CN109141639B - Fourier transform-based interference out-of-focus image speckle steering discrimination method - Google Patents
Fourier transform-based interference out-of-focus image speckle steering discrimination method Download PDFInfo
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- CN109141639B CN109141639B CN201811038665.6A CN201811038665A CN109141639B CN 109141639 B CN109141639 B CN 109141639B CN 201811038665 A CN201811038665 A CN 201811038665A CN 109141639 B CN109141639 B CN 109141639B
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- 238000012850 discrimination method Methods 0.000 title claims abstract description 6
- 239000002245 particle Substances 0.000 claims abstract description 43
- 238000003384 imaging method Methods 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims description 8
- 238000005259 measurement Methods 0.000 abstract description 7
- 238000010586 diagram Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000012798 spherical particle Substances 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0227—Investigating particle size or size distribution by optical means using imaging; using holography
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Abstract
The invention discloses a Fourier transform-based interference defocused image speckle turning discrimination method, which comprises the following steps of (1) acquiring an interference defocused image of transparent ellipsoid particles under any turning by using an interference particle imaging system; step (2), carrying out Fourier transform processing on the interference defocused image by using MATLAB; step (3), binarizing the image processing result to obtain central bright spots processed by Fourier transform; step (4), utilizing the ellipse to circle out the bright spots, and drawing lines along the long axis direction of the ellipse to obtain the bright spot steering; and (5) making a perpendicular line for turning the bright spots in the step (3), wherein the direction of the perpendicular line is the direction of the speckle turning of the interference out-of-focus image. The invention can realize the speckle turning discrimination of the particle interference defocused image, further realize the turning discrimination of the particles and provide technical support for the measurement of complex particle fields.
Description
Technical Field
The invention relates to the technical field of measurement of ellipsoidal particles in an optical system, in particular to a method for distinguishing speckle turning of an interference defocused image of a complex particle.
Background
The interference particle imaging technology has the advantages of high precision, wide measurement range, non-contact and the like, so the method is widely applied to the field of particle measurement. In the measuring process, the interference focusing image of the transparent spherical particles is a two-point image, the interference defocusing image is a fringe image with alternate light and shade, and the information such as particle size, position coordinates, motion speed and the like can be acquired by analyzing the interference focusing image or the interference defocusing image. The interference defocused image of the transparent ellipsoid particles is a speckle image, the steering change of the particles leads to the speckle steering change of the interference defocused image, and the steering information of the particles can be acquired by analyzing the steering information of the speckles, so that the speckle steering judgment of the interference defocused image has important significance.
In the process of realizing transparent ellipsoid particle measurement by utilizing an interference particle imaging technology, patent CN103868831A proposes a cloud particle spectrum distribution measurement method and measurement system, and phase discrimination of cloud particles is realized by a defocused interference pattern and a defocused interference pattern.
At present, no example of speckle turning discrimination of the transparent ellipsoid particle interference defocused image exists in the prior art.
Disclosure of Invention
On the basis of the prior art, the invention provides a Fourier transform-based interference defocused image speckle turning discrimination method, which is suitable for measuring transparent ellipsoid particles in an optical system by acquiring speckle turning through Fourier transform of an interference defocused image.
The invention discloses an interference defocused image speckle turning discrimination method based on Fourier transform, which comprises the following steps of:
and 4, making a perpendicular line for turning the bright spots in the step 3, wherein the direction of the perpendicular line is the direction of the interference out-of-focus image speckle turning.
The method can realize speckle turning discrimination of the interference defocused image of the transparent ellipsoid particles, further realize turning discrimination of the transparent ellipsoid particles, and provide technical support for complex particle field measurement.
Reference numerals
FIG. 1 is a flow chart of the method for discriminating speckle turning of the interference defocused image of the transparent ellipsoid particles.
FIG. 2 is a block diagram of an example interference particle imaging system, wherein: 1. the device comprises a laser, 2, a microscope objective, 3, a spatial filter, 4, a collimating lens, 5, a first cylindrical mirror, 6, a second cylindrical mirror, 7, a glass slide, 8, an imaging lens, 9 and a CCD.
FIG. 3 is a schematic diagram of an interference defocused image and a processing result, wherein: (a) - (d) is a transparent ellipsoidal particle interference defocused image with different speckle steering; (e) - (h) is a fourier transform processing result of the interference out-of-focus image; (i) - (l) combined image of interferometric out-of-focus image speckle magnification and interferometric out-of-focus image fourier speckle magnification.
Detailed Description
Embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.
Example 1: interference particle imaging system
An interference particle imaging system adopted by the invention is shown in figure 2, the wavelength of laser beam emitted by a laser 1 is 532nm, the maximum output power is 6W, the laser beam is expanded by a microscope objective lens 2, filtered by a spatial filter 3 and collimated by a collimating lens 4, and then compressed into a sheet-shaped laser beam with the thickness of 1mm by a first cylindrical mirror 5 and a second cylindrical mirror 6, an imaging lens 8 for collecting particle scattered light is a Nikon 50mm f/1.4D focusing lens, a receiving device 9 is a CCD with the pixel size of 6.45 mu m and the effective pixel number of 1384 multiplied by 1036, the scattering angle theta of the system is 90 degrees, the magnification of the system is 1.67, the object distance is 79.88mm, the image distance is 133.68mm, the particle to be detected is an ellipsoid particle obtained by stretching polystyrene spherical particle with the particle size of 80 mu m, and the axial ratio range of the long particle and the short particle of the ellipsoid is 1.5-.
In the observation process, the particles are distributed on the glass slide 7 in any direction, and the glass slide is parallel to a receiving plane of the CCD9 positioned on the defocused image surface, so that the ellipsoid particles only have a deflection angle on the plane, and interference defocused images of the transparent ellipsoid particles under different speckle turning directions are collected.
Example 2: and (3) obtaining a processing result of the speckle turning of the transparent ellipsoid particle interference defocused image by adopting a Fourier transform algorithm, and comparing the processing result:
FIG. 3 is a schematic diagram of an interference defocused image and a processing result. Wherein: (a) - (d) is a transparent ellipsoidal particle interference defocused image with different speckle steering; (e) - (h) is a fourier transform processing result of the interference out-of-focus image; (i) - (l) is a combined image of the interferometric out-of-focus image speckle magnification and the interferometric out-of-focus image fourier speckle magnification. The interference images with different speckle directions are obtained by obtaining the interference defocused images of particles with different directions of rotation, representative speckles in the interference defocused images are taken as speckle directions and marked out by dotted lines, Fourier transform results of the interference defocused images are taken and marked out by dot-dash lines and solid lines respectively, and as can be seen from figure 3, the direction of a perpendicular line of the Fourier transform bright spots is the direction of the speckles of the interference defocused images.
Claims (1)
1. An interference out-of-focus image speckle steering discrimination method based on Fourier transform is characterized by comprising the following steps:
the method comprises the following steps of (1) acquiring an interference defocused image of transparent ellipsoid particles under any steering by using an interference particle imaging system;
performing Fourier transform processing on the interference defocused image by using MATLAB, and binarizing a result image of the Fourier transform processing to obtain a central bright spot of the Fourier transform processing;
step (3), utilizing the ellipse to circle out the bright spots, and drawing lines along the long axis direction of the ellipse to obtain the bright spot steering;
and (4) making a perpendicular line for turning the bright spots in the step (3), wherein the direction of the perpendicular line is the direction of the speckle turning of the interference out-of-focus image.
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| CN201811038665.6A CN109141639B (en) | 2018-09-06 | 2018-09-06 | Fourier transform-based interference out-of-focus image speckle steering discrimination method |
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| CN201811038665.6A CN109141639B (en) | 2018-09-06 | 2018-09-06 | Fourier transform-based interference out-of-focus image speckle steering discrimination method |
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| CN109141639B true CN109141639B (en) | 2021-02-09 |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1339705A (en) * | 2000-08-18 | 2002-03-13 | 中国科学院武汉物理与数学研究所 | Double wave length liquid altitude deection laser radar |
| CN102721478A (en) * | 2012-07-10 | 2012-10-10 | 中国科学院光电技术研究所 | Wavefront restoration method applied to curvature wavefront sensor |
| CN103674791A (en) * | 2013-12-16 | 2014-03-26 | 天津大学 | Double beam irradiation-based interfering particle image measurement method |
| CN104034281A (en) * | 2014-06-16 | 2014-09-10 | 浙江大学 | Optical self-focusing probe used for free-form surface topography measurement |
| JP5881497B2 (en) * | 2012-03-28 | 2016-03-09 | 三菱電機株式会社 | Exhaust fan with protective guard for exhaust fan and protective guard for exhaust fan |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US9348463B2 (en) * | 2006-08-03 | 2016-05-24 | New York University | Retroreflection based multitouch sensor, method and program |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1339705A (en) * | 2000-08-18 | 2002-03-13 | 中国科学院武汉物理与数学研究所 | Double wave length liquid altitude deection laser radar |
| JP5881497B2 (en) * | 2012-03-28 | 2016-03-09 | 三菱電機株式会社 | Exhaust fan with protective guard for exhaust fan and protective guard for exhaust fan |
| CN102721478A (en) * | 2012-07-10 | 2012-10-10 | 中国科学院光电技术研究所 | Wavefront restoration method applied to curvature wavefront sensor |
| CN103674791A (en) * | 2013-12-16 | 2014-03-26 | 天津大学 | Double beam irradiation-based interfering particle image measurement method |
| CN104034281A (en) * | 2014-06-16 | 2014-09-10 | 浙江大学 | Optical self-focusing probe used for free-form surface topography measurement |
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