CN108950485A - Coating control method, system and the pulse laser depositing device of pulse laser depositing device - Google Patents

Coating control method, system and the pulse laser depositing device of pulse laser depositing device Download PDF

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Publication number
CN108950485A
CN108950485A CN201810677440.9A CN201810677440A CN108950485A CN 108950485 A CN108950485 A CN 108950485A CN 201810677440 A CN201810677440 A CN 201810677440A CN 108950485 A CN108950485 A CN 108950485A
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China
Prior art keywords
pulse laser
data
brightness
depositing device
target
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Inventor
张晓军
罗敏
胡凯
陈志强
方安安
姜鹭
潘恒
王岩
王峻岭
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Shenzhen Matrix Multielement Technology Co Ltd
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Shenzhen Matrix Multielement Technology Co Ltd
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/28Vacuum evaporation by wave energy or particle radiation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

The present invention relates to thin-film material manufacturing technology fields, disclose coating control method, system and the pulse laser depositing device of a kind of pulse laser depositing device.The coating control method of the pulse laser depositing device, comprising: when pulse laser beam carries out plated film, acquire the brightness plumage image in vacuum chamber in real time;Analyze position data of the focal beam spot brightness data, brightness plumage shape data and laser facula in the brightness plumage image acquired in real time on target;The focal beam spot brightness data analyzed, the position data of brightness plumage shape data and laser facula on target are matched with corresponding preset normal data;And judge whether the coating process of pulse laser depositing device is normal according to matching result.The present invention is accurate, conveniently and efficiently realizes the control of the real time monitoring of pulse laser depositing device coating process, improves the working efficiency and stability of pulse laser depositing device plated film.

Description

Coating control method, system and the pulse laser deposition of pulse laser depositing device Equipment
Technical field
The present invention relates to a kind of controls of the plated film of thin-film material manufacturing technology field more particularly to pulse laser depositing device Method, system and pulse laser depositing device.
Background technique
It is pre- when meeting in existing pulse laser depositing device (Pulsed Laser Deposition, PLD) coating process If the pulse laser beam that control laser issues passes through when preparation condition (for example intracavitary vacuum degree, substrate heat, are passed through gas) Enter vacuum chamber away from converging after burnt mirror, and through transmissive window, pulse laser beam target centre focus so that target object Matter ablation, ablation object preferentially transmit along the normal direction of target and form penniform brightness plumage (Plasma plume), final to burn Erosion object, which deposits to, forms film on substrate.
In entire coating process, experimenter, which needs real-time and accurately to monitor pulsed laser energy state in vacuum chamber, is Whether whether face target and transmissive window the status datas such as have a stain no up to standard, pulse laser, to interrupt in abnormality Plated film task simultaneously analyzes abnormal failure.But in practical coating process, can only tentatively be judged by human eye plumage luminance and manually Whether the pulse laser intensity outside operation laser energy meter test vacuum chamber meets preparation process demand, and can not obtain and directly take The real-time power data of pulse laser in vacuum chamber, also effectively can not monitor and analyze transmissive window in long-time coating process The influence that stain and pulse laser miss the target to the real-time power data of pulse laser in vacuum chamber, influences coating process system data Consistency and stability, lead to not accurately analyze failure cause.
Summary of the invention
In consideration of it, coating control method, system and the pulse laser that the present invention provides a kind of pulse laser depositing device are heavy Product equipment, solve in existing pulse laser depositing device coating process can not accurate real-time monitoring pulsed laser energy state whether Whether whether face target and transmissive window the status datas such as have a stain and influence plated film real time planning up to standard, pulse laser And the technical issues of accident analysis.
According to one embodiment of present invention, a kind of coating control method of pulse laser depositing device is provided, comprising: When pulse laser beam carries out plated film, the brightness plumage image in vacuum chamber is acquired in real time;It analyzes poly- in the brightness plumage image acquired in real time Burnt hot spot brightness data, the position data of brightness plumage shape data and laser facula on target;The focal beam spot analyzed is bright Degree evidence, the position data of brightness plumage shape data and laser facula on target are matched with corresponding preset normal data; And judge whether the coating process of pulse laser depositing device is normal according to matching result.
Preferably, described to judge whether the coating process of pulse laser depositing device is normal according to matching result, comprising: when The focal beam spot brightness data that analyzes, the position data of brightness plumage shape data and laser facula on target with it is corresponding preset When normal data matches, determine that the coating process of current PRF laser deposition equipment is normal;Otherwise, it is determined that current PRF laser The coating process of depositing device is abnormal.
Preferably, described to judge whether the coating process of pulse laser depositing device is normal according to matching result, comprising: when When the focal beam spot brightness data of analysis is mismatched with corresponding preset normal data, the laser of pulse laser depositing device is determined Device operation irregularity;When the brightness plumage shape data of analysis is mismatched with corresponding preset normal data, pulse laser deposition is determined The transmissive window of equipment has a stain;And when position data of the laser facula analyzed on target and corresponding preset normal data When mismatch, determine that the pulse laser optical path of pulse laser depositing device deviates target.
Preferably, after whether the coating process for judging pulse laser depositing device according to matching result is normal, Further include: when judging the coating process exception of pulse laser depositing device according to matching result, prompt corresponding in matching result Abnormal data.
Preferably, the coating control method of the pulse laser depositing device, further includes: obtain the focusing light analyzed The historical data of the position data of spot brightness data, brightness plumage shape data and laser facula on target;And analysis acquisition Abnormal cause in coating process of the historical data to judge pulse laser depositing device.
According to another embodiment of the invention, a kind of plated film control system of pulse laser depositing device is also provided, is wrapped It includes: image collecting device, for acquiring the brightness plumage image in vacuum chamber in real time when pulse laser beam carries out plated film;Image analysis Device, for analyzing the focal beam spot brightness data in the brightness plumage image that described image acquisition device acquires in real time, brightness plumage shape The position data of data and laser facula on target;Coalignment, focal beam spot brightness data, brightness plumage for will analyze The position data of shape data and laser facula on target is matched with corresponding preset normal data;And judgement dress It sets, judges whether the coating process of pulse laser depositing device is normal according to the matching result of the coalignment.
Preferably, the judgment means are used for the focusing light when the coalignment analyzes described image analytical equipment Spot brightness data, the position data of brightness plumage shape data and laser facula on target are matched with corresponding preset normal data When, determine that the coating process of current PRF laser deposition equipment is normal;Otherwise, it is determined that the plated film of current PRF laser deposition equipment Process exception.
Preferably, the judgment means further comprise: the first determination module, for working as the coalignment for the figure When mismatching as the focal beam spot brightness data of analytical equipment analysis with corresponding preset normal data, pulse laser deposition is determined The laser works of equipment are abnormal;Second determination module, for analyze described image analytical equipment when the coalignment When brightness plumage shape data is mismatched with corresponding preset normal data, determine that the transmissive window of pulse laser depositing device has a stain; And third determination module, the laser facula for analyzing described image analytical equipment when the coalignment is on target When position data is mismatched with corresponding preset normal data, determine that the pulse laser optical path of pulse laser depositing device deviates target Material.
Preferably, the plated film control system of the pulse laser depositing device, further includes: abnormal prompt device is used for When the judgment means judge the coating process exception of pulse laser depositing device according to the matching result of the coalignment, Prompt corresponding abnormal data in matching result;And fail analysis device, for obtaining the focal beam spot brightness number analyzed According to the historical data of the, position data of brightness plumage shape data and laser facula on target, and analyze the historical data of acquisition with Judge the abnormal cause in the coating process of pulse laser depositing device.
According to still another embodiment of the invention, a kind of pulse laser depositing device, including laser, transmission are also provided The plated film control system of window, vacuum chamber and above-mentioned pulse laser depositing device, the pulse laser of the laser pass through described Target in vacuum chamber described in transmissive window face, the image collecting device of the plated film control system of the pulse laser depositing device Through the target in cavity described in the vacuum chamber lateral opening hole face.
Coating control method, system and the pulse laser depositing device of pulse laser depositing device provided by the invention lead to The intracavitary brightness plumage image of real-time acquisition pulse laser deposition equipment vacuum is crossed, the focal beam spot brightness number in brightness plumage image is analyzed According to, the position data of brightness plumage shape data and laser facula on target, and by the brightness plumage image data analyzed with it is corresponding pre- If normal data is matched, finally judge whether the coating process of pulse laser depositing device is normal according to matching result, it is quasi- Really, the real time monitoring control for conveniently and efficiently realizing pulse laser depositing device coating process, improves pulse laser deposition The working efficiency and stability of equipment plated film.
Detailed description of the invention
To describe the technical solutions in the embodiments of the present invention more clearly, make required in being described below to embodiment Attached drawing is briefly described.It should be evident that drawings in the following description are only some embodiments of the invention, for For those of ordinary skill in the art, without creative efforts, it can also be obtained according to these attached drawings other Attached drawing.
Fig. 1 is the flow diagram of the coating control method of one embodiment of the invention middle arteries impulse light deposition equipment.
Fig. 2 be one embodiment of the invention according to matching result judge pulse laser depositing device coating process whether Normal flow diagram.
Fig. 3 is the flow diagram of the coating control method of another embodiment of the present invention middle arteries impulse light deposition equipment.
Fig. 4 is the flow diagram of the coating control method of another embodiment middle arteries impulse light deposition equipment of the invention.
Fig. 5 is the structural schematic diagram of the plated film control system of one embodiment of the invention middle arteries impulse light deposition equipment.
Fig. 6 is the structural schematic diagram of judgment means in one embodiment of the invention.
Fig. 7 is the structural schematic diagram of the plated film control system of another embodiment of the present invention middle arteries impulse light deposition equipment.
Fig. 8 is the structural schematic diagram of further embodiment middle arteries impulse light deposition equipment of the present invention.
Specific embodiment
Further more detailed description is made to technical solution of the present invention with reference to the accompanying drawings and detailed description.It is aobvious So, described embodiment is only a part of the embodiments of the present invention, instead of all the embodiments.Based in the present invention Embodiment, those of ordinary skill in the art's every other embodiment obtained without making creative work, It all should belong to the scope of protection of the invention.
In the description of the present invention, it is to be understood that, term " first ", " second " etc. are used for description purposes only, without It can be interpreted as indication or suggestion relative importance.In the description of the present invention, it should be noted that unless otherwise specific regulation And restriction, term " connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, Or it is integrally connected;It can be mechanical connection, be also possible to be electrically connected;It can be directly connected, intermediary can also be passed through It is indirectly connected.For the ordinary skill in the art, above-mentioned term can be understood in the present invention in conjunction with concrete condition Concrete meaning.In addition, in the description of the present invention, unless otherwise indicated, the meaning of " plurality " is two or more.
Fig. 1 is the flow diagram of the coating control method of one embodiment of the invention middle arteries impulse light deposition equipment.Such as Shown in figure, the coating control method of the pulse laser depositing device, comprising:
Step S101: when pulse laser beam carries out plated film, the brightness plumage image in vacuum chamber is acquired in real time.
It is default when meeting in pulse laser depositing device (Pulsed Laser Deposition, PLD) coating process When preparation condition (for example intracavitary vacuum degree, substrate heat, are passed through gas), the pulse laser beam that controllable laser issues passes through Enter vacuum chamber away from converging after burnt mirror, and through transmissive window, pulse laser beam target centre focus so that target object Matter ablation, ablation object preferentially transmit along the normal direction of target and form penniform brightness plumage (Plasma plume), final to burn Erosion object, which deposits to, forms film on substrate.In the present embodiment, when pulse laser beam carries out coating process, by vacuum chamber Inner or outer side configures image collecting device such as camera, acquires in real time and saves target material in vacuum chamber and burns and formed Brightness plumage image.
Step S102: the focal beam spot brightness data in the brightness plumage image acquired in real time, brightness plumage shape data are analyzed and is swashed Position data of the light hot spot on target.
In the present embodiment, it can be analyzed by computer image analysis processing technique in the brightness plumage image acquired in real time The position data of focal beam spot brightness data, brightness plumage shape data and laser facula on target.The focal beam spot brightness number Can correspond to according to height indicates that the energy of pulse laser in vacuum chamber is strong and weak, arteries and veins in the higher corresponding expression vacuum chamber of focal beam spot brightness The energy of impulse light is stronger.Whether the pulse laser beam that the brightness plumage shape data can indicate that laser issues is dirty in transmissive window Point, brightness plumage shape anomaly when there are stain.Position data of the laser facula on target can indicate to rush laser optical path just Pair or deviate target state.
Step S103: by the focal beam spot brightness data analyzed, brightness plumage shape data and laser facula on target Position data is matched with corresponding preset normal data.
In the present embodiment, it can be first passed through in advance by coating process of experimental test under the conditions of standard parameter in vacuum Standard brightness plumage image under the such as camera acquisition standard plating film test of the inner or outer side configuration image collecting device of chamber, in turn Standard focal beam spot brightness data, the standard brightness plumage in standard brightness plumage image are analyzed by computer image analysis processing technique The standard position data of shape data and laser facula on target, using the canonical reference number controlled as subsequent coating process According to.
In the present embodiment, after the data for analyzing brightness plumage image, by the focal beam spot brightness data analyzed, brightness plumage The position data of shape data and laser facula on target and corresponding preset standard focal beam spot brightness data, standard brightness plumage Shape data and standard position data are matched item by item, are sentenced when the two data degree of approximation of each is within the scope of default value Determine successful match, otherwise determines that it fails to match.
Step S104: judge whether the coating process of pulse laser depositing device is normal according to matching result.
In the present embodiment, whether just the coating process of pulse laser depositing device further can be judged according to matching result Often.Specifically, the position data when the focal beam spot brightness data, brightness plumage shape data and laser facula analyzed on target When matching with corresponding preset normal data, determine that the coating process of current PRF laser deposition equipment is normal;Otherwise, it is determined that The coating process of current PRF laser deposition equipment is abnormal.
In the coating control method of the pulse laser depositing device of the present embodiment, pass through real-time acquisition pulse laser deposition The intracavitary brightness plumage image of equipment vacuum analyzes focal beam spot brightness data, brightness plumage shape data and laser light in brightness plumage image Position data of the spot on target, and the brightness plumage image data analyzed is matched with corresponding preset standard data, finally Judge whether the coating process of pulse laser depositing device is normal, accurately, conveniently and efficiently realizes pulse according to matching result The real time monitoring of laser deposition equipment coating process controls, and improves the working efficiency and stabilization of pulse laser depositing device plated film Property.
Referring to fig. 2, in another embodiment, described that pulse laser depositing device is judged according to matching result Whether coating process is normal, comprising:
Step S201: when the focal beam spot brightness data of analysis is mismatched with corresponding preset normal data, determine arteries and veins The laser works of impulse light deposition equipment are abnormal.
Step S202: when the brightness plumage shape data of analysis is mismatched with corresponding preset normal data, determine that pulse swashs The transmissive window of light deposition equipment has a stain.
Step S203: when position data of the laser facula on target of analysis is mismatched with corresponding preset normal data When, determine that the pulse laser optical path of pulse laser depositing device deviates target.
In the present embodiment, when the focal beam spot brightness data of analysis is mismatched with corresponding preset normal data, sentence The laser works for determining pulse laser depositing device are abnormal.When analysis brightness plumage shape data and corresponding preset normal data not When matching, determine that the transmissive window of pulse laser depositing device has a stain.When position data of the laser facula on target of analysis When mismatching with corresponding preset normal data, determine that the pulse laser optical path of pulse laser depositing device deviates target.Pass through Analysis matching brightness plumage image data, accurately, conveniently and efficiently determines pulse laser depositing device plated film abnormal failure reason.
Referring to Fig. 3, in another embodiment of the invention, the coating control method of the pulse laser depositing device, packet It includes:
Step S301: when pulse laser beam carries out plated film, the brightness plumage image in vacuum chamber is acquired in real time.
Step S302: the focal beam spot brightness data in the brightness plumage image acquired in real time, brightness plumage shape data are analyzed and is swashed Position data of the light hot spot on target.
Step S303: by the focal beam spot brightness data analyzed, brightness plumage shape data and laser facula on target Position data is matched with corresponding preset normal data.
Step S304: judge whether the coating process of pulse laser depositing device is normal according to matching result.
Step S305: when judging the coating process exception of pulse laser depositing device according to matching result, matching is prompted As a result corresponding abnormal data in.
It in the present embodiment, can when judging the coating process exception of pulse laser depositing device according to matching result Further by voice, signal lamp, jump out the modes such as prompt and prompt corresponding abnormal data in matching result, such as laser Device operation irregularity, transmissive window, which have a stain, deviates target lamp with pulse laser optical path, in time, conveniently and efficiently realizes failure exception Prompting, corresponding troubleshooting is made according to abnormity prompt convenient for staff.
Referring to fig. 4, in further embodiment of the present invention, the coating control method of the pulse laser depositing device, packet It includes:
Step S401: when pulse laser beam carries out plated film, the brightness plumage image in vacuum chamber is acquired in real time.
Step S402: the focal beam spot brightness data in the brightness plumage image acquired in real time, brightness plumage shape data are analyzed and is swashed Position data of the light hot spot on target.
Step S403: by the focal beam spot brightness data analyzed, brightness plumage shape data and laser facula on target Position data is matched with corresponding preset normal data.
Step S404: judge whether the coating process of pulse laser depositing device is normal according to matching result.
Step S405: the focal beam spot brightness data, brightness plumage shape data and laser facula that analyze are obtained on target Position data historical data.
Step S406: the exception analyzed in coating process of the historical data of acquisition to judge pulse laser depositing device is former Cause.
In the present embodiment, the focal beam spot brightness data, brightness plumage shape data and laser analyzed can further be obtained The historical data of position data of the hot spot on target, and the historical data of acquisition is analyzed to judge pulse laser depositing device Abnormal cause in coating process, the historical data by analyzing brightness plumage image can accurately, conveniently and efficiently judge that pulse swashs Abnormal cause in the coating process of light deposition equipment makees corresponding troubleshooting according to abnormity prompt convenient for staff.
Based on above method embodiment, the present invention also provides a kind of plated film control systems of pulse laser depositing device.Ginseng See Fig. 5, the plated film control system 100 of the pulse laser depositing device, including image collecting device 10, image analysis apparatus 20, coalignment 30 and judgment means 40.
It is default when meeting in pulse laser depositing device (Pulsed Laser Deposition, PLD) coating process When preparation condition (for example intracavitary vacuum degree, substrate heat, are passed through gas), the pulse laser beam that controllable laser issues passes through Enter vacuum chamber away from converging after burnt mirror, and through transmissive window, pulse laser beam target centre focus so that target object Matter ablation, ablation object preferentially transmit along the normal direction of target and form penniform brightness plumage (Plasma plume), final to burn Erosion object, which deposits to, forms film on substrate.In the present embodiment, when pulse laser beam carries out coating process, by vacuum chamber Inner or outer side configures the such as camera of described image acquisition device 10, acquires in real time and saves target material in vacuum chamber and burns And the brightness plumage image formed.
In the present embodiment, described image analytical equipment 20 can be analyzed described by computer image analysis processing technique Focal beam spot brightness data, brightness plumage shape data and the laser facula in brightness plumage image that image collecting device 10 acquires in real time exist Position data on target.The focal beam spot brightness data height, which can correspond to, indicates that the energy of pulse laser in vacuum chamber is strong Weak, focal beam spot brightness is higher, and the corresponding energy for indicating pulse laser in vacuum chamber is stronger.The brightness plumage shape data can indicate Laser issue pulse laser beam transmissive window whether stain, brightness plumage shape anomaly when there are stain.The laser facula Position data on target can indicate to rush laser optical path face or deviate the state of target.
In the present embodiment, it can be first passed through in advance by coating process of experimental test under the conditions of standard parameter in vacuum Standard brightness plumage figure under the such as camera acquisition standard plating film test of the inner or outer side configuration described image acquisition device 10 of chamber Picture, and then described image analytical equipment 20 analyzes the standard in standard brightness plumage image by computer image analysis processing technique The standard position data of focal beam spot brightness data, standard brightness plumage shape data and laser facula on target, using as subsequent The standard reference data of coating process control.
In the present embodiment, after the data that described image analytical equipment 20 analyzes brightness plumage image, the coalignment 30 focal beam spot brightness data, brightness plumage shape data and the laser faculas for analyzing described image analytical equipment 20 are on target Position data and corresponding preset standard focal beam spot brightness data, standard brightness plumage shape data and standard position data item by item It is matched, determines successful match when the two data degree of approximation of each is within the scope of default value, otherwise determine that matching is lost It loses.
In the present embodiment, the judgment means 40 further can judge arteries and veins according to the matching result of the coalignment 30 Whether the coating process of impulse light deposition equipment is normal.Specifically, when the coalignment 30 matched described image analysis dress Set 20 analyze focal beam spot brightness data, the position data of brightness plumage shape data and laser facula on target with it is corresponding pre- If normal data when matching, the judgment means 40 determine that the coating process of current PRF laser deposition equipment is normal;It is no Then, the judgment means 40 determine that the coating process of current PRF laser deposition equipment is abnormal.
In the plated film control system 100 of the embodiment of the present invention pulse laser depositing device, acquired by described image The intracavitary brightness plumage image of the real-time acquisition pulse laser deposition equipment vacuum of device 10, described image analytical equipment 20 analyze brightness plumage figure The position data of focal beam spot brightness data, brightness plumage shape data and laser facula on target as in, the coalignment 30 match the brightness plumage image data that described image analytical equipment 20 analyzes with corresponding preset standard data, final described Judgment means 40 judge whether the coating process of pulse laser depositing device is normal according to the matching result of the coalignment 30, Accurately, the real time monitoring control for conveniently and efficiently realizing pulse laser depositing device coating process, it is heavy to improve pulse laser The working efficiency and stability of product equipment plated film.
Referring to Fig. 6, in some embodiments, the judgment means 40 further comprise the first determination module 401, second sentence Cover half block 402 and third determination module 403.In the present embodiment, when the coalignment 30 to focal beam spot brightness data with When corresponding preset normal data mismatches, first determination module 401 determines the laser work of pulse laser depositing device Make abnormal.When the coalignment 30 mismatches brightness plumage shape data with corresponding preset normal data, described second sentences Cover half block 402 determines that the transmissive window of pulse laser depositing device has a stain.When the coalignment 30 to laser facula in target On position data when being mismatched with corresponding preset normal data, third determination module 403 determines pulse laser depositing device Pulse laser optical path deviate target.The judgment means 40 are by analysis matching brightness plumage image data, accurately, conveniently and efficiently Determine pulse laser depositing device plated film abnormal failure reason.
Referring to Fig. 7, in yet another embodiment of the present invention, the plated film control system of the pulse laser depositing device 100 include image collecting device 10, image analysis apparatus 20, coalignment 30, judgment means 40, abnormal prompt device 50 and event Hinder analytical equipment 60.
In the present embodiment, in the judgment means 40 when the plated film for judging pulse laser depositing device according to matching result When process exception, the abnormal prompt device 50 can further by voice, signal lamp, jump out the modes such as prompt and prompt With abnormal data corresponding in result, for example laser works are abnormal, transmissive window has a stain and pulse laser optical path deviation target Lamp in time, conveniently and efficiently realizes the prompting of failure exception, is made at corresponding failure convenient for staff according to abnormity prompt Reason.
The fail analysis device 60 can further obtain the focal beam spot brightness that described image analytical equipment 20 analyzes The historical data of the position data of data, brightness plumage shape data and laser facula on target, and analyze the historical data of acquisition The abnormal cause in coating process to judge pulse laser depositing device, the historical data by analyzing brightness plumage image can be quasi- Really, the abnormal cause in the coating process of pulse laser depositing device is conveniently and efficiently judged, convenient for staff according to different It often reminds and makees corresponding troubleshooting.
Fig. 8 is the structural schematic diagram of further embodiment middle arteries impulse light deposition equipment of the present invention.As shown, the arteries and veins Impulse light deposition equipment, including the pulse laser depositing device in vacuum chamber 1, laser 2, transmissive window 3 and above-described embodiment Plated film control system 100.
In the present embodiment, the laser 2 can produce pulse laser by the way that away from converging after burnt mirror, pulse laser passes through institute State the target 4 in vacuum chamber described in 3 face of transmissive window, pulse laser beam the target 4 centre focus so that the target 4 Substance ablation, ablation object preferentially transmit along the normal direction of target and form penniform brightness plumage 5, and ablation object deposits to substrate 6 Above form film.
The image collecting device of the plated film control system 100 of the pulse laser depositing device penetrates 1 side of vacuum chamber The plated film control system 100 of target 4 in cavity described in face aperture face, the pulse laser depositing device acquires vacuum in real time The image data of brightness plumage 5 in chamber 1 analyzes focal beam spot brightness data, brightness plumage shape data and laser facula in brightness plumage image Position data on target, and the brightness plumage image data analyzed is matched with corresponding preset standard data, final root Judge whether the coating process of pulse laser depositing device is normal according to matching result, accurately, conveniently and efficiently realizes pulse and swash The real time monitoring of light deposition equipment coating process controls, and improves the working efficiency and stabilization of pulse laser depositing device plated film Property.
It should be appreciated that each section of the invention can be realized with hardware, software, firmware or their combination.Above-mentioned In embodiment, software that multiple steps or method can be executed in memory and by suitable instruction execution system with storage Or firmware is realized.It, and in another embodiment, can be under well known in the art for example, if realized with hardware Any one of column technology or their combination are realized: having a logic gates for realizing logic function to data-signal Discrete logic, with suitable combinational logic gate circuit specific integrated circuit, programmable gate array (PGA), scene Programmable gate array (FPGA) etc..
In the description of this specification, reference term " one embodiment ", " some embodiments ", " example ", " specifically show The descriptions such as example " or " some examples " mean particular features, structures, materials, or characteristics described in conjunction with this embodiment or example It is included at least one embodiment or example of the invention.In the present specification, schematic expression of the above terms are different Surely identical embodiment or example is referred to.Moreover, particular features, structures, materials, or characteristics described can be any It can be combined in any suitable manner in one or more embodiment or examples.
Although an embodiment of the present invention has been shown and described, it will be understood by those skilled in the art that: not A variety of change, modification, replacement and modification can be carried out to these embodiments in the case where being detached from the principle of the present invention and objective, this The range of invention is defined by the claims and their equivalents.

Claims (10)

1. a kind of coating control method of pulse laser depositing device characterized by comprising
When pulse laser beam carries out plated film, the brightness plumage image in vacuum chamber is acquired in real time;
Focal beam spot brightness data, brightness plumage shape data and the laser facula in the brightness plumage image acquired in real time are analyzed on target Position data;
By the focal beam spot brightness data analyzed, the position data of brightness plumage shape data and laser facula on target with it is corresponding Preset normal data is matched;And
Judge whether the coating process of pulse laser depositing device is normal according to matching result.
2. the coating control method of pulse laser depositing device according to claim 1, which is characterized in that the basis Judge whether the coating process of pulse laser depositing device is normal with result, comprising:
When analyze focal beam spot brightness data, the position data of brightness plumage shape data and laser facula on target with it is corresponding When preset normal data matches, determine that the coating process of current PRF laser deposition equipment is normal;Otherwise, it is determined that current arteries and veins The coating process of impulse light deposition equipment is abnormal.
3. the coating control method of pulse laser depositing device according to claim 1, which is characterized in that the basis Judge whether the coating process of pulse laser depositing device is normal with result, comprising:
When the focal beam spot brightness data of analysis is mismatched with corresponding preset normal data, pulse laser depositing device is determined Laser works it is abnormal;
When the brightness plumage shape data of analysis is mismatched with corresponding preset normal data, the saturating of pulse laser depositing device is determined Window is penetrated to have a stain;And
When position data of the laser facula of analysis on target is mismatched with corresponding preset normal data, determine that pulse swashs The pulse laser optical path of light deposition equipment deviates target.
4. the coating control method of pulse laser depositing device according to claim 1, which is characterized in that in the basis After matching result judges whether the coating process of pulse laser depositing device is normal, further includes:
When judging the coating process exception of pulse laser depositing device according to matching result, prompt corresponding different in matching result Regular data.
5. the coating control method of pulse laser depositing device according to claim 1, which is characterized in that further include:
Obtain going through for the position data of the focal beam spot brightness data, brightness plumage shape data and laser facula that analyze on target History data;And
Analyze the abnormal cause in coating process of the historical data obtained to judge pulse laser depositing device.
6. a kind of plated film control system of pulse laser depositing device characterized by comprising
Image collecting device, for acquiring the brightness plumage image in vacuum chamber in real time when pulse laser beam carries out plated film;
Image analysis apparatus, for analyzing the focal beam spot brightness number in the brightness plumage image that described image acquisition device acquires in real time According to, the position data of brightness plumage shape data and laser facula on target;
Coalignment, the focal beam spot brightness data, brightness plumage shape data and laser facula for will analyze are on target Position data is matched with corresponding preset normal data;And
Whether just judgment means judge the coating process of pulse laser depositing device according to the matching result of the coalignment Often.
7. the plated film control system of pulse laser depositing device according to claim 6, which is characterized in that the judgement dress Set focal beam spot brightness data for analyzing described image analytical equipment when the coalignment, brightness plumage shape data and Laser facula determines that current PRF laser deposition is set when the position data on target is matched with corresponding preset normal data Standby coating process is normal;Otherwise, it is determined that the coating process of current PRF laser deposition equipment is abnormal.
8. the plated film control system of pulse laser depositing device according to claim 6, which is characterized in that the judgement dress It sets and further comprises:
First determination module, focal beam spot brightness data for analyzing described image analytical equipment when the coalignment with When corresponding preset normal data mismatches, determine that the laser works of pulse laser depositing device are abnormal;
Second determination module, brightness plumage shape data for analyzing described image analytical equipment when the coalignment with it is corresponding When preset normal data mismatches, determine that the transmissive window of pulse laser depositing device has a stain;And
Third determination module, the laser facula for analyzing described image analytical equipment when the coalignment is on target When position data is mismatched with corresponding preset normal data, determine that the pulse laser optical path of pulse laser depositing device deviates target Material.
9. the plated film control system of pulse laser depositing device according to claim 6, which is characterized in that further include:
Abnormal prompt device, for judging that pulse laser deposits according to the matching result of the coalignment when the judgment means When the coating process exception of equipment, corresponding abnormal data in matching result is prompted;And
Fail analysis device, for obtaining the focal beam spot brightness data analyzed, brightness plumage shape data and laser facula in target The historical data of position data on material, and the historical data of acquisition is analyzed to judge the coating process of pulse laser depositing device In abnormal cause.
10. a kind of pulse laser depositing device, which is characterized in that including laser, transmissive window, vacuum chamber and such as claim 6 To the plated film control system of 9 described in any item pulse laser depositing devices, the pulse laser of the laser passes through described The target in vacuum chamber described in window face is penetrated, the image collecting device of the plated film control system of the pulse laser depositing device is saturating Cross the target in cavity described in the vacuum chamber lateral opening hole face.
CN201810677440.9A 2018-06-07 2018-06-27 Coating control method, system and the pulse laser depositing device of pulse laser depositing device Pending CN108950485A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109609915A (en) * 2019-01-09 2019-04-12 张晓军 Without process engineering semiconductor nano material preparation system
CN114481040A (en) * 2021-12-23 2022-05-13 北京科技大学 Laser pulse deposition system and method capable of monitoring laser process parameters in vacuum in situ
CN115406489A (en) * 2022-11-01 2022-11-29 山东申华光学科技有限公司 Monitoring and early warning method and system for film coating of film coating machine

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100745619B1 (en) * 2006-04-11 2007-08-02 한국전기연구원 Plume shape controllable pulsed laser deposition system
CN103103480A (en) * 2011-11-15 2013-05-15 中国科学院物理研究所 Film deposition equipment and film deposition method
CN103774097A (en) * 2014-01-23 2014-05-07 中国科学院合肥物质科学研究院 High-intensity magnetic field assisted pulsed laser deposition system
CN104772568A (en) * 2014-01-15 2015-07-15 宝山钢铁股份有限公司 Laser surface treatment quality control method and on-line monitoring system thereof
CN108700738A (en) * 2015-12-12 2018-10-23 印度电子与信息技术部(Deity) The systems, devices and methods of monitoring for surface profile and thickness measure in film

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100745619B1 (en) * 2006-04-11 2007-08-02 한국전기연구원 Plume shape controllable pulsed laser deposition system
CN103103480A (en) * 2011-11-15 2013-05-15 中国科学院物理研究所 Film deposition equipment and film deposition method
CN104772568A (en) * 2014-01-15 2015-07-15 宝山钢铁股份有限公司 Laser surface treatment quality control method and on-line monitoring system thereof
CN103774097A (en) * 2014-01-23 2014-05-07 中国科学院合肥物质科学研究院 High-intensity magnetic field assisted pulsed laser deposition system
CN108700738A (en) * 2015-12-12 2018-10-23 印度电子与信息技术部(Deity) The systems, devices and methods of monitoring for surface profile and thickness measure in film

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109609915A (en) * 2019-01-09 2019-04-12 张晓军 Without process engineering semiconductor nano material preparation system
CN109609915B (en) * 2019-01-09 2020-12-01 张晓军 Disordered engineering semiconductor nano material preparation system
CN114481040A (en) * 2021-12-23 2022-05-13 北京科技大学 Laser pulse deposition system and method capable of monitoring laser process parameters in vacuum in situ
CN115406489A (en) * 2022-11-01 2022-11-29 山东申华光学科技有限公司 Monitoring and early warning method and system for film coating of film coating machine
CN115406489B (en) * 2022-11-01 2023-01-24 山东申华光学科技有限公司 Monitoring and early warning method and system for film coating of film coating machine

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Application publication date: 20181207