CN108802497B - Microelectrode amplifier pole resistance measurement method - Google Patents
Microelectrode amplifier pole resistance measurement method Download PDFInfo
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- CN108802497B CN108802497B CN201810628772.8A CN201810628772A CN108802497B CN 108802497 B CN108802497 B CN 108802497B CN 201810628772 A CN201810628772 A CN 201810628772A CN 108802497 B CN108802497 B CN 108802497B
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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Abstract
The microelectrode amplifier pole resistance measuring method comprises the following steps: acquiring a current zero return compensation value: offset V; calculating pole resistance test excitation high wave: QAVE _ H = offsetV + M; calculating pole resistance test excitation low wave: WAVE _ H = offsetV-M; judging whether the pole resistance test excitation high wave and the pole resistance test excitation low wave overflow; if so, ending the measurement if the abnormality occurs; if not, initializing the test times N, and executing S4; delaying to obtain first analog-digital sampling data and output test excitation high waves; delaying to obtain second analog-digital sampling data and output test excitation low waves; calculating the pole resistance value; subtracting 1 from the test frequency; judging whether the test times are 0; and calculating the average pole resistance and outputting the average pole resistance through a data interface. The mode of avoiding manual bridge balance, not only the circuit is simple and convenient to use just can guarantee the accuracy of measurement.
Description
Technical Field
The invention belongs to the technical field of measurement. In particular to a method for measuring the polar resistance of a microelectrode amplifier.
Background
The original microelectrode amplifier is adjusted by manual adjustment and then negative capacitance compensation by an observation method, if the operator is not familiar with the operation method, the compensation is probably improper, and abnormal signal output occurs, so that the system can be caused to self-excite.
Disclosure of Invention
The invention aims to solve the problems and provides a method for measuring the polar resistance of a microelectrode amplifier, which comprises the following steps:
s1: obtaining a current return-to-zero compensation value through a microelectrode amplifier circuit: offset V;
s2: calculating pole resistance test excitation high wave: QAVE _ H = offsetV + M; calculating pole resistance test excitation low wave: WAVE _ H = offsetV-M; m is a half-wave amplitude of the test excitation signal;
s3: judging whether the pole resistance test excitation high wave and the pole resistance test excitation low wave overflow; if so, ending the measurement if the abnormality occurs; if not, initializing the test times N, and executing S4;
s4: delaying to obtain first analog-digital sampling data and output test excitation high waves;
s5: delaying to obtain second analog-digital sampling data and output test excitation low waves;
s6: calculating the pole resistance value;
s7: subtracting 1 from the test frequency;
s8: judging whether the test times are 0; if yes, go to S9; if not, go to S4;
s9: and calculating the average pole resistance value for N times, and outputting the average pole resistance value through a data interface.
Further, the half-wave amplitude of the test excitation is 100 mV.
Furthermore, the microelectrode amplifier system is characterized by comprising a microelectrode input circuit, a sampling resistor, a signal follower, a first signal conditioning circuit, a second signal conditioning circuit, a third signal conditioning circuit, a fourth signal conditioning circuit, an adder, a first digital-to-analog conversion unit, a second digital-to-analog conversion unit, a third digital-to-analog conversion unit, an analog-to-digital conversion unit, a processor, a single-pole switch and an interface unit; the interface unit comprises a zero return output interface for outputting a zero return signal, an output interface for outputting a compensated signal and a digital interface for outputting an electrode resistance value;
the first end of the sampling resistor is connected with a static contact of the single-pole double-throw switch; the second end of the sampling resistor and the output end of the microelectrode input circuit are connected with the input end of the signal following circuit; the output end of the signal following circuit is connected with the first moving contact of the single-pole switch and the first input end of the adder;
the output end of the adder is connected with a return-to-zero output interface of the microelectrode amplifier system and the input end of the second signal conditioning circuit; the output end of the second signal conditioning circuit is connected with the processor through the analog-to-digital conversion unit and used for quantitatively acquiring return-to-zero output signals;
a first output end of the processor is connected with an input end of the first signal conditioning circuit through a first digital-to-analog conversion unit; the output end of the first signal conditioning circuit is connected with the second input end of the adder;
the second output end of the processor is connected with the input end of a third signal processing circuit through a second analog-to-digital conversion unit, and the output end of the third signal conditioning circuit is connected with a second movable contact of the single-pole switch and is used for being superposed with a preset excitation signal;
the third output end of the processor is connected with the input end of the fourth signal conditioning circuit through a third digital-to-analog conversion unit; the output end of the fourth signal conditioning circuit is connected with the output interface unit.
The invention has the beneficial effects that: the system is completely realized by a method, and the excitation waveform is automatically adjusted according to the digital-to-analog conversion condition when the time returns to zero, so that the symmetric differential measurement is achieved, and the measurement accuracy is ensured; the mode of avoiding manual bridge balance, not only the circuit is simple and convenient to use.
Drawings
FIG. 1 is a flow chart of a method for measuring the polar resistance of a microelectrode amplifier;
FIG. 2 is a circuit diagram of a microelectrode amplifier.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to fig. 1 in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of the embodiment of the present invention generally described and illustrated in FIG. 1 herein may be arranged and designed in a wide variety of different configurations. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment provides a method for measuring the polar resistance of a microelectrode amplifier, which comprises the following steps: s1: obtaining a current return-to-zero compensation value through a microelectrode amplifier circuit: offset V; s2: calculating pole resistance test excitation high wave: QAVE _ H = offsetV + M; calculating pole resistance test excitation low wave: WAVE _ H = offsetV-M; m is a half-wave amplitude of the test excitation signal; s3: judging whether the pole resistance test excitation high wave and the pole resistance test excitation low wave overflow; if so, ending the measurement if the abnormality occurs; if not, initializing the test times N, and executing S4; s4: delaying to obtain first analog-digital sampling data and output test excitation high waves; s5: delaying to obtain second analog-digital sampling data and output test excitation low waves; s6: calculating the pole resistance value; s7: subtracting 1 from the test frequency; s8: judging whether the test times are 0; if yes, go to S9; if not, go to S4; s9: and calculating the average pole resistance value for N times, and outputting the average pole resistance value through a data interface.
As shown in fig. 1, the microelectrode amplifier circuit includes a microelectrode input circuit, a sampling resistor, a signal follower, a first signal conditioning circuit, a second signal conditioning circuit, a third signal conditioning circuit, a fourth signal conditioning circuit, an adder, a first digital-to-analog conversion unit, a second digital-to-analog conversion unit, a third digital-to-analog conversion unit, an analog-to-digital conversion unit, a processor, a single-pole switch, and an interface unit; the interface unit comprises a zero returning output interface for outputting a zero returning signal, an output interface for outputting a compensated signal and a digital interface for outputting an electrode resistance value.
The first end of the sampling resistor is connected with a static contact of the single-pole double-throw switch; the second end of the sampling resistor and the output end of the microelectrode input circuit are connected with the input end of the signal following circuit; and the output end of the signal following circuit is connected with the first movable contact of the single-pole switch and the first input end of the adder. The output end of the adder is connected with a return-to-zero output interface of the microelectrode amplifier system and the input end of the second signal conditioning circuit; the output end of the second signal conditioning circuit is connected with the processor through the analog-to-digital conversion unit and used for the quantitative acquisition of the return-to-zero output signal. A first output end of the processor is connected with an input end of the first signal conditioning circuit through a first digital-to-analog conversion unit; the output end of the first signal conditioning circuit is connected with the second input end of the adder. The second output end of the processor is connected with the input end of a third signal processing circuit through a second analog-to-digital conversion unit, and the output end of the third signal conditioning circuit is connected with a second movable contact of the single-pole switch. A third output end of the processor is connected with the input end of the fourth signal conditioning circuit through a third digital-to-analog conversion unit; the output end of the fourth signal conditioning circuit is connected with the output interface unit.
The first signal conditioning circuit comprises a first resistor, a second resistor, a third resistor, a first operational amplifier, a first capacitor, a second capacitor and a first power supply; the first end of the first resistor is connected with the output end of the first digital-to-analog conversion circuit; the second end of the first resistor is connected with the homodromous input end of the first operational amplifier and the first end of the first capacitor; the second end of the first capacitor is grounded; the first end of the second resistor is connected with the reference voltage output end of the first digital-to-analog conversion circuit, and the second end of the second resistor is connected with the reverse input end of the first operational amplifier, the first end of the third resistor and the first end of the second capacitor; and the second end of the third resistor and the second end of the second capacitor are connected with the output end of the first operational amplifier and the output end of the signal conditioning circuit.
The second signal conditioning circuit comprises a fourth resistor, a fifth resistor, a sixth resistor, a seventh resistor, a third capacitor and a second operational amplifier; the reference voltage input end of the second signal conditioning circuit is respectively connected with the homodromous input end of the second operational amplifier, the first end of the eighth resistor and the first end of the third capacitor through a fourth resistor; the second end of the eighth resistor and the second end of the third capacitor are grounded; the output end of the adder is connected with the reverse input end of the second operational amplifier and the first end of the seventh resistor through a sixth resistor; and the second end of the seventh resistor is connected with the output end of the second operational amplifier and the input end of the analog-to-digital conversion unit.
The third signal conditioning circuit comprises an eighth resistor, a ninth resistor, a tenth resistor, a third operational amplifier, a fourth capacitor and a fifth capacitor; the output end of the second digital-to-analog conversion circuit is connected with the eighth resistor through the eighth resistor, the first end of the fourth capacitor and the same-direction input end of the third operational amplifier; the second end of the fourth capacitor is grounded; the reference voltage input end of the third signal conditioning circuit is connected with the reverse input end of the third operational amplifier, the first end of a tenth resistor and the first end of a fifth capacitor through a ninth resistor; the second end of the tenth resistor and the second end of the fifth capacitor are connected with the output end of the third operational amplifier; and the output end of the third operational amplifier is connected with the second movable contact of the single-pole switch. The fourth signal conditioning circuit is the same as the first signal conditioning circuit.
As shown in fig. 1, the single-pole double-set switch is disposed at the end b, the second digital-to-analog converter sends a preset excitation signal, and after passing through the third signal conditioning circuit, the preset excitation signal is superimposed with the original signal through the fixed-value sampling resistor, and in order to ensure the measurement accuracy, the original signal does not contain an alternating current component, and then undergoes impedance conversion through the "signal follower" amplifier to output a signal V2; the V2 and the V4 are combined through an adder to generate a V3 return-to-zero signal. The signal is sent to an analog-to-digital converter for quantitative acquisition through a second signal conditioning circuit, the pole resistance is calculated through a pole resistance measurement method according to the result of the quantitative acquisition, and the pole resistance is output through a data interface.
In the description of the present invention, it should be noted that the terms "first", "second", "third", and the like are used only for distinguishing the description, and are not intended to indicate or imply relative importance.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," and "connected" are to be construed broadly, e.g., as meaning fixedly connected, detachably connected, or integrally connected; either mechanically or electrically.
Claims (2)
1. The method for measuring the polar resistance of the microelectrode amplifier is characterized by comprising the following steps of:
s1: obtaining a current return-to-zero compensation value through a microelectrode amplifier circuit: offset V;
the microelectrode amplifier circuit comprises a microelectrode input circuit, a sampling resistor, a signal follower, a first signal conditioning circuit, a second signal conditioning circuit, a third signal conditioning circuit, a fourth signal conditioning circuit, an adder, a first digital-to-analog conversion unit, a second digital-to-analog conversion unit, a third digital-to-analog conversion unit, an analog-to-digital conversion unit, a processor, a single-pole switch and an interface unit; the interface unit comprises a zero return output interface for outputting a zero return signal, an output interface for outputting a compensated signal and a digital interface for outputting an electrode resistance value;
the first end of the sampling resistor is connected with a static contact of the single-pole double-throw switch; the second end of the sampling resistor and the output end of the microelectrode input circuit are connected with the input end of the signal following circuit; the output end of the signal following circuit is connected with the first moving contact of the single-pole switch and the first input end of the adder;
the output end of the adder is connected with a return-to-zero output interface of the microelectrode amplifier system and the input end of the second signal conditioning circuit; the output end of the second signal conditioning circuit is connected with the processor through the analog-to-digital conversion unit and used for quantitatively acquiring return-to-zero output signals;
a first output end of the processor is connected with an input end of the first signal conditioning circuit through a first digital-to-analog conversion unit; the output end of the first signal conditioning circuit is connected with the second input end of the adder;
the second output end of the processor is connected with the input end of a third signal processing circuit through a second analog-to-digital conversion unit, and the output end of the third signal conditioning circuit is connected with a second movable contact of the single-pole switch and is used for being superposed with a preset excitation signal;
the third output end of the processor is connected with the input end of the fourth signal conditioning circuit through a third digital-to-analog conversion unit; the output end of the fourth signal conditioning circuit is connected with the output interface unit;
s2: calculating pole resistance test excitation high wave: QAVE _ H = offsetV + M; calculating pole resistance test excitation low wave: WAVE _ H = offsetV-M; m is a half-wave amplitude of the test excitation signal;
s3: judging whether the pole resistance test excitation high wave and the pole resistance test excitation low wave overflow; if so, ending the measurement if the abnormality occurs; if not, initializing the test times N, and executing S4;
s4: delaying to obtain first analog-digital sampling data and output test excitation high waves;
s5: delaying to obtain second analog-digital sampling data and output test excitation low waves;
s6: calculating the pole resistance value;
s7: subtracting 1 from the test frequency;
s8: judging whether the test times are 0; if yes, go to S9; if not, go to S4;
s9: and calculating the average pole resistance value for N times, and outputting the average pole resistance value through a data interface.
2. The method for measuring the polar resistance of the microelectrode amplifier of claim 1, wherein the half-wave amplitude of the test stimulus is 100 mV.
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