CN109240864A - A kind of AEP memory DC test method and device - Google Patents
A kind of AEP memory DC test method and device Download PDFInfo
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- CN109240864A CN109240864A CN201811038514.0A CN201811038514A CN109240864A CN 109240864 A CN109240864 A CN 109240864A CN 201811038514 A CN201811038514 A CN 201811038514A CN 109240864 A CN109240864 A CN 109240864A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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Abstract
The embodiment of the present application provides a kind of AEP memory DC test method and device, comprising: setting AEP memory initial parameter；The tester table equipped with AEP memory is booted up using control machine；Scan the test parameter of the AEP memory；The performance state of the AEP memory is obtained according to the initial parameter and the test parameter；Power-off operation is carried out to the tester table using script.The present invention can carry out DC test to AEP memory automatically and improve testing efficiency and accuracy rate, while also saving plenty of time and manpower without manually being operated.
Description
Technical field
The invention belongs to AEP internal memory performance the field of test technology, and in particular to a kind of AEP memory DC test method and dress
It sets.
Background technique
AEP memory abbreviation ApachePassDIMMs is private clound, server, indispensable setting of accelerating in operation etc.
It is standby.Main positioning is to support lasting Memory or In- for substituting DRAM (dynamic random access memory, server memory)
Memory application.The operation of server needs high reliability, when server contains AEP memory, needs to carry out it a series of
Reliability test guarantees to be not in exception in future customer hand.
DC test is repeatedly switched on for long-range control tester table and then tests a kind of test of hardware or software stability.Mesh
It is preceding it is most need artificial repetitive operation, waste time and manpower.
Summary of the invention
In view of the deficiencies of the prior art, the present invention provides a kind of AEP memory DC test method and device, to solve above-mentioned skill
Art problem.
In a first aspect, the embodiment of the present application provides a kind of AEP memory DC test method, which comprises
AEP memory initial parameter is set；
The tester table equipped with AEP memory is booted up using control machine；
Scan the test parameter of the AEP memory；
The performance state of the AEP memory is obtained according to the initial parameter and the test parameter；
Power-off operation is carried out to the tester table using script.
With reference to first aspect, in the first embodiment of first aspect, the setting AEP memory initial parameter packet
It includes:
AEP memory ID is acquired using ipmctl and generates ID table；
AEP memory initial number is obtained according to the AEP memory ID table；
AEP memory initial health is obtained according to the AEP memory ID；
The spatial data block of AEP memory is re-created using ndctl and obtains the initial MD5 value of the spatial data block.
With reference to first aspect, described to utilize control machine to equipped with AEP memory in second of embodiment of first aspect
Tester table boot up and include:
Obtain tested board power supply status；
Judge whether tested board power supply is in close state:
It is then to send power-on instruction to control tested board energization booting；
It is no, then recycle the tested board power supply status operation of acquisition.
With reference to first aspect, the third in first aspect is the test of the scanning AEP memory in embodiment
Parameter includes:
AEP memory ID is acquired using ipmctl and generates test ID table；
The health status of the AEP memory is retrieved according to the AER memory ID；
The quantity of AEP memory is retrieved according to the AEP memory test ID table；
The MD5 value of the spatial data block of the AEP memory is retrieved according to the AEP memory ID.
With reference to first aspect, described according to initial parameter and the test in the 4th kind of embodiment of first aspect
The performance state that parameter obtains the AEP memory includes:
Judge whether AEP memory test parameter is consistent with initial parameter:
It is then to determine that AEP memory is normal；
It is no, then determine AEP memory abnormal and saves error-logging information.
Second aspect, the embodiment of the present application provide a kind of AEP memory DC test device, and described device includes:
Parameter set unit is configured to setting AEP memory initial parameter；
Start-up unit is controlled, is configured to boot up the tester table equipped with AEP memory using control machine；
Parameter scanning unit is configured to scan the test parameter of the AEP memory；
Performance acquiring unit is configured to obtain the AEP memory according to the initial parameter and the test parameter
Performance state；
Power-off operation unit is configured to carry out power-off operation to the tester table using script.
In conjunction with second aspect, in the first embodiment of second aspect, the parameter set unit includes:
Initial acquisition module is configured to using ipmctl acquisition AEP memory ID and generates ID table；
First setup module is configured to obtain AEP memory initial number according to the AEP memory ID table；
Second setup module is configured to obtain AEP memory initial health according to the AEP memory ID；
Third setup module is configured to be re-created the spatial data block of AEP memory using ndctl and obtains the sky
Between data block initial MD5 value.
In conjunction with second aspect, in second of embodiment of second aspect, the control start-up unit includes:
State acquisition module is configured to obtain tested board power supply status；
Condition judgment module is configured to judge whether tested board power supply is in close state；
Starting module is controlled, is configured to send the tested board energization booting of power-on instruction control；
Circulation obtains module, is configured to circulation and obtains tested board power supply status operation.
In conjunction with second aspect, in the third embodiment of second aspect, the parameter scanning unit includes:
Acquisition module is tested, be configured to using ipmctl acquisition AEP memory ID and generates test ID table；
Status retrieval module is configured to retrieve the health status of the AEP memory according to the AER memory ID；
Quantity retrieval module is configured to retrieve the quantity of AEP memory according to the AEP memory test ID table；
Parameter search module is configured to retrieve the spatial data block of the AEP memory according to the AEP memory ID
MD5 value.
In conjunction with second aspect, in the 4th kind of embodiment of second aspect, the performance acquiring unit includes:
Parameter judgment module is configured to judge whether AEP memory test parameter is consistent with initial parameter；
Normal determination module is configured to determine that AEP memory is normal；
Abnormal determination module is configured to determine AEP memory abnormal and saves error-logging information.
The third aspect provides a kind of terminal, comprising:
Processor, memory, wherein
The memory is used to store computer program,
The processor from memory for calling and running the computer program, so that terminal executes above-mentioned end
The method for holding terminal.
Fourth aspect provides a kind of computer storage medium, instruction is stored in the computer readable storage medium,
When run on a computer, so that computer executes method described in above-mentioned various aspects.
5th aspect, provides a kind of computer program product comprising instruction, when run on a computer, so that
Computer executes method described in above-mentioned various aspects.
The beneficial effects of the present invention are,
AEP memory DC test method provided by the invention and device, by the way that the initial parameter of AEP memory is arranged, by remote
After tester table is switched on by process control, scanning collection booting after AEP memory test parameter, pass through initial parameter and test parameter
The performance state of AEP memory can be obtained.The present invention can carry out DC test to AEP memory automatically, without manually being operated,
Testing efficiency and accuracy rate are improved, while also saving plenty of time and manpower.
In addition, design principle of the present invention is reliable, structure is simple, has very extensive application prospect.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, for those of ordinary skill in the art
Speech, without creative efforts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is the schematic flow chart of the method for the application one embodiment.
Fig. 2 is the schematic block diagram of the device of the application one embodiment.
Fig. 3 is a kind of structural schematic diagram of terminal provided in an embodiment of the present invention.
Specific embodiment
Technical solution in order to enable those skilled in the art to better understand the present invention, below in conjunction with of the invention real
The attached drawing in example is applied, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described implementation
Example is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work, all should belong to protection of the present invention
Range.Technical solution in order to enable those skilled in the art to better understand the present invention, below in conjunction with of the invention real
The attached drawing in example is applied, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described implementation
Example is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work, all should belong to protection of the present invention
Range.
The Key Term occurred in the application is explained below.
Fig. 1 is the schematic flow chart of the method for the application one embodiment.Wherein, Fig. 1 executing subject can be one kind
AEP memory DC test device.
As shown in Figure 1, this method 100 includes:
Step 110, AEP memory initial parameter is set；
Step 120, the tester table equipped with AEP memory is booted up using control machine；
Step 130, the test parameter of the AEP memory is scanned；
Step 140, the performance state of the AEP memory is obtained according to the initial parameter and the test parameter；
Step 150, power-off operation is carried out to the tester table using script.
In order to facilitate the understanding of the present invention, the principle of the AEP memory DC test method improved below with the present invention, in conjunction with
The process for carrying out DC test in embodiment to AEP memory, further retouches AEP memory DC test method provided by the invention
It states.
Optionally, as the application one embodiment, the setting AEP memory initial parameter includes:
AEP memory ID is acquired using ipmctl and generates ID table；
AEP memory initial number is obtained according to the AEP memory ID table；
AEP memory initial health is obtained according to the AEP memory ID；
The spatial data block of AEP memory is re-created using ndctl and obtains the initial MD5 value of the spatial data block.
Optionally, described that the tester table equipped with AEP memory is carried out using control machine as the application one embodiment
Booting includes:
Obtain tested board power supply status；
Judge whether tested board power supply is in close state:
It is then to send power-on instruction to control tested board energization booting；
It is no, then recycle the tested board power supply status operation of acquisition.
Optionally, as the application one embodiment, the test parameter of the scanning AEP memory includes:
AEP memory ID is acquired using ipmctl and generates test ID table；
The health status of the AEP memory is retrieved according to the AER memory ID；
The quantity of AEP memory is retrieved according to the AEP memory test ID table；
The MD5 value of the spatial data block of the AEP memory is retrieved according to the AEP memory ID.
Optionally, described that the AEP is obtained according to initial parameter and the test parameter as the application one embodiment
The performance state of memory includes:
Judge whether AEP memory test parameter is consistent with initial parameter:
It is then to determine that AEP memory is normal；
It is no, then determine AEP memory abnormal and saves error-logging information.
Specifically, the AEP memory DC test method includes:
S1, setting AEP memory initial parameter.
Into OS---ipmctlshow-dimm, retrieves AEP memory ID and generate ID table, it is initial according to ID list deciding AEP
Quantity and health status (statistics healthy quantity), ndctllist determines that region whether there is, and checking on each pmem is
No there are files, have, delete file, re-create file, size 20M or more.This document MD5 value is obtained as initial MD5
Value, is recorded under other catalogues of os.
S2, the tester table equipped with AEP memory is booted up using control machine.
A control machine connection tester table is needed, ipmitool tool is installed on control machine, when tester table executes
After shutdown command, execute at control board end as ordered: ipmitool-Ilanplus-HXX:XX:XX:XX (tester table
BMCIP)–Uadmin–Padminpoweron；Tester table boot action is carried out, following script method can be referred to:
Above-mentioned code is executed in remotely control board, in order to control the power supply status of tested board, if when tested
When the power supply status of board is PowerOFF, long-range control machine will send PowerOn order to by tested board
The test parameter of S3, the scanning AEP memory.
AEP memory ID is acquired using ipmctl and generates test ID table, and the AEP memory is retrieved according to AER memory ID
Health status；The quantity of AEP memory is retrieved according to AEP memory test ID table；The AEP memory is retrieved according to AEP memory ID
The MD5 value of spatial data block.
S4, the performance state that the AEP memory is obtained according to the initial parameter and the test parameter.
Whether the test parameter obtained in comparison step S3 is consistent with the initial parameter in step S1, if being consistent
Then determine that AEP memory is normal, AEP memory abnormal is determined if inconsistent and saves error log file.
S5, power-off operation is carried out to the tester table using script.
After having executed primary booting test, shutdown is to carry out booting test next time, until reaching preset test
Number.500 testing times are set in the present embodiment, reaches the 500th time and just no longer executes shutdown but complete entire test.When
After being completed, file log file is checked, if all pass, the reliability demonstration of this AEP memory passes through, if
There are fail, then do not pass through.Show test result.
Specifically, the implementation code of step S3 and S4 is as follows:
If Fig. 2 shows, which includes:
Parameter set unit 210, the parameter set unit 210 is for being arranged AEP memory initial parameter；
Start-up unit 220 is controlled, the control start-up unit 220 is used for the test using control machine to AEP memory is equipped with
Board boots up；
Parameter scanning unit 230, the parameter scanning unit 230 are used to scan the test parameter of the AEP memory；
Performance acquiring unit 240, the performance acquiring unit 240 are used for according to the initial parameter and the test parameter
Obtain the performance state of the AEP memory；
Power-off operation unit 250, the power-off operation unit 250 is for shutting down to the tester table using script
Operation.
Optionally, as the application one embodiment, the parameter set unit includes:
Initial acquisition module is configured to using ipmctl acquisition AEP memory ID and generates ID table；
First setup module is configured to obtain AEP memory initial number according to the AEP memory ID table；
Second setup module is configured to obtain AEP memory initial health according to the AEP memory ID；
Third setup module is configured to be re-created the spatial data block of AEP memory using ndctl and obtains the sky
Between data block initial MD5 value.
Optionally, as the application one embodiment, the control start-up unit includes:
State acquisition module is configured to obtain tested board power supply status；
Condition judgment module is configured to judge whether tested board power supply is in close state；
Starting module is controlled, is configured to send the tested board energization booting of power-on instruction control；
Circulation obtains module, is configured to circulation and obtains tested board power supply status operation.
Optionally, as the application one embodiment, the parameter scanning unit includes:
Acquisition module is tested, be configured to using ipmctl acquisition AEP memory ID and generates test ID table；
Status retrieval module is configured to retrieve the health status of the AEP memory according to the AER memory ID；
Quantity retrieval module is configured to retrieve the quantity of AEP memory according to the AEP memory test ID table；
Parameter search module is configured to retrieve the spatial data block of the AEP memory according to the AEP memory ID
MD5 value.
Optionally, as the application one embodiment, the performance acquiring unit includes:
Parameter judgment module is configured to judge whether AEP memory test parameter is consistent with initial parameter；
Normal determination module is configured to determine that AEP memory is normal；
Abnormal determination module is configured to determine AEP memory abnormal and saves error-logging information.
Fig. 3 is a kind of structural schematic diagram of terminal installation 300 provided in an embodiment of the present invention, which can be with
For executing the method provided by the embodiments of the present application for updating heat dissipation policing parameter.
Wherein, which may include: processor 310, memory 320 and communication unit 330.These components
It is communicated by one or more bus, it will be understood by those skilled in the art that the structure of server shown in figure is not
The restriction to the application is constituted, it is also possible to hub-and-spoke configuration either busbar network, can also include more than illustrating
Or less component, perhaps combine certain components or different component layouts.
Wherein, which can be used for executing instruction for storage processor 310, and memory 320 can be by any class
The volatibility or non-volatile memories terminal or their combination of type are realized, such as static random access memory (SRAM), electricity
Erasable Programmable Read Only Memory EPROM (EEPROM), Erasable Programmable Read Only Memory EPROM (EPROM), programmable read only memory
(PROM), read-only memory (ROM), magnetic memory, flash memory, disk or CD.When executing instruction in memory 320
When being executed by processor 310, so that terminal 300 some or all of is able to carry out in following above method embodiment step.
Processor 310 is the control centre for storing terminal, utilizes each of various interfaces and the entire electric terminal of connection
A part by running or execute the software program and/or module that are stored in memory 320, and calls and is stored in storage
Data in device, to execute the various functions and/or processing data of electric terminal.The processor can be by integrated circuit
(Integrated Circuit, abbreviation IC) composition, such as the IC that can be encapsulated by single are formed, can also be by more of connection
The encapsulation IC of identical function or different function and form.For example, processor 310 can only include central processing unit
(Central Processing Unit, abbreviation CPU).In the application embodiment, CPU can be single operation core, can also
To include multioperation core.
Communication unit 330, for establishing communication channel, so that the storage terminal be allow to be led to other terminals
Letter.It receives the user data of other terminals transmission or sends user data to other terminals.
The application also provides a kind of computer storage medium, wherein the computer storage medium can be stored with program, the journey
Sequence may include step some or all of in each embodiment provided by the present application when executing.The storage medium can for magnetic disk,
CD, read-only memory (English: read-only memory, referred to as: ROM) or random access memory (English:
Random access memory, referred to as: RAM) etc..
Therefore, the application is by the initial parameter of setting AEP memory, by sweeping after remotely controlling tester table being switched on
AEP memory test parameter after retouching acquisition booting, the performance shape of AEP memory can be obtained by initial parameter and test parameter
State.The present invention can carry out DC test to AEP memory automatically, without manually being operated, improve testing efficiency and accuracy rate,
Also save plenty of time and manpower simultaneously, the attainable technical effect of the present embodiment institute may refer to it is described above, this
Place repeats no more.
It is required that those skilled in the art can be understood that the technology in the embodiment of the present application can add by software
The mode of general hardware platform realize.Based on this understanding, the technical solution in the embodiment of the present application substantially or
Say that the part that contributes to existing technology can be embodied in the form of software products, which is stored in
Such as USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory in one storage medium
The various media that can store program code such as (RAM, Random Access Memory), magnetic or disk, including it is several
Instruction is used so that a terminal (can be personal computer, server or second terminal, the network terminal etc.) is held
Row all or part of the steps of the method according to each embodiment of the present invention.
Same and similar part may refer to each other between each embodiment in this specification.Implement especially for terminal
For example, since it is substantially similar to the method embodiment, so being described relatively simple, related place is referring in embodiment of the method
Explanation.
In several embodiments provided herein, it should be understood that disclosed systems, devices and methods, it can be with
It realizes by another way.For example, the apparatus embodiments described above are merely exemplary, for example, the unit
It divides, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple units or components
It can be combined or can be integrated into another system, or some features can be ignored or not executed.Another point, it is shown or
The mutual coupling, direct-coupling or communication connection discussed can be through some interfaces, the indirect coupling of device or unit
It closes or communicates to connect, can be electrical property, mechanical or other forms.
The unit as illustrated by the separation member may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, it can and it is in one place, or may be distributed over multiple
In network unit.It can select some or all of unit therein according to the actual needs to realize the mesh of this embodiment scheme
's.
It, can also be in addition, the functional units in various embodiments of the present invention may be integrated into one processing unit
It is that each unit physically exists alone, can also be integrated in one unit with two or more units.
Although by reference to attached drawing and combining the mode of preferred embodiment to the present invention have been described in detail, the present invention
It is not limited to this.Without departing from the spirit and substance of the premise in the present invention, those of ordinary skill in the art can be to the present invention
Embodiment carry out various equivalent modifications or substitutions, and these modifications or substitutions all should in covering scope of the invention/appoint
What those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, answer
It is included within the scope of the present invention.Therefore, protection scope of the present invention is answered described is with scope of protection of the claims
It is quasi-.
Claims (10)
1. a kind of AEP memory DC test method, which is characterized in that the described method includes:
AEP memory initial parameter is set；
The tester table equipped with AEP memory is booted up using control machine；
Scan the test parameter of the AEP memory；
The performance state of the AEP memory is obtained according to the initial parameter and the test parameter；
Power-off operation is carried out to the tester table using script.
2. the method according to claim 1, wherein the setting AEP memory initial parameter includes:
AEP memory ID is acquired using ipmctl and generates ID table；
AEP memory initial number is obtained according to the AEP memory ID table；
AEP memory initial health is obtained according to the AEP memory ID；
The spatial data block of AEP memory is re-created using ndctl and obtains the initial MD5 value of the spatial data block.
3. the method according to claim 1, wherein it is described using control machine to be equipped with AEP memory test machine
Platform, which boots up, includes:
Obtain tested board power supply status；
Judge whether tested board power supply is in close state:
It is then to send power-on instruction to control tested board energization booting；
It is no, then recycle the tested board power supply status operation of acquisition.
4. the method according to claim 1, wherein the test parameter of the scanning AEP memory includes:
AEP memory ID is acquired using ipmctl and generates test ID table；
The health status of the AEP memory is retrieved according to the AER memory ID；
The quantity of AEP memory is retrieved according to the AEP memory test ID table；
The MD5 value of the spatial data block of the AEP memory is retrieved according to the AEP memory ID.
5. the method according to claim 1, wherein described obtain institute according to initial parameter and the test parameter
The performance state for stating AEP memory includes:
Judge whether AEP memory test parameter is consistent with initial parameter:
It is then to determine that AEP memory is normal；
It is no, then determine AEP memory abnormal and saves error-logging information.
6. a kind of AEP memory DC test device, which is characterized in that described device includes:
Parameter set unit is configured to setting AEP memory initial parameter；
Start-up unit is controlled, is configured to boot up the tester table equipped with AEP memory using control machine；
Parameter scanning unit is configured to scan the test parameter of the AEP memory；
Performance acquiring unit is configured to obtain the performance of the AEP memory according to the initial parameter and the test parameter
State；
Power-off operation unit is configured to carry out power-off operation to the tester table using script.
7. device according to claim 6, which is characterized in that the parameter set unit includes:
Initial acquisition module is configured to using ipmctl acquisition AEP memory ID and generates ID table；
First setup module is configured to obtain AEP memory initial number according to the AEP memory ID table；
Second setup module is configured to obtain AEP memory initial health according to the AEP memory ID；
Third setup module is configured to be re-created the spatial data block of AEP memory using ndctl and obtains the space number
According to the initial MD5 value of block.
8. device according to claim 6, which is characterized in that the control start-up unit includes:
State acquisition module is configured to obtain tested board power supply status；
Condition judgment module is configured to judge whether tested board power supply is in close state；
Starting module is controlled, is configured to send the tested board energization booting of power-on instruction control；
Circulation obtains module, is configured to circulation and obtains tested board power supply status operation.
9. device according to claim 6, which is characterized in that the parameter scanning unit includes:
Acquisition module is tested, be configured to using ipmctl acquisition AEP memory ID and generates test ID table；
Status retrieval module is configured to retrieve the health status of the AEP memory according to the AER memory ID；
Quantity retrieval module is configured to retrieve the quantity of AEP memory according to the AEP memory test ID table；
Parameter search module is configured to retrieve the MD5 value of the spatial data block of the AEP memory according to the AEP memory ID.
10. device according to claim 6, which is characterized in that the performance acquiring unit includes:
Parameter judgment module is configured to judge whether AEP memory test parameter is consistent with initial parameter；
Normal determination module is configured to determine that AEP memory is normal；
Abnormal determination module is configured to determine AEP memory abnormal and saves error-logging information.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109918897A (en) * | 2019-02-27 | 2019-06-21 | 苏州浪潮智能科技有限公司 | A kind of password authentification test method and system based on AEP memory |
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Application publication date: 20190118 |