CN109001538A - A method of reaching high-acruracy survey resistance using non-accurate device - Google Patents
A method of reaching high-acruracy survey resistance using non-accurate device Download PDFInfo
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- CN109001538A CN109001538A CN201811177807.7A CN201811177807A CN109001538A CN 109001538 A CN109001538 A CN 109001538A CN 201811177807 A CN201811177807 A CN 201811177807A CN 109001538 A CN109001538 A CN 109001538A
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- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000005070 sampling Methods 0.000 claims abstract description 26
- 238000012360 testing method Methods 0.000 claims description 24
- 238000005259 measurement Methods 0.000 abstract description 6
- 230000000694 effects Effects 0.000 abstract description 2
- 238000000691 measurement method Methods 0.000 abstract description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
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- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a kind of method for reaching high-acruracy survey resistance using non-accurate device, measurement method includes circuit design, and circuit switching and data calculate three aspects.Circuit mainly needs to include a switch, reference point and the multinomial switched design of measurement point, circuit switching mainly includes switch selection switching, it mainly includes passing through computer sampling data that data, which calculate aspect, multi-group data is obtained, for calculating the resistance value of tested point, this method can effectively avoid measurement caused by circuit loss from being lost, achieve the effect that reduce cost by replacing high precision reference source simultaneously, is completed at the same time high-precision measurement.
Description
Technical field
It is the present invention relates to Precision Inspection field, in particular to a kind of to reach high-acruracy survey electricity using non-accurate device
The method of resistance.
Background technique
High-acruracy survey equipment on the market requires to use an even multiple high-precision a reference sources at present, and leads to
Often similar a reference source is all that the price is very expensive, leads to the increase that production cost is additional, while the difference of circuit can also make
The output of a reference source has differences, and the problem of circuit loss occurs, to influence the accuracy of test, further environmental factor
Corresponding interference is also had to a reference source, while increasing the expense of maintenance and maintenance.
Summary of the invention
The technical problem to be solved by the present invention is to provide a kind of methods for reaching accurate measurement resistance using non-high precision component.
The technical solution adopted by the present invention to solve the technical problems is: a kind of to reach high-precision survey using non-accurate device
The method for measuring resistance, it is characterised in that: further include testing resistance and multiple reference resistances, institute including constant-current source and selection switch
Testing resistance and multiple reference resistance one end are stated by selecting switch to connect with the anode of constant-current source, the testing resistance and multiple
The other end of reference resistance is connect with the negative terminal of constant-current source, so that constant-current source can only provide constant-current source to a resistance every time,
It further include computer and sampling module, the sampling module is connect with testing resistance and multiple reference resistances, the first reference point, the
Two ..., N reference point and tested point, the sampling module are used to sample the voltage value of each resistance, the sampling module and choosing
Switch is selected to connect with computer；
Specific steps are as follows:
(1) Rn that multiple reference resistances is denoted as R1, R2 ..., testing resistance are denoted as R, and Constant current input electric current is I, by ohm
Law, the voltage value of V1 to Vn, Vn=IRn, by the sampling to voltage V, available sample magnitude is recorded as A, thus may be used
Know through multi-point sampling V1~Vn, can be obtained (A1, R1) ..., (An, Rn) multi-group data；
(2) by known two o'clock, slope-intercept form formula, y=kx+b can be learnt；
Formula k=(R1-R2)/(A1-A2), b=A2* (R2-R1)/(A1-A2)；Y is expressed as resistance value, and x is expressed as
Sampled value；
Tested point sampled value x is substituted into formula it can be concluded that tested point resistance value by the expression formula.
Further, (A1, the R1) ..., the data of (An, Rn), can to same reference point in order to improve precision
A value, A=(A1+A2+ ...+An)/n are calculated to carry out multiple repairing weld.
Further, passing through mean value A, it is known that variance s=((A1-A) ^2+ ...+(An-A) ^2)/N；
The precision measured known to the variance s.
Further, when resistance value to be measured is known resistance value R=R ', and make reference point resistance R1=R2 ...=Rn=
R'；
Above-mentioned R1 is calculated ..., the correspondence sampled value A1 of Rn ..., mean value=A of An；
By above-mentioned mean value and reference point resistance, y=R '/A*x is obtained；
Above-mentioned y is resistance value, and x is sampled value；
By the multiple repairing weld to testing resistance R, the sampling mean value of testing resistance R is calculated, obtains y value according to calculation；
It is E=(standard value-test value) by the above-mentioned error range that is calculated；
E1 ..., En can be repeatedly calculated in the E, it can be deduced that standard error, that is, root-mean-square error value
The beneficial effects of the present invention are: cost needed for present invention reduction production equipment, reduces environment to caused by measurement
It influences, reaches low cost, high-precision test effect.
Detailed description of the invention
Fig. 1 is that Fig. 1 is a kind of switching circuit schematic diagram that the embodiment of the present disclosure provides；
Fig. 2 is a kind of flow diagram that the embodiment of the present disclosure provides.
In the figure, it is marked as
Specific embodiment
The present invention is further described with reference to the accompanying drawings and detailed description.
A kind of method being reached high-acruracy survey resistance using non-accurate device as depicted in figs. 1 and 2, feature are existed
In: including constant-current source and selection switch, the selection switchs and is denoted as k, further includes testing resistance and multiple reference resistances, it is described to
Measuring resistance and multiple reference resistance one end are by selecting switch to connect with the anode of constant-current source, the testing resistance and multiple references
The other end of resistance is connect with the negative terminal of constant-current source, so that constant-current source can only provide constant-current source to a resistance every time, is also wrapped
Computer and sampling module are included, the sampling module is connect with testing resistance and multiple reference resistances, the first reference point, the
Two ..., N reference point and tested point, the sampling module are used to sample the voltage value of each resistance, the sampling module and choosing
Switch is selected to connect with computer；
Specific steps are as follows:
(1) Rn that multiple reference resistances is denoted as R1, R2 ..., testing resistance are denoted as R, and Constant current input electric current is I, by ohm
Law, the voltage value of V1 to Vn, Vn=IRn, by the sampling to voltage V, available sample magnitude is recorded as A, thus may be used
Know through multi-point sampling V1~Vn, can be obtained (A1, R1) ..., (An, Rn) multi-group data；
(2) by known two o'clock, slope-intercept form formula, y=kx+b can be learnt；
Formula k=(R1-R2)/(A1-A2), b=A2* (R2-R1)/(A1-A2)；Y is expressed as resistance value, and x is expressed as
Sampled value；
Tested point sampled value x is substituted into formula it can be concluded that tested point resistance value by the expression formula.
On the basis of the above, described (A1, R1) ..., the data of (An, Rn) are in order to improve precision, to same reference point,
It can carry out multiple repairing weld and calculate A value, A=(A1+A2+ ...+An)/n.
On the basis of the above, pass through mean value A, it is known that variance s=((A1-A) ^2+ ...+(An-A) ^2)/N；
The precision measured known to the variance s.
The above method can measure the determinand of known resistance value simultaneously, when resistance value to be measured is known resistance value R=R ', and make
It must join
Examination point resistance R1=R2 ...=Rn=R '；
Above-mentioned R1 is calculated ..., the correspondence sampled value A1 of Rn ..., mean value=A of An；
By above-mentioned mean value and reference point resistance, y=R '/A*x is obtained；
Above-mentioned y is resistance value, and x is sampled value；
By the multiple repairing weld to testing resistance R, the sampling mean value of testing resistance R is calculated, obtains y value according to calculation；
It is E=(standard value-test value) by the above-mentioned error range that is calculated；
E1 ..., En can be repeatedly calculated in the E, it can be deduced that standard error, that is, root-mean-square error value
The measurement method provided below in conjunction with attached drawing the embodiment of the present disclosure is described in detail.
By attached drawing 2, as seen from the figure, by controlling computer, operating selection switch C20 carries out switch plate and selects work.
Sampling module C30 is controlled by computer again to be sampled, and is obtained first and is referred to point data.
Further, control sheet selects C20 transfer strip to select, and repeats the above steps, obtains new reference point data.
Further, it repeats the above steps, finally obtains point data to be measured.
Table 1 is the instance data of the unknown resistance to be measured of this example, this example maximum reference resistance 15K, minimum reference
Resistance is 1K, and determinand resistance is unknown, is temporarily designated as R.
Table 1
Byway formula formula y=25.23x-12 is obtained by icon data；
The substitution of R sampling to be measured is calculated into y=25.23x397-12=10004；
It is (10004-10000)/10000=0.04% that measurement resulting value, which obtains range differences,；
It should be noted that the mode that measures of the resistance value of known R to be measured can with the associated description in reference, repetition
Details are not described herein at place.
Particular embodiments described above has carried out further in detail the purpose of the present invention, technical scheme and beneficial effects
It describes in detail bright, it should be understood that the above is only a specific embodiment of the present invention, is not intended to restrict the invention, it is all
Within the spirit and principles in the present invention, any modification, equivalent substitution, improvement and etc. done should be included in guarantor of the invention
Within the scope of shield.
Claims (4)
1. a kind of method for reaching high-acruracy survey resistance using non-accurate device, it is characterised in that: including constant-current source and selection
Switch, further includes testing resistance and multiple reference resistances, and the testing resistance and multiple reference resistance one end pass through selection switch
It is connect with the anode of constant-current source, the other end of the testing resistance and multiple reference resistances is connect with the negative terminal of constant-current source, is made
Constant-current source can only provide constant-current source to resistance every time, further include computer and sampling module, the sampling module with to
Measuring resistance is connected with multiple reference resistances, the first reference point, and second ..., N reference point and tested point, the sampling module are used
In the voltage value for sampling each resistance, the sampling module and selection switch are connect with computer；
Specific steps are as follows:
(1) Rn that multiple reference resistances is denoted as R1, R2 ..., testing resistance are denoted as R, and Constant current input electric current is I, are determined by ohm
Rule, the voltage value of V1 to Vn, Vn=IRn, by the sampling to voltage V, available sample magnitude is recorded as A, it can thus be appreciated that
By multi-point sampling V1~Vn, can be obtained (A1, R1) ..., (An, Rn) multi-group data；
(2) by known two o'clock, slope-intercept form formula, y=kx+b can be learnt；
Formula k=(R1-R2)/(A1-A2), b=A2* (R2-R1)/(A1-A2)；Y is expressed as resistance value, and x is expressed as sampling
Value；
Tested point sampled value x is substituted into formula it can be concluded that tested point resistance value by the expression formula.
2. a kind of method for reaching high-acruracy survey resistance using non-accurate device as described in claim 1, it is characterised in that:
(A1, the R1) ..., the data of (An, Rn), to same reference point, can carry out multiple repairing weld and calculate A to improve precision
Value, A=(A1+A2+ ...+An)/n.
3. a kind of method for reaching high-acruracy survey resistance using non-accurate device as claimed in claim 2, it is characterised in that:
Pass through mean value A, it is known that variance s=((A1-A) ^2+ ...+(An-A) ^2)/N；
The precision measured known to the variance s.
4. a kind of method for reaching high-acruracy survey resistance using non-accurate device as claimed in claim 3, it is characterised in that:
When resistance value to be measured is known resistance value R=R ', and make reference point resistance R1=R2 ...=Rn=R '；
Above-mentioned R1 is calculated ..., the correspondence sampled value A1 of Rn ..., mean value=A of An；
By above-mentioned mean value and reference point resistance, y=R '/A*x is obtained；
Above-mentioned y is resistance value, and x is sampled value；
By the multiple repairing weld to testing resistance R, the sampling mean value of testing resistance R is calculated, obtains y value according to calculation；
It is E=(standard value-test value) by the above-mentioned error range that is calculated；
E1 ..., En can be repeatedly calculated in the E, it can be deduced that standard error, that is, root-mean-square error value
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811177807.7A CN109001538B (en) | 2018-10-10 | 2018-10-10 | Method for achieving high-precision resistance measurement by using non-precision device |
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| CN201811177807.7A CN109001538B (en) | 2018-10-10 | 2018-10-10 | Method for achieving high-precision resistance measurement by using non-precision device |
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| CN109001538A true CN109001538A (en) | 2018-12-14 |
| CN109001538B CN109001538B (en) | 2024-03-22 |
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Citations (8)
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|---|---|---|---|---|
| EP0496147A1 (en) * | 1991-01-25 | 1992-07-29 | John Fluke Mfg. Co., Inc. | Method of precise measurement of small resistance values |
| JP2004194304A (en) * | 2002-11-29 | 2004-07-08 | Matsushita Electric Ind Co Ltd | Parameter correction circuit and parameter correction method |
| CN102539001A (en) * | 2010-12-30 | 2012-07-04 | 上海微电子装备有限公司 | Temperature measuring device and temperature measuring method thereof |
| CN104267262A (en) * | 2014-07-22 | 2015-01-07 | 国家电网公司 | High-precision intelligent loop resistance tester |
| CN104330640A (en) * | 2014-11-24 | 2015-02-04 | 武汉大学 | Large scale and high accuracy RLC (radio link control) measurement device and method |
| CN105158575A (en) * | 2015-08-19 | 2015-12-16 | 湘潭大学 | Automatic low resistance test device |
| DE102016202498A1 (en) * | 2016-02-18 | 2017-08-24 | Continental Automotive Gmbh | Measuring resistance calibration device, method for calibrating a measuring resistor and battery sensor |
| CN108008191A (en) * | 2017-11-06 | 2018-05-08 | 湖北三江航天万峰科技发展有限公司 | A kind of precision aid of Minitype resistance |
-
2018
- 2018-10-10 CN CN201811177807.7A patent/CN109001538B/en active Active
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|---|---|---|---|---|
| EP0496147A1 (en) * | 1991-01-25 | 1992-07-29 | John Fluke Mfg. Co., Inc. | Method of precise measurement of small resistance values |
| JP2004194304A (en) * | 2002-11-29 | 2004-07-08 | Matsushita Electric Ind Co Ltd | Parameter correction circuit and parameter correction method |
| CN102539001A (en) * | 2010-12-30 | 2012-07-04 | 上海微电子装备有限公司 | Temperature measuring device and temperature measuring method thereof |
| CN104267262A (en) * | 2014-07-22 | 2015-01-07 | 国家电网公司 | High-precision intelligent loop resistance tester |
| CN104330640A (en) * | 2014-11-24 | 2015-02-04 | 武汉大学 | Large scale and high accuracy RLC (radio link control) measurement device and method |
| CN105158575A (en) * | 2015-08-19 | 2015-12-16 | 湘潭大学 | Automatic low resistance test device |
| DE102016202498A1 (en) * | 2016-02-18 | 2017-08-24 | Continental Automotive Gmbh | Measuring resistance calibration device, method for calibrating a measuring resistor and battery sensor |
| CN108008191A (en) * | 2017-11-06 | 2018-05-08 | 湖北三江航天万峰科技发展有限公司 | A kind of precision aid of Minitype resistance |
Non-Patent Citations (1)
| Title |
|---|
| 华猛;黄伟军;苏朗;肖金球: "基于FPGA的高精度多量程的电阻测量系统设计", 苏州科技大学学报(自然科学版), no. 003, 31 December 2017 (2017-12-31) * |
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