CN109345988A - Test circuit, display panel test device and display device - Google Patents
Test circuit, display panel test device and display device Download PDFInfo
- Publication number
- CN109345988A CN109345988A CN201811395116.4A CN201811395116A CN109345988A CN 109345988 A CN109345988 A CN 109345988A CN 201811395116 A CN201811395116 A CN 201811395116A CN 109345988 A CN109345988 A CN 109345988A
- Authority
- CN
- China
- Prior art keywords
- display panel
- switch circuit
- signal
- liner
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 100
- 239000010409 thin film Substances 0.000 claims description 11
- 238000009434 installation Methods 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 8
- 229910052751 metal Inorganic materials 0.000 claims description 8
- 230000005611 electricity Effects 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 description 16
- 238000010586 diagram Methods 0.000 description 6
- 238000003698 laser cutting Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Abstract
The application discloses a test circuit, a display panel test device and a display device, wherein the test circuit comprises at least one scanning line pad, at least one data line pad, N first switch circuits, N second switch circuits, test equipment and a signal generator, the N first switch circuits are arranged on the N data lines in a one-to-one mode, and the N second switch circuits are arranged on the N scanning lines in a one-to-one mode; the test equipment is arranged to output a first control signal through the first signal input end so as to control the conduction of the N first switch circuits and the N second switch circuits and output a test signal to the scanning line pad and the data line pad; the second signal input end receives a second control signal output by a signal generator arranged on the display panel and controls the N first switch circuits and the N second switch circuits to be switched off.
Description
Technical field
This application involves technical field of display panel, in particular to a kind of test circuit, testing device of display panel and aobvious
Showing device.
Background technique
Panel test refers to single panel is cut out on large substrates after, by be arranged on panel it is some walk
Line carries out simple picture test, with some bad problems of detection panel, facilitates the work such as subsequent repairing.Generally for
Recall rate is improved, scan line can be divided into the design that odd even is connected with data line, connect respectively by short-circuited conducting sleeve with test equipment, survey
It is contact pad designed by probe to try equipment, by test signal input panel, the test to panel is completed, in addition to dividing several rows of odd even
Outside, can also perhaps data line be divided into 123/456/789 by scan line ... i.e. with 3 behavior units or 1234/5678 ...
That is 4 behavior units.
After panel test, the connecting line between liner and panel needs to carry out one procedure-laser cutting, by institute
There are data line and scan line and short-circuited conducting sleeve to disconnect, in this way, just will increase one of production process in faceplate manufacturing process, increases
Production cost.
Apply for content
The main purpose of the application is to provide a kind of test circuit, it is intended to solve to increase in faceplate manufacturing process and swash together
The problem of production process of light cutting, increase production cost.
To achieve the above object, the application proposes that a kind of test circuit, the display panel include N scan line and M
Data line, the test circuit include:
At least one scan line liner, is set as being correspondingly connected with N scan line of the display panel by short-circuited conducting sleeve;
At least one data line liner, is set as being correspondingly connected with the M data line of the display panel by short-circuited conducting sleeve;
M first switch circuit, the M first switch circuit are correspondingly arranged on data line described in M item;
N number of second switch circuit, N number of second switch circuit are correspondingly arranged in scan line described in N item;
Test equipment is set as output first control signal control M first switch circuits and N number of described second opens
Powered-down road conducting, and the test signal of the display panel is tested extremely through scan line liner and data line liner output
The display panel;
First control liner, the first control liner includes the first signal input part and second signal input terminal and letter
Number output end;
First signal input part is set as receiving the first control signal of the test equipment output, and described in warp
First control signal is exported through the signal output end to first switch circuit and the second switch circuit;
The second signal input terminal, is set as after the display panel is completed, and receives and is arranged in the display
The second control signal of signal generator output on panel, and export through the signal output end to the first switch circuit
With the second switch circuit.
Optionally, the first switch circuit and the second switch circuit are thin film transistor (TFT).
Optionally, the first control signal is the first level, and the second control signal is second electrical level.
Optionally, the voltage value of the first control signal is more than or equal to 10V and is less than or equal to 40V, described
The voltage value of second control signal is more than or equal to -20V and is less than or equal to -3V.
Optionally, the first switch circuit and the second switch circuit are NPN triode.
The application also proposes a kind of testing device of display panel, including tests circuit as described above.
The application also proposes a kind of display device, including display panel and testing device of display panel as described above.
Optionally, the display panel is additionally provided with the second control liner, and the second control liner is connected on described the
Between one control liner and the signal generator.
Optionally, the second control liner passes through metal wire and the first control liner connection.
Optionally, multiple installation liners, the M first switch circuit and the N are additionally provided on the display panel
A second switch circuit is connect by multiple installation liners with scan line described in data line described in M item and N item respectively.
Technical scheme is padded by using at least one scan line, at least one data line liner, M a first are opened
Powered-down road, N number of second switch circuit, the first control liner and test equipment constitute test circuit, the M data of display panel
Line is padded through M first switch circuit connection to data line, and N scan line of display panel is through N number of second switch circuit connection
It is padded to scan line, the controlled end of M first switch circuit and the controlled end of N number of second switch circuit pass through short-circuited conducting sleeve and first
Control liner connection, the first control liner include the first signal input part, second signal input terminal and signal output end, the first letter
Number input terminal is connect with test equipment, and second control signal keeps vacant state, test circuit work before display panel is tested
When, the first signal input part receives the first control signal of test equipment, and exports through signal output end to first switch circuit
With second switch circuit to control first switch circuit and the conducting of second switch circuit, test equipment is through the first switch circuit
Test signal to display panel is exported respectively with second switch circuit to be tested, after display panel is completed, signal hair
Raw device installation on a display panel, and is connect by connecting line with the second signal input terminal of the first control liner, and signal occurs
Device exports second control signal to first switch circuit and second switch circuit, first switch circuit and second switch circuit and closes
It is disconnected, it is disconnected with the data line, scan line and the short-circuited conducting sleeve that control the display panel, increases by one in faceplate manufacturing process to solve
The problem of production process of road laser cutting, increase production cost.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of application for those of ordinary skill in the art without creative efforts, can be with
The structure shown according to these attached drawings obtains other attached drawings.
Fig. 1 is the functional block diagram that the application tests one embodiment of circuit;
Fig. 2 is the functional block diagram of one embodiment of the application display device;
Fig. 3 is the electrical block diagram of one embodiment of the application display device.
The embodiments will be further described with reference to the accompanying drawings for realization, functional characteristics and the advantage of the application purpose.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present application, technical solutions in the embodiments of the present application carries out clear, complete
Site preparation description, it is clear that described embodiment is only a part of the embodiment of the application, instead of all the embodiments.Base
Embodiment in the application, it is obtained by those of ordinary skill in the art without making creative efforts it is all its
His embodiment, shall fall in the protection scope of this application.
It is to be appreciated that the description for being related to " first ", " second " etc. in this application is used for description purposes only, and cannot understand
For its relative importance of indication or suggestion or implicitly indicate the quantity of indicated technical characteristic.Define as a result, " first ",
The feature of " second " can explicitly or implicitly include at least one of the features.In addition, the "and/or" occurred in full text contains
Justice are as follows: including three schemes arranged side by side, by taking " A/B " as an example, including the scheme that A scheme or B scheme or A and B meet simultaneously, separately
Outside, the technical solution between each embodiment can be combined with each other, can be real with those of ordinary skill in the art but must be
Based on existing, the combination of this technical solution will be understood that not when conflicting or cannot achieve when occurs in the combination of technical solution
In the presence of, also not this application claims protection scope within.
The application proposes a kind of test circuit 100.
As shown in FIG. 1, FIG. 1 is the functional block diagram that the application tests 100 1 embodiment of circuit, the application proposes one
Kind test circuit 100, the display panel 200 includes N scan line and N data line, and the test circuit 100 includes:
At least one scan line liner 20, is set as being correspondingly connected with N scan line of the display panel by short-circuited conducting sleeve;
At least one data line liner 10, is set as being correspondingly connected with the M data line of the display panel by short-circuited conducting sleeve;
M first switch circuit 30, on the one-to-one setting data line described in M item of M first switch circuit 30;
N number of second switch circuit 40, in N number of one-to-one setting scan line described in N item of second switch circuit 40;
Test equipment 60 is set as output first control signal control M first switch circuits 30 and N number of described the
The conducting of two switching circuits 40, and the display panel is tested through scan line liner 20 and 10 output of data line liner
200 test signal is to the display panel 200;
First control liner 50, the first control liner 50 include the first signal input part and second signal input terminal with
And signal output end;
First signal input part is set as receiving the first control signal that the test equipment 60 exports, and through institute
First control signal is stated to export through the signal output end to first switch circuit 30 and the second switch circuit 40;
The second signal input terminal, is set as after the display panel is completed, and receives and is arranged in the display
The second control signal of signal generator output on panel, and export through the signal output end to the first switch circuit
30 and the second switch circuit 40.
In the present embodiment, the display panel 200 includes but is not limited to liquid crystal display panel, organic light-emitting diode display
Panel, field emission display panel, Plasmia indicating panel, curved face type panel, the liquid crystal display panel include tft liquid crystal
Display panel, TN panel, VA class panel, IPS panel etc..
In order to realize to the unified charging detection of all pixels on display panel 200, each data line of display panel 200
It is connect by short-circuited conducting sleeve B1 with data line liner 10, similarly, scan line equally passes through short-circuited conducting sleeve B1 and connect with scan line liner 20,
Then test equipment 60 applies test signal to scan line liner 20 and data line liner 10 by probe and realizes and charge, display
The scan line of panel 200 is segmented into the design that odd even is connected with data line, i.e., by the data line of display panel 200 or scanning
Perhaps odd column uses same short-circuited conducting sleeve B1 connection even number line or even column to use same short-circuited conducting sleeve B1 connection to line odd-numbered line,
Scan line liner 20 and data line liner 10 can be correspondingly arranged, when the data line and scan line of display panel 200 are adopted
When being connected with odd even, scan line liner 20 is scan line odd number liner and scan line even number liner, and data line liner 10 is data
Line odd number liner and data line even number liner, the data line and data line of display panel 200, can be with other than dividing several rows of odd even
Perhaps data line is divided into 123/456/789 by scan line ... i.e. with 3 behavior units or 1234/5678 ... i.e. 4 behavior lists
Position, scan line liner 20 and data line liner 10 are correspondingly arranged according to the design of data line and scan line, can be respectively set three
It is a, four or more, be not specifically limited herein.
It should be noted that short-circuited conducting sleeve B1 is used to shield external signal interference in 200 test process of display panel, avoid
Influence of the external signal to internal circuit connection.
In the present embodiment, the switch member device with on-off function is can be used in first switch circuit 30 and second switch circuit 40
Part or circuit, first switch circuit 30 and second switch circuit 40, which respectively correspond, to be arranged on the data line of display panel 200
In scan line, the signal input part of M first switch circuit 30 is connected to data line liner 10 by short-circuited conducting sleeve B1, and N number of the
The signal input part of two switching circuits 40 is connected to scan line liner 20, the controlled end of first switch circuit 30 by short-circuited conducting sleeve B1
It is connect with the first control liner 50 with the controlled end of second switch circuit 40.
First control liner 50 includes that there are two signal input part and a signal output ends, before display panel 200 is tested,
First signal input terminal is connect by probe with the first signal input part with test equipment 60, and second signal input terminal is kept
Vacantly, no signal inputs, and when testing the test of circuit 100, test equipment 60 exports first control signal to first switch circuit
30 and second switch circuit 40, first control signal is connected for controlling first switch circuit 30 and second switch circuit 40,
After switching circuit conducting, output test signal to the display panel 200 of test equipment 60 is tested, and test equipment 60 has first
Signal end, second signal end and third signal end, the first signal end are padded for exporting simulation gray scale voltage signal to data line
10, second signal end is for exporting row scan control signal to scan line liner 20, to realize the pixel on display panel 200
The test of display panel 200 is completed in unified charging, and third signal end is for exporting first control signal to the first control liner 50
The first signal input part, and then first control signal is exported to first switch circuit 30 and second switch circuit 40.
Test equipment 60 may include for exporting the data-driven integrated circuit of simulation gray scale voltage voltage, for exporting row
The turntable driving integrated circuit of scan control signal and the signal output module for exporting first control signal, data-driven are integrated
Circuit, drive integrated circult and signal output module are integrated on same circuit board, and are connected respectively by probe and liner, are surveyed
Examination equipment 60 may also be configured to single control chip, and output test signal and first control signal, test equipment 60 can roots respectively
It is correspondingly arranged according to processing procedure and test mode, does not do specific requirement herein.
After display panel 200 is completed, signal generator bonding on a display panel, and passes through connecting line and first
The second signal input terminal connection of control liner, signal generator 210 are used for exporting second control signal, second control signal
In control first switch circuit 30 and second switch circuit 40 turn off, signal generator 210 may be configured as single control chip or
The physical circuit etc. of person's component composition, does not do specific requirement herein.
In the present embodiment, 100 course of work of circuit is tested are as follows:
Before test, display panel 200 flows into panel test process, and the M data line difference of display panel 200 is one-to-one logical
It crosses M first switch circuit 30 and is connected to data line liner 10, N scan line of display panel 200 is one-to-one by N number of respectively
Second switch circuit 40 is connected to scan line liner 20, the controlled end of first switch circuit 30 and second switch circuit 40 it is controlled
End is connected to the first control liner 50, the first signal input part and 60 signal generator of test equipment of the first control liner 50
210 connection signal generators 210;
When test, test equipment 60 exports the first signal input part of first control signal to the first control liner 50, and M is a
First switch circuit 30 and N number of second switch circuit 40 are both turned on, and test equipment 60 passes through data line liner 10 and scanning respectively
The pixel of line liner 20 output test signal to display panel 200 carries out unified charging, and then completes panel test;
After display panel 200 is completed, on a display panel by 210 bonding of signal generator, and by signal wire with
The second signal input terminal connection of first control liner 50, the second control signal that signal generator 210 exports is through second signal
Input terminal is exported to first switch circuit 30 and second switch circuit 40, and first switch circuit 30 and second switch circuit 40 close
Disconnected, the data line and scan line of display panel 200 are separated with short-circuited conducting sleeve B1 respectively, the data line and scan line of display panel 200
It can work normally, without carrying out laser cutting work, panel production efficiency be improved, to solve in faceplate manufacturing process
The problem of increasing the production process of laser cutting together, increasing production cost.
Technical scheme is by using at least one scan line liner 20, at least one data line liner 10, M the
One switching circuit 30, the control of N number of second switch circuit 40, first liner 50 and test equipment 60 constitute test circuit 100, show
Show that the M data line of panel 200 is connected to data line liner 10 through M first switch circuit 30, the N item of display panel 200 is swept
It retouches line and is connected to the controlled end and N number of second that scan line pads 20, M first switch circuit 30 through N number of second switch circuit 40
The controlled end of switching circuit 40 is connect by short-circuited conducting sleeve with the first control liner 50, and the first control liner 50 includes that the first signal is defeated
Enter end, second signal input terminal and signal output end, the first signal input part is connect with test equipment 60, and second control signal exists
Display panel 200 keeps vacant state before testing, when test circuit 100 works, the first signal input part receives test equipment 60
First control signal, and export through signal output end to first switch circuit 30 and second switch circuit 40 and opened with controlling first
Powered-down road 30 and second switch circuit 40 are connected, and test equipment 60 is divided through the first switch circuit 30 and second switch circuit 40
Signal to display panel 200 Shu Chu not tested to be tested, after display panel 200 is completed, signal generator is mounted on
On display panel 200, and it is connect by connecting line with the second signal input terminal of the first control liner 50, signal generator output
Second control signal to first switch circuit 30 and second switch circuit 40, first switch circuit 30 and second switch circuit 40 closes
It is disconnected, it is disconnected with the data line, scan line and the short-circuited conducting sleeve Bar that control the display panel 200, to solve in faceplate manufacturing process
The problem of increasing the production process of laser cutting together, increasing production cost.
In an alternative embodiment, the first switch circuit 30 and the second switch circuit 40 are thin film transistor (TFT).
It should be noted that the structure and working principle of thin film transistor (TFT) are similar with field-effect tube, it mainly include grid, source
Pole and drain electrode can be divided into N-type and p-type, it is assumed that thin film transistor (TFT) is N-type transistor, film crystal on the data line is arranged
For pipe, the drain electrode of each thin film transistor (TFT) is corresponding to be connect with data line liner 10, the source electrode and display panel of each thin film transistor (TFT)
200 connections, the grid of each thin film transistor (TFT) are connect with the first signal input part of the first control liner 50, the grid of thin film transistor (TFT)
The high level that pole is exported in reception test equipment 60, that is, first control signal conducting, test signal are input to aobvious through thin film transistor (TFT)
Show that panel 200 carries out charging measurement, after being completed, the grid of thin film transistor (TFT) is receiving what signal generator 210 exported
Low level, that is, second control signal shutdown, so that short-circuited conducting sleeve B1 be made to separate with data line, display panel 200 can be normally carried out work
Make.
In an alternative embodiment, the first control signal is the first level, and the second control signal is the second electricity
It is flat.
In the present embodiment, first switch circuit 30 and second switch circuit 40 are in the first electric conducts, second electrical level
Shutdown, and the first level value is generally the positive voltage of 10V~40V, and second electrical level voltage value is generally -20V~3V, root
The switchtype or cut-in voltage difference high low level voltage value selected according to first switch circuit 30 with second switch circuit 40
It can change, be not particularly limited herein.
In an alternative embodiment, the first switch circuit 30 and the second switch circuit 40 are NPN triode.
In the present embodiment, NPN triode, NPN triode is also can be used in first switch circuit 30 and second switch circuit 40
Base stage with first control liner 50 signal output end connect, the collector of NPN triode respectively with scan line liner sum number
It pads and connects according to line, the emitter of NPN triode is then correspondingly connected with data line and scan line respectively, and NPN triode receives high
Electric conducts, the output test signal of test equipment 60, which is exported to display panel 200, to be tested, and NPN triode receives low electricity
Flat shutdown, data line and scan line are disconnected with short-circuited conducting sleeve Bar.
The application also proposes a kind of testing device of display panel 300, which includes test circuit
100, the specific structure of the test circuit 100 is referring to above-described embodiment, since testing device of display panel 300 uses above-mentioned institute
There are whole technical solutions of embodiment, therefore at least all beneficial effects brought by the technical solution with above-described embodiment,
This is no longer going to repeat them.
The application also proposes a kind of display device 1000, including display panel 200 and testing device of display panel as above
300, as shown in Fig. 2, Fig. 2 is the functional block diagram of one embodiment of the application display device, in the present embodiment, display panel
200 data line and scan line is correspondingly connected with testing device of display panel 300, and it is defeated to receive testing device of display panel 300
Test signal out carries out panel test, also can receive driving signal after being completed and carries out the driving display of display panel 200,
Testing device of display panel 300 can also bonding on display panel 200, complete display panel 200 test after realize display surface
The driving of plate 200.
In an alternative embodiment, the display panel 200 is additionally provided with the second control liner 220, second control
Liner 220 is connected between the first control liner 50 and the signal generator 210.
In the present embodiment, caused by between signal generator 210 and the first control liner 50 because of slab movement
Poor contact, is additionally provided with the second control liner 220 on display panel 200, and the second control liner 220 is used for transmission the second control
Signal processed is turned off to the first control liner 50 with controlling first control circuit 30 and second control circuit 40, the second control liner
220 bondings on a display panel, and are connect by connecting line with the first control liner 50.
In an alternative embodiment, the second control liner 220 is connected by metal wire and the first control liner 50
It connects.
In the present embodiment, metal wire receives the second control signal that signal generator 210 exports, metal wire and the first control
Liner 50 second signal input terminal can connect by welding, the material of metal wire can be used aluminum steel, copper wire or its
The metal wire of his material, metal wire have many advantages, such as that high temperature resistant, resistance are small, electric conductivity is good, corrosion-resistant, can effectively reduce signal and decline
Subtract.
As shown in figure 3, Fig. 3 is the electrical block diagram of one embodiment of the application display device, it is described in the present embodiment
Multiple installation liners 230, the M first switch circuit 30 and N number of second switch electricity are additionally provided on display panel 200
Road 40 is connect by multiple installation liners 230 with scan line described in data line described in M item and N item respectively.
In the present embodiment, scan line and data line pass through 230 bondings of installation liner on a display panel respectively, installation liner
230 other ends are connected to each pixel by data line and scan line, to constitute 200 structure of display panel, it is ensured that data
It is stably connected between line and scan line and each pixel, the data line of the periphery of display panel 200 or scan line displacements is avoided to make
The movement of pixel, to guarantee the overall stability of display panel 200.
The foregoing is merely preferred embodiment of the present application, are not intended to limit the scope of the patents of the application, all at this
Under the inventive concept of application, using equivalent structure transformation made by present specification and accompanying drawing content, or directly/use indirectly
In the scope of patent protection that other related technical areas are included in the application.
Claims (10)
1. a kind of test circuit, it being set as test display panel, the display panel includes N scan line and M data line,
It is characterized in that, the test circuit includes:
At least one scan line liner, is set as being correspondingly connected with N scan line of the display panel by short-circuited conducting sleeve;
At least one data line liner, is set as being correspondingly connected with the M data line of the display panel by short-circuited conducting sleeve;
M first switch circuit, the M first switch circuit are correspondingly arranged on data line described in M item;
N number of second switch circuit, N number of second switch circuit are correspondingly arranged in scan line described in N item;
Test equipment is set as M first switch circuits of output first control signal control and N number of second switch electricity
Road conducting, and the test signal of the display panel is tested to described through scan line liner and data line liner output
Display panel;
First control liner, the first control liner include that the first signal input part and second signal input terminal and signal are defeated
Outlet;
First signal input part is set as receiving the first control signal of the test equipment output, and through described first
Control signal is exported through the signal output end to first switch circuit and the second switch circuit;
The second signal input terminal, is set as after the display panel is completed, and receives and is arranged in the display panel
On signal generator output second control signal, and export through the signal output end to the first switch circuit and institute
State second switch circuit.
2. test circuit as described in claim 1, which is characterized in that the first switch circuit and the second switch circuit
For thin film transistor (TFT).
3. test circuit as claimed in claim 2, which is characterized in that the first control signal is the first level, described the
Two control signals are second electrical level.
4. test circuit as claimed in claim 3, which is characterized in that the voltage value of the first control signal is greater than or waits
In 10V and it is less than or equal to 40V, the voltage value of the second control signal is more than or equal to -20V and is less than or waits
In -3V.
5. test circuit as described in claim 1, which is characterized in that the first switch circuit and the second switch circuit
For NPN triode.
6. a kind of testing device of display panel, which is characterized in that including the test electricity as described in claim 1-5 any one
Road.
7. a kind of display device, which is characterized in that including display panel and display panel as claimed in claim 6 test dress
It sets.
8. display device as claimed in claim 7, which is characterized in that the display panel is additionally provided with the second control liner,
The second control liner is connected between the first control liner and the signal generator.
9. display device as claimed in claim 8, which is characterized in that the second control liner passes through metal wire and described the
One control liner connection.
10. display device as claimed in claim 9, which is characterized in that be additionally provided with multiple installation linings on the display panel
Pad, the M first switch circuit and N number of second switch circuit pass through respectively described in multiple installation liners and M item
Data line is connected with scan line described in N item.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811395116.4A CN109345988B (en) | 2018-11-21 | 2018-11-21 | Test circuit, display panel test device and display device |
PCT/CN2018/122184 WO2020103258A1 (en) | 2018-11-21 | 2018-12-19 | Test circuit, display panel testing apparatus, and display apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811395116.4A CN109345988B (en) | 2018-11-21 | 2018-11-21 | Test circuit, display panel test device and display device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN109345988A true CN109345988A (en) | 2019-02-15 |
CN109345988B CN109345988B (en) | 2021-04-30 |
Family
ID=65317057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201811395116.4A Active CN109345988B (en) | 2018-11-21 | 2018-11-21 | Test circuit, display panel test device and display device |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN109345988B (en) |
WO (1) | WO2020103258A1 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110045223A (en) * | 2019-04-28 | 2019-07-23 | 云谷(固安)科技有限公司 | A kind of display panel and its test method, display device |
CN110767131A (en) * | 2019-10-15 | 2020-02-07 | 深圳市华星光电技术有限公司 | Lighting detection method and lighting fixture for liquid crystal display panel |
CN111653226A (en) * | 2020-07-06 | 2020-09-11 | 京东方科技集团股份有限公司 | Detection circuit, driving method thereof and display panel |
WO2021012415A1 (en) * | 2019-07-24 | 2021-01-28 | 武汉华星光电半导体显示技术有限公司 | Array substrate and display panel |
CN112331116A (en) * | 2020-11-05 | 2021-02-05 | 北海惠科光电技术有限公司 | Liquid crystal panel and liquid crystal panel array substrate row driving circuit detection method |
CN116129780A (en) * | 2023-04-04 | 2023-05-16 | 惠科股份有限公司 | Fault detection circuit, display panel and fault detection method |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101004490A (en) * | 2006-01-18 | 2007-07-25 | 中华映管股份有限公司 | Base plate of driving part array, liquid crystal display faceplate, and detection method |
CN101038315A (en) * | 2006-03-16 | 2007-09-19 | 统宝光电股份有限公司 | Scanning tester and method for plane display device |
CN101315472A (en) * | 2008-06-24 | 2008-12-03 | 友达光电股份有限公司 | Detection circuit and method of liquid crystal display panel, and liquid crystal display panel |
CN101458405A (en) * | 2007-12-12 | 2009-06-17 | 群康科技(深圳)有限公司 | Liquid crystal display panel and test method thereof |
CN101833910A (en) * | 2009-03-11 | 2010-09-15 | 上海天马微电子有限公司 | Display device and testing method of array substrate thereof |
CN102621721A (en) * | 2012-04-10 | 2012-08-01 | 深圳市华星光电技术有限公司 | Liquid crystal panel, liquid crystal module and method for clarifying reasons resulting in poor screen images thereof |
CN102692740A (en) * | 2012-06-05 | 2012-09-26 | 深圳市华星光电技术有限公司 | Liquid crystal display device, array substrate thereof and manufacturing method |
CN103325327A (en) * | 2013-06-20 | 2013-09-25 | 深圳市华星光电技术有限公司 | Display panel and detecting line and detecting method for display panel |
CN104111550A (en) * | 2014-08-08 | 2014-10-22 | 深圳市华星光电技术有限公司 | Liquid crystal panel detection circuit |
CN106531038A (en) * | 2016-12-09 | 2017-03-22 | 武汉华星光电技术有限公司 | Display device and detection method of display panel |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014202907A (en) * | 2013-04-04 | 2014-10-27 | 株式会社ジャパンディスプレイ | Planar display device and inspection method of the same |
CN107248387A (en) * | 2017-07-19 | 2017-10-13 | 深圳市华星光电半导体显示技术有限公司 | The test circuit and display device of display panel |
CN107329298A (en) * | 2017-08-31 | 2017-11-07 | 京东方科技集团股份有限公司 | Lighting test circuit, array base palte and preparation method thereof, display device |
-
2018
- 2018-11-21 CN CN201811395116.4A patent/CN109345988B/en active Active
- 2018-12-19 WO PCT/CN2018/122184 patent/WO2020103258A1/en active Application Filing
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101004490A (en) * | 2006-01-18 | 2007-07-25 | 中华映管股份有限公司 | Base plate of driving part array, liquid crystal display faceplate, and detection method |
CN101038315A (en) * | 2006-03-16 | 2007-09-19 | 统宝光电股份有限公司 | Scanning tester and method for plane display device |
CN101458405A (en) * | 2007-12-12 | 2009-06-17 | 群康科技(深圳)有限公司 | Liquid crystal display panel and test method thereof |
CN101315472A (en) * | 2008-06-24 | 2008-12-03 | 友达光电股份有限公司 | Detection circuit and method of liquid crystal display panel, and liquid crystal display panel |
CN101833910A (en) * | 2009-03-11 | 2010-09-15 | 上海天马微电子有限公司 | Display device and testing method of array substrate thereof |
CN102621721A (en) * | 2012-04-10 | 2012-08-01 | 深圳市华星光电技术有限公司 | Liquid crystal panel, liquid crystal module and method for clarifying reasons resulting in poor screen images thereof |
CN102692740A (en) * | 2012-06-05 | 2012-09-26 | 深圳市华星光电技术有限公司 | Liquid crystal display device, array substrate thereof and manufacturing method |
CN103325327A (en) * | 2013-06-20 | 2013-09-25 | 深圳市华星光电技术有限公司 | Display panel and detecting line and detecting method for display panel |
CN104111550A (en) * | 2014-08-08 | 2014-10-22 | 深圳市华星光电技术有限公司 | Liquid crystal panel detection circuit |
CN106531038A (en) * | 2016-12-09 | 2017-03-22 | 武汉华星光电技术有限公司 | Display device and detection method of display panel |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110045223A (en) * | 2019-04-28 | 2019-07-23 | 云谷(固安)科技有限公司 | A kind of display panel and its test method, display device |
WO2021012415A1 (en) * | 2019-07-24 | 2021-01-28 | 武汉华星光电半导体显示技术有限公司 | Array substrate and display panel |
CN110767131A (en) * | 2019-10-15 | 2020-02-07 | 深圳市华星光电技术有限公司 | Lighting detection method and lighting fixture for liquid crystal display panel |
CN110767131B (en) * | 2019-10-15 | 2023-03-24 | Tcl华星光电技术有限公司 | Lighting detection method and lighting fixture for liquid crystal display panel |
CN111653226A (en) * | 2020-07-06 | 2020-09-11 | 京东方科技集团股份有限公司 | Detection circuit, driving method thereof and display panel |
CN111653226B (en) * | 2020-07-06 | 2023-05-23 | 京东方科技集团股份有限公司 | Detection circuit, driving method thereof and display panel |
CN112331116A (en) * | 2020-11-05 | 2021-02-05 | 北海惠科光电技术有限公司 | Liquid crystal panel and liquid crystal panel array substrate row driving circuit detection method |
CN116129780A (en) * | 2023-04-04 | 2023-05-16 | 惠科股份有限公司 | Fault detection circuit, display panel and fault detection method |
WO2024207668A1 (en) * | 2023-04-04 | 2024-10-10 | 惠科股份有限公司 | Fault detection circuit, display panel, and fault detection method |
Also Published As
Publication number | Publication date |
---|---|
WO2020103258A1 (en) | 2020-05-28 |
CN109345988B (en) | 2021-04-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109345988A (en) | Test circuit, display panel test device and display device | |
CN104459400B (en) | Detection circuit and detection method for self-tolerant touch screen | |
US20190294290A1 (en) | Display substrate and short-circuit detecting method thereof, and display device | |
CN107329298A (en) | Lighting test circuit, array base palte and preparation method thereof, display device | |
CN105070239A (en) | Liquid crystal display panel | |
CN103309065B (en) | The measurement circuit of display panel and method of testing thereof | |
CN209328489U (en) | LED display module, display screen and display system with bad point detection | |
CN109872667A (en) | Signal detection system and display device | |
CN100568059C (en) | The testing circuit of display panels and method and display panels thereof | |
CN101355082A (en) | Display panel and test system | |
CN106057106B (en) | A kind of detection structure, detection method and display device | |
CN105652539B (en) | Liquid crystal display device and its liquid crystal display panel | |
CN106647082A (en) | Circuit and method for testing gate line of array substrate | |
CN108053785A (en) | The detection module and detection device of OLED display panel | |
CN104280970A (en) | Array substrate and liquid crystal display panel | |
CN110488547A (en) | Display panel | |
CN110322819A (en) | Display panel tests circuit | |
CN105702199B (en) | Pixel unit and its driving method | |
CN109839767A (en) | A kind of array substrate, display panel and display device | |
CN105609023A (en) | Testing element group, array substrate, detection device and detection method | |
CN207457645U (en) | A kind of LCD probe detection devices and LCD AOI equipment | |
CN110660346A (en) | Micro LED display panel and detection method thereof | |
CN202221452U (en) | Automatic test system | |
CN106531038B (en) | The detection method of display device and display panel | |
CN108335658A (en) | Display panel and display test device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |