CN108716982A - Optical element detection method, device, electronic equipment and storage medium - Google Patents
Optical element detection method, device, electronic equipment and storage medium Download PDFInfo
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Abstract
This application involves a kind of optical element detection method, device, electronic equipment and computer readable storage mediums.The method includes：Obtain infrared figure and speckle pattern, the first zero level region of speckle pattern and the luminance mean value in the first zero level region are obtained according to speckle pattern, detect the luminance mean value of first peripheral region of the speckle pattern around the first zero level region, obtain the luminance mean value in the first zero level region and the first peripheral region corresponding second zero level region and the second peripheral region in infrared figure with speckle pattern, when the ratio that the ratio of the luminance mean value in the first zero level region and the luminance mean value of the first peripheral region is more than the luminance mean value of the first preset value and the luminance mean value and the second zero level region in the first zero level region is more than the ratio of the luminance mean value of the first peripheral region and the luminance mean value of the second peripheral region, then judge optical element exception.Due to being detected to optical element according to the luminance mean value of speckle pattern and infrared figure, the accuracy of detection can be improved.
Description
Technical field
This application involves field of computer technology, more particularly to a kind of optical element detection method, device, electronic equipment
And computer readable storage medium.
Background technology
With the development of computer technology, depth image technology is widely used in intelligent electronic device.Electronic equipment can be with
It is irradiated on object by diffraction optical element by Laser video camera head acquisition laser and is formed by speckle pattern, obtain image object
Depth information, to be applied to the scenes such as face or object identification, 3D printing, human-computer interaction.
However, when diffraction optics is damaged, laser irradiation can cause serious injury human eye to when human eye, traditional technology
In the detection of optical element is easy to be influenced by object infrared emittance, there is a problem of that detection accuracy is low.
Invention content
A kind of optical element detection method of the embodiment of the present application offer, device, electronic equipment and computer-readable storage medium
Matter can improve the accuracy of optical element detection.
A kind of optical element detection method, the method includes：
Infrared figure and speckle pattern are obtained, the speckle pattern is that the laser that light source generates in the projector passes through institute after optical element
The image of formation；
The first zero level region of the speckle pattern and the luminance mean value in the first zero level region, institute are obtained according to the speckle pattern
It is the maximum region of brightness to state zero level region；
Detect the luminance mean value of first peripheral region of the speckle pattern around first zero level region；
The brightness for obtaining the first zero level region corresponding second zero level region in the infrared figure with the speckle pattern is equal
Value, and the second peripheral region corresponding with the first peripheral region of the speckle pattern luminance mean value；
When the ratio of the luminance mean value of the luminance mean value and first peripheral region in first zero level region is more than the
When one preset value and zero level area ratio are more than peripheral region ratio, then judge that the optical element is abnormal；Wherein, the zero level
Area ratio is the ratio of the luminance mean value in first zero level region and the luminance mean value in the second zero level region, the peripheral region
Domain ratio is the ratio of the luminance mean value of first peripheral region and the luminance mean value of the second peripheral region.
A kind of optical element detection device, described device include：
Image collection module, for obtaining infrared figure and speckle pattern, the speckle pattern is the sharp of light source generation in the projector
Light after optical element by being formed by image；
Zero level region acquisition module, the first zero level region and first for obtaining the speckle pattern according to the speckle pattern
The luminance mean value in zero level region, the zero level region are the maximum region of brightness；
First brightness detection module, for detecting first peripheral region of the speckle pattern around first zero level region
The luminance mean value in domain；
Second brightness detection module, it is corresponding with the first zero level region of the speckle pattern in the infrared figure for obtaining
The luminance mean value in the second zero level region, and the second peripheral region corresponding with the first peripheral region of the speckle pattern brightness
Mean value；
Determination module, the luminance mean value for luminance mean value and first peripheral region when first zero level region
Ratio when being more than the first preset value and zero level area ratio and being more than peripheral region ratio, then judge that the optical element is abnormal；
Wherein, the zero level area ratio is the ratio of the luminance mean value in first zero level region and the luminance mean value in the second zero level region
Value, the peripheral region ratio are the ratio of the luminance mean value of first peripheral region and the luminance mean value of the second peripheral region
Value.
A kind of electronic equipment, including memory and processor are stored with computer program, the calculating in the memory
When machine program is executed by the processor so that the processor executes following steps：
Infrared figure and speckle pattern are obtained, the speckle pattern is that the laser that light source generates in the projector passes through institute after optical element
The image of formation；
The first zero level region of the speckle pattern and the luminance mean value in the first zero level region, institute are obtained according to the speckle pattern
It is the maximum region of brightness to state zero level region；
Detect the luminance mean value of first peripheral region of the speckle pattern around first zero level region；
The brightness for obtaining the first zero level region corresponding second zero level region in the infrared figure with the speckle pattern is equal
Value, and the second peripheral region corresponding with the first peripheral region of the speckle pattern luminance mean value；
When the ratio of the luminance mean value of the luminance mean value and first peripheral region in first zero level region is more than the
When one preset value and zero level area ratio are more than peripheral region ratio, then judge that the optical element is abnormal；Wherein, the zero level
Area ratio is the ratio of the luminance mean value in first zero level region and the luminance mean value in the second zero level region, the peripheral region
Domain ratio is the ratio of the luminance mean value of first peripheral region and the luminance mean value of the second peripheral region.
A kind of computer readable storage medium, is stored thereon with computer program, and the computer program is held by processor
Following steps are realized when row：
Infrared figure and speckle pattern are obtained, the speckle pattern is that the laser that light source generates in the projector passes through institute after optical element
The image of formation；
The first zero level region of the speckle pattern and the luminance mean value in the first zero level region, institute are obtained according to the speckle pattern
It is the maximum region of brightness to state zero level region；
Detect the luminance mean value of first peripheral region of the speckle pattern around first zero level region；
The brightness for obtaining the first zero level region corresponding second zero level region in the infrared figure with the speckle pattern is equal
Value, and the second peripheral region corresponding with the first peripheral region of the speckle pattern luminance mean value；
When the ratio of the luminance mean value of the luminance mean value and first peripheral region in first zero level region is more than the
When one preset value and zero level area ratio are more than peripheral region ratio, then judge that the optical element is abnormal；Wherein, the zero level
Area ratio is the ratio of the luminance mean value in first zero level region and the luminance mean value in the second zero level region, the peripheral region
Domain ratio is the ratio of the luminance mean value of first peripheral region and the luminance mean value of the second peripheral region.
Above-mentioned optical element detection method, device, electronic equipment and computer readable storage medium, can obtain infrared figure
The laser generated with light source in the projector obtains the of speckle pattern by being formed by speckle pattern after optical element, according to speckle pattern
One zero level region and corresponding first zero level regional luminance mean value, detection speckle pattern around the first zero level region first around
Luminance mean value, obtain the first zero level region and the first peripheral region corresponding second zero level region with speckle pattern in infrared figure
With the luminance mean value of the second peripheral region, when the ratio of the luminance mean value of the luminance mean value and the first peripheral region in the first zero level region
Value is more than the first peripheral region more than the first preset value and the first zero level region and the ratio of the luminance mean value in the second zero level region
When with the ratio of the luminance mean value of the second peripheral region, then optical element exception is judged.Due to can be according to the zero level of speckle pattern
The luminance mean value of region zero level region corresponding with the luminance mean value of peripheral region and infrared figure and peripheral region is to optical element
It is detected, the accuracy of detection can be improved.
Description of the drawings
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of application for those of ordinary skill in the art without creative efforts, can be with
Obtain other attached drawings according to these attached drawings.
Fig. 1 is the application scenario diagram of optical element detection method in one embodiment；
Fig. 2 is the flow chart of optical element detection method in one embodiment；
Fig. 3 is the flow chart that speckle pattern zero level region is obtained in one embodiment；
Fig. 4 is the flow chart that speckle pattern is detected in one embodiment；
Fig. 5 is the schematic diagram for the peripheral region that speckle pattern zero level region is obtained in one embodiment；
Fig. 6 is the flow chart that infrared figure different zones luminance mean value is obtained in one embodiment；
Fig. 7 is the flow chart of optical element detection method in another embodiment；
Fig. 8 is the structure diagram of optical element detection device in one embodiment；
Fig. 9 is the schematic diagram of image processing circuit in one embodiment.
Specific implementation mode
It is with reference to the accompanying drawings and embodiments, right in order to make the object, technical solution and advantage of the application be more clearly understood
The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, and
It is not used in restriction the application.
It is appreciated that term " first " used in this application, " second " etc. can be used to describe herein various elements,
But these elements should not be limited by these terms.These terms are only used to distinguish first element and another element.Citing comes
It says, in the case where not departing from scope of the present application, the first client can be known as the second client, and similarly, can incite somebody to action
Second client is known as the first client.First client and the second client both client, but it is not same visitor
Family end.
Fig. 1 is the application scenario diagram of optical element detection method in one embodiment.As shown in Figure 1, electronic equipment 10 can
Including camera module 110, second processing unit 120, first processing units 130.Above-mentioned second processing unit 120 can be CPU
(Central Processing Unit, central processing unit) module.Above-mentioned first processing units 130 can be MCU
(Microcontroller Unit, micro-control unit) module 130 etc..Wherein, first processing units 130 are connected to second processing
Between unit 120 and camera module 110, above-mentioned first processing units 130 can control Laser video camera head in camera module 110
112, floodlight 114 and color-changing lamp 118, above-mentioned second processing unit 120 can control RGB cameras in camera module 110
116。
Camera module 110 include Laser video camera head 112, floodlight 114, RGB (Red/Green/Blue, red green/
Blue color pattern) camera 116 and color-changing lamp 118.Above-mentioned Laser video camera head 112 is infrared camera, for obtaining infrared figure
Picture.Above-mentioned floodlight 114 is the area source that infrared light can occur；Above-mentioned color-changing lamp 118 is that the point light source of laser can occur and be
With figuratum point light source.Wherein, when floodlight 114 emits area source, Laser video camera head 112 can be according to the light being reflected back
Obtain infrared image.When color-changing lamp 118 emits point light source, Laser video camera head 112 can obtain speckle according to the light being reflected back
Image.Above-mentioned speckle image is the image that pattern deforms upon after the figuratum point light source of band that color-changing lamp 118 emits is reflected.
First processing units 130 include PWM (Pulse Width Modulation, pulse width modulation) module 132,
SPI/I2C (Serial Peripheral Interface/Inter-Integrated Circuit, Serial Peripheral Interface (SPI)/bis-
To two-wire system synchronous serial interface) interface 134, RAM (Random Access Memory, random access memory) module 136
With depth engine 138.Above-mentioned PWM module 132 can emit pulse to camera module, control floodlight 114 or color-changing lamp 118 is opened
It opens so that Laser video camera head 112 can collect infrared image or speckle image.Above-mentioned SPI/I2C interfaces 134 are for receiving second
The face acquisition instructions that processing unit 120 is sent.Above-mentioned depth engine 138 can handle speckle image to obtain depth parallax
Figure.
When second processing unit 120 receives the data acquisition request of application program, for example, when application program need into
When the unlock of pedestrian's face, face payment, face can be sent to first processing units 130 by operating in the CPU core under TEE environment
Acquisition instructions.After first processing units 130 receive face acquisition instructions, impulse wave control can be emitted by PWM module 132
Floodlight 114 is opened and acquires infrared image, control camera module 110 by Laser video camera head 112 in camera module 110
Middle color-changing lamp 118 is opened and acquires speckle image by Laser video camera head 112.Camera module 110 can will be collected infrared
Image and speckle image are sent to first processing units 130.First processing units 130 can be at the infrared image that receives
Reason obtains infrared disparity map；The speckle image received is handled to obtain speckle disparity map or depth parallax figure.Wherein,
It refers to carrying out school to infrared image or speckle image that one processing unit 130 carries out processing to above-mentioned infrared image and speckle image
Just, influence of the inside and outside parameter to image in camera module 110 is removed.Wherein, first processing units 130 can be set to different
The image of pattern, different mode output is different.When first processing units 130 are set as speckle chart-pattern, first processing units
130 pairs of speckle image processings obtain speckle disparity map, and target speckle image can be obtained according to above-mentioned speckle disparity map；At first
When reason unit 130 is set as depth chart-pattern, first processing units 130 obtain depth parallax figure to speckle image processing, according to
Depth image can be obtained in above-mentioned depth parallax figure, and above-mentioned depth image refers to the image with depth information.First processing units
130 can be sent to above-mentioned infrared disparity map and speckle disparity map second processing unit 120, and first processing units 130 can also incite somebody to action
Above-mentioned infrared disparity map and depth parallax figure are sent to second processing unit 120.Second processing unit 120 can be according to above-mentioned infrared
Disparity map obtains Infrared Targets image, obtains depth image according to above-mentioned depth parallax figure.Further, second processing unit
120 can detect according to Infrared Targets image, depth image to carry out recognition of face, face matching, In vivo detection and acquisition
Face depth information.
Communicated between first processing units 130 and second processing unit 120 is by fixed safe interface, to ensure
The safety of transmission data.As shown in Figure 1, the data that second processing unit 120 is sent to first processing units 130 are to pass through peace
Full serial Peripheral Interface or bidirectional two-line synchronous serial interface (SECURE SPI/I2C) 140, first processing units 130 are sent
Data to second processing unit 120 be by safety moving Industry Processor Interface (SECURE MIPIMobile,
Industry Processor Interface)150。
In one embodiment, first processing units 130 are by controlling floodlight 114 and radium-shine in camera module 110
Lamp 118 is opened and acquires corresponding infrared figure and speckle pattern by Laser video camera head 112, and camera module 110 can be by acquisition
Infrared figure and speckle pattern are sent to first processing units 130, and first processing units 130 can be obtained according to speckle pattern in speckle pattern
The maximum region of the brightness i.e. luminance mean value in the first zero level region and the first zero level region, and speckle pattern is detected in the first zero level area
The luminance mean value of the first peripheral region around domain, first processing units 130 can also obtain with speckle pattern in infrared figure
The luminance mean value in one zero level region and the first peripheral region corresponding second zero level region and the second peripheral region, when the first zero level
The ratio of the luminance mean value in region and the luminance mean value of the first peripheral region is more than the first preset value and zero level area ratio is more than
When peripheral region ratio, first processing units 130 judge that optical element is abnormal, and wherein zero level area ratio is the first zero level region
Luminance mean value and the second zero level region luminance mean value ratio, peripheral region ratio be the first peripheral region luminance mean value
With the ratio of the luminance mean value of the second peripheral region.
Fig. 2 is the flow chart of optical element detection method in one embodiment.As shown in Fig. 2, the optical element detection side
Method includes step 202 to step 210.
Step 202, infrared figure and speckle pattern are obtained, speckle pattern is that the laser that light source generates in the projector passes through optical element
After be formed by image.
Infrared figure refers to that electronic equipment is emitted by controlling floodlight on Infrared irradiation to object, and passes through Laser video camera
The infrared image that head is acquired according to the light being reflected back.Floodlight is the area source that infrared light can occur.Speckle pattern refers to laser
The laser of camera acquisition generated by light source in the projector, which is irradiated to by optical element on object, is formed by speckle image.
The projector of electronic equipment can be color-changing lamp.The projector includes light source, collimating mirror and optical element.Wherein, light source can be face
Emit laser, vertical cavity surface laser (VCSEL, Vertical Cavity Surface Emitting Laser) array.Optics
Element can be both DOE (Diffractive Optical Elements, diffraction optical element), frosted glass or the insides group
Close etc..Laser video camera head includes imaging sensor, lens etc., and imaging sensor can be CMOS (Complementary Metal
Oxide Semiconductor, complementary metal oxide semiconductor), CCD (Charge-coupled Device, Charged Couple
Element) etc..
Electronic equipment is irradiated to the light reflected on object by Laser video camera head acquisition floodlight and is formed by infrared figure
The laser generated with light source in the projector, which is irradiated to by optical element on object, is formed by speckle pattern.
Step 204, according to speckle pattern obtain speckle pattern the first zero level region and the first zero level region luminance mean value, zero
Grade region is the maximum region of brightness.
Zero level region refers to the maximum region of brightness value in speckle pattern.In the case where optical element is abnormal, due to
The optical characteristics of laser can cause the brightness of picture centre region abnormal.Specifically, it is influenced by shooting distance, speckle pattern
Zero level region is likely located at the center of speckle pattern, it is also possible to be located at the center of speckle pattern position to the right.Specifically, electronic equipment
The search box that size can be preset by setting traverses speckle pattern, and the region where the maximum search box of brightness value is made
For the first zero level region of speckle pattern, and obtain the luminance mean value in the first zero level region.The luminance mean value in the first zero level region is
Refer to the average value of the brightness of each pixel in the first zero level region.
Electronic equipment is used as the zero level region of speckle pattern by searching for the maximum region of brightness in speckle pattern, and obtains zero level
The luminance mean value in region.
Step 206, the luminance mean value of first peripheral region of the detection speckle pattern around the first zero level region.
First peripheral region of the speckle pattern around the first zero level region refers in speckle pattern in addition to where zero level region
Other regions outside region.Specifically, electronic equipment can detect whole region of the speckle pattern around the first zero level region
Luminance mean value can also obtain the part around the first zero level region by extracting the subregion around the first zero level region
The luminance mean value in region.Electronic equipment to the extraction quantity in the region around zero level region can according to the demand of practical application and
Detection result determines.Specifically, electronic equipment to the extraction quantity in the region around zero level region can be 4,8,12
It is a etc. without being limited thereto.
Electronic equipment is by obtaining region of the speckle pattern around zero level region, each picture in region around detection zero level region
The brightness value of vegetarian refreshments, and calculate luminance mean value of the average value as the region around zero level region of the brightness of each pixel.
Step 208, the brightness for obtaining the first zero level region corresponding second zero level region in infrared figure with speckle pattern is equal
Value, and the second peripheral region corresponding with the first peripheral region of speckle pattern luminance mean value.
Electronic equipment obtains the first zero level region position corresponding second zero level area with speckle pattern in infrared figure
The luminance mean value in domain.Electronic equipment obtains second week corresponding with the first peripheral region position of speckle pattern in infrared figure
Enclose the luminance mean value in region.Specifically, when the whole region outside the first zero level region that electronic equipment obtains speckle pattern is as scattered
When the first peripheral region of spot figure, then the luminance mean value of the whole region outside corresponding the second zero level region for obtaining infrared figure is made
For the luminance mean value of the second peripheral region.When electronic equipment obtains subregion of the speckle pattern outside the first zero level region as the
When one peripheral region, then the luminance mean value of the subregion outside corresponding the second zero level region for obtaining infrared figure.Electronic equipment
Extraction number to the extraction quantity of the second peripheral region of infrared figure, extraction area size etc. with the first peripheral region of speckle pattern
The one-to-one correspondence such as amount, extraction area size.Electronic equipment by obtain in infrared figure with the first zero level region and the first peripheral region
The brightness value of the corresponding each pixel in domain position calculates the luminance mean value in the second zero level region and the second peripheral region.
Step 210, when the ratio of the luminance mean value of the luminance mean value and the first peripheral region in the first zero level region is more than the
When one preset value and zero level area ratio are more than peripheral region ratio, then optical element exception is judged；Wherein, zero level area ratio
For the ratio of the luminance mean value of the luminance mean value and the second zero level region in the first zero level region, peripheral region ratio is around first
The ratio of the luminance mean value of the luminance mean value in region and the second peripheral region.
First preset value can be determined according to experimental data and practical application effect.First preset value can work as optics
There is perforation on element or there are when cut, the laser that light source generates in the projector is irradiated on object when institute by optical element
The ratio of the luminance mean value in zero level region and peripheral region in the speckle pattern of formation.Electronic equipment is working as the bright of the first zero level region
The ratio for spending the luminance mean value of mean value and the first peripheral region is more than the first preset value and zero level area ratio is more than peripheral region
When ratio, then judge optical element exception, at this time optical element there may be perforation or cut, electronic equipment can to user into
Row is reminded and testing result is uploaded to server.When the brightness of the luminance mean value and the first peripheral region in the first zero level region is equal
When the ratio of value is more than the first preset value but zero level area ratio and is not greater than peripheral region ratio, the first zero level region at this time
The ratio of luminance mean value and the first peripheral region luminance mean value may be due to existing to red in speckle pattern more than the first preset value
Caused by the reasons such as the high material of outer luminous emissivity, then electronic equipment judgement optical element is without abnormal.
Optical element detection method in the embodiment of the present application is swashed by what light source in the infrared figure of acquisition and the projector generated
Light obtains the first zero level region and corresponding first of speckle pattern according to speckle pattern by being formed by speckle pattern after optical element
Zero level regional luminance mean value, detection speckle pattern around the first zero level region first around luminance mean value, obtain infrared figure
In with the brightness in the first zero level region and the first peripheral region corresponding second zero level region and the second peripheral region of speckle pattern
Mean value, when the ratio of the luminance mean value of the luminance mean value and the first peripheral region in the first zero level region is more than the first preset value and the
One zero level region is more than the brightness of the first peripheral region and the second peripheral region with the ratio of the luminance mean value in the second zero level region
When the ratio of mean value, then optical element exception is judged.Due to can be according to the zero level region of speckle pattern and the brightness of peripheral region
Mean value and the luminance mean value of the corresponding zero level region of infrared figure and peripheral region are detected optical element, avoid because there are red
Speckle pattern zero level regional luminance variation caused by high object of outer emissivity etc. influences the testing result of optical element, can improve
The accuracy of detection.
In one embodiment, zero level region and the zero level that speckle pattern is obtained in a kind of optical element detection method are provided
The process of the luminance mean value in region may include：
Step 302, it is traversed in the predeterminable area of speckle pattern using the posting of default size.
The predeterminable area of speckle pattern refers to the maximum magnitude of preset zero level region region.Default size is determined
Position frame refers to the search box set according to the size in zero level region.Specifically, the size and posting of the predeterminable area of speckle pattern
Default size can be determined according to the demand in experimental data or practical application.Posting is in the predeterminable area of speckle pattern
Traversal mode can be lateral traversal, can also be vertical traversal.Electronic equipment can also be according to posting institute in ergodic process
Position where prejudging zero level region in the brightness value of position determines the different zones in predeterminable area according to judging result
Traversal number.For example, in the speckle pattern of a 1000*1000 pixel, predeterminable area can be pixel value be 600*600 and in
The region that heart point is overlapped with speckle pattern, the posting of default size can be the postings that pixel value is 30*30, and electronic equipment can
The posting of 30*30 to be traversed in predeterminable area, if normal in the case of the number that laterally traverses be 100 times, primary horizontal
During traversal, the brightness value that electronic equipment is located at right side according to posting in ergodic process is located at left side more than posting
When brightness value, it can be determined that zero level region position be speckle pattern right side, and according to judging result to traversal number into
Row adjustment, reduces the traversal number of left area.
Step 304, using the maximum posting region of luminance mean value as the first zero level region of speckle pattern.
The traversal of predeterminable area of the electronic equipment using the posting of default size in speckle pattern simultaneously obtains in ergodic process
The luminance mean value of posting region, using the region where the maximum posting of luminance mean value as the first zero level of speckle pattern
Region, while obtaining the luminance mean value in the first zero level region.
It is traversed in the predeterminable area of speckle pattern by using the posting of default size, by the maximum posting of brightness value
Region can improve acquisition zero level as the first zero level region of speckle pattern and the luminance mean value in the first zero level region of acquisition
The efficiency in region.
As shown in figure 4, in one embodiment, a kind of optical element detection method provided can also include：
Step 402, the first quantity region around the first zero level region of speckle pattern is obtained.
Specifically, the first quantity region around zero level region can be region identical with the size in zero level region,
It can also be the different regions from zero level area size, such as can be region more twice than zero level area size, also may be used
To be the region etc. smaller than zero level region.Electronic equipment obtain the peripheral region in zero level region the first quantity can with 4,8,
10 etc. without being limited thereto.
Step 404, when the ratio of the luminance mean value and the luminance mean value in the first quantity region in the first zero level region is big
When the first preset value, then judge that the ratio of the luminance mean value and the luminance mean value of the first peripheral region in the first zero level region is more than
First preset value.
When region around the first zero level region of electronic equipment acquisition has multiple, if the luminance mean value in the first zero level region
When being all higher than the first preset value with the luminance mean value of multiple regions around, then the luminance mean value and first in the first zero level region is judged
The ratio of the luminance mean value of peripheral region is more than the first preset value.When the luminance mean value and surrounding multiple regions in the first zero level region
Luminance mean value ratio there are one be less than the first preset value, then judge the luminance mean value and the first peripheral region in the first zero level region
The luminance mean value in domain is not more than the first preset value.For example, electronic equipment obtains the brightness in 4 regions around the first zero level region
Mean value is respectively 80,88,93,100, and the first preset value is 2, if the luminance mean value in the first zero level region is 220, the first zero level
Region and the ratio of the luminance mean value in 4 regions of surrounding are respectively 2.75,2.50,2.44,2.2, are all higher than the first preset value, then
Judge that the ratio of the luminance mean value in the first zero level region and the luminance mean value of the first peripheral region is more than the first preset value, if first
The brightness in zero level region is 180, then the ratio of the luminance mean value in the first zero level region and 4 regions of surrounding be respectively 2.25,
2.05,1.94,1.8, since there are the ratios of luminance mean value to be less than 2, then judge the luminance mean value and first in the first zero level region
The luminance mean value of peripheral region is not more than the first preset value.
By extracting the first quantity region around the first zero level region, when the luminance mean value in zero level region and first count
When the ratio of the luminance mean value in amount region is more than the first preset value, then judge the first zero level region luminance mean value and first week
The ratio for enclosing the luminance mean value in region is more than the first preset value, can be to avoid the part week caused by time for exposure, object reflection etc.
The brightness for enclosing region is excessive and detects the problem of mistake, improves the accuracy of detection.
In one embodiment, the first zero level region week of speckle pattern is provided in a kind of optical element detection method provided
The the first quantity region enclosed includes：It obtains and is no more than 0 with the horizontal distance in the first zero level region of speckle pattern and vertical range
The first quantity region
No more than 0 refer in the horizontal direction, obtaining the side in region with the horizontal distance in the first zero level region of speckle pattern
The coincident of edge and the first zero level region or the first zero level region.Likewise, vertical with the first zero level region of speckle pattern
Distance refers to the edge and the edge in the first zero level region or the first zero level region for obtaining region in vertical direction no more than 0
It overlaps.Obtain the first quantity region institute no more than 0 with the horizontal distance in the first zero level region of speckle pattern and vertical range
Position cannot be overlapped with the position where the first zero level region.First quantity region that electronic equipment obtains can be with
It is that 2 regions, 4 regions, 8 regions etc. are without being limited thereto.The size in the first quantity region that electronic equipment obtains can be with
First zero level region it is in the same size, can also be more than or less than the first zero level region size.It is bright when the first zero level region
When degree mean value and the luminance mean value in the first quantity region are all higher than the first preset value, then judge that the brightness in the first zero level region is equal
Value and the ratio of the luminance mean value of the first peripheral region are more than the first preset value.When the luminance mean value and first in the first zero level region
There are one the first preset value is less than in the ratio of the luminance mean value in quantity region, then the luminance mean value in the first zero level region is judged
It is not more than the first preset value with the luminance mean value of the first peripheral region.
As shown in figure 5, for the region around the first zero level region of electronic equipment acquisition and speckle pattern in one embodiment
Schematic diagram.First zero level region 502 is the maximum region of luminance mean value in speckle pattern, and 8 regions 504 of surrounding are and the 1st
The horizontal distance in grade region and 8 regions that vertical range is no more than 0 and size is consistent with the first zero level region.Electronic equipment
The luminance mean value that 8 regions 504 around can be detected, when the around luminance mean value in 8 regions 504 and the first zero level region 502
The ratio of luminance mean value when being all higher than the first preset value, then judge the luminance mean value and the first peripheral region in the first zero level region
Luminance mean value ratio be more than the first preset value.In other embodiments, the first peripheral region that electronic equipment obtains can be with
It is that 4 regions therein, 6 regions etc. are without being limited thereto.
As shown in fig. 6, in one embodiment, the second of infrared figure is obtained in a kind of optical element detection method provided
The process of the luminance mean value in zero level region and the second peripheral region includes：
Step 602, it is obtained and the first zero level region of speckle pattern and the first peripheral region corresponding second according to infrared figure
Zero level region and the second peripheral region.
Electronic equipment obtains the first zero level region position corresponding second zero level area with speckle pattern in infrared figure
Domain.The location information in the second zero level region of infrared figure and the location information in the first zero level region of speckle pattern are to correspond
's.Electronic equipment obtains the second peripheral region corresponding with the first peripheral region position of speckle pattern in infrared figure.When
When electronic equipment obtains first peripheral region of the whole region outside the first zero level region of speckle pattern as speckle pattern, then correspond to
The infrared figure of acquisition the second zero level region outside second peripheral region of the whole region as infrared figure.When electronic equipment obtains
It is when subregion of the speckle pattern outside the first zero level region is as the first peripheral region, then corresponding to obtain the 2nd 0 of infrared figure
Second peripheral region of the subregion as infrared figure outside grade region.Electronic equipment is carried to the second peripheral region of infrared figure
The one-to-one correspondence such as access amount, the extraction quantity of extraction area size etc. and the first peripheral region of speckle pattern, extraction area size.
Step 604, the luminance mean value in the second zero level region and the second peripheral region is detected.
Luminance mean value refers to the average brightness of whole pixels of wanted detection zone.Electronic equipment is obtaining infrared figure
The second zero level region and the second peripheral region after, can obtain each pixel in the second zero level region brightness value calculate second
The luminance mean value in zero level region, and obtain the brightness of the second peripheral region of brightness value calculating of each pixel in the second peripheral region
Mean value.
In one embodiment, in a kind of optical element detection method provided, after judging optical element exception, may be used also
To include：When judging optical element exception, the frequency of abnormity of optical element is increased by 1.
When optical element frequency of abnormity refers to that electronic equipment carries out abnormality detection optical element according to speckle pattern, light is judged
Learn the number of element exception.Electronic equipment obtains speckle pattern and is detected to optical element, can receive three-dimensional image acquisition
When request obtain speckle pattern carry out abnormality detection, can also in face recognition process In vivo detection by when obtain speckle pattern into
Row abnormality detection out-of-date can also obtain speckle In vivo detection is obstructed when face information and camera are more than pre-determined distance value
Figure carries out abnormality detection optical element.Electronic equipment can record the abnormality detection knot to optical element under different situations
Fruit.
When judging optical element exception, electronic equipment can record the frequency of abnormity of optical element, and optical element is different
Normal number increases by 1.
As shown in fig. 7, in one embodiment, a kind of optical element detection method provided can also include：
Step 702, when judging optical element exception, the frequency of abnormity of optical element is increased by 1.
Step 704, when the frequency of abnormity of optical element is more than preset times, forbid the use of the projector.
The projector includes light source, collimating mirror and optical element.Laser is irradiated on object by optical element and forms speckle
Image, when optical component damage, the laser intensity for being irradiated to object increases, and can be caused to human eye seriously when being irradiated to human eye
Injury.Electronic equipment forbids the use of the projector, it is possible to reduce because of light when optical element frequency of abnormity is more than preset times
It learns element exception and causes the injury to human eye.When optical element frequency of abnormity is less than preset times, electronic equipment can be right
User sends out optical component damage prompting, reduces use of the user to three-dimensional image acquisition function or face identification functions etc., and
The frequency of abnormity for recording optical element, server is uploaded to by the result of optical element exception.Preset times can be according to reality
Demand during use determines.Specifically, in order to improve safety in utilization, preset times can be a smaller number
Value, such as 3 times, 5 times are without being limited thereto.
When the frequency of abnormity of optical element is more than preset times, forbid the use of the projector.Due to can repeatedly examine
It surveys and determines that optical element is abnormal and forbid the use of the projector when frequency of abnormity is more than preset times, detection can taken into account
The safety in utilization of the projector is improved while accuracy.
In one embodiment, a kind of optical element detection method is provided, realizes that this method is as follows institute
It states：
First, electronic equipment obtains infrared figure and speckle pattern, and speckle pattern is that the laser that light source generates in the projector passes through light
It is formed by image after learning element.Infrared figure refers to that electronic equipment is emitted by controlling floodlight on Infrared irradiation to object,
And by Laser video camera head according to the infrared image for the light acquisition being reflected back.Floodlight is the area source that infrared light can occur.
Speckle pattern refers to that the laser of Laser video camera head acquisition generated by light source in the projector is irradiated to institute on object by optical element
The speckle image of formation.The projector of electronic equipment can be color-changing lamp.The projector includes light source, collimating mirror and optical element.
Wherein, light source can be surface-emission laser, vertical cavity surface laser array.Optical element can be both DOE, frosted glass or the inside
Combination etc..Laser video camera head includes imaging sensor, lens etc., and imaging sensor can be CMOS, CCD etc..
Then, electronic equipment is equal according to the brightness in the first zero level region and the first zero level region of speckle pattern acquisition speckle pattern
Value, zero level region are the maximum region of brightness.In the case where optical element is abnormal, due to the optical characteristics of laser, meeting
Cause the brightness of picture centre region abnormal.It is influenced by shooting distance, the zero level region of speckle pattern is likely located at speckle pattern
Center, it is also possible to be located at the center of speckle pattern position to the right.Electronic equipment can preset the search box pair of size by setting
Speckle pattern is traversed, and using the region where the maximum search box of brightness value as the first zero level region of speckle pattern, and is obtained
The luminance mean value in the first zero level region.The luminance mean value in the first zero level region refers to the brightness of each pixel in the first zero level region
Average value.
Optionally, electronic equipment may be used the posting of default size and be traversed in the predeterminable area of speckle pattern, will be bright
First zero level region of the maximum posting region of angle value as speckle pattern.The predeterminable area of speckle pattern refers to presetting
Zero level region region maximum magnitude.The posting of default size refers to the search set according to the size in zero level region
Frame.It can be lateral traversal that posting traverses mode in the predeterminable area of speckle pattern, can also be vertical traversal.Electronic equipment
The position where zero level region can also be prejudged according to the brightness value of posting position in ergodic process, according to judgement
As a result it determines the traversal number of the different zones in predeterminable area, and obtains the brightness of posting region in ergodic process
Value, using the region where the maximum posting of brightness value as the first zero level region of speckle pattern.
Optionally, electronic equipment can also obtain brightness value of the speckle pattern in predeterminable area, reduce predeterminable area, and obtain
Take the brightness value of the predeterminable area after reducing, the brightness value of predeterminable area after diminution bright with adjacent last predeterminable area
When angle value difference is less than preset difference value, using the predeterminable area after diminution as the first zero level region of speckle pattern.Speckle pattern it is pre-
If region is the maximum magnitude of zero level region region in preset speckle pattern.Electronic equipment can be by obtaining speckle
The brightness value of figure each pixel in predeterminable area is recycled to reduce and be preset to obtain brightness value of the speckle pattern in predeterminable area
Region is to reduce zero level region region range, the brightness value of predeterminable area after diminution and adjacent last preset areas
The brightness value of predeterminable area when the brightness value difference in domain is less than preset difference value, that is, after diminution and adjacent last preset areas
The brightness value in domain is identical or close, using the predeterminable area after diminution as the first zero level region of speckle pattern.
Then, the luminance mean value of first peripheral region of the electronic equipment detection speckle pattern around the first zero level region.It dissipates
First peripheral region of the spot figure around the first zero level region refers to its in speckle pattern other than the region where zero level region
His region.Specifically, electronic equipment can detect the luminance mean value of whole region of the speckle pattern around the first zero level region, also
It can be by extracting the subregion around the first zero level region, the brightness for obtaining the subregion around the first zero level region is equal
Value.Electronic equipment can be according to the demand and detection result of practical application come really to the extraction quantity in the region around zero level region
It is fixed.Specifically, electronic equipment to the extraction quantity in the region around zero level region can be 4,8,12 etc. it is without being limited thereto.
Optionally, electronic equipment can obtain the first quantity region around the first zero level region of speckle pattern.First
The first quantity region around zero level region can be region identical with the size in the first zero level region, can also be and the
The different regions of one zero level area size, such as can be region more twice than the first zero level area size, can also be
The region etc. smaller than the first zero level region.
Optionally, electronic equipment can also be obtained with the horizontal distance in the first zero level region of speckle pattern and vertical range not
The first quantity region more than 0.No more than 0 refer in the horizontal direction with the horizontal distance in the first zero level region of speckle pattern
On, obtain the coincident at the edge and the first zero level region or the first zero level region in region.Likewise, the zero level with speckle pattern
The vertical range in region refers to obtaining the edge and the first zero level region or the first zero level in region in vertical direction no more than 0
The coincident in region.Obtain the first number no more than 0 with the horizontal distance in the first zero level region of speckle pattern and vertical range
Position where amount region cannot be overlapped with the position where the first zero level region.
Then, electronic equipment obtains the bright of the first zero level region corresponding second zero level region with speckle pattern in infrared figure
Spend mean value, and the luminance mean value of the second peripheral region corresponding with the first peripheral region of speckle pattern.Electronic equipment is by obtaining
The brightness value of each pixel corresponding with the first zero level region and the first peripheral region position in infrared figure is taken to calculate the
The luminance mean value in two zero level regions and the second peripheral region.Specifically, when electronic equipment obtains the first zero level region of speckle pattern
It is when first peripheral region of the outer whole region as speckle pattern, then complete outside corresponding the second zero level region for obtaining infrared figure
Luminance mean value of the luminance mean value in portion region as the second peripheral region.When electronic equipment obtains speckle pattern in the first zero level region
When outer subregion is as the first peripheral region, then subregion outside corresponding the second zero level region for obtaining infrared figure
Luminance mean value.Electronic equipment is to the extraction quantity of the second peripheral region of infrared figure, extraction area size etc. and speckle pattern first
The extraction quantity of peripheral region extracts the one-to-one correspondence such as area size.
Optionally, electronic equipment obtains corresponding with the first zero level region of speckle pattern and the first peripheral region according to infrared figure
The second zero level region and the second peripheral region, detect the second zero level region and the second peripheral region luminance mean value.Electronics is set
It is standby obtain in infrared figure with the first zero level region position corresponding second zero level region of speckle pattern.The second of infrared figure
The location information in zero level region and the location information in the first zero level region of speckle pattern are one-to-one.Electronic equipment obtains red
The second peripheral region corresponding with the first peripheral region position of speckle pattern in outer figure.When electronic equipment obtains speckle pattern
The first zero level region outside first peripheral region of the whole region as speckle pattern when, then it is corresponding to obtain the second of infrared figure
Second peripheral region of the whole region as infrared figure outside zero level region.When electronic equipment obtains speckle pattern in the first zero level area
When overseas subregion is as the first peripheral region, then the subregion outside corresponding the second zero level region for obtaining infrared figure
The second peripheral region as infrared figure.Luminance mean value refers to the average brightness of whole pixels of wanted detection zone.Electricity
Sub- equipment can obtain each pixel in the second zero level region behind the second zero level region and the second peripheral region for obtaining infrared figure
The brightness value of point calculates the luminance mean value in the second zero level region, and obtains the brightness value calculating of each pixel in the second peripheral region
The luminance mean value of second peripheral region.
Then, when the ratio of the luminance mean value of the luminance mean value and the first peripheral region in the first zero level region is more than first in advance
If value and when zero level area ratio is more than peripheral region ratio, electronic equipment judges that optical element is abnormal；Wherein, zero level region ratio
It is worth the ratio for the luminance mean value in the first zero level region and the luminance mean value in the second zero level region, peripheral region ratio is first week
Enclose the ratio of the luminance mean value in region and the luminance mean value of the second peripheral region.First preset value can be deposited on optical element
It is perforating or there are when cut, is being formed by when the laser of light source generation is irradiated to by optical element on object in the projector scattered
The ratio of the luminance mean value in zero level region and peripheral region in spot figure.Electronic equipment when the first zero level region luminance mean value with
When the ratio of the luminance mean value of first peripheral region is more than the first preset value and zero level area ratio and is more than peripheral region ratio, then
Judge that optical element is abnormal, there may be perforation or cut, electronic equipment to be reminded simultaneously user for optical element at this time
Testing result is uploaded to server.When the ratio of the luminance mean value of the luminance mean value and the first peripheral region in the first zero level region
When being not greater than peripheral region ratio more than the first preset value but zero level area ratio, the luminance mean value in the first zero level region at this time
More than the first preset value may be due to existing to infrared light emission in speckle pattern with the ratio of the first peripheral region luminance mean value
Caused by the reasons such as the high material of rate, then electronic equipment judgement optical element is without abnormal.
Optionally, electronic equipment can also when the first zero level region luminance mean value and the first peripheral region brightness it is equal
When the ratio of value is more than the second preset value more than the odds ratio of the first preset value and zero level area ratio and peripheral region ratio, then
Judge that optical element is abnormal.Second preset value can be according to the determination of experimental data, such as can be 1.1,1.2 etc..First
The ratio of the luminance mean value of the luminance mean value in zero level region and the first peripheral region is more than the first preset value and zero level area ratio
When being more than the second preset value with the odds ratio of peripheral region ratio, judgement optical element is abnormal, it is possible to reduce influence because of environment or
The situation brighter than the second zero level of infrared figure region of speckle pattern the first zero level region caused by detection error, improves the accurate of detection
Property.
Optionally, when judging optical element exception, the frequency of abnormity of optical element can be increased by 1 by electronic equipment.Light
When element frequency of abnormity refers to that electronic equipment carries out abnormality detection optical element according to speckle pattern, judgement optical element is abnormal
Number.Electronic equipment obtains speckle pattern and is detected to optical element, can be obtained when receiving three-dimensional image acquisition request
Speckle pattern carries out abnormality detection, can also in face recognition process In vivo detection by when obtain speckle pattern and carry out abnormal inspection
It surveys, it can also be in the obstructed out-of-date acquisition speckle pattern when face information and camera are more than pre-determined distance value of In vivo detection to optics
Element carries out abnormality detection.Electronic equipment can record the abnormality detection result to optical element under different situations.
Optionally, electronic equipment can also forbid the projector when the frequency of abnormity of optical element is more than preset times
Use.The projector includes light source, collimating mirror and optical element.Preset times can according to demand in actual use come
It determines.Specifically, in order to improve safety in utilization, preset times can be a smaller numerical value, such as 3 times, be not limited to for 5 times
This.Laser is irradiated on object by optical element and forms speckle image, when optical component damage, is irradiated to the laser of object
Intensity increases, and can be caused serious injury to human eye when being irradiated to human eye.Electronic equipment is more than in optical element frequency of abnormity
When preset times, forbid the use of the projector, it is possible to reduce the injury to human eye is caused because of optical element exception.When optics member
When part frequency of abnormity is less than preset times, electronic equipment can send out user optical component damage prompting, reduce user couple three
The use of image collecting function or face identification functions etc. is tieed up, and records the frequency of abnormity of optical element, by optical element exception
Result be uploaded to server.
Although it should be understood that Fig. 2-5,7 flow chart in each step shown successively according to the instruction of arrow,
Be these steps it is not that the inevitable sequence indicated according to arrow executes successively.Unless expressly stating otherwise herein, these steps
There is no stringent sequences to limit for rapid execution, these steps can execute in other order.Moreover, in Fig. 2-5,7 extremely
Few a part of step may include that either these sub-steps of multiple stages or stage are not necessarily same to multiple sub-steps
Moment executes completion, but can execute at different times, and the execution sequence in these sub-steps or stage is also not necessarily
It carries out successively, but can either the sub-step of other steps or at least part in stage in turn or are handed over other steps
Alternately execute.
Fig. 8 is the structure diagram of the optical element detection device of one embodiment.As shown in figure 8, the device includes：
Image collection module 802, for obtaining infrared figure and speckle pattern, speckle pattern is the laser that light source generates in the projector
By being formed by image after optical element；
Zero level region acquisition module 804, the first zero level region and the first zero level for obtaining speckle pattern according to speckle pattern
The luminance mean value in region, zero level region are the maximum region of brightness；
First brightness detection module 806, for detecting first peripheral region of the speckle pattern around the first zero level region
Luminance mean value；
Second brightness detection module 808, for obtaining the first zero level region corresponding second in infrared figure with speckle pattern
The luminance mean value in zero level region, and the second peripheral region corresponding with the first peripheral region of speckle pattern luminance mean value；
Determination module 810 is used for the ratio when the luminance mean value in the first zero level region and the luminance mean value of the first peripheral region
When value is more than peripheral region ratio more than the first preset value and zero level area ratio, then optical element exception is judged；Wherein, zero level
Area ratio is the ratio of the luminance mean value in the first zero level region and the luminance mean value in the second zero level region, and peripheral region ratio is
The ratio of the luminance mean value of the luminance mean value of first peripheral region and the second peripheral region.
In one embodiment, zero level region acquisition module 804 can be also used for dissipating using the posting of default size
Traversal in the predeterminable area of spot figure, using the region where the maximum posting of luminance mean value as the first zero level area of speckle pattern
Domain.
In one embodiment, the first brightness detection module 806 can be also used for obtaining the first zero level region of speckle pattern
First quantity region of surrounding, determination module 810 are additionally operable to the luminance mean value when the first zero level region and the first quantity area
When the ratio of the luminance mean value in domain is all higher than the first preset value, then the luminance mean value and the first peripheral region in the first zero level region are judged
The ratio of the luminance mean value in domain is more than the first preset value.
In one embodiment, the first brightness detection module 806 can be also used for obtaining the first zero level area with speckle pattern
The horizontal distance and vertical range in domain are no more than 0 the first quantity region.
In one embodiment, the second brightness detection module 808 can be also used for being obtained and speckle pattern according to infrared figure
First zero level region and the first peripheral region corresponding second zero level region and the second peripheral region, detection the second zero level region and
The luminance mean value of second peripheral region.
In one embodiment, a kind of optical element detection device provided further includes 812 exception of exception processing module
It manages module to be used for when judging optical element exception, the frequency of abnormity of optical element is increased by 1.
In one embodiment, exception processing module 812 can be used for being more than default time when the frequency of abnormity of optical element
When number, forbid the use of the projector.
Above-mentioned optical element detection device can obtain the laser that light source generates in infrared figure and the projector and pass through optics member
It is formed by speckle pattern after part, the first zero level region of speckle pattern and corresponding first zero level regional luminance are obtained according to speckle pattern
Mean value, detection speckle pattern around the first zero level region first around luminance mean value, obtain in infrared figure with speckle pattern
The luminance mean value in the first zero level region and the first peripheral region corresponding second zero level region and the second peripheral region, when the 1st
The ratio of the luminance mean value of luminance mean value and first peripheral region in grade region be more than the first preset value and the first zero level region and
When the ratio of the luminance mean value in the second zero level region is more than the ratio of the luminance mean value of the first peripheral region and the second peripheral region,
Then judge optical element exception.Due to can be according to the zero level region of speckle pattern and the luminance mean value of peripheral region and infrared figure pair
The luminance mean value in the zero level region and peripheral region answered is detected optical element, can improve the accuracy of detection.
The division of modules is only used for for example, in other embodiments in above-mentioned optical element detection device, can
Optical element detection device is divided into different modules as required, with complete above-mentioned optical element detection device whole or
Partial function.
Specific about optical element detection device limits the limit that may refer to above for optical element detection method
Fixed, details are not described herein.Modules in above-mentioned optical element detection device can fully or partially through software, hardware and its
It combines to realize.Above-mentioned each module can be embedded in or in the form of hardware independently of in the processor in electronic equipment, can also be with
Software form is stored in the memory in electronic equipment, and the corresponding behaviour of the above modules is executed in order to which processor calls
Make.
The realization of modules in the optical element detection device provided in the embodiment of the present application can be computer program
Form.The computer program can be run in terminal or server.The program module that the computer program is constituted is storable in
On the memory of terminal or server.When the computer program is executed by processor, side described in the embodiment of the present application is realized
The step of method.
The embodiment of the present application also provides a kind of computer readable storage mediums.One or more is executable comprising computer
The non-volatile computer readable storage medium storing program for executing of instruction, when the computer executable instructions are executed by one or more processors
When so that the processor executes the step of optical element detection method.
A kind of computer program product including instruction, when run on a computer so that computer executes optics
Element testing method.
The embodiment of the present application also provides a kind of electronic equipment.Above-mentioned electronic equipment includes image processing circuit, at image
Managing circuit can utilize hardware and or software component to realize, it may include define ISP (Image Signal Processing, figure
As signal processing) the various processing units of pipeline.Fig. 9 is the schematic diagram of image processing circuit in one embodiment.Such as Fig. 9 institutes
Show, for purposes of illustration only, only showing the various aspects with the relevant image processing techniques of the embodiment of the present application.
As shown in figure 9, image processing circuit includes ISP processors 940 and control logic device 950.Imaging device 910 captures
Image data handled first by ISP processors 940, ISP processors 940 to image data analyzed with capture can be used for really
The image statistics of fixed and/or imaging device 910 one or more control parameters.Imaging device 910 may include thering is one
The camera of a or multiple lens 912 and imaging sensor 914.Imaging sensor 914 may include colour filter array (such as
Bayer filters), imaging sensor 914 can obtain the luminous intensity captured with each imaging pixel of imaging sensor 914 and wavelength
Information, and the one group of raw image data that can be handled by ISP processors 940 is provided.Sensor 920 (such as gyroscope) can be based on passing
The parameter (such as stabilization parameter) of the image procossing of acquisition is supplied to ISP processors 940 by 920 interface type of sensor.Sensor 920
Interface can utilize SMIA (Standard Mobile Imaging Architecture, Standard Mobile Imager framework) interface,
The combination of other serial or parallel camera interfaces or above-mentioned interface.
In addition, raw image data can be also sent to sensor 920 by imaging sensor 914, sensor 920 can be based on passing
920 interface type of sensor is supplied to ISP processors 940 or sensor 920 to deposit raw image data raw image data
It stores up in video memory 930.
ISP processors 940 handle raw image data pixel by pixel in various formats.For example, each image pixel can
Bit depth with 8,10,12 or 14 bits, ISP processors 940 can carry out raw image data at one or more images
Reason operation, statistical information of the collection about image data.Wherein, image processing operations can be by identical or different bit depth precision
It carries out.
ISP processors 940 can also receive image data from video memory 930.For example, 920 interface of sensor will be original
Image data is sent to video memory 930, and the raw image data in video memory 930 is available to ISP processors 940
It is for processing.Video memory 930 can be independent special in a part, storage device or electronic equipment for memory device
With memory, and it may include DMA (Direct Memory Access, direct direct memory access (DMA)) feature.
When receiving from 914 interface of imaging sensor or from 920 interface of sensor or from video memory 930
When raw image data, ISP processors 940 can carry out one or more image processing operations, such as time-domain filtering.Treated schemes
As data can be transmitted to video memory 930, to carry out other processing before shown.ISP processors 940 are from image
Memory 930 receives processing data, and is carried out in original domain and in RGB and YCbCr color spaces to the processing data
Image real time transfer.Treated that image data may be output to display 970 for ISP processors 940, for user's viewing and/or
It is further processed by graphics engine or GPU (Graphics Processing Unit, graphics processor).In addition, ISP processors
940 output also can be transmitted to video memory 930, and display 970 can read image data from video memory 930.?
In one embodiment, video memory 930 can be configured as realizing one or more frame buffers.In addition, ISP processors 940
Output can be transmitted to encoder/decoder 960, so as to encoding/decoding image data.The image data of coding can be saved,
And it is decompressed before being shown in 970 equipment of display.Encoder/decoder 960 can be real by CPU or GPU or coprocessor
It is existing.
The statistical data that ISP processors 940 determine, which can be transmitted, gives control logic device Unit 950.For example, statistical data can wrap
Include the image sensings such as automatic exposure, automatic white balance, automatic focusing, flicker detection, black level compensation, 912 shadow correction of lens
914 statistical information of device.Control logic device 950 may include the processor and/or micro-control that execute one or more routines (such as firmware)
Device processed, one or more routines can determine the control parameter and ISP processors of imaging device 910 according to the statistical data of reception
940 control parameter.For example, the control parameter of imaging device 910 may include 920 control parameter of sensor (such as gain, exposure
The time of integration, stabilization parameter of control etc.), camera flash control parameter, 912 control parameter of lens (such as focus or zoom
With focal length) or these parameters combination.ISP control parameters may include for automatic white balance and color adjustment (for example, in RGB
During processing) 912 shadow correction parameter of gain level and color correction matrix and lens.
In the embodiment of the present application, the application is realized when which executes the computer program of storage on a memory
In embodiment the step of optical element detection method.
Used in this application may include to any reference of memory, storage, database or other media is non-volatile
And/or volatile memory.Suitable nonvolatile memory may include read-only memory (ROM), programming ROM (PROM),
Electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include arbitrary access
Memory (RAM), it is used as external cache.By way of illustration and not limitation, RAM is available in many forms, such as
It is static RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDR SDRAM), enhanced
SDRAM (ESDRAM), synchronization link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM
(RDRAM), direct memory bus dynamic ram (DRDRAM) and memory bus dynamic ram (RDRAM).
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
Cannot the limitation to the application the scope of the claims therefore be interpreted as.It should be pointed out that for those of ordinary skill in the art
For, under the premise of not departing from the application design, various modifications and improvements can be made, these belong to the guarantor of the application
Protect range.Therefore, the protection domain of the application patent should be determined by the appended claims.
Claims (10)
1. a kind of optical element detection method, the method includes：
Infrared figure and speckle pattern are obtained, the speckle pattern is the laser of light source generation in the projector by being formed after optical element
Image；
Obtain the first zero level region of the speckle pattern and the luminance mean value in the first zero level region according to the speckle pattern, described zero
Grade region is the maximum region of brightness；
Detect the luminance mean value of first peripheral region of the speckle pattern around first zero level region；
The luminance mean value for obtaining the first zero level region corresponding second zero level region in the infrared figure with the speckle pattern, with
And the luminance mean value of the second peripheral region corresponding with the first peripheral region of the speckle pattern；
When the ratio of the luminance mean value of the luminance mean value and first peripheral region in first zero level region is more than first in advance
If value and when zero level area ratio is more than peripheral region ratio, then judge that the optical element is abnormal；Wherein, the zero level region
Ratio is the ratio of the luminance mean value in first zero level region and the luminance mean value in the second zero level region, the peripheral region ratio
It is worth the ratio for the luminance mean value of first peripheral region and the luminance mean value of the second peripheral region.
2. according to the method described in claim 1, it is characterized in that, described obtain the of the speckle pattern according to the speckle pattern
The luminance mean value in one zero level region and the first zero level region, the zero level region are the maximum region of brightness, including：
It is traversed in the predeterminable area of the speckle pattern using the posting of default size；
Using the region where the maximum posting of luminance mean value as the first zero level region of the speckle pattern.
3. according to the method described in claim 1, it is characterized in that, the method further includes：
Obtain the first quantity region around the first zero level region of the speckle pattern；
When the ratio of the luminance mean value of the luminance mean value and first quantity region in first zero level region is all higher than
When one preset value, then the ratio of the luminance mean value in first zero level region and the luminance mean value of first peripheral region is judged
More than the first preset value.
4. according to the method described in claim 3, it is characterized in that, around the first zero level region for obtaining the speckle pattern
The first quantity region, including：
Obtain the first quantity area no more than 0 with the horizontal distance in the first zero level region of the speckle pattern and vertical range
Domain.
5. according to the method described in claim 1, it is characterized in that, described obtain the first of the infrared figure and the speckle pattern
The luminance mean value of the luminance mean value and the second peripheral region in zero level region and the first peripheral region corresponding second zero level region, packet
It includes：
The second zero level corresponding with the first zero level region of the speckle pattern and the first peripheral region is obtained according to the infrared figure
Region and the second peripheral region；
Detect the luminance mean value in second zero level region and the second peripheral region.
6. according to the method described in claim 1, it is characterized in that, the method further includes：
When judging the optical element exception, the frequency of abnormity of the optical element is increased by 1.
7. according to the method described in claim 6, it is characterized in that, the method further includes：
When the frequency of abnormity of the optical element is more than preset times, forbid the use to the projector.
8. a kind of optical element detection device, which is characterized in that described device includes：
Image collection module, for obtaining infrared figure and speckle pattern, the speckle pattern is that the laser that light source generates in the projector is logical
It is formed by image after crossing optical element；
Zero level region acquisition module, the first zero level region and the first zero level for obtaining the speckle pattern according to the speckle pattern
The luminance mean value in region, the zero level region are the maximum region of brightness；
First brightness detection module, for detecting first peripheral region of the speckle pattern around first zero level region
Luminance mean value；
Second brightness detection module, for obtaining the first zero level region corresponding second in the infrared figure with the speckle pattern
The luminance mean value in zero level region, and the brightness of the second peripheral region corresponding with the first peripheral region of the speckle pattern are equal
Value；
Determination module, the ratio of the luminance mean value for the luminance mean value and first peripheral region when first zero level region
When value is more than peripheral region ratio more than the first preset value and zero level area ratio, then judge that the optical element is abnormal；Wherein,
The zero level area ratio is the ratio of the luminance mean value in first zero level region and the luminance mean value in the second zero level region, institute
State the ratio of the luminance mean value around the luminance mean value and second that peripheral region ratio is first peripheral region.
9. a kind of electronic equipment, including memory and processor, the memory are stored with computer program, which is characterized in that
The processor realizes the step of any one of claim 1 to 7 the method when executing the computer program.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of method described in any one of claim 1 to 7 is realized when being executed by processor.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810403817.1A CN108716982B (en) | 2018-04-28 | 2018-04-28 | Optical element detection method, optical element detection device, electronic equipment and storage medium |
| PCT/CN2019/075386 WO2019174435A1 (en) | 2018-03-12 | 2019-02-18 | Projector and test method and device therefor, image acquisition device, electronic device, readable storage medium |
| EP19736569.5A EP3567851A4 (en) | 2018-03-12 | 2019-02-18 | Projector and test method and device therefor, image acquisition device, electronic device, readable storage medium |
| TW108108335A TWI696391B (en) | 2018-03-12 | 2019-03-12 | Projector, detection method and detection device thereof, image capturing device, electronic device, and computer readable storage medium |
| US16/684,299 US11348217B2 (en) | 2018-03-12 | 2019-11-14 | Projector, detection method thereof, and electronic device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810403817.1A CN108716982B (en) | 2018-04-28 | 2018-04-28 | Optical element detection method, optical element detection device, electronic equipment and storage medium |
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| CN108716982A true CN108716982A (en) | 2018-10-30 |
| CN108716982B CN108716982B (en) | 2020-01-10 |
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