CN108828310A - A kind of test method of low power consuming devices service life - Google Patents
A kind of test method of low power consuming devices service life Download PDFInfo
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- CN108828310A CN108828310A CN201810778355.1A CN201810778355A CN108828310A CN 108828310 A CN108828310 A CN 108828310A CN 201810778355 A CN201810778355 A CN 201810778355A CN 108828310 A CN108828310 A CN 108828310A
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- consuming devices
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- power consumption
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- 238000010998 test method Methods 0.000 title claims abstract description 10
- 238000012360 testing method Methods 0.000 claims abstract description 20
- 238000000034 method Methods 0.000 claims abstract description 8
- 238000004088 simulation Methods 0.000 claims abstract description 4
- 230000001960 triggered effect Effects 0.000 claims abstract description 4
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 claims description 3
- 238000005516 engineering process Methods 0.000 abstract description 2
- 238000004891 communication Methods 0.000 description 5
- 238000013459 approach Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
- G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods
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- General Physics & Mathematics (AREA)
- Tests Of Electric Status Of Batteries (AREA)
Abstract
The invention discloses the test methods of low power consuming devices service life a kind of, belong to equipment the field of test technology.Specific method of the present invention includes：Step 1, starting test, low power consuming devices are accessed in power consumption test instrument；Step 2：Read quiescent dissipation Ps, the cell voltage U of low power consuming devices suspend mode, electric current Is；Step 3：Read power consumption Pw, the electric current Iwi of low power consuming devices high-frequency work mode；Step 4：It operates in low power consuming devices in simulation true environment, increases power consumption consumed by the time occupied after typicalness is triggered, obtain the power consumption P of the normal mode of unit time t；Step 5：Using tested low power consuming devices battery capacity Q divided by the normality power consumption under the unit time, the service life T being devices under under live service condition is calculated.The present invention calculates low power consuming devices investment scene postrun service life by accurately measuring operation power consumption of the low power consuming devices under different operational modes in laboratory.
Description
Technical field
The present invention relates to equipment testing field, in particular to a kind of test method of low power consuming devices service life.
Background technique
With the development of technology of Internet of things, Internet of Things is affecting the every aspect of our lives, diversified electronics
Equipment is employed, and realizes interconnection in various different formats.Internet of things equipment all has low power consumption characteristic, the service life of battery substantially
It is the ultimate challenge that internet of things equipment is faced, therefore the service life test of low power consuming devices becomes particularly important.
The present invention is directed to low power consuming devices testing field, compared to non-low power consuming devices, the operating current of low power consuming devices
Range is more widened, and milliampere grade even ampere levels are reached from the several microamperes of electric current when suspend mode to electric current when work, are needed more smart
Really measurement, could obtain the average power consumption of the normal work of equipment.
Existing power consumption test method only tests quiescent dissipation and dynamic power consumption, the suspend mode of not stringent differentiation equipment
Power consumption under power consumption and various working conditions, such test result cannot accurately obtain the operation under the various operating statuses of equipment
Power consumption, thus also can not accurate test equipment service life.
Summary of the invention
It is inaccurate it is an object of the invention to solve low power consuming devices power consumption test, it cannot accurately calculate equipment and use after battery
The problem of normal length of service.The test method of low power consuming devices service life a kind of is proposed, is specifically included：
Step 1, starting test, low power consuming devices are accessed in power consumption test instrument；
Step 2：Read quiescent dissipation Ps, the cell voltage U of low power consuming devices suspend mode, electric current Is；
Ps=U × Is (1)
Step 3：Read power consumption Pw, the electric current Iwi of low power consuming devices high-frequency work mode；
Step 4：Make low power consuming devices operate in simulation true environment in, increase typicalness be triggered after occupy when
Between consumed power consumption, obtain the power consumption P of normal mode in unit time t, the t is low power consuming devices suspend mode in the unit time
The sum of mode time ts and low power consuming devices operating mode time twi；
T=ts+tw(4)
Step 5：Using tested low power consuming devices battery capacity Q divided by the normality power consumption under the unit time, calculate by
Service life T under the service condition of test equipment scene；
Optionally, high-frequency work mode includes that external tool and low power consuming devices communication or external tool triggering low-power consumption are set
Standby work.
Optionally, external tool includes：Infrared kit, wireless tool, impulse tool and show tools.
Optionally, high-frequency work mode is continuously to work, and does not enter dormant state.
Optionally, the unit time is using day or the moon as chronomere.
Optionally, suspend mode is that low power consuming devices button operation or low does not occur with external communication, for low power consuming devices
Power consuming device is timed wake-up according to the Wakeup interval of itself.
The present invention is by accurately measuring operation power consumption of the low power consuming devices under different operational modes, Jin Erji in laboratory
Low power consuming devices investment scene postrun service life is calculated, live operational version can be instructed and improve, promotes low-power consumption
The service life of equipment.
Detailed description of the invention
Fig. 1 is a kind of test method flow chart of low power consuming devices service life of the present invention；
Fig. 2 is a kind of test method power consumption test instrument schematic diagram of low power consuming devices service life of the present invention.
Specific embodiment
Exemplary embodiments of the present invention are introduced referring now to the drawings, however, the present invention can use many different shapes
Formula is implemented, and is not limited to the embodiment described herein, and to provide these embodiments be at large and fully disclose
The present invention, and the scope of the present invention is sufficiently conveyed to person of ordinary skill in the field.Show for what is be illustrated in the accompanying drawings
Term in example property embodiment is not limitation of the invention.In the accompanying drawings, identical cells/elements use identical attached
Icon note.
Unless otherwise indicated, term (including scientific and technical terminology) used herein has person of ordinary skill in the field
It is common to understand meaning.Further it will be understood that with the term that usually used dictionary limits, should be understood as and its
The context of related fields has consistent meaning, and is not construed as Utopian or too formal meaning.
The present invention provides the test method of low power consuming devices service life a kind of, as shown in Figure 1, detailed process is as follows：
Low power consuming devices are accessed power consumption in the case where acquiring without any communication and data by step 1, starting test
In test equipment；As shown in Fig. 2, the power consumption test instrument that the present invention uses is the analysis of N6705+N6781A module DC power supply
Instrument, for the standard approach of low-power consumption analysis；
Step 2：Read quiescent dissipation Ps, the cell voltage U of low power consuming devices suspend mode, electric current Is；Suspend mode is
Low power consuming devices button operation or low power consuming devices do not occur with external communication, for low power consuming devices according to itself Wakeup interval
It is timed wake-up；
Wherein, Ps=U × Is。
Step 3：So that low power consuming devices is continuously worked, do not enter dormant state, reads low power consuming devices high-frequency work mould
Power consumption Pw, the electric current Iwi of formula；High-frequency work mode includes that external tool and low power consuming devices communication or external tool trigger low function
Equipment work is consumed, external tool includes：Infrared kit, wireless tool, impulse tool and show tools,
Wherein
Step 4：Make low power consuming devices operate in simulation true environment in, increase typicalness be triggered after occupy when
Between consumed power consumption, obtain the power consumption P of normal mode in unit time t, the unit time is the t using day or the moon as chronomere
For the sum of low power consuming devices suspend mode time ts and low power consuming devices operating mode time twi in the unit time；
T=ts+tw
Step 5：Using tested low power consuming devices battery capacity Q divided by the normality power consumption under the unit time, calculate by
Service life T under the service condition of test equipment scene；
The present invention is by accurately measuring operation power consumption of the low power consuming devices under different operational modes, Jin Erji in laboratory
Low power consuming devices investment scene postrun service life is calculated, and can instruct and improve live operational version, promotes low function
Consume the service life of equipment.
Claims (6)
1. a kind of test method of low power consuming devices service life, which is characterized in that including：
Step 1, starting test, low power consuming devices are accessed in power consumption test instrument；
Step 2：Read the quiescent dissipation P of low power consuming devices suspend modes, cell voltage U, electric current Is；
Ps=U × Is (1)
Step 3：Read the power consumption P of low power consuming devices high-frequency work modew, electric current Iwi；
Step 4：It operates in low power consuming devices in simulation true environment, increases the time institute occupied after typicalness is triggered
The power consumption of consumption, the power consumption P, the t for obtaining normal mode in unit time t are low power consuming devices suspend mode in the unit time
Time tsWith low power consuming devices operating mode time twiSum；
T=ts+tw (4)
Step 5：Using tested low power consuming devices battery capacity Q divided by the normality power consumption under the unit time, calculate tested
Service life T under device context service condition；
2. according to the method described in claim 1, it is characterized in that：The high-frequency work mode includes external tool and low function
Consume device talk or external tool triggering low power consuming devices work.
3. according to the method described in claim 2, it is characterized in that：The external tool includes：Infrared kit, wireless work
Tool, impulse tool and show tools.
4. according to the method described in claim 1, it is characterized in that：The high-frequency work mode is continuously to work, not into
Enter dormant state.
5. according to the method described in claim 1, it is characterized in that：The unit time is using day or the moon as chronomere.
6. according to the method described in claim 1, it is characterized in that：The suspend mode is that low power consuming devices are not logical with outside
News low power consuming devices button operation or low power consuming devices do not occur are timed wake-up according to the Wakeup interval of itself.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810778355.1A CN108828310A (en) | 2018-07-16 | 2018-07-16 | A kind of test method of low power consuming devices service life |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810778355.1A CN108828310A (en) | 2018-07-16 | 2018-07-16 | A kind of test method of low power consuming devices service life |
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| CN108828310A true CN108828310A (en) | 2018-11-16 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113655399A (en) * | 2021-08-16 | 2021-11-16 | 国网湖南省电力有限公司 | Method and system for detecting power consumption service life of battery of intelligent sensing terminal |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113655399A (en) * | 2021-08-16 | 2021-11-16 | 国网湖南省电力有限公司 | Method and system for detecting power consumption service life of battery of intelligent sensing terminal |
| CN113655399B (en) * | 2021-08-16 | 2024-04-16 | 国网湖南省电力有限公司 | Intelligent perception terminal battery power consumption life detection method and system |
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