CN109001514B - Parameter measuring and marking method based on three-dimensional waveform mapping image - Google Patents
Parameter measuring and marking method based on three-dimensional waveform mapping image Download PDFInfo
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Abstract
The invention discloses a parameter measurement and marking method based on a three-dimensional waveform mapping image. And then, according to the measured parameters, correspondingly marking and displaying the three-dimensional waveform mapping image. Compared with the traditional software waveform parameter calculation algorithm, the method for calculating the waveform parameters based on the three-dimensional waveform image not only greatly reduces the data transmission amount and the operation processing time, but also solves the problem that software can only calculate the parameters of a single waveform, and can calculate the parameters containing probability information of a plurality of waveforms superposed in a database.
Description
Technical Field
The invention belongs to the technical field of three-dimensional waveform processing, and particularly relates to a parameter measuring and marking method based on a three-dimensional waveform mapping image.
Background
The digital three-dimensional oscilloscope is a novel digital storage oscilloscope with a real-time waveform mapping technology and a three-dimensional display effect, and the displayed waveform not only contains time-amplitude information, but also contains probability information of amplitude appearing along with time. The greater the probability of occurrence of an amplitude value, the darker the waveform color at that amplitude value, as shown in fig. 1. The principle is that high-speed mapping from waveform data to waveform images is realized based on a three-dimensional waveform database which is continuously updated in real time. The digital storage oscilloscope integrates the advantages of an analog oscilloscope and a digital storage oscilloscope, has the functions of signal storage, processing and pre-trigger display of the digital storage oscilloscope, and has the characteristics of real-time capture and three-dimensional display of the analog oscilloscope.
The parameter measurement function is one of the necessary functions of each digital oscilloscope, and the parameter measurement function finally acquires basic parameter information of an input waveform by performing a series of measurement calculations on waveform data input by each physical channel. The basic information comprises amplitude class parameters and time class parameters, wherein the amplitude class parameters generally comprise a top value, a bottom value, an amplitude value, a peak-to-peak value, a maximum value, a minimum value and the like; the time class parameters generally include frequency, period, rise time, fall time, and the like.
The traditional parameter measurement method measures a single waveform, and if a new waveform is acquired, calculation is performed once, so that huge performance overhead of oscilloscope software is caused, and the real-time performance of other functional modules is not guaranteed. Therefore, in order to ensure the optimal overall performance of the oscilloscope software and the user experience, the parameters are generally selected to be recalculated once every fixed time interval, and the measurement flow chart is shown in fig. 2.
According to the conventional waveform parameter measurement principle of the digital oscilloscope in the three-dimensional mapping mode, as shown in fig. 3, collected and received data are simultaneously stored in a hardware system into two waveform data cache regions, wherein waveform data in the first cache region is used for performing a three-dimensional mapping process, waveform data in the second cache region is transmitted into a software system for waveform parameter measurement, and then two processing results are displayed.
When the parameter measurement is carried out by the waveform parameter measurement algorithm, only one waveform can be randomly selected at fixed time intervals for parameter calculation, and the three-dimensional mapping waveform displayed by the liquid crystal screen in real time cannot be accurately measured, so that the waveform parameters obtained by the method have high randomness and uncertainty. Therefore, it is very urgent to accurately identify the relevant parameters of the waveform according to the three-dimensional waveform mapping image and mark the parameters on the image, and the method has very important significance.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a parameter measurement and marking method based on a three-dimensional waveform mapping image, which measures parameters by using a weighted average method and displays the parameters in real time.
In order to achieve the above object, the present invention provides a method for measuring and marking parameters based on a three-dimensional waveform mapping image, comprising the steps of:
(1) and constructing a data matrix D by using the image subjected to the three-dimensional waveform mappingL×MIts corresponding address matrix AL×ML and M are the length of the display area of the corresponding liquid crystal screen, namely the length and width of the database;
(2) according to the data matrix DL×MAnd mapping the address matrix AL×MCalculating the weighted average value of the sampling points in each row;
let the i-th column store an area address of A1～AnThe storage information corresponding to each address is sequentially K1～KnI is more than or equal to 1 and less than or equal to L, then the mapping address X corresponding to the weighted average value of the amplitude values of the sampling points in the ith columni_mean：
At address Xi_meanThe corresponding sampling point amplitude value is:
Yi_mean＝(i·M-1)-Xi_mean(2)
substituting the formula (1) into the formula (2) can obtain the amplitude average value of the data matrix at the ith column as:
similarly, the amplitude average value of the data matrix corresponding to other columns is obtained according to the method;
(3) forming a waveform subjected to column weighted average by the amplitude average values of all the columns, and recording the waveform as a central waveform of the three-dimensional waveform mapping image;
(4) using the data matrix DL×MConstructing an original waveform image frequency distribution histogram, constructing a central waveform frequency distribution histogram by using a central waveform, wherein in the two frequency distribution histograms, an X axis represents an amplitude value contained in a waveform, and a Y axis represents the occurrence statistics times of sampling points;
(5) parameter measurement and marking
(5.1), measuring the most value: in the original waveform image frequency distribution histogram, the extreme left value of the X axis is recorded as the minimum value Y of the waveform amplitudeminThe rightmost end value of the X axis is recorded as the maximum value Y of the waveform amplitudemax；
(5.2), measuring top and bottom values: in the central waveform frequency distribution histogram, the leftmost value of the X axis is recorded as a waveform amplitude bottom value YbottomThe rightmost end value of the X axis is recorded as the top value Y of the waveform amplitudetop；
(5.3), measured amplitude value and peak-to-peak value: in the central waveform, the amplitude value and the peak-to-peak value have the same calculation method, and the difference between the top value and the bottom value of the waveform is recorded as the amplitude value or the peak-to-peak value;
(5.4), measurement average value: calculating an Average value Average in the central waveform frequency distribution histogram:
(5.5), measuring effective value: calculating effective value Y in central waveform frequency distribution histogramRMS：
(5.6), measurement column standard deviation: in the frequency distribution histogram of the central waveform, the standard deviation sigma of the ith sampling pointiComprises the following steps:
wherein N is the number of different amplitude values corresponding to the sampling points in the ith column mapping area, and Y isjIs the jth amplitude in column i;
(5.7), measuring overshoot:
wherein, Ymax、YminMapping the maximum and minimum values, Y, obtained in the image frequency distribution histogram for the three-dimensional waveformtop、YbottomThe top value and the bottom value corresponding to the central waveform;
(5.8), measuring rise and fall times:
assuming that the sampling point at 10% of the waveform amplitude of the rising edge is located in the ith column and the sampling point at 90% of the waveform amplitude is located in the ith' column, then the rising time is:
setting the sampling point at 90% of the waveform amplitude of the falling edge to be positioned in the m-th column, setting the sampling point at 10% of the waveform amplitude to be positioned in the n-th column, and setting the falling time as follows:
wherein, tbaseThe method is a current time base, K is the number of pixel points of each grid of a liquid crystal display area, i ', m and n all belong to L, i is not equal to i', and m is not equal to n;
(6) parameter mark
(6.1), indicia of the most, top and bottom values
According to the minimum value, the maximum value, the top value and the sum in the step (5)Measurement of the bottom value, in turn in the address matrix AL×MSearching each address, marking addresses corresponding to the minimum value, the maximum value, the top value and the bottom value in sequence, and then marking pixel points corresponding to each address by using a triangle;
(6.2) labeling of mean and valid values
According to the measurement results of the average value and the effective value in the step (5), sequentially arranging the average value and the effective value in the address matrix AL×MSearching each address, marking the addresses corresponding to the average value and the effective value in sequence, and marking the pixel points corresponding to each address by using a dotted line.
The invention aims to realize the following steps:
the invention relates to a parameter measurement and marking method based on a three-dimensional waveform mapping image. And then, according to the measured parameters, correspondingly marking and displaying the three-dimensional waveform mapping image. Compared with the traditional software waveform parameter calculation algorithm, the method for calculating the waveform parameters based on the three-dimensional waveform image not only greatly reduces the data transmission amount and the operation processing time, but also solves the problem that software can only calculate the parameters of a single waveform, and can calculate the parameters containing probability information of a plurality of waveforms superposed in a database.
Meanwhile, the parameter measuring and marking method based on the three-dimensional waveform mapping image also has the following beneficial effects:
(1) by carrying out waveform parameter measurement on the mapped waveform image, the limitation of carrying out parameter measurement on a single waveform in the traditional parameter measurement is solved, and waveform parameter measurement containing probability information can be carried out on the superposed multi-waveform, so that the measurement result is closer to the original waveform;
(2) and the waveform parameters obtained by real-time measurement are correspondingly marked at the corresponding positions, so that a user can observe real-time waveform information more intuitively. Meanwhile, as for the parameter marks of the central waveform and the original waveform image, a user can quickly acquire a waveform parameter comparison display result between the real-time mapping waveform and the central waveform.
Drawings
FIG. 1 is a three-dimensional mapping waveform display effect diagram of a digital three-dimensional oscilloscope;
FIG. 2 is a flow chart of a conventional parameter measurement module algorithm;
FIG. 3 is a schematic diagram of a conventional parameter measurement method;
FIG. 4 is a schematic diagram of a parameter measurement and labeling method based on three-dimensional waveform mapping images according to the present invention;
FIG. 5 is a graph of a center waveform after a weighted averaging process;
FIG. 6 is a data frequency distribution histogram of a three-dimensional mapping waveform;
FIG. 7 is a histogram of center waveform frequency distribution;
FIG. 8 is a diagram illustrating various parameters commonly used;
FIG. 9 is a schematic of rise/fall times;
FIG. 10 is a schematic of a maximum value marker;
FIG. 11 is a schematic diagram of a minimum marker;
FIG. 12 is a schematic representation of mean value labeling.
Detailed Description
The following description of the embodiments of the present invention is provided in order to better understand the present invention for those skilled in the art with reference to the accompanying drawings. It is to be expressly noted that in the following description, a detailed description of known functions and designs will be omitted when it may obscure the subject matter of the present invention.
Examples
FIG. 4 is a schematic diagram of a parameter measurement and marking method based on a three-dimensional waveform mapping image according to the present invention.
In this embodiment, as shown in fig. 4, a method for measuring and marking parameters based on a three-dimensional waveform mapping image according to the present invention includes the following steps:
s1, in this embodiment, the three-dimensional waveform to be mapped needs to be received and buffered, then the three-dimensional waveform mapping is performed, and then the three-dimensional waveform mapping is performedData matrix D is constructed by utilizing images subjected to three-dimensional waveform mappingL×MAs shown in Table 1, the corresponding address matrix AL×MAs shown in table 2, wherein L and M are the length of the display area of the corresponding lcd panel, i.e. the length and width of the database;
TABLE 1
TABLE 2
S2, according to the data matrix DL×MAnd mapping the address matrix AL×MCalculating the weighted average value of the sampling points in each row;
TABLE 3
As shown in Table 3, let the area address stored in the i-th column be A1～AnThe storage information corresponding to each address is sequentially K1～KnI is more than or equal to 1 and less than or equal to L, then the mapping address X corresponding to the weighted average value of the amplitude values of the sampling points in the ith columni_mean：
Xi_meanRounded integers are rounded, so the value is the integer value closest to the calculation result;
at address Xi_meanThe corresponding sampling point amplitude value is:
Yi_mean＝(i·M-1)-Xi_mean(2)
substituting the formula (1) into the formula (2) can obtain the amplitude average value of the data matrix at the ith column as:
similarly, the amplitude average value of the data matrix corresponding to other columns is obtained according to the method;
the average value of the amplitude corresponding to each row of sampling points is calculated by formula (3), and represents the average position of each row of sampling points, and for an input signal with gaussian noise, the amplitude value after weighted average has a small measurement error.
S3, as shown in fig. 5, the black curve at the center of the black area is the central waveform of the three-dimensional waveform mapping image, and the waveform is obtained by weighted averaging based on the superimposed waveform image, so that the influence of noise is removed when the central waveform is used to perform parameter calculation, and the calculation result can be more accurate.
S4, using data matrix DL×MConstructing an original waveform image frequency distribution histogram, as shown in fig. 6; constructing a center waveform frequency distribution histogram by using the center waveform, as shown in fig. 7; in the two frequency distribution histograms, the X axis represents the amplitude value contained in the waveform, and the Y axis represents the occurrence statistics times of the sampling points;
s5, parameter measurement and marking
As shown in fig. 8, the basic amplitude class parameters mainly include a maximum value, a minimum value, a top value, a bottom value, a peak-to-peak value, an amplitude value, an average value, a root-mean-square, and the like, which are respectively described in detail below.
S5.1, measuring the most value: since the original mapping waveform image contains all the waveform amplitude values, the determination of the maximum value and the minimum value of the waveform needs to be calculated according to the mapping waveform image. In the original waveform image frequency distribution histogram shown in fig. 6, the leftmost value on the X axis is recorded as the waveform amplitude minimum value YminThe rightmost end value of the X axis is recorded as the maximum value Y of the waveform amplitudemax；
S5.2, measuring a top value and a bottom value: generally, the sampled data is unstable when the waveform changes, and when the waveform is stable, the stable maximum and minimum waveform amplitude values are the top and bottom values of the waveform.
In the figure7, the leftmost value of the X-axis is recorded as the waveform amplitude bottom value YbottomThe rightmost end value of the X axis is recorded as the top value Y of the waveform amplitudetop；
S5.3, measuring an amplitude value and a peak value: the difference between the maximum value and the minimum value of the waveform amplitude represents the signal value change range. Because each column of the original three-dimensional waveform mapping image displays a plurality of sampling points, when the peak-to-peak value is calculated by using the mapping waveform image, the calculation result has larger error due to the fact that each column is in a discrete type with larger amplitude, and therefore the peak-to-peak value is calculated by adopting the central waveform diagram. Similarly, after converting the central waveform diagram into the frequency distribution histogram of the central waveform shown in fig. 7, it can be seen that the maximum value Y _ Mid of the central waveformmaxIs the rightmost amplitude value, Y _ Mid, in FIG. 7minThe leftmost amplitude value in fig. 7, the peak-to-peak value is: y ispp＝Y_Midmax-Y_Midmin(ii) a In the central waveform, the amplitude value and the peak-to-peak value have the same calculation method, and the difference between the top value and the bottom value of the waveform is recorded as the amplitude value or the peak-to-peak value;
s5.4, measuring average value: representing the average amplitude of the signal over a period. The Average algorithm in the oscilloscope is to take all points of a waveform as Average, namely arithmetic Average, which is theoretically equivalent to the direct current component of a signal, so that the Average value Average can be calculated in a frequency distribution histogram of a central waveform:
s5.5, measuring an effective value: the energy generated by the signal in one period corresponds to the voltage generating equivalent energy, i.e. the effective value of the voltage, so that the effective value Y can be calculated in the frequency distribution histogram of the central waveformRMS：
S5.6, measuring the standard deviation: the mean square difference of the waveform amplitude, i.e. the arithmetic square root of the variance, reflects the waveThe degree of dispersion of the shape data from the average value. Because the standard deviation reflects the fluctuation of the waveform actually, for each column of sampling points, the dispersion degree of each column of sampling points from the central waveform can be obtained by calculating the standard deviation between the amplitude value of the sampling point and the amplitude value of the central waveform in the column, and for each obtained column of standard deviation, the waveform fluctuation probability distribution can be obtained, the larger the standard deviation is, the larger the waveform fluctuation of the sampling points is, the larger the error between the sampling points and the input waveform is, therefore, in the frequency distribution histogram of the central waveform, the standard deviation sigma of the sampling points in the ith column isiComprises the following steps:
wherein N is the number of different amplitude values corresponding to the sampling points in the ith column mapping area, and Y isjIs the jth amplitude in column i;
calculating the standard deviation of the maximum and minimum values of each column of sampling points to obtain the sampling point with the maximum dispersion of the column, and marking as sigmai_maxThe maximum standard deviation of the current amplitude mapping waveform can be obtained by sequentially comparing the maximum standard deviation value of each column and is recorded as sigmai_maxThen the value represents that the current amplitude mapping waveform is at the second
The sample points listed have the greatest dispersion, i.e., the greatest fluctuation there.
S5.7, measuring overshoot: overshoot refers to a peak or valley exceeding a set voltage by more than the set voltage-for a rising edge the highest voltage and for a falling edge the lowest voltage. The calculation formula is as follows:
wherein, Ymax、YminMapping the maximum and minimum values, Y, obtained in the image frequency distribution histogram for the three-dimensional waveformtop、YbottomThe top corresponding to the central waveformA value and a floor;
s5.8, measuring rising and falling time:
the rise time of the pulse signal is an interval between two instants at which the instantaneous value of the pulse initially reaches the prescribed lower limit and the prescribed upper limit. Unless otherwise specified, the lower and upper limits are defined as 10% and 90% of the pulse peak amplitude, respectively. Because the discreteness of the mapping waveform on the amplitude is not beneficial to calculating the waveform time parameter, a central waveform needs to be selected for calculation.
As shown in fig. 9(a), assuming that the sampling point at 10% of the waveform amplitude of the rising edge is located in the ith column and the sampling point at 90% of the waveform amplitude is located in the ith' column, the rising time is:
as shown in fig. 9(b), let the sampling point at 90% of the waveform amplitude of the falling edge be located in the m-th column, the sampling point at 10% of the waveform amplitude be located in the n-th column, and the falling time be:
wherein, tbaseThe method is a current time base, K is the number of pixel points of each grid of a liquid crystal display area, i ', m and n all belong to L, i is not equal to i', and m is not equal to n;
s6, parameter marking
After the parameter calculation based on the waveform image is completed by the measuring method, the parameter measurement can be more visual by marking some parameter values in real time. During the statistical analysis of the mapping address of the parameter measurement, the mapping address of the concerned waveform parameter is recorded, and the waveform information at the address is marked through an icon, so that a user can observe the waveform information more intuitively. Because the original three-dimensional waveform image and the central waveform image obtained after weighted averaging are simultaneously analyzed in the parameter measurement method based on the waveform image, a user can select whether the parameter value needing to be marked currently is the original mapping waveform or the weighted central waveform, so that the user can quickly acquire the waveform parameter comparison relation between the mapping waveform image and the central waveform image.
In the following we describe the parameter tag in detail:
s6.1 labeling of the maximum, top and bottom values
According to the measurement results of the minimum value, the maximum value, the top value and the bottom value in the step S5, sequentially arranging the address matrix AL×MSearching each address, marking addresses corresponding to the minimum value, the maximum value, the top value and the bottom value in sequence, and then marking pixel points corresponding to each address by using a triangle;
the maximum value and the top value are marked in the same way, and as shown in fig. 10, the specific marking method of the corresponding address is as follows:
maximum value YmaxAnd top value YtopThe corresponding address is AmaxAnd AtopThen mark A with an inverted trianglemaxAnd AtopCorresponding pixel points in three lines right above, and the marked address area is as follows:
Aμ-1；
Aμ-2,(Aμ-2)-M,(Aμ-2)+M；
Aμ-3,(Aμ-3)-M,(Aμ-3)+M,(Aμ-3)-2M,(Aμ-3)+2M；
wherein, when mu is 1, Aμ＝AmaxWhen mu is 2, Aμ＝Atop。
The labeling methods of the minimum value and the bottom value are the same, and as shown in fig. 11, the specific labeling method of the corresponding address is as follows:
setting the minimum value YminAnd a base value YbottomThe corresponding address is AminAnd AbottomThen mark A with regular triangleminAnd AbottomCorresponding pixel points in three lines right below, and the marked address area is as follows:
Aλ+1；
Aλ+2,(Aλ+2)-M,(Aλ+2)+M；
Aλ+3,(Aλ+3)-M,(Aλ+3)+M,(Aλ+3)-2M,(Aλ+3)+2M；
wherein, when λ is 1, Aλ＝AminWhen λ is 2, Aλ＝Abottom。
In this embodiment, the triangle is highlighted by the pixel points in three rows to facilitate the observation, and certainly, more rows of the triangle or the shapes such as arrows can be highlighted.
S6.2 labeling of mean and effective values
Based on the measurement results of the average value and the effective value in step S5, the address matrix a is sequentially updatedL×MSearching each address, marking the addresses corresponding to the average value and the effective value in sequence, and marking the pixel points corresponding to each address by using a dotted line.
The average value and the effective value are marked in the same way, and as shown in fig. 12, the specific marking method of the corresponding address is as follows:
let mean value YmeanAnd a valid value YRMSThe corresponding address is AmeanAnd ARMSThen marked a by a dotted line every other three columnsmeanAnd ARMSCorresponding to the pixel points, the marked address regions are:
Aκ+kM，k＝4i，κ＝1,2；
wherein, when κ ═ 1, Aκ＝AmeanWhen k is 2, Aκ＝ARMS。
Although illustrative embodiments of the present invention have been described above to facilitate the understanding of the present invention by those skilled in the art, it should be understood that the present invention is not limited to the scope of the embodiments, and various changes may be made apparent to those skilled in the art as long as they are within the spirit and scope of the present invention as defined and defined by the appended claims, and all matters of the invention which utilize the inventive concepts are protected.
Claims (4)
1. A parameter measurement and marking method based on three-dimensional waveform mapping images is characterized by comprising the following steps:
(1) and constructing a data matrix D by using the image subjected to the three-dimensional waveform mappingL×MIts corresponding address matrix AL×ML and M are the length of the display area of the corresponding liquid crystal screen, namely the length and width of the database;
(2) according to the data matrix DL×MAnd mapping the address matrix AL×MCalculating the weighted average value of the sampling points in each row;
let the i-th column store an area address of A1～AnThe storage information corresponding to each address is sequentially K1～KnI is more than or equal to 1 and less than or equal to L, then the mapping address X corresponding to the weighted average value of the amplitude values of the sampling points in the ith columni_mean：
At address Xi_meanThe corresponding sampling point amplitude value is:
Yi_mean＝(i·M-1)-Xi_mean(2)
substituting the formula (1) into the formula (2) can obtain the amplitude average value of the data matrix at the ith column as:
similarly, the amplitude average value of the data matrix corresponding to other columns is obtained according to the method;
(3) forming a waveform subjected to column weighted average by the amplitude average values of all the columns, and recording the waveform as a central waveform of the three-dimensional waveform mapping image;
(4) using the data matrix DL×MConstructing an original waveform image frequency distribution histogram, constructing a central waveform frequency distribution histogram by using a central waveform, wherein in the two frequency distribution histograms, an X axis represents all amplitude values contained in a waveform, and a Y axis represents the occurrence statistics times of sampling points;
(5) parameter measurement and marking
(5.1), measuring the most value: histogram of frequency distribution in original waveform imageIn the middle, the leftmost value of the X axis is recorded as the minimum value Y of the waveform amplitudeminThe rightmost end value of the X axis is recorded as the maximum value Y of the waveform amplitudemax；
(5.2), measuring top and bottom values: in the central waveform frequency distribution histogram, the leftmost value of the X axis is recorded as a waveform amplitude bottom value YbottomThe rightmost end value of the X axis is recorded as the top value Y of the waveform amplitudetop；
(5.3), measured amplitude value and peak-to-peak value: in the central waveform, the amplitude value and the peak-to-peak value have the same calculation method, and the difference between the top value and the bottom value of the waveform is recorded as the amplitude value or the peak-to-peak value;
(5.4), measurement average value: calculating an Average value Average in the central waveform frequency distribution histogram:
(5.5), measuring effective value: calculating effective value Y in central waveform frequency distribution histogramRMS：
(5.6), measurement column standard deviation: in the frequency distribution histogram of the central waveform, the standard deviation sigma of the ith sampling pointiComprises the following steps:
wherein N is the number of different amplitude values corresponding to the sampling points in the ith column mapping area, and Y isjIs the jth amplitude in column i;
(5.7), measuring overshoot:
wherein, Ymax、YminMapping the maximum and minimum obtained in an image frequency distribution histogram for three-dimensional waveformsValue, Ytop、YbottomThe top value and the bottom value corresponding to the central waveform;
(5.8), measuring rise and fall times:
assuming that the sampling point at 10% of the waveform amplitude of the rising edge is located in the ith column and the sampling point at 90% of the waveform amplitude is located in the ith' column, then the rising time is:
setting the sampling point at 90% of the waveform amplitude of the falling edge to be positioned in the m-th column, setting the sampling point at 10% of the waveform amplitude to be positioned in the n-th column, and setting the falling time as follows:
wherein, tbaseThe method is a current time base, K is the number of pixel points of each grid of a liquid crystal display area, i ', m and n all belong to L, i is not equal to i', and m is not equal to n;
(6) parameter mark
(6.1), indicia of the most, top and bottom values
According to the measurement results of the minimum value, the maximum value, the top value and the bottom value in the step (5), sequentially arranging the minimum value, the maximum value, the top value and the bottom value in the address matrix AL×MSearching each address, marking addresses corresponding to the minimum value, the maximum value, the top value and the bottom value in sequence, and then marking pixel points corresponding to each address by using a triangle;
(6.2) labeling of mean and valid values
According to the measurement results of the average value and the effective value in the step (5), sequentially arranging the average value and the effective value in the address matrix AL×MSearching each address, marking the addresses corresponding to the average value and the effective value in sequence, and marking the pixel points corresponding to each address by using a dotted line.
2. The method for measuring and marking parameters based on three-dimensional waveform mapping image according to claim 1, wherein in the step (6.1), the specific marking method of the addresses corresponding to the maximum value and the top value is as follows:
maximum value YmaxAnd top value YtopThe corresponding address is AmaxAnd AtopThen mark A with an inverted trianglemaxAnd AtopCorresponding pixel points in three lines right above, and the marked address area is as follows:
Aμ-1；
Aμ-2,(Aμ-2)-M,(Aμ-2)+M；
Aμ-3,(Aμ-3)-M,(Aμ-3)+M,(Aμ-3)-2M,(Aμ-3)+2M；
wherein, when mu is 1, Aμ＝AmaxWhen mu is 2, Aμ＝Atop。
3. The method for measuring and marking parameters based on three-dimensional waveform mapping image according to claim 1, wherein in the step (6.1), the specific marking method of the addresses corresponding to the minimum value and the bottom value is as follows:
setting the minimum value YminAnd a base value YbottomThe corresponding address is AminAnd AbottomThen mark A with regular triangleminAnd AbottomCorresponding pixel points in three lines right below, and the marked address area is as follows:
Aλ+1；
Aλ+2,(Aλ+2)-M,(Aλ+2)+M；
Aλ+3,(Aλ+3)-M,(Aλ+3)+M,(Aλ+3)-2M,(Aλ+3)+2M；
wherein, when λ is 1, Aλ＝AminWhen λ is 2, Aλ＝Abottom。
4. The method for measuring and marking parameters based on three-dimensional waveform mapping image according to claim 1, wherein in the step (6.2), the specific marking method of the addresses corresponding to the average value and the valid value is as follows:
let mean value YmeanAnd a valid value YRMSCorrespond toHas an address of AmeanAnd ARMSThen marked a by a dotted line every other three columnsmeanAnd ARMSCorresponding to the pixel points, the marked address regions are:
Aκ+kM，k＝4i，κ＝1,2；
wherein, when κ ═ 1, Aκ＝AmeanWhen k is 2, Aκ＝ARMS。
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