CN108917923B - Power measurement method and electronic equipment - Google Patents
Power measurement method and electronic equipment Download PDFInfo
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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Abstract
The invention discloses a power measurement method and electronic equipment, which relate to the field of optics and are applied to the electronic equipment, wherein the electronic equipment comprises: a filtering unit, a power measurement unit, and a plurality of spectral measurement units, the method comprising: and measuring the light beam from the supercontinuum light source by a plurality of spectrum measuring units to obtain spectrum data of a plurality of wave bands of the light beam. And splicing the spectrum data of the multiple wave bands to obtain the total spectrum data of the light beam. And filtering the light beam from the supercontinuum light source through the filtering unit to obtain a light beam with a preset wave band. And measuring the light beam with the preset wave band through the power measuring unit to obtain the power of the light beam with the preset wave band. And generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam with the preset wave band. The method can improve the accuracy of measuring the total power of the supercontinuum light source.
Description
Technical Field
The present invention relates to the field of optics, and in particular, to a power measurement method and an electronic device.
Background
With the rapid development of science and technology in recent years, the supercontinuum light source is widely applied to civil and military fields such as spectroscopy, environmental monitoring, chemical sensing, biochemistry, infrared countermeasure and the like with the advantages of high brightness, high coherence, superbandwidth and the like. At present, a laser power meter is generally used for measuring the total power of the supercontinuum light source, but the bandwidth of the supercontinuum light source is extremely wide, the measuring range of the laser power meter is limited, so that a plurality of laser power meters are needed to be used for measuring the supercontinuum light source, and the calibration methods of different laser power meters for laser power of different wave bands are different, so that the problem that the measurement of the total power of the supercontinuum light source is not accurate enough exists.
Disclosure of Invention
The embodiment of the invention mainly aims to provide a power measurement method and electronic equipment, which can improve the accuracy of measuring the total power of a supercontinuum light source.
An embodiment of the present invention provides a power measurement method, applied to an electronic device, where the electronic device includes: a filtering unit, a power measurement unit, and a plurality of spectral measurement units, the method comprising: measuring light beams from a supercontinuum light source through a plurality of spectrum measuring units to obtain spectrum data of a plurality of wave bands of the light beams; splicing the spectrum data of the multiple wave bands to obtain the total spectrum data of the light beam; filtering the light beam from the supercontinuum light source through the filtering unit to obtain a light beam with a preset wave band; measuring the light beam of the preset wave band through the power measuring unit to obtain the power of the light beam of the preset wave band; and generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam with the preset wave band.
A second aspect of an embodiment of the present invention provides an electronic device, including: the spectrum measuring units are used for measuring the light beams from the supercontinuum light source to obtain spectrum data of a plurality of wave bands of the light beams; the splicing unit is connected with the plurality of spectrum measuring units and is used for splicing the spectrum data of the plurality of wave bands to obtain the total spectrum data of the light beam; the filtering unit is used for filtering the light beam from the supercontinuum light source to obtain a light beam with a preset wave band; the power measurement unit is connected with the filtering unit and is used for measuring the light beam of the preset wave band to obtain the power of the light beam of the preset wave band; the generation unit is connected with the splicing unit and the power measuring unit and is used for generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam with the preset wave band.
According to the embodiment, the spectrum data of the multiple wavebands are directly measured through the multiple spectrum measuring units, the light beams of the preset wavebands are obtained through filtering of the light source through the filtering unit, the light beams of the preset wavebands are directly measured through the power measuring unit, then the total power of the light source is obtained through calculation of the spectrum data of the multiple wavebands and the power of the preset wavebands, and the total power of the light source is obtained through measurement and summation of the power meters of different wavebands, so that errors caused by different calibration methods of the power meters of different wavebands are avoided, and the accuracy of measuring the total power of the supercontinuum light source is improved.
Drawings
Fig. 1 is a schematic application diagram of a power measurement method in a first embodiment provided by the present invention;
fig. 2 is a schematic flow chart of an implementation of a power measurement method in the first embodiment provided by the present invention;
fig. 3 is a schematic flow chart of an implementation of a power measurement method in a second embodiment provided by the present invention;
fig. 4 is a schematic structural diagram of an electronic device in a third embodiment provided by the present invention.
Detailed Description
In order to make the objects, features and advantages of the present invention more comprehensible, the technical solutions in the embodiments of the present invention will be clearly described in conjunction with the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1, fig. 1 is a schematic application diagram of a power measurement method in a first embodiment of the present invention, where the method is applied to an electronic device. As shown in fig. 1, the electronic device includes a filtering unit 101, a power measuring unit 102, and a plurality of spectrum measuring units 103. Illustratively, the plurality of spectral measurement units 103 receive light beams from the supercontinuum light source 105 through multimode fiber jumpers 104 for measurement. The filtering unit 101 may be a band-pass filter, the power measuring unit 102 may be a laser power meter, and the spectrum measuring unit 103 may be a spectrometer.
Referring to fig. 2, fig. 2 is a schematic flow chart of an implementation of a power measurement method in a first embodiment provided by the present invention. As shown in fig. 2, the power measurement method includes:
201. and measuring the light beam from the supercontinuum light source by a plurality of spectrum measuring units to obtain spectrum data of a plurality of wave bands of the light beam.
Specifically, because the supercontinuum light source has the characteristic of extremely wide bandwidth, and the measurement range of a single spectrum measurement unit is limited, a plurality of spectrum measurement units with different measurement ranges are adopted to measure the light beam from the supercontinuum light source, and accordingly, each spectrum measurement unit obtains spectrum data in the measurement range after measuring the light beam. That is, the wavelength band of the spectrum data measured by each spectrum measuring unit is not larger than the measurement range of each spectrum measuring unit. It will be appreciated that in order to obtain spectral data of the full bandwidth of the supercontinuum light source, the sum of the measurement ranges of the plurality of spectral measurement units therefore includes the full bandwidth of the supercontinuum light source.
202. And splicing the spectrum data of the multiple wave bands to obtain the total spectrum data of the light beam.
Specifically, since the spectral data measured by each spectral measurement unit is the spectral data of the partial wave band of the light beam from the supercontinuum light source, the spectral data measured by each spectral measurement unit are spliced, and the wave bands corresponding to the spectral data are different, that is, the spectral data of each wave band are spliced to obtain the total spectral data of the light beam.
203. And filtering the light beam from the supercontinuum light source through the filtering unit to obtain a light beam with a preset wave band.
Specifically, since the bandwidth of the light beam from the supercontinuum light source is extremely wide and the measurement range of the power measurement unit is limited, the light beam is subjected to filtering processing by the filtering unit before being measured by the power measurement unit, so as to obtain a light beam of a preset band. In practical applications, the filtering unit may be a band-pass filter, which is a device that allows a wave in a specific frequency band to pass while shielding other frequency bands, and it can be understood that the band allowed to pass by the filtering unit is a band of a light beam in the preset band, and the band of the light beam in the preset band is located within a bandwidth of the light beam from the supercontinuum light source.
204. And measuring the light beam with the preset wave band through the power measuring unit to obtain the power of the light beam with the preset wave band.
Specifically, after the light beam is subjected to filtering treatment by the filtering unit, a light beam with a preset wave band is obtained, and then the light beam with the preset wave band is measured by the power measuring unit so as to obtain the power of the light beam with the preset wave band. It will be appreciated that the wavelength band of the light beam of the predetermined wavelength band is not greater than the measurement range of the power measurement unit, which is less than the bandwidth of the light beam from the supercontinuum light source.
205. And generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam with the preset wave band.
Specifically, the total spectrum data obtained by splicing the spectrum data of the multiple wave bands and the power of the light beam of the preset wave band obtained by measuring by the power measuring unit generate the total power of the light beam. In the process, the total power of the light beam can be obtained through subsequent calculation by only one power measuring unit.
In the embodiment of the invention, the spectrum data of a plurality of wave bands are directly measured by a plurality of spectrum measuring units, the light source is filtered by a filtering unit to obtain the light beam of the preset wave band, the light beam of the preset wave band is directly measured by a power measuring unit, and then the total power of the light source is obtained by directly measuring the spectrum data of the plurality of wave bands and the power of the preset wave band, and the total power of the light source is obtained by measuring and summing the light source by using the power meters of different wave bands, so that errors caused by different calibration methods of the power meters of different wave bands are avoided, and the accuracy of measuring the total power of the supercontinuum light source is improved.
Referring to fig. 3, fig. 3 is a schematic flow chart of an implementation of a power measurement method according to a second embodiment of the present invention, where the power measurement method is applied to an electronic device. As shown in fig. 3, the method mainly comprises the following steps:
301. and measuring the light beam from the supercontinuum light source by a plurality of spectrum measuring units to obtain spectrum data of a plurality of wave bands of the light beam.
302. And converting the linear spectrum data into converted logarithmic spectrum data, and selecting any one spectrum data from the logarithmic spectrum data and the converted logarithmic spectrum data as reference logarithmic spectrum data.
Specifically, since the logarithmic spectrum data is obtained by measuring the light beam by the partial spectrum measuring unit and the linear spectrum data is obtained by measuring the light beam by the partial spectrum measuring unit, the spectrum data of a plurality of wave bands in the spectrum data of the plurality of wave bands are logarithmic spectrum data, and the spectrum data of the remaining wave bands are linear spectrum data. To further process the plurality of spectral data, the linear spectral data is converted into converted logarithmic spectral data. Alternatively, the linear spectral data is converted to converted logarithmic spectral data using the following formula:
y＝-10lg(x)
where x is a linear intensity value of a certain wavelength measured by the spectrum measuring unit, and y is a logarithmic intensity value of a corresponding wavelength.
The logarithmic spectrum data and the conversion logarithmic spectrum data are in the form of the logarithmic intensity values of the wavelengths and the corresponding wavelengths, and any one spectrum data is selected from the logarithmic spectrum data and the conversion logarithmic spectrum data to be used as reference logarithmic spectrum data.
Optionally, the spectral data including the minimum wavelength is selected from the logarithmic spectral data and the converted logarithmic spectral data as the reference spectral data, or the spectral data including the intermediate wavelength of the light beam from the supercontinuum light source is selected from the logarithmic spectral data and the converted logarithmic spectral data as the reference spectral data, or the spectral data including the maximum wavelength is selected from the logarithmic spectral data and the converted logarithmic spectral data as the reference spectral data.
303. And selecting the spectrum data with the corresponding wave band overlapped with the wave band of the reference logarithmic spectrum data from the rest logarithmic spectrum data and the converted logarithmic spectrum data as the logarithmic spectrum data to be spliced.
Specifically, spectrum data which coincides with the wave band of the reference logarithmic spectrum data is selected from the logarithmic spectrum data and the conversion logarithmic spectrum data except the reference logarithmic spectrum data as the logarithmic spectrum data to be spliced. The bands of the reference logarithmic spectrum data are, for example, 350 to 750nm (unit: nm), and the remaining two bands of the spectrum data are, respectively: 650-1250 nm and 1150-1700 nm, wherein the spectral data with the wave band range of 650-1250 nm is overlapped with the wave band of the reference spectral data, and the spectral data with the wave band range of 1150-1700 nm is not overlapped with the wave band of the reference spectral data, so that the spectral data with the wave band range of 650-1250 nm is logarithmic spectral data to be spliced.
304. And calculating according to a preset algorithm based on the reference logarithmic spectrum data and the coincident wave band of the logarithmic spectrum data to be spliced to obtain the connection wavelength.
Specifically, because errors and uncertainties caused by boundaries of measurement ranges of the spectrum measurement units are increased, after overlapping bands of the reference logarithmic spectrum data and the spectrum data to be spliced are determined, wavelengths of the boundaries of the overlapping bands are not selected as connection wavelengths, but the connection wavelengths are calculated according to the overlapping bands according to a preset algorithm, and the preset algorithm can be designed according to actual conditions. For example, if the band of the reference log spectrum data is 350 to 750nm, the band range of the log spectrum data to be spliced is 650 to 1250nm, and the overlapping band of the reference log spectrum data and the log spectrum data to be spliced is 650 to 750nm, then the intermediate wavelength of the overlapping band can be selected as the connection wavelength, that is, 700nm is calculated according to (650+750)/(2=700 nm) as the connection wavelength.
305. Respectively obtaining a reference logarithmic intensity value and a logarithmic intensity value to be spliced, which correspond to the connection wavelength, from the reference logarithmic spectrum data and the logarithmic spectrum data to be spliced;
306. subtracting the reference logarithmic intensity value from the logarithmic intensity value to be spliced to obtain a deviation value, subtracting the deviation value from all logarithmic intensity values in the logarithmic spectrum data to be spliced according to the deviation value, splicing the logarithmic spectrum data to be spliced and the reference logarithmic spectrum data at the connecting wavelength, and taking the spliced reference logarithmic spectrum data and the logarithmic spectrum data to be spliced as new reference logarithmic spectrum data.
In particular, in theory, the intensity value of a certain wavelength of a light beam from the same light source should be a constant value, but because of a systematic error existing between different spectrum measurement units, there is an error in the intensity value measured for the same wavelength from the same light source, and thus the obtained reference logarithmic intensity value corresponding to the connection wavelength and the logarithmic intensity value to be spliced may be unequal.
Therefore, the reference logarithmic intensity value is subtracted from the logarithmic intensity value to be spliced to obtain the deviation value. It will be appreciated that the offset value may be zero. After determining the deviation value, it is explained that the error of the logarithmic intensity value of the log-spectrum data to be spliced, which is the whole equivalent to the reference logarithmic intensity value, is the deviation value, so that the deviation value is subtracted from all the logarithmic intensity values in the log-spectrum data to be spliced so that the log-intensity value to be spliced at the connection wavelength is equal to the reference logarithmic intensity value at the connection wavelength, that is, the point at the connection wavelength of the reference log-spectrum data and the point at the connection wavelength of the log-spectrum data to be spliced can be overlapped, and after the point is overlapped, the reference log-spectrum data and the log-spectrum data to be spliced can be spliced together in a coordinate system with the wavelength on the abscissa and the logarithmic intensity on the ordinate. It will be appreciated that the reference log spectral data and the log spectral data to be spliced are phased and form a new spectral data set which is the new reference log spectral data.
Wherein steps 303-306 are repeatedly performed based on the new reference log spectral data, and when there is no log spectral data left and log spectral data is converted, step 307 is performed: and (3) until all the spectrum data of the wave bands are spliced together, obtaining the total logarithmic spectrum data of the light beam.
308. And converting the total logarithmic spectrum data of the light beam to obtain the bus spectrum data of the light beam.
Specifically, in order to facilitate the subsequent calculation of the total power of the light beam, the total log spectral data of the light beam is converted to obtain the bus spectral data of the light beam. Illustratively, the conversion may be performed according to the following formula:
where x is a logarithmic intensity value corresponding to a certain wavelength in the total logarithmic spectrum data, and y is a linear intensity value corresponding to the wavelength.
309. And filtering the light beam from the supercontinuum light source through the filtering unit to obtain a light beam with a preset wave band.
310. And measuring the light beam with the preset wave band through the power measuring unit to obtain the power of the light beam with the preset wave band.
311. Summing the bus spectrum data of the light beam to obtain the spectrum total intensity of the light beam; selecting and summing the spectrum data of the preset wave band from the bus spectrum data of the light beam to obtain the spectrum intensity of the light beam of the preset wave band; generating the total power of the light beam according to the total spectrum intensity of the light beam, the spectrum intensity of the light beam with the preset wave band and the power of the light beam with the preset wave band.
Specifically, the total spectral data of the light beam is summed, that is, the total spectral intensity of the light beam is integrated, the lower limit of the integration is the minimum wavelength in the total spectral data, and the upper limit of the integration is the maximum wavelength in the total spectral data, so as to obtain the total spectral intensity of the light beam.
Because the preset wave band is included in the wave band of the bus spectrum data, in order to obtain the spectrum intensity of the light beam of the preset wave band, the spectrum data of the preset wave band can be selected from the bus spectrum data of the light beam to be summed, namely, the spectrum data of the preset wave band is integrated, the lower limit of the integration is the minimum wavelength of the preset wave band, and the upper limit of the integration is the maximum wavelength of the preset wave band.
Wherein, the total power of the light beam can be generated according to the following formula according to the total spectrum intensity of the light beam, the spectrum intensity of the light beam with the preset wave band and the power of the light beam with the preset wave band:
wherein P is Total (S) Representing the total power of the beam S Total (S) The total spectral intensity of the light beam is represented, S represents the spectral intensity of the light beam of the preset wave band, and P represents the power of the light beam of the preset wave band.
Optionally, dividing the total spectral intensity of the light beam by the total power of the light beam yields a ratio between the total spectral intensity of the light beam and the total power of the light beam.
Dividing the total intensity value of the spectrum of the light beam by the proportion value to obtain the spectrum power density data of the light beam.
Specifically, the power density is an important parameter for representing the performance of the supercontinuum light source, and is an important standard for judging the quality of the light source, and the unit is typically mw/nm (unit: milliwatt/nanometer). There is a certain relation between the spectral intensity distribution and the spectral power density distribution of the light beam, and the larger the spectral intensity of a certain wave band is, the larger the spectral power density of the wave band is. Thus after the total spectral intensity of the light beam is obtained. Dividing the total spectral intensity of the light beam by the total power of the light beam to obtain a ratio between the total spectral intensity of the light beam and the total power of the light beam. Dividing all data of the linear spectrum intensity by the slope to obtain power density data of the light beam, and dividing all intensity values in the total spectrum intensity of the light beam by the proportion value to obtain spectrum power density data of the light beam.
Optionally, in order to improve the intuitiveness and convenience of the total log spectrum data, the bus spectrum data and the spectrum power density data of the light beam, the total log spectrum graph of the light beam, the bus spectrum graph of the light beam and the power density distribution graph of the light beam are respectively obtained by drawing according to the total log spectrum data of the light beam, the bus spectrum data of the light beam and the spectrum power density data of the light beam.
In the embodiment of the invention, the spectrum data of a plurality of wave bands are directly measured by a plurality of spectrum measuring units, the light source is filtered by a filtering unit to obtain the light beam of the preset wave band, the light beam of the preset wave band is directly measured by a power measuring unit, and then the total power of the light source is obtained by directly measuring the spectrum data of the plurality of wave bands and the power of the preset wave band, and the total power of the light source is obtained by measuring and summing the light source by using the power meters of different wave bands, so that errors caused by different calibration methods of the power meters of different wave bands are avoided, and the accuracy of measuring the total power of the supercontinuum light source is improved. And the intuitiveness and convenience of the method are improved by plotting the total logarithmic spectrum data, the bus spectrum data and the spectrum power density data.
Referring to fig. 4, fig. 4 is a schematic structural diagram of an electronic device in a third embodiment provided by the present invention. . As shown in fig. 4, the electronic device mainly includes:
and a plurality of spectrum measuring units 401 for measuring the light beams from the supercontinuum light source to obtain spectrum data of a plurality of wave bands of the light beams.
And the splicing unit 402 is connected with the plurality of spectrum measuring units 401 and is used for splicing the spectrum data of the plurality of wave bands to obtain the total spectrum data of the light beam.
The filtering unit 403 is configured to perform filtering processing on the light beam from the supercontinuum light source, so as to obtain a light beam with a preset band.
And the power measurement unit 404 is connected with the filtering unit 403 and is used for measuring the light beam with the preset wave band to obtain the power of the light beam with the preset wave band.
And the generating unit 405 is connected with the splicing unit 402 and the power measuring unit 404, and is used for generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam with a preset wave band.
Further, the spectrum data of a plurality of wave bands in the spectrum data of a plurality of wave bands are logarithmic spectrum data, the spectrum data of the rest wave bands are linear spectrum data,
the stitching unit 402 is further configured to convert the linear spectrum data into converted log spectrum data, and select any one spectrum data from the log spectrum data and the converted log spectrum data as reference log spectrum data.
The splicing unit 402 is further configured to select, from the remaining log spectrum data and the converted log spectrum data, spectrum data with a corresponding band overlapping with a band of the reference log spectrum data, as log spectrum data to be spliced.
The splicing unit 402 is further configured to calculate, according to a preset algorithm, a connection wavelength based on the reference log spectrum data and the coincident band of the log spectrum data to be spliced.
The splicing unit 402 is further configured to obtain a reference log intensity value and a log intensity value to be spliced corresponding to the connection wavelength from the reference log spectrum data and the log spectrum data to be spliced, respectively.
The splicing unit 402 is further configured to subtract the reference log intensity value from the log intensity value to be spliced to obtain an offset value, and subtract the offset value from all log intensity values in the log spectrum data to be spliced according to the offset value, so as to splice the log spectrum data to be spliced and the reference log spectrum data together at a connection wavelength.
The splicing unit 402 is further configured to take the spliced reference log spectrum data and the log spectrum data to be spliced as new reference log spectrum data, and execute, based on the new reference log spectrum data, selecting, from the remaining log spectrum data and the converted log spectrum data, spectrum data with corresponding bands overlapping with the bands of the reference log spectrum data as the log spectrum data to be spliced, until all the spectrum data of the multiple bands are spliced together, to obtain total log spectrum data of the light beam.
The splicing unit 402 is further configured to convert the total log spectrum data of the light beam to obtain bus spectrum data of the light beam.
Further, the generating unit 405 is further configured to sum the total linear spectrum data of the light beam to obtain a total spectrum intensity of the light beam.
The generating unit 405 is further configured to select and sum spectral data of a preset band from the bus spectral data of the light beam, so as to obtain a spectral intensity of the light beam of the preset band.
The generating unit 405 is further configured to generate the total power of the light beam according to the total spectrum intensity of the light beam, the spectrum intensity of the light beam in the preset band, and the power of the light beam in the preset band.
Further, the electronic device further includes:
the calculating unit 406 is connected to the generating unit 405, and is configured to divide the total spectral intensity of the light beam by the total power of the light beam, so as to obtain a ratio value between the total spectral intensity of the light beam and the total power of the light beam.
The calculating unit 406 is further configured to divide all intensity values in the total spectrum intensity of the light beam by the proportional value to obtain the spectral power density data of the light beam.
The drawing unit 407 is connected to the generating unit 405 and the calculating unit 406, and is configured to draw according to the total log spectrum data of the light beam, the bus spectrum data of the light beam, and the spectral power density data of the light beam, so as to obtain a total log spectrum of the light beam, a bus spectrum of the light beam, and a power density distribution diagram of the light beam.
Further, the generating unit 405 is further configured to generate the total power of the light beam according to the total spectrum intensity of the light beam, the spectrum intensity of the light beam of the preset wavelength band, and the power of the light beam of the preset wavelength band according to the following formula:
wherein P is Total (S) Representation ofTotal power of light beam S Total (S) The total spectral intensity of the light beam is represented, S represents the spectral intensity of the light beam in a preset wave band, and P represents the power of the light beam in the preset wave band.
In the embodiment of the invention, the spectrum data of a plurality of wave bands are directly measured by a plurality of spectrum measuring units, the light source is filtered by a filtering unit to obtain the light beam of the preset wave band, the light beam of the preset wave band is directly measured by a power measuring unit, and then the total power of the light source is obtained by directly measuring the spectrum data of the plurality of wave bands and the power of the preset wave band, and the total power of the light source is obtained by measuring and summing the light source by using the power meters of different wave bands, so that errors caused by different calibration methods of the power meters of different wave bands are avoided, and the accuracy of measuring the total power of the supercontinuum light source is improved.
It should be noted that, for the sake of simplicity of description, the foregoing method embodiments are all expressed as a series of combinations of actions, but it should be understood by those skilled in the art that the present invention is not limited by the order of actions described, as some steps may be performed in other order or simultaneously according to the present invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are all preferred embodiments, and that the acts and modules referred to are not necessarily all required for the present invention.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and for parts of one embodiment that are not described in detail, reference may be made to related descriptions of other embodiments.
The foregoing description of the power measurement method and the electronic device provided by the present invention is for those skilled in the art, and according to the ideas of the embodiments of the present invention, there are changes in the specific embodiments and the application scope, and in summary, the present disclosure should not be construed as limiting the present invention.
Claims (6)
1. A power measurement method, characterized by being applied to an electronic device, the electronic device comprising: a filtering unit, a power measurement unit, and a plurality of spectral measurement units, the method comprising:
measuring light beams from a supercontinuum light source through a plurality of spectrum measuring units to obtain spectrum data of a plurality of wave bands of the light beams, wherein the spectrum data of a plurality of wave bands in the spectrum data of the plurality of wave bands are logarithmic spectrum data, and the spectrum data of the rest wave bands are linear spectrum data;
splicing the spectrum data of the multiple wave bands to obtain total spectrum data of the light beam, wherein the method comprises the following steps:
converting the linear spectrum data into converted logarithmic spectrum data, and selecting any one spectrum data from the logarithmic spectrum data and the converted logarithmic spectrum data as reference logarithmic spectrum data;
selecting spectrum data with corresponding wave bands overlapped with the wave bands of the reference logarithmic spectrum data from the rest logarithmic spectrum data and the converted logarithmic spectrum data as logarithmic spectrum data to be spliced;
based on the reference logarithmic spectrum data and the coincident wave bands of the logarithmic spectrum data to be spliced, calculating according to a preset algorithm to obtain a connection wavelength;
respectively obtaining a reference logarithmic intensity value and a logarithmic intensity value to be spliced, which correspond to the connection wavelength, from the reference logarithmic spectrum data and the logarithmic spectrum data to be spliced;
subtracting the reference logarithmic intensity value from the logarithmic intensity value to be spliced to obtain a deviation value, and subtracting the deviation value from all logarithmic intensity values in the logarithmic spectrum data to be spliced according to the deviation value so as to splice the logarithmic spectrum data to be spliced and the reference logarithmic spectrum data together at the connecting wavelength;
taking the spliced reference log spectrum data and the log spectrum data to be spliced as new reference log spectrum data, and executing the steps of selecting spectrum data with corresponding wave bands overlapped with the wave bands of the reference log spectrum data from the rest log spectrum data and the conversion log spectrum data based on the new reference log spectrum data to be spliced as log spectrum data until all the spectrum data of the wave bands are spliced together to obtain total log spectrum data of the light beam;
converting the total logarithmic spectrum data of the light beam to obtain bus spectrum data of the light beam;
filtering the light beam from the supercontinuum light source through the filtering unit to obtain a light beam with a preset wave band;
measuring the light beam of the preset wave band through the power measuring unit to obtain the power of the light beam of the preset wave band;
generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam with the preset wave band, wherein the method comprises the following steps:
summing the bus spectrum data of the light beams to obtain the spectrum total intensity of the light beams;
selecting and summing the spectrum data of the preset wave band from the bus spectrum data of the light beam to obtain the spectrum intensity of the light beam of the preset wave band;
and generating the total power of the light beam according to the total spectrum intensity of the light beam, the spectrum intensity of the light beam with the preset wave band and the power of the light beam with the preset wave band.
2. The power measurement method of claim 1, wherein the method further comprises:
dividing the total spectral intensity of the light beam by the total power of the light beam to obtain a ratio value between the total spectral intensity of the light beam and the total power of the light beam;
dividing all intensity values in the total spectrum intensity of the light beam by the proportion value to obtain spectrum power density data of the light beam;
and drawing according to the total logarithmic spectrum data of the light beam, the bus spectrum data of the light beam and the spectrum power density data of the light beam to respectively obtain a total logarithmic spectrum diagram of the light beam, a bus spectrum diagram of the light beam and a power density distribution diagram of the light beam.
3. The power measurement method of claim 1, wherein the total power of the light beam is generated according to the total spectral intensity of the light beam, the spectral intensity of the light beam of the preset wavelength band, and the power of the light beam of the preset wavelength band according to the following formula:
in the method, in the process of the invention,
representing the total power of the beam, +.>
Representing the total spectral intensity of said beam, +.>
Representing the spectral intensity of the light beam of said preset band, a +.>
Representing the power of the beam of light of the preset band.
4. An electronic device, the electronic device comprising:
the device comprises a plurality of spectrum measuring units, a plurality of spectrum measuring units and a spectrum processing unit, wherein the spectrum measuring units are used for measuring light beams from a supercontinuum light source to obtain spectrum data of a plurality of wave bands of the light beams, the spectrum data of a plurality of wave bands in the spectrum data of the wave bands are logarithmic spectrum data, and the spectrum data of the rest wave bands are linear spectrum data;
the splicing unit is connected with the plurality of spectrum measuring units and is used for splicing the spectrum data of the plurality of wave bands to obtain the total spectrum data of the light beam, and comprises the following steps:
converting the linear spectrum data into converted logarithmic spectrum data, and selecting any one spectrum data from the logarithmic spectrum data and the converted logarithmic spectrum data as reference logarithmic spectrum data;
selecting spectrum data with corresponding wave bands overlapped with the wave bands of the reference logarithmic spectrum data from the rest logarithmic spectrum data and the converted logarithmic spectrum data as logarithmic spectrum data to be spliced;
based on the reference logarithmic spectrum data and the coincident wave bands of the logarithmic spectrum data to be spliced, calculating according to a preset algorithm to obtain a connection wavelength;
respectively obtaining a reference logarithmic intensity value and a logarithmic intensity value to be spliced, which correspond to the connection wavelength, from the reference logarithmic spectrum data and the logarithmic spectrum data to be spliced;
subtracting the reference logarithmic intensity value from the logarithmic intensity value to be spliced to obtain a deviation value, and subtracting the deviation value from all logarithmic intensity values in the logarithmic spectrum data to be spliced according to the deviation value so as to splice the logarithmic spectrum data to be spliced and the reference logarithmic spectrum data together at the connecting wavelength;
taking the spliced reference log spectrum data and the log spectrum data to be spliced as new reference log spectrum data, and executing the steps of selecting spectrum data with corresponding wave bands overlapped with the wave bands of the reference log spectrum data from the rest log spectrum data and the conversion log spectrum data based on the new reference log spectrum data to be spliced as log spectrum data until all the spectrum data of the wave bands are spliced together to obtain total log spectrum data of the light beam;
converting the total logarithmic spectrum data of the light beam to obtain bus spectrum data of the light beam;
the filtering unit is used for filtering the light beam from the supercontinuum light source to obtain a light beam with a preset wave band;
the power measurement unit is connected with the filtering unit and is used for measuring the light beam of the preset wave band to obtain the power of the light beam of the preset wave band;
the generating unit is connected with the splicing unit and the power measuring unit and is used for generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam with the preset wave band, and comprises the following steps:
summing the bus spectrum data of the light beams to obtain the spectrum total intensity of the light beams;
selecting and summing the spectrum data of the preset wave band from the bus spectrum data of the light beam to obtain the spectrum intensity of the light beam of the preset wave band;
and generating the total power of the light beam according to the total spectrum intensity of the light beam, the spectrum intensity of the light beam with the preset wave band and the power of the light beam with the preset wave band.
5. The electronic device of claim 4, wherein the electronic device further comprises:
the calculating unit is connected with the generating unit and is used for dividing the total spectrum intensity of the light beam by the total power of the light beam to obtain a ratio value between the total spectrum intensity of the light beam and the total power of the light beam;
the calculating unit is further configured to divide all intensity values in the total spectrum intensity of the light beam by the ratio value to obtain spectrum power density data of the light beam;
and the drawing unit is connected with the generating unit and the calculating unit and is used for drawing according to the total logarithmic spectrum data of the light beam, the bus spectrum data of the light beam and the spectrum power density data of the light beam to respectively obtain a total logarithmic spectrum diagram of the light beam, a bus spectrum diagram of the light beam and a power density distribution diagram of the light beam.
6. The electronic device of claim 4,
the generating unit is further configured to generate the total power of the light beam according to the total spectrum intensity of the light beam, the spectrum intensity of the light beam in the preset band, and the power of the light beam in the preset band according to the following formula:
in the method, in the process of the invention,
representing the total power of the beam, +.>
Representing the total spectral intensity of said beam, +.>
Representing the spectral intensity of the light beam of said preset band, a +.>
Representing the power of the beam of light of the preset band. />
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| CN106462081A (en) * | 2014-06-04 | 2017-02-22 | 西默有限公司 | Estimation of spectral feature of pulsed light beam |
| CN104713641A (en) * | 2015-03-25 | 2015-06-17 | 西安应用光学研究所 | Broadband terahertz source radiant power calibration device and method |
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