CN108693406B - Method and system for calculating impedance parameters of high-voltage transmission cable of X-ray generating device - Google Patents
Method and system for calculating impedance parameters of high-voltage transmission cable of X-ray generating device Download PDFInfo
- Publication number
- CN108693406B CN108693406B CN201710235206.6A CN201710235206A CN108693406B CN 108693406 B CN108693406 B CN 108693406B CN 201710235206 A CN201710235206 A CN 201710235206A CN 108693406 B CN108693406 B CN 108693406B
- Authority
- CN
- China
- Prior art keywords
- tube
- ray
- transmission cable
- calculating
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- X-Ray Techniques (AREA)
Abstract
The invention provides a method and a system for calculating impedance parameters of a high-voltage transmission cable of an X-ray generating device. According to one embodiment, the X-ray generating device comprises an X-ray bulb tube and a sampling resistor, and the method for calculating the impedance parameter of the high-voltage transmission cable of the X-ray generating device comprises the following steps: 1) reducing the cathode heating current of the X-ray bulb tube to a set threshold value; 2) carrying out short-time high-pressure loading on the X-ray bulb tube; 3) collecting tube voltage U of the X-ray bulb tubekvAnd a current I flowing through the sampling resistormA(ii) a And 4) utilizing the tube voltage UkvAnd the current ImAAnd calculating the impedance parameter of the high-voltage transmission cable. The method and the system provided by the invention can improve the measurement precision.
Description
Technical Field
The invention relates to the technical field of medical instruments, in particular to a method and a system for calculating impedance parameters of a high-voltage transmission cable of an X-ray generating device.
Background
The high-voltage cable is a special cable widely applied to high-voltage transmission, and in a high-frequency and high-voltage working environment, the high-voltage cable can show a conductive resistance characteristic, and a parasitic capacitance effect between a high-voltage conductor and a cable shielding layer can also influence the transmission of high voltage and current.
At present, the parasitic parameters of the high-voltage cable are mainly obtained through data listed in a product manual provided by a manufacturer, and are estimated and compensated through experiments, and the method has the following defects: when the consistency of the cable product is poor, the error obtained by the method is large; in addition, the parasitic parameters of the tube voltage and tube current sampling circuit cannot be included in the actual calculation, and it is difficult to optimize the transient characteristics of the tube voltage and tube current using the obtained data.
Disclosure of Invention
In view of the above, the present invention provides a scheme for obtaining actual parasitic parameters of a high-voltage cable in order to make it possible to optimize the tube voltage and the tube current waveform of a bulb in an X-ray generation device.
The invention provides a method for calculating impedance parameters of a high-voltage transmission cable of an X-ray generating device on one hand and a system for calculating the impedance parameters of the high-voltage transmission cable of the X-ray generating device on the other hand.
According to one embodiment, the X-ray generating device comprises an X-ray bulb tube and a sampling resistor, and the method for calculating the impedance parameter of the high-voltage transmission cable of the X-ray generating device comprises the following steps: 1) reducing the cathode heating current of the X-ray bulb tube to a set threshold value; 2) carrying out short-time high-pressure loading on the X-ray bulb tube; 3) collecting tube voltage U of the X-ray bulb tubekvAnd a current I flowing through the sampling resistormA(ii) a And 4) utilizing the tube voltage UkvAnd the current ImAAnd calculating the impedance parameter of the high-voltage transmission cable.
Wherein the set threshold may be zero.
Wherein the high pressure loading time for the X-ray tube may not exceed 10 ms.
Wherein the tube voltage U can be collected digitally at equal intervalskvAnd the current ImA。
Wherein the method may further comprise repeating steps 2) -4) at different high voltages and obtaining the high voltage transmission cable impedance parameter by iterative calculation.
Wherein the impedance parameter Z of the high-voltage transmission cable can be iteratively calculated by the following formular(z)：
Wherein the parameter b0-bmAnd a1-anThe following formula is satisfied:
Ukv(kT)+a1Ukv[(k-1)T]+a2Ukv[(k-2)T]+…+anUkv[(k-n)T]＝b0ImA(kT)+b1ImA[(k-1)T]+…+bmImA[(k-m)T]。
according to another embodiment, the X-ray generating device comprises an X-ray bulb tube and a sampling resistor, and the impedance parameter calculation system of the high-voltage transmission cable of the X-ray generating device comprises: a setting device for heating the cathode of the X-ray bulb tubeThe current decreases to a set threshold; the pressurizing device is used for carrying out short-time high-pressure loading on the X-ray bulb tube; a collecting device for collecting tube voltage U of the X-ray bulb tubekvAnd a current I flowing through the sampling resistormA(ii) a And a computing device for utilizing the tube voltage UkvAnd the current ImAAnd calculating the impedance parameter of the high-voltage transmission cable.
Wherein the set threshold may be zero.
Wherein the high pressure loading time for the X-ray tube may not exceed 10 ms.
Wherein, the collecting device can collect the tube voltage U in a digital equal interval modekvAnd the current ImA。
The pressurizing device can perform short-time high-voltage loading on the X-ray bulb tube at different high voltages, and the acquisition device acquires different tube voltages U of the X-ray bulb tube under different high voltageskvAnd a different current I flowing through the sampling resistormASaid computing means being adapted to utilize said different tube voltages UkvAnd said different currents ImAAnd iteratively calculating the impedance parameter of the high-voltage transmission cable.
Wherein the calculation device can iteratively calculate the impedance parameter Z of the high-voltage transmission cable by the following formular(z)：
Wherein the parameter b0-bmAnd a1-anThe following formula is satisfied:
Ukv(kT)+a1Ukv[(k-1)T]+a2Ukv[(k-2)T]+…+anUkv[(k-n)T]＝b0ImA(kT)+b1ImA[(k-1)T]+…+bmImA[(k-m)T]。
the impedance characteristic of the currently used high-voltage cable can be obtained through measurement and calculation, and the tube voltage and the tube current obtained through sampling of the sampling resistor can be compensated under the condition that the distribution parameters of the high-voltage cable are known, so that the measurement accuracy is improved.
Drawings
The above and other features and advantages of the present invention will become more apparent to those of ordinary skill in the art by describing in detail embodiments thereof with reference to the attached drawings in which:
fig. 1 is a schematic equivalent circuit diagram of a high-voltage rectification transmission system of an X-ray generation device according to an embodiment of the invention.
Fig. 2 is another equivalent circuit diagram of the high-voltage rectification transmission system of the X-ray generation device according to an embodiment of the invention.
Fig. 3 is a schematic flow chart of a method for calculating impedance parameters of a high-voltage transmission cable of an X-ray generation device according to an embodiment of the invention.
Fig. 4 is a schematic block diagram of a system for calculating an impedance parameter of a high voltage transmission cable of an X-ray generation apparatus according to an embodiment of the present invention.
Wherein the reference numbers are as follows:
100. 200 equivalent circuit
101X-ray bulb tube
Zrs, Zrp equivalent impedance
Cs filter capacitor
ImA、Irp、ItubeElectric current
Rs sampling resistor
US、UkVVoltage of
300 high-voltage transmission cable impedance parameter calculation method
S310-S340 steps
400 high-voltage transmission cable impedance parameter calculation system
410 setting device
420 pressure device
430 collecting device
440 computing device
Detailed Description
In order to more clearly understand the technical features, objects, and effects of the present invention, embodiments of the present invention will now be described with reference to the accompanying drawings, in which like reference numerals refer to like parts throughout.
"exemplary" means "serving as an example, instance, or illustration" herein, and any illustration, embodiment, or steps described as "exemplary" herein should not be construed as a preferred or advantageous alternative.
For the sake of simplicity, the drawings only schematically show the parts relevant to the present invention, and they do not represent the actual structure as a product. In addition, in order to make the drawings concise and understandable, components having the same structure or function in some of the drawings are only schematically illustrated or only labeled.
In this document, "a" or "an" means not only "but also" more than one ". In this document, "first", "second", and the like are used only for distinguishing one from another, and do not indicate the degree of importance and order thereof, and the premise that each other exists, and the like.
To illustrate the principles of the present invention, reference is first made to FIG. 1. Fig. 1 is a schematic equivalent circuit diagram of a high-voltage rectification transmission system of an X-ray generation device according to an embodiment of the invention. In the prior art in the field, the tube current value of the X-ray tube 101 is calculated by measuring the voltage value of the sampling resistor Rs without considering the influence of the high voltage cable. However, as mentioned above, parasitic capacitive effects between the high voltage conductor and the cable shield can affect the transmission of high voltage and current. Therefore, in order to further improve the measurement accuracy, the invention provides a technical scheme capable of measuring and calculating the impedance characteristic of the currently used high-voltage cable.
In particular, the parasitic parameters of the high-voltage cable, which is used as a medium for transmitting the voltage and current generated by the high-voltage generator to the X-ray bulb tube, can be mainly divided into series equivalent impedance ZrsAnd a parallel equivalent impedance Zrp. As shown in fig. 1, the equivalent circuit 100 includes a tube current sampling resistor Rs, a filter capacitor Cs, a series equivalent impedance Zrs and a parallel equivalent impedance Zrp of the high voltage cable, and an X-ray tube 101. Wherein Us is the voltage across the current sampling resistor Rs, ImAFor the current flowing through the current sampling resistor Rs, IrpFor the current flowing in the high-voltage cable parallel equivalent impedance Zrp, ItubeFor the actual current flowing through the X-ray tube 101, UkvIs the true tube voltage of the X-ray tube 101.
When the current of the path of the X-ray tube 101 is small enough to be negligible (e.g., the path of the X-ray tube 101 is in a high impedance state), the equivalent circuit 100 shown in fig. 1 can be equivalent to the equivalent circuit 200 shown in fig. 2. Referring to fig. 2, fig. 2 is another equivalent circuit diagram of the high-voltage rectification transmission system of the X-ray generation device according to an embodiment of the invention. As shown in fig. 2, in the equivalent circuit 200, the X-ray tube has been omitted equivalently. At this time, since the high voltage cable is the only payload, ImA＝Irp，UkvIs the value of the voltage applied to the high voltage cable. The following formula must be satisfied in the continuous frequency domain:
[Zrs(s)+Zrp(s)]*ImA(s)＝Zr(s)*ImA(s)＝Ukv(s)。
by the pair ImAAnd UkvThe transient waveform is subjected to equally-spaced discrete sampling and calculation, and the impedance characteristic of the high-voltage cable can be expressed in the form of a differential equation.
With reference to fig. 3, a method for calculating impedance parameters of a high-voltage transmission cable of an X-ray generating device according to the present invention is described. Fig. 3 is a schematic flow chart of a method for calculating impedance parameters of a high-voltage transmission cable of an X-ray generation device according to an embodiment of the present invention, and in the embodiment shown in fig. 3, the method 300 for calculating impedance parameters of a high-voltage transmission cable of an X-ray generation device may include the following steps:
step S310: reducing the cathode heating current of the X-ray bulb tube to a set threshold value;
step S320: carrying out short-time high-pressure loading on the X-ray bulb tube;
step S330: tube voltage U of X-ray bulb tube is collectedkvAnd a current I flowing through the sampling resistormA(ii) a And
step S340: using tube voltage UkvAnd current ImAAnd calculating the impedance parameter of the high-voltage transmission cable.
According to the characteristics of the X-ray bulb tube, when the heating current of the filament of the bulb tube is lower than a certain limit value, the filament can not emit hot electrons, and the tube current can not be generated even if high voltage is loaded on the bulb tube. At this time, the X-ray tube can be equivalently ignored due to the high impedance state. Thus, in practice, the set threshold in step S310 may be zero. I.e. the cathode heating current of the X-ray tube is reduced to zero.
In a variant, the X-ray tube is pressurized for a short time in step S320, and the person skilled in the art can set the duration of the high-pressure loading according to actual needs, for example, the time for the high-pressure loading on the X-ray tube may not exceed 10 ms. In addition, the tube current is not closed loop controlled during high voltage loading.
In practice, the tube voltage U can be collected in a digitized and equally spaced manner by an A/D conversion device (e.g. an A/D chip)kvAnd a current I flowing through the sampling resistormA。
In other embodiments, the method may further include repeating steps S320-S340 at different high voltages and obtaining the high voltage transmission cable impedance parameter by iterative calculations. For example, the impedance parameter Z of the high voltage transmission cable may be iteratively calculated by the following formular(z)：
Wherein the parameter b0-bmAnd a1-anThe following formula is satisfied:
Ukv(kT)+a1inkv[(k-1)T]+a2Ukv[(k-2)T]+…+anUkv[(k-n)T]＝b0ImA(kT)+b1ImA[(k-1)T]+…+bmImA[(k-m)T]。
Those skilled in the art should understand and correctly apply the above iterative formula, and the relevant contents do not belong to the focus of the present invention, so they are not described herein. For example, the following references may be referred to by those skilled in the art to assist in understanding the above iterative equations and their applications: the document "A New modeling method for the Switching Power Converter (a New modeling method for the Switching Power Converter)" proposed by Weiping Wang, Yujie Shi and Dianbing Yang and published in 2008 on IEEE (DOI:10.1109/PEITS. 2008.117).
The following describes a system for calculating impedance parameters of a high-voltage transmission cable of an X-ray generating device according to the present invention with reference to fig. 4. Fig. 4 is a schematic block diagram of a high-voltage transmission cable impedance parameter calculation system of an X-ray generation apparatus according to an embodiment of the present invention, in the embodiment shown in fig. 4, the X-ray generation apparatus includes an X-ray bulb and a sampling resistor (not shown), and the high-voltage transmission cable impedance parameter calculation system 400 of the X-ray generation apparatus includes a setting device 410, a pressurizing device 420, a collecting device 430, and a calculation device 440.
Wherein, the setting device 410 is used for reducing the cathode heating current of the X-ray bulb tube to a set threshold value, the pressurizing device 420 is used for carrying out short-time high-voltage loading on the X-ray bulb tube, and the collecting device 430 is used for collecting the tube voltage U of the X-ray bulb tubekvAnd a current I flowing through the sampling resistormAAnd a computing device 440 for utilizing the tube voltage UkvAnd current ImAAnd calculating the impedance parameter of the high-voltage transmission cable.
In an embodiment, the set threshold may be zero, i.e. the cathode heating current of the X-ray tube may be reduced to zero by the setting means 410. The time for the pressurizing device 420 to apply high pressure to the X-ray tube may not exceed 10 ms. In addition, the tube current is not closed loop controlled during high voltage loading.
In practice, the collection device 430 may collect the tube voltage U in a digitized equally spaced mannerkvAnd current ImAFor example, an a/D conversion device (e.g., an a/D chip) may be disposed in the acquisition device to complete the acquisition of the related data.
The pressurizing device 420 can apply different high voltages to the X-ray tube for a short time and with high voltage, and the collecting device 430 collects different tube voltages U of the X-ray tube under different high voltageskvAnd a different current I flowing through the sampling resistormAThereby obtaining a plurality of sets of voltage and current samples, respectively, such that the computing device 440 can utilize different tube voltages UkvAnd different currents ImAAnd iteratively calculating the impedance parameters of the high-voltage transmission cable.
For example, the calculating device 440 may iteratively calculate the impedance parameter Z of the high voltage transmission cable by the following formular(z)：
Wherein the parameter b0-bmAnd a1-anThe following formula is satisfied:
Ukv(kT)+a1Ukv[(k-1)T]+a2Ukv[(k-2)T]+…+anUkv[(k-n)T]＝b0ImA(kT)+b1ImA[(k-1)T]+…+bmImA[(k-m)T]。
the invention provides a scheme capable of obtaining the impedance characteristics of a currently used high-voltage cable by measuring and calculating aiming at an X-ray generating device, and particularly provides a method and a system for calculating the impedance parameters of a high-voltage transmission cable of the X-ray generating device. According to one embodiment, the X-ray generating device comprises an X-ray bulb tube and a sampling resistor, and the method for calculating the impedance parameter of the high-voltage transmission cable of the X-ray generating device comprises the following steps: 1) reducing the cathode heating current of the X-ray bulb tube to a set threshold value; 2) carrying out short-time high-pressure loading on the X-ray bulb tube; 3) collecting tube voltage U of the X-ray bulb tubekvAnd a current I flowing through the sampling resistormA(ii) a And 4) utilizing the tube voltage UkvAnd the current ImAAnd calculating the impedance parameter of the high-voltage transmission cable. Therefore, the method and the system provided by the invention can compensate the tube voltage and the tube current sampled by the sampling resistor under the condition that the distribution parameters of the high-voltage cable are known, thereby improving the measurement accuracy.
The above description is only exemplary of the present invention and should not be taken as limiting the invention, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (12)
1. A method for calculating impedance parameters of a high-voltage transmission cable of an X-ray generating device, wherein the X-ray generating device comprises an X-ray bulb tube and a sampling resistor, and the method comprises the following steps:
1) reducing the cathode heating current of the X-ray bulb tube to a set threshold value;
2) carrying out short-time high-pressure loading on the X-ray bulb tube;
3) collecting tube voltage U of the X-ray bulb tubekvAnd a current I flowing through the sampling resistormA(ii) a And
4) using said tube voltage UkvAnd the current ImAAnd calculating the impedance parameter of the high-voltage transmission cable.
2. The method of calculating the impedance parameter of the high voltage transmission cable of the X-ray generation apparatus according to claim 1, wherein the set threshold is zero.
3. The method of calculating the impedance parameters of a high voltage transmission cable of an X-ray generation device according to claim 1, wherein the high voltage loading time on the X-ray tube is not more than 10 ms.
4. The method of claim 1, wherein the tube voltage U is collected digitally at equal intervalskvAnd the current ImA。
5. The method of calculating the impedance parameter of the high voltage transmission cable of the X-ray generation apparatus as set forth in claim 1, further comprising repeating steps 2) to 4) at different high voltages, and obtaining the impedance parameter of the high voltage transmission cable by iterative calculation.
6. The method of claim 5, wherein the impedance Z of the high voltage transmission cable is calculated iteratively by the formular(z)：
Wherein the parameter b0-bmAnd a1-anThe following formula is satisfied:
Ukv(kT)+a1Ukv[(k-1)T]+a2Ukv[(k-2)T]+…+anUkv[(k-n)T]＝b0ImA(kT)+b1ImA[(k-1)T]+…+bmImA[(k-m)T]。
7. a system for calculating impedance parameters of a high-voltage transmission cable of an X-ray generating device, wherein the X-ray generating device comprises an X-ray bulb tube and a sampling resistor, and the system comprises:
the setting device is used for reducing the cathode heating current of the X-ray bulb tube to a set threshold value;
the pressurizing device is used for carrying out short-time high-pressure loading on the X-ray bulb tube;
a collecting device for collecting tube voltage U of the X-ray bulb tubekvAnd a current I flowing through the sampling resistormA(ii) a And
a computing device for utilizing the tube voltage UkvAnd the current ImAAnd calculating the impedance parameter of the high-voltage transmission cable.
8. The system for calculating the impedance parameter of a high voltage transmission cable of an X-ray generation device according to claim 7, wherein the set threshold is zero.
9. The system for calculating impedance parameters of a high voltage transmission cable of an X-ray generation device according to claim 7, wherein the time for high voltage loading of the X-ray tube by the pressurizing device is not more than 10 ms.
10. The system of claim 7, wherein the acquisition device acquires the tube voltage U in a digitized equally spaced mannerkvAnd the current ImA。
11. The system of claim 7, wherein the pressurizing device applies short-term high voltage to the X-ray tube at different high voltages, and the collecting device collects different tube voltages U of the X-ray tube at different high voltageskvAnd a different current I flowing through the sampling resistormASaid computing means using said different tube voltages UkvAnd said different currents ImAAnd iteratively calculating the impedance parameter of the high-voltage transmission cable.
12. The system for calculating the impedance parameter of a high voltage transmission cable of an X-ray generating device according to claim 11, wherein the calculating means iteratively calculates the impedance parameter Z of the high voltage transmission cable by the following formular(z)：
Wherein the parameter b0-bmAnd a1-anThe following formula is satisfied:
Ukv(kT)+a1Ukv[(k-1)T]+a2Ukv[(k-2)T]+…+anUkv[(k-n)T]＝b0ImA(kT)+b1ImA[(k-1)T]+…+bmImA[(k-m)T]。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710235206.6A CN108693406B (en) | 2017-04-12 | 2017-04-12 | Method and system for calculating impedance parameters of high-voltage transmission cable of X-ray generating device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710235206.6A CN108693406B (en) | 2017-04-12 | 2017-04-12 | Method and system for calculating impedance parameters of high-voltage transmission cable of X-ray generating device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108693406A CN108693406A (en) | 2018-10-23 |
| CN108693406B true CN108693406B (en) | 2020-08-25 |
Family
ID=63843496
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710235206.6A Active CN108693406B (en) | 2017-04-12 | 2017-04-12 | Method and system for calculating impedance parameters of high-voltage transmission cable of X-ray generating device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108693406B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1509491A (en) * | 2001-01-26 | 2004-06-30 | 索尼公司 | Electron gun, cathode ray tube and image display unit |
| CN1682577A (en) * | 2002-09-09 | 2005-10-12 | 株式会社日立医药 | X-ray generator and x-ray CT apparatus comprising same |
| CN101680922A (en) * | 2007-02-27 | 2010-03-24 | Osi软件公司 | Impedance measurement of a power line |
| CN103163422A (en) * | 2011-12-15 | 2013-06-19 | 西安华傲通讯技术有限责任公司 | Device for searching fault points of cable or pipeline |
| CN103338429A (en) * | 2013-06-25 | 2013-10-02 | 歌尔声学股份有限公司 | Device and method for measuring impedance of loudspeaker |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201109696A (en) * | 2009-09-11 | 2011-03-16 | Chroma Ate Inc | Electronic load capable of simulating LED characteristics and simulation method of same |
-
2017
- 2017-04-12 CN CN201710235206.6A patent/CN108693406B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1509491A (en) * | 2001-01-26 | 2004-06-30 | 索尼公司 | Electron gun, cathode ray tube and image display unit |
| CN1682577A (en) * | 2002-09-09 | 2005-10-12 | 株式会社日立医药 | X-ray generator and x-ray CT apparatus comprising same |
| CN101680922A (en) * | 2007-02-27 | 2010-03-24 | Osi软件公司 | Impedance measurement of a power line |
| CN103163422A (en) * | 2011-12-15 | 2013-06-19 | 西安华傲通讯技术有限责任公司 | Device for searching fault points of cable or pipeline |
| CN103338429A (en) * | 2013-06-25 | 2013-10-02 | 歌尔声学股份有限公司 | Device and method for measuring impedance of loudspeaker |
Non-Patent Citations (1)
| Title |
|---|
| 直流微电网节点阻抗特性与系统稳定性分析;刘晓东等;《电网技术》;20151231;第39卷(第12期);第3463-3469页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108693406A (en) | 2018-10-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Lee et al. | Measurement and processing of fast pulsed discharge current in plasma focus machines | |
| JP2015219116A (en) | Calibration method of electric charge density in space-charge distribution measurement | |
| EP3325983B1 (en) | System for measuring the voltage of a conductor | |
| Haberman et al. | Noncontact AC voltage measurements: Error and noise analysis | |
| Bassi et al. | Early prediction of surge arrester failures by dielectric characterization | |
| US9264154B1 (en) | Dynamic range enhancement of high-speed electrical signal data via non-linear compression | |
| CN108693406B (en) | Method and system for calculating impedance parameters of high-voltage transmission cable of X-ray generating device | |
| WO2019078079A1 (en) | Radiation imaging device, operation method therefor, and program | |
| Kapisch et al. | Spectral variation-based signal compression technique for gapless power quality waveform recording in smart grids | |
| Mendes et al. | PLL based method for supraharmonics emission assessment | |
| CN108761184B (en) | Iron tower potential distribution and impedance characteristic testing method based on lightning impulse | |
| KR101130260B1 (en) | System for measuring ground impedance in high frequency band | |
| Luijendijk et al. | Comparison of three devices for measuring the second derivative of a Langmuir probe curve | |
| Akeboshi et al. | Wideband noncontact voltage measurement for EMC applications: Design and implementation | |
| Mujčić et al. | Corona noise on a 400 kV overhead power line: Measurements and computer modeling | |
| Gafvert et al. | Modelling of partial discharge spectra measured with variable applied frequency | |
| Egorov | Note: Numerical simulation and experimental validation of accelerating voltage formation for a pulsed electron accelerator | |
| Khodsuz et al. | A modified time-delay addition method to extract resistive leakage current of MOSA | |
| Freye et al. | Model‐based accuracy enhancements for guarded conductivity measurements: determination of effective electrode areas utilising numerical field simulation | |
| KR101031782B1 (en) | Evaluation method of high voltage generation and recording medium thereof | |
| JP5505185B2 (en) | Lightning impulse withstand voltage test system, reference waveform calculation program, and lightning impulse withstand voltage test method | |
| CN108693394B (en) | Tube current calculation method and device of X-ray bulb tube | |
| CN111579909B (en) | Method for measuring stable relaxation polarizability and electric field characteristic of nonlinear insulating dielectric medium | |
| JP2012037448A (en) | Thunder impulse withstand voltage test system, reference waveform calculation program, and thunder impulse withstand voltage test method | |
| US2481589A (en) | Measuring of high-frequency power |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |