CN108802797A - A kind of in-orbit particle detection monitors system with single particle effect - Google Patents
A kind of in-orbit particle detection monitors system with single particle effect Download PDFInfo
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- CN108802797A CN108802797A CN201810611919.2A CN201810611919A CN108802797A CN 108802797 A CN108802797 A CN 108802797A CN 201810611919 A CN201810611919 A CN 201810611919A CN 108802797 A CN108802797 A CN 108802797A
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- particle
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T5/00—Recording of movements or tracks of particles; Processing or analysis of such tracks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
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- Crystallography & Structural Chemistry (AREA)
- Measurement Of Radiation (AREA)
Abstract
The invention discloses a kind of in-orbit particle detections and single particle effect to monitor system, space radiation environment detection is integrated to radiation effect monitoring modular in same system, can in-orbit monitoring single particle effect while, the particle information (including energy, type and LET values etc.) for being possible to induce this single particle effect is obtained, this has great importance for single particle effect mechanism of production research；It is designed using multifunctional all, has not only met multiclass particle detection demand, but also radiation effect monitoring can be carried out, contributed to spacecraft small light design requirement.
Description
Technical field
The invention belongs to space radiation environment detection technology fields, and in particular to a kind of in-orbit particle detection is imitated with single-particle
System should be monitored.
Background technology
Space radiation environment is the essential environmental factors for causing the performance degradations such as Spacecraft Material, component even to fail.
Wherein high energy charged particles generate a large amount of charged particle in the sensitive volume of device, single particle effect are induced, so as to cause member
Phenomena such as device single-particle inversion, single-ion transient state, locking single particle or even single event burnout, threaten the in-orbit peace of spacecraft
Entirely, reliability service.
Space environment research is the basis of irradiation effects.Currently, space charged particle detection basic principle be according to
Indirect detection is carried out according to the ionization of charged particle and material atom or excitation.Basic procedure is：Incoming charged particles and spy
Survey device matter interaction；Ionizing energy loses Δ E and (directly generates electric signal or optical signal；Electric impulse signal；Signal amplitude is surveyed
Amount；The value of incident physical quantity is judged from measured value.Single particle effect research mainly by the methods of analog simulation, irradiation test,
Usually carry out in ground experiment room.In fact, space environment is extremely complex, ground experiment room condition and space radiation environment are poor
It is not huge, it is difficult to simulate real space environment.Therefore, in-orbit flight test is research space environment and its radiation effect to space flight
The best method of equipment material, component performance degradation.However, particle detection at present and the in-orbit experiment of single particle effect, the two are more
It is discrete, it is difficult to which Energetic particle information is mapped with single particle effect.
Invention content
In view of this, the object of the present invention is to provide a kind of in-orbit particle detections and single particle effect to monitor system, it can
While in-orbit monitoring single particle effect, the particle information for being possible to induce this single particle effect is obtained.
A kind of in-orbit particle detection and single particle effect monitor system, include aluminium film (1), the first silicon half successively from top to bottom
Conductor sensor (2), single particle effect monitoring modular (3), the second silicon semiconductor sensor (4) and caesium iodide scintillator detection
Device (5).
Preferably, the sensitizing range of measured device is partly led with first silicon in the single particle effect monitoring modular (3)
The sensitizing range of body sensor (2) is aligned.
Preferably, the thickness of the first silicon semiconductor sensor (2) is thin as possible.
The present invention has the advantages that：
1), space radiation environment detection is integrated to radiation effect monitoring modular in same system by the system, can
While in-orbit monitoring single particle effect, obtain be possible to induce this single particle effect particle information (including energy, type and
LET values etc.), this has great importance for single particle effect mechanism of production research；
2), the detected object of conventional detectors is generally relatively simple, even if generally using multigroup spy if detected object is a variety of
Head, different objects considerably increase detector volume and weight in this way by different probe detections.It is set using multifunctional all
Meter, had not only met multiclass particle detection demand, but also can carry out radiation effect monitoring, and the design of spacecraft small light is contributed to need
It asks.
Description of the drawings
Fig. 1 is in-orbit particle detection and the single particle effect monitoring system structure diagram of the present invention；
Wherein, 1- aluminium films, the first silicon semiconductor detectors of 2-, 3- single particle effect monitoring modular the second silicon semiconductors of 4- are visited
Survey device, 5- caesium iodide scintillator detectors.
Specific implementation mode
The present invention will now be described in detail with reference to the accompanying drawings and examples.
For Space Particle detection and single particle effect monitoring integration demand, the present invention proposes a kind of for in-orbit grain
Son detection monitors system with single particle effect.The present invention passes through silicon semiconductor detector, scintillator detector and single particle effect
Monitoring modular Integration Design, the grain for inducing this effect can not more accurately be obtained by solving in in-orbit single particle effect experiment at present
The problem of sub-information, can be studied for single particle effect and provide important in-orbit measured data, to spacecraft radiation hardening skill
Art research is of great significance.Meanwhile multifunctional all designs, and reduces the volume and weight shared by equipment, helps to navigate
Its device small light design requirement.
As shown in Figure 1, the in-orbit particle detection of the present invention and single particle effect monitoring system include aluminium successively from top to bottom
Film 1, the first silicon semiconductor sensor 2, single particle effect monitoring modular 3, the second silicon semiconductor sensor 4 and cesium iodide flicker
Bulk detector 5.
When charged particle is incident in substance, since coulomb effect occurs with the orbital electron of material atom, lose from
Oneself portion of energy makes material atom excite or ionization, and particle will lose its energy, can formula be expressed as：
Wherein M is the mass number of incoming particle, and Z is the atomic number of absorbing material, and k ' is constant, therefore, what is selected
In energy range, after certain specific charged particle is incident in detector, Δ EE ∝ MZ2As long as detecting electrification
Total energy of a particle E and Δ E, so that it may MZ be calculated2.High energy particle discrimination method generally use telescope detection system, that is, Δ
E-E detectors generally constitute measuring system by two or more combinations of detectors, using different charged particles in detector
Rate of energy loss difference carries out particle components discriminating.We are combined using semiconductor detector with caesium iodide scintillator detector 5
Space charged particle detection is carried out, and integrates single particle effect monitoring modular 3 in this detection system, realizes spatial band electrochondria
Son detection and the design of single particle effect monitoring integration.Wherein aluminium film 1 is for stopping the higher low-energy electron of flux in space
And proton, the first silicon semiconductor sensor 2 are used to measure the sedimentary energy Δ E of particle, preferably to monitor single particle effect, the
One silicon sensor thickness is thin as possible, reduces the energy loss of particle wherein.Second silicon semiconductor detector 4 and caesium iodide scintillator are visited
The measurement that device 5 is used for incoming particle gross energy E is surveyed, single particle effect monitoring modular 3 is in real time monitoring whether that simple grain has occurred
Sub- effect.Single particle effect monitoring modular is placed in after the first silicon semiconductor sensor 2, and wherein single particle effect sensitizing range is most
Amount is aligned with silicon semiconductor sensitizing range.
Whole system operation principle is：The incident particle within the scope of detector field of view, when its energy is sufficiently large, particle
Aluminium film 1, the first silicon sensor 2, single particle effect monitoring modular 3, the second silicon sensor 4, caesium iodide scintillator will be passed through successively
Detector 5.Incoming particle deposits part energy in aluminium film first；Then according to the trigger signal in the first silicon sensor 2
Carry out Δ E measurements；After first silicon sensor of particle penetration, it is incident to single particle effect monitoring modular 3, it would be possible to induce simple grain
Sub- effect, the module carry out real-time monitoring and the record of single particle effect；If it is sufficiently large to be somebody's turn to do particle energy, single-particle effect is penetrated
It will be incident to second silicon semiconductor sensor, second silicon sensor 4 and caesium iodide scintillator detector 5 after answering monitoring modular
Projectile energy is set finally to deposit completely, single particle effect monitoring modular 3 is for monitoring whether incoming particle induces simple grain
Sub- effect.Energy loss of the particle in single particle effect monitoring modular 3 is can be evaluated whether by emulation, and is sensed in silicon according to particle
Sedimentary energy measured value in device 2,4 and cesium iodide detector 5 can estimate incoming particle gross energy E.In addition, utilizing the Δ side E-E
Method can obtain the type of particle, the information such as LET values.In above process, the single particle effect module 3 in detector monitors simultaneously
Whether record has occurred single particle effect, while the information (energy, ingredient etc.) of incoming particle, in-orbit number has been recorded in detector
It is of great significance according to single particle effect characteristic is induced for research space charged particle.
According to the above description, different-energy range can be carried out by variation semiconductor detector, scintillator detector thickness
Charged particle and its radiation environment detection study.In addition, single particle effect monitoring modular is replaced with other radiation effect moulds
Block (such as charging and discharging effects) can carry out the in-orbit experimental study of charging and discharging effects.Other relevant variations are numerous to list herein, and
Obvious changes or variations extended from this still in the protection domain of the invention within.
Claims (3)
1. a kind of in-orbit particle detection and single particle effect monitor system, which is characterized in that include aluminium film successively from top to bottom
(1), the first silicon semiconductor sensor (2), single particle effect monitoring modular (3), the second silicon semiconductor sensor (4) and iodate
Caesium scintillator detector (5).
2. a kind of in-orbit particle detection as described in claim 1 and single particle effect monitor system, which is characterized in that the list
The sensitizing range of the sensitizing range of measured device and the first silicon semiconductor sensor (2) in particle effect monitoring modular (3)
Alignment.
3. a kind of in-orbit particle detection as described in claim 1 and single particle effect monitor system, which is characterized in that described the
The thickness of one silicon semiconductor sensor (2) is thin as possible.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810611919.2A CN108802797B (en) | 2018-06-14 | 2018-06-14 | On-orbit particle detection and single event effect monitoring system |
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| CN201810611919.2A CN108802797B (en) | 2018-06-14 | 2018-06-14 | On-orbit particle detection and single event effect monitoring system |
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| CN108802797B CN108802797B (en) | 2022-06-21 |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581471A (en) * | 2018-11-27 | 2019-04-05 | 山东航天电子技术研究所 | A kind of multi-layer combined calorimeter |
| CN109828300A (en) * | 2019-01-31 | 2019-05-31 | 兰州空间技术物理研究所 | A kind of miniaturization omnidirectional particles detection |
| CN110082815A (en) * | 2019-05-16 | 2019-08-02 | 山东航天电子技术研究所 | A kind of ultra-wide LET detection method and device using pixel type silicon sensor |
| CN110531399A (en) * | 2019-09-02 | 2019-12-03 | 北京卫星环境工程研究所 | The early warning of spacecraft on-orbit fault and screening device |
| CN110646833A (en) * | 2019-09-18 | 2020-01-03 | 北京空间飞行器总体设计部 | Satellite single event upset monitoring method based on monolithic array particle detector |
| CN111273334A (en) * | 2019-12-26 | 2020-06-12 | 兰州空间技术物理研究所 | Composite energy particle detector for deep space detection and design method thereof |
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| US20140032135A1 (en) * | 2012-04-09 | 2014-01-30 | International Business Machines Corporation | Structure and method to ensure correct operation of an integrated circuit in the presence of ionizing radiation |
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| CN108072888A (en) * | 2017-12-15 | 2018-05-25 | 北京卫星环境工程研究所 | Medium-Earth Orbit space environment and the integrated detection device of effect |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581471A (en) * | 2018-11-27 | 2019-04-05 | 山东航天电子技术研究所 | A kind of multi-layer combined calorimeter |
| CN109581471B (en) * | 2018-11-27 | 2023-02-28 | 山东航天电子技术研究所 | Multilayer combined type energy meter |
| CN109828300A (en) * | 2019-01-31 | 2019-05-31 | 兰州空间技术物理研究所 | A kind of miniaturization omnidirectional particles detection |
| CN110082815A (en) * | 2019-05-16 | 2019-08-02 | 山东航天电子技术研究所 | A kind of ultra-wide LET detection method and device using pixel type silicon sensor |
| CN110082815B (en) * | 2019-05-16 | 2023-05-23 | 山东航天电子技术研究所 | Ultra-wide LET detection method and device adopting pixel type silicon sensor |
| CN110531399A (en) * | 2019-09-02 | 2019-12-03 | 北京卫星环境工程研究所 | The early warning of spacecraft on-orbit fault and screening device |
| CN110531399B (en) * | 2019-09-02 | 2021-07-06 | 北京卫星环境工程研究所 | Spacecraft on-orbit fault early warning and discriminating device |
| CN110646833A (en) * | 2019-09-18 | 2020-01-03 | 北京空间飞行器总体设计部 | Satellite single event upset monitoring method based on monolithic array particle detector |
| CN111273334A (en) * | 2019-12-26 | 2020-06-12 | 兰州空间技术物理研究所 | Composite energy particle detector for deep space detection and design method thereof |
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|---|---|
| CN108802797B (en) | 2022-06-21 |
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