and lower fixture 5-9, upper fixture 5-1 and lower fixture 5-8 points
Not Jia Chi beryllium copper beam 5-7 top and bottom, the groove for placing superconducting thin film sample 5-5 is provided among the top surface of beryllium copper beam 5-8
5-6, superconducting thin film sample 5-5 are fixed in groove 5-6 by solder joint 5-7, the upper surface fixed temperature of superconducting thin film sample 5-5
Count 5-3 and foil gauge 5-4；Beryllium copper beam 5-8 is connect by copper braid 7 with the refrigeration machine second level cold head 6 being set on vacuum tank 2,
Realize the cooling of superconducting thin film sample on beryllium copper beam 5-8, refrigeration machine second level cold head 6 uses GM refrigeration machine second level cold head.Beryllium copper beam
5-8 is equipped with adding thermal resistance 8, and vacuum tank 2 is equipped with vacuum sock 9 and vacuum valve 10.Solder joint 5-7, thermometer 5-3, foil gauge
5-4 and adding thermal resistance 8 are connected on vacuum sock 9 by conducting wire, and vacuum sock 9 is connected with external collecting test instrument, thus
Realize electric current load, voltage, strain measurement and the temperature control of superconducting thin film.
In order to further ensure the load bending degree of beryllium copper beam 5-8, two upper folders can be set in the bottom surface of upper fixture 5-1
Two lower collet 5-10 are arranged in the top surface of head 5-2, lower fixture 5-9, and the distance between two lower collet 5-10 are greater than two upper folders
The distance between head 5-2, the distance between two upper grip 5-2 are greater than the width of groove 5-6.In order to make upper grip 5-2 under
Collet 5-10 is applied to the upper force localization of beryllium copper beam 5-8, is designed to the shape of upper grip 5-2 and lower collet 5-10,
Make the cross section of upper grip 5-2 in up-side down triangle, the cross section of lower collet 5-10 is in equilateral triangle.
When specifically used, pressure head of testing machine 3 is to upper 4 on-load pressure of glass mat, upper glass mat 4 and lower glass fibers
It ties up plate 11 and clamps superconducting thin film sample pressure fixture 5, upper fixture 5-1 is pushed the top surface of beryllium copper beam 5-8, beryllium by downward pressure
The bottom surface of Tongliang County 5-8 generates pure bending after the reaction force by lower fixture 5-9, thus to the superconducting thin film sample in groove 5-6
Product 5-5 is compressed, and this compress mode does not destroy the structure of superconducting thin film sample 5-5, measures superconducting thin film sample compression
When critical current and critical-temperature it is more acurrate.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (4)
- The measuring device of critical current density and critical-temperature when 1. a kind of superconducting thin film compresses, which is characterized in that including vacuum Testing machine pressure is inserted at case, pressure head of testing machine, glass mat and superconducting thin film sample pressure fixture, the top of the vacuum tank Head, is arranged bellows on the position that pressure head of testing machine is contacted with vacuum tank, the glass mat include upper glass mat and Lower glass mat, the upper glass mat are set to the lower section of pressure head of testing machine, and the lower glass mat is fixed on very Empty van bottom, the glass mat and superconducting thin film sample pressure fixture are set in vacuum tank, the upper glass mat Superconducting thin film sample pressure fixture is placed between lower glass mat, the superconducting thin film sample pressure fixture includes upper folder Tool, beryllium copper beam and lower fixture, the upper fixture and lower fixture clamp the top and bottom of beryllium copper beam, the top of the beryllium copper beam respectively The groove for placing superconducting thin film sample, the upper surface fixed thermometer and foil gauge of the superconducting thin film sample are provided among face； The beryllium copper beam is connect by copper braid with the refrigeration machine second level cold head being set on vacuum tank, and beryllium copper beam is equipped with heating electricity Resistance, the vacuum tank are equipped with vacuum sock and vacuum valve；The superconducting thin film sample, thermometer, foil gauge and adding thermal resistance It is connected on vacuum sock by conducting wire, the vacuum sock is connected with external collecting test instrument.
- The measuring device of critical current density and critical-temperature, feature when 2. superconducting thin film as described in claim 1 compresses It is, two upper grips are arranged in the bottom surface of the upper fixture, and two lower collets are arranged in the top surface of the lower fixture, under described two The distance between collet is greater than the distance between described two upper grips, and the distance between described two upper grips are greater than described recessed The width of slot.
- The measuring device of critical current density and critical-temperature, feature when 3. superconducting thin film as claimed in claim 2 compresses It is, the cross section of the upper grip is in up-side down triangle, and the cross section of the lower collet is in equilateral triangle.
- The measuring device of critical current density and critical-temperature, feature when 4. superconducting thin film as described in claim 1 compresses It is, the superconducting thin film sample is fixed in groove by glue, and the solder joint is then connected to vacuum and inserts after connecting with conducting wire On seat.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811512830.7A CN109406861A (en) | 2018-12-11 | 2018-12-11 | The measuring device of critical current density and critical-temperature when a kind of superconducting thin film compresses |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811512830.7A CN109406861A (en) | 2018-12-11 | 2018-12-11 | The measuring device of critical current density and critical-temperature when a kind of superconducting thin film compresses |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109406861A true CN109406861A (en) | 2019-03-01 |
Family
ID=65458529
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811512830.7A Pending CN109406861A (en) | 2018-12-11 | 2018-12-11 | The measuring device of critical current density and critical-temperature when a kind of superconducting thin film compresses |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109406861A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06249902A (en) * | 1993-02-23 | 1994-09-09 | Sumitomo Heavy Ind Ltd | Superconducting-critical-current measuring apparatus |
| KR100805284B1 (en) * | 2006-08-31 | 2008-02-20 | 한국전기연구원 | Holder for measurement of bending strain effect on critical current in hts superconducting tapes and accelerated test apparatus adopting the holder |
| CN102305804A (en) * | 2011-05-19 | 2012-01-04 | 北京鼎臣超导科技有限公司 | Device and method for measuring superconducting transition temperature of high temperature superconducting material |
| CN102735902A (en) * | 2012-05-31 | 2012-10-17 | 华中科技大学 | High-temperature superconducting wire tensile force testing device and testing method thereof |
| CN104007402A (en) * | 2014-06-06 | 2014-08-27 | 泉州师范学院 | Nanovolt-order superconductor resistance critical temperature measurement system |
| CN104535824A (en) * | 2015-01-06 | 2015-04-22 | 吉林大学 | Testing system and method for critical current density of high temperature superconductor film material |
| CN105865919A (en) * | 2016-05-09 | 2016-08-17 | 兰州大学 | Critical current test device for high-temperature superconducting strip under action of lateral compression |
| CN209296803U (en) * | 2018-12-11 | 2019-08-23 | 兰州大学 | The measuring device of critical current density and critical-temperature when a kind of superconducting thin film compresses |
-
2018
- 2018-12-11 CN CN201811512830.7A patent/CN109406861A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06249902A (en) * | 1993-02-23 | 1994-09-09 | Sumitomo Heavy Ind Ltd | Superconducting-critical-current measuring apparatus |
| KR100805284B1 (en) * | 2006-08-31 | 2008-02-20 | 한국전기연구원 | Holder for measurement of bending strain effect on critical current in hts superconducting tapes and accelerated test apparatus adopting the holder |
| CN102305804A (en) * | 2011-05-19 | 2012-01-04 | 北京鼎臣超导科技有限公司 | Device and method for measuring superconducting transition temperature of high temperature superconducting material |
| CN102735902A (en) * | 2012-05-31 | 2012-10-17 | 华中科技大学 | High-temperature superconducting wire tensile force testing device and testing method thereof |
| CN104007402A (en) * | 2014-06-06 | 2014-08-27 | 泉州师范学院 | Nanovolt-order superconductor resistance critical temperature measurement system |
| CN104535824A (en) * | 2015-01-06 | 2015-04-22 | 吉林大学 | Testing system and method for critical current density of high temperature superconductor film material |
| CN105865919A (en) * | 2016-05-09 | 2016-08-17 | 兰州大学 | Critical current test device for high-temperature superconducting strip under action of lateral compression |
| CN209296803U (en) * | 2018-12-11 | 2019-08-23 | 兰州大学 | The measuring device of critical current density and critical-temperature when a kind of superconducting thin film compresses |
Non-Patent Citations (2)
| Title |
|---|
| D. C. VAN DER LAAN 等: "Effect of a Compressive Uniaxial Strain on the Critical Current Density of Grain Boundaries in Superconducting YBa2Cu3O7-δ Films", PHYSICAL REVIEW LETTERS, pages 027005 - 1 * |
| D. C. VAN DER LAAN 等: "Large intrinsic effect of axial strain on the critical current of hightemperature superconductors for electric power applications", APPLIED PHYSICS LETTERS, pages 052506 - 1 * |
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