CN109194414B - System for testing parameters of Lora radio frequency module - Google Patents
System for testing parameters of Lora radio frequency module Download PDFInfo
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- CN109194414B CN109194414B CN201811094977.9A CN201811094977A CN109194414B CN 109194414 B CN109194414 B CN 109194414B CN 201811094977 A CN201811094977 A CN 201811094977A CN 109194414 B CN109194414 B CN 109194414B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/101—Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof
- H04B17/102—Power radiated at antenna
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/29—Performance testing
Abstract
The invention discloses a system for testing parameters of a Lora radio frequency module, and belongs to the technical field of Lora testing. The system for testing the parameters of the Lora radio frequency module comprises a current detection module, a radio frequency detection module and a small system circuit. The current detection module is used for detecting the sleep current, the maximum transmitting current, the receiving current and the standby current of the Lora radio frequency module; the radio frequency detection module is used for detecting the TX transmitting power of the Lora radio frequency module and the receiving sensitivity of the RX; the small system circuit is used for sampling and data processing of the current and controlling the operation of the whole test system. Parameters of the Lora radio frequency module are indirectly tested by means of a discrete relation table between receiving sensitivity and power, and a traditional radio frequency detection mode by means of a shielding box and a frequency spectrometer is eliminated; the high-end sampling circuit and the operational amplifier circuit are adopted for current detection, so that the functions of an upper computer are increased for convenience of industrialization and asset tracking, and the subsequent product tracking can be facilitated by recording the testing quantity, the reject ratio and the test report of each module.
Description
Technical Field
The invention relates to the technical field of Lora test, in particular to a system for testing parameters of a Lora radio frequency module.
Background
With the development of LPWAN technology and the marketization of internet of things technology, more and more capital and enterprises begin to establish their own ecosystem of internet of things. Lora is a new favorite of the open market of the Internet of things by virtue of the characteristics of ultra-low power consumption and long-distance communication; the construction that Ali, Tengxin, Chinese iron tower and China Unicom are added into the Lora network is performed in succession, so that the Lora network develops rapidly. Because of market increases to the demand of Lora radio frequency module, the detection efficiency's of Lora radio frequency module promotion will help greatly reduce manufacturing cost, reduces the threshold that the Lora module production was added to the small enterprise simultaneously.
The detection parameters of Lora mainly relate to low power consumption current, TX maximum transmitting power and Rx receiving sensitivity. For the detection of these parameters, the traditional module manufacturer detects the current by means of a digital multimeter, the frequency spectrograph or a special radio frequency power meter detects the maximum transmitting power, and the test of the receiving sensitivity needs to be carried out by means of a shielding box or in a shielding room. The test environment of the detection mode is complex to build, the number of related test instruments is large, and the test cost is high.
Disclosure of Invention
The invention aims to provide a system for testing parameters of a Lora radio frequency module, which is used for solving the problems of complex environment and high cost required by the conventional system for testing the parameters of the Lora radio frequency module.
In order to solve the technical problem, the invention provides a system for testing parameters of a Lora radio frequency module, which comprises a current detection module, a radio frequency detection module and a small system circuit, wherein the current detection module is used for detecting the current of the Lora radio frequency module; wherein the content of the first and second substances,
the current detection module is used for detecting the sleep current, the maximum emission current, the receiving current and the standby current of the Lora radio frequency module;
the radio frequency detection module is used for detecting the TX transmitting power of the Lora radio frequency module and the receiving sensitivity of the RX;
the small system circuit is used for sampling and data processing of the current and controlling the operation of the whole test system.
Optionally, the current detection module includes a first nA two-way relay U3, a second mA two-way relay U1, a third uA two-way relay U2, a first nA sampling resistor R11, a second mA sampling resistor R13, a third uA sampling resistor R12, a first operational amplifier chip U12, a second operational amplifier chip U14, and a third operational amplifier chip U13; wherein the content of the first and second substances,
two normally open terminals PIN4 and PIN5 of the first nA double-way relay U3 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of an MCU in the small system circuit, a normally open terminal PIN4 and PIN5 of the first nA double-way relay U3 are connected to one end of a first nA sampling resistor R11, the other end of the first nA sampling resistor R11 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the normally open terminal PIN4 and PIN5 are connected to the positive input of the first operational amplifier chip U36;
two normally open terminals PIN4 and PIN5 of the second mA two-way relay U1 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of the MCU in the small system circuit, the normally open terminals PIN4 and PIN5 of the second mA two-way relay U1 are connected to one end of a second mA sampling resistor R13, the other end of the second mA sampling resistor R13 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the second mA sampling resistor R13 is connected to the positive input of the first operational amplifier chip U12;
two normally open terminals PIN4 and PIN5 of the third uA double-way relay U2 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of an MCU in the small system circuit, a normally open terminal PIN4 and PIN5 of the third uA double-way relay U2 are connected to one end of a third uA sampling resistor R12, the other end of the third uA sampling resistor R12 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the third uA double-way relay U2 is connected to the positive input of the first operational amplifier chip U36;
the first operational amplifier chip U12 and the second operational amplifier chip U14 are connected to form a high impedance differential operational amplifier circuit, the third operational amplifier chip U13 is built into a doubled differential amplifier circuit, and the outputs of the first operational amplifier chip U12 and the second operational amplifier chip U14 are connected to the input of the third operational amplifier chip U13.
Optionally, the radio frequency detection module includes a Lora radio frequency module, a power divider, and a Lora reference module; the SPI communication pin of Lora radio frequency module is connected to MCU's in the small system circuit IO end, the radio frequency pin of Lora radio frequency module is connected to power distribution unit one end, and the SPI communication pin of Lora benchmark module is connected to MCU's in the small system circuit IO end, and the radio frequency pin of Lora benchmark module is connected to the power distribution unit other end.
Optionally, the small system circuit includes a minimum system circuit with STM32F407 as an MCU, a power supply circuit with RY3835 as a core, and an AD sampling reference voltage circuit with REF3030 as a core.
Optionally, the system for testing the parameters of the Lora radio frequency module further includes:
the upper computer display unit is used for displaying the test result and carrying out data interaction with the small system;
and the power supply module supplies power to the current detection module, the radio frequency detection module and the small system circuit.
The invention provides a system for testing parameters of a Lora radio frequency module, which comprises a current detection module, a radio frequency detection module and a small system circuit. The current detection module is used for detecting the sleep current, the maximum transmitting current, the receiving current and the standby current of the Lora radio frequency module; the radio frequency detection module is used for detecting the TX transmitting power of the Lora radio frequency module and the receiving sensitivity of the RX; the small system circuit is used for sampling and data processing of the current and controlling the operation of the whole test system. Parameters of the Lora radio frequency module are indirectly tested by means of a discrete relation table between receiving sensitivity and power, and a traditional radio frequency detection mode by means of a shielding box and a frequency spectrometer is eliminated; the high-end sampling circuit and the operational amplifier circuit are adopted for current detection, so that the functions of an upper computer are increased for convenience of industrialization and asset tracking, and the subsequent product tracking can be facilitated by recording the testing quantity, the reject ratio and the test report of each module.
Drawings
FIG. 1 is a schematic structural diagram of a system for testing parameters of a Lora radio frequency module according to the present invention;
FIG. 2 is a schematic diagram of a core circuit of the current sensing module;
FIG. 3 is a schematic diagram of a core circuit of the RF detection module;
fig. 4 is a core circuit schematic of a small system circuit.
Detailed Description
The following describes a system for testing parameters of a Lora rf module according to the present invention in detail with reference to the accompanying drawings and specific embodiments. Advantages and features of the present invention will become apparent from the following description and from the claims. It is to be noted that the drawings are in a very simplified form and are not to precise scale, which is merely for the purpose of facilitating and distinctly claiming the embodiments of the present invention.
Example one
The invention provides a system for testing parameters of a Lora radio frequency module, which has a structure shown in figure 1. The system for testing the parameters of the Lora radio frequency module comprises a current detection module 1, a radio frequency detection module 2 and a small system circuit 3. The current detection module 1 is used for detecting the sleep current, the maximum emission current, the receiving current and the standby current of the Lora radio frequency module; the radio frequency detection module 2 is used for detecting the TX transmitting power of the Lora radio frequency module and the receiving sensitivity of the RX; the small system circuit 3 is used for sampling and data processing of the current and controlling the operation of the whole test system. Further, the system for testing the parameters of the Lora radio frequency module further comprises an upper computer display unit 4 and a power supply module (not shown in the figure); the upper computer display unit 4 displays the test results including the total number of the tested modules, the defective number, the yield and the test Fail item by means of a Labview upper computer, performs data interaction with the small system circuit 3, and is more intuitive through a graphical interface to facilitate judgment of the test results; the power supply module supplies power to the current detection module 1, the radio frequency detection module 2 and the small system circuit 3.
Specifically, the sampling current is in the range of 50 nA-200 mA, and in order to prevent the influence of bottom noise on the sampling result, high-end differential sampling is adopted, the input impedance of the sampling differential operational amplifier chip is large enough, and the influence of overlarge leakage current on the nA-level test result is prevented. The structure of the current detection module 1 is shown in fig. 2, and the current detection module comprises a first nA two-way relay U3, a second mA two-way relay U1, a third uA two-way relay U2, a first nA sampling resistor R11, a second mA sampling resistor R13, a third uA sampling resistor R12, a first operational amplifier chip U12, a second operational amplifier chip U14 and a third operational amplifier chip U13; two normally open terminals PIN4 and PIN5 of the first nA double-way relay U3 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of an MCU in the small system circuit, a normally open terminal PIN4 and PIN5 of the first nA double-way relay U3 are connected to one end of a first nA sampling resistor R11, the other end of the first nA sampling resistor R11 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the normally open terminal PIN4 and PIN5 are connected to the positive input of the first operational amplifier chip U12; two normally open terminals PIN4 and PIN5 of the second mA two-way relay U1 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of the MCU in the small system circuit, the normally open terminals PIN4 and PIN5 of the second mA two-way relay U1 are connected to one end of a second mA sampling resistor R13, the other end of the second mA sampling resistor R13 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the second mA sampling resistor R13 is connected to the positive input of the first operational amplifier chip U12; two normally open terminals PIN4 and PIN5 of the third uA double-way relay U2 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of an MCU in the small system circuit, a normally open terminal PIN4 and PIN5 of the third uA double-way relay U2 are connected to one end of a third uA sampling resistor R12, the other end of the third uA sampling resistor R12 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the third uA double-way relay U2 is connected to the positive input of the first operational amplifier chip U36; the first operational amplifier chip U12 and the second operational amplifier chip U14 are connected to form a high impedance differential operational amplifier circuit, the third operational amplifier chip U13 is built into a doubled differential amplifier circuit, and the outputs of the first operational amplifier chip U12 and the second operational amplifier chip U14 are connected to the input of the third operational amplifier chip U13. A high-end differential sampling mode is adopted, a differential circuit adopts a differential operational amplifier chip with high input impedance, and a sampling resistor adopts one thousandth of precision.
The current detection module 1 needs to complete a detection range of 50 nA-200 mA. According to the working characteristics of Lora, the current grades are divided into three categories, the current in the sleep mode is nA grade, and the current detection range is 50 nA-1 UA; the standby and receiving mode current is in mA level, and the corresponding current detection range is 1 mA-20 mA; the current of the emission mode is in mA level, and the corresponding current detection range is 50 mA-200 mA. In order to ensure that one gain circuit is shared, three high-precision sampling resistors with different resistance values are adopted, wherein the high-precision sampling resistors are respectively 1 omega, 10 omega and 100K omega. The differential amplifying circuit adopts OP07CP with high input impedance, and the sampling output is connected to the AD sampling end of the small system circuit 3.
The power and the receiving sensitivity of the Lora radio frequency module are indirectly tested by testing the parameters of TSSI and RSSI by means of a discrete relation table between the receiving sensitivity and the power, and the traditional radio frequency production detection mode by means of a shielding box and a frequency spectrometer is eliminated. The receiving sensitivity and the POWER dispersion table are different according to the attenuation of the path, and a dispersion relation table drawn by a 12000-piece module after test is given as follows (RSSI = TSSI = -2~0, POWER =19dbm, and Trace loss =8 dbm). As shown in fig. 3, the rf detection module 2 includes a Lora rf module 21, a power divider 22 and a Lora reference module 23; the SPI communication pin of Lora radio frequency module 21 is connected to MCU's in the small system circuit 3 IO end, Lora radio frequency module 21's radio frequency pin is connected to 22 one end of power distribution unit, and the SPI communication pin of Lora benchmark module 23 is connected to MCU's in the small system circuit 3 IO end, and Lora benchmark module 23's radio frequency pin is connected to the 22 other end of power distribution unit. When detecting the TX of the Lora radio frequency module 21, the Lora reference module 23 is set to the RX mode only, the RSSI parameter of the Lora reference module 23 is read, and the magnitude of the transmission power of the Lora radio frequency module 21 is calculated by querying the constructed TX discrete table; when detecting the RX of the Lora rf module 21, the Lora reference module 23 is only required to be set to the TX mode, the RSSI parameter of the Lora rf module 21 is read, and the receiving sensitivity of the Lora rf module 21 is calculated by querying the constructed RX discrete table. Furthermore, when a plurality of modules are tested simultaneously, a power divider is needed to realize the switching function of the modules to be tested.
Specifically referring to fig. 4, the small system circuit 3 is a hardware main control platform of a Lora radio frequency module parameter testing system, and includes a minimum system circuit using STM32F407 as an MCU, a power supply circuit using RY3835 as a core, and an AD sampling reference voltage circuit using REF3030 as a core. The MCU is a processing unit, processes, stores and files the test result of the to-be-tested Lora radio frequency module, calculates the yield, and tracks the test result with the production data of the test module; and the acquired analog quantity is converted into corresponding digital quantity, and the total quantity of the test modules and the test result of the test parameters are automatically stored.
The Lora radio frequency module parameter testing system provided by the invention changes the traditional high-cost Lora module testing mode, adopts a low-cost and high-integration testing circuit, indirectly tests the maximum transmitting power and the receiving sensitivity by detecting RSSI and TSSI parameters by means of the discrete relation of the transmitting power and the receiving sensitivity, adopts a high-end sampling circuit and an operational amplifier circuit to carry out current detection, is convenient for industrialization and asset tracking, increases the functions of an upper computer, can record the testing quantity and the reject ratio, and can record the testing report of each module so as to be convenient for follow-up product tracking.
The above description is only for the purpose of describing the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention, and any variations and modifications made by those skilled in the art based on the above disclosure are within the scope of the appended claims.
Claims (4)
1. A system for testing parameters of a Lora radio frequency module is characterized by comprising a current detection module, a radio frequency detection module and a small system circuit; wherein the content of the first and second substances,
the current detection module is used for detecting the sleep current, the maximum emission current, the receiving current and the standby current of the Lora radio frequency module;
the radio frequency detection module is used for detecting the TX transmitting power of the Lora radio frequency module and the receiving sensitivity of the RX;
the small system circuit is used for sampling and data processing the current and controlling the operation of the whole test system;
the current detection module comprises a first nA double-circuit relay U3, a second mA double-circuit relay U1, a third uA double-circuit relay U2, a first nA sampling resistor R11, a second mA sampling resistor R13, a third uA sampling resistor R12, a first operational amplifier chip U12, a second operational amplifier chip U14 and a third operational amplifier chip U13; wherein the content of the first and second substances,
two normally open terminals PIN4 and PIN5 of the first nA double-way relay U3 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of an MCU in the small system circuit, a normally open terminal PIN4 and PIN5 of the first nA double-way relay U3 are connected to one end of a first nA sampling resistor R11, the other end of the first nA sampling resistor R11 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the normally open terminal PIN4 and PIN5 are connected to the positive input of the first operational amplifier chip U36;
two normally open terminals PIN4 and PIN5 of the second mA two-way relay U1 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of the MCU in the small system circuit, the normally open terminals PIN4 and PIN5 of the second mA two-way relay U1 are connected to one end of a second mA sampling resistor R13, the other end of the second mA sampling resistor R13 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the second mA sampling resistor R13 is connected to the positive input of the first operational amplifier chip U12;
two normally open terminals PIN4 and PIN5 of the third uA double-way relay U2 are in short circuit, one common terminal PIN6 is connected to a power supply, the other common terminal PIN3 is connected to the positive input of the second operational amplifier chip U14, a control terminal PIN1 is connected to the I/O end of an MCU in the small system circuit, a normally open terminal PIN4 and PIN5 of the third uA double-way relay U2 are connected to one end of a third uA sampling resistor R12, the other end of the third uA sampling resistor R12 is connected to a power supply terminal VCC of a Lora radio frequency module, and meanwhile, the third uA double-way relay U2 is connected to the positive input of the first operational amplifier chip U36;
the first operational amplifier chip U12 and the second operational amplifier chip U14 are connected to form a high impedance differential operational amplifier circuit, the third operational amplifier chip U13 is built into a doubled differential amplifier circuit, and the outputs of the first operational amplifier chip U12 and the second operational amplifier chip U14 are connected to the input of the third operational amplifier chip U13.
2. The system for testing the parameters of a Lora rf module of claim 1, wherein the rf detection module comprises a Lora rf module, a power divider and a Lora reference module; the SPI communication pin of Lora radio frequency module is connected to MCU's in the small system circuit IO end, the radio frequency pin of Lora radio frequency module is connected to power distribution unit one end, and the SPI communication pin of Lora benchmark module is connected to MCU's in the small system circuit IO end, and the radio frequency pin of Lora benchmark module is connected to the power distribution unit other end.
3. The system for testing the parameters of the Lora rf module of claim 1, wherein the small system circuit comprises a minimum system circuit with STM32F407 as MCU, a power supply circuit with RY3835 as core, and an AD sampling reference voltage circuit with REF3030 as core.
4. The system of claim 1, wherein the system for testing the parameters of the Lora rf module further comprises:
the upper computer display unit is used for displaying the test result and carrying out data interaction with the small system;
and the power supply module supplies power to the current detection module, the radio frequency detection module and the small system circuit.
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| CN201811094977.9A CN109194414B (en) | 2018-09-19 | 2018-09-19 | System for testing parameters of Lora radio frequency module |
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| CN201811094977.9A CN109194414B (en) | 2018-09-19 | 2018-09-19 | System for testing parameters of Lora radio frequency module |
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| CN109194414B true CN109194414B (en) | 2021-03-30 |
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| CN205105224U (en) * | 2015-09-17 | 2016-03-23 | 珠海中慧微电子股份有限公司 | Micropower wireless communication module testing arrangement |
| TWI800014B (en) * | 2016-12-29 | 2023-04-21 | 美商天工方案公司 | Front end systems and related devices, integrated circuits, modules, and methods |
| CN207410019U (en) * | 2017-11-03 | 2018-05-25 | 山东联合电力技术有限公司 | A kind of power distribution network distribution differential protective system |
| CN108241089A (en) * | 2018-01-09 | 2018-07-03 | 成都秦川物联网科技股份有限公司 | Detection device |
| CN108418866A (en) * | 2018-02-07 | 2018-08-17 | 沈磊 | Lora switch detectors, facility switching detecting system and detector extraction of square root method |
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