CN108957277B - Crystal oscillator testing device - Google Patents
Crystal oscillator testing device Download PDFInfo
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- CN108957277B CN108957277B CN201810833050.6A CN201810833050A CN108957277B CN 108957277 B CN108957277 B CN 108957277B CN 201810833050 A CN201810833050 A CN 201810833050A CN 108957277 B CN108957277 B CN 108957277B
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- crystal oscillator
- mounting plate
- disc
- fixed
- fixing hole
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Abstract
The invention discloses a crystal oscillator testing device, comprising: a base; the brackets are symmetrically arranged on the base; the rotating shafts penetrate between the brackets and extend out of two sides of the brackets; a mounting plate provided on the rotating shaft; and a disc fixed inside the bracket; the mounting plate is used for receiving the crystal oscillator, the disc is located between the support and the mounting plate, the disc and the rotating shaft are concentrically arranged, and a plurality of adjusting holes which are axially symmetrically and uniformly distributed by taking the circle center as the center are formed in the disc. The invention improves the test accuracy and the test efficiency.
Description
Technical Field
The invention relates to the technical field of communication, in particular to a crystal oscillator testing device
Background
The quartz crystal oscillator is an acceleration sensitive device, and under the vibration environment, the stability of the crystal oscillator greatly reduces the serious deterioration of phase noise, so that the error rate of communication equipment, the radar detection sensitivity and the guidance precision of a weapon system are greatly reduced.
The crystal is a device with the highest acceleration sensitivity in the crystal oscillator, when the crystal is subjected to vibration and impact, mechanical structures such as a bracket of the crystal and the like deform, meanwhile, the crystal can also deform and distort, equivalent parameters of the crystal can change, and the frequency of the crystal can change. The stability of the crystal oscillator under vibration is improved, and besides the design aspects of the crystal and the crystal oscillator, the acceleration sensitivity of the crystal oscillator needs to be tested to determine whether the crystal oscillator meets the system requirements.
The relative change of the crystal frequency caused by vibration is in direct proportion to the magnitude of the vibration acceleration
In the order of magnitude of the acceleration,
for crystal acceleration sensitivity, crystal acceleration sensitivity is a vector that can be determined by measuring the vector component of each of 3 mutually orthogonal axes.
When the crystal oscillator rotates 180 degrees along a horizontal axial direction (perpendicular to the gravity direction), the oscillator is subjected to an acceleration variation of 2 g. The acceleration sensitivity of the crystal oscillator can thus be tested using a simple 2g flip test apparatus. The 2g turning test method is that the crystal oscillator is turned by 180 degrees respectively in three mutually orthogonal axial directions, and the frequencies of the crystal oscillator before and after turning are respectively fmaxAnd fminThen the acceleration sensitivity of the crystal oscillator in this direction is:
the acceleration sensitivities in the directions of three mutually orthogonal axes are respectively obtained in sequence, so that the acceleration sensitivity of the crystal oscillator is as follows:
the acceleration sensitivity of the crystal oscillator is small, and is generally 10-9～10-10And the magnitude is high, so that the test is easily influenced by frequency changes caused by temperature changes caused by air convection, heat conduction changes caused by crystal oscillator placement state changes, crystal oscillator structure changes caused by overturning operations, test cable changes and the like, and the 2g overturning test result has a large error.
Therefore, it is desirable to provide a crystal oscillator test apparatus capable of accurately testing the acceleration sensitivity of a crystal oscillator.
Disclosure of Invention
In order to achieve the above object, a first aspect of the present invention provides a crystal oscillator testing apparatus, comprising:
a base;
the brackets are symmetrically arranged on the base;
the rotating shafts penetrate between the brackets and extend out of two sides of the brackets;
a mounting plate provided on the rotating shaft; and
a disc fixed inside the bracket;
the mounting plate is used for receiving the crystal oscillator, the disc is located between the support and the mounting plate, the disc and the rotating shaft are concentrically arranged, and a plurality of adjusting holes which are axially symmetrically and uniformly distributed by taking the circle center as the center are formed in the disc.
Preferably, a first fixing hole is formed in the disc, a second fixing hole corresponding to the first fixing hole is formed in the support, and the disc and the support are fixed through the first fixing hole and the second fixing hole in a penetrating mode through bolts.
Preferably, be provided with the third fixed orifices that uses the rotation axis centre of a circle as the mutual symmetry of center on the mounting panel, the third fixed orifices sets up with axial symmetry the regulation hole on the disc corresponds each other, the disc with the mounting panel is worn to establish through the bolt third fixed orifices and regulation hole are fixed.
Preferably, the mounting plate is provided with a switching clamp for fixing the crystal oscillator, and the switching clamp is provided with a circuit board for powering on the crystal oscillator and outputting the test frequency.
Preferably, the switching clamp is provided with fourth fixing holes on the surface for fixing the crystal oscillator and the two adjacent side surfaces, the mounting plate is provided with fifth fixing holes corresponding to the fourth fixing holes, and the switching clamp and the mounting plate are fixed by penetrating the fourth fixing holes and the fifth fixing holes through bolts.
Preferably, the number of the adjusting holes is 12.
Preferably, the end parts of the rotating shafts, which extend out of the two sides of the bracket, are provided with handles.
Preferably, the material of the base comprises a hard aluminium mill.
The invention has the following beneficial effects:
the technical scheme provided by the invention is clear in principle and simple in scheme, and can reduce adverse effects on a test result caused by frequency change caused by state change of the crystal oscillator when a worker performs an acceleration sensitivity test on the crystal oscillator by adopting a 2g turnover test method, so that the test accuracy and the test efficiency are improved.
Drawings
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings.
Fig. 1 is a front view of a crystal oscillator test apparatus according to an embodiment of the present invention;
FIG. 2 is a front view of a disk proposed in one embodiment of the present invention;
FIG. 3 is a side view of a mounting plate provided in one embodiment of the present invention;
FIG. 4 is a front view of a mounting plate provided in one embodiment of the present invention;
fig. 5 is a schematic structural diagram of an adapter jig according to an embodiment of the present invention.
In the figure: 1. a base; 2. a support; 21. a second fixing hole; 3. a disc; 31. a central hole; 32. an adjustment hole; 33. a first fixing hole; 4. a rotating shaft; 41. a handle; 5. mounting a plate; 51. a central bore; 52. a third fixing hole; 53. a fifth fixing hole; 6. transferring the clamp; 61. a circuit board; 62. a fourth fixing hole; 7. crystal oscillator
Detailed Description
In order to more clearly illustrate the invention, the invention is further described below with reference to preferred embodiments and the accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
Fig. 1 is a front view of a crystal oscillator testing apparatus according to an embodiment of the present invention, as shown in fig. 1, including a horizontally disposed base, symmetrical brackets are vertically fixed on an upper surface of the base, the brackets are fixed on the base by screws, a rotating shaft is inserted between the brackets, two ends of the rotating shaft extend out of two sides of the brackets, the rotating shaft can rotate between the brackets, a center hole is formed in a center of the mounting plate, the rotating shaft is inserted through the mounting plate by the center hole, so that the mounting plate is mounted on the rotating shaft, the mounting plate is located between the brackets, the mounting plate can rotate along with the rotating shaft, a disc is fixedly disposed inside the brackets, the disc is clamped between the brackets and the mounting plate, a center of the disc and the rotating shaft are concentrically disposed, a center hole is formed at a center of the disc, that is, the rotating shaft is inserted through the center hole of the disc, the number of the disks can be two, and the two disks are respectively positioned on two inner side surfaces of the bracket; or one disc is arranged on one inner side surface of the bracket, which is not limited in this embodiment. The disc is provided with a plurality of adjusting holes which are axially and symmetrically distributed by taking the circle center as the center.
In the specific implementation of this embodiment, the mounting plate is used to support the crystal oscillator, that is, the mounting plate plays a role of a carrier, when the crystal oscillator testing apparatus provided in this embodiment is used, the crystal oscillator is first mounted on the mounting plate and fixed, since two ends of the rotating shaft extend out of two sides of the bracket, the mounting plate can be driven to rotate by rotating the rotating shaft, that is, the crystal oscillator can be driven to rotate, here, the adjusting holes provided on the disk are uniformly distributed in an axial symmetry manner by taking the center of the disk as the center, the plurality of adjusting holes uniformly divide the entire circumference, the angle formed between adjacent adjusting holes is fixed, we can use the adjusting holes as reference points, exemplarily, the number of the adjusting holes is set to 12, that is, the angle between adjacent adjusting holes is 30 °, therefore, when the crystal oscillator is tested, the rotating shaft can be rotated according to the position of the adjusting hole, and the mounting plate can be accurately turned over, so that the crystal oscillator can be turned over, the crystal oscillator is further powered up to start testing, and the testing accuracy can be improved.
In an alternative embodiment of this embodiment, the support is a telescopic structure.
In the test experiment of the crystal vibrator, the support is a telescopic result, so that the support can be adjusted according to the requirement, and the convenience in the test process is improved.
In an optional implementation manner of this embodiment, a first fixing hole is provided on the disc, a second fixing hole corresponding to the first fixing hole is provided on the bracket, and the disc and the bracket are fixed by inserting a bolt through the first fixing hole and the second fixing hole.
Here, through wearing to establish first fixed orifices and second fixed orifices with the bolt and realizing fixing the disc on the medial surface of support, the installation is simple, has reduced the operation degree of difficulty.
In an optional implementation manner of this embodiment, be provided with the third fixed orifices that uses the rotation axis centre of a circle as the mutual symmetry of center on the mounting panel, the third fixed orifices sets up with axial symmetry the regulation hole on the disc corresponds each other, the disc with the mounting panel is worn to establish through the bolt third fixed orifices and regulation hole are fixed.
The mounting plate is provided with third fixing holes which are symmetrical with each other by taking the circle center of the rotating shaft as the center, namely the third fixing holes are symmetrically arranged by taking the center hole on the mounting plate as the center, the third fixing holes are corresponding to the adjusting holes on the disc, and the adjusting holes on the disc are symmetrically and uniformly arranged, the disc and the mounting plate can be fixed by the bolts passing through the third fixing holes and the adjusting holes, when in test, firstly, the mounting plate is rotated to a certain angle by rotating the rotating shaft, the disk and the mounting plate are fixed by bolts, so that the thermal balance state and the connection state of the crystal oscillator can be ensured not to change, the crystal can be stable in state when being overturned, the situation that the testing precision is reduced due to unstable state of the crystal oscillator when the crystal oscillator is tested is prevented, and the testing sensitivity is improved.
In an optional implementation manner of this embodiment, an adapting clamp for fixing the crystal oscillator is disposed on the mounting plate, and a circuit board for powering up the crystal oscillator and outputting a test frequency is disposed on the adapting clamp.
The switching anchor clamps are used for fixed crystal oscillator, thereby can guarantee crystal oscillator when testing, the condition that can not take place to remove, and be provided with the circuit board on the switching anchor clamps and can add power for crystal oscillator, and can export the test frequency that crystal oscillator exported, the test condition of crystal oscillator is provided, in the test, add power and frequency output all carry out the switching through the circuit board, can avoid crystal oscillator cable to crystal oscillator's influence when the upset test, improve the accuracy nature of test.
In an optional implementation manner of this embodiment, the adapting jig is provided with fourth fixing holes on a surface where the crystal oscillator is fixed and on both adjacent two side surfaces, the mounting plate is provided with fifth fixing holes corresponding to the fourth fixing holes, and the adapting jig and the mounting plate are fixed by bolts passing through the fourth fixing holes and the fifth fixing holes.
The switching clamp is provided with a fourth fixing hole relative to the surface for fixing the crystal oscillator and two adjacent side faces, a fifth fixing hole is formed in the mounting plate, the switching clamp and the mounting plate are fixed through bolts penetrating through the fourth fixing hole and the fifth fixing hole, and the crystal acceleration sensitivity is a vector and needs to be determined by measuring a vector component of each of 3 mutually orthogonal axes, so that different positions of the switching clamp are mounted on the mounting plate during testing, the vector component of each of the 3 mutually orthogonal axes can be measured respectively, and the crystal acceleration sensitivity is further determined.
In an alternative embodiment of this embodiment, the end of the rotating shaft extending out of the two sides of the bracket is provided with a handle.
The handles arranged at the end parts of the rotating shaft extending out of the two sides of the support can facilitate the rotation of the rotating shaft by workers, and the convenience is improved.
In an alternative embodiment of this embodiment, the material of the base comprises hard aluminum mill.
The hard aluminum mill is used as a manufacturing material of the base, so that the hardness of the base can be improved, and the service life of the device is prolonged.
Next, the crystal oscillator test apparatus according to the present invention will be described with reference to the application scenario, in which the adapter jig is first fixed to the mounting plate by passing a bolt through a fourth fixing hole on the surface of the adapter jig opposite to the fixed crystal oscillator and a fifth fixing hole on the mounting plate, the crystal oscillator is powered up, the test frequency is output through the circuit board, then the mounting plate is rotated by 180 degrees, the mounting plate and the disc are fixed, so that the acceleration sensitivity vector component in the direction is obtained through testing, and then the adapter clamp is detached from the mounting plate, and two adjacent side surfaces of the switching clamp are respectively installed on the installation plate and tested to obtain acceleration sensitivity components in two directions, thereby obtaining vector components of each of 3 mutually orthogonal axes and further determining the crystal acceleration sensitivity.
It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations or modifications may be made on the basis of the above description, and all embodiments may not be exhaustive, and all obvious variations or modifications may be included within the scope of the present invention.
Claims (5)
1. A crystal oscillator test apparatus, comprising:
a base;
the brackets are symmetrically arranged on the base;
the rotating shafts penetrate between the brackets and extend out of two sides of the brackets;
a mounting plate provided on the rotating shaft; and
a disc fixed inside the bracket;
the mounting plate is used for bearing the crystal oscillator, the disc is positioned between the support and the mounting plate, the disc and the rotating shaft are concentrically arranged, and a plurality of adjusting holes which are axially, symmetrically and uniformly distributed by taking the circle center as the center are formed in the disc;
the mounting plate is provided with third fixing holes which are symmetrical with each other by taking the circle center of the rotating shaft as the center, the third fixing holes correspond to the adjusting holes which are axially symmetrical and arranged on the disc, and the disc and the mounting plate are fixed by penetrating the third fixing holes and the adjusting holes through bolts;
the mounting plate is provided with a switching clamp for fixing the crystal oscillator, and the switching clamp is provided with a circuit board for powering up the crystal oscillator and outputting test frequency;
switching anchor clamps are for fixed all be provided with the fourth fixed orifices on crystal oscillator's the surface and the adjacent both sides face, be provided with on the mounting panel with the corresponding fifth fixed orifices of fourth fixed orifices, switching anchor clamps with the mounting panel passes through the bolt fourth fixed orifices and the fifth fixed orifices is fixed.
2. The crystal oscillator testing device of claim 1, wherein the disk is provided with a first fixing hole, the bracket is provided with a second fixing hole corresponding to the first fixing hole, and the disk and the bracket are fixed by bolts passing through the first fixing hole and the second fixing hole.
3. The crystal oscillator test apparatus of claim 1, wherein the number of the adjustment holes is 12.
4. The crystal oscillator test apparatus of claim 1, wherein the end portions of the rotary shaft protruding from both sides of the holder are provided with handles.
5. A crystal oscillator test apparatus as claimed in any one of claims 1 to 4, wherein the material of the base includes duralumin milling.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810833050.6A CN108957277B (en) | 2018-07-26 | 2018-07-26 | Crystal oscillator testing device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810833050.6A CN108957277B (en) | 2018-07-26 | 2018-07-26 | Crystal oscillator testing device |
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| CN108957277A CN108957277A (en) | 2018-12-07 |
| CN108957277B true CN108957277B (en) | 2021-08-13 |
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| CN201810833050.6A Active CN108957277B (en) | 2018-07-26 | 2018-07-26 | Crystal oscillator testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109596922B (en) * | 2018-12-24 | 2021-04-20 | 北京无线电计量测试研究所 | Constant acceleration device for crystal element device and using method thereof |
| CN112629790A (en) * | 2020-12-29 | 2021-04-09 | 北京无线电计量测试研究所 | Crystal oscillator vibration tool clamp |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN200996982Y (en) * | 2007-01-16 | 2007-12-26 | 天津必利优科技发展有限公司 | Quartz crystal oscillater, its automatic testing loader |
| CN101725803B (en) * | 2008-10-17 | 2012-12-05 | 德昌电机(深圳)有限公司 | Rotatable platform |
| CN201615746U (en) * | 2010-03-22 | 2010-10-27 | 北京盈和工控技术有限公司 | Finished-product testing machine |
| CN102539846B (en) * | 2012-02-13 | 2014-11-19 | 广东中晶电子有限公司 | Crystal oscillator test clamp with circuit switching plate |
| CN205576071U (en) * | 2016-03-28 | 2016-09-14 | 安徽师范大学 | Mix shaking table |
| CN107499563B (en) * | 2017-08-29 | 2023-03-03 | 深圳市三一联光智能设备股份有限公司 | Multi-station crystal oscillator test, classification, marking and braiding integrated equipment |
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