CN109031101B - Mass production test circuit for AGC output power of power amplifier - Google Patents
Mass production test circuit for AGC output power of power amplifier Download PDFInfo
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a mass production test circuit of AGC output power of a power amplifier, wherein a first test resistor RDFT1 and a first switch S1 are connected in series at the input end of a first amplifier AMP1, a resistor second test resistor RDFT2 and a first switch S1 are connected in series at the feedback end, wherein the first switch S1 is controlled by an EN_ MASSTEST control signal, and when the power amplifier works normally, the first switch S1 is closed, and the first test resistor RDFT1 and the second test resistor RDFT2 are short-circuited; when the output power of the test power amplifier AGC is tested in mass production, the EN_ MASSTEST control signal is low, the first switch S1 is disconnected, and the first test resistor RDFT1 and the second test resistor RDFT2 are connected. The invention can accurately test the AGC output power value by only adopting single-point test, thereby greatly saving the test time of mass production, improving UPH and increasing the productivity.
Description
Technical Field
The invention relates to the technical field of semiconductor integrated circuits, in particular to a mass production test circuit for AGC output power of a power amplifier.
Background
Chip mass production testing is a very serious problem, directly penetrating through the whole chip design and mass production process, and after the chip packaging is completed, a special Automatic Test Equipment (ATE) is required to test whether the functions and performances of the manufactured chip meet the design specification requirements. Therefore, the chip mass production test can comprise various contents such as direct current parameter test, functional test, mixed signal parameter test and the like, and different types of chips have different requirements on the test. With the progress of chip technology, integrated functions on a chip are more and more complex, test items of the chip are more and more, and test time is longer and longer, which means that test cost of the chip is increased and cost of the chip is increased.
In order to reduce the test time of the chip, improve UPH, increase productivity and save test cost, a test mode which does not affect the normal operation of the chip needs to be designed in the chip. However, with the development of light and thin portable devices, the requirements of speakers on the power variation range are also increasing, and the fluctuation range of the power center value of the required power amplifier is limited to +/-10%. If the output power of the power amplifier exceeds the limit range, the loudspeaker is damaged, and the loudspeaker belongs to a reliable quality accident, so that the fluctuation range of the central value of the AGC power is limited within +/-10% by considering the fluctuation range of a burner of a processing technology and the fluctuation range of related parameters during design.
Therefore, how to accurately test the AGC power value of the power amplifier during mass production test, and select the chip test meeting the AGC power mass production specification of the power amplifier, so that the mass production test time is greatly saved, the UPH is improved, and the productivity is increased, which is a problem to be solved urgently by those skilled in the art.
Disclosure of Invention
In view of this, the present invention provides a mass production test circuit for AGC output power of a power amplifier,
In order to achieve the above purpose, the present invention provides the following technical solutions:
a mass production test circuit for AGC output power of a power amplifier comprises: the device comprises a pre-amplifying module, a PWM modulation module and a gain adjustment module, wherein:
The pre-amplification module comprises: a first amplifier (Amp 1), a first feedback resistor (RF 1), a first capacitor (C1), a first resistor (R1), a first test resistor (RDFT 1), a second test resistor (RDFT 2) and a first switch (S1), wherein an inverting input (-) and a forward input (+) of the first amplifier (Amp 1) receive voltage input signals through the first test resistor (RDFT 1), the first resistor (R1) and the first capacitor (C1), respectively; the first feedback end and the second feedback end of the first amplifier (Amp 1) are respectively connected with the inverting input end (-) and the forward input end (+) of the first amplifier (Amp 1) through the first feedback resistor (RF 1) and the second test resistor (RDFT 2); the first switch (S1) is respectively connected with the first test resistor (RDFT 1) and the second test resistor (RDFT 2); the first switch (S1) is controlled by an EN_ MASSTEST control signal, and a first feedback end and a second feedback end of the first amplifier (Amp 1) are respectively used as a first output end and a second output end of the pre-amplification module; when the output power of the power amplifier AGC is tested in a mass production test, the EN_ MASSTEST control signal goes low, the first switch (S1) is disconnected, and the first test resistor (RDFT 1) and the second test resistor (RDFT 2) are connected;
The PWM modulation module is used for converting the analog signal into a PWM signal and driving a power tube, and sending the output power of the AGC to a load;
The gain adjustment module is used for detecting the output voltage of the pre-amplification module, comparing the output voltage of the pre-amplification module with a reference voltage, generating a corresponding control code according to a comparison result to control the first feedback resistor (RF 1), determining the output voltage of the first amplifier (Amp 1) according to the comparison result, modulating by the PWM modulation module, and limiting the output power of the power amplifier AGC.
Further, the PWM modulation module includes: a second amplifier (Amp 2), a feedback resistor RF2, a second capacitor (CF 2), a second resistor (R2), a comparator (Comp), a PWM modulation circuit (21), and a triangular wave generator (22), wherein:
The inverting input (-) and the forward input (+) of the second amplifier (Amp 2) are respectively connected with the first output and the second output of the pre-amplification module through the second resistor (R2); the first output end and the second output end of the second amplifier (Amp 2) are respectively connected with the inverting input end (-) and the forward input end (+) of the second amplifier (Amp 2);
The first output end and the second output end of the second amplifier (Amp 2) are respectively connected with the first input end of the comparator (Comp); the second input end of the comparator (Comp) is connected with the triangular wave generator (22), the output end of the comparator (Comp) is connected with the input end of the PWM modulation circuit (21), and the output end of the PWM modulation circuit (21) is used as the output end of the PWM modulation module to be connected with a load;
The output end of the PWM modulation circuit (21) is respectively connected with the inverting input end (-) and the forward input end (+) of the second amplifier (Amp 2) through the feedback resistor RF 2.
Further, the gain adjustment module includes: gain adjustment comparator, reference level circuit and up-down counter, wherein:
The gain adjustment comparator detects the output voltage of the pre-amplification module, receives the reference voltage of the reference level circuit, and compares the output voltage of the pre-amplification module with the reference voltage;
the up-down counter generates a corresponding control code to control the first feedback resistor (RF 1) according to a comparison result, the comparison result determines the output voltage of the first amplifier (Amp 1), and the output power of the power amplifier AGC is limited through the amplification of the second amplifier (Amp 2) and the modulation of the PWM modulation module.
Further, the first amplifier (Amp 1) and the second amplifier (Amp 2) are operational amplifiers.
Further, the second test resistance (RDFT 2) is used to reduce the compression step.
Further, the first test resistor (RDFT 1) is used for keeping the gain of the power amplifier AGC unchanged after the second test resistor (RDFT 2) is added.
Compared with the prior art, the invention discloses a mass production test circuit for AGC output power of a power amplifier, wherein a first test resistor RDFT1 and a first switch S1 are connected in series to the input end of a first amplifier AMP1, a second test resistor RDFT2 and the first switch S1 are connected in series to the feedback end, wherein the first switch S1 is controlled by EN_ MASSTEST control signals, and when the power amplifier works normally, the first switch S1 is closed to short the first test resistor RDFT1 and the second test resistor RDFT2; when the output power of the AGC is tested in a mass production test, the EN_ MASSTEST control signal is low, the first switch S1 is disconnected, the first test resistor RDFT1 and the second test resistor RDFT2 are connected, wherein the second test resistor RDFT2 is used for reducing compression steps, so that the sawtooth wave amplitude of the AGC compression curve is small, the stability and accuracy of power in single-point test are facilitated, and the gain of the whole power amplifier is kept unchanged after the first test resistor RDFT1 is added into the second test resistor RDFT 2. The invention can accurately test the AGC output power value by only adopting single-point test, thereby greatly saving the test time of mass production, improving UPH and increasing the productivity.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required to be used in the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only embodiments of the present invention, and that other drawings can be obtained according to the provided drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a mass production test circuit of a conventional AGC output power of a power amplifier provided in the prior art;
Fig. 2 is a waveform diagram of AGC gain compression provided in the prior art;
Fig. 3 is a schematic diagram of a mass production test circuit for AGC output power of a power amplifier according to an embodiment of the present invention;
Fig. 4 is a waveform diagram comparing AGC compression power of a mass production test circuit for AGC output power of a power amplifier and a conventional mass production test circuit for AGC output power of a power amplifier according to an embodiment of the present invention.
Detailed Description
In audio applications, the input signal is too large or the battery voltage drops, which may cause the output signal of the audio amplifier to be distorted, and may cause permanent damage to the speaker. Therefore, in order to protect the speaker and improve the effect of music playing, the audio amplifier generally has a dynamic gain adjustment function (called AGC or NCN) similar to a compression function or a clipping function in audio processing. As shown in fig. 1, when the input audio signal increases, the output power of the power amplifier increases, and when the output power exceeds the internally set protection threshold power, the internal gain of the power amplifier is automatically reduced, so that the output power is limited at the threshold power; when the input audio signal is reduced, the output power of the power amplifier is reduced, and when the output power is reduced to the release threshold power set in the interior, the internal gain of the power amplifier is automatically recovered, so that the output of the power amplifier does not exceed the set output power range. For music signals, generally variations within 1dB are not easily perceived, so the compression step of AGC is typically designed to be within 1dB, typically around 0.5 dB.
In the audio power amplifier shown in fig. 1, AMP1 is a pre-amplifier for adjusting gain; AMP2, R2 and CF2 constitute an integrator; COMP is a comparator for comparing the output of AMP2 with the triangular wave generated by the triangular wave generator, converting the analog signal into a PWM signal, and driving the power tube by the PWM modulation circuit to transmit power to the speaker terminal.
The gain adjustment module determines whether the gain adjustment module is started or not by detecting outputs VON1 and VOP1 of AMP1 and comparing the detected outputs with a reference voltage generated by a reference level circuit through a gain adjustment comparator in the gain adjustment module, an up-down counter of the gain adjustment module generates a corresponding control code to control a first-stage feedback resistor RF1, the comparison level determines the output voltage of AMP1, and the output power of AGC is limited after performing a second-stage amplification and PWM modulation circuit through AMP 2.
Fig. 2 is a gain compression waveform diagram of the AGC in the prior art, which is a compression curve of output power and input signal amplitude when the function of the gain adjustment module is activated, wherein the abscissa is the input signal amplitude (V), and the ordinate is the output power size (W). When the output signal is greater than the upper edge of the window, i.e., the peak power, the signal starts to compress by 0.5dB, the signal continues to increase, the AGC recompresses by 0.5dB, and the AGC is in a compressed state, and the output power does not continue to increase linearly until the amplitude of the input signal is greater than the compression range of the AGC. When the input signal is smaller than the lower edge of the window, the AGC starts to release 0.5dB, the gain becomes larger, the output signal becomes larger, if the input signal continues to decrease, the AGC releases 0.5dB again, the AGC is in a release state, and the output power does not continue to linearly decrease until the input signal is smaller than the release threshold of the AGC. The maximum power of the AGC compression process is determined by the upper edge of the window and is mainly affected by circuit mismatch.
In the mass production test of the power amplifier, the AGC output power is the most important test index, and in the curve of FIG. 2, if the reference voltage generated by the reference level circuit changes along with the process burner, the compression curve moves up and down; if the gain is deviated, the compression curve moves left and right, so that the volume production test is required to accurately test the variation of the AGC output power along with the process, and ensure that the output chip meets the requirement of the AGC output power range.
Therefore, in order to accurately test the AGC output power, it is necessary to test the AGC output power multiple times, then average to calculate a center value of the AGC output power, and then convert the power center value into a power peak value. The reason for this is that: the compression step of AGC is 0.5dB/step, for output amplitude, the variation range is 6%, the central value is ±3%, the output power is changed to ±6%, and for factors such as the process corn variation range of the reference voltage and the mismatch of the resistor, which have a great influence on the output power, the general influence is ±5%, if only a single point test is adopted, that is, the input signal corresponding to a certain point of the compression curve is used to obtain the output power, the variation range of the output power value obtained by the test is ±11%, and the output power of AGC cannot be accurately tested, therefore, the conventional test will adopt a mode of multiple tests, and then the average value is obtained, for example: and determining 8 test points on the compression curve of the AGC, corresponding to 8 input signals and 8 output powers, taking the average value of the 8 output powers to obtain a power center value, and converting to obtain a power peak value.
The AGC output power of the power amplifier can be accurately tested by adopting a mode of multiple tests, but the test time is very occupied, the very large test cost is increased, and the chip cost is increased. In the 8-point test mode, the test time is about 0.8s, and the test time is increased more as the test output power level is increased.
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
As shown in fig. 3, an embodiment of the present invention provides a mass production test circuit for AGC output power of a power amplifier, the circuit includes: comprising the following steps: a pre-amplification module 1, a PWM modulation module 2 and a gain adjustment module 3, wherein:
The pre-amplification module 1 includes: the first amplifier Amp1, the first feedback resistor RF1, the first capacitor C1, the first resistor R1, the first test resistor RDFT1, the second test resistor RDFT2, and the first switch S1, wherein the inverting input terminal (-) and the forward input terminal (+) of the first amplifier Amp1 receive voltage input signals through the first test resistor RDFT1, the first resistor R1, and the first capacitor C1, respectively; the first feedback end and the second feedback end of the first amplifier Amp1 are respectively connected with the inverting input end (-) and the forward input end (+) of the first amplifier Amp1 through the first feedback resistor RF1 and the second test resistor RDFT2; the first switch S1 is connected to the first test resistor RDFT1 and the second test resistor RDFT2, respectively; the first switch S1 is controlled by an en_ MASSTEST control signal, and a first feedback end and a second feedback end of the first amplifier Amp1 are respectively used as a first output end and a second output end of the pre-amplifier module; when the output power of the power amplifier AGC is tested in a mass production test, the en_ MASSTEST control signal goes low, the first switch S1 is turned off, and the first test resistor RDFT1 and the second test resistor RDFT2 are connected. In addition, when the power amplifier AGC works normally, the first switch S1 is closed, and the first test resistor RDFT1 and the second test resistor RDFT2 are shorted;
The PWM modulation module 2 is used for converting an analog signal into a PWM signal and driving a power tube, and sending the output power of the AGC to a load;
The gain adjustment module 3 is configured to detect an output voltage of the pre-amplifier module, compare the output voltage of the pre-amplifier module with a reference voltage, generate a corresponding control code according to a comparison result to control the first feedback resistor RF1, determine the output voltage of the first amplifier Amp1 according to the comparison result, modulate the output voltage by the PWM modulation module, and limit the output power of the power amplifier AGC.
As shown in fig. 3, the PWM modulation module 2 includes: a second amplifier Amp2, a feedback resistor RF2, a second capacitor CF2, a second resistor R2, a comparator Comp, a PWM modulation circuit 21, and a triangular wave generator 22, wherein:
The inverting input terminal (-) and the forward input terminal (+) of the second amplifier Amp2 are respectively connected with the first output terminal and the second output terminal of the pre-amplifier module through the second resistor R2; the first output end and the second output end of the second amplifier Amp2 are respectively connected with the inverting input end (-) and the forward input end (+) of the second amplifier Amp 2; the first output end and the second output end of the second amplifier Amp2 are respectively connected with the first input end of the comparator Comp; a second input terminal of the comparator Comp is connected to the triangular wave generator 22, an output terminal of the comparator Comp is connected to an input terminal of the PWM modulation circuit 21, and an output terminal of the PWM modulation circuit 21 is connected to a load as an output terminal of the PWM modulation module; the output terminal of the PWM modulation circuit 21 is connected to the inverting input terminal (-) and the forward input terminal (+) of the second amplifier Amp2 through the feedback resistor RF2, respectively.
As shown in fig. 3, the gain adjustment module 3 includes: a gain adjustment comparator 31, a reference level circuit 32, and an up-down counter 33, wherein:
the gain adjustment comparator 31 detects the output voltage of the pre-amplifier module 1, receives the reference voltage of the reference level circuit 32, and compares the output voltage of the pre-amplifier module 1 with the reference voltage; the up-down counter 33 generates a corresponding control code to control the first feedback resistor RF1 according to a comparison result, the comparison result determines the output voltage of the first amplifier Amp1, and the output power of the power amplifier AGC is limited by the amplification of the second amplifier Amp2 and the modulation of the PWM modulation module.
In the embodiment of the present invention, the first amplifier Amp1 and the second amplifier Amp2 are operational amplifiers. The second test resistor (RDFT 2) is used to reduce the compression step. The first test resistor (RDFT 1) is used for keeping the gain of the power amplifier AGC unchanged after the second test resistor (RDFT 2) is added.
In the embodiment of the present invention, when the switch S1 is closed, the compressed waveform of the AGC output power is shown in fig. 2, and each compression step is about 0.5dB, where the expression of the compression step is:
Wherein, R tot,i represents the total feedback resistance before the i-th compression, and R tot,i-1 represents the total feedback resistance after the i-th compression. If R tot,i＝60kohm,Rtot,i-1 =56.5 kohm, the compression factor is: a dB,1 =0.52 dB, i.e. the fluctuation range of the output power of the power amplifier AGC is ±6.17%.
When the output power of the AGC is tested in a mass production mode, an EN_ MASSTEST control signal is disconnected, a first test resistor RDFT1 and a second test resistor RDFT2 are respectively connected into an input resistor string and a feedback resistor string, wherein the second test resistor RDFT2 has the function of reducing compression steps, so that the sawtooth wave amplitude of an AGC compression curve is small, and the stability and the accuracy of power during single-point testing are facilitated; and the first test resistor RDFT1 is used for keeping the gain of the whole power amplifier unchanged after the second test resistor RDFT2 is added. If rdrt=120 kohm, R toti,＝180kohm,Rtot,i-1 =176.5 kohm, the compression multiple is a dB,1 =0.17 dB, that is, the fluctuation range of the output power of the power amplifier AGC is ±1.98%, the power test accuracy is improved by at least 3 times without considering the influence of other factors, and the second test resistor RDFT2 can be further increased to reduce the fluctuation range of the power. The AGC compression power comparison waveforms of the mass production test circuit and the normal test circuit of the present invention are shown in fig. 4.
According to the mass production test circuit for the AGC output power of the power amplifier, the first test resistor RDFT1 and the first switch S1 are connected in series to the input end of the first amplifier AMP1, the resistor second test resistor RDFT2 and the first switch S1 are connected in series to the feedback end, the first switch S1 is controlled by an EN_ MASSTEST control signal, and when the power amplifier works normally, the first switch S1 is closed, and the first test resistor RDFT1 and the second test resistor RDFT2 are short-circuited; when the output power of the AGC is tested in a mass production test, the EN_ MASSTEST control signal is low, the first switch S1 is disconnected, the first test resistor RDFT1 and the second test resistor RDFT2 are connected, wherein the second test resistor RDFT2 is used for reducing compression steps, so that the sawtooth wave amplitude of the AGC compression curve is small, the stability and accuracy of power in single-point test are facilitated, and the gain of the whole power amplifier is kept unchanged after the first test resistor RDFT1 is added into the second test resistor RDFT 2. The invention can accurately test the AGC output power value by only adopting single-point test, thereby greatly saving the test time of mass production, improving UPH and increasing the productivity.
It should be noted that, in the present specification, each embodiment is described in a progressive manner, and each embodiment is mainly described as different from other embodiments, and identical and similar parts between the embodiments are all enough to be referred to each other.
The circuit according to the present invention has been described above by way of example with reference to the accompanying drawings, and the description of the above embodiments is only for aiding in the understanding of the core idea of the present invention. Variations in the detailed description and the application scope will occur to those skilled in the art upon consideration of the teachings of the present invention. In view of the foregoing, this description should not be construed as limiting the invention.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (6)
1. A mass production test circuit for AGC output power of a power amplifier is characterized by comprising: the device comprises a pre-amplifying module, a PWM modulation module and a gain adjustment module, wherein:
The pre-amplification module comprises: a first amplifier (Amp 1), a first feedback resistor (RF 1), a first capacitor (C1), a first resistor (R1), a first test resistor (RDFT 1), a second test resistor (RDFT 2) and a first switch (S1), wherein an inverting input (-) and a forward input (+) of the first amplifier (Amp 1) receive voltage input signals through the first test resistor (RDFT 1), the first resistor (R1) and the first capacitor (C1), respectively; the first feedback end and the second feedback end of the first amplifier (Amp 1) are respectively connected with the inverting input end (-) and the forward input end (+) of the first amplifier (Amp 1) through the first feedback resistor (RF 1) and the second test resistor (RDFT 2); the first switch (S1) is respectively connected with the first test resistor (RDFT 1) and the second test resistor (RDFT 2); the first switch (S1) is controlled by an EN_ MASSTEST control signal, and a first feedback end and a second feedback end of the first amplifier (Amp 1) are respectively used as a first output end and a second output end of the pre-amplification module; when the output power of the power amplifier AGC is tested in a mass production test, the EN_ MASSTEST control signal goes low, the first switch (S1) is disconnected, and the first test resistor (RDFT 1) and the second test resistor (RDFT 2) are connected;
The PWM modulation module is used for converting the analog signal into a PWM signal and driving a power tube, and sending the output power of the AGC to a load;
The gain adjustment module is used for detecting the output voltage of the pre-amplification module, comparing the output voltage of the pre-amplification module with a reference voltage, generating a corresponding control code according to a comparison result to control the first feedback resistor (RF 1), determining the output voltage of the first amplifier (Amp 1) according to the comparison result, modulating by the PWM modulation module, and limiting the output power of the power amplifier AGC.
2. The circuit of claim 1, wherein the PWM modulation module comprises: a second amplifier (Amp 2), a feedback resistor RF2, a second capacitor (CF 2), a second resistor (R2), a comparator (Comp), a PWM modulation circuit (21), and a triangular wave generator (22), wherein:
the inverting input (-) and the forward input (+) of the second amplifier (Amp 2) are respectively connected with the first output end and the second output end of the pre-amplification module through the second resistor (R2); the first output end and the second output end of the second amplifier (Amp 2) are respectively connected with the inverting input end (-) and the forward input end (+) of the second amplifier (Amp 2);
The first output end and the second output end of the second amplifier (Amp 2) are respectively connected with the first input end of the comparator (Comp); the second input end of the comparator (Comp) is connected with the triangular wave generator (22), the output end of the comparator (Comp) is connected with the input end of the PWM modulation circuit (21), and the output end of the PWM modulation circuit (21) is used as the output end of the PWM modulation module to be connected with a load;
The output end of the PWM modulation circuit (21) is respectively connected with the inverting input end (-) and the forward input end (+) of the second amplifier (Amp 2) through the feedback resistor RF 2.
3. The circuit of claim 2, wherein the gain adjustment module comprises: gain adjustment comparator, reference level circuit and up-down counter, wherein:
The gain adjustment comparator detects the output voltage of the pre-amplification module, receives the reference voltage of the reference level circuit, and compares the output voltage of the pre-amplification module with the reference voltage;
the up-down counter generates a corresponding control code to control the first feedback resistor (RF 1) according to a comparison result, the comparison result determines the output voltage of the first amplifier (Amp 1), and the output power of the power amplifier AGC is limited through the amplification of the second amplifier (Amp 2) and the modulation of the PWM modulation module.
4. The circuit according to claim 2, characterized in that the first amplifier (Amp 1) and the second amplifier (Amp 2) are operational amplifiers.
5. A circuit according to claim 1, characterized in that the second test resistance (RDFT 2) is used to reduce the compression step.
6. A circuit according to claim 1, characterized in that the first test resistor (RDFT 1) is arranged to keep the gain of the power amplifier AGC unchanged after adding the second test resistor (RDFT 2).
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| CN109586676B (en) * | 2019-01-24 | 2024-07-26 | 江门市川琪科技有限公司 | Full-load automatic gain matching power amplifier |
| CN111665391B (en) * | 2019-03-08 | 2022-11-25 | 杭州海康威视数字技术股份有限公司 | Power level detection device |
| CN113945828B (en) * | 2021-10-19 | 2024-10-18 | 北京中电华大电子设计有限责任公司 | Low-cost analog test circuit with offset calibration |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN208537688U (en) * | 2018-08-13 | 2019-02-22 | 上海艾为电子技术股份有限公司 | A kind of volume production test circuit of power amplifier AGC output power |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05340982A (en) * | 1992-06-11 | 1993-12-24 | Fuji Electric Co Ltd | Tester and testing method for pwm power amplifier |
| CN1610833A (en) * | 2001-11-26 | 2005-04-27 | 皇家飞利浦电子股份有限公司 | Test machine for testing an integrated circuit with a comparator |
| JP4087684B2 (en) * | 2002-11-18 | 2008-05-21 | 株式会社ルネサステクノロジ | Semiconductor integrated circuit for communication and offset correction method for amplifier |
| CN100582801C (en) * | 2007-11-29 | 2010-01-20 | 中兴通讯股份有限公司 | Batch detector methods and apparatus of power amplifier |
| JP2010122149A (en) * | 2008-11-21 | 2010-06-03 | Yokogawa Electric Corp | Dc module and semiconductor-testing device using the same |
| CN101764579B (en) * | 2009-11-24 | 2012-07-04 | 上海贝岭股份有限公司 | Gain-adjustable audio power amplifier circuit |
| JP2012205212A (en) * | 2011-03-28 | 2012-10-22 | Mitsubishi Electric Corp | High frequency power amplification device |
| CN203596902U (en) * | 2013-12-05 | 2014-05-14 | 无锡焺通微电子有限公司 | Audio frequency power amplification integrated circuit chip having linear power volume control function |
| CN104485910B (en) * | 2014-12-31 | 2017-12-19 | 上海艾为电子技术股份有限公司 | Gain control method and device |
| CN104767498B (en) * | 2015-04-30 | 2017-07-21 | 上海艾为电子技术股份有限公司 | Gain control method and device |
| CN106533583B (en) * | 2015-09-14 | 2019-04-09 | 上海原动力通信科技有限公司 | The quickly method and device of test power amplifier 1dB compression point |
| CN106936402A (en) * | 2015-12-31 | 2017-07-07 | 无锡华润矽科微电子有限公司 | Power control circuit |
| CN106019113A (en) * | 2016-05-25 | 2016-10-12 | 陕西开尔文测控技术有限公司 | Testing circuit using PWM to control IGBT power amplifier |
| US9948185B2 (en) * | 2016-06-10 | 2018-04-17 | Dialog Semiconductor (Uk) Limited | Fast-transient switching converter with type III compensation |
| CN106656065A (en) * | 2016-11-16 | 2017-05-10 | 上海艾为电子技术股份有限公司 | Audio power amplifier and audio device |
| CN206546404U (en) * | 2017-03-17 | 2017-10-10 | 石家庄市凯拓电子技术工程公司 | A kind of level pressure power amplifier short-circuit detecting circuit based on comparator |
-
2018
- 2018-08-13 CN CN201810916519.2A patent/CN109031101B/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN208537688U (en) * | 2018-08-13 | 2019-02-22 | 上海艾为电子技术股份有限公司 | A kind of volume production test circuit of power amplifier AGC output power |
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