CN108919775B - Testing device and method for control system - Google Patents
Testing device and method for control system Download PDFInfo
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- CN108919775B CN108919775B CN201810597837.7A CN201810597837A CN108919775B CN 108919775 B CN108919775 B CN 108919775B CN 201810597837 A CN201810597837 A CN 201810597837A CN 108919775 B CN108919775 B CN 108919775B
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
Abstract
The invention provides a testing device and a testing method of a control system, relates to the technical field of measurement and control, and can test the stability of the control system. The test device includes: the two ends of the first resistor are respectively connected to an input interface and an output interface of the control system; a first end of the second resistor is connected to an input interface of the control system, and a second end of the second resistor is connected to a controllable voltage source; the controllable voltage source is connected to the processor; the signal acquisition module is used for acquiring the voltage difference between two ends of the first resistor; and the processor is used for determining the current of the first resistor according to the voltage difference between the two ends of the first resistor so as to judge whether the control system is in a normal state. The technical scheme provided by the invention is suitable for the stability test process of the electronic ionization source control system.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to the technical field of measurement and control, in particular to a testing device and a testing method for a control system.
[ background of the invention ]
The electron ionization source of the mass spectrometer comprises a control system and a filament, as shown in fig. 1, when in working state, a power supply unit (comprising a power supply module, a transformer and a rectifying module) in the control system applies a driving voltage to the filament in a vacuum environment according to a comparison result of a comparator to heat the filament, and when the filament is heated to a certain temperature, free electrons e in a filament material-Escape in suspended negative voltage VfUnder the action of e-And accelerating the movement to the electron receiving end to form emission current.
At present, in order to ensure the normal work of an electron ionization source, a control system is generally required to be tested based on a filament, but because the stability of the control system cannot be ensured, the driving voltage of the filament is likely to have an unstable phenomenon, and the filament is damaged due to the fact that the voltage is suddenly high and suddenly low. And when the control system is tested through the filament, the filament needs to work in a vacuum environment, so that the establishment of the test environment consumes resources.
In the process of implementing the invention, the inventor finds that at least the following problems exist in the prior art:
in the prior art, a control system is tested through a filament, a testing environment is built to consume resources, the filament is easily damaged, and the higher testing requirement of the control system cannot be met.
[ summary of the invention ]
In view of this, embodiments of the present invention provide a testing apparatus and a method for a control system, where the testing apparatus is composed of a first resistor, a second resistor, a controllable voltage source, a signal acquisition module, and a processor, and can test the stability of the control system, and a filament in a vacuum environment is not needed, so as to meet a higher testing requirement for the control system.
In a first aspect, an embodiment of the present invention provides a test apparatus for a control system, where the test apparatus includes:
the two ends of the first resistor are respectively connected to an input interface and an output interface of the control system;
a first end of the second resistor is connected to an input interface of the control system, and a second end of the second resistor is connected to a controllable voltage source;
the controllable voltage source is connected to the processor;
the signal acquisition module is used for acquiring the voltage difference between two ends of the first resistor;
and the processor is used for determining the current of the first resistor according to the voltage difference between the two ends of the first resistor so as to judge whether the control system is in a normal state.
The above aspect and any possible implementation manner further provide an implementation manner, and the signal acquisition module is further configured to acquire a voltage difference across the second resistor.
The above-described aspect and any possible implementation further provide an implementation, where the test apparatus further includes:
and the first differential operational amplifier module is used for eliminating common-mode interference of voltages at two ends of the first resistor.
The above-described aspect and any possible implementation further provide an implementation, where the test apparatus further includes:
and the second differential operational amplifier module is used for eliminating common-mode interference of voltages at two ends of the second resistor.
The above-described aspect and any possible implementation further provide an implementation, where the test apparatus further includes:
and the control module is connected to the processor.
The above aspect and any possible implementation further provide an implementation, where the control system includes: a third resistor, a suspension voltage source, a voltage setting module, a comparator, a power supply unit and an operational amplifier module,
the first end of the third resistor is grounded, and the second end of the third resistor is connected to an input interface of the control system through the suspension voltage source;
the voltage setting module and the second end of the third resistor are respectively connected to the input end of the comparator, the output end of the comparator is connected to the control end of the power supply unit, and the anode and the cathode of the power supply unit are respectively connected to the output interface and the input interface of the control system;
the operational amplifier module is used for carrying out isolation protection on the control system.
The above aspect and any possible implementation further provide an implementation, where the processor is connected to the comparator.
In a second aspect, an embodiment of the present invention provides a method for testing a control system, which is applied to the testing apparatus according to any one of the above aspects and any possible implementation manners, and the method includes:
acquiring a preset voltage of a control system, an emission current corresponding to the preset voltage and a judgment current corresponding to the preset voltage;
adjusting the controllable voltage source to make the current of the second resistor equal to the emission current;
acquiring the current of a first resistor;
after the system rises for a long time, comparing the current of the first resistor with the judgment current;
when the current of the first resistor is larger than a specified value relative to the overshoot of the judgment current, determining that the control system is in an abnormal working state;
and when the overshoot of the current of the first resistor relative to the judgment current is smaller than or equal to a specified value, determining that the control system is in a normal working state.
The above aspect and any possible implementation further provide an implementation, where the control system includes: the device comprises a third resistor, a floating voltage source, a voltage setting module, a comparator and a power supply unit, wherein the processor is connected with the comparator, and the method further comprises the following steps:
and sending the voltage difference between two ends of the first resistor to the comparator so as to regulate the output voltage of the power supply unit.
In a third aspect, an embodiment of the present invention provides a test apparatus for a control system, where the apparatus includes:
the device comprises a first acquisition unit, a second acquisition unit and a control unit, wherein the first acquisition unit is used for acquiring a preset voltage of a control system, an emission current corresponding to the preset voltage and a judgment current corresponding to the preset voltage;
the adjusting unit is used for adjusting the controllable voltage source so that the current of the second resistor is equal to the emission current;
the second acquisition unit is used for acquiring the current of the first resistor;
the comparison unit is used for comparing the current of the first resistor with the judgment current after the system is raised for a long time;
the determining unit is used for determining that the control system is in an abnormal working state when the overshoot of the current of the first resistor relative to the judging current is larger than a specified value; alternatively, the first and second electrodes may be,
and when the overshoot of the current of the first resistor relative to the judgment current is smaller than or equal to a specified value, determining that the control system is in a normal working state.
The embodiment of the invention provides a testing device and a testing method of a control system. Firstly, acquiring a preset voltage of a control system, an emission current corresponding to the preset voltage and a judgment current corresponding to the preset voltage, then adjusting a controllable voltage source to enable the current of a second resistor to be equal to the emission current, and acquiring the current of a first resistor at the moment; after the system rises for a long time, comparing the current of the first resistor with the judgment current; and finally, determining whether the working state of the control system is normal or not according to the comparison result. The testing device provided by the embodiment of the invention can test the stability of the control system, and the filament in a vacuum environment is not required to be used for testing, so that the higher testing requirement on the control system is met.
[ description of the drawings ]
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of a prior art electron ionization source system;
FIG. 2 is a schematic diagram of a testing apparatus of a control system according to an embodiment of the present invention;
FIG. 3 is a flow chart of a method for testing a control system according to an embodiment of the present invention;
fig. 4 is a block diagram of a testing apparatus of a control system according to an embodiment of the present invention.
[ detailed description ] embodiments
For better understanding of the technical solutions of the present invention, the following detailed descriptions of the embodiments of the present invention are provided with reference to the accompanying drawings.
It should be understood that the described embodiments are only some embodiments of the invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The terminology used in the embodiments of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in the examples of the present invention and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
The word "if" as used herein may be interpreted as "at … …" or "when … …" or "in response to a determination" or "in response to a detection", depending on the context. Similarly, the phrases "if determined" or "if detected (a stated condition or event)" may be interpreted as "when determined" or "in response to a determination" or "when detected (a stated condition or event)" or "in response to a detection (a stated condition or event)", depending on the context.
It should be understood that the term "and/or" as used herein is merely one type of association that describes an associated object, meaning that three relationships may exist, e.g., a and/or B may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter related objects are in an "or" relationship.
An embodiment of the present invention provides a testing apparatus for a control system, which is suitable for a state testing process of stability and safety of the control system, and as shown in fig. 2, the testing apparatus includes:
and two ends of the first resistor 11 are respectively connected to an input interface in and an output interface out of the control system.
A second resistor 12, a first end 121 of the second resistor 12 is connected to the input interface in of the control system, and a second end 122 of the second resistor 12 is connected to the controllable voltage source 13.
The controllable voltage source 13 is connected to a processor 15.
For safety reasons, the controllable voltage source 13 may also be connected to ground, as shown in fig. 2.
And the signal acquisition module 14 is configured to acquire a voltage difference between two ends of the first resistor 11.
The processor 15 is configured to determine the current I of the first resistor 11 according to the voltage difference between the two ends of the first resistor 111And the size of the control system is used for judging whether the control system is in a normal state or not.
It should be noted that, compared with the conventional electron ionization source, the testing apparatus provided by the embodiment of the present invention has the first resistor 11 instead of the filament, and the current I flowing through the first resistor 111Namely, filament current can be simulated; the second resistor 12 is connected to a controllable voltage source 13, and the processor 15 adjusts the voltage Vn of the controllable voltage source 13 so that the current flowing through the second resistor 12 can be used to simulate the filament emission current in equal amounts.
In a specific application scenario, considering that in a traditional electron ionization source, the working current of a filament is usually 1-5 amperes, the equivalent resistance of the filament is 1-2 ohms, and the power of the filament can be calculated as watt level. Therefore, the first resistor 11 can be selected to be a high-precision resistor with 1.5 ohms and a rated power of 10 watts. The voltage across the first resistor 11 can be transmitted to the processor 15 in real time through signal acquisition, and the processor 15 monitors the current I1 of the first resistor 11 in real time according to the voltage difference across the first resistor 11.
It is further noted that a switch may be further disposed in the testing apparatus, and as shown in fig. 2, the switch is connected in series between the first resistor 11 and the input interface in of the control system, or connected in series between the first resistor 11 and the output interface out of the control system. The switch can control whether the testing device is connected with the control system.
Optionally, the signal collecting module 14 is further configured to collect a voltage difference across the second resistor 12.
The signal collecting module 14 collects a voltage difference between two ends of the second resistor 12 and transmits the voltage difference to the processor 15, so that the processor 15 can realize the current I of the second resistor 122And carrying out real-time monitoring.
Optionally, the testing apparatus further includes:
the first differential operational amplifier module 16 is configured to eliminate common mode interference of voltages across the first resistor 11.
As shown in fig. 2, the first differential operational amplifier module 16 is connected between the first resistor 11 and the signal acquisition module 14.
Optionally, the testing apparatus further includes:
and the second differential operational amplifier module 17 is configured to eliminate common mode interference of voltages across the second resistor 12.
As shown in fig. 2, the second differential operational amplifier module 17 is connected between the second resistor 12 and the signal acquisition module 14.
Optionally, in order to implement the operation and control of the testing apparatus, as shown in fig. 2, the testing apparatus further includes:
a manipulation module 18 connected to the processor 15.
In a specific implementation, the manipulation module 18 may be a user interaction device, such as a display with input and output functions.
Optionally, as shown in fig. 2, the control system includes: a third resistor 19, a floating voltage source 20, a voltage setting module 21, a comparator 22, a power supply unit 23 and an operational amplifier module 24.
The first end 191 of the third resistor 19 is grounded, and the second end 192 of the third resistor 19 is connected to the input interface in of the control system through the floating voltage source 20.
The voltage setting module 21 and the second end 192 of the third resistor 19 are respectively connected to the input end of the comparator 22, the output end of the comparator 22 is connected to the control end C of the power supply unit 23, and the positive pole + and the negative pole-of the power supply unit 23 are respectively connected to the output interface out and the input interface in of the control system.
Specifically, as shown in fig. 2, the power supply unit 23 includes a power supply module 231, a transformer 232, and a rectification module 233. The power module 231 is used for providing electric energy, the transformer 232 is used for changing the ratio of current to voltage provided by the power module 231, and the rectifying module 233 is used for correspondingly adjusting the current and voltage and outputting the adjusted current and voltage.
The operational amplifier module 24 is used for performing isolation protection on the control system.
It should be noted that, in the testing apparatus provided in the embodiment of the present invention, compared with the conventional electron ionization source, the current in the second resistor 12 simulates the filament emission current, the voltage difference between the two ends of the second resistor 12 is determined by the controllable voltage source 13 and the floating voltage source 20 in the control system, and if the floating voltage source is Vf, the resistance of the second resistor 12 is R2Then the current I flowing through the second resistor 122＝(Vn-Vf)/R2。
In a specific application scene, the filament emission current is mostly microampere-milliampere, and if Vf is-70V, R2100K ohm, filament emission current 0.1 ma, then Vn needs to be set to-60 v, i.e. current I can be realized2The filament emission current is simulated.
Optionally, the processor 15 is connected to the comparator 22 for closed loop control.
The embodiment of the invention provides a testing device of a control system, which is formed by a first resistor 11, a second resistor 12, a controllable voltage source 13, a signal acquisition module 14 and a processor 15. Firstly, acquiring a preset voltage of a control system, an emission current corresponding to the preset voltage and a judgment current corresponding to the preset voltage, then adjusting a controllable voltage source 13 to enable the current of a second resistor 12 to be equal to the emission current, and acquiring the current of a first resistor 11 at the moment; after the system is raised for a long time, comparing the current of the first resistor 11 with the judgment current; and finally, determining whether the working state of the control system is normal or not according to the comparison result. The testing device provided by the embodiment of the invention can test the stability of the control system, and the filament in a vacuum environment is not required to be used for testing, so that the higher testing requirement on the control system is met.
Based on the above test apparatus, an embodiment of the present invention provides a test method for a control system, where the test method is executed on a processor, as shown in fig. 3, and includes:
s301, acquiring a preset voltage of a control system, an emission current corresponding to the preset voltage and a judgment current corresponding to the preset voltage.
The preset voltage of the control system is determined by the voltage setting module, and when the suspension voltage is constant, the preset voltage with the specified size corresponds to the emission current with the determined value.
And, the predetermined voltage of the designated magnitude corresponds to the determination current of the determined value. Specifically, the judgment current refers to a standard current that the first resistor should have under a preset voltage of a specified magnitude.
And S302, adjusting the controllable voltage source to enable the current of the second resistor to be equal to the emission current.
And S303, acquiring the current of the first resistor.
S304, comparing the current of the first resistor with the judgment current after the system is raised for a long time.
S305, when the overshoot of the current of the first resistor relative to the judgment current is larger than a specified value, determining that the control system is in an abnormal working state; and when the overshoot of the current of the first resistor relative to the judgment current is smaller than or equal to a specified value, determining that the control system is in a normal working state.
Under a normal condition, after the system is raised for a long time, relative to the judgment current, if the current overshoot of the first resistor is more than 5%, the control system is considered to be in an abnormal working state; and if the current overshoot of the first resistor is less than or equal to 5%, the control system is in a normal working state.
The embodiment of the invention provides a test method of a control system, which comprises a test device consisting of a first resistor, a second resistor, a controllable voltage source, a signal acquisition module and a processor. Firstly, acquiring a preset voltage of a control system, an emission current corresponding to the preset voltage and a judgment current corresponding to the preset voltage, then adjusting a controllable voltage source to enable the current of a second resistor to be equal to the emission current, and acquiring the current of a first resistor at the moment; after the system rises for a long time, comparing the current of the first resistor with the judgment current; and finally, determining whether the working state of the control system is normal or not according to the comparison result. The testing device provided by the embodiment of the invention can test the stability of the control system, and the filament in a vacuum environment is not required to be used for testing, so that the higher testing requirement on the control system is met.
Further, in combination with the foregoing method flow, the control system includes: the invention further provides another possible implementation manner of the embodiment of the invention for realizing closed-loop control of a control system, and the implementation manner further comprises the following method flows, wherein the method flows comprise the following steps:
s306, sending the voltage difference between the two ends of the first resistor to the comparator so as to adjust the output voltage of the power supply unit.
When the control system is in an abnormal working state, the processor can feed back the voltage difference between the two ends of the first resistor to the comparator, so that the comparator adjusts the output voltage of the power supply unit according to the voltage difference between the two ends of the first resistor, and further closed-loop control is realized.
It should be noted that, based on the above-mentioned testing device, after confirming that the control system is in a normal operating state, the relationship between each parameter and the emission current can be further tested. Such as: (1) exploring the relation between the filament current (namely the current of the first resistor) and the filament emission current (namely the current of the second resistor) under the fixed suspension voltage; (2) under the fixed voltage setting, adjusting the voltage of a suspension voltage source, and exploring the relation between the suspension voltage and the filament emission current; (3) exploring the relationship between (1) and (2) under different environmental temperatures; and various filament performances can be further known by comparing various data obtained by the testing device with actual filament data placed in a vacuum environment, and a control system is improved.
It is further explained that the testing device can be used for mass spectrum electron ionization sources and can also be used for simulating the working process of other system filaments.
An embodiment of the present invention provides a testing apparatus for a control system, which is suitable for the above method flow, and as shown in fig. 4, the apparatus includes:
the first obtaining unit 41 is configured to obtain a preset voltage of a control system, an emission current corresponding to the preset voltage, and a judgment current corresponding to the preset voltage.
An adjusting unit 42 for adjusting the controllable voltage source such that the current of the second resistor is equal to the emission current.
And a second obtaining unit 43 for obtaining the current of the first resistor.
And the comparison unit 44 is configured to compare the current of the first resistor with the determination current after the system rise time period.
A determining unit 45, configured to determine that the control system is in an abnormal operating state when an overshoot of the current of the first resistor with respect to the determination current is greater than a specified value; or when the overshoot of the current of the first resistor relative to the judgment current is smaller than or equal to a specified value, determining that the control system is in a normal working state.
The embodiment of the invention provides a testing device of a control system, which is formed by a first resistor, a second resistor, a controllable voltage source, a signal acquisition module and a processor. Firstly, acquiring a preset voltage of a control system, an emission current corresponding to the preset voltage and a judgment current corresponding to the preset voltage, then adjusting a controllable voltage source to enable the current of a second resistor to be equal to the emission current, and acquiring the current of a first resistor at the moment; after the system rises for a long time, comparing the current of the first resistor with the judgment current; and finally, determining whether the working state of the control system is normal or not according to the comparison result. The testing device provided by the embodiment of the invention can test the stability of the control system, and the filament in a vacuum environment is not required to be used for testing, so that the higher testing requirement on the control system is met.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
The integrated unit implemented in the form of a software functional unit may be stored in a computer readable storage medium. The software functional unit is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device) or a Processor (Processor) to execute some steps of the methods according to the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (7)
1. A test apparatus for a control system, the test apparatus comprising:
the two ends of the first resistor are respectively connected to an input interface and an output interface of the control system;
a first end of the second resistor is connected to an input interface of the control system, and a second end of the second resistor is connected to a controllable voltage source;
the controllable voltage source is connected to the processor;
the signal acquisition module is used for acquiring the voltage difference between two ends of the first resistor;
the processor is used for determining the current of the first resistor according to the voltage difference between the two ends of the first resistor so as to judge whether the control system is in a normal state or not,
wherein the control system comprises: a third resistor, a suspension voltage source, a voltage setting module, a comparator, a power supply unit and an operational amplifier module,
the first end of the third resistor is grounded, and the second end of the third resistor is connected to an input interface of the control system through the suspension voltage source;
the voltage setting module and the second end of the third resistor are respectively connected to the input end of the comparator, the output end of the comparator is connected to the control end of the power supply unit, and the anode and the cathode of the power supply unit are respectively connected to the output interface and the input interface of the control system;
the operational amplifier module is used for carrying out isolation protection on the control system.
2. The testing device of claim 1, wherein the signal acquisition module is further configured to acquire a voltage difference across the second resistor.
3. The testing device of claim 1, further comprising:
and the first differential operational amplifier module is used for eliminating common-mode interference of voltages at two ends of the first resistor.
4. The testing device of claim 2, further comprising:
and the second differential operational amplifier module is used for eliminating common-mode interference of voltages at two ends of the second resistor.
5. The testing device of claim 1, further comprising:
and the control module is connected to the processor.
6. The test device of claim 1, wherein the processor is coupled to the comparator.
7. A method of testing a control system, adapted to the test apparatus of any one of claims 1 to 6, the method comprising:
acquiring a preset voltage of a control system, an emission current corresponding to the preset voltage and a judgment current corresponding to the preset voltage;
adjusting the controllable voltage source to make the current of the second resistor equal to the emission current;
acquiring the current of a first resistor;
after the system rises for a long time, comparing the current of the first resistor with the judgment current;
when the current of the first resistor is larger than a specified value relative to the overshoot of the judgment current, determining that the control system is in an abnormal working state;
when the overshoot of the current of the first resistor relative to the judgment current is less than or equal to a specified value, determining that the control system is in a normal working state,
wherein the control system comprises: the device comprises a third resistor, a suspension voltage source, a voltage setting module, a comparator, a power supply unit and an operational amplifier module, wherein the processor is connected with the comparator, and the method further comprises the following steps:
and sending the voltage difference between two ends of the first resistor to the comparator so as to regulate the output voltage of the power supply unit.
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