CN108829551B - High-low voltage initiating explosive device equivalent device testing system and method - Google Patents
High-low voltage initiating explosive device equivalent device testing system and method Download PDFInfo
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- CN108829551B CN108829551B CN201810560735.8A CN201810560735A CN108829551B CN 108829551 B CN108829551 B CN 108829551B CN 201810560735 A CN201810560735 A CN 201810560735A CN 108829551 B CN108829551 B CN 108829551B
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
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- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
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- G—PHYSICS
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
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Abstract
A system and method for testing high-low voltage initiating explosive device equivalent devices are disclosed, wherein the system comprises a power module, a time sequence control module, a state indication module, a feedback module, a network communication module and a controller module; the sequential control module comprises a high-low voltage selection control circuit, a sequential control circuit and a grouping control circuit, and the controller module comprises a single chip microcomputer system, a driving circuit and a UART circuit. The automatic test system based on the single chip microcomputer technology realizes automatic test of the initiating explosive device equivalent device, and improves the test efficiency compared with the traditional manual test; the test precision is improved by interpreting the test data; the state indication can clearly determine the testing process, and is beneficial to rapidly finishing the primary fault positioning.
Description
Technical Field
The invention relates to a testing system and a testing method for an initiating explosive device equivalent device.
Background
The high-low voltage initiating explosive device equivalent device simulates the working mechanism and performance parameters of the initiating explosive device, is connected with a control sequential circuit on a projectile (arrow) for testing, and can realize the detection of a sequential path. At present, the testing of the high-low pressure initiating explosive device equivalent device has no systematic research and still stays in a manual testing stage.
The manual test not only consumes a large amount of time, but also can not comprehensively detect the performance index required by the design of the channel, and the reliability can not be ensured. The manual test needs cooperation of a plurality of people, the test time is long, and the condition of low manual detection efficiency exists.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the automatic test replaces the manual test, the high-low pressure initiating explosive device equivalent device test system and the method are provided, the test efficiency is improved, and the problems of uncertainty of manual test results and low test precision are solved.
The technical scheme adopted by the invention is as follows: a high-low voltage initiating explosive device equivalent device testing system comprises a power supply module, a time sequence control module, a state indicating module, a feedback module, a network communication module and a controller module;
the power supply module supplies power to the time sequence control module and the controller module respectively;
the timing control module receives a relay driving signal output by the controller module to control a level signal provided by the power supply module, outputs a self-checking high-voltage or low-voltage timing signal to the feedback module during self-checking, and outputs a high-voltage or low-voltage timing signal during testing;
the feedback module compares the self-checking high-voltage/low-voltage signal output by the time sequence control module with a reference voltage and outputs a comparison result to the controller module for judgment;
the controller module outputs a relay driving signal to the time sequence control module during self-checking, judges a self-checking comparison result sent by the feedback module and outputs a self-checking result driving signal to the state indicating module; during testing, network communication is carried out through the network communication module, a relay driving signal is output to the time sequence control module, a test result is judged by receiving an RS232 signal which contains test data and is input by the network communication module, and the test result driving signal is output to the state indicating module;
the state indicating module receives a driving signal output by the controller module and gives a corresponding high-voltage/low-voltage self-checking state indication;
the network communication module converts the RS232 signal sent by the controller module into a network signal supporting a TCP/IP protocol; the network communication module converts the received network signal supporting the TCP/IP protocol into an RS232 signal and sends the RS232 signal to the controller module.
The controller module comprises a single chip microcomputer system, a driving circuit and a UART circuit;
the single chip microcomputer system receives power supply of the power supply module and outputs a level signal to the driving circuit through the I/O port; the singlechip system receives a comparison result fed back by the feedback module, judges the comparison result, generates a self-checking result and sends the self-checking result to the drive circuit; the single chip microcomputer system receives TTL signals sent by the UART circuit and realizes network communication with the initiating explosive device equivalent device;
the drive circuit receives the level signal sent by the power supply module, enhances the drive current output by the I/O port of the singlechip system, sends a relay drive signal to the time sequence control module, and sends a drive level signal to the state indication module;
and the UART circuit converts the RS232 signal input by the network communication module into a TTL signal available for the singlechip system.
The power module comprises a first power source, a second power source and a third power source, wherein the first power source is a signal source of high-voltage and low-voltage time sequence signals, the second power source is an input signal source of a driving circuit in the simulator module, and the third power source supplies power for a singlechip system in the controller module.
The sequential control module comprises a high-low voltage selection control circuit, a sequential control circuit and a grouping control circuit, wherein the high-low voltage selection control circuit, the sequential control circuit and the grouping control circuit are cascaded to form a relay array;
the high-low voltage selection control circuit receives a relay driving signal output by the controller module, controls a level signal provided by the first power supply, outputs a high-voltage or low-voltage level signal and sends the high-voltage or low-voltage level signal to the sequential control circuit;
the time sequence control circuit receives a time sequence logic relay driving signal output by the controller module, controls a high-voltage or low-voltage level signal input by the high-voltage and low-voltage selection control circuit in a time-sharing manner, generates a high-voltage or low-voltage time sequence signal and sends the high-voltage or low-voltage time sequence signal to the grouping control circuit;
the group control circuit receives the relay driving signal output by the controller module, performs group control on the input high-voltage or low-voltage time sequence level signal, and selectively generates a power-on self-test high-voltage/low-voltage signal and a high-voltage/low-voltage test time sequence signal.
The relay array formed by cascading the high-low voltage selection control circuit, the sequential control circuit and the grouping control circuit is specifically as follows: the system comprises a high-low voltage selection relay J0, sequential control logic relays J1-J8 and grouped control relays J9-J16; for a high-voltage signal path, normally closed contacts of a high-voltage and low-voltage selection relay J0 are respectively connected with four normally open contacts of sequential control logic relays J1-J4 in series, and four normally open contacts of the sequential control logic relays J1-J4 are respectively connected with four normally closed contacts of group control relays J9-J12 in series; for a low-voltage signal path, the normally open contacts of the high-voltage and low-voltage selection relay J0 are respectively connected with the four normally open contacts of the sequential control logic relays J5-J8 in series, and the four normally open contacts of the sequential control logic relays J5-J8 are respectively connected with the four normally closed contacts of the group control relays J13-J16 in series; the input control of each stage of relay is a driving signal after an I/O port output signal of a singlechip system passes through a driving circuit, during self-checking, a high-low voltage selection relay J0 keeps a normally closed state, a group control relay J9-J12 keeps a normally closed state, a time sequence control logic relay J1-J4 is controlled to be switched on to generate a high-voltage self-checking signal, a high-low voltage selection relay J0 is controlled to be switched on, a group control relay J13-J16 keeps a normally closed state, a time sequence control logic relay J5-J8 is controlled to be switched on to generate a low-voltage self-checking signal; during testing, the high-low voltage selection relay J0 keeps a normally closed state, the group control relays J9-J12 are controlled to be switched on, the time sequence control logic relays J1-J4 are controlled to be switched on, high-voltage test signals are generated through series diodes, the high-low voltage selection control circuit relay J0 is controlled to be switched on, the group control relays J13-J16 are controlled to be switched on, the time sequence control logic relays J5-J8 are controlled to be switched on, and low-voltage test signals are generated through series resistors.
A method for testing an initiating explosive device equivalent by using the test system comprises the following steps:
(1) switching on a power supply, outputting a level signal by using a single chip microcomputer system, enhancing a driving current output by the single chip microcomputer system through a driving circuit, outputting a relay driving signal to input control ends of all levels of relays of a time sequence control module, generating a self-checking voltage signal, comparing the self-checking voltage signal with a reference voltage in a feedback circuit, sending a comparison result to the single chip microcomputer system for judgment, generating a self-checking result, outputting a driving level signal to a state indicating module through the driving circuit, and judging whether the test system is self-checked normally or not;
(2) after the self-checking is normal, performing network communication with the initiating explosive device equivalent device through a network communication module according to a TCP/IP protocol, and entering a testing state; the singlechip system is used for outputting a level signal to the drive circuit, outputting a relay drive signal to the relay input control end of the high-low voltage selection control circuit of the time sequence control module through the drive circuit, and outputting a level signal for high voltage or low voltage to the relay output end of the time sequence control circuit; the group control circuit selectively generates a high-voltage/low-voltage test time sequence signal;
(3) the initiating explosive device equivalent device is controlled to receive high-voltage/low-voltage test time sequence signals to obtain test data, the test data are converted into TTL signals available for a single chip microcomputer system through a network communication module and UART circuits in a controller module, the single chip microcomputer system interprets the test data, outputs a test state and a test result, outputs a driving level signal to a state indicating module through a driving circuit, lights corresponding test state indicating lamps and displays the test result.
In the step (3), a green light in the test result indicator lights to indicate that the result is normal, and a red light in the test result indicator lights to indicate that the result is abnormal.
Compared with the prior art, the invention has the advantages that:
(1) the testing system based on the single chip microcomputer technology is adopted, high/low voltage time sequence testing signals meeting the requirements of the initiating explosive device equivalent device can be automatically output, manual testing is replaced by automatic testing, manpower is saved, and testing efficiency is improved;
(2) the single chip microcomputer system automatically interprets the test data transmitted by the initiating explosive device equivalent device and displays the interpretation result through the state indicating lamp, thereby solving the problem of uncertainty of the manual test result and putting an end to the manual test error;
(3) the test process of the invention is displayed by the status indicator lamp, and when the initiating explosive device equivalent device fails, the primary fault positioning can be quickly completed by combining the test process.
Drawings
FIG. 1 is a block diagram of the system components of the present invention;
FIG. 2 is a schematic diagram of the high and low voltage timing signal generation according to the present invention.
Detailed Description
The invention is further illustrated with reference to the following figures and examples.
As shown in fig. 1, a system for testing an equivalent device of a high-low voltage initiating explosive device comprises a power module, a time sequence control module, a state indication module, a feedback module, a network communication module and a controller module; the sequential control module comprises a high-low voltage selection control circuit, a sequential control circuit and a grouping control circuit, and the controller module comprises a single chip microcomputer system, a driving circuit and a UART circuit.
The power module adopts a 4NIC-K series sun-facing power supply, consists of three independent power supplies, namely DC28V, DC12V and DC5V, and is integrated in one power module, wherein the DC28V is a signal source of high-voltage and low-voltage time sequence signals, the DC12V is used as the input of a driving circuit, and the DC5V is used for supplying power to a singlechip system in the control module.
The time sequence control module comprises a high-low voltage selection control circuit, a time sequence control circuit and a grouping control circuit, wherein the high-low voltage selection control circuit, the time sequence control circuit and the grouping control circuit are cascaded to form a relay array, the high-low voltage selection control circuit and the grouping control circuit adopt electromagnetic relays, the time sequence control circuit adopts small MOSFET relays, 12V driving level signals output by a driving circuit of the controller module are received, 28V level signals provided by a DC28V power supply are controlled, power-on self-test high-voltage/low-voltage self-test signals and high-voltage/low-voltage test time sequence signals are selectively generated.
The high-low voltage selection control circuit receives a relay 12V driving signal output by the controller module driving circuit, controls a 28V level signal provided by a DC28V power supply, and outputs a 28V level signal for high voltage or low voltage to the relay output end of the sequential control circuit.
The sequential control circuit receives a sequential logic relay 12V driving signal output by the controller module driving circuit, performs time-sharing control on an input high-voltage or low-voltage 28V level signal, and generates a high-voltage or low-voltage 28V sequential signal to the relay output end of the grouping control circuit.
The group control circuit receives a relay 12V driving signal output by the controller module driving circuit, controls the input high-voltage or low-voltage 28V time sequence level signal in a group mode, and generates a power-on self-test high-voltage/low-voltage signal and a high-voltage/low-voltage test time sequence signal through the diode network/resistor network selection under the control of the relay 12V driving signal output by the control module driving circuit.
As shown in fig. 2, the relay array formed by cascading the high-low voltage selection control circuit, the timing control circuit, and the grouping control circuit is specifically: the system comprises a high-low voltage selection relay J0, sequential control logic relays J1-J8 and grouped control relays J9-J16; for a high-voltage signal path, normally closed contacts of a high-voltage and low-voltage selection relay J0 are respectively connected with four normally open contacts of sequential control logic relays J1-J4 in series, and four normally open contacts of the sequential control logic relays J1-J4 are respectively connected with four normally closed contacts of group control relays J9-J12 in series; for a low-voltage signal path, the normally open contacts of the high-voltage and low-voltage selection relay J0 are respectively connected with the four normally open contacts of the sequential control logic relays J5-J8 in series, and the four normally open contacts of the sequential control logic relays J5-J8 are respectively connected with the four normally closed contacts of the group control relays J13-J16 in series; the input control of each stage of relay is a driving signal after an I/O port output signal of a singlechip system passes through a driving circuit, during self-checking, a high-low voltage selection relay J0 keeps a normally closed state, a group control relay J9-J12 keeps a normally closed state, a time sequence control logic relay J1-J4 is controlled to be switched on to generate a high-voltage self-checking signal, a high-low voltage selection relay J0 is controlled to be switched on, a group control relay J13-J16 keeps a normally closed state, a time sequence control logic relay J5-J8 is controlled to be switched on to generate a low-voltage self-checking signal; during testing, the high-low voltage selection relay J0 is kept in a normally closed state, the group control relays J9-J12 are controlled to be switched on, the sequential control logic relays J1-J4 are controlled to be switched on, high-voltage test signals are generated through series diodes, the high-low voltage selection control circuit relay J0 is controlled to be switched on, the group control relays J13-J16 are controlled to be switched on, the sequential control logic relays J5-J8 are controlled to be switched on, and low-voltage test signals are generated through series 1K omega resistors.
When the state indicating module is used for self-checking, a 12V driving signal output by a driving circuit of the controller module is received, a corresponding high-voltage/low-voltage self-checking state indicating lamp is lightened, a self-checking green indicating lamp is lightened, the self-checking result is normal, a self-checking red indicating lamp is lightened, and the self-checking result is abnormal; during testing, a 12v driving signal output by the control module driving circuit is received, a corresponding high-voltage/low-voltage testing state indicator lamp is lightened, a red state indicator lamp is lightened to indicate that the testing state is high voltage, a testing green indicator lamp is lightened, the high-voltage testing result is normal, a testing red indicator lamp is lightened, the high-voltage testing result is abnormal, a blue state indicator lamp is lightened to indicate that the testing state is low voltage, a testing green indicator lamp is lightened, the low-voltage testing result is normal, a testing red indicator lamp is lightened, and the low-voltage testing result is abnormal.
The feedback module compares the self-checking high-voltage/low-voltage signal output by the time sequence control module group control circuit with a designed reference voltage through an operational amplifier LM124, and outputs comparison data to the controller module single chip microcomputer system for judgment.
The network communication module converts the RS232 signal sent by the UART circuit of the controller module into a network signal supporting TCP/IP protocol through NPORT5110 manufactured by MOXA of Taiwan, and also can convert the received network signal supporting TCP/IP protocol into an RS232 signal to be sent to the UART circuit of the controller module through NPORT 5110.
The controller module comprises a single chip microcomputer system, a driving circuit and a UART circuit, wherein the single chip microcomputer system adopts MC9S12XDP512 produced by Feichale semiconductor company, when the system is electrified for self-checking, a relay 12V driving signal is output to a high-low voltage selection control circuit, a time sequence control circuit and a grouping control circuit relay of the time sequence control module through the driving circuit, self-checking comparison voltage sent by the feedback module is judged, a self-checking result is output, and a 12V driving level signal is output to a self-checking state indicating lamp of the state indicating module through the driving circuit; during testing, network communication with an initiating explosive device equivalent device is carried out through the NPORT5110 of the network communication module, a relay 12V driving signal is output to the time sequence control module through the driving circuit, an RS232 signal which is output by the network communication module NPORT5110 and contains time sequence test data is received, the test data is judged by converting the signal into a TTL signal through the UART circuit, a test state and a test result are output, and a 12V driving level signal is output to the state indicating module test state and test result indicating lamp through the driving circuit.
In the single chip microcomputer system, the external power supply input is 5V, and the I/O port outputs a 5V level signal.
The driving circuit drives and inverts 5V level signals output by an I/O port of the singlechip system twice through two Darlington driving chips ULN2803 to serve as the input of the 12V level signal driving circuit; the 12V level signal driving circuit outputs to the input control end of each stage relay of the time sequence control module and the state indicating lamp of the state indicating module.
The UART circuit converts RS232 signals output by the NPORT5110 into TTL signals available for the single chip microcomputer system through a MAX232 chip, and conversely converts the TTL signals output by the single chip microcomputer system into RS232 signals available for the NPORT 5110.
The test system tests the initiating explosive device equivalent device, and the specific test flow is as follows:
(1) the system is electrified and self-checked, a controller module single chip microcomputer system outputs a 5V level signal through an I/O port, a 12V driving level signal is output to the input control end of each level of relay of a time sequence control module through a driving circuit, a self-checking voltage signal output by the time sequence control module is compared with a reference voltage in a feedback circuit, a comparison result is sent to the controller module single chip microcomputer system for judgment, a self-checking result is output, a 12V driving level signal is output to a self-checking state indicator lamp of a state indicating module through the driving circuit, and a self-checking state indicator green lamp is turned on to indicate that the self-checking;
(2) after the self-checking is normal, the system testing is started, the controller module single chip microcomputer system performs network communication with the initiating explosive device equivalent device through a NPORT5110 of the network communication module according to a TCP/IP protocol, after the testing state is prepared, the controller module single chip microcomputer system outputs a 5V level signal through an I/O port, outputs a 12V driving level signal to an input control end of a high-low voltage selection control circuit relay of the time sequence control module through a driving circuit, outputs a 28V level signal for high voltage or low voltage to an output end of the time sequence control circuit relay, outputs a 12V driving level signal to an input control end of a grouping control circuit relay through the driving circuit, outputs a 12V driving level signal to the input control end of the time sequence control circuit relay through the driving circuit, and the grouping control circuit selectively generates a high-voltage/low-voltage testing time.
(3) The initiating explosive device equivalent device receives a high-voltage/low-voltage test time sequence signal to obtain test data, the test data are converted into TTL signals available for a single chip microcomputer system through NPORT5110 of the network communication module and a UART circuit in the controller module, the single chip microcomputer system interprets the test data, a test state and a test result are output, a 12V drive level signal is output to a test state indicating module and a test result indicating lamp of the state indicating module through a drive circuit, a corresponding test state indicating lamp is lightened, a test result indicating green lamp is lightened, a result is normal, a test result indicating red lamp is lightened, and the result is abnormal.
The present invention has not been described in detail, partly as is known to the person skilled in the art.
Claims (3)
1. A high-low voltage initiating explosive device equivalent device test system is characterized by comprising a power supply module, a time sequence control module, a state indication module, a feedback module, a network communication module and a controller module;
the power supply module supplies power to the time sequence control module and the controller module respectively;
the timing control module receives a relay driving signal output by the controller module to control a level signal provided by the power supply module, outputs a self-checking high-voltage or low-voltage timing signal to the feedback module during self-checking, and outputs a high-voltage or low-voltage timing signal during testing;
the feedback module compares the self-checking high-voltage/low-voltage signal output by the time sequence control module with a reference voltage and outputs a comparison result to the controller module for judgment;
the controller module outputs a relay driving signal to the time sequence control module during self-checking, judges a self-checking comparison result sent by the feedback module and outputs a self-checking result driving signal to the state indicating module; during testing, network communication is carried out through the network communication module, a relay driving signal is output to the time sequence control module, a test result is judged by receiving an RS232 signal which contains test data and is input by the network communication module, and the test result driving signal is output to the state indicating module;
the state indicating module receives a driving signal output by the controller module and gives a corresponding high-voltage/low-voltage self-checking state indication;
the network communication module converts the RS232 signal sent by the controller module into a network signal supporting a TCP/IP protocol; the network communication module converts the received network signal supporting the TCP/IP protocol into an RS232 signal and sends the RS232 signal to the controller module;
the controller module comprises a single chip microcomputer system, a driving circuit and a UART circuit;
the single chip microcomputer system receives power supply of the power supply module and outputs a level signal to the driving circuit through the I/O port; the singlechip system receives a comparison result fed back by the feedback module, judges the comparison result, generates a self-checking result and sends the self-checking result to the drive circuit; the single chip microcomputer system receives TTL signals sent by the UART circuit and realizes network communication with the initiating explosive device equivalent device;
the drive circuit receives the level signal sent by the power supply module, enhances the drive current output by the I/O port of the singlechip system, sends a relay drive signal to the time sequence control module, and sends a drive level signal to the state indication module;
the UART circuit converts the RS232 signal input by the network communication module into a TTL signal available for the singlechip system;
the power supply module comprises a first power supply, a second power supply and a third power supply, wherein the first power supply is a signal source of high-voltage and low-voltage time sequence signals, the second power supply is an input signal source of a driving circuit in the simulator module, and the third power supply supplies power for a singlechip system in the controller module;
the sequential control module comprises a high-low voltage selection control circuit, a sequential control circuit and a grouping control circuit, wherein the high-low voltage selection control circuit, the sequential control circuit and the grouping control circuit are cascaded to form a relay array;
the high-low voltage selection control circuit receives a relay driving signal output by the controller module, controls a level signal provided by the first power supply, outputs a high-voltage or low-voltage level signal and sends the high-voltage or low-voltage level signal to the sequential control circuit;
the time sequence control circuit receives a time sequence logic relay driving signal output by the controller module, controls a high-voltage or low-voltage level signal input by the high-voltage and low-voltage selection control circuit in a time-sharing manner, generates a high-voltage or low-voltage time sequence signal and sends the high-voltage or low-voltage time sequence signal to the grouping control circuit;
the group control circuit receives a relay driving signal output by the controller module, performs group control on an input high-voltage or low-voltage time sequence level signal, and selectively generates a power-on self-test high-voltage/low-voltage signal and a high-voltage/low-voltage test time sequence signal;
the relay array formed by cascading the high-low voltage selection control circuit, the sequential control circuit and the grouping control circuit is specifically as follows: the system comprises a high-low voltage selection relay J0, sequential control logic relays J1-J8 and grouped control relays J9-J16; for a high-voltage signal path, normally closed contacts of a high-voltage and low-voltage selection relay J0 are respectively connected with four normally open contacts of sequential control logic relays J1-J4 in series, and four normally open contacts of the sequential control logic relays J1-J4 are respectively connected with four normally closed contacts of group control relays J9-J12 in series; for a low-voltage signal path, the normally open contacts of the high-voltage and low-voltage selection relay J0 are respectively connected with the four normally open contacts of the sequential control logic relays J5-J8 in series, and the four normally open contacts of the sequential control logic relays J5-J8 are respectively connected with the four normally closed contacts of the group control relays J13-J16 in series; the input control of each stage of relay is a driving signal after an I/O port output signal of a singlechip system passes through a driving circuit, during self-checking, a high-low voltage selection relay J0 keeps a normally closed state, a group control relay J9-J12 keeps a normally closed state, a time sequence control logic relay J1-J4 is controlled to be switched on to generate a high-voltage self-checking signal, a high-low voltage selection relay J0 is controlled to be switched on, a group control relay J13-J16 keeps a normally closed state, a time sequence control logic relay J5-J8 is controlled to be switched on to generate a low-voltage self-checking signal; during testing, the high-low voltage selection relay J0 keeps a normally closed state, the group control relays J9-J12 are controlled to be switched on, the time sequence control logic relays J1-J4 are controlled to be switched on, high-voltage test signals are generated through series diodes, the high-low voltage selection control circuit relay J0 is controlled to be switched on, the group control relays J13-J16 are controlled to be switched on, the time sequence control logic relays J5-J8 are controlled to be switched on, and low-voltage test signals are generated through series resistors.
2. A method of testing a pyrotechnic charge equivalent using the test system of claim 1, comprising the steps of:
(1) switching on a power supply, outputting a level signal by using a single chip microcomputer system, enhancing a driving current output by the single chip microcomputer system through a driving circuit, outputting a relay driving signal to input control ends of all levels of relays of a time sequence control module, generating a self-checking voltage signal, comparing the self-checking voltage signal with a reference voltage in a feedback circuit, sending a comparison result to the single chip microcomputer system for judgment, generating a self-checking result, outputting a driving level signal to a state indicating module through the driving circuit, and judging whether the test system is self-checked normally or not;
(2) after the self-checking is normal, performing network communication with the initiating explosive device equivalent device through a network communication module according to a TCP/IP protocol, and entering a testing state; the singlechip system is used for outputting a level signal to the drive circuit, outputting a relay drive signal to the relay input control end of the high-low voltage selection control circuit of the time sequence control module through the drive circuit, and outputting a level signal for high voltage or low voltage to the relay output end of the time sequence control circuit; the group control circuit selectively generates a high-voltage/low-voltage test time sequence signal;
(3) the initiating explosive device equivalent device is controlled to receive high-voltage/low-voltage test time sequence signals to obtain test data, the test data are converted into TTL signals available for a single chip microcomputer system through a network communication module and UART circuits in a controller module, the single chip microcomputer system interprets the test data, outputs a test state and a test result, outputs a driving level signal to a state indicating module through a driving circuit, lights corresponding test state indicating lamps and displays the test result.
3. The method for testing the equivalents of the initiating explosive devices according to claim 2, wherein in the step (3), a green light in the test result indicator is turned on to indicate that the result is normal, and a red light in the test result indicator is turned on to indicate that the result is abnormal.
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| CN109539905A (en) * | 2018-11-20 | 2019-03-29 | 上海航天计算机技术研究所 | A kind of intelligence priming system timing instructions simulator and its detection method |
| CN115638700B (en) * | 2022-12-21 | 2023-02-28 | 北京星途探索科技有限公司 | A chronogenesis recording equipment for multichannel initiating explosive device |
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