CN108717138A - A kind of substrate current test circuit and system - Google Patents
A kind of substrate current test circuit and system Download PDFInfo
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- CN108717138A CN108717138A CN201810547190.7A CN201810547190A CN108717138A CN 108717138 A CN108717138 A CN 108717138A CN 201810547190 A CN201810547190 A CN 201810547190A CN 108717138 A CN108717138 A CN 108717138A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
Abstract
The application is suitable for field of terminal technology, a kind of substrate current test circuit and system are provided, power supply system applied to electric terminal, the power supply system includes power management chip, the power management chip includes low pressure difference linear voltage regulator, and M current output terminal of the low pressure difference linear voltage regulator corresponds to M first load of the electric terminal；The substrate current test circuit includes M the first divider resistances, between the current input terminal that the i-th first for the i-th current output terminal and the electric terminal that the first divider resistance of i-th is serially connected in the low pressure difference linear voltage regulator loads, a voltage test points are respectively drawn at the both ends of the first divider resistance of i-th；Wherein, M >=I >=1 and M and I are integer.The embodiment of the present application can effectively improve testing current efficiency, and ensure the integrality of the circuit board of electric terminal.
Description
Technical field
The application belongs to field of terminal technology more particularly to a kind of substrate current test circuit and system.
Background technology
Before the manufacture of the electric terminals such as mobile phone, tablet computer, personal digital assistant, it usually needs power consumption analysis is carried out,
It is whether qualified to detect electric terminal.Whether substrate current of the electric terminal under standby mode or sleep state increases, and is point
Analyse the important indicator of electric terminal power consumption.Test substrate electric current usually requires to disassemble each component of electric terminal successively, until
The remaining minimum component (low pressure difference linear voltage regulator of usually only remaining power management chip and corresponding that can realize basic function
Load), with the electric current that each component of determination is consumed, lead to the increased component of substrate current to test out.
The mode of existing test substrate electric current needs the component disassembled more, time-consuming and laborious, inefficiency, and can be right
The circuit board of electric terminal causes a degree of damage.
Invention content
In view of this, the embodiment of the present application provides a kind of substrate current test circuit and system, to solve existing survey
The mode of examination substrate current needs the Power Supply Assembly disassembled more, time-consuming and laborious, inefficiency, and can be to the electricity of power supply system
The problem of road plate causes a degree of damage.
The first aspect of the embodiment of the present application provides a kind of substrate current test circuit, is applied to the power supply of electric terminal
System, the power supply system include power management chip, and the power management chip includes low pressure difference linear voltage regulator, described low
M current output terminal of pressure difference linear voltage regulator corresponds to M first load of the electric terminal；
The substrate current test circuit includes M the first divider resistances, and the first divider resistance of i-th is serially connected in described low
Between the current input terminal that the i-th current output terminal of pressure difference linear voltage regulator and the i-th first of the electric terminal load,
Respectively draw a voltage test points in the both ends of the first divider resistance of i-th；
Wherein, M >=I >=1 and M and I are integer.
In one embodiment, when the electric terminal is in sleep state or standby mode, what i-th first loaded
The resistance value of the first divider resistance of voltage difference/i-th of the voltage test points at the first divider resistance of substrate current=i-th both ends.
In one embodiment, the power management chip further includes DC/DC converters, the DC/DC converters it is N number of
Current output terminal corresponds to N number of second load of the electric terminal；
The substrate current test circuit further includes N number of second divider resistance, and the second divider resistance of j-th is serially connected in described
Between the current input terminal that the j-th current output terminal of DC/DC converters and the j-th second of the electric terminal load, J
Respectively draw a voltage test points in the both ends of a second divider resistance；
Wherein, N >=J >=1 and N and J are integer.
In one embodiment, when the electric terminal is in sleep state or standby mode, what j-th second loaded
The resistance value of the second divider resistance of voltage difference/j-th of the voltage test points at the second divider resistance of substrate current=j-th both ends.
In one embodiment, the power supply system further includes power supply, the current output terminal of the power supply and the power supply
The current input terminal of m third of the current input terminal of managing chip and electric terminal load connects altogether；
The substrate current test circuit further includes m third divider resistance, and i-th of third divider resistance is serially connected in described
Between the current input terminal of i-th of third of the current output terminal of power supply and electric terminal load, i-th of third partial pressure electricity
Respectively draw a voltage test points in the both ends of resistance；
Wherein, m >=i >=1 and m and i are integer.
In one embodiment, when the electric terminal is in sleep state or standby mode, i-th of third load
The resistance value of the third divider resistance of the voltage difference of the voltage test points at the third divider resistance both ends of substrate current=i-th/i-th.
In one embodiment, the power supply system further includes power supply and power conversion module, and the electric current of the power supply is defeated
Outlet connects altogether with the current input terminal of the power management chip and the current input terminal of the power conversion module, the power supply
N current output terminal of conversion module and the current input terminal of the n of the electric terminal the 4th load connect altogether；
The substrate current test circuit further includes n the 4th divider resistances, and j-th of the 4th divider resistances are serially connected in described
Between the current input terminals of j-th the 4th loads of the current output terminal of power conversion module and the electric terminal, j-th the
Respectively draw a voltage test points in the both ends of four divider resistances；
Wherein, n >=j >=1 and n and j are integer.
In one embodiment, when the electric terminal is in sleep state or standby mode, j-th the 4th loads
The resistance value of the 4th divider resistance of the voltage difference of the voltage test points at the 4th divider resistance both ends of substrate current=j-th/j-th.
In one embodiment, the power conversion module is low pressure difference linear voltage regulator or DC/DC converters.
The embodiment of the present application second aspect provides a kind of substrate current test system comprising above-mentioned substrate current test
The data that circuit further includes the voltage measuring apparatus being connect with the voltage test points and is connect with the voltage measuring apparatus
Processing terminal.
The embodiment of the present application is by providing a kind of substrate circuit test circuit including at least one divider resistance, in electronics
The electric current of the current output terminal of the low pressure difference linear voltage regulator of the power management chip of the power supply system of terminal and corresponding load
One divider resistance of series connection between input terminal, and a voltage test points are respectively drawn at the both ends of divider resistance, so as to logical
The voltage of detection voltage test points is crossed to judge whether the substrate current of corresponding load is bigger than normal, can effectively improve testing current effect
Rate, and ensure the integrality of the circuit board of electric terminal.
Description of the drawings
It in order to more clearly explain the technical solutions in the embodiments of the present application, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description is only some of the application
Embodiment for those of ordinary skill in the art without having to pay creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is the structural schematic diagram for the substrate current test circuit that the embodiment of the present application one provides；
Fig. 2 is the structural schematic diagram for the substrate current test circuit that the embodiment of the present application two provides；
Fig. 3 is the structural schematic diagram for the substrate current test circuit that the embodiment of the present application three provides；
Fig. 4 is the structural schematic diagram for the substrate current test circuit that the embodiment of the present application four provides.
Specific implementation mode
In being described below, for illustration and not for limitation, it is proposed that such as tool of particular system structure, technology etc
Body details, so as to provide a thorough understanding of the present application embodiment.However, it will be clear to one skilled in the art that there is no these specific
The application can also be realized in the other embodiments of details.In other situations, it omits to well-known system, device, electricity
The detailed description of road and method, so as not to obscure the description of the present application with unnecessary details.
In order to illustrate technical solution described herein, illustrated below by specific embodiment.
Embodiment one
As shown in Figure 1, the present embodiment provides a kind of substrate current test circuit 10, it is applied to the power supply system of electric terminal
System, the power supply system includes power management chip (Power Management Integrated Circuits, PMIC) 20,
Power management chip 20 includes low pressure difference linear voltage regulator (Low Dropout Regulator, LDC) 21, and low pressure difference linearity is steady
M current output terminal of depressor 21 corresponds to M first load of electric terminal.
In a particular application, electric terminal can be mobile phone, tablet computer, personal digital assistant, Intelligent bracelet, notebook
Computer etc., including power supply system and power management chip need to detect the base under sleep state or standby mode before manufacture
Bottom electric current is to analyze the arbitrary electric terminal of power consumption.
As shown in Figure 1, substrate current test circuit 10 includes M the first divider resistances, the first divider resistance of i-th concatenation
Between the current input terminal that the i-th current output terminal of low pressure difference linear voltage regulator and the i-th first of electric terminal load,
Respectively draw a voltage test points in the both ends of the first divider resistance of i-th；
Wherein, M >=I >=1 and M and I are integer.
In a particular application, M number is by the load that is connect with low pressure difference linear voltage regulator in tested electric terminal
Actual quantity determines.
Illustratively show that M first load includes 211, the 2nd first loads of the 1st first load in Fig. 1
212 ..., i-th first load 21I ..., m-th first load 21M；M the first divider resistances include the 1st first
Divider resistance R11, the 2nd the first divider resistance R12 ..., the first divider resistance of i-th R1I ..., m-th first divide
Resistance R1M；The double-end voltage test points of each first partial pressure are expressed as U11 and U11 ', U12 and U12 ' ...,
U1I and U1I ' ..., U1M and U1M '.
In a particular application, when electric terminal is under sleep state or standby mode, pass through the first load pair of detection
The voltage for the double-end voltage test points of the first divider resistance answered, then according to the equal original of electric current everywhere in series circuit
Reason and Ohm's law (electric current I=voltage U/ resistance R), according to the resistance value of the voltage difference of voltage test points and the first divider resistance
The substrate current of the first load can be calculated.
In the present embodiment, when electric terminal is in sleep state or standby mode, the substrate that i-th first loads is electric
The resistance value of the first divider resistance of voltage difference/i-th of the voltage test points at the first divider resistance of stream=i-th both ends.
In a particular application, the resistance value of each first divider resistance is known determining value, the voltage of voltage test points
It can be detected with the voltage measuring apparatus of test voltage by multimeter, voltmeter etc., the first different divider resistances
Resistance value can be the same or different, and can select the resistance of respective resistance values as the first divider resistance according to actual needs.
In a particular application, all first divider resistances can select resistance error, thermal stability (temperature coefficient), divide
The indices such as cloth parameter (distribution capacity and distributed inductance) reach the precision resistance of certain standard, for example, the precision of 100R
Resistance.
In one embodiment, in order to realize the accurate test to the substrate current of the first load, reduce test error, the
One divider resistance can select rheostat, by changing the resistance value of the first divider resistance, test the resistance value of the first divider resistance not
Simultaneously the first divider resistance both ends voltage test points voltage and calculate voltage difference, then take the voltage difference being repeatedly calculated
Average value, the substrate current of corresponding first load of the first divider resistance is calculated according to Ohm's law, from can obtain
Accurate substrate current；Wherein, the average value for substrate current=voltage difference that the first divider resistance corresponding first loads/
The resistance value of first divider resistance.
The present embodiment is by providing a kind of substrate circuit test circuit including at least one first divider resistance, in electronics
The current output terminal of the low pressure difference linear voltage regulator of the power management chip of the power supply system of terminal and it is corresponding first load
One the first divider resistance of series connection between current input terminal, and respectively draw a voltage tester at the both ends of the first divider resistance
Point, whether the substrate current so as to judge corresponding first load by detecting the voltage of voltage test points is bigger than normal, can be with
Testing current efficiency is effectively improved, and ensures the integrality of the circuit board of electric terminal.
Embodiment two
As shown in Fig. 2, in the present embodiment, the power management chip 20 in embodiment one further includes DC/DC converters 22,
N number of current output terminal of DC/DC converters 22 corresponds to N number of second load of electric terminal.
As shown in Fig. 2, in the present embodiment, substrate current test circuit 10 further includes N number of second divider resistance, j-th
The electric current that the j-th second for the j-th current output terminal and electric terminal that second divider resistance is serially connected in DC/DC converters loads
Between input terminal, a voltage test points are respectively drawn at the both ends of the second divider resistance of j-th；
Wherein, N >=J >=1 and N and J are integer.
In a particular application, number N is by the actual number for the load being connect with DC/DC converters in tested electric terminal
Amount determines.
Illustratively show that N number of first load includes 221, the 2nd second loads of the 1st second load in Fig. 2
222 ..., j-th second load 22J ..., n-th second load 22N；N number of second divider resistance includes the 1st second
Divider resistance R21, the 2nd the second divider resistance R22 ..., the second divider resistance of j-th R2J ..., n-th second divide
Resistance R2N；The double-end voltage test points of each second partial pressure are expressed as U21 and U21 ', U22 and U22 ' ...,
U2J and U2J ' ..., U2N and U2N '.
In a particular application, when electric terminal is under sleep state or standby mode, pass through the second load pair of detection
The voltage for the double-end voltage test points of the second divider resistance answered, then according to the equal original of electric current everywhere in series circuit
Reason and Ohm's law (electric current I=voltage U/ resistance R), according to the resistance value of the voltage difference of voltage test points and the second divider resistance
The substrate current of the second load can be calculated.
In the present embodiment, when the electric terminal is in sleep state or standby mode, the base of the load of j-th second
The resistance value of the second divider resistance of voltage difference/j-th of the voltage test points at bottom electric current=the second divider resistance of j-th both ends.
In a particular application, the resistance value of each second divider resistance is known determining value, the voltage of voltage test points
It can be detected with the voltage measuring apparatus of test voltage by multimeter, voltmeter etc., the second different divider resistances
Resistance value can be the same or different, and can select the resistance of respective resistance values as the second divider resistance according to actual needs.
In a particular application, all second divider resistances can select resistance error, thermal stability (temperature coefficient), divide
The indices such as cloth parameter (distribution capacity and distributed inductance) reach the precision resistance of certain standard, for example, the precision of 100R
Resistance.
In one embodiment, in order to realize the accurate test to the substrate current of the second load, reduce test error, the
Two divider resistances can select rheostat, by changing the resistance value of the second divider resistance, test the resistance value of the second divider resistance not
Simultaneously the second divider resistance both ends voltage test points voltage and calculate voltage difference, then take the voltage difference being repeatedly calculated
Average value, the substrate current of corresponding second load of the second divider resistance is calculated according to Ohm's law, from can obtain
Accurate substrate current；Wherein, the average value for substrate current=voltage difference that the second divider resistance corresponding second loads/
The resistance value of second divider resistance.
In a particular application, the resistance value and type of the first divider resistance and the second divider resistance can be identical or different, tool
Body can be selected according to actual needs.
The present embodiment is by providing a kind of substrate circuit test circuit including at least one second divider resistance, in electronics
The current output terminal of the DC/DC converters of the power management chip of the power supply system of terminal and the electric current of corresponding second load are defeated
Enter second divider resistance of connecting between holding, and a voltage test points are respectively drawn at the both ends of the second divider resistance, to
It can judge whether the substrate current of corresponding second load is bigger than normal, can effectively improve by detecting the voltage of voltage test points
Testing current efficiency, and ensure the integrality of the circuit board of electric terminal.
Embodiment three
In the present embodiment, the power supply system in embodiment one or embodiment two further includes power supply, and the electric current of the power supply is defeated
The current input terminal of the m third load of the current input terminal and electric terminal of outlet and power management chip connects altogether, substrate electricity
Current test circuit further includes m third divider resistance；
I-th of third divider resistance is serially connected in the electricity of i-th of third load of the current output terminal and electric terminal of power supply
Between flowing input terminal, a voltage test points are respectively drawn at the both ends of i-th of third divider resistance；
Wherein, m >=i >=1 and m and i are integer.
In a particular application, power supply be specifically as follows be directly connected to power supply adaptor DC power-supply circuit can also be can
Rechargeable battery circuit.
Fig. 3 illustratively shows that the power supply system in embodiment one further includes power supply 30, the current output terminal of power supply 30
It is connect altogether with the current input terminal of the m third load of the current input terminal and electric terminal of power management chip 20, substrate current
Test circuit 10 further includes m third divider resistance；
I-th of third divider resistance is serially connected in i-th of third load of the current output terminal and electric terminal of power supply 30
Between current input terminal, a case where voltage test points are respectively drawn at the both ends of i-th of third divider resistance；
Wherein, the load of m third include the 1st third load 231, the 2nd thirds load 232 ..., i-th of third
Load 23i ..., m-th third load 23m；M third divider resistance include the 1st third divider resistance R31, the 2nd the
Three divider resistance R32 ..., i-th of third divider resistance R3i ..., m-th of third divider resistance R3m；Each third partial pressure
Double-end voltage test points be expressed as U31 and U21 ', U32 and U32 ' ..., U3i and U3i ' ..., U3m and
U3m’。
In a particular application, when electric terminal is under sleep state or standby mode, by detecting third load pair
The voltage for the double-end voltage test points of third divider resistance answered, then according to the equal original of electric current everywhere in series circuit
Reason and Ohm's law (electric current I=voltage U/ resistance R), according to the resistance value of the voltage difference of voltage test points and third divider resistance
The substrate current of third load can be calculated.
In the present embodiment, when the electric terminal is in sleep state or standby mode, the base of i-th of third load
The resistance value of the third divider resistance of the voltage difference of the voltage test points at the third divider resistance both ends of bottom electric current=i-th/i-th.
In a particular application, the resistance value of each third divider resistance is known determining value, the voltage of voltage test points
It can be detected with the voltage measuring apparatus of test voltage by multimeter, voltmeter etc., different third divider resistances
Resistance value can be the same or different, and can select the resistance of respective resistance values as third divider resistance according to actual needs.
In a particular application, all third divider resistances can select resistance error, thermal stability (temperature coefficient), divide
The indices such as cloth parameter (distribution capacity and distributed inductance) reach the precision resistance of certain standard, for example, the precision of 100R
Resistance.
In one embodiment, in order to realize the accurate test of the substrate current loaded to third, reduce test error, the
Three divider resistances can select rheostat, by changing the resistance value of third divider resistance, test the resistance value of third divider resistance not
Simultaneously third divider resistance both ends voltage test points voltage and calculate voltage difference, then take the voltage difference being repeatedly calculated
Average value, the substrate current of third divider resistance corresponding third load is calculated according to Ohm's law, from can obtain
Accurate substrate current；Wherein, the average value for substrate current=voltage difference that the corresponding third of third divider resistance loads/
The resistance value of third divider resistance.
In a particular application, the first divider resistance, the resistance value of the second divider resistance and third divider resistance and type can be with
It is identical or different, it can specifically be selected according to actual needs.
The present embodiment is by providing a kind of substrate circuit test circuit including at least one third divider resistance, in electronics
One third of series connection between the current output terminal of the power supply of the power supply system of terminal and the current input terminal of corresponding third load
Divider resistance, and a voltage test points are respectively drawn at the both ends of third divider resistance, so as to by detecting voltage tester
Whether the voltage of point is bigger than normal to judge the substrate current of corresponding third load, can effectively improve testing current efficiency, and ensure
The integrality of the circuit board of electric terminal.
Example IV
In the present embodiment, the power supply system in embodiment one or embodiment two further includes power supply and power conversion module or reality
It further includes power conversion module to apply the power supply system in example three, the current output terminal of the power supply and the power management chip
Current input terminal and the current input terminal of the power conversion module connect altogether, n current output terminal of the power conversion module
It is connect altogether with the current input terminal of n the 4th load of the electric terminal；
The substrate current test circuit further includes n the 4th divider resistances, and j-th of the 4th divider resistances are serially connected in described
Between the current input terminals of j-th the 4th loads of the current output terminal of power conversion module and the electric terminal, j-th the
Respectively draw a voltage test points in the both ends of four divider resistances；
Wherein, n >=j >=1 and n and j are integer.
In a particular application, the power conversion module is low pressure difference linear voltage regulator or DC/DC converters.
Fig. 4 illustratively shows that the power supply system in embodiment one further includes power conversion module 40, the electricity of power supply 30
Stream output end connects altogether with the current input terminal of power management chip 20 and the current input terminal of power conversion module 40, power supply conversion
N current output terminal of module 40 and the current input terminal of the n of electric terminal the 4th load connect altogether；
Substrate current test circuit 10 further includes n the 4th divider resistances, and j-th of the 4th divider resistances are serially connected in power supply and turn
Between the current input terminal for changing the mold j-th the 4th loads of the current output terminal and electric terminal of block 40, i-th the 4th partial pressure electricity
Respectively draw the case where voltage test points in the both ends of resistance；
Wherein, the 4th loads of n include the 1st the 4th load 241, the 2nd the 4th load 242 ..., j-th the 4th
Load 24j ..., n-th the 4th load 24n；N the 4th divider resistances include the 1st the 4th divider resistance R41, the 2nd the
Four divider resistance R42 ..., j-th of the 4th divider resistance R4j ..., n-th of the 4th divider resistance R4n；Each 4th partial pressure
Double-end voltage test points be expressed as U41 and U41 ', U42 and U42 ' ..., U4j and U4j ' ..., U4n and
U4n’。
In a particular application, when electric terminal is under sleep state or standby mode, pass through the 4th load pair of detection
The voltage for the 4th double-end voltage test points of divider resistance answered, then according to the equal original of electric current everywhere in series circuit
Reason and Ohm's law (electric current I=voltage U/ resistance R), according to the resistance value of the voltage difference of voltage test points and the 4th divider resistance
The substrate current of the 4th load can be calculated.
In the present embodiment, when the electric terminal is in sleep state or standby mode, the base of j-th the 4th loads
The resistance value of the 4th divider resistance of the voltage difference of the voltage test points at the 4th divider resistance both ends of bottom electric current=j-th/j-th.
In a particular application, the resistance value of each 4th divider resistance is known determining value, the voltage of voltage test points
It can be detected with the voltage measuring apparatus of test voltage by multimeter, voltmeter etc., the 4th different divider resistances
Resistance value can be the same or different, and can select the resistance of respective resistance values as the 4th divider resistance according to actual needs.
In a particular application, all 4th divider resistances can select resistance error, thermal stability (temperature coefficient), divide
The indices such as cloth parameter (distribution capacity and distributed inductance) reach the precision resistance of certain standard, for example, the precision of 100R
Resistance.
In one embodiment, in order to realize the accurate test to the substrate current of the 4th load, reduce test error, the
Four divider resistances can select rheostat, by changing the resistance value of the 4th divider resistance, test the resistance value of the 4th divider resistance not
Simultaneously the 4th divider resistance both ends voltage test points voltage and calculate voltage difference, then take the voltage difference being repeatedly calculated
Average value, the substrate current of corresponding 4th load of the 4th divider resistance is calculated according to Ohm's law, from can obtain
Accurate substrate current；Wherein, the average value for substrate current=voltage difference that the 4th divider resistance the corresponding 4th loads/
The resistance value of 4th divider resistance.
In a particular application, the resistance of the first divider resistance, the second divider resistance, third divider resistance and the 4th divider resistance
Value and type can be identical or different, can specifically be selected according to actual needs.
The present embodiment is by providing a kind of substrate circuit test circuit including at least one 4th divider resistance, in electronics
It connects between the current output terminal of the power conversion module of the power supply system of terminal and the current input terminal of corresponding 4th load
One the 4th divider resistance, and a voltage test points are respectively drawn at the both ends of the 4th divider resistance, so as to pass through detection
Whether the voltage of voltage test points is bigger than normal to judge the substrate current of corresponding 4th load, can effectively improve testing current effect
Rate, and ensure the integrality of the circuit board of electric terminal.
Embodiment five
The present embodiment provides a kind of substrate currents to test system comprising the substrate current test in any of the above-described embodiment
The data that circuit further includes the voltage measuring apparatus being connect with the voltage test points and is connect with the voltage measuring apparatus
Processing terminal.
In a particular application, voltage measuring apparatus can be multimeter or voltmeter, and data processing terminal can be PC
(Personal Computer, personal computer) client, tablet computer, laptop or dedicated treatment facility, service
Device etc. has data processing function and itself has human-computer interaction function or can to connect display screen, mouse, keyboard etc. man-machine
The equipment of interaction device.
In the present embodiment, when the electric terminal is in sleep state or standby mode, the voltage measuring apparatus
Voltage value for detecting the voltage test points；
The data processing terminal is used to be calculated according to the voltage value of the double-end voltage test points of any divider resistance
Voltage difference, and according to Ohm's law and the series circuit equal principle of electric current everywhere, utilize voltage difference and branch pressure voltage resistance
Computing the resistor value and the concatenated load of divider resistance substrate current.
The base to the arbitrary load of electric terminal may be implemented by providing a kind of substrate current test system in the present embodiment
The automatic calculating of bottom electric current can effectively provide substrate current testing efficiency.
In the above-described embodiments, it all emphasizes particularly on different fields to the description of each embodiment, is not described in detail or remembers in some embodiment
The part of load may refer to the associated description of other embodiments.
Embodiment described above is only to illustrate the technical solution of the application, rather than its limitations；Although with reference to aforementioned reality
Example is applied the application is described in detail, it will be understood by those of ordinary skill in the art that：It still can be to aforementioned each
Technical solution recorded in embodiment is modified or equivalent replacement of some of the technical features；And these are changed
Or replace, the spirit and scope of each embodiment technical solution of the application that it does not separate the essence of the corresponding technical solution should all
Within the protection domain of the application.
Claims (10)
1. a kind of substrate current test circuit, which is characterized in that be applied to the power supply system of electric terminal, the power supply system packet
Power management chip is included, the power management chip includes low pressure difference linear voltage regulator, M of the low pressure difference linear voltage regulator
Current output terminal corresponds to M first load of the electric terminal；
The substrate current test circuit includes M the first divider resistances, and the first divider resistance of i-th is serially connected in the low voltage difference
Between the current input terminal that the i-th current output terminal of linear voltage regulator and the i-th first of the electric terminal load, I
Respectively draw a voltage test points in the both ends of a first divider resistance；
Wherein, M >=I >=1 and M and I are integer.
2. substrate current test circuit as described in claim 1, which is characterized in that when the electric terminal is in sleep state
Or when standby mode, the voltage of the voltage test points at the first divider resistance of substrate current=i-th both ends that i-th first loads
The resistance value of the first divider resistance of difference/i-th.
3. substrate current test circuit as described in claim 1, which is characterized in that the power management chip further includes DC/
N number of current output terminal of DC converters, the DC/DC converters corresponds to N number of second load of the electric terminal；
The substrate current test circuit further includes N number of second divider resistance, and the second divider resistance of j-th is serially connected in the DC/
Between the current input terminal that the j-th current output terminal of DC converters and the j-th second of the electric terminal load, j-th
Respectively draw a voltage test points in the both ends of second divider resistance；
Wherein, N >=J >=1 and N and J are integer.
4. substrate current test circuit as claimed in claim 3, which is characterized in that when the electric terminal is in sleep state
Or when standby mode, the voltage of the voltage test points at the second divider resistance of substrate current=j-th both ends that j-th second loads
The resistance value of the second divider resistance of difference/j-th.
5. substrate current test circuit as described in claim 1, which is characterized in that the power supply system further includes power supply, institute
State the current output terminal of power supply and the load of m third of the current input terminal of the power management chip and the electric terminal
Current input terminal connects altogether；
The substrate current test circuit further includes m third divider resistance, and i-th of third divider resistance is serially connected in the power supply
Current output terminal and the electric terminal the load of i-th of third current input terminal between, i-th third divider resistance
Respectively draw a voltage test points in both ends；
Wherein, m >=i >=1 and m and i are integer.
6. substrate current test circuit as claimed in claim 5, which is characterized in that when the electric terminal is in sleep state
Or when standby mode, the voltage of the voltage test points at substrate current=i-th third divider resistance both ends of i-th of third load
The resistance value of difference/i-th third divider resistance.
7. substrate current test circuit as described in claim 1, which is characterized in that the power supply system further includes power supply and electricity
Source conversion module, current input terminal and the power supply modulus of conversion of the current output terminal of the power supply with the power management chip
The current input terminal of block connects altogether, n current output terminal of the power conversion module and the n of the electric terminal the 4th load
Current input terminal connect altogether；
The substrate current test circuit further includes n the 4th divider resistances, and j-th of the 4th divider resistances are serially connected in the power supply
Between the current input terminals of j-th the 4th loads of the current output terminal of conversion module and the electric terminal, j-th the 4th point
Respectively draw a voltage test points in the both ends of piezoresistance；
Wherein, n >=j >=1 and n and j are integer.
8. substrate current test circuit as claimed in claim 7, which is characterized in that when the electric terminal is in sleep state
Or when standby mode, the voltage of the voltage test points at substrate current=j-th the 4th divider resistance both ends of j-th the 4th loads
The resistance value of difference/j-th the 4th divider resistances.
9. such as claim 7 or 8 any one of them substrate current test circuits, which is characterized in that the power conversion module
For low pressure difference linear voltage regulator or DC/DC converters.
10. a kind of substrate current tests system, which is characterized in that surveyed including claim 1~9 any one of them substrate current
The number that examination circuit further includes the voltage measuring apparatus being connect with the voltage test points and is connect with the voltage measuring apparatus
According to processing terminal.
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| CN201810547190.7A CN108717138B (en) | 2018-05-31 | 2018-05-31 | Substrate current test circuit and system |
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| CN108717138B CN108717138B (en) | 2021-03-30 |
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Cited By (1)
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|---|---|---|---|---|
| CN112710893A (en) * | 2019-10-25 | 2021-04-27 | 北京小米移动软件有限公司 | Electronic device and bottom current testing device |
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| Publication number | Publication date |
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| CN108717138B (en) | 2021-03-30 |
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