CN109145324A - A kind of parameterized module unit of transistors - Google Patents
A kind of parameterized module unit of transistors Download PDFInfo
- Publication number
- CN109145324A CN109145324A CN201710488909.XA CN201710488909A CN109145324A CN 109145324 A CN109145324 A CN 109145324A CN 201710488909 A CN201710488909 A CN 201710488909A CN 109145324 A CN109145324 A CN 109145324A
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- Prior art keywords
- modular unit
- transistor
- grid
- domain
- polysilicon
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/392—Floor-planning or layout, e.g. partitioning or placement
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
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- Computer Hardware Design (AREA)
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- Theoretical Computer Science (AREA)
- Evolutionary Computation (AREA)
- Geometry (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Architecture (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Abstract
The present invention provides small size matching transistor parameterized module units to improve the stability of domain to improve the efficiency for drawing domain, wherein the small size matching transistor modular unit with parameter, is made of the transistor of two fixed matching connection relationships.
Description
Technical field
The present invention relates to after integrated circuit and power device field more particularly to Analogous Integrated Electronic Circuits and power device design
End.
Background technique
IC design includes Front-end Design and two stages are designed in rear end, and Front-end Design is responsible for logic realization, usually
It is the speech like sound using verilog/VHDL, carries out the description of behavioral scaling.Rear end design refers to the gate leve for generating Front-end Design
Netlist is laid out wiring by EDA design tool and carries out physical verification and finally generate the mistake of the GDS file for manufacture
Journey, main responsibility have: chip makes physical structural analysis, logic analysis, establish rear end design cycle, laying out pattern wiring,
Layout editing, gets in touch with fab and submits creation data domain physical verification.So-called GDS file is a kind of patterned text
Part is a kind of format of integrated circuit diagram.
With the increase increasingly of mixed-signal designs complexity, development technology design tool packet (PDK, Process
Design Kit) and to establish verifying reference flowchart be extremely important for reducing the market risk brought by expensive design repeatedly
's.In general, fab can customize the design component of PDK according to the requirement of technology, and each technique can have a set of right
The PDK answered.
PDK is the complete process file set that provides for analog/mixed signal IC circuit design, be connection IC design and
The data platform of IC technique manufacture.The content of PDK includes:
Device model (Device Model): the simulation model file provided by Foundry;
Symbol and view (Symbols & View): for the symbol of principle diagram design, the design cell of parametrization all passes through
The verifying of SPICE emulation;
Component descriptor format (CDF, Component Description Format) and Callback function: the attribute of device is retouched
State file, define type of device, device name, device parameters and parameter call relation collection of functions Callback, device model,
Various view formats of device etc.;
Parameterized units (Pcell, Parameterized Cell): it is write by the SKILL language of Cadence, corresponding
Domain has passed through design rule check (DRC, design rule check) and domain and circuit diagram (LVS) is verified, and facilitates design
Domain (Schematic Driven Layout) design cycle of personnel's progress schematic diagram driving;
Technological document (Technology File): for the technical papers of layout design and verifying, the design number comprising GDSII
It is defined according to the mapping relations of layer and process layer, the attribute definition of design data layer, Photographing On-line rule, electric rule, display color
Coloured silk definition and graphical format definition etc.;
Physical verification rule (PV Rule) file: it is extracted comprising layout verification file DRC/LVS/RC, supports Cadence's
Diva, Dracula, Assura etc..
What wherein the parameter in parameterized units (Pcell) referred to is exactly CDF parameter, and it is fixed that their combination can be realized user
The institute of system is functional, is the core of PDK.In fact, the library of PDK just refers to the intersection of all parameterized units.It is specific next
It says, parameterized units have following effect:
(1) data for being inserted into domain can be accelerated, avoid the repetition creation of unit;
(2) space of physical disk is saved, similar portion may be connected to identical resource;
(3) mistake occurred because to safeguard multiple versions of same unit is avoided;
(4) editting function for realizing level does not need to go to change hierarchical structure to change the design of domain.
In short, if having the PDK, IC of the optimization sets such as parameterized units structure, symbol and the rule by verifying
The work of designer can free from the task of cumbersome fallibility and become high quality and rich in efficiency.
In traditional territory unit library, mos transistor basic unit is only existed, layout drawing personnel are drawing matching MOS
When transistor, two mos transistors with parameter are first called, then confirm the mos transistor come further according to circuit simulation
Dimensional parameters carry out parameter setting to the territory unit of each mos transistor, are attached then according to matched principle and cloth
Office, the later period modification during, if mos transistor size is varied, change operation it is very cumbersome, and be easy without
Mistake occurs in meaning.
Summary of the invention
The present invention provides small size matching transistor parameterized module units to be improved with improving the efficiency for drawing domain
The stability of domain.
Small size matching transistor parameterized module unit provided by the invention, by the crystalline substance of two fixed matching connection relationships
Body pipe composition.The modular unit provides control two parameters of transistor grid length and grid width, modifies two parameters, can be with
The size of transistor is adjusted, inside will make automatically corresponding adjustment, still maintain matching connection relationship.
Optionally, six metal lines are drawn in the modular unit, is connected for modular unit external circuit.
Optionally, the grid area that can adjust the transistor at any time allows area, Optimized Matching essence according to practical domain
Exactness.
Optionally, the modular unit uses complete common centroid domain structure.
Optionally, described transistor the right and left adds equidistant setoff grid, avoids because of polysilicon etch rate
Mismatch caused by inconsistent.
Optionally, the gate electrode for serving as a contrast or foil pipe is connected in the modular unit with backgate, helps to ensure that the electricity of transistor
Learn characteristic is not influenced by the pseudo- channel formed below setoff pipe.
Optionally, do not have to polysilicon in the modular unit and multiple gate electrodes are connected with each other with metal, prevent
Adjacent domain causes etch rate to change there are polysilicon graphics.
Optionally, the modular unit correctly handles the position of contact hole on polygate electrodes.
Optionally, the modular unit has close to symmetrical metal connecting line and is laid out.
Detailed description of the invention
Fig. 1 is preferred embodiment of the present invention small-medium size matching transistor parameterized module cellular construction schematic diagram.
Specific embodiment
The increase of gate area helps to reduce local irregularities' influence, improves matching accuracy.And because channel becomes
The long influence for reducing channel-length modulation, so long channel MOSFET matches more accurate than short-channel transistor.This
It is a have parameter, can with the changed domain modular unit of parameter, can guarantee breadth length ratio it is certain in the case where, at any time
The grid area for adjusting it, according to chip area at any time by grid rea adjusting to most suitable size, so that obtaining in a practical situation
Obtain best matching effect.
It can reduce the mismatch as caused by gradient by reducing the distance between matching transistor mass center.Common centroid domain cloth
Office is closer, is just less susceptible to the influence by nonlinear gradient.Fig. 1 is the preferred embodiment of the invention, wherein MOS domain mass center
Alignment and compact layout completely.The active grid region of MOS transistor uses long narrow rectangular in form, is divided into several sections, so as to
Construct a compact array.Properly staggeredly these are interdigital for the module, match in the mass center and array symmetry axis of device
The alignment of heart point.
The etch rate of polysilicon is not always consistent.The aperture of polysilicon is bigger, and etch rate is faster, because of etching
Ion can more freely enter side wall and the bottom of large opening, therefore when small aperture has just been carved, the edge of large opening is deposited
In a degree of over etching.This effect makes the grid length of Silicon-gate MOS transistor change.It must reach medium or smart
Otherwise the transistor of true currents match should may cause 1% or bigger electric current using setoff grid to ensure uniformly to etch
Mismatch.In the module be added setoff grid, and ensure that setoff grid between actual gate at a distance from be equal to actual gate it
Between distance, avoid because polysilicon etch rate it is inconsistent caused by mismatch.
The gate electrode for serving as a contrast or foil pipe is connected by the modular unit with backgate, help to ensure that the electrology characteristic of transistor not by
Serving as a contrast or foil the pseudo- channel formed below pipe influences.Some designers connect setoff pipe with neighbouring gate electrode, but do so and can make
Capacitor and leakage current is held to increase, so not using this method.
Many designers are connected with each other multiple gate electrodes with a polysilicon, form pectination grid structure.This is undoubtedly
It is that very easily, but since adjacent domain is there are polysilicon graphics, this way may make etch rate change.For
Reach best match effect, the modular unit connects simple rectangle polysilicon strip using metal.It is used without polysilicon
Metal is connected with each other multiple gate electrodes, prevents adjacent domain from causing etch rate to become there are polysilicon graphics
Change.
Contact hole site on MOS transistor active gate can cause significant threshold voltage mismatch.For this effect,
The possible explanation of one kind is due to there is metal above active gate.The alternatively possible mechanism that contact induces is contact part
Silication.If the polysilicon gate formed in technique is sufficiently thin, some silicides may complete penetration polysilicon gate.Aoxidize stratum boundary
The silicide occurred at face can greatly change the work function of gate electrode near contact hole, and make total threshold voltage mismatch.If
Stress form changes in crystallite dimension, impurity, then there may be the mismatches induced by contact.It is correctly handled in the module
The position of contact hole on polygate electrodes guarantees the top for making to contact thick field oxide layer, it can not substantially change crystal at this time
The property of pipe.
Reducing annealing is used for a long time to stablize the threshold voltage of MOS transistor in Designer Craftman.In annealing process,
Hydrogen can penetrate into interlayer oxide.Some hydrogen atoms can eventually arrive at oxide layer-silicon interface, and in conjunction with dangling bonds.It should
Reaction has neutralized the positive fixed charge of dangling bonds introducing.Due to incomplete hydrogenation, MOS transistor metal connecting line domain is matched
Different can introduce big mismatch between identical device originally.The module is used to be laid out close to symmetrical metal connecting line, is subtracted
The mismatch that light endless perhydrogenating introduces.
The modular unit provides control two parameters of transistor grid length and grid width, modifies two parameters, can be with
The size of transistor is adjusted, inside will make automatically corresponding adjustment, still maintain matching connection relationship.In the modular unit,
Six metal lines are drawn, are connected for modular unit external circuit.
Claims (9)
1. a kind of small size matching transistor parameterized module unit is made of the transistor of two fixed matching connection relationships,
It is characterized in that, the modular unit provides control two parameters of transistor grid length and grid width, two parameters are modified, it can
To adjust the size of transistor, inside will make automatically corresponding adjustment, still maintain matching connection relationship.
2. modular unit as described in claim 1, which is characterized in that six metal lines are drawn in the modular unit, for mould
The connection of module unit external circuit.
3. modular unit as described in claim 1, which is characterized in that the grid area of the transistor, root can be adjusted at any time
Factually border domain allows area, Optimized Matching accuracy.
4. modular unit as described in claim 1, which is characterized in that the modular unit uses complete common centroid domain knot
Structure.
5. modular unit as described in claim 1, which is characterized in that described transistor the right and left adds equidistant setoff
Grid, avoid because polysilicon etch rate it is inconsistent caused by mismatch.
6. modular unit as described in claim 1, which is characterized in that the gate electrode and back of pipe will be served as a contrast or foil in the modular unit
Grid are connected, and help to ensure that the electrology characteristic of transistor is not influenced by the pseudo- channel formed below setoff pipe.
7. modular unit as described in claim 1, which is characterized in that do not have to polysilicon in the modular unit and with metal handle
Multiple gate electrodes are connected with each other, and prevent adjacent domain from causing etch rate to change there are polysilicon graphics.
8. modular unit as described in claim 1, which is characterized in that the modular unit is correctly handled on polygate electrodes
The position of contact hole.
9. modular unit as described in claim 1, which is characterized in that the modular unit has close to symmetrical metal connecting line
Layout.
Priority Applications (1)
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CN201710488909.XA CN109145324A (en) | 2017-06-27 | 2017-06-27 | A kind of parameterized module unit of transistors |
Applications Claiming Priority (1)
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CN201710488909.XA CN109145324A (en) | 2017-06-27 | 2017-06-27 | A kind of parameterized module unit of transistors |
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CN109145324A true CN109145324A (en) | 2019-01-04 |
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CN201710488909.XA Pending CN109145324A (en) | 2017-06-27 | 2017-06-27 | A kind of parameterized module unit of transistors |
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- 2017-06-27 CN CN201710488909.XA patent/CN109145324A/en active Pending
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Application publication date: 20190104 |