CN108828354A - A kind of test device of cable - Google Patents
A kind of test device of cable Download PDFInfo
- Publication number
- CN108828354A CN108828354A CN201810557834.0A CN201810557834A CN108828354A CN 108828354 A CN108828354 A CN 108828354A CN 201810557834 A CN201810557834 A CN 201810557834A CN 108828354 A CN108828354 A CN 108828354A
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- China
- Prior art keywords
- test
- cable
- pin
- test device
- exit
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
Abstract
The invention discloses a kind of test device of cable, including two test boards, the both ends of cable are connected to two test boards；The connector of each test board has multiple pins pair, wherein pin on multiple column of multiple pin centerings is to being exit, and exit is for connection cables.Test device provided by the invention can test the relevant parameter of the signal integrity of particular cable as needed.
Description
Technical field
The present invention relates to field of computer technology, it particularly relates to a kind of test device of cable.
Background technique
In the prototype system-E grades of prototype of E grades of supercomputers for Dawning's design, network exchange subsystem
The 400G copper cable of a large amount of different lengths is needed to carry out external interconnection between each switching node of system；And on the other hand, high bandwidth
Interchanger proposes harsh requirement to the signal integrity of system, needs to be subject to the loss of signal of every part stringent survey
Examination control.
But the parameter that existing copper cable test fixture technical parameter is unsatisfactory for the 400G copper cable of Dawning's customization is wanted
It asks, can not accurately test the signal integrities technical parameters such as copper cable loss, crosstalk, assessment of system performance is not provided effectively
Foundation.Accordingly, it is desirable to provide a kind of test device of cable, to test the signal integrity of particular cable (for example, 400G copper cable)
The relevant parameter of property.
Summary of the invention
In view of the above problems in the related art, the present invention proposes a kind of test device of cable, can test certain line
The relevant parameter of the signal integrity of cable (for example, 400G copper cable).
The technical proposal of the invention is realized in this way：
According to an aspect of the invention, there is provided a kind of test device of cable, including two test boards, the two of cable
End is connected to two test boards；The connector of each test board have multiple pins pair, wherein multiple pin centerings it is more
To for exit, exit is used for connection cables for pin on a column.
According to an embodiment of the invention, multiple pins are to being 4 × 8 pins pair, the third of 4 × 8 pin centerings arrange to
Pin on 5th column is to for exit.
According to an embodiment of the invention, the test device of cable further includes：Terminating resistor, terminating resistor setting with conduct
The pin of exit is to adjacent each pin to upper.
According to an embodiment of the invention, the test device of cable further includes：It is connected to the lubber-line part of two test boards,
Lubber-line in lubber-line part is 3.5inch lubber-line and 7inch lubber-line.
According to an embodiment of the invention, wherein, the pin as exit is drawn to by high-frequency adapter head, high-frequency adapter
Head is all located at the front of test board.
According to an embodiment of the invention, the track lengths of connector to high-frequency adapter head are all 3.5 inches on test board
(inch), and the loss of each test board is not more than 3dB.
According to an embodiment of the invention, the center spacing of every a pair of high-frequency adapter head is 0.6 inch (inch).
According to an embodiment of the invention, the bandwidth of cable is 400G
Test device provided by the invention can test the relevant parameter of the signal integrity of particular cable as needed.
The present invention is tied by loss control, material selection, extraction signal wafer selection, the test to test board upward wiring
Fruit goes embedding technique, SMA adapter layout arrangement, signal wire track lengths, cabling form etc. on test board to be configured, and provides
It is a kind of meet loss, crosstalk requirements cable test device, can accurately obtain the signal integrity parameter of 400G cable.
Detailed description of the invention
It in order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, below will be to institute in embodiment
Attached drawing to be used is needed to be briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the invention
Example, for those of ordinary skill in the art, without creative efforts, can also obtain according to these attached drawings
Obtain other attached drawings.
Fig. 1 is the schematic diagram of the test device of cable according to an embodiment of the present invention；
Fig. 2 is the pin arrangement schematic diagram of the connector of test board in Fig. 1；
Fig. 3 is the test connection schematic diagram of the test device of cable according to an embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art's every other embodiment obtained belong to what the present invention protected
Range.
As shown in Figure 1, a kind of test device of cable according to an embodiment of the present invention, including two test boards P1, P2, to
The both ends of test cable are connected to two test boards P1, P2；Each test board P1, P2 are respectively provided with connector 12,22, even
Device 12,22 is connect with multiple pins pair.Wherein, the pin on multiple column of multiple pin centerings to for exit, use by exit
In connection cable to be tested.Through the above technical solutions, test device provided by the invention, can test certain line as needed
The relevant parameter of the signal integrity of cable.
In some embodiments, the bandwidth of cable is 400G, that is to say, that test device of the invention can satisfy for example
The parameter request of 400G copper cable, it is accurate to test the signal integrities technical parameters such as copper cable loss, crosstalk.
According to an embodiment of the invention, connector 12,22 can have 4 × 8 pins pair.Fig. 2 schematically illustrates row
Cloth be 4 rows (AB, CD, EF, GH) 8 column (the 1st ..., 8 column) multiple pins pair.In the present embodiment, 4 × 8 pin centerings
Third arrange to the pin on the 5th column to can be used as exit.Connector 12,22 on test board P1, P2 uses Amphrnol 4
× 8pairXcede+ high speed connector (a kind of Amphrnol high speed connector), draw third arrange to the 5th column wafer3,
The high speed signal of wafer4, wafer5 (a column signal hole of connector is known as wafer), adjacent signals with 50 Ω terminating resistors into
The processing of row termination, i.e. terminating resistor are arranged in the pin as exit to adjacent each pin to upper, and signal draws
Foot (pin) is as shown in Figure 2.Wherein, the signal interconnection relationship between test board P1 and test board P2 is closed by the interconnection for being tested cable
System determines, for example, can specify that fourth line third column (AB3) signal of test board P1 and the second row third of test board P2 arrange
(EF3) the first row third column (GH3) letter of signal interconnection, the third line third column (CD3) signal of test board P1 and test board P2
Number interconnection.It should be appreciated that the signal interconnection relationship between test board P1 and test board P2 can be depending on actual use situation, this
Restriction is made in invention not to this.
The test device of cable provided by the invention further includes being connected to the lubber-line part 30 of two test boards P1, P2,
The detection calibration line used in lubber-line part 30 is used for for 3.5inch and two kinds of 7inch in test result post-processing,
AFR (automatic fixture removes and removes embedding technique) goes the loss of embedding removal test board upward wiring, to obtain tested cable waste, crosstalk
Etc. performance parameters.
Wherein, test board P1, P2 uses Panasonic Megtron6G material, and plate thickness 2.9mm, high speed signal line impedence is interior
Layer 95 Ω of difference, signal lead walk curve rather than broken line in bending place.Pin as exit to pass through sub-miniature A connector (high frequency
Adapter) it draws, sub-miniature A connector is all located at the front of test board, to facilitate test.Further, on test board P1, P2, even
The track lengths for connecing device to sub-miniature A connector are all 3.5inch, and the loss of each test board P1, P2 are not more than 3dB.Every a pair
Differential signal SMA center spacing is 0.6 inch of inch (600mil).Sub-miniature A connector uses 2.4mm specification to meet 400G copper cable
25Gbps signal testing.Signal can increase back drill technique at connector, SMA structure to reduce stub (pillar).In addition,
On test board P1, P2, the track lengths of connector to sub-miniature A connector are strict controlled in 3.5inch, to control every piece of test board
The loss of P1, P2 are not more than 3dB.
Fig. 3 shows the test JA(junction ambient) of test device of the invention, to use the test device to complete 400G copper cable
The work of 50 signal integrity passive tests, the female connector of test board P1, P2 and the male connector 52 of copper cable 50 are to slotting, test board
The high speed signal drawn on P1, P2 is connected to the enterprising line frequency domain of vector network analyzer 40 by sub-miniature A connector and instrument cable 42
The test of parameter, the frequency domain parameter mainly include insertion loss, return loss, near-end cross, far-end cross talk and conversion when
Domain impedance.
In conclusion passing through the loss control to test board upward wiring, material by means of above-mentioned technical proposal of the invention
Selection, extraction signal wafer selection, test result go embedding technique, SMA adapter layout arrangement, signal wire on test board to walk
Line length, cabling form etc. are configured, provide it is a kind of meet loss, crosstalk requirements cable test device, Neng Goujing
Really obtain the signal integrity parameter of 400G cable.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Within mind and principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (8)
1. a kind of test device of cable, which is characterized in that including two test boards, the both ends of the cable are connected to institute
State two test boards；
The connector of each test board has multiple pins pair, wherein the pin pair on multiple column of multiple pin centerings
For exit, the exit is for connecting the cable.
2. the test device of cable according to claim 1, which is characterized in that the multiple pin is to being 4 × 8 pins
Right, the third of 4 × 8 pin centerings is arranged to the pin on the 5th column to for the exit.
3. the test device of cable according to claim 1, which is characterized in that further include：
Terminating resistor, the terminating resistor are arranged in the pin as exit to adjacent each pin to upper.
4. the test device of cable according to claim 1, which is characterized in that further include：
Be connected to the lubber-line part of two test boards, the lubber-line in the lubber-line part be 3.5inch lubber-line and
7inch lubber-line.
5. the test device of cable according to claim 1, which is characterized in that wherein, the pin as exit is to logical
The extraction of high frequency adapter is crossed, the high-frequency adapter head is all located at the front of the test board.
6. the test device of cable according to claim 7, which is characterized in that on the test board, the connector
Track lengths to the high-frequency adapter head are all 3.5 inches (inch), and the loss of each test board is not more than 3dB.
7. the test device of cable according to claim 5, which is characterized in that the center spacing of every a pair of high-frequency adapter head
For 0.6 inch (inch).
8. the test device of cable according to claim 1-7, which is characterized in that the bandwidth of the cable is
400G。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810557834.0A CN108828354B (en) | 2018-06-01 | 2018-06-01 | Testing device for cable |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810557834.0A CN108828354B (en) | 2018-06-01 | 2018-06-01 | Testing device for cable |
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| Publication Number | Publication Date |
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| CN108828354A true CN108828354A (en) | 2018-11-16 |
| CN108828354B CN108828354B (en) | 2021-06-04 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201810557834.0A Active CN108828354B (en) | 2018-06-01 | 2018-06-01 | Testing device for cable |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110441628A (en) * | 2019-07-29 | 2019-11-12 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | High speed connector performance test methods, apparatus and system |
| CN110531167A (en) * | 2019-09-16 | 2019-12-03 | 西安兆格电子信息技术有限公司 | A kind of cable pathways Insertion Loss measuring device and measurement method |
| CN114113704A (en) * | 2021-11-23 | 2022-03-01 | 中国民航大学 | Airplane wire harness finished part performance measuring device and method based on de-embedding technology |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110441628A (en) * | 2019-07-29 | 2019-11-12 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | High speed connector performance test methods, apparatus and system |
| CN110531167A (en) * | 2019-09-16 | 2019-12-03 | 西安兆格电子信息技术有限公司 | A kind of cable pathways Insertion Loss measuring device and measurement method |
| CN114113704A (en) * | 2021-11-23 | 2022-03-01 | 中国民航大学 | Airplane wire harness finished part performance measuring device and method based on de-embedding technology |
| WO2023092921A1 (en) * | 2021-11-23 | 2023-06-01 | 中国民航大学 | Apparatus and method for measuring performance of finished product of aircraft wiring harness on the basis of de-embedding technology |
| CN114113704B (en) * | 2021-11-23 | 2023-11-17 | 中国民航大学 | Device and method for measuring performance of finished aircraft harness part based on de-embedding technology |
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| CN108828354B (en) | 2021-06-04 |
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Effective date of registration: 20190730 Address after: 100193 Beijing, Haidian District, northeast Wang West Road, building 8, No. 36 Applicant after: Dawning Information Industry (Beijing) Co., Ltd. Applicant after: CHINESE CORPORATION DAWNING INFORMATION INDUSTRY CHENGDU CO., LTD. Address before: 100193 Beijing, Haidian District, northeast Wang West Road, building 8, No. 36 Applicant before: Dawning Information Industry (Beijing) Co., Ltd. |
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Effective date of registration: 20190909 Address after: 610213 Sichuan city of Chengdu province Tianfu Tianfu Avenue South Huayang Street No. 846 Applicant after: CHINESE CORPORATION DAWNING INFORMATION INDUSTRY CHENGDU CO., LTD. Applicant after: Dawning Information Industry (Beijing) Co., Ltd. Address before: 100193 Beijing, Haidian District, northeast Wang West Road, building 8, No. 36 Applicant before: Dawning Information Industry (Beijing) Co., Ltd. Applicant before: CHINESE CORPORATION DAWNING INFORMATION INDUSTRY CHENGDU CO., LTD. |
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