CN109141639B - Fourier transform-based interference out-of-focus image speckle steering discrimination method - Google Patents

Fourier transform-based interference out-of-focus image speckle steering discrimination method Download PDF

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CN109141639B
CN109141639B CN201811038665.6A CN201811038665A CN109141639B CN 109141639 B CN109141639 B CN 109141639B CN 201811038665 A CN201811038665 A CN 201811038665A CN 109141639 B CN109141639 B CN 109141639B
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interference
fourier transform
image
speckle
steering
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CN109141639A (en
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张红霞
孙金露
王晓磊
贾大功
刘铁根
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Tianjin University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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    • G01J3/45—Interferometric spectrometry
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    • G01—MEASURING; TESTING
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    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
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Abstract

本发明公开了一种基于傅里叶变换的干涉离焦像散斑转向判别方法，步骤(1)、利用干涉粒子成像系统，获取任意转向下透明椭球粒子的干涉离焦像；步骤(2)、利用MATLAB对干涉离焦像进行傅里叶变换处理；步骤(3)、对图像处理结果二值化，得到傅里叶变换处理的中心亮斑；步骤(4)、利用椭圆圈出亮斑，沿椭圆长轴方向画线得到亮斑转向；步骤(5)、做步骤(3)中亮斑转向的垂线，垂线方向即为干涉离焦像散斑转向。本发明可以实现粒子干涉离焦像的散斑转向判别，进而实现粒子的转向判别，为复杂粒子场测量提供技术支持。

Figure 201811038665

The invention discloses a method for discriminating speckle steering of an interference defocused image based on Fourier transform. In step (1), an interference particle imaging system is used to obtain an interference defocused image of a transparent ellipsoid particle under arbitrary steering; step (2) ), use MATLAB to carry out Fourier transform processing to the interference defocused image; Step (3), binarize the image processing result, and obtain the center bright spot of Fourier transform processing; Step (4), use elliptical circle to highlight Spot, draw a line along the direction of the long axis of the ellipse to obtain the turning of the bright spot; in step (5), make the vertical line of the turning of the bright spot in step (3), and the direction of the vertical line is the turning of the speckle of the interference defocused image. The invention can realize the speckle steering discrimination of the particle interference defocus image, and then realize the steering discrimination of the particles, and provide technical support for the complex particle field measurement.

Figure 201811038665

Description

Fourier transform-based interference out-of-focus image speckle steering discrimination method
Technical Field
The invention relates to the technical field of measurement of ellipsoidal particles in an optical system, in particular to a method for distinguishing speckle turning of an interference defocused image of a complex particle.
Background
The interference particle imaging technology has the advantages of high precision, wide measurement range, non-contact and the like, so the method is widely applied to the field of particle measurement. In the measuring process, the interference focusing image of the transparent spherical particles is a two-point image, the interference defocusing image is a fringe image with alternate light and shade, and the information such as particle size, position coordinates, motion speed and the like can be acquired by analyzing the interference focusing image or the interference defocusing image. The interference defocused image of the transparent ellipsoid particles is a speckle image, the steering change of the particles leads to the speckle steering change of the interference defocused image, and the steering information of the particles can be acquired by analyzing the steering information of the speckles, so that the speckle steering judgment of the interference defocused image has important significance.
In the process of realizing transparent ellipsoid particle measurement by utilizing an interference particle imaging technology, patent CN103868831A proposes a cloud particle spectrum distribution measurement method and measurement system, and phase discrimination of cloud particles is realized by a defocused interference pattern and a defocused interference pattern.
At present, no example of speckle turning discrimination of the transparent ellipsoid particle interference defocused image exists in the prior art.
Disclosure of Invention
On the basis of the prior art, the invention provides a Fourier transform-based interference defocused image speckle turning discrimination method, which is suitable for measuring transparent ellipsoid particles in an optical system by acquiring speckle turning through Fourier transform of an interference defocused image.
The invention discloses an interference defocused image speckle turning discrimination method based on Fourier transform, which comprises the following steps of:
step 1, acquiring an interference defocused image of transparent ellipsoid particles under any steering by using an interference particle imaging system;
step 2, carrying out Fourier transform processing on the interference defocused image by using MATLAB, and carrying out binarization on a result image subjected to Fourier transform processing to obtain a central bright spot subjected to Fourier transform processing;
step 3, utilizing the ellipse to circle out bright spots, and drawing lines along the long axis direction of the ellipse to obtain bright spot steering;
and 4, making a perpendicular line for turning the bright spots in the step 3, wherein the direction of the perpendicular line is the direction of the interference out-of-focus image speckle turning.
The method can realize speckle turning discrimination of the interference defocused image of the transparent ellipsoid particles, further realize turning discrimination of the transparent ellipsoid particles, and provide technical support for complex particle field measurement.
Reference numerals
FIG. 1 is a flow chart of the method for discriminating speckle turning of the interference defocused image of the transparent ellipsoid particles.
FIG. 2 is a block diagram of an example interference particle imaging system, wherein: 1. the device comprises a laser, 2, a microscope objective, 3, a spatial filter, 4, a collimating lens, 5, a first cylindrical mirror, 6, a second cylindrical mirror, 7, a glass slide, 8, an imaging lens, 9 and a CCD.
FIG. 3 is a schematic diagram of an interference defocused image and a processing result, wherein: (a) - (d) is a transparent ellipsoidal particle interference defocused image with different speckle steering; (e) - (h) is a fourier transform processing result of the interference out-of-focus image; (i) - (l) combined image of interferometric out-of-focus image speckle magnification and interferometric out-of-focus image fourier speckle magnification.
Detailed Description
Embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.
Example 1: interference particle imaging system
An interference particle imaging system adopted by the invention is shown in figure 2, the wavelength of laser beam emitted by a laser 1 is 532nm, the maximum output power is 6W, the laser beam is expanded by a microscope objective lens 2, filtered by a spatial filter 3 and collimated by a collimating lens 4, and then compressed into a sheet-shaped laser beam with the thickness of 1mm by a first cylindrical mirror 5 and a second cylindrical mirror 6, an imaging lens 8 for collecting particle scattered light is a Nikon 50mm f/1.4D focusing lens, a receiving device 9 is a CCD with the pixel size of 6.45 mu m and the effective pixel number of 1384 multiplied by 1036, the scattering angle theta of the system is 90 degrees, the magnification of the system is 1.67, the object distance is 79.88mm, the image distance is 133.68mm, the particle to be detected is an ellipsoid particle obtained by stretching polystyrene spherical particle with the particle size of 80 mu m, and the axial ratio range of the long particle and the short particle of the ellipsoid is 1.5-.
In the observation process, the particles are distributed on the glass slide 7 in any direction, and the glass slide is parallel to a receiving plane of the CCD9 positioned on the defocused image surface, so that the ellipsoid particles only have a deflection angle on the plane, and interference defocused images of the transparent ellipsoid particles under different speckle turning directions are collected.
Example 2: and (3) obtaining a processing result of the speckle turning of the transparent ellipsoid particle interference defocused image by adopting a Fourier transform algorithm, and comparing the processing result:
FIG. 3 is a schematic diagram of an interference defocused image and a processing result. Wherein: (a) - (d) is a transparent ellipsoidal particle interference defocused image with different speckle steering; (e) - (h) is a fourier transform processing result of the interference out-of-focus image; (i) - (l) is a combined image of the interferometric out-of-focus image speckle magnification and the interferometric out-of-focus image fourier speckle magnification. The interference images with different speckle directions are obtained by obtaining the interference defocused images of particles with different directions of rotation, representative speckles in the interference defocused images are taken as speckle directions and marked out by dotted lines, Fourier transform results of the interference defocused images are taken and marked out by dot-dash lines and solid lines respectively, and as can be seen from figure 3, the direction of a perpendicular line of the Fourier transform bright spots is the direction of the speckles of the interference defocused images.

Claims (1)

1.一种基于傅里叶变换的干涉离焦像散斑转向判别方法，其特征在于，该方法包括以下步骤：1. a method for judging speckle steering of an interference defocused image based on Fourier transform, is characterized in that, the method comprises the following steps: 步骤（1）、利用干涉粒子成像系统，获取任意转向下透明椭球粒子的干涉离焦像；Step (1), use the interference particle imaging system to obtain the interference defocus image of the transparent ellipsoid particle under any direction; 步骤（2）、利用MATLAB对干涉离焦像进行傅里叶变换处理，对傅里叶变换处理的结果图像进行二值化，得到傅里叶变换处理的中心亮斑；Step (2), using MATLAB to perform Fourier transform processing on the interference defocused image, and binarize the result image of the Fourier transform processing to obtain the central bright spot processed by the Fourier transform; 步骤（3）、利用椭圆圈出亮斑，沿椭圆长轴方向画线得到亮斑转向；Step (3), use the ellipse to circle the bright spot, and draw a line along the long axis of the ellipse to obtain the bright spot turning; 步骤（4）、做步骤（3）中亮斑转向的垂线，垂线方向即为干涉离焦像散斑转向。Step (4), make the vertical line of the bright spot turning in step (3), the direction of the vertical line is the speckle turning of the interference defocused image.
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1339705A (en) * 2000-08-18 2002-03-13 中国科学院武汉物理与数学研究所 Double wave length liquid altitude deection laser radar
CN102721478A (en) * 2012-07-10 2012-10-10 中国科学院光电技术研究所 Wavefront restoration method applied to curvature wavefront sensor
CN103674791A (en) * 2013-12-16 2014-03-26 天津大学 Double beam irradiation-based interfering particle image measurement method
CN104034281A (en) * 2014-06-16 2014-09-10 浙江大学 Optical self-focusing probe used for free-form surface topography measurement
JP5881497B2 (en) * 2012-03-28 2016-03-09 三菱電機株式会社 Exhaust fan with protective guard for exhaust fan and protective guard for exhaust fan

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9348463B2 (en) * 2006-08-03 2016-05-24 New York University Retroreflection based multitouch sensor, method and program

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1339705A (en) * 2000-08-18 2002-03-13 中国科学院武汉物理与数学研究所 Double wave length liquid altitude deection laser radar
JP5881497B2 (en) * 2012-03-28 2016-03-09 三菱電機株式会社 Exhaust fan with protective guard for exhaust fan and protective guard for exhaust fan
CN102721478A (en) * 2012-07-10 2012-10-10 中国科学院光电技术研究所 Wavefront restoration method applied to curvature wavefront sensor
CN103674791A (en) * 2013-12-16 2014-03-26 天津大学 Double beam irradiation-based interfering particle image measurement method
CN104034281A (en) * 2014-06-16 2014-09-10 浙江大学 Optical self-focusing probe used for free-form surface topography measurement

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