CN109285849B - 电子图像采集装置 - Google Patents

电子图像采集装置 Download PDF

Info

Publication number
CN109285849B
CN109285849B CN201810729632.XA CN201810729632A CN109285849B CN 109285849 B CN109285849 B CN 109285849B CN 201810729632 A CN201810729632 A CN 201810729632A CN 109285849 B CN109285849 B CN 109285849B
Authority
CN
China
Prior art keywords
substrate wafer
electrical connection
semiconductor substrate
dielectric layer
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201810729632.XA
Other languages
English (en)
Other versions
CN109285849A (zh
Inventor
F·罗伊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Crolles 2 SAS
Original Assignee
STMicroelectronics Crolles 2 SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Crolles 2 SAS filed Critical STMicroelectronics Crolles 2 SAS
Publication of CN109285849A publication Critical patent/CN109285849A/zh
Application granted granted Critical
Publication of CN109285849B publication Critical patent/CN109285849B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14603Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14643Photodiode arrays; MOS imagers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14634Assemblies, i.e. Hybrid structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14636Interconnect structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14683Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
    • H01L27/14687Wafer level processing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14683Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
    • H01L27/1469Assemblies, i.e. hybrid integration
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/07Structure, shape, material or disposition of the bonding areas after the connecting process
    • H01L2224/08Structure, shape, material or disposition of the bonding areas after the connecting process of an individual bonding area
    • H01L2224/081Disposition
    • H01L2224/0812Disposition the bonding area connecting directly to another bonding area, i.e. connectorless bonding, e.g. bumpless bonding
    • H01L2224/08121Disposition the bonding area connecting directly to another bonding area, i.e. connectorless bonding, e.g. bumpless bonding the connected bonding areas being not aligned with respect to each other
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Facsimile Heads (AREA)

Abstract

本公开的实施例涉及电子图像采集装置。一种电子图像采集装置包括第一部分和第二部分。第一部分由衬底晶片形成,该衬底晶片在其一侧上设置有电子电路以及具有电连接网络和在外表面上的外部电接触的介电层。第二部分包括在光的作用下能够生成电信号的像素晶片、安装到像素晶片并设置有电子电路的衬底晶片以及具有电连接网络和外表面上的外部电接触的介电层。外表面和外部电接触彼此结合,以便将第一部分安装到第二部分。连接焊盘延伸穿过像素晶片中的孔,以与第二部分的电连接网络电连接。

Description

电子图像采集装置
优先权要求
本申请要求2017年07月19日提交的法国专利申请No.1756836的优先权权益,其内容通过引用以其整体并入本文至法律允许的最大程度。
技术领域
本发明的实施例涉及能够采集图像的电子装置的领域。
发明内容
在一个实施例中,一种电子图像采集装置包括第一部分和第二部分。第一部分包括半导体衬底晶片,其在一侧上设置有集成电子电路以及包括电连接网络的介电层,该介电层具有设置有电接触的面。第二部分被配置成在光的作用下以像素的形式生成电信号,并且包括半导体衬底晶片,其在一侧上设置有集成电子电路以及包括电连接网络的介电层,该介电层具有设置有电接触的面,并且在另一侧上,设置有定义所述像素的次级晶片。
所述第一部分和所述第二部分被安装在彼此之上,使得它们的上述设置有电接触的面被结合在一起,并且这些电接触分别被结合在一起。
用于外部电连接的焊盘被制作在所述次级晶片中的孔中,并且被链接到所述第二部分的所述电连接网络。
所述第一部分和所述第二部分可以通过所述面的分子粘合和所述电接触的分子粘合而被组装在一起。
衬底晶片和次级晶片可以通过彼此的分子粘合而被组装在一起。
所述孔可以位于所述第二部分的没有电子电路和像素的区域中。
第二部分的衬底晶片可以包括已经使其变得导电的绝缘部分,该绝缘部分具有连接到所述第二部分的所述电连接网络的一侧,以及在其上所述用于外部电连接的焊盘被制作在所述孔中的另一侧。
所述第二部分的衬底晶片的所述绝缘部分可以没有电子电路。
可以通过将金属沉积和扩散到半导体材料中使所述绝缘部分变得导电。
附图说明
现在将通过由图1图示的非限制性示例来描述电子图像采集装置:
图1示出了电子图像采集装置的横截面图。
具体实施方式
图1图示了电子图像采集装置1,该装置包括结合在一起的第一部分2和第二部分3。
第一部分2包括由硅制成的半导体衬底晶片4,半导体衬底晶片4在一侧5上设置有集成电子电路6以及包括电连接网络8的介电层7。
介电层7具有与衬底晶片4相对的正面9,正面9上设置有电接触10。
电连接网络8包括多个金属层级,这些金属层级被选择性地连接到彼此、电子电路6以及电接触10。
集成电子电路6特别地包括用于电子图像采集装置1的控制电路。
第二部分3能够在光的作用下生成信号,并且包括由硅制成的薄半导体衬底晶片11,在半导体衬底晶片11一侧12上设置有集成电子电路13以及包括电连接网络15的介电层14。
介电层14具有与衬底晶片11相对的正面16,正面16上设置有电接触17。
第二部分3在薄半导体衬底晶片11的另一侧18上还包括次级晶片19(膜),次级晶片19(膜)能够吸收光并定义像素的光敏区(该晶片19例如由硅制成并且与半导体衬底晶片11绝缘)。
电连接网络15包括多个金属层级,这些金属层级使用经过衬底晶片11到层19中的光敏区的贯穿通道(图1中未显式地示出)而被选择性地链接到彼此、电子电路13、电接触17以及次级层19的多个部分。
电子电路13特别地包括与用于电子图像采集装置1的像素读出电路系统相关联的晶体管和电荷存储电容器。光敏区可以包括例如光电二极管或其他光敏集成电路或在次级层19中形成的公知的区域。
检测到达与衬底晶片11相对的晶片19的外表面20(第二部分3的背面)的光,电子电路13和次级晶片19(定义MOS电容器)以像素的形式传送信号。
第一部分2和第二部分3被安装或堆叠在彼此之上,使得它们的面9和面16通过分子粘合而被结合在一起并且使得电接触10和电接触17通过粘合而被选择性地结合在一起。
第二部分3具有盲孔21,在其中制作用于外部电连接22的焊盘,所述焊盘选择性地链接到电连接网络15。
孔21被制作在次级晶片19中的没有电子电路13的地方,从外表面20(背面)开始并到达衬底晶片11的绝缘部分11a。
衬底晶片11的部分11a通过诸如沟槽绝缘的绝缘区域与该晶片的其余部分11b分离,在其余部分11b上制作电子电路13。
预先使部分11a导电,例如通过在部分11a上沉积诸如钴的金属并通过热处理将金属扩散到硅中以形成金属硅化物。
在一侧上,部分11a连接到电连接网络15,而在另一侧,电连接焊盘22被制作在部分11a上的孔21中。
电连接焊盘22可以由铝或铜制成,其中导电粘合层插入在它们与部分11a之间,并且绝缘层被插入在它们与次级晶片19之间。
以上的结果是电连接网络8和电连接网络15经由电接触10和电接触17选择性地链接到彼此,链接到电子电路6和电子电路13并且链接到用于外部电连接的焊盘22,以便从外部向电子电路6和电子电路13供电并且提供电子电路6和电子电路13之间以及电子电路6和电子电路13中的每一个与外部之间的信号交换。
可以以下面的方式制造电子装置1。
分开制造第一部分2和第二部分3。
可以以下面的方式制造第二部分3。顺序地制造包括次级晶片19的第一元件(包括像素的光敏区)。接下来通过分子粘合将衬底11结合到厚的次级晶片19上,为此,这些元件包括例如氧化硅层。
在实现这种结合之后,晶片11的部分11a被定义并通过硅化工艺使其导电,电子电路13被定义在晶片11的部分11b中,并且介电层14被形成并设置有电连接网络15。然后,如上所描述的,通过分子粘合将部分2和部分3安装在彼此之上。
在该顺序之后,在与分子键合相对的一侧上减薄次级晶片19,以在减薄之后获得具有外表面20的光敏膜。接下来,制作孔21并制造电连接焊盘22。
接下来,电子装置1可通过将电线23连接到电连接焊盘22而链接到外部电子装置。
根据另一种布置,电连接焊盘22可以突出,以便经由熔合的接触连接到外部电子装置。

Claims (8)

1.一种电子图像采集装置,包括:
第一部分,包括:第一半导体衬底晶片,包括设置有集成电子电路的第一表面;和第一介电层,安装在所述第一半导体衬底晶片的所述第一表面上并且包括电连接网络,其中所述第一介电层的外表面包括第一电接触;和
第二部分,包括:膜层,所述膜层包括被配置成响应于光而生成电信号的像素;第二半导体衬底晶片,包括设置有集成电子电路的第一表面、安装到所述膜层的所述第二半导体衬底晶片的第二表面;和第二介电层,安装在所述第二半导体衬底晶片的所述第一表面上并且包括电连接网络,其中所述第二介电层的外表面包括第二电接触;
其中所述第一部分被安装定位到所述第二部分,使得设置有第一电接触和第二电接触的外表面结合在一起,并且所述第一电接触和所述第二电接触分别结合在一起;并且
其中用于外部电连接的焊盘延伸穿过所述膜层中的孔,所述焊盘电链接到被包括在所述第二部分的所述第二介电层内的所述电连接网络,
其中所述第一部分和所述第二部分通过所述外表面的分子粘合和所述第一电接触和所述第二电接触的分子粘合而被组装在一起。
2.根据权利要求1所述的装置,其中所述第二半导体衬底晶片和所述膜层通过分子粘附而被组装在一起。
3.根据权利要求1所述的装置,其中所述孔位于所述第二部分的没有电子电路和像素的区域中。
4.根据权利要求1所述的装置,其中所述第二半导体衬底晶片包括:第一部分和第二部分,其中所述第一部分和第二部分彼此绝缘,其中所述第一部分提供所述焊盘和被包括在所述第二介电层内的所述电连接网络之间的电连接;并且其中所述集成电子电路位于所述第二部分内。
5.根据权利要求4所述的装置,其中所述第一部分是导电的并且与所述孔和所述焊盘的位置对准。
6.根据权利要求4所述的装置,其中所述第一部分不包括任何集成电子电路。
7.根据权利要求4所述的装置,其中所述第一部分包括具有由所述第二半导体衬底晶片形成的金属硅化物的至少一部分。
8.根据权利要求4所述的装置,还包括用于使所述第一部分和第二部分彼此绝缘的沟槽隔离。
CN201810729632.XA 2017-07-19 2018-07-05 电子图像采集装置 Active CN109285849B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1756836 2017-07-19
FR1756836A FR3069371B1 (fr) 2017-07-19 2017-07-19 Dispositif electronique capteur d'images

Publications (2)

Publication Number Publication Date
CN109285849A CN109285849A (zh) 2019-01-29
CN109285849B true CN109285849B (zh) 2023-07-28

Family

ID=60382313

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201810729632.XA Active CN109285849B (zh) 2017-07-19 2018-07-05 电子图像采集装置
CN201821058973.0U Withdrawn - After Issue CN208570608U (zh) 2017-07-19 2018-07-05 电子图像采集装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201821058973.0U Withdrawn - After Issue CN208570608U (zh) 2017-07-19 2018-07-05 电子图像采集装置

Country Status (3)

Country Link
US (1) US10475827B2 (zh)
CN (2) CN109285849B (zh)
FR (1) FR3069371B1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3069371B1 (fr) * 2017-07-19 2019-08-30 Stmicroelectronics (Crolles 2) Sas Dispositif electronique capteur d'images

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012004965A1 (en) * 2010-07-09 2012-01-12 Canon Kabushiki Kaisha Solid-state image pickup device
CN208570608U (zh) * 2017-07-19 2019-03-01 意法半导体(克洛尔2)公司 电子图像采集装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5482025B2 (ja) * 2009-08-28 2014-04-23 ソニー株式会社 固体撮像装置とその製造方法、及び電子機器
US10269863B2 (en) * 2012-04-18 2019-04-23 Taiwan Semiconductor Manufacturing Company, Ltd. Methods and apparatus for via last through-vias
TWI676280B (zh) * 2014-04-18 2019-11-01 日商新力股份有限公司 固體攝像裝置及具備其之電子機器
US20170003314A1 (en) * 2015-06-30 2017-01-05 Lumedyne Technologies Incorporated Z-axis physical proximity switch

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012004965A1 (en) * 2010-07-09 2012-01-12 Canon Kabushiki Kaisha Solid-state image pickup device
CN208570608U (zh) * 2017-07-19 2019-03-01 意法半导体(克洛尔2)公司 电子图像采集装置

Also Published As

Publication number Publication date
FR3069371A1 (fr) 2019-01-25
US10475827B2 (en) 2019-11-12
CN208570608U (zh) 2019-03-01
FR3069371B1 (fr) 2019-08-30
CN109285849A (zh) 2019-01-29
US20190027523A1 (en) 2019-01-24

Similar Documents

Publication Publication Date Title
US20210036040A1 (en) Solid-state imaging apparatus and method for manufacturing the solid-state imaging apparatus having sealing portion disposed in bonded members
JP6779825B2 (ja) 半導体装置および機器
US8274101B2 (en) CMOS image sensor with heat management structures
KR101122344B1 (ko) 반도체 이미지 센서 모듈, 반도체 이미지 센서 모듈의 제조방법, 카메라 및 카메라의 제조 방법
CN102971851B (zh) 固态图像拾取设备
CN101866897B (zh) 具有贯通电极的固体摄像器件
US9324753B2 (en) Solid-state imaging device, method of manufacturing a solid-state imaging device, and electronic apparatus
US10559464B2 (en) Method for manufacturing photoelectric conversion device
US8916911B2 (en) Semiconductor devices having backside illuminated image sensors
US20100295170A1 (en) Semiconductor device
CN104517951A (zh) 通过晶圆级堆叠的双面bsi图像传感器
CN112789488B (zh) 红外检测器制造方法和相关红外检测器
US9635228B2 (en) Image sensors with interconnects in cover layer
KR20160008385A (ko) 위상차 검출 픽셀 및 이를 갖는 이미지 센서
CN103137566A (zh) 用于形成集成电路的方法
CN109285849B (zh) 电子图像采集装置
JP2022000897A (ja) 固体撮像装置および固体撮像装置の製造方法
US12035060B2 (en) Stacked image sensor
CN104037138A (zh) 形成超高密度嵌入式半导体管芯封装的半导体器件和方法
JP6095904B2 (ja) 固体撮像装置の製造方法及び固体撮像装置
US10679944B2 (en) Semiconductor structure with high resistivity wafer and fabricating method of bonding the same
JP2003133538A (ja) 半導体装置およびその製造方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant