CN108919533A - Display panel test method and device, electronic equipment - Google Patents
Display panel test method and device, electronic equipment Download PDFInfo
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- CN108919533A CN108919533A CN201810892523.XA CN201810892523A CN108919533A CN 108919533 A CN108919533 A CN 108919533A CN 201810892523 A CN201810892523 A CN 201810892523A CN 108919533 A CN108919533 A CN 108919533A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
The invention discloses a kind of display panel test method and devices, electronic equipment, including：Obtain common voltage-reference optical parameter value curve for being measured at the subtest point of display panel and when m- reference optical parameter value curve, and, the voltage-transmittance curve measured at the test point of display panel；According to when m- reference optical parameter value curve and common voltage-reference optical parameter value curve, m- practical common voltage curve when obtaining；According to the relationship of voltage-transmittance curve test voltage and time, in conjunction with initial common voltage and when m- practical common voltage curve, obtain test voltage-voltage deviation curve；According to test voltage-voltage deviation curve, voltage-transmittance curve is corrected.Display panel test method proposed by the present invention and device, electronic equipment can obtain accurate VT curve.
Description
Technical field
The present invention relates to field of display technology, a kind of display panel test method and device, electronic equipment are particularly related to.
Background technique
At present the mainstream in flat-panel monitor first is that liquid crystal display (LCD) panel, have it is small in size, low in energy consumption, without spoke
It penetrates, the advantages such as manufacturing cost is low.Important test gimmick is exactly voltage-transmission of panel during LCD is manufactured
Rate (VT) curve.
But size and Orientation unknown straight is inevitably introduced during product operation or in test process
The phenomenon that stream remains (DC) into sample, and test data and curve is caused to occur offset (Shift), in this way, depositing due to DC
There is Shift relative to ideal curve in actual test VT curve, and conventional test gimmick is difficult to obtain the size of DC and change
Change.
Summary of the invention
In view of this, the first purpose of the embodiment of the present invention is, a kind of display panel test method and device, electricity are proposed
Sub- equipment can obtain accurate VT curve.
Based on above-mentioned purpose, the first aspect of the embodiment of the present invention provides a kind of display panel test method, packet
It includes：
Obtain common voltage-reference optical parameter value curve for being measured at the subtest point of display panel and when it is m-
Reference optical parameter value curve, and, the voltage-transmittance curve measured at the test point of display panel；Wherein, the electricity
Pressure-transmittance curve and it is described when m- reference optical parameter value curve measure simultaneously；
According to it is described when the m- reference optical parameter value curve and common voltage-reference optical parameter value curve, obtain
When m- practical common voltage curve；
According to the test voltage and the relationship of time of the voltage-transmittance curve, in conjunction with initial common voltage and described
When m- practical common voltage curve, obtain test voltage-voltage deviation curve；
According to the test voltage-voltage deviation curve, the voltage-transmittance curve is corrected.
Optionally, the method also includes：
Obtain the initial reference optical parameter value at the subtest point under initial common voltage；
M- reference optical parameter value curve and the initial reference optical parameter value when comparing described determine practical reference
Whether optical parameter value changes over time；
If the practical reference optical parameter value does not change over time, according to the common voltage-reference optical parameter
It is worth curve and determines practical common voltage, and voltage deviation is determined according to practical common voltage and the initial common voltage；
If the practical reference optical parameter value changes over time, according to it is described when m- reference optical parameter value curve
With the common voltage-reference optical parameter value curve, m- practical common voltage curve when obtaining；Also, according to test voltage
With the relationship of time, in conjunction with initial common voltage and it is described when m- practical common voltage curve, it is inclined to obtain test voltage-voltage
Shifting amount curve.
Optionally, the test voltage-voltage deviation curve is obtained by fit approach.
Optionally, the reference optical parameter is flashing or brightness.
Optionally, the subtest point is two or more；The method also includes：
Obtain the test voltage-voltage deviation curve measured respectively for different auxiliary test points；
The test voltage-voltage deviation curve is handled by the way of taking mean value or normal distribution, after obtaining amendment
Test voltage-voltage deviation curve；
According to the revised test voltage-voltage deviation curve, the voltage-transmittance curve is corrected.
Optionally, the method also includes：
According to revised voltage-transmittance curve, the symmetrical center line of generating positive and negative voltage is obtained；
According to the relationship of test voltage and time, in conjunction with it is described when m- practical common voltage curve, obtain test voltage with
The relationship of practical common voltage；
According to the symmetrical center line of the generating positive and negative voltage and the relationship of the test voltage and practical common voltage, in conjunction with
Revised voltage-the transmittance curve, obtains leaping voltage-transmittance curve.
Optionally, the method also includes：
Obtain the symmetrical centre of the corresponding generating positive and negative voltage of crucial transmitance；
According to the symmetrical centre of the generating positive and negative voltage, in conjunction with it is described when m- practical common voltage curve, obtain jump electricity
Pressure；
According to the crucial transmitance and its corresponding leaping voltage, fitting obtains leaping voltage-transmittance curve.
Optionally, the crucial transmitance includes：0.4%, 1.2%, 4%, 10%, 20%, 35%, 53%, 74%,
90%.
The second aspect of the embodiment of the present invention provides a kind of testing device of display panel, including：
Module is obtained, for obtaining the common voltage-reference optical parameter measured at the subtest point of display panel
Be worth curve and when m- reference optical parameter value curve, and, the voltage measured at the test point of display panel-transmitance is bent
Line；Wherein, the voltage-transmittance curve and it is described when m- reference optical parameter value curve measure simultaneously；
Processing module, for according to it is described when the m- reference optical parameter value curve and common voltage-reference optical join
Numerical curve, m- practical common voltage curve when obtaining；According to the test voltage of the voltage-transmittance curve and time
Relationship, in conjunction with initial common voltage and it is described when m- practical common voltage curve, obtain test voltage-voltage deviation curve；
And according to the test voltage-voltage deviation curve, correct the voltage-transmittance curve.
In terms of the third of the embodiment of the present invention, a kind of electronic equipment is provided, including：
At least one processor；And
The memory being connect at least one described processor communication；Wherein,
The memory is stored with the instruction that can be executed by one processor, and described instruction is by described at least one
It manages device to execute, so that at least one described processor is able to carry out the method as described in preceding any one.
From the above it can be seen that display panel test method provided in an embodiment of the present invention and device, electronic equipment,
By the offset containing DC generated in operation before detection LCD panel test and test process, so as to restore removal DC
Ideal VT curve afterwards.
Detailed description of the invention
Fig. 1 is the waveform diagram of step voltage when testing VT curve；
Fig. 2 is the waveform diagram of actual test VT curve and ideal VT curve；
Fig. 3 is the flow diagram of one embodiment of display panel test method provided by the invention；
Fig. 4 is the flow diagram of the initial preparation of display panel test method provided by the invention；
Fig. 5 is the schematic diagram of display panel in the embodiment of the present invention；
Fig. 6 is the schematic diagram of common voltage-reference optical parameter value curve one embodiment in the embodiment of the present invention；
The schematic diagram of Fig. 7 one embodiment of m- reference optical parameter value curve when being in the embodiment of the present invention；
Fig. 8 is the flow diagram of one embodiment of the present of invention；
Fig. 9 is the flow diagram of one embodiment of the present of invention；
Figure 10 is the flow diagram of one embodiment of the present of invention；
Figure 11 is the flow diagram of one embodiment of the present of invention；
Figure 12 is transmitance-leaping voltage curve schematic diagram in the embodiment of the present invention；
Figure 13 is the structural schematic diagram of one embodiment of testing device of display panel provided by the invention；
Figure 14 is the structural schematic diagram of electronic equipment provided by the invention.
Specific embodiment
To make the objectives, technical solutions, and advantages of the present invention clearer, below in conjunction with specific embodiment, and reference
Attached drawing, the present invention is described in more detail.
It should be noted that all statements for using " first " and " second " are for differentiation two in the embodiment of the present invention
The non-equal entity of a same names or non-equal parameter, it is seen that " first " " second " only for the convenience of statement, does not answer
It is interpreted as the restriction to the embodiment of the present invention, subsequent embodiment no longer illustrates this one by one.
A kind of VT curve test method, generally includes following steps：
Grid line (Gate) scanning signal normally exports, i.e., opens pixel line by line, and upper one is closed when opening current line pixel
Row pixel.Gate driving circuit output gate turn-on voltage (Vgon) when opening current line pixel, when closing lastrow pixel, grid
Pole driving circuit exports gate off voltage (Vgoff).
Public voltage signal is Vcom, and Vcom voltage can be taking human as being adjusted.
Data line (Data) voltage signal is generally provided by external dc power, removes the flip of one of Data signal
DC power supply is connect by conducting wire with its data line pad (Data pad) by film (COF).If Data voltage signal can include
Dry ladder (step) voltage, each step voltage includes two fixed generating positive and negative voltage values, symmetrical respectively about given Vcom,
Voltage signal is as shown in Figure 1.The brightness that the corresponding region Data pad is tested under each step voltage, take every brightness with
The brightness ratio of most bright spot is transmitance, ultimately forms voltage-transmittance curve, i.e. VT Curve.
There are leaping voltage △ Vp for LCD display, this also has led to our practical given Data voltages and leads through more than half
Body thin film transistor (TFT) can change after entering pixel electrode, this will result in entire VT curve with respect to Vcom voltage
Asymmetry, we can preferably think VT curve about Vcom+ △ Vp (i.e. Vcenter) voltage symmetry.By curve we
Available Vcenter, it is possible to preferably think the leaping voltage △ Vp=Vcenter-Vcom of product.
But the VT test method inevitably introduces size and side during product operation or in test process
To unknown DC into sample, the phenomenon that causing test data and curve to occur Shift, therefore we cannot be accurate
Vcenter value then cannot get accurate △ Vp, as shown in Fig. 2, actual test VT curve is relative to reason due to the presence of DC
Think that Shift occurs in curve, conventional test gimmick is unable to get the size and variation of DC, therefore we cannot compare it is calibrated
True VT curve and △ Vp.
The first aspect of the embodiment of the present invention, proposes a kind of display panel test method as shown in Figure 3, including with
Lower step：
Step 101：Obtain the common voltage-reference optical parameter value curve measured at the subtest point of display panel
With when m- reference optical parameter value curve, and, the voltage-transmittance curve measured at the test point of display panel；Its
In, the voltage-transmittance curve and it is described when m- reference optical parameter value curve measure simultaneously.
Optionally, before the step 101, some initial preparations can also be carried out, as shown in figure 4, specifically
It may include following steps：
Step 100a：Choose test point, subtest point and reference optical parameter (such as flashing, brightness parameter).Here,
The complete winner for choosing test point, subtest point and reference optical parameter, can be tester or needs to carry out VT curve
The user of calibration.
Refering to what is shown in Fig. 5, being usually provided with specific regions in display panel, it is exclusively used in test VT curve, it is special at this
Arbitrary point in region can be used as the test point；
Due to needing the subtest point to test the reference optical parameter for corresponding, the test point is assisted
Setting position need to be in the normal display area of display panel, but its specific position in the normal display area of display panel
Setting can be unlimited.
Step 100b：Measure common voltage-reference optical parameter value curve at the subtest point.Here, it measures
Common voltage-reference optical parameter value curve equipment at the subtest point can be the equipment for testing VT curve
(such as color analysis instrument).
Optionally, before the VT curve of test display panel, the common voltage-at the subtest point is tested first
Reference optical parameter value curve.Here, by taking Vcom-Flicker curve as an example, the shape of curve is as shown in fig. 6, visual flicker
(Flicker) it is the variation with Vcom and changes.
It is deviated it should be noted that the present embodiment is conceived to Vcom caused by DC in test, therefore is not limited to basis
Vcom-Flicker curve is modified, and can also be characterized by other modes such as Vcom-Lum (brightness), as long as V can be obtained
(DC Shift).
Step 100c：Voltage-transmittance curve at the test point is tested, while being acquired at the subtest point
Reference optical parameter value, and while obtaining m- reference optical parameter value curve.
Here, the test process that step 100c is carried out can be through equipment for testing VT curve (such as color
Analyzer) and measure.Optionally, voltage-transmittance curve at the test point can be is tested using an equipment, institute
State the reference optical parameter value at subtest point and it is corresponding when m- reference optical parameter value curve can be by another
Equipment test, that is, be directed to the test process of test point and subtest point, is to test completion respectively using two equipment.When
It so, when conditions permit, can also be by being integrated with the equipment for the function that can carry out two kinds of tests simultaneously come simultaneously
Complete the test process for being directed to test point and subtest point.
During carrying out VT curve test to the test point, the reference light at the subtest point need to be acquired simultaneously
Learn the curve that changes over time of parameter value, so as to by Vcom in particular point in time offset and the reference optical parameter value
Variation corresponds.So can correspond to obtain one group of Flicker with testing time t curve after the completion of VT curve test.With reference
For optical parameter is Flicker, as shown in fig. 7, being synchronously tested t-Flicker curve.
It arrives and measures the initialization of each required curve here and accuse completion.
Step 102：According to it is described when the m- reference optical parameter value curve and common voltage-reference optical parameter value
Curve, m- practical common voltage curve when obtaining.
Optionally, the corresponding reference optical parameter value of constant duration can be corresponded into the common voltage-reference light
It learns in parameter value curve, then obtains the practical common voltage at corresponding time point, then by obtained multiple discrete points (with the time
It is parameter with practical common voltage) by way of matched curve, m- practical common voltage curve when obtaining described.
Step 103：According to the test voltage and the relationship of time of the voltage-transmittance curve, in conjunction with initial common electrical
M- practical common voltage curve, obtains test voltage-voltage deviation curve when pressing and is described.
Refering to what is shown in Fig. 1, in the test process of VT curve, it is desirable to provide different step voltages, and in corresponding ladder electricity
The brightness of the test point is tested in pressure, and therefore, with the process of testing time, there is also differences for step voltage, and and the time
Between there are corresponding relationships.
At the beginning of being incorporated in test the initial common voltage that measures and it is described when m- practical common voltage curve, can obtain
When m- voltage deviation curve, and also there are corresponding relationships between the time for test voltage, therefore, can obtain test voltage-
Voltage deviation curve.
Step 104：According to the test voltage-voltage deviation curve, the voltage-transmittance curve is corrected.Pass through
Step 103 has obtained the relationship of test voltage and voltage deviation, can be modified accordingly to voltage-transmittance curve, from
And remove the offset containing DC in VT curve.
From above-described embodiment as can be seen that display panel test method provided in an embodiment of the present invention, passes through the detection face LCD
The offset containing DC for operating before plate test and being generated in test process, it is bent so as to restore the ideal VT after removal DC
Line.
Display panel test method provided in an embodiment of the present invention breaks routine test gimmick to obtain the characterization side of DC
Formula.Test operates the DC generated in the DC or test process being introduced into before and will have a direct impact on the Shift of VT curve, we can be with
Be equivalent to the Shift of Vcom, and the Shift of Vcom can be detected by the Flicker or brightness of panel, thus obtain by
Vcom Shift caused by DC.
By the display panel test method, capable of effectively detecting the size of DC in display panel, (size of DC can be with
With reference to the relatively good region of intermediate grayscale symmetry) and variation, and obtain the ideal VT curve of a removal DC.
As an alternative embodiment of the present invention, as shown in figure 8, the display panel test method, may also include with
Lower step：
Step 201：Obtain the initial reference optical parameter value at the subtest point under initial common voltage；
Specifically, when being tested using VT test equipment, by providing a stable Vcom value to display panel
(can be carried out by way of outer filling voltage, and the Vcom of entire panel needs unanimously), which is initial common voltage
Vcom (0), and corresponding Flicker is initial reference optical parameter value Flicker (0) to Vcom (0) at this time.
Step 202：M- reference optical parameter value curve and the initial reference optical parameter value when comparing described, determine
Whether practical reference optical parameter value changes over time.
It by t-Flicker curve, is compared with initial Flicker (0), it may be determined that determine practical reference optical parameter
Whether value changes over time.As shown in fig. 7, the two kinds of t-Flicker variation enumerated, initial value are Flicker
(0), the Flicker of type a is not changed over time, and the Flicker of type b then time to time change.Step 203：If described
Practical reference optical parameter value does not change over time, then is determined according to the common voltage-reference optical parameter value curve practical
Common voltage, and voltage deviation is determined according to practical common voltage and the initial common voltage.
For type a：It can be seen that Flicker has a mutation, does not change later, it is believed that before testing when test starts
DC is produced to the handling and operation of sample, but this DC does not change during the test.Such case is fairly simple, corresponding
The shift amount of the test front and back different corresponding Vcom of Flicker value difference can be read directly on Vcom-Flicker curve.As for
The offset change direction of Vcom can observe Flicker to initial value Flicker's (0) by adjusting Vcom value at this time
Change direction determines that we are named as V (DC Shift), at this time we by the VT curve actually obtained to corresponding offset this
A V (DC Shift) variable quantity is exactly ideal VT curve.
Step 204：If the practical reference optical parameter value changes over time, according to it is described when m- reference optical join
Numerical curve and the common voltage-reference optical parameter value curve, m- practical common voltage curve when obtaining.
Step 205：According to the test voltage and the relationship of time of the voltage-transmittance curve, in conjunction with initial common electrical
M- practical common voltage curve, obtains test voltage-voltage deviation curve when pressing and is described.
For type b：Flicker was changed with the testing time, illustrated that DC is generated in test process leads to the variation of Vcom,
And V (DC Shift) is the amount changed over time.Such case is more complicated, because of test VT curve and test reference optics
The time of parameter value is synchronous, it would be desirable to be carried out to the V (DC Shift) of corresponding temporal each Data voltage
It calculates, the Vcom's as caused by DC by Vcom-Flicker curve under our still available different gray scale voltages
Shift amount, i.e. V (DC Shift), by each gray scale voltage to the corresponding V of corresponding direction Shift (DC Shift), in this way I
Finally obtained the V (DC Shift) that panel generates under different grayscale, ultimately form ideal VT curve after a fitting.
In addition, type a and b may occur simultaneously, analysis method same type b is not repeated herein.
The quantity of the subtest point is not limited to 1, can be the subtest point of multiple positions in display panel,
As an alternative embodiment of the present invention, as shown in figure 9, subtest point can be selection two or more；It is described aobvious
Show panel test method, can also include the steps of：
Step 301：It is bent to obtain the test voltage-voltage deviation tested respectively for different auxiliary test points
Line；
Step 302：The test voltage-voltage deviation curve is handled by the way of taking mean value or normal distribution, is obtained
To revised test voltage-voltage deviation curve；
Step 303：According to the revised test voltage-voltage deviation curve, it is bent to correct the voltage-transmitance
Line.
In this way, by the change curve that obtains a plurality of Flicker perhaps brightness by taking mean value or normal distribution etc.
Reason mode obtains relatively reasonable curve, to obtain accurate DC value.
As shown in Fig. 2, being the obtained VT curve shape of routine VT curve test method.Wherein curve a is after being mixed into DC
The practical VT curve measured, curve symmetric center are Vcenter (a), and curve b is ideal VT curve after removal DC interference, bent
Line symmetrical centre is Vcenter (b), according to △ Vp=Vcenter (b)-Vcom theoretically.But due to DC there are us only
Vcenter (a) can be obtained, therefore also just cannot get △ Vp.
For the t-Flicker curve of type a above-mentioned, the leaping voltage of display panel is preferably calculated, calculation formula
For：△ Vp=Vcenter (a)-Vcom (0)+V (DC Shift).
For the t-Flicker curve of type b above-mentioned, we are not difficult to find out after obtaining corresponding amendment VT curve, real
The transmitance of border upper curve positive-negative polarity is not fully symmetrical, none complete symmetry axis especially compares in transmitance
When high or relatively low, this is because in the △ Vp and phase not to the utmost of different grayscale (different data voltage in other words) lower curve
Together, so as an alternative embodiment of the present invention, obtaining the characterizing method of △ Vp by VT the invention proposes a kind of.Such as
Shown in Figure 10, the display panel test method can also include the steps of：
Step 401：According to revised voltage-transmittance curve, the symmetrical center line of generating positive and negative voltage is obtained；
Step 402：According to the relationship of test voltage and time, in conjunction with it is described when m- practical common voltage curve, surveyed
Try the relationship of voltage and practical common voltage；
Step 403：According to the symmetrical center line of the generating positive and negative voltage and the test voltage and practical common voltage
Relationship obtains leaping voltage-transmittance curve in conjunction with the revised voltage-transmittance curve.
By choosing the corresponding positive and negative Data voltage of each transmitance (Tr.) from revised VT curve, take positive and negative
The symmetrical centre (average value) of voltage is Vcenter (Tr.), and △ Vp=Vcenter (Tr.)-Vcom under this transmitance is (practical
Common voltage), thus form a △ Vp curve at different transmitances (Tr.).In this way, the reason after reduction removes DC
After the VT curve thought, and then obtain the △ Vp of display panel.
For the t-Flicker curve of type b above-mentioned, another alternative embodiment of the invention proposes a kind of calculating
Method.As shown in figure 11, the display panel test method, can also include the steps of：
Step 501：Obtain the symmetrical centre of the corresponding generating positive and negative voltage of crucial transmitance；Optionally, the crucial transmitance
Including：0.4%, 1.2%, 4%, 10%, 20%, 35%, 53%, 74%, 90%；
Step 502：According to the symmetrical centre of the generating positive and negative voltage, in conjunction with it is described when m- practical common voltage curve, obtain
Leaping voltage；
Step 503：According to the crucial transmitance and its corresponding leaping voltage, fitting obtains leaping voltage-transmitance
Curve (as shown in figure 12).
It is referred to by the △ Vp value only chosen under crucial transmitance, as shown in figure 12, we choose transmitance and are
0.4%, the △ Vp value under 1.2%, 4%, 10%, 20%, 35%, 53%, 74%, 90% is as reference.It can be with by calculating
Obtain " △ Vp- transmitance " curve as shown in figure 12.The gamma curve and image retention tune of △ Vp under different transmitances to the later period
Section has important reference significance.
By above-mentioned display panel test method, capable of effectively detecting the size of DC in display panel, (size of DC can be with
With reference to the relatively good region of intermediate grayscale symmetry) and variation, and the ideal VT curve of a removal DC is obtained, and in turn
Obtain correct △ Vp.
Display panel test method provided in an embodiment of the present invention, increases in VT curve test and can detecte the face LCD
The DC for operating before plate test and being generated in test process；So as to restore the ideal VT curve after removal DC, and then can be with
Obtain the accurate △ Vp of LCD product.
The second aspect of the embodiment of the present invention proposes a kind of one embodiment of testing device of display panel, can
Obtain accurate VT curve.It as shown in figure 13, is one embodiment of testing device of display panel provided by the invention
Structural schematic diagram.
The testing device of display panel, including：
Module 601 is obtained, for obtaining the common voltage measured at the subtest point of display panel-reference optical ginseng
Numerical curve and when m- reference optical parameter value curve, and, the voltage-transmitance measured at the test point of display panel
Curve；Wherein, the voltage-transmittance curve and it is described when m- reference optical parameter value curve measure simultaneously；
Processing module 602, for according to it is described when the m- reference optical parameter value curve and common voltage-reference light
Learn parameter value curve, m- practical common voltage curve when obtaining；According to the relationship of test voltage and time, in conjunction with initial public
Voltage and it is described when m- practical common voltage curve, obtain test voltage-voltage deviation curve；And according to the test
Voltage-voltage offset curve corrects the voltage-transmittance curve.
It should be noted that the display panel in the present embodiment can be：Electronic Paper, mobile phone, tablet computer, television set,
Any products or components having a display function such as laptop, Digital Frame, navigator.
From above-described embodiment as can be seen that testing device of display panel provided in an embodiment of the present invention, passes through the detection face LCD
The offset containing DC for operating before plate test and being generated in test process；It is bent so as to restore the ideal VT after removal DC
Line.
As an embodiment of the present invention, the acquisition module 601, is also used to obtain the institute under initial common voltage
State the initial reference optical parameter value at subtest point；
The processing module 602, is also used to：
M- reference optical parameter value curve and the initial reference optical parameter value when comparing described determine practical reference
Whether optical parameter value changes over time；
If the practical reference optical parameter value does not change over time, according to the common voltage-reference optical parameter
It is worth curve and determines practical common voltage, and voltage deviation is determined according to practical common voltage and the initial common voltage；
If the practical reference optical parameter value changes over time, according to it is described when m- reference optical parameter value curve
With the common voltage-reference optical parameter value curve, m- practical common voltage curve when obtaining；Also, according to test voltage
With the relationship of time, in conjunction with initial common voltage and it is described when m- practical common voltage curve, it is inclined to obtain test voltage-voltage
Shifting amount curve.
As an embodiment of the present invention, the subtest point is two or more；The acquisition module 601, is also used
Different test voltage-voltage deviation the curves for assisting test points and testing respectively are directed in obtaining；
The processing module 602, is also used to：
The test voltage-voltage deviation curve is handled by the way of taking mean value or normal distribution, after obtaining amendment
Test voltage-voltage deviation curve；
According to the revised test voltage-voltage deviation curve, the voltage-transmittance curve is corrected.
As an embodiment of the present invention, the processing module 602, is also used to：
According to revised voltage-transmittance curve, the symmetrical center line of generating positive and negative voltage is obtained；
According to the relationship of test voltage and time, in conjunction with it is described when m- practical common voltage curve, obtain test voltage with
The relationship of practical common voltage；
According to the symmetrical center line of the generating positive and negative voltage and the relationship of the test voltage and practical common voltage, in conjunction with
Revised voltage-the transmittance curve, obtains leaping voltage-transmittance curve.
As an embodiment of the present invention, the processing module 602, is also used to：
Obtain the symmetrical centre of the corresponding generating positive and negative voltage of crucial transmitance；
According to the symmetrical centre of the generating positive and negative voltage, in conjunction with it is described when m- practical common voltage curve, obtain jump electricity
Pressure；
According to the crucial transmitance and its corresponding leaping voltage, fitting obtains leaping voltage-transmittance curve.
Optionally, the crucial transmitance includes：0.4%, 1.2%, 4%, 10%, 20%, 35%, 53%, 74%,
90%.
It should be noted that any embodiment of aforementioned testing device of display panel, it can be optional real using two kinds
Mode is applied to realize.One of which is surveyed by the way that function possessed by above-mentioned testing device of display panel is integrated into existing VT
It tries in equipment, such as in color analysis instrument, so that color analysis instrument is measuring primary data (for example, in subtest point
The common voltage that place measures-reference optical parameter value curve and when m- reference optical parameter value curve, and, at test point
Voltage-the transmittance curve measured) after can be done directly corresponding processing step, to obtain revised curve.It is another then
It is the equipment by having processing function, connects VT test equipment to obtain corresponding primary data, then itself go to complete phase
The subsequent processing steps answered are to obtain revised curve.
For latter implementation mode, the embodiment of the present invention can also provide a kind of test system for display panel, wherein wrapping
It includes：Any embodiment of testing device of display panel above-mentioned, and, VT test equipment (such as color analysis instrument), the color
Color analyzer be used to measure common voltage-reference optical parameter value curve at subtest point and when m- reference optical ginseng
Numerical curve, and, voltage-transmittance curve at test point.
Optionally, the testing device of display panel, which can be arbitrary, has the equipment of processing function to realize, such as
PC (PC), tablet computer (PAD), mobile phone etc. the equipment for having processing function common in the art, or
Person is integrated with the novel test equipment of aforementioned testing device of display panel.Such testing device of display panel, by above-mentioned
Display panel test method completes the amendment for VT curve.
Based on above-mentioned purpose, the third aspect of the embodiment of the present invention proposes a kind of execution display panel test
One embodiment of the device of method.It as shown in figure 14, is the dress provided by the invention for executing the display panel test method
The hardware structural diagram of the one embodiment set.
As shown in figure 14, described device includes：
One or more processors 701 and memory 702, in Figure 14 by taking a processor 701 as an example.
The device for executing the display panel test method can also include：Input unit 703 and output device
704。
Processor 701, memory 702, input unit 703 and output device 704 can pass through bus or other modes
It connects, in Figure 14 for being connected by bus.
Memory 702 is used as a kind of non-volatile computer readable storage medium storing program for executing, can be used for storing non-volatile software journey
Sequence, non-volatile computer executable program and module, such as the display panel test method pair in the embodiment of the present application
Program instruction/the module answered (for example, acquisition module 601 and processing module 602 shown in attached drawing 13).Processor 701 passes through fortune
Non-volatile software program, instruction and the module that row is stored in memory 702, are answered thereby executing the various functions of server
With and data processing, that is, realize above method embodiment display panel test method.
Memory 702 may include storing program area and storage data area, wherein storing program area can store operation system
Application program required for system, at least one function；Storage data area, which can be stored, uses institute according to testing device of display panel
The data etc. of creation.In addition, memory 702 may include high-speed random access memory, it can also include non-volatile memories
Device, for example, at least a disk memory, flush memory device or other non-volatile solid state memory parts.In some embodiments
In, optional memory 702 includes the memory remotely located relative to processor 701, these remote memories can pass through net
Network is connected to member user's behavior monitoring device.The example of above-mentioned network includes but is not limited to internet, intranet, local
Net, mobile radio communication and combinations thereof.
Input unit 703 can receive the number or character information of input, and generate the use with testing device of display panel
Family setting and the related key signals input of function control.Output device 704 may include that display screen etc. shows equipment.
One or more of modules are stored in the memory 702, when by one or more of processors
When 701 execution, the display panel test method in above-mentioned any means embodiment is executed.It is described to execute the display panel test
The embodiment of the device of method, technical effect are same or similar with aforementioned any means embodiment.
The embodiment of the invention provides a kind of non-transient computer storage medium, the computer storage medium is stored with meter
The processing of the operation of the list items in above-mentioned any means embodiment can be performed in calculation machine executable instruction, the computer executable instructions
Method.The embodiment of the non-transient computer storage medium, technical effect it is identical as aforementioned any means embodiment or
It is similar.
Finally, it should be noted that those of ordinary skill in the art will appreciate that realizing the whole in above-described embodiment method
Or part process, it is that related hardware can be instructed to complete by computer program, the program can be stored in a calculating
In machine read/write memory medium, the program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein, described
Storage medium can be magnetic disk, CD, read-only memory (Read-Only Memory, ROM) or random access memory
(Random Access Memory, RAM) etc..The embodiment of the computer program, technical effect and aforementioned any means
Embodiment is same or similar.
Those of ordinary skills in the art should understand that：The above is only a specific embodiment of the present invention, and
It is not used in the limitation present invention, all within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. done,
It should be included within protection scope of the present invention.
Claims (10)
1. a kind of display panel test method, which is characterized in that including：
Obtain common voltage-reference optical parameter value curve for being measured at the subtest point of display panel and when m- reference
Optical parameter value curve, and, the voltage-transmittance curve measured at the test point of display panel；Wherein, the voltage-
Transmittance curve and it is described when m- reference optical parameter value curve measure simultaneously；
According to it is described when the m- reference optical parameter value curve and common voltage-reference optical parameter value curve, when obtaining
M- practical common voltage curve；
According to the test voltage and the relationship of time of the voltage-transmittance curve, in conjunction with initial common voltage and it is described when it is m-
Practical common voltage curve obtains test voltage-voltage deviation curve；
According to the test voltage-voltage deviation curve, the voltage-transmittance curve is corrected.
2. the method according to claim 1, wherein further including：
Obtain the initial reference optical parameter value at the subtest point under initial common voltage；
M- reference optical parameter value curve and the initial reference optical parameter value when comparing described, determine practical reference optical
Whether parameter value changes over time；
It is bent according to the common voltage-reference optical parameter value if the practical reference optical parameter value does not change over time
Line determines practical common voltage, and determines voltage deviation according to practical common voltage and the initial common voltage；
If the practical reference optical parameter value changes over time, according to it is described when m- reference optical parameter value curve and institute
Common voltage-reference optical parameter value curve is stated, m- practical common voltage curve when obtaining；Also, according to test voltage and when
Between relationship, in conjunction with initial common voltage and it is described when m- practical common voltage curve, obtain test voltage-voltage deviation
Curve.
3. the method according to claim 1, wherein the test voltage-voltage deviation curve is by quasi-
Conjunction mode obtains.
4. the method according to claim 1, wherein the reference optical parameter is flashing or brightness.
5. the method according to claim 1, wherein subtest point is two or more；The method is also
Including：
Obtain the test voltage-voltage deviation curve measured respectively for different auxiliary test points；
The test voltage-voltage deviation curve is handled by the way of taking mean value or normal distribution, obtains revised survey
Try Voltage-voltage offset curve；
According to the revised test voltage-voltage deviation curve, the voltage-transmittance curve is corrected.
6. method according to claim 1-5, which is characterized in that further include：
According to revised voltage-transmittance curve, the symmetrical center line of generating positive and negative voltage is obtained；
According to the relationship of test voltage and time, in conjunction with it is described when m- practical common voltage curve, obtain test voltage and reality
The relationship of common voltage；
According to the symmetrical center line of the generating positive and negative voltage and the relationship of the test voltage and practical common voltage, in conjunction with described
Revised voltage-transmittance curve, obtains leaping voltage-transmittance curve.
7. method according to claim 1-5, which is characterized in that further include：
Obtain the symmetrical centre of the corresponding generating positive and negative voltage of crucial transmitance；
According to the symmetrical centre of the generating positive and negative voltage, in conjunction with it is described when m- practical common voltage curve, obtain leaping voltage；
According to the crucial transmitance and its corresponding leaping voltage, fitting obtains leaping voltage-transmittance curve.
8. the method according to the description of claim 7 is characterized in that the key transmitance includes：0.4%, 1.2%, 4%,
10%, 20%, 35%, 53%, 74%, 90%.
9. a kind of testing device of display panel, which is characterized in that including：
Module is obtained, it is bent for obtaining the common voltage measured at the subtest point of display panel-reference optical parameter value
Line and when m- reference optical parameter value curve, and, the voltage-transmittance curve measured at the test point of display panel；Its
In, the voltage-transmittance curve and it is described when m- reference optical parameter value curve measure simultaneously；
Processing module, for according to it is described when the m- reference optical parameter value curve and common voltage-reference optical parameter value
Curve, m- practical common voltage curve when obtaining；According to the test voltage and the relationship of time of the voltage-transmittance curve,
In conjunction with initial common voltage and it is described when m- practical common voltage curve, obtain test voltage-voltage deviation curve；And
According to the test voltage-voltage deviation curve, the voltage-transmittance curve is corrected.
10. a kind of electronic equipment, including：
At least one processor；And
The memory being connect at least one described processor communication；Wherein,
The memory is stored with the instruction that can be executed by one processor, and described instruction is by least one described processor
It executes, so that at least one described processor is able to carry out the method as described in claim 1-8 any one.
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| CN113296296A (en) * | 2021-05-24 | 2021-08-24 | 京东方科技集团股份有限公司 | Liquid crystal box testing device and method |
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