CN108917707A - A kind of laser deflection measuring apparatus and its measurement method - Google Patents
A kind of laser deflection measuring apparatus and its measurement method Download PDFInfo
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- CN108917707A CN108917707A CN201810772647.4A CN201810772647A CN108917707A CN 108917707 A CN108917707 A CN 108917707A CN 201810772647 A CN201810772647 A CN 201810772647A CN 108917707 A CN108917707 A CN 108917707A
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- value
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- monitoring point
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C5/00—Measuring height; Measuring distances transverse to line of sight; Levelling between separated points; Surveyors' levels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
Abstract
The present invention relates to a kind of laser deflection measuring apparatus and its measurement methods.Including testing agency, it is provided with detection faces in the testing agency and limits the linear array CCD scanning device moved horizontally in range in detection faces, the detection faces are the rectangular detection faces of transparent configuration, the lower section of the testing agency is equipped with the fixed plate being connected with measured point, the fixed plate is equipped with laser range finder, position of the laser range finder in fixed plate is adjustable, and the testing agency is built-in with lithium battery and GPRS/3G/GPS module.As shown from the above technical solution, the present invention is emitted on laser to detection faces by laser range finder, pass through linear array CCD scanning device scanning back and forth in detection faces, the judgement to light spot shape and position can be achieved, and calculate the sedimentation value of measuring device in the change in location of detection faces by measuring hot spot.
Description
Technical field
The present invention relates to engineering surveying instrument fields, and in particular to one kind is for detecting building settlement value and horizontal displacement
The laser deflection measuring apparatus and its measurement method of value.
Background technique
Currently, the measurement of sedimentation value and horizontal displacement value for building, large-scale component class equipment mostly use greatly it is following
Mode：1) it is measured based on whole station instrument：Total station needs to be arranged special datum mark in measurement, and needs by professional skill
Art personnel go measurement, observation, basically can not realize the transmission of full automatic real-time measurement and data, and error is comparatively
It is all bigger；2) it is measured using automatic measurement machine people：Automatic measurement machine people is a kind of total station of full-automation, valence
Lattice are very high, troublesome maintenance, are unsuitable for being widely applied and apply.
Summary of the invention
The purpose of the present invention is to provide a kind of laser deflection measuring apparatus, which solves existing measurement side
In formula measure measured object sedimentation in terms of can not real-time online measuring problem, greatly facilitate scene measurement and construction,
Management etc..
To achieve the above object, the invention adopts the following technical scheme：Including testing agency, in the testing agency
It is provided with detection faces and limits the linear array CCD scanning device moved horizontally in range in detection faces, the detection faces are
The rectangular detection faces of bright structure, the lower section of the testing agency are equipped with the fixed plate being connected with measured point, the fixed plate
It is equipped with laser range finder, position of the laser range finder in fixed plate is adjustable, and the testing agency is built-in with lithium
Battery and GPRS/3G/GPS module.
The cover for sunshade and rainwater-proof is provided with above the testing agency, setting is useful above the cover
In the bracket of fixed solar panel.
The laser range finder is connected by rotary head with fixed plate, and the laser range finder and rotary head are cut with scissors
The adjustment being connected to realize laser range finder horizontal direction position is connect, the rotary head and fixed plate are hinged and connected to realize
The adjustment of laser range finder vertical direction position.
The fixed plate is L-type fixed plate, and horizontal plate face is connected with the bottom of testing agency, and vertical plate face passes through
Expansion bolt is mutually fixed with measured point, and the rotary head is hinged and connected with expansion bolt.
The testing agency is built-in with quarter-bell Rouser, which is changed awake device and supplied using independent button cell
Electricity.
As shown from the above technical solution, the present invention is emitted on laser to detection faces by laser range finder, passes through line array CCD
Scanning means scanning back and forth in detection faces is being examined by measuring hot spot, it can be achieved that judgement to light spot shape and position
The change in location in survey face calculates the sedimentation value of measuring device.
Another object of the present invention is to provide a kind of measurement methods of laser deflection measuring apparatus, include the following steps：
Step (1)：1,2,3 ... n+1 platform measuring devices are installed at An point respectively in A0, A1, A2 ..., wherein A0 and
Measuring device at An point is located on datum mark, and the measuring device at A1, A2 ... An-1 point is located on monitoring point；
Step (2)：The position for adjusting laser range finder makes the facula position alignment A1 point that laser range finder emits at A0 point
Locate the center of detection faces, and so on；
Step (3)：The power supply for opening measuring device determines hot spot by scanning back and forth for linear array CCD scanning device
Position；
Step (4)：The sedimentation value of each monitoring point is determined by the change in location of hot spot.
In the step (3), the sampling unit of linear array CCD scanning device is 96, is divided between each linear array unit
1.00mm, the peak value of each pixel unit are 1024, and single-chip microcontroller samples the illumination value for reading each unit, bonding wire by AD
Battle array CCD scanning means draws the image of glossing up in the step value of X-direction in single-chip microcontroller, then according to the bright of each unit
Degree finds out the position that position corresponding to brightness maxima is hot spot.
In the step (1), the sedimentation value at datum mark A0 and An is 0, i.e. A0=0, An=0, and each monitoring point sinks
Depreciation is：
Wherein：AmFor the sedimentation value of each monitoring point；
M is the number of monitoring point；
AmWhen for the current measurement value of m-th of monitoring point；
AmIt is just the initial measurement of m-th of monitoring point；
Work as m=n, when An ≠ 0, the sedimentation value of each monitoring point is：
Wherein：A'm is the sedimentation value of m-th of monitoring point after mis-tie misclosure adjustment；
AmWhen for the current measurement value of m-th of monitoring point；
AmIt is just the initial measurement of m-th of monitoring point；
Am is m-th point of the sedimentation value calculated from a datum mark accumulation；
N is total monitoring point quantity；
An is the sedimentation value of n point.
The position of hot spot is obtained by following formula：
As Xn=Amax,
Formula one：X (n+1)=A (n+1)<Amax；
Formula two：X (n-1)=A (n-1)<Amax；
Formula three：Amax=Amin+F
Wherein：Xn is the coordinate of n-th of line array CCD unit；
An is the numerical value that n-th of line array CCD unit is read；
Amax is the maximum value in the An currently measured；
Amin is the minimum value in the An currently measured；
F is resolution of the system in vertical direction；
A is the most bright value of hot spot after calculating；
X is the corresponding position A；
By calculating the specific coordinate value of A to formula one, two derivation of formula.
As shown from the above technical solution, measurement method provided by the invention can determine each monitoring point by the position of hot spot
Sedimentation value.
Detailed description of the invention
Fig. 1 is main view of the invention；
Fig. 2 is the left view of Fig. 1；
Fig. 3 is usage state diagram of the invention；
Fig. 4 is the analysis chart of facula position solution formula in the method for the present invention.
Specific embodiment
The present invention will be further described with reference to the accompanying drawing：
A kind of laser deflection measuring apparatus as shown in Figure 1 and Figure 2, including testing agency 1 are provided with inspection in testing agency 1
Survey face 2 and the linear array CCD scanning device 3 moved horizontally in the restriction range of detection faces 2, detection faces 2 are the side of transparent configuration
Shape detection faces, the lower section of testing agency 1 are equipped with the fixed plate 4 being connected with measured point, and fixed plate 4 is equipped with laser range finder 5,
Position of the laser range finder 5 in fixed plate 4 is adjustable, specifically, laser range finder 5 passes through rotary head 8 and 4 phase of fixed plate
Even, laser range finder 5 and rotary head 8 are hinged and connected the adjustment to realize 5 horizontal direction position of laser range finder, rotary head
8 are hinged and connected the adjustment to realize 5 vertical direction position of laser range finder with fixed plate 4.More specifically, fixed plate 4 is L-type
Fixed plate, horizontal plate face are connected with the bottom of testing agency 1, and vertical plate face is mutually fixed by expansion bolt 9 with measured point,
Rotary head 8 is hinged and connected with expansion bolt 9.
Further, testing agency 1 is built-in with lithium battery and GPRS/3G/GPS module, and the top of testing agency 1 is provided with
For sunshade and the cover 6 of rainwater-proof, the bracket 7 for fixing solar panel, solar battery are provided with above cover 6
Plate is the lithium battery power supply inside testing agency 1.
Further, testing agency 1 is built-in with quarter-bell Rouser, which changes awake device using independent button cell
Power supply.After completing sampling operation, measurement host can set the starting time of work next time, and it is completely disconnected then to measure host
Electricity opens constantly worked by quarter-bell Rouser again, realizes power saving to the maximum extent.
The working principle of laser deflection measuring apparatus and use process is as follows：
Measuring device of the invention is using the line laser that laser range finder 5 emits as the horizontal line of reference, by the light of laser
Spot is irradiated in the detection faces 2 of measuring device, and linear array CCD scanning device 3 scans back and forth in the horizontal direction in detection faces 2, can
It realizes judgement to light spot shape and position, and measuring device is calculated in the change in location of detection faces 2 by measurement hot spot
Sedimentation value.
As shown in figure 3, the mode that pole connection when in use, can be used in this measuring device measures.First is measured
Device and last measuring device are placed in standard point, remaining measuring device is individually positioned on each measured point, is passed through
The position of laser range finder 5 is adjusted, the line laser for launching the laser range finder 5 of previous measuring device is incident upon next
In the detection faces 2 of measuring device, and it is located at the center of detection faces 2；By scanning back and forth for linear array CCD scanning device 3, i.e.,
The judgement to light spot shape and position can be achieved；Meanwhile while the transmitting line laser of laser range finder 5, laser ranging can measure
Distance of the instrument 5 apart from detection faces 2 can determine whether the original that sedimentation occurs by measuring the distance change of laser emission point and detection faces
Cause is then caused by the sedimentation of detection faces if distance is there is no variation；It is then detection faces if distance is changed
Inclination.
By taking existing high-speed rail construction as an example, existing high-speed rail construction is substantially all to use overhead mode, according to existing
Job specfication, as soon as general 35 meters or so bridge piers, one kilometer of needs nearly 30 bridge pier, and these bridge piers are required to arrange
Personnel carry out periodic measurement sedimentation and shift value, and the measurement content of this part needs to extend through the construction of high-speed rail, operation.Together
When very manifold bridge pier and bridge geographical location it is also very special, also taken a lot of work very much using manual measurement, and in Special section,
Work or high-risk work are measured, annual railway department, which has to expend sizable man power and material, thus goes to handle.From height
The data that the construction party of iron obtains, the expense of the existing each bridge pier measurement of technology is at monthly 3000 yuan or so, one kilometer of height
Metal bridge pier is each in terms of measurement nearly to spend 10W or so, and the measuring device of the application is used to measure, and expense is too late
The 2% of traditional expense, and data can be uploaded in real time, measurement accuracy can achieve 0.1mm, be much higher than existing measurement
Technology, therefore there is great marketing condition.
The present invention also provides a kind of measurement methods of laser deflection measuring apparatus, include the following steps：
Step (1)：1,2,3 ... n+1 platform measuring devices are installed at An point respectively in A0, A1, A2 ..., wherein A0 and
Measuring device at An point is located on datum mark, and the measuring device at A1, A2 ... An-1 point is located on monitoring point；
Step (2)：The position for adjusting laser range finder makes the facula position alignment A1 point that laser range finder emits at A0 point
Locate the center of detection faces, and so on；
Step (3)：The power supply for opening measuring device determines hot spot by scanning back and forth for linear array CCD scanning device
Position；
Step (4)：The sedimentation value of each monitoring point is determined by the change in location of hot spot.
Further, in step (3), the sampling unit of linear array CCD scanning device is 96, the interval of each linear array unit
For 1.00mm, the peak value of each pixel unit is 1024, and single-chip microcontroller samples the illumination value for reading each unit by AD, in conjunction with
Linear array CCD scanning device draws the image of glossing up in the step value of X-direction in single-chip microcontroller, then according to each unit
The position that position corresponding to brightness maxima is hot spot is found out in brightness.
Further, in step (1), sedimentation value at datum mark A0 and An is 0, i.e. A0=0, An=0, each monitoring point
Sedimentation value is：
Wherein：AmFor the sedimentation value of each monitoring point；
M is the number of monitoring point；
AmWhen for the current measurement value of m-th of monitoring point；
AmIt is just the initial measurement of m-th of monitoring point；
Work as m=n, when An ≠ 0, the sedimentation value of each monitoring point is：
Wherein：A'm is the sedimentation value of m-th of monitoring point after mis-tie misclosure adjustment；
AmWhen for the current measurement value of m-th of monitoring point；
AmIt is just the initial measurement of m-th of monitoring point；
Am is m-th point of the sedimentation value calculated from a datum mark accumulation；
N is total monitoring point quantity；
An is the sedimentation value of n point.
Further, the position of hot spot is obtained by following formula：
As Xn=Amax,
Formula one：X (n+1)=A (n+1)<Amax；
Formula two：X (n-1)=A (n-1)<Amax；
Formula three：Amax=Amin+F
Wherein：Xn is the coordinate of n-th of line array CCD unit；
An is the numerical value that n-th of line array CCD unit is read；
Amax is the maximum value in the An currently measured；
Amin is the minimum value in the An currently measured；
F is resolution ratio of the system in vertical direction；
A is the most bright value of hot spot after calculating；
X is the corresponding position A；
Amax=Amin+F, when F value is 100 or so, resolution ratio 1/100mm can achieve 0.01mm, it is contemplated that real
The influence of the environment light on border, the minimum resolution of the system can achieve 0.05mm.
By calculating the specific coordinate value of A to formula one, two derivation of formula.Namely by A (n-1) and A (n+1)
Derivation, calculates the coordinate in the crosspoint of two straight lines, to calculate the specific coordinate value of A, as shown in Figure 4.
The precision of measurement is determined that under good illumination, F value is 100 or more by F.When F value is 100 or so, differentiate
Rate is 1/100mm, can achieve 0.01mm, it is contemplated that the minimum resolution of the influence of actual environment light, the system can reach
To 0.05mm.
Embodiment described above only describe the preferred embodiments of the invention, not to model of the invention
It encloses and is defined, without departing from the spirit of the design of the present invention, those of ordinary skill in the art are to technical side of the invention
The various changes and improvements that case is made should all be fallen into the protection scope that claims of the present invention determines.
Claims (9)
1. a kind of laser deflection measuring apparatus, it is characterised in that：Including testing agency (1), the testing agency is arranged on (1)
There are detection faces (2) and limits the linear array CCD scanning device (3) moved horizontally in range, the detection faces in detection faces (2)
It (2) is the rectangular detection faces of transparent configuration, the lower section of the testing agency (1) is equipped with the fixed plate (4) being connected with measured point,
The fixed plate (4) is equipped with laser range finder (5), and position of the laser range finder (5) on fixed plate (4) can
It adjusts, the testing agency (1) is built-in with lithium battery and GPRS/3G/GPS module.
2. laser deflection measuring apparatus according to claim 1, it is characterised in that：It is set above the testing agency (1)
It is equipped with the cover (6) for sunshade and rainwater-proof, the branch for fixing solar panel is provided with above the cover (6)
Frame (7).
3. laser deflection measuring apparatus according to claim 1, it is characterised in that：The laser range finder (5) passes through
Rotary head (8) is connected with fixed plate (4), and the laser range finder (5) and rotary head (8) are hinged and connected to realize laser
The adjustment of rangefinder (5) horizontal direction position, the rotary head (8) and fixed plate (4) are hinged and connected to realize Laser Measuring
The adjustment of distance meter (5) vertical direction position.
4. laser deflection measuring apparatus according to claim 3, it is characterised in that：The fixed plate (4) is fixed for L-type
Plate, horizontal plate face are connected with the bottom of testing agency (1), and vertical plate face is mutually fixed by expansion bolt (9) with measured point,
The rotary head (8) is hinged and connected with expansion bolt (9).
5. laser deflection measuring apparatus according to claim 1, it is characterised in that：The testing agency (1) is built-in with
Quarter-bell Rouser, the quarter-bell are changed awake device and are powered using independent button cell.
6. a kind of measurement method of laser deflection measuring apparatus as claimed in any of claims 1 to 5, including it is following
Step：
Step (1)：1,2,3 ... n+1 platform measuring devices are installed respectively in A0, A1, A2 ..., wherein A0 and An point at An point
The measuring device at place is located on datum mark, and the measuring device at A1, A2 ... An-1 point is located on monitoring point；
Step (2)：The position for adjusting laser range finder makes to examine at the facula position alignment A1 point that laser range finder emits at A0 point
The center in survey face, and so on；
Step (3)：The power supply for opening measuring device, passes through the position of linear array CCD scanning device scanned back and forth to determine hot spot；
Step (4)：The sedimentation value of each monitoring point is determined by the change in location of hot spot.
7. the measurement method of laser deflection measuring apparatus according to claim 6, it is characterised in that：The step (3)
In, the sampling unit of linear array CCD scanning device is 96, it is divided into 1.00mm between each linear array unit, each pixel unit
Peak value is 1024, and single-chip microcontroller samples the illumination value for reading each unit by AD, in conjunction with line array CCD scanning means in X-direction
Step value the image of glossing up is drawn in single-chip microcontroller, it is right then to find out brightness maxima institute according to the brightness of each unit
The position answered is the position of hot spot.
8. the measurement method of laser deflection measuring apparatus according to claim 6, it is characterised in that：The step (1)
In, the sedimentation value at datum mark A0 and An is 0, i.e. A0=0, An=0, the sedimentation value of each monitoring point is：
Wherein：AmFor the sedimentation value of each monitoring point；
M is the number of monitoring point；
AmWhen for the current measurement value of m-th of monitoring point；
AmIt is just the initial measurement of m-th of monitoring point；
Work as m=n, when An ≠ 0, the sedimentation value of each monitoring point is：
Wherein：A'm is the sedimentation value of m-th of monitoring point after mis-tie misclosure adjustment；
AmWhen for the current measurement value of m-th of monitoring point；
AmIt is just the initial measurement of m-th of monitoring point；
Am is m-th point of the sedimentation value calculated from a datum mark accumulation；
N is total monitoring point quantity；
An is the sedimentation value of n point.
9. the measurement method of laser deflection measuring apparatus according to claim 7, it is characterised in that：The position of hot spot passes through
Following formula obtains：
As Xn=Amax,
Formula one：X (n+1)=A (n+1)<Amax；
Formula two：X (n-1)=A (n-1)<Amax；
Formula three：Amax=Amin+F
Wherein：Xn is the coordinate of n-th of line array CCD unit；
An is the numerical value that n-th of line array CCD unit is read；
Amax is the maximum value in the An currently measured；
Amin is the minimum value in the An currently measured；
F is resolution of the system in vertical direction；
A is the most bright value of hot spot after calculating；
X is the corresponding position A；
By calculating the specific coordinate value of A to formula one, two derivation of formula.
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| CN201810772647.4A CN108917707A (en) | 2018-07-13 | 2018-07-13 | A kind of laser deflection measuring apparatus and its measurement method |
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| CN201810772647.4A CN108917707A (en) | 2018-07-13 | 2018-07-13 | A kind of laser deflection measuring apparatus and its measurement method |
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| CN107655451A (en) * | 2017-11-16 | 2018-02-02 | 北京联睿科科技有限公司 | Laser linear array displacement measuring device and its application method |
| CN208536828U (en) * | 2018-07-13 | 2019-02-22 | 中铁四局集团有限公司 | A kind of laser deflection measuring apparatus |
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| CN201993089U (en) * | 2011-03-28 | 2011-09-28 | 中国科学院西安光学精密机械研究所 | Charge coupled device (CCD) laser displacement detecting device based on jumbo size linear array |
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