CN109115870B - Annular eccentric eddy current probe and method for detecting defects of small-diameter pipe - Google Patents

Annular eccentric eddy current probe and method for detecting defects of small-diameter pipe Download PDF

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CN109115870B
CN109115870B CN201811201970.2A CN201811201970A CN109115870B CN 109115870 B CN109115870 B CN 109115870B CN 201811201970 A CN201811201970 A CN 201811201970A CN 109115870 B CN109115870 B CN 109115870B
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eddy current
small
eccentric
diameter pipe
probe
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CN109115870A (en
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解社娟
杨庆宁
孔玉莹
王小刚
马强
许盼盼
陈振茂
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Xian Jiaotong University
CGNPC Inspection Technology Co Ltd
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Xian Jiaotong University
CGNPC Inspection Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006Details, e.g. in the structure or functioning of sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013Arrangements for scanning

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  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

A circumferential eccentric eddy current probe and a method aiming at the defect detection of a small-diameter pipe are disclosed, the probe comprises an eddy current Bobbin probe device and circumferential eccentric devices arranged at two ends of the eddy current Bobbin probe device, the eddy current Bobbin probe device is composed of a columnar framework, and an excitation coil and a detection coil which are wound on the framework and are not in contact with each other; the annular eccentric device consists of a movable rod, a fixed frame and a rotating frame, the columnar rotating frame is inserted into a framework of the eddy Bobbin probe device and fixedly connected, the expansion and contraction and angle change of the movable rod are controlled by a driver arranged on the rotating frame, so that the eccentric motion and the annular motion of the eddy Bobbin probe device are realized, and the radial eccentric lift-off distance of the annular eccentric eddy probe relative to the inner wall of the pipeline to be detected is adjusted; the invention has the capability of simultaneously detecting the axial information, the circumferential information and the depth information of the wall defects of the small-diameter pipe; in addition, the annular eccentric scanning mode has higher efficiency and precision.

Description

Annular eccentric eddy current probe and method for detecting defects of small-diameter pipe
Technical Field
The technology relates to an electromagnetic nondestructive testing probe, in particular to an annular eccentric eddy current Bobbin probe and a method for detecting three-dimensional information of a small-diameter pipeline defect.
Background
The small-diameter pipe pipeline has wide application in various industrial fields such as energy, chemical industry and the like. Because the pipe diameter is small, the manufacturing precision is difficult to guarantee, and after the pipe is in service for a period of time, the internal structure of the pipe cannot avoid damage such as macro-micro defects and the like. Since the presence of damage can pose a serious risk to the safe use of the pipeline structure, it is particularly important to perform regular detection and evaluation on the pipeline structure.
At present, for the detection of the small-diameter pipe, an eddy current Bobbin probe detection method and a Pancut point type probe scanning detection method are conventionally used. Both methods are based on electromagnetic induction phenomena for defect detection. The eddy Bobbin probe detection is an effective method for carrying out nondestructive evaluation on the surface defects of the pipeline structure, has the advantages of high detection capability on the surface defects and the near surface defects, non-contact, rapid investigation and the like, but can only determine the axial information of the defects in the pipe wall and cannot give the circumferential information of the defects in the pipe wall; pancake point-type probe detection is a detection method for performing spiral annular scanning in a pipe, can determine axial and annular information of defects in the pipe wall, and has extremely slow speed and low efficiency of spiral scanning. The method comprises the steps of firstly determining the axial position of a defect in a pipeline in the pipe wall by using a Bobbin probe, then performing accurate annular scanning on the position of the defect by using a Pancut point type probe, further determining the annular position and the depth of the defect, and finally determining the three-dimensional information of the defect. The method for detecting the defects in the pipe by using the two probes in combination needs to perform two times of scanning, and is long in time consumption and low in efficiency.
In addition, for the eddy current annular array probe used in the traditional pipeline detection, on one hand, the array probe is inconvenient to accommodate for a smaller pipe diameter, so that the problems of difficult design and high cost exist; on the other hand, the detection angle of the eddy current annular array probe in the small-diameter pipe is limited, so that the eddy current annular array probe cannot scan and detect all angles, and the problem of missed detection exists.
Disclosure of Invention
In order to solve the problems existing in the prior art, the invention aims to provide a circumferential eccentric eddy current probe and a method for detecting the defects of a small-diameter pipe, wherein the axial eddy current scanning and the circumferential eddy current scanning of the pipe defects are respectively carried out through an eddy current Bobbin probe device and a circumferential eccentric device, the axial information of the pipe wall defects is determined through the axial scanning, and the circumferential information and the depth information of the pipe wall defects are determined through the circumferential scanning, so that the three-dimensional information of the defects is obtained; compared with a conventional eddy Bobbin probe, the invention has the capability of simultaneously detecting the axial information, the circumferential information and the depth information of the defects of the small-diameter pipe; compared with the conventional method for detecting the defects of the small-diameter tube, the method can detect the three-dimensional information of the defects only by one-time passing through the tube to be detected, and has the advantages of easiness in realization, easiness in operation, strong practicability, high detection efficiency, simplicity in control and the like.
In order to achieve the above purpose, the invention adopts the following technical scheme:
a circumferential eccentric eddy current probe aiming at the defect detection of a small-diameter pipe comprises an eddy current Bobbin probe device 2 and circumferential eccentric devices 1 arranged at two ends of the eddy current Bobbin probe device 2, wherein the eddy current Bobbin probe device 2 is composed of a columnar framework 5, and an excitation coil 3 and a detection coil 4 which are wound on the framework 5 and are not in contact with each other; the annular eccentric device consists of a movable rod 6, a fixed frame 7 and a rotating frame 8, and the cylindrical rotating frame 8 is inserted into the framework 5 of the eddy Bobbin probe device 2 and is fixedly connected with the framework; the fixed frame 7 is in a hollow columnar shape, the rotating frame 8 is positioned in the fixed frame 7, the movable rods 6 are multiple and can extend and retract along the axial direction of the movable rods, the movable rods 6 are radially arranged between the rotating frame 8 and the fixed frame 7, the fixed frame 7 is connected by buckling a ball at the outer end part of the movable rod 6 through a groove at the inner side of the fixed frame 7 so that the movable rod 6 can rotate, the fixed frame 7 does not move along with the movable rods 6, the rotating frame 8 is connected by buckling a ball at the inner end part of the movable rod 6 through a groove at the outer side of the rotating frame 8 so that the movable rod 6 can rotate and further drive the rotating frame 8 to rotate, a driver is arranged on the rotating frame 8, the expansion and the angle change of the movable rod 6 are controlled through the driver so that the eccentric motion and the circumferential motion of the eddy current Bobbin; during operation, the fixing frame 7 is attached to the inner wall of the small-diameter pipe to be measured.
The exciting coil 3 and the detecting coil 4 are formed by spirally and densely winding enameled wires on a framework 5.
The framework 5 is made of PVC.
The number of the movable rods 6 is eight, and the movable rods are uniformly arranged between the rotating frame 8 and the fixed frame 7 along the radial direction.
The method for detecting the defects of the annular eccentric eddy current probe aiming at the defect detection of the small-diameter pipe,
firstly, the eddy current Bobbin probe device 2 and the corresponding annular eccentric device 1 are installed in a matched mode, wherein after initial installation, the eddy current Bobbin probe device 2 keeps a non-eccentric state relative to a small-diameter pipe to be detected during axial scanning, the probe is placed into the small-diameter pipe to be detected, and the lift-off distance of the installed eddy current Bobbin probe device 2 is guaranteed to be an effective value capable of detecting defects;
secondly, a steady-state sinusoidal excitation current is continuously introduced into the excitation coil 3, the sinusoidal excitation current can generate an alternating magnetic field in the small-diameter pipeline to be detected, and the alternating magnetic field can induce an alternating eddy current field in the pipeline wall; when the pipe wall has defects, the eddy current field is disturbed by the defects to change, and further, a secondary magnetic field induced by the eddy current field also changes, so that a detection signal in the detection coil 4 changes; determining defect information in the pipe wall by detecting the change of the signal in the coil 4;
then, continuously scanning without eccentricity along the axial direction of the small-diameter pipe to be detected by using the annular eccentric eddy Bobbin probe, and determining the axial information of the defect on the small-diameter pipe to be detected according to the detection signal of the detection coil 4; once the defect is determined by axial scanning, starting a driver of the annular eccentric device 1 to enable the movable rod 6 to stretch and change angles, controlling the rotating frame 8 to drive the eddy Bobbin probe device 2 to perform eccentric motion, fixing the lifting distance after the lifting distance is reduced to a preset value, performing annular eccentric scanning and recording a detection signal output by the detection coil 4;
and finally, determining the circumferential information and the depth information of the defect in the pipe wall of the small-diameter pipe to be detected according to the detection signal of the detection coil 4 in the circumferential scanning, and recording the axial position information of the defect in the small-diameter pipe to be detected.
Compared with the prior art, the invention has the following advantages:
1. the invention designs and transforms the eddy Bobbin probe device, thus greatly reducing the cost on the premise of ensuring the working efficiency of the device. Compared with a method for combining and applying the Bobbin probe and the Pancake point type probe, the method can quickly and accurately detect and obtain the three-dimensional information of the defects of the inner wall of the pipe only by completely passing through the pipeline to be detected once, thereby reducing the difficulty of the working process and improving the working efficiency.
2. The circumferential eccentric device can realize the change of the lifting distance of the eddy Bobbin probe by controlling the contraction and the angle of the movable rod, and can reduce the radial lifting distance of the probe and improve the sensitivity and the detection precision of the probe during circumferential scanning.
3. The process of axially scanning the small-diameter pipe by using the eddy Bobbin probe is a continuous process, and the information of the defect along the axial direction can be determined according to the detection signal of the detection coil in the axial scanning process, so that the defect information obtained by the whole detection scanning is real and continuous.
Drawings
Fig. 1 is an assembly schematic diagram of the annular eccentric eddy current probe of the present invention, wherein: fig. 1a is an overall view and fig. 1b is an exploded view.
Fig. 2 is a schematic structural diagram of the annular eccentric device of the present invention, wherein: fig. 2a is a radial cross-sectional view, fig. 2b is an axial cross-sectional view, and fig. 2c is a perspective view.
Fig. 3 is a detailed view of the structural assembly of the movable rod of the present invention, wherein fig. 3a is an assembly view of the movable rod and the rotating frame, and fig. 3b is an assembly view of the movable rod and the fixed frame.
FIG. 4 is a schematic diagram of the movement of the probe of the present invention, wherein: fig. 4a is a motion diagram in an unbiased state, and fig. 4b is a motion diagram in a biased state.
Detailed description of the invention
The invention is described in further detail below with reference to the figures and the embodiments.
As shown in fig. 1a and 1b of fig. 1, the circular eccentricity eddy current probe for detecting a small diameter pipe defect in the present embodiment includes a circular eccentricity device 1 and an eddy current bob probe device 2, where the eddy current bob probe device is composed of a framework 5 made of PVC material, an excitation coil 3 formed by spirally and densely winding an enameled wire with a wire diameter of 0.03mm to 0.1mm on the framework 5 by 500 turns to 1000 turns, and a detection coil 4 formed by spirally and densely winding an enameled wire with a wire diameter of 0.03mm to 0.1mm on the same framework 5 by 500 turns to 1000 turns. The distance between the exciting coil 3 and the detecting coil 4 is 2.5mm, and the width of the coil is 2.5 mm.
As shown in fig. 2a, 2b and 2c of fig. 2 and 3a and 3b of fig. 3, the ring-shaped eccentric device is composed of a movable rod 6, a fixed frame 7 and a rotating frame 8. The annular eccentric device 1 is arranged at the axial front and back positions of the framework 5 through a rotating frame 8, wherein the annular eccentric device 1 is provided with eight movable rods 6, the fixed frame 7 is in a hollow column shape, the rotating frame 8 is positioned in the fixed frame 7, the movable rods 6 are a plurality of and can axially extend and retract along the movable frame, the movable rods 6 are radially arranged between the rotating frame 8 and the fixed frame 7, the fixed frame 7 is connected by a ball body at the outer end part of the movable rod 6 which is buckled by a groove at the inner side of the fixed frame 7 so that the movable rod 6 can rotate, the fixed frame 7 does not move along with the movable rods 6, the rotating frame 8 is connected by a ball body at the inner end part of the movable rod 6 which is buckled by a groove at the outer side of the rotating frame 8 so that the movable rod 6 can rotate to drive the rotating frame 8 to rotate, a driver bbb is arranged on the rotating frame 8, and the eccentric motion and, and controlling the lifting distance of the annular eccentric eddy current probe relative to the inner wall of the pipeline to be detected.
As shown in fig. 4a and 4b of fig. 4, the eccentric state of the probe is driven by the movable rod to deviate from the original central position, and then the probe is rotated to perform circumferential scanning detection by taking the eccentric distance as a radius and the original center of a circle as an axis, so as to ensure that the position in each angle in the pipeline can be detected.
The invention discloses a method for detecting defects of a circular eccentric eddy current probe aiming at detecting the defects of a small-diameter pipe, which comprises the following steps:
firstly, the eddy current Bobbin probe device 2 and the corresponding annular eccentric device 1 are installed in a matched mode, wherein after initial installation, the eddy current Bobbin probe device 2 is not eccentric and keeps a non-eccentric state relative to a small-diameter pipe to be detected during axial scanning, the probe is placed into the small-diameter pipe to be detected, and the lift-off distance of the installed eddy current Bobbin probe device 2 is guaranteed to be an effective value capable of detecting defects;
secondly, a steady-state sinusoidal excitation current is continuously introduced into the excitation coil 3, the sinusoidal excitation current can generate an alternating magnetic field in the small-diameter pipeline to be detected, the alternating magnetic field can induce an alternating eddy current field in the pipeline wall, when a defect exists in the pipeline wall, a secondary magnetic field induced by the eddy current field can change, and further a detection signal in the detection coil 4 changes, so that the defect information in the pipeline wall can be determined through the change of the detection signal in the detection coil 4;
then, continuously scanning without eccentricity along the axial direction of the small-diameter pipe to be detected by using the annular eccentric eddy Bobbin probe, and determining the axial information of the defect in the small-diameter pipe to be detected according to the detection signal of the detection coil 4; once the defect is determined by axial scanning, starting a driver of the annular eccentric device 1 to enable the movable rod (6) to stretch and contract and change angles, controlling the rotating frame 8 to drive the eddy Bobbin probe device 2 to perform eccentric motion, fixing the lifting distance after the lifting distance is reduced to a certain value, performing annular eccentric scanning and recording a detection signal output by the detection coil 4;
and finally, determining the circumferential information and the depth information of the defect in the pipe wall of the small-diameter pipe to be detected according to the detection signal of the detection coil 4 in the circumferential scanning, and recording the axial position information of the defect in the small-diameter pipe to be detected.

Claims (5)

1. The utility model provides a ring off-centre eddy current probe to small diameter pipe defect detection which characterized in that: the eddy current Bobbin probe device comprises an eddy current Bobbin probe device (2) and annular eccentric devices (1) arranged at two ends of the eddy current Bobbin probe device (2), wherein the eddy current Bobbin probe device (2) is composed of a columnar framework (5), and an excitation coil (3) and a detection coil (4) which are wound on the framework (5) and are not in contact with each other; the annular eccentric device is composed of a movable rod (6), a fixed frame (7) and a rotating frame (8), and the cylindrical rotating frame (8) is inserted into a framework (5) of the eddy Bobbin probe device (2) and fixedly connected with the framework; the fixed frame (7) is hollow column-shaped, the rotating frame (8) is positioned in the fixed frame (7), the movable rods (6) are a plurality of and can extend and retract along the axial direction of the movable rods, the movable rods (6) are arranged between the rotating frame (8) and the fixed frame (7) along the radial direction, the fixed frame (7) is connected by a ball body at the outer end part of the movable rod (6) buckled by a groove at the inner side of the fixed frame, so that the movable rod (6) can rotate, the fixed frame (7) does not move along with the movable rod (6), the rotary frame (8) is connected by buckling a ball at the inner end of the movable rod (6) by a groove at the outer side of the rotary frame, so that the movable rod (6) can rotate to drive the rotating frame (8) to rotate, a driver is arranged on the rotating frame (8), the extension and the angle change of the movable rod (6) are controlled by the driver to further realize the eccentric motion and the circular motion of the eddy Bobbin probe device (2), adjusting the radial eccentric lift-off distance of the annular eccentric eddy current probe relative to the inner wall of the pipeline to be detected; when the device works, the fixing frame (7) is attached to the inner wall of the small-diameter pipe to be measured.
2. The annular eccentric eddy current probe for the defect detection of the small-diameter pipe according to claim 1, wherein: the exciting coil (3) and the detecting coil (4) are formed by spirally and densely winding enameled wires on the framework (5).
3. The annular eccentric eddy current probe for the defect detection of the small-diameter pipe according to claim 1, wherein: the skeleton (5) is made of PVC.
4. The annular eccentric eddy current probe for the defect detection of the small-diameter pipe according to claim 1, wherein: the number of the movable rods (6) is eight, and the movable rods are uniformly arranged between the rotating frame (8) and the fixed frame (7) along the radial direction.
5. The method for detecting the defects of the annular eccentric eddy current probe aiming at the defect detection of the small-diameter pipe as claimed in any one of claims 1 to 4, wherein:
firstly, the eddy current Bobbin probe device (2) and the corresponding annular eccentric device (1) are installed in a matched mode, wherein after the eddy current Bobbin probe device (2) is installed initially, the eddy current Bobbin probe device is kept in a non-eccentric state relative to the small-diameter pipe to be detected during axial scanning, the probe is placed into the small-diameter pipe to be detected, and the lifting distance of the installed eddy current Bobbin probe device (2) is guaranteed to be an effective value capable of detecting defects;
secondly, a steady-state sinusoidal excitation current is continuously introduced into the excitation coil (3), the sinusoidal excitation current can generate an alternating magnetic field in the small-diameter pipeline to be detected, and the alternating magnetic field can induce an alternating eddy current field in the pipeline wall; when the pipe wall has defects, the eddy current field is disturbed by the defects to change, and further, a secondary magnetic field induced by the eddy current field also changes, so that a detection signal in the detection coil (4) changes; determining defect information in the pipe wall by detecting changes in the signal in the coil (4);
then, continuously scanning without eccentricity along the axial direction of the small-diameter pipe to be detected by using the annular eccentric eddy Bobbin probe, and determining the axial information of the defect in the small-diameter pipe to be detected according to a detection signal of the detection coil (4); once the defect is determined by axial scanning, starting a driver of the annular eccentric device (1) to enable the movable rod (6) to stretch and contract and change angles, controlling the rotating frame (8) to drive the eddy Bobbin probe device (2) to do eccentric motion, fixing the lift-off distance after the lift-off distance is reduced to a preset value, performing annular eccentric scanning and recording a detection signal output by the detection coil (4);
and finally, determining the circumferential information and the depth information of the defect in the pipe wall of the small-diameter pipe to be detected according to the detection signal of the coil (4) detected in the circumferential scanning, and recording the axial position information of the defect in the small-diameter pipe to be detected.
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CN112067690B (en) * 2020-08-28 2022-05-06 西安交通大学 Inclined axial array annular eccentric eddy current probe and method for small-diameter pipe detection
CN112014458A (en) * 2020-09-04 2020-12-01 中广核检测技术有限公司 Eddy current probe set and method for detecting defects of small-diameter pipe

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US4808927A (en) * 1987-02-19 1989-02-28 Atomic Energy Of Canada Limited Circumferentially compensating eddy current probe with alternately polarized receiver coil
US8390278B2 (en) * 2009-10-20 2013-03-05 Westinghouse Electric Company Llc Eddy current inspection probe for inspecting the interior of a tubular member
CN103247357B (en) * 2013-03-29 2015-06-03 西安交通大学 Online nondestructive testing method of multilayer sleeve structure eccentricity of internal ITER (International Thermonuclear Experimental Reactor) coil
CN103341530B (en) * 2013-07-12 2014-12-10 安徽工业大学 Slewing bearing ferrule circular degree error automatic detection and correction device
CN105806934A (en) * 2014-12-30 2016-07-27 中核武汉核电运行技术股份有限公司 Array probe for eddy current multiplexing
CN106770636B (en) * 2017-01-18 2018-03-13 西安交通大学 A kind of magnetic drives formula Array eddy-current probe and method for defect inspection

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