CN108761211A - A kind of rear road production characterization processes and production line of tantalum capacitance - Google Patents
A kind of rear road production characterization processes and production line of tantalum capacitance Download PDFInfo
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- CN108761211A CN108761211A CN201810437937.3A CN201810437937A CN108761211A CN 108761211 A CN108761211 A CN 108761211A CN 201810437937 A CN201810437937 A CN 201810437937A CN 108761211 A CN108761211 A CN 108761211A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
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Abstract
The present invention provides a kind of rear road of tantalum capacitance production characterization processes and production lines, can realize circulation of the tantalum capacitance between different test equipments, and circulation is convenient and efficient, improves production efficiency, and it includes sequence setting to reduce cost of labor：The mechanical, electrical appearance trimmer of ribbon tantalum capacity measurement, shape screening machine, capacitance automatic tray filler, automatic tray filler includes circulation disk, it is placed with the capacitance fixing groove that can accommodate the capacitance on circulation disk, the single tantalum capacitance screened through shape screening machine is mounted in the capacitance fixing groove of circulation disk respectively by automatic tray filler, and by circulating, disk circulates between preceding road aging clamp engaged test machine, ageing oven, rear road aging clamp engaged test machine, tantalum capacitance high/low temperature surge machine, 4 parameter testing machine of high/low temperature, 4 parameter testing machine of room temperature tantalum capacitance.
Description
Technical field
The present invention relates to tantalum capacitance production technical field, the rear road production characterization processes of specially a kind of tantalum capacitance and production
Line.
Background technology
In tantalum capacitance industry, output demand is low, properties of product require road band semi-finished product cell after military products high, more than type
In the production line of appearance, mainly there is following technique：Capacitor cutting forming, capacitance aging, capacitance high/low temperature test, capacitance
Population parameter is tested, and in existing production technology, since each technique is developed by distinct device producer, technique and technique it
Between linking and circulation fitness it is not high, need it is a large amount of artificial carry out product circulation, cause low production efficiency, cost of labor to occupy
It is high not under.
Invention content
For problems of the prior art, the present invention provides a kind of rear road of tantalum capacitance production characterization processes and lifes
Producing line can realize circulation of the tantalum capacitance between different test equipments, and circulation is convenient and efficient, improves production efficiency, drops
Low cost of labor.
Its technical solution is such：A kind of rear road production characterization processes of tantalum capacitance, it is characterised in that：Preceding road is produced
Process produces to obtain the stripped tantalum capacitive division to link together of semi-finished product into single tantalum capacitance, and use can load
The circulation disk of the single tantalum capacitance loads the tantalum capacitance, is flowed between each production detection device by the circulation disk
Turn tantalum capacitance, while the single tantalum capacitance can expose the electrode of itself in the circulation disk and be used to be tested, institute
Stating after circulation disk loads the tantalum capacitance can be used in the test of each production detection device.
Further, include the following steps：
Step 1, ribbon tantalum capacity measurement:It produces to obtain the stripped of semi-finished product to preceding road production process to link together
Tantalum capacitance carries out capacitance, loss, leakage current, ESR tests, rejects underproof capacitance；Step 2, capacitive division shaping：It will be through
The lead frame of the ribbon tantalum capacitance of step 1 test passes is cut off, and is divided into single tantalum capacitance, and by the single tantalum capacitance
Pin bent reshaping；Step 3, shape screening：The single tantalum capacitance obtained through step 2 shaping is identified, rejecting appearance has
The tantalum capacitance of flaw；The tantalum capacitance obtained through step 3 screening is mounted on circulation disk by step 4, capacitance sabot, passes through the disk that circulates
Circulate tantalum capacitance in subsequent steps；
Step 5, preceding road aging clamp engaged test：The circulation disk that tantalum capacitance is equipped in step 4 circulation is placed in aging
In fixture, contact situation of the tantalum capacitance in aging clamp is tested；
Step 6, aging：The tantalum capacitance of step 5 test passes is circulated by the circulation disk, tantalum capacitance is loaded in circulation disk
It is sent into aging equipment and carries out aging；
Step 7, rear road aging clamp engaged test：After the tantalum capacitance obtained through step 6 aging is circulated by the circulation disk,
Short-circuit, open circuit is carried out in the circulation disk, probe poor contact is tested；
Step 8, high/low temperature surge test：After the tantalum capacitance of step 7 test passes is circulated by the circulation disk, in the stream
High/low temperature surge test is carried out in turntable；
Step 9,4 parameter testing machine of high/low temperature：After the tantalum capacitance of step 8 test passes is circulated by the circulation disk, in institute
State the capacitance carried out respectively in circulation disk under high temperature and low temperature, loss, leakage current, ESR tests；
Step 10,4 parameter testing of room temperature；After the tantalum capacitance of step 9 test passes is circulated by the circulation disk, described
Capacitance under room temperature, loss, leakage current, ESR tests are carried out in circulation disk respectively.
A kind of rear pipeline production line of the tantalum capacitance of the rear road production characterization processes based on above-mentioned tantalum capacitance, feature exist
In, including sequence setting：
Ribbon tantalum capacity measurement machine, the stripped tantalum capacitance to link together for being produced to preceding road production process
Capacitance, loss, leakage current, ESR tests are carried out, unqualified tantalum capacitance is rejected；Capacitance shaping machine, being used for will be through the ribbon
The lead frame of the ribbon tantalum capacitance of tantalum capacity measurement machine test passes is cut off, and is divided into single tantalum capacitance, and the tantalum is electric
The pin bent reshaping of appearance；Shape screening machine, the shape screening machine is to the single tantalum that is obtained through the capacitance shaping machine shaping
Capacitance carries out identification of taking pictures, and rejects appearance tantalum capacitance defective；Capacitance automatic tray filler, the automatic tray filler include stream
Turntable, the capacitance fixing groove that can accommodate the tantalum capacitance is placed on the circulation disk, and the tantalum capacitance is solid in the capacitance
Determine to expose in slot the electrode of itself for being tested, distinguishes through the single tantalum capacitance that shape screening machine screens
It is mounted on by the automatic tray filler in the capacitance fixing groove of the circulation disk；
Preceding road aging clamp engaged test machine, the tantalum capacitance are placed in by the circulation disk in aging clamp, by described old
Change fixture engaged test machine to test contact situation of the tantalum capacitance in aging clamp；
Ageing oven, for carrying out aging in the disk that circulates to the tantalum capacitance through the aging clamp engaged test machine testing qualification；
Road aging clamp engaged test machine afterwards, circulation disk taking-up from the ageing oven together with aging clamp are placed in described
Afterwards on road aging clamp engaged test machine, for carrying out short-circuit, open circuit to the tantalum capacitance through aging, probe poor contact is surveyed
Examination；
Tantalum capacitance high/low temperature surge machine, the tantalum capacitance of road aging clamp engaged test machine test passes passes through the stream after described
Turntable is mounted on the surge fixture of the tantalum capacitance high/low temperature surge machine, for carrying out high/low temperature surge survey to the tantalum capacitance
Examination；
4 parameter testing machine of high/low temperature；Tantalum capacitance through the tantalum capacitance high/low temperature surge machine test passes passes through the circulation disk
It is placed in 4 parameter testing machine of the high/low temperature, for carrying out high temperature and 4 parameter testing of low temperature, including high temperature to the tantalum capacitance
With the capacitance under low temperature, loss, leakage current, ESR tests；
4 parameter testing machine of room temperature, the tantalum capacitance through 4 parameter testing machine test passes of the high/low temperature are placed in by the circulation disk
In 4 parameter testing machine of the room temperature, for carrying out 4 parameter of room temperature, including the capacitance under room temperature, loss, leakage to the tantalum capacitance
Electric current, ESR tests.
Further, the capacitance automatic tray filler includes vibration feeding machine structure, loads disk displacement mechanism, shot tantalum capacitance
Manipulator mechanism is put,
The vibration feeding machine structure includes the vibrating disk and feeding track being connected, and the single tantalum capacitance is shaken by vibrating disk
Dynamic feeding moves on the feeding track；
The loading disk displacement mechanism includes the track conveying device being arranged in the vibration feeding machine structure side, the circulation disk
The shot tantalum capacitance is moved to by the track conveying device to put at manipulator mechanism；
It includes the portal frame being mounted on the loading disk displacement mechanism, the dragon that the shot tantalum capacitance, which puts manipulator mechanism,
There are one can be equipped with along the manipulator of putting of the portal frame transverse shifting, the lower end for putting manipulator for installation on door frame
One mobile vacuum cup that can reach the standard grade, the vacuum cup will one by one move the tantalum capacitance from the feeding track
And put in the capacitance fixing groove of the circulation disk, wherein one horizontally-arranged capacitance fixing groove of the circulation disk puts tantalum electricity
After appearance, the circulation disk is moved by the track conveying device, the shot tantalum capacitance is enable to put manipulator mechanism
Enough put next horizontally-arranged tantalum capacitance.
Further, the capacitance automatic tray filler further includes empty tray conveying mechanism, and the empty tray conveying mechanism is set
It sets in the front side for loading disk displacement mechanism, the empty tray conveying mechanism includes a circulation biscuit frame, the circulation disk
The circulation disk is stacked in rack from bottom to top, the lower section of the circulation biscuit frame, which is equipped with elevating mechanism, can drive the stream
Turntable lift, the side of the circulation biscuit frame are additionally provided with circulation disk pushing mechanism, and circulation disk pushing mechanism can will most
The circulation disk on upper layer is sent into the track conveying device.
Further, the capacitance automatic tray filler further includes full charging tray conveying mechanism, and the full charging tray conveying mechanism is set
It sets in the rear side for loading disk displacement mechanism, the empty tray conveying mechanism includes a circulation biscuit frame, the circulation disk
The lower section of rack, which is equipped with elevating mechanism, can drive the stream turntable lift, the side of the circulation biscuit frame to be additionally provided with circulation disk
Pushing mechanism has loaded the circulation disk of tantalum capacitance after track conveying device conveying by the circulation disk pushing machine
Structure is sent into the circulation biscuit frame of the full charging tray conveying mechanism.
Further, guide groove is additionally provided on the loading disk displacement mechanism, the guide groove is used for the circulation disk
Guide-localization.
The circulation variation of traditional banded tantalum capacitance is the circulation of single tantalum capacitance by the present invention, passes through the disk that circulates
Tantalum capacitance is loaded, circulate between different test equipments tantalum capacitance by the disk that circulates, convenient and efficient, circulation disk is non-resistance
Pattern is picked and placeed, circulation disk can also be directly applied to high temperature power-up aging, high/low temperature surge, high/low temperature test, 4 parameter of tantalum capacitance
In the test equipments such as test, reduce the process of the repetition loading tantalum capacitance in each test equipment, improve production efficiency, saves
A large amount of hand labor has been gone to intervene, while single shot tantalum capacitance circulation is conducive to discharge what bent reshaping was brought in aging
Stress on product improves the yields of product.
Description of the drawings
Fig. 1 is the schematic diagram of the rear pipeline production line of the tantalum capacitance of the present invention；
Fig. 2 is the schematic diagram of the circulation disk of the present invention；
Fig. 3 is the structural schematic diagram of the capacitance automatic tray filler of the present invention.
Specific implementation mode
The rear road of the tantalum capacitance of the present invention produces characterization processes, and produce to obtain semi-finished product by preceding road production process is in band
The tantalum capacitive division that shape links together loads tantalum at single tantalum capacitance using the circulation disk that can load single tantalum capacitance
Capacitance, by circulating, disk circulates tantalum capacitance, while single tantalum capacitance energy in the disk that circulates between each production detection device
Enough expose the electrode of itself for being tested, circulation disk can be used in each survey for producing detection device after loading tantalum capacitance
In examination, following steps are specifically included：
Step 1, ribbon tantalum capacity measurement:It produces to obtain the stripped of semi-finished product to preceding road production process to link together
Tantalum capacitance carries out capacitance, loss, leakage current, ESR tests, rejects underproof capacitance；Step 2, capacitive division shaping：It will be through
The lead frame of the ribbon tantalum capacitance of step 1 test passes is cut off, and is divided into single tantalum capacitance, and by the pin of single tantalum capacitance
Bent reshaping；Step 3, shape screening：The single tantalum capacitance obtained through step 2 shaping is identified, rejecting appearance has flaw
Tantalum capacitance；The tantalum capacitance obtained through step 3 screening is mounted on circulation disk by step 4, capacitance sabot, by the disk that circulates rear
Circulate tantalum capacitance in continuous step；
Step 5, preceding road aging clamp engaged test：The circulation disk that tantalum capacitance is equipped in step 4 circulation is placed in aging clamp
In, contact situation of the tantalum capacitance in aging clamp is tested；
Step 6, aging：By the tantalum capacitance of step 5 test passes by the disk circulation that circulates, tantalum capacitance is loaded in circulation disk and is sent into
Aging equipment carries out aging；
Step 7, rear road aging clamp engaged test：After the tantalum capacitance obtained through step 6 aging is by the disk circulation that circulates, circulating
Short-circuit, open circuit is carried out in disk, probe poor contact is tested；
Step 8, high/low temperature surge test：Through the tantalum capacitance of step 7 test passes by circulate disk circulation after, in the disk that circulates into
Row high/low temperature surge test；
Step 9,4 parameter testing machine of high/low temperature：After the tantalum capacitance of step 8 test passes is by the disk circulation that circulates, flowing respectively
High temperature and the capacitance under low temperature, loss, leakage current, ESR tests are carried out in turntable；
Step 10,4 parameter testing of room temperature；After the tantalum capacitance of step 9 test passes is by the disk circulation that circulates, circulating respectively
Capacitance, loss, leakage current in disk under progress room temperature, ESR tests.
See Fig. 1, Fig. 2, the rear road life of the tantalum capacitance of the rear road production characterization processes of the invention based on above-mentioned tantalum capacitance
Producing line, which is characterized in that including sequence setting：
Ribbon tantalum capacity measurement machine 1, the stripped tantalum electricity to link together for being produced to preceding road production process
Hold and carry out capacitance, loss, leakage current, ESR tests, rejects unqualified tantalum capacitance；Capacitance shaping machine 2, being used for will be through ribbon tantalum
The lead frame of the ribbon tantalum capacitance of 1 test passes of capacity measurement machine is cut off, and is divided into single tantalum capacitance, and drawing tantalum capacitance
Foot bent reshaping；Shape screening machine 3, shape screening machine take pictures to the single tantalum capacitance obtained through 2 shaping of capacitance shaping machine
Appearance tantalum capacitance defective is rejected in identification；Capacitance automatic tray filler 4, automatic tray filler 4 include circulation disk 11, and circulate disk 11
On be placed with the capacitance fixing groove 12 that can accommodate capacitance, tantalum capacitance can expose the electrode of itself in capacitance fixing groove 12 and use
In being tested, in the present embodiment, set in capacitance fixing groove 12 there are two the through-hole 13 opposite with the electrode of tantalum capacitance, through outer
Shape screening machine 3 screens obtained single tantalum capacitance and is mounted on respectively by automatic tray filler in the capacitance fixing groove 12 of circulation disk,
Circulation disk can be directly installed on the fixture of different processes, be done directly the work of the process by simply assembling, without pair
Single product carries out loading or unloading operation；
Preceding road aging clamp engaged test machine 5, tantalum capacitance are placed in aging clamp by the disk that circulates, are connect by preceding road aging clamp
Test machine 5 is touched to test contact situation of the tantalum capacitance in aging clamp；
Ageing oven 6 carries out aging for detecting qualified tantalum capacitance to premenstrual road aging clamp engaged test machine 5, which can
Large number of product is accommodated, the input of aging cost can be effectively reduced, when the ageing equipment, product is dissipating after clubfoot shaping
Granule product, high temperature power-up aging help to discharge the stress generated when clubfoot shaping, and multiple circulation disks are in turn mounted to always respectively
Change on plate, each capacitance station of burn-in board carries two probes, is applied to probe direction to capacitance by flexible device and is pressed
Power, aging process can be carried out by being combined into an entirety and being put into ageing oven；
Road aging clamp engaged test machine 7 afterwards, aging clamp takes out from ageing oven 6 is placed in rear road aging clamp engaged test machine
On 7, for carrying out short-circuit, open circuit to the tantalum capacitance through aging, probe poor contact is tested；
Tantalum capacitance high/low temperature surge machine 8, the tantalum capacitance of 7 test passes of road aging clamp engaged test machine passes through the disk peace that circulates after
On the surge fixture of tantalum capacitance high/low temperature surge machine 8, for carrying out high/low temperature surge test to tantalum capacitance, by quickly pacifying
Assembling structure will individually circulate disk on surge fixture, and each capacitance station of surge fixture carries two elastic probes, respectively
Two electrodes of hand capacity, are transferred by adapter, and fixture, which is put into high/low temperature surge equipment, can carry out surge process；
4 parameter testing machine 9 of high/low temperature；Tantalum capacitance through 8 test passes of tantalum capacitance high/low temperature surge machine is placed in height by the disk that circulates
In 4 parameter testing machine 9 of low temperature, for carrying out high temperature and 4 parameter testing of low temperature, including the appearance under high temperature and low temperature to tantalum capacitance
Value, loss, leakage current, ESR tests, disk will be individually circulated mounted on 4 parameter testing jig of high/low temperature by Fast Installation structure
On, each capacitance station of 4 parameter testing jig of high/low temperature carries four elastic probes, distinguishes two electrodes of hand capacity two-by-two,
It is transferred by adapter, fixture, which is put into 4 parametric test equipment of high/low temperature, can carry out the process.；
4 parameter testing machine 10 of room temperature surveys the qualified tantalum capacitance of 9 examinations through 4 parameter testing machine of high/low temperature and is placed in room temperature 4 by the disk that circulates
In parameter testing machine 10, for carrying out 4 parameter of room temperature, including the capacitance under room temperature, loss, leakage current, ESR surveys to tantalum capacitance
Examination, is modified without convection current turntable, can directly circulation disk is placed on the load plate of test machine and can be tested.
The circulation variation of traditional banded tantalum capacitance is the circulation of single tantalum capacitance by the present invention, passes through the disk that circulates
Tantalum capacitance is loaded, circulate between different test equipments tantalum capacitance by the disk that circulates, convenient and efficient, circulation disk is non-resistance
Pattern is picked and placeed, aging, high/low temperature surge, high/low temperature test, the survey of 4 parameter of tantalum capacitance are powered up by the compatible high temperature of simple process
The tests such as examination, improve production efficiency, eliminate a large amount of hand labor intervention, while single shot tantalum capacitance circulation is conducive to
The stress on the product that bent reshaping is brought is discharged in aging, improves the yields of product.
Specifically, seeing that the capacitance automatic tray filler of Fig. 3 present invention includes vibration feeding machine structure 41, loads disk displacement mechanism
42, shot tantalum capacitance puts manipulator mechanism 43,
Vibration feeding machine structure 41 includes that the vibrating disk 411 being connected and feeding track 412, single tantalum capacitance pass through vibrating disk
411 vibration feedings move on feeding track 412；
It includes the track conveying device 421 being arranged in 41 side of vibration feeding machine structure to load disk displacement mechanism 42, and circulation disk 11 is logical
It crosses track conveying device 421 and is moved to shot tantalum capacitance and put at manipulator mechanism 43；
It includes being mounted on the portal frame 431 loaded on disk displacement mechanism, portal frame 431 that shot tantalum capacitance, which puts manipulator mechanism 43,
There are one that can put manipulator 432 along 431 transverse shifting of portal frame, the lower end for putting manipulator 432 is equipped with one for upper installation
A vacuum cup 433 that can reach the standard grade mobile, vacuum cup 433 move up after one by one picking up tantalum capacitance from feeding track 412
It moves and puts in the capacitance fixing groove 12 of circulation disk 11, wherein one horizontally-arranged capacitance fixing groove 12 of circulation disk 11 puts tantalum electricity
Shot tantalum capacitance to put manipulator mechanism 43 by the movement circulation disk 11 of track conveying device 421 after appearance to put
Next horizontally-arranged tantalum capacitance.
Capacitance automatic tray filler 4 further includes empty tray conveying mechanism 44, and the setting of empty tray conveying mechanism is loading disk displacement
The front side of mechanism 42, empty tray conveying mechanism 44 include a circulation biscuit frame 441, heap from bottom to top in circulation biscuit frame 441
It is laminated with circulation disk 11, the lower section of circulation biscuit frame, which is equipped with elevating mechanism, can drive stream turntable lift, and the one of circulation biscuit frame 441
Side is additionally provided with circulation disk pushing mechanism 442, and the circulation disk of top layer can be sent into orbit transports dress by circulation disk pushing mechanism 442
It in setting 421, loads and is additionally provided with guide groove 422 on disk displacement mechanism 42, guide groove 422 is led when being moved for convection current turntable 11
To positioning.
Capacitance automatic tray filler 4 further includes full charging tray conveying mechanism 45, and full charging tray conveying mechanism 45, which is arranged, is loading disk position
The rear side of telephone-moving structure 42, empty tray conveying mechanism 45 include a circulation biscuit frame 451, and the lower section of circulation biscuit frame 451 is equipped with
Elevating mechanism can drive stream turntable lift, the side of circulation biscuit frame 451 to be additionally provided with circulation disk pushing mechanism 452, loaded
The circulation disk 11 of tantalum capacitance is sent into full charging tray conveyer after the conveying of track conveying device 421 by the disk pushing mechanism 452 that circulates
In the circulation biscuit frame 451 of structure 45.
The tantalum capacitance of shot is lined up, charging tray by the capacitance automatic tray filler of the present invention by vibrating disk on feeding track
The empty circulation disk to come from conveying is moved to shot tantalum capacitance and puts the corresponding working region of manipulator mechanism by displacement mechanism,
Shot tantalum capacitance puts the tantalum capacitance that feeding track guide rail end is sequenced team by manipulator mechanism, transfers to sky after absorption successively
It circulates in each station of disk, charging tray displacement mechanism drives circulation disk to be displaced to next line sky material in charging tray after a discharge occupies
Position, until circulation disk is filled, empty tray conveying mechanism can place the circulation disk of multiple sky by rack simultaneously, general when work
One circulation disk of top layer is transported to robot work position, and after first disk that circulates fills tantalum capacitance, which passes through
Remaining charging tray is risen a station by elevating mechanism, then is pushed to robot work position, until the circulation disk having time is successively
Rise and fills material；Rack is empty rack in full charging tray conveying mechanism, and the disk that circulates when first fills tantalum electricity in position of manipulator
Rong Hou, rack is risen to highest point by full charging tray conveying mechanism by lifting gear, then first circulation disk completely expected is pushed
Into rack, lifting gear declines a station, is pushed in rack again after second disk that circulates fills material, until in rack
Charging tray is all filled.
The basic principles, main features and advantages of the present invention have been shown and described above.The technology of the industry
Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and what is described in the above embodiment and the description is only the present invention
Principle, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these variation and
Improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention is by appended claims and its equivalent
Object defines.
Claims (7)
1. a kind of rear road of tantalum capacitance produces characterization processes, it is characterised in that：It produces preceding road production process to obtain semi-finished product
The stripped tantalum capacitive division to link together is at single tantalum capacitance, using the circulation that can load the single tantalum capacitance
Disk loads the tantalum capacitance, is circulated between each production detection device tantalum capacitance by the circulation disk, while single
The tantalum capacitance can expose the electrode of itself for being tested in the circulation disk, and the circulation disk loads the tantalum electricity
It can be used in after appearance in the test of each production detection device.
2. a kind of rear road of tantalum capacitance according to claim 1 produces characterization processes, which is characterized in that including following step
Suddenly：
Step 1, ribbon tantalum capacity measurement：It produces to obtain the stripped of semi-finished product to preceding road production process to link together
Tantalum capacitance carries out capacitance, loss, leakage current, ESR tests, rejects underproof capacitance；
Step 2, capacitive division shaping：The lead frame of ribbon tantalum capacitance through step 1 test passes is cut off, is divided into single
Tantalum capacitance, and by the pin bent reshaping of the single tantalum capacitance；
Step 3, shape screening：The single tantalum capacitance obtained through step 2 shaping is identified, appearance tantalum electricity defective is rejected
Hold；
The tantalum capacitance obtained through step 3 screening is mounted on circulation disk by step 4, capacitance sabot, by the disk that circulates in subsequent step
Circulate tantalum capacitance in rapid；
Step 5, preceding road aging clamp engaged test：The circulation disk that tantalum capacitance is equipped in step 4 circulation is placed in aging
In fixture, contact situation of the tantalum capacitance in aging clamp is tested；
Step 6, aging：The tantalum capacitance of step 5 test passes is circulated by the circulation disk, tantalum capacitance is loaded in the circulation
It is sent into aging equipment in disk and carries out aging；
Step 7, rear road aging clamp engaged test：After the tantalum capacitance obtained through step 6 aging is circulated by the circulation disk,
Short-circuit, open circuit is carried out in the circulation disk, probe poor contact is tested；
Step 8, high/low temperature surge test：After the tantalum capacitance of step 7 test passes is circulated by the circulation disk, in the stream
High/low temperature surge test is carried out in turntable；
Step 9,4 parameter testing machine of high/low temperature：After the tantalum capacitance of step 8 test passes is circulated by the circulation disk, in institute
State the capacitance carried out respectively in circulation disk under high temperature and low temperature, loss, leakage current, ESR tests；
Step 10,4 parameter testing of room temperature；After the tantalum capacitance of step 9 test passes is circulated by the circulation disk, described
Capacitance under room temperature, loss, leakage current, ESR tests are carried out in circulation disk respectively.
3. a kind of rear pipeline production line of the tantalum capacitance of the rear road production characterization processes based on the tantalum capacitance described in claim 2,
It is characterized in that, including sequence setting：
Ribbon tantalum capacity measurement machine, the stripped tantalum capacitance to link together for being produced to preceding road production process
Capacitance, loss, leakage current, ESR tests are carried out, unqualified tantalum capacitance is rejected；Capacitance shaping machine, being used for will be through the ribbon
The lead frame of the ribbon tantalum capacitance of tantalum capacity measurement machine test passes is cut off, and is divided into single tantalum capacitance, and the tantalum is electric
The pin bent reshaping of appearance；Shape screening machine, the shape screening machine is to the single tantalum that is obtained through the capacitance shaping machine shaping
Capacitance carries out identification of taking pictures, and rejects appearance tantalum capacitance defective；Capacitance automatic tray filler, the automatic tray filler include stream
Turntable, the capacitance fixing groove that can accommodate the tantalum capacitance is placed on the circulation disk, and the tantalum capacitance is solid in the capacitance
Determine to expose in slot the electrode of itself for being tested, distinguishes through the single tantalum capacitance that shape screening machine screens
It is mounted on by the automatic tray filler in the capacitance fixing groove of the circulation disk；
Preceding road aging clamp engaged test machine, the tantalum capacitance are placed in by the circulation disk in aging clamp, by described old
Change fixture engaged test machine to test contact situation of the tantalum capacitance in aging clamp；
Ageing oven, for carrying out aging in the disk that circulates to the tantalum capacitance through the aging clamp engaged test machine testing qualification；
Road aging clamp engaged test machine afterwards, circulation disk taking-up from the ageing oven together with aging clamp are placed in described
Afterwards on road aging clamp engaged test machine, for carrying out short-circuit, open circuit to the tantalum capacitance through aging, probe poor contact is surveyed
Examination；
Tantalum capacitance high/low temperature surge machine, the tantalum capacitance of road aging clamp engaged test machine test passes passes through the stream after described
Turntable is mounted on the surge fixture of the tantalum capacitance high/low temperature surge machine, for carrying out high/low temperature surge survey to the tantalum capacitance
Examination；
4 parameter testing machine of high/low temperature；Tantalum capacitance through the tantalum capacitance high/low temperature surge machine test passes passes through the circulation disk
It is placed in 4 parameter testing machine of the high/low temperature, for carrying out high temperature and 4 parameter testing of low temperature, including high temperature to the tantalum capacitance
With the capacitance under low temperature, loss, leakage current, ESR tests；
4 parameter testing machine of room temperature, the tantalum capacitance through 4 parameter testing machine test passes of the high/low temperature are placed in by the circulation disk
In 4 parameter testing machine of the room temperature, for carrying out 4 parameter of room temperature, including the capacitance under room temperature, loss, leakage to the tantalum capacitance
Electric current, ESR tests.
4. a kind of rear pipeline production line of tantalum capacitance according to claim 3, it is characterised in that：The capacitance automatic tray filler
Manipulator mechanism is put including vibration feeding machine structure, loading disk displacement mechanism, shot tantalum capacitance,
The vibration feeding machine structure includes the vibrating disk and feeding track being connected, and the single tantalum capacitance is shaken by vibrating disk
Dynamic feeding moves on the feeding track；
The loading disk displacement mechanism includes the track conveying device being arranged in the vibration feeding machine structure side, the circulation disk
The shot tantalum capacitance is moved to by the track conveying device to put at manipulator mechanism；
It includes the portal frame being mounted on the loading disk displacement mechanism, the dragon that the shot tantalum capacitance, which puts manipulator mechanism,
There are one can be equipped with along the manipulator of putting of the portal frame transverse shifting, the lower end for putting manipulator for installation on door frame
One mobile vacuum cup that can reach the standard grade, the vacuum cup will one by one move the tantalum capacitance from the feeding track
And put in the capacitance fixing groove of the circulation disk, wherein one horizontally-arranged capacitance fixing groove of the circulation disk puts tantalum electricity
After appearance, the circulation disk is moved by the track conveying device, the shot tantalum capacitance is enable to put manipulator mechanism
Enough put next horizontally-arranged tantalum capacitance.
5. a kind of rear pipeline production line of tantalum capacitance according to claim 4, it is characterised in that：The capacitance automatic tray filler
Further include empty tray conveying mechanism, the empty tray conveying mechanism is arranged in the front side for loading disk displacement mechanism, the sky
Charging tray conveying mechanism includes a circulation biscuit frame, and the circulation disk is stacked with from bottom to top in the circulation biscuit frame, described
The lower section of circulation biscuit frame, which is equipped with elevating mechanism, can drive the stream turntable lift, the side of the circulation biscuit frame to be additionally provided with
Circulate disk pushing mechanism, and the circulation disk of top layer can be sent into the track conveying device by the circulation disk pushing mechanism
In.
6. a kind of rear pipeline production line of tantalum capacitance according to claim 4, it is characterised in that：The capacitance automatic tray filler
Further include full charging tray conveying mechanism, the full charging tray conveying mechanism is arranged in the rear side for loading disk displacement mechanism, the sky
Charging tray conveying mechanism includes a circulation biscuit frame, and the lower section of the circulation biscuit frame, which is equipped with elevating mechanism, can drive the stream
The side of turntable lift, the circulation biscuit frame is additionally provided with circulation disk pushing mechanism, has loaded the circulation disk warp of tantalum capacitance
The circulation biscuit of the full charging tray conveying mechanism is sent into after the track conveying device conveying by the circulation disk pushing mechanism
In frame.
7. a kind of rear pipeline production line of tantalum capacitance according to claim 4, it is characterised in that：The loading disk displacement mechanism
On be additionally provided with guide groove, the guide groove is used for the circulation disk guide-localization.
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| CN110320429A (en) * | 2019-07-11 | 2019-10-11 | 南通海美电子有限公司 | A kind of fuse ageing and screening method |
| CN111054663A (en) * | 2019-12-25 | 2020-04-24 | 株洲宏达电子股份有限公司 | Screening method of high-reliability tantalum capacitor |
| CN113911166A (en) * | 2020-07-07 | 2022-01-11 | 中车唐山机车车辆有限公司 | Motor train unit shaft temperature detection device |
| CN117348576A (en) * | 2023-12-04 | 2024-01-05 | 深圳恒越机电设备有限公司 | Intelligent control system and method applied to test sorting machine |
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| CN113911166A (en) * | 2020-07-07 | 2022-01-11 | 中车唐山机车车辆有限公司 | Motor train unit shaft temperature detection device |
| CN113911166B (en) * | 2020-07-07 | 2022-09-27 | 中车唐山机车车辆有限公司 | Motor train unit shaft temperature sensor detection device |
| CN117348576A (en) * | 2023-12-04 | 2024-01-05 | 深圳恒越机电设备有限公司 | Intelligent control system and method applied to test sorting machine |
| CN117348576B (en) * | 2023-12-04 | 2024-02-13 | 深圳恒越机电设备有限公司 | Intelligent control system and method applied to test sorting machine |
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