CN109239584A - Detect the circuit of pin floating state - Google Patents
Detect the circuit of pin floating state Download PDFInfo
- Publication number
- CN109239584A CN109239584A CN201811228671.8A CN201811228671A CN109239584A CN 109239584 A CN109239584 A CN 109239584A CN 201811228671 A CN201811228671 A CN 201811228671A CN 109239584 A CN109239584 A CN 109239584A
- Authority
- CN
- China
- Prior art keywords
- pin
- measured
- voltage
- switch
- comparator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007667 floating Methods 0.000 title claims abstract description 18
- 235000013399 edible fruits Nutrition 0.000 claims description 2
- 239000007787 solid Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 17
- 238000001514 detection method Methods 0.000 description 12
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 6
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 6
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000005611 electricity Effects 0.000 description 5
- 230000005283 ground state Effects 0.000 description 4
- 238000007689 inspection Methods 0.000 description 4
- 101000716809 Homo sapiens Secretogranin-1 Proteins 0.000 description 3
- 102100020867 Secretogranin-1 Human genes 0.000 description 3
- LFERELMXERXKKQ-NYTQINMXSA-N cpad Chemical compound NC(=O)C1=CC=CC([C@H]2[C@@H]([C@@H](O)[C@H](COP([O-])(=O)O[P@@](O)(=O)OC[C@H]3[C@@H]([C@@H](O)[C@@H](O3)N3C4=NC=NC(N)=C4N=C3)O)O2)O)=[NH+]1 LFERELMXERXKKQ-NYTQINMXSA-N 0.000 description 3
- 230000007257 malfunction Effects 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- 238000003466 welding Methods 0.000 description 3
- 102100038026 DNA fragmentation factor subunit alpha Human genes 0.000 description 2
- 102100038023 DNA fragmentation factor subunit beta Human genes 0.000 description 2
- 101100277639 Homo sapiens DFFB gene Proteins 0.000 description 2
- 101000950906 Homo sapiens DNA fragmentation factor subunit alpha Proteins 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The present invention provides a kind of circuit for detecting pin floating state, comprising: charge/discharge unit connects pin to be measured, for being the pin charge or discharge to be measured；The comparing unit being connected with the charge/discharge unit, for receiving voltage of the pin to be measured under charged state or discharge condition, and voltage and first predetermined voltage of the pin to be measured under the charged state, obtain the first comparison result, and voltage and second predetermined voltage of the pin to be measured under the discharge condition, obtain the second comparison result.It can detecte out whether pin is in vacant state by circuit disclosed above.
Description
Technical field
The present invention relates to technical field of integrated circuits more particularly to a kind of circuits for detecting pin floating state.
Background technique
Pin is the connection jaws drawn from integrated circuit with peripheral circuit, and all pins just constitute connecing for this block chip
Mouthful.Chip by melt tin by pin and printed circuit board, i.e. pad solder in PCB circuit board together.
In the prior art, since pad and component solderability are poor, printing parameter is incorrect, reflow welding temperature and heating speed
It spends the factors such as improper and is likely to result in rosin joint.Rosin joint will cause chip pin open circuit, so that pin is vacant state.If pin
In vacant state, then can be caused that supply voltage can be charged to by weak current but also discharge into ground voltage.If drawn
Foot is that welding is good, then having external power supply or ground or resistance etc., would not be caused be charged to by weak current
Supply voltage can discharge into ground voltage again.
Disadvantage of the prior art is that in the batch production of the electronic equipments such as mobile phone, plate, due to chip on pcb board
Numerous and intensive, factory can not effectively monitor the welding quality situation of each pin.For the chip of rosin joint, can only lean on whole
The electric performance test of machine screens out.And if the pin of rosin joint is not provided with pullup or pulldown resistance, it is in vacant state, then often
It is secondary power on after the pin state be all it is uncertain, voltage value may be 0 to an arbitrary value between supply voltage, because
Can work when this chip is, when and cannot work, so there is the possibility in the pin missing inspection of vacant state, erroneous detection.
Summary of the invention
Based on above-mentioned the deficiencies in the prior art, the invention proposes a kind of circuits for detecting pin floating state, to realize
Pin in vacant state detected.
To achieve the goals above, it is proposed that scheme it is as follows:
The invention discloses a kind of circuits for detecting pin floating state, comprising:
Charge/discharge unit connects pin to be measured, for being the pin charge or discharge to be measured；
The comparing unit being connected with the charge/discharge unit, for receiving the pin to be measured in charged state or electric discharge shape
Voltage under state, and voltage and first predetermined voltage of the pin to be measured under the charged state, obtain the first ratio
Compared with as a result, and voltage and second predetermined voltage of the pin to be measured under the discharge condition, obtain second and compare
As a result.
Optionally, the charge/discharge unit, comprising:
Power supply, first switch, the first current source, second switch and the second current source；Wherein:
One end of first current source connects the power supply, and the other end connects the first switch, the first switch
The other end connect the second switch, the other end of the second switch connects second current source, second electric current
The other end in source connects ground；The first switch connects the pin to be measured and the comparison with the public end of the second switch
Unit.
Optionally, the comparing unit, comprising:
First comparator and the second comparator；Wherein:
The first input end of the first comparator inputs the voltage of the pin to be measured, the second input terminal input described the
The output end of one predetermined voltage, the first comparator exports first comparison result；
Second input terminal of second comparator inputs the voltage of the pin to be measured, first input end input described the
The output end of two predetermined voltages, second comparator exports second comparison result.
Optionally, further includes:
First trigger and the second trigger；Wherein:
The data input pin of first trigger connects the output end of the first comparator, first trigger
Clock input level signal, output end output the first triggering result of first trigger；
The data input pin of second trigger connects the output end of second comparator, second trigger
Clock input level signal, output end output the second triggering result of second trigger.
Optionally, further includes:
Control door and the controlling brancher being connect with the control door；
The control door receives the first triggering result and second triggering respectively as a result, if the first triggering knot
Fruit and the second triggering result meet pre-provisioning request, then the control door controls the controlling brancher work；
Wherein, the pre-provisioning request is for reflecting that the pin to be measured is in vacant state；
The controlling brancher is used to the pin to be measured be pulled upward to fixed voltage or power supply or by the pin to be measured
Pull down to ground.
Optionally, the controlling brancher, comprising:
Third switch and resistance；Wherein:
The first end of the resistance connects the pin to be measured, and the control terminal of the third switch connects the control door,
The first end of third switch connects the second end of the resistance, the second end ground connection of the third switch, connect power supply or
Connect fixed voltage.
It can be seen from the above technical scheme that in the circuit of detection pin floating state provided by the invention, by filling
Discharge cell carries out charge or discharge to pin to be measured, and by the comparing unit being connected with charge/discharge unit, comparing unit is received
Voltage of the pin to be measured under charged state or discharge condition, and the voltage and first of pin more to be measured in the charge state is in advance
Constant voltage obtains the first comparison result, and the voltage and the second predetermined voltage of pin more to be measured in the discharged condition, obtains
Second comparison result.It can be seen that the circuit in the present invention can detecte out whether pin is in outstanding by two comparison results
Dummy status avoids the pin in vacant state by factory's missing inspection, erroneous detection, can work sometimes after chip factory, be unable to work sometimes
The problem of making.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of invention for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of circuit diagram for detecting pin floating state disclosed by the embodiments of the present invention；
Fig. 2 is the circuit diagram of another detection pin floating state disclosed by the embodiments of the present invention；
Fig. 3 is electrifying timing sequence figure disclosed by the embodiments of the present invention；
Fig. 4 is the circuit diagram of another detection pin floating state disclosed by the embodiments of the present invention；
Fig. 5 is the circuit diagram of another detection pin floating state disclosed by the embodiments of the present invention；
Fig. 6 is the circuit diagram of another detection pin floating state disclosed by the embodiments of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
In the prior art, since rosin joint causes pin open, so that pin is in vacant state, and the pin is not set
Pullup or pulldown resistance is set, then the voltage of pin is uncertain, it may be possible to 0 to any electricity between supply voltage
The case where pressing, and can not monitoring each pin when factory's volume production, so there is the pin missing inspection in vacant state, erroneous detection
Possibility, cause chip that can work sometimes, cannot work sometimes.
Inventor the study found that if pin is in vacant state can be caused that electricity can be charged to by weak current
Source can discharge into ground again.
In view of the above-mentioned problems, the invention discloses a kind of circuits for detecting pin floating state.
Refering to fig. 1, the embodiment of the invention discloses a kind of circuits for detecting pin floating state, comprising:
Charge/discharge unit 101 and comparing unit 102.
Wherein, charge/discharge unit 101 connects pin PAD_A to be measured, and charge/discharge unit 101 is connected with comparing unit 102, uses
In for the pin PAD_A charge or discharge to be measured.
Optionally, a kind of embodiment of charge/discharge unit 101, as shown in Fig. 2, charge/discharge unit 101 includes: power supply
VCC, first switch S1, the first current source Iref1, second switch S2 and the second current source Iref2.First current source Iref1's
One end connects power supply VCC, and the other end connects first switch S1, and the other end of first switch S1 connects second switch S2, and described the
The other end that the other end of two switch S2 connects the second current source Iref2, the second current source Iref2 connects ground；First opens
It closes S1 and connects pin PAD_A and comparing unit 102 to be measured with the public end of second switch S2.
In conjunction with shown in Fig. 2 and Fig. 3, the control signal of first switch S1 is CHG signal, and within the t1 period, CHG signal is
High level, control first switch S1 closure, first switch S1 conducting.Power supply VCC passes through the first current source Iref1 and first switch
S1 connects pin PAD_A to be measured.When first switch S1 is closed, the first current source Iref1 charges to pin PAD_A to be measured.First
Current source Iref1 can be as being mos pipe, for the electric current Iref1 that 1 to 1 duplication external circuit generates, and to pin to be measured
PAD_A exports electric current Iref1, charges to pin PAD_A to be measured.If pin PAD_A to be measured is in vacant state, in power supply
VCC is connected in the state of pin PAD_A to be measured, then the first current source Iref1 can be within the t1 time by pin PAD_A's to be measured
Voltage is charged to more than the first predetermined voltage VREF1, and the voltage that comparing unit 102 compares pin PAD_A to be measured is filled height.
In conjunction with shown in Fig. 2 and Fig. 3, the control signal of second switch S2 is DISCHG signal, within the t2 period, DISCHG
Signal is high level, control second switch S2 closure, second switch S2 conducting.Pin PAD_A to be measured by second switch S2 and
Second current source Iref2 ground connection.When second switch S2 is closed, the second current source Iref2 discharges to pin PAD_A to be measured.Second
Current source Iref2, for the electric current Iref2 that 1 to 1 duplication external circuit generates, can give pin PAD_ to be measured as being mos pipe
A electric discharge.If pin PAD_A to be measured is in vacant state, in the state that power supply VCC connects pin PAD_A to be measured, then the
The voltage of pin PAD_A to be measured can be put into lower than the second predetermined voltage VREF2 by two current source Iref2 within the t2 time, be compared
The voltage that unit 102 compares pin PAD_A to be measured has been lowered.
Wherein, comparing unit 102 is connected with charge/discharge unit 101, for receive pin PAD_A to be measured in charged state or
Voltage under discharge condition, and the voltage and the first predetermined voltage VREF1 of pin PAD_A more to be measured in the charge state, obtain
To the first comparison result, and the voltage and the second predetermined voltage VREF2 of pin PAD_A more to be measured in the discharged condition, obtain
To the second comparison result.Whether hanging it can detecte out pin by circuit disclosed above.
Optionally, a kind of embodiment of comparing unit 102, as shown in Fig. 2, comparing unit 102 includes first comparator
With the second comparator；The first input end of first comparator inputs the voltage of pin PAD_A to be measured, the second input terminal input first
The output end of predetermined voltage VREF1, first comparator export the first comparison result；Second comparator the second input terminal input to
The voltage of pin PAD_A is surveyed, first input end inputs the second predetermined voltage VREF2, the output end output second of the second comparator
Comparison result.
Wherein, the first predetermined voltage VREF1 is the reference voltage close to supply voltage VCC, and the second predetermined voltage VREF2 is
Close to the reference voltage of ground voltage.If pin PAD_A to be measured is Cpad to the total capacitance of ground and power supply, it is closed first switch
The time of S1 is t1, and the time of closure second switch S2 is t2, then, t1 need to meet t1 > Cpad*VREF1/Iref1, and t2 need to expire
Sufficient t2 > Cpad*VREF2/Iref2.It is also not complete to the charge and discharge process of pin PAD_A to be measured if t1 the and t2 time is too short
At the judging result inaccuracy of comparator.
It should be noted that referring to Fig.2, closure first switch S1, meets power supply VCC and is accessed by the first current source Iref1
To pin PAD_A to be measured.Due to there is electric current to flow into pin PAD_A to be measured, the electric current of pin PAD_A to be measured can change, electricity
Corresponding change can also occur for pressure.The first input end connection first switch S1 of first comparator is for connecting pin PAD_A to be measured
Port, then can receive pin PAD_A to be measured because accessing the voltage that generates of power supply by the first current source Iref1, first
The received voltage of first input end and the received first predetermined voltage VREF1 of the second input terminal are compared by comparator, are obtained
First comparison result.
It is closed second switch S2, the second current source Iref2 of ground connection is accessed into pin PAD_A to be measured.Due to there is electric current
Pin PAD_A to be measured is flowed out, the electric current of pin PAD_A to be measured can change at this time, and corresponding change can also occur for voltage.Second
The second input terminal connection second switch S2 of comparator is used to connect the port of pin PAD_A to be measured, then can receive to be measured draw
Foot PAD_A is because of the voltage generated by the second current source Iref2 ground connection, and the second comparator is by the received voltage of the second input terminal
It is compared with received second predetermined voltage of first input end, obtains the second comparison result.
It is understood that in the pin PAD_A to be measured in the state of accessing power supply, first comparator, compare to
Whether the voltage for surveying pin PAD_A, which is filled height, is arrived more than the first predetermined voltage, in shape of the pin PAD_A to be measured on access ground
Under state, whether the voltage of the second comparator, pin PAD_A more to be measured is lowered to lower than the second predetermined voltage.
It should be noted that the second comparator in the setting of input terminal with first comparator on the contrary, as shown in Fig. 2,
One comparator is that normal phase input end inputs voltage of the pin PAD_A to be measured in the case where access power supply status, and inverting input terminal inputs the
One predetermined voltage VREF1, the second comparator are the voltage that inverting input terminal inputs pin PAD_A to be measured, normal phase input end input
Second predetermined voltage VREF2.It is higher than the first predetermined voltage in voltage of the pin PAD_A to be measured in the case where accessing power supply status
When, the first comparison result that first comparator obtains is high level, otherwise is low level；Similarly, in the pin PAD_A to be measured
When voltage under ground state is lower than the second predetermined voltage, the second comparison result that the second comparator obtains is low level, instead
Be high level.By identifying the type of the first comparison result and the second comparison result, then whether pin to be measured can be determined
In vacant state.It can be said that if the first comparison result of first comparator output is high level, the output of the second comparator
Second comparison result is that the first comparison result of high level or first comparator output be low level, what the second comparator exported
Second comparison result is low level, then it is high to close to supply voltage but also being lowered to illustrate that pin PAD_A to be measured can be filled
Close to ground voltage, judge that pin PAD_A to be measured is vacant state.
Certainly, the connection type of two input terminals of first comparator and the second comparator is not limited in shown in Fig. 2, can
Think other modes, such as: the inverting input terminal of first comparator inputs the pin PAD_A to be measured in the case where accessing power supply status
Voltage, normal phase input end input the first predetermined voltage；The normal phase input end of second comparator inputs the pin PAD_A to be measured
Voltage under ground state, inverting input terminal input the second predetermined voltage.
It should be noted that first comparator can also be used for electricity of the pin PAD_A more to be measured in the case where accessing power supply status
Pressure, the second comparator can also be used for voltage of the pin PAD_A more to be measured under ground state, and the embodiment of the present invention does not limit
The usage mode of first comparator and the second comparator.The output result of first comparator and the output result energy of the second comparator
Enough representing pin to be measured can be filled high to close to supply voltage but also being discharged into close to ground voltage, be not limited solely to
The result exported twice is all high level or low level, and the embodiment of the present invention is not limited to above-mentioned implementation.
The embodiment of the present invention carries out pin PAD_A to be measured by the charge/discharge unit 101 being connected with pin PAD_A to be measured
Charge or discharge, by the comparing unit 102 being connected with charge/discharge unit 101, comparing unit 102 receives pin PAD_A to be measured
Voltage under charged state or discharge condition, and the voltage and first of pin PAD_A more to be measured in the charge state makes a reservation for
Voltage VREF1 obtains the first comparison result, and the voltage and the second predetermined voltage of pin more to be measured in the discharged condition
VREF2 obtains the second comparison result.It can be seen that the circuit in the present invention can detecte out pin by two comparison results
Whether it is in vacant state, avoids the pin in vacant state by factory's missing inspection, erroneous detection, can work sometimes after chip factory,
Sometimes inoperable problem.
Refering to Fig. 4, the embodiment of the invention discloses the circuits of another detection pin floating state, comprising:
Charge/discharge unit 401, first comparator, the second comparator, the first trigger and the second trigger.
Charge/discharge unit 401 is identical as the implementation procedure and principle of charge/discharge unit 101 in Fig. 1 herein, here no longer
It repeats.The implementation procedure and original of first comparator and the second comparator and first comparator and the second comparator in Fig. 2 herein
Manage identical, which is not described herein again.
The output end of the data input pin connection first comparator of first trigger, the input end of clock of the first trigger connect
Receive level signal CHGB, the first triggering of output end output result Q1 of the first trigger；
The data input pin of second trigger connects the output end of the second comparator, and the input end of clock of the second trigger connects
Receive level signal DISCHGB, the second triggering of output end output result Q2 of the second trigger.
Optionally, in conjunction with shown in Fig. 3 and Fig. 4, the first trigger level signal CHGB rising edge time DFF1 to
One comparator outputs level signals are acquired.The next state of principle based on trigger, trigger depends on level signal CHGB
Rising edge time DFF1 arrive before data input pin state.So if first comparator output is high level
Signal, then the output of the first trigger is also high level signal.Similarly, the second trigger is in the upper of level signal DISCHGB
It rises and the second comparator outputs level signals is acquired along moment DFF2.The next state of principle based on trigger, trigger takes
The certainly state of the data input pin before the rising edge time DFF2 of level signal DISCHGB arrives.So if the second ratio
What it is compared with device output is high level signal, then the output of the second trigger is also high level signal.
Principle of the embodiment of the present invention based on trigger, the first trigger and the second trigger make level signal by dry
A possibility that disturbing reduction can maintain the state of level signal the long period, convenient for comparing pin charged state and discharge condition
Result.
Refering to Fig. 5, the embodiment of the invention discloses the circuits of another detection pin floating state, comprising:
Charge/discharge unit 501, first comparator, the second comparator, the first trigger, the second trigger, control door and with
Control the controlling brancher of door connection.
Charge/discharge unit 501 is identical as the implementation procedure and principle of charge/discharge unit 101 in Fig. 1 herein, here no longer
It repeats.The implementation procedure and original of first comparator and the second comparator and first comparator and the second comparator in Fig. 2 herein
Manage identical, which is not described herein again.First trigger and the second trigger in first trigger and the second trigger and Fig. 4 herein
Implementation procedure and principle are identical, and which is not described herein again.
As shown in figure 5, control door and the controlling brancher being connect with control door.
Optionally, control door receives the first triggering result and the second triggering as a result, if the first triggering result and second respectively
Triggering result meets pre-provisioning request, then controls door control controlling brancher work.
Wherein, pre-provisioning request is for reflecting that pin PAD_A to be measured is in vacant state；Controlling brancher by be measured for drawing
Foot PAD_A pulls down to ground.
It should be noted that as shown in figure 5, if control door is exported with door, received first trigger of control door
The case where first triggering result is high level, and the second triggering result for controlling the received second trigger output of door is high level
Under, the level signal of control door output is high level signal, illustrates that pin PAD_A to be measured can be filled high arrive close to supply voltage
It can be lowered to again close to ground voltage, pin PAD_A to be measured is in vacant state, and controlling door manipulation controlling brancher at this time will be to
The voltage for surveying pin PAD_A pulls down to ground.
Wherein, controlling brancher includes: third switch S3 and resistance Rpd.
Wherein, the first end of resistance Rpd connects pin PAD_A to be measured, and the control terminal of third switch S3 connects the control
Door, the first end of the third switch S3 connect the second end of the resistance Rpd, the second end ground connection of the third switch S3.
When the first triggering result and the second triggering result meet pre-provisioning request, then controls door and control controlling brancher work
When, third switch S3 closure, pin PAD_A to be measured pulls down to ground by resistance Rpd, and pin PAD_A to be measured is determining later
Ground state.
The embodiment of the present invention by control door receive first triggering result and second triggering as a result, if first triggering result and
Second triggering result meets pre-provisioning request, then controls door control controlling brancher work.Controlling brancher is by pulling down to fixed voltage
Determine the voltage of the pin in vacant state.If third switch S3 is closed, ground connection is so that pin works normally, even if pin
It is vacant state, then chip can also work normally.
Refering to Fig. 6, the embodiment of the invention discloses the circuits of another detection pin floating state, comprising:
Charge/discharge unit 601, first comparator, the second comparator, the first trigger, the second trigger, control door and with
Control the controlling brancher of door connection.
Charge/discharge unit 601 is identical as the implementation procedure and principle of charge/discharge unit 101 in Fig. 1 herein, here no longer
It repeats.The implementation procedure and original of first comparator and the second comparator and first comparator and the second comparator in Fig. 2 herein
Manage identical, which is not described herein again.First trigger and the second trigger in first trigger and the second trigger and Fig. 4 herein
Implementation procedure and principle are identical, and which is not described herein again.Control door and implementation procedure and principle phase that door is controlled in Fig. 5 herein
Together, which is not described herein again.
Wherein, controlling brancher is used to pin PAD_A to be measured being pulled upward to power supply.Optionally, controlling brancher will be in addition to will be described
Pin PAD_A to be measured is pulled upward to power supply, can also be pulled upward to fixed voltage.
It should be noted that as shown in fig. 6, if control door is exported with door, received first trigger of control door
The case where first triggering result is high level, and the second triggering result for controlling the received second trigger output of door is high level
Under, the level signal of control door output is high level signal, illustrates that pin PAD_A to be measured can be filled high arrive close to supply voltage
It can be lowered to again close to ground voltage, pin PAD_A to be measured is in vacant state, and controlling door manipulation controlling brancher at this time will be to
The voltage for surveying pin PAD_A is pulled upward to power supply.
Wherein, controlling brancher includes: third switch S3 and resistance Rpu.
Wherein, the first end of resistance Rpu connects pin PAD_A to be measured, and the control terminal of third switch S3 connects the control
Door, the first end of the third switch S3 connect the second end of the resistance Rpu, and the second end of the third switch S3 connects electricity
Source VCC.When the first triggering result and the second triggering result meet pre-provisioning request, then controls door and control controlling brancher work
When, third switch S3 closure, pin PAD_A to be measured is drawn by resistance Rpu to power supply, and pin PAD_A to be measured is fixed later
Pull-up state.
It should be noted that there are many kind, not only Fig. 5 of the embodiment of the present invention and Fig. 6 for the mode of determining pin voltage
Embodiment.
The embodiment of the present invention by control door receive first triggering result and second triggering as a result, if first triggering result and
Second triggering result meets pre-provisioning request, then controls door control controlling brancher work.Controlling brancher is by being pulled upward to fixed voltage
Determine the voltage of the pin in vacant state.If third switch S3 is closed, connects power supply and make pin cisco unity malfunction, i.e.,
Making pin is vacant state, then chip is cisco unity malfunction, or chip can issue alarm signal at this time, and factory can
With by electric performance test discovery, chip is cisco unity malfunction or has found alarm signal, this avoid drawing for rosin joint
Foot factory.
It should be noted that, in this document, relational terms such as first and second and the like are used merely to a reality
Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation
In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to
Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those
Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment
Intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that
There is also other identical elements in process, method, article or equipment including the element.
The foregoing description of the disclosed embodiments enables those skilled in the art to implement or use the present invention.
Various modifications to these embodiments will be readily apparent to those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, of the invention
It is not intended to be limited to the embodiments shown herein, and is to fit to and the principles and novel features disclosed herein phase one
The widest scope of cause.
Claims (6)
1. a kind of circuit for detecting pin floating state characterized by comprising
Charge/discharge unit connects pin to be measured, for being the pin charge or discharge to be measured；
The comparing unit being connected with the charge/discharge unit, for receiving the pin to be measured under charged state or discharge condition
Voltage, and voltage and first predetermined voltage of the pin to be measured under the charged state obtains first and compares knot
Fruit, and voltage and second predetermined voltage of the pin to be measured under the discharge condition, obtain the second comparison result.
2. circuit according to claim 1, which is characterized in that the charge/discharge unit, comprising:
Power supply, first switch, the first current source, second switch and the second current source；Wherein:
One end of first current source connects the power supply, and the other end connects the first switch, the first switch it is another
One end connects the second switch, and the other end of the second switch connects second current source, second current source
Other end connection ground；The first switch connects the pin to be measured and the relatively list with the public end of the second switch
Member.
3. circuit according to claim 1, which is characterized in that the comparing unit, comprising:
First comparator and the second comparator；Wherein:
The first input end of the first comparator inputs the voltage of the pin to be measured, and the second input terminal input described first is pre-
The output end of constant voltage, the first comparator exports first comparison result；
Second input terminal of second comparator inputs the voltage of the pin to be measured, and first input end input described second is pre-
The output end of constant voltage, second comparator exports second comparison result.
4. circuit according to claim 3, which is characterized in that further include:
First trigger and the second trigger；Wherein:
The data input pin of first trigger connects the output end of the first comparator, the clock of first trigger
Input terminal receives level signal, output end output the first triggering result of first trigger；
The data input pin of second trigger connects the output end of second comparator, the clock of second trigger
Input terminal receives level signal, output end output the second triggering result of second trigger.
5. circuit according to claim 4, which is characterized in that further include:
Control door and the controlling brancher being connect with the control door；
The control door receive respectively it is described first triggering result and it is described second triggering as a result, if it is described first triggering result and
The second triggering result meets pre-provisioning request, then the control door controls the controlling brancher work；
Wherein, the pre-provisioning request is for reflecting that the pin to be measured is in vacant state；
The controlling brancher is used to for the pin to be measured being pulled upward to fixed voltage or power supply or pulls down the pin to be measured
To ground.
6. circuit according to claim 5, which is characterized in that the controlling brancher, comprising:
Third switch and resistance；Wherein:
The first end of the resistance connects the pin to be measured, and the control terminal of the third switch connects the control door, described
The first end of third switch connects the second end of the resistance, and the second end ground connection of the third switch connects power supply or connects solid
Constant voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811228671.8A CN109239584A (en) | 2018-10-22 | 2018-10-22 | Detect the circuit of pin floating state |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811228671.8A CN109239584A (en) | 2018-10-22 | 2018-10-22 | Detect the circuit of pin floating state |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109239584A true CN109239584A (en) | 2019-01-18 |
Family
ID=65081026
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811228671.8A Pending CN109239584A (en) | 2018-10-22 | 2018-10-22 | Detect the circuit of pin floating state |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109239584A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111835049A (en) * | 2019-04-22 | 2020-10-27 | 北京小米移动软件有限公司 | Charging terminal, method and device |
| CN112485654A (en) * | 2020-11-16 | 2021-03-12 | 上海唯捷创芯电子技术有限公司 | Chip port state detection circuit, chip and communication terminal |
| CN113589202A (en) * | 2020-04-30 | 2021-11-02 | 华为技术有限公司 | Detection circuit and detection device for charging interface |
| CN113777537A (en) * | 2021-08-30 | 2021-12-10 | 上海芯凌微电子有限公司 | Circuit and method for detecting correct access of chip pin capacitor |
| CN114184936A (en) * | 2021-11-30 | 2022-03-15 | 上海儒竞智控技术有限公司 | Chip continuous welding self-detection method, system, medium and chip |
| CN117368701A (en) * | 2023-12-07 | 2024-01-09 | 芯洲科技(北京)股份有限公司 | Pad detection circuit |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104991184A (en) * | 2015-07-29 | 2015-10-21 | 英特格灵芯片(天津)有限公司 | On-chip tri-state signal detecting apparatus and detecting method thereof |
| CN105891651A (en) * | 2015-01-16 | 2016-08-24 | 飞思卡尔半导体公司 | Low power open circuit detection system |
| CN106226685A (en) * | 2016-09-10 | 2016-12-14 | 苏州创必成电子科技有限公司 | Multi input data mode parallel detection circuit with on-off control |
| CN107300653A (en) * | 2016-04-15 | 2017-10-27 | 英飞凌科技股份有限公司 | Open-circuited load detection in output stage |
| CN208969206U (en) * | 2018-10-22 | 2019-06-11 | 上海艾为电子技术股份有限公司 | Detect the circuit of pin floating state |
-
2018
- 2018-10-22 CN CN201811228671.8A patent/CN109239584A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105891651A (en) * | 2015-01-16 | 2016-08-24 | 飞思卡尔半导体公司 | Low power open circuit detection system |
| CN104991184A (en) * | 2015-07-29 | 2015-10-21 | 英特格灵芯片(天津)有限公司 | On-chip tri-state signal detecting apparatus and detecting method thereof |
| CN107300653A (en) * | 2016-04-15 | 2017-10-27 | 英飞凌科技股份有限公司 | Open-circuited load detection in output stage |
| CN106226685A (en) * | 2016-09-10 | 2016-12-14 | 苏州创必成电子科技有限公司 | Multi input data mode parallel detection circuit with on-off control |
| CN208969206U (en) * | 2018-10-22 | 2019-06-11 | 上海艾为电子技术股份有限公司 | Detect the circuit of pin floating state |
Non-Patent Citations (2)
| Title |
|---|
| 张宁春 等, 《电工电子实习》, no. 1, pages 90 * |
| 梁淼 等: "《数字电子技术》", vol. 1, 31 July 1998, 机械工业出版社, pages: 181 - 182 * |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111835049A (en) * | 2019-04-22 | 2020-10-27 | 北京小米移动软件有限公司 | Charging terminal, method and device |
| CN111835049B (en) * | 2019-04-22 | 2022-06-24 | 北京小米移动软件有限公司 | Charging terminal, method and device |
| CN113589202A (en) * | 2020-04-30 | 2021-11-02 | 华为技术有限公司 | Detection circuit and detection device for charging interface |
| CN113589202B (en) * | 2020-04-30 | 2023-01-13 | 华为技术有限公司 | Detection circuit and detection device for charging interface |
| CN112485654A (en) * | 2020-11-16 | 2021-03-12 | 上海唯捷创芯电子技术有限公司 | Chip port state detection circuit, chip and communication terminal |
| WO2022100756A1 (en) * | 2020-11-16 | 2022-05-19 | 上海唯捷创芯电子技术有限公司 | Chip port state detection circuit, chip, and communication terminal |
| CN113777537A (en) * | 2021-08-30 | 2021-12-10 | 上海芯凌微电子有限公司 | Circuit and method for detecting correct access of chip pin capacitor |
| CN114184936A (en) * | 2021-11-30 | 2022-03-15 | 上海儒竞智控技术有限公司 | Chip continuous welding self-detection method, system, medium and chip |
| CN117368701A (en) * | 2023-12-07 | 2024-01-09 | 芯洲科技(北京)股份有限公司 | Pad detection circuit |
| CN117368701B (en) * | 2023-12-07 | 2024-03-15 | 芯洲科技(北京)股份有限公司 | Pad detection circuit |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109239584A (en) | Detect the circuit of pin floating state | |
| CN109239583A (en) | Detect the circuit of pin floating state | |
| CN208969205U (en) | Detect the circuit of pin floating state | |
| US10983152B2 (en) | USB data pin impedance detection | |
| US9128691B2 (en) | Method and terminal for selecting internal circuit according to USB interface status | |
| CN101373893B (en) | Over temperature protection circuit for battery | |
| CN103545882B (en) | Battery in-situ test method and device and battery charge system | |
| US7629775B2 (en) | Battery connection detection circuit | |
| CN101989749B (en) | Charging device and charging method | |
| CN101102119B (en) | A charging detection circuit of appliance device and charging detection method | |
| CN208969206U (en) | Detect the circuit of pin floating state | |
| CN103677449B (en) | The method of adjustment of a kind of touch screen rate of scanning and electric terminal | |
| CN100574041C (en) | Charger type distinguishing system, terminal charging method, terminal and charger | |
| CN106020176B (en) | A kind of CC logic controls chip low-power consumption connecting detection method and structure | |
| CN100438202C (en) | Battery charger and charge control method | |
| CN109374148A (en) | A kind of temperature measuring device and measurement method | |
| CN109217425A (en) | A kind of charger circuit and its intelligent charge control method | |
| CN104539274A (en) | Reset circuit and WiFi communication system | |
| CN110429700A (en) | A kind of charge-discharge circuit for ammeter | |
| CN108683236A (en) | A kind of mobile terminal OTG charging methods and device | |
| CN111537915A (en) | Broken string detection circuitry and treasured that charges of polymorphic type charging wire | |
| CN106600853A (en) | Anti-jittering circuit used for charging or signal transmission of charging base, and charging base | |
| CN108594626B (en) | Power-down timing method, circuit and electronic equipment thereof | |
| CN206640354U (en) | Can accumulative power source internal rechargeable battery charging times hand-held mobile power supply | |
| CN206096382U (en) | Many buttons switch detection circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Country or region after: China Address after: Room 1201, No.2, Lane 908, Xiuwen Road, Minhang District, Shanghai, 201199 Applicant after: SHANGHAI AWINIC TECHNOLOGY Co.,Ltd. Address before: Room 303-39, building 33, 680 Guiping Road, Xuhui District, Shanghai 200233 Applicant before: SHANGHAI AWINIC TECHNOLOGY Co.,Ltd. Country or region before: China |