CN108663119A - A kind of Spectral line bend correction system of VPH transmission-types spectrometer - Google Patents
A kind of Spectral line bend correction system of VPH transmission-types spectrometer Download PDFInfo
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- CN108663119A CN108663119A CN201810817928.7A CN201810817928A CN108663119A CN 108663119 A CN108663119 A CN 108663119A CN 201810817928 A CN201810817928 A CN 201810817928A CN 108663119 A CN108663119 A CN 108663119A
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- vph
- spectral line
- spectrometer
- entrance slit
- line bend
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- 230000003595 spectral effect Effects 0.000 title claims abstract description 33
- 238000012937 correction Methods 0.000 title abstract description 9
- 230000003287 optical effect Effects 0.000 claims abstract description 26
- 238000003384 imaging method Methods 0.000 claims abstract description 9
- 239000000571 coke Substances 0.000 claims 1
- 238000013461 design Methods 0.000 abstract description 6
- 238000000034 method Methods 0.000 abstract description 6
- 238000012545 processing Methods 0.000 abstract description 4
- 238000005452 bending Methods 0.000 abstract description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000001237 Raman spectrum Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 210000002381 plasma Anatomy 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 230000033772 system development Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0297—Constructional arrangements for removing other types of optical noise or for performing calibration
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The invention discloses a kind of Spectral line bends of VPH transmission-types spectrometer to correct system, and system includes entrance slit, collimation lens set, VPH gratings, focus lens group and CCD.Incident light enters VPH transmission-type spectrometers through entrance slit, is collimated by collimation lens set, is then divided through VPH optical grating diffractions, and diffraction light focus lamp focuses to CCD imaging units.The present invention is directed to specific optical system, designs a curved slit by calculating, the Spectral line bend that whole system is brought is compensated using bending entrance slit, to realize the correction to spectral instrument Spectral line bend.The simple light velocity of this method is effective, does not interfere with the performance of instrument, will not increase additional data processing load to user, and the Spectral line bend of spectrometer is solved the problems, such as from the source that system designs, can be used for actually detected demand.
Description
Technical field
The present invention relates to spectral technique field more particularly to a kind of Spectral line bend bearing calibrations of VPH transmission-types spectrometer.
Background technology
Imaging spectrometer be it is a kind of be used for obtaining the instrument of target two-dimensional space information and spectral information, every field all
It is widely used.Volume holographic grating (VPH) has maximum diffraction efficiency relative to conventional reflective diffraction gratings
Extremely low stray light, using the imaging spectrometer of VPH grating combination lens system developments, relative to other imaging spectrometers
Speech has higher image quality and detection efficient, and application is also more and more extensive, such as the D α plasmas in detection ITER
Spectrum, Raman spectrum detection etc..
However for imaging spectrometer, due to the optical characteristics of itself, the light come out from entrance slit is caused to be imaged onto
It is being not a vertical line after CCD is upper, in the hot spot for deviateing center position and is deviateing original main optical path, spectral line is caused to present
Go out bending.This Spectral line bend can not only influence the spectral resolution and spatial resolution of system, but also can be to the data of user
Processing causes prodigious trouble.For this Spectral line bend, traditional method is to carry out wavelength mark to each row of area array CCD
It is fixed, to obtain the wavelength information of each pixel in entire surface array area domain, or the calibration public affairs by demarcating several row in interval that are connected
Formula obtains the wavelength information in entire surface array area domain by difference, but this method all cannot fundamentally correct Spectral line bend,
Also have and correct Spectral line bend by way of increasing prism grating, but prism grating cost is too expensive, is unfavorable for promoting.
Invention content
The object of the present invention is to provide a kind of method of effective correction imaging spectrometer Spectral line bend, especially VPH transmissions
The narrow imaging spectrometer of this covering wavelength band of formula spectrometer.
To achieve the above object, present invention employs following technical schemes：A kind of Spectral line bend of VPH transmission-types spectrometer
Correction system, it is characterised in that：System include system include entrance slit, collimation lens set, VPH gratings, focus lens group with
And CCD.Incident light enters VPH transmission-type spectrometers through entrance slit, is collimated by collimation lens set, then through VPH gratings
Diffraction is divided, and diffraction light focus lamp focuses to CCD imaging units, and incident light meets following formula by optical grating diffraction focusing：Νm
λ=cos (γ) (sin (α+φ 1)+sin β), wherein α are grating incident angle, and β is optical grating diffraction angle, and φ 1 is that entrance slit is horizontal
Primary optical axis angle is deviateed in direction, and γ is entrance slit vertical direction and primary optical axis angle, and N is grating line density, and λ is incident light wave
Long, m is optical grating diffraction level.
The present invention be directed to specific optical system, by calculating design a curved slit, using bending entrance slit come
The Spectral line bend that compensation whole system is brought, to realize the correction to spectral instrument Spectral line bend.The simple light velocity of this method has
Effect, does not interfere with the performance of instrument, will not increase additional data processing load to user, and light is solved from the source that system designs
The Spectral line bend problem of spectrometer, can be used for actually detected demand.
Description of the drawings
Fig. 1 is the optical schematic diagram of VPH systems；
Fig. 2 is Spectral line bend figure；
Fig. 3 is spectral line actual measurement and theoretical spectrum；
Fig. 4 is narrow slit buckling curve figure in the present invention；
Fig. 5 is the spectral line schematic diagram after present invention correction.
Specific implementation mode
Fig. 1 show a typical VPH system optics schematic diagram, and wherein f1 is incident arm lengths；F2 is outgoing brachium
Degree；α is grating incident angle；β is optical grating diffraction angle；X1 is that entrance slit horizontal direction deviates primary optical axis distance；Φ 1 is incident narrow
It stitches horizontal direction and deviates master, optical axis angle；X2 is that diffraction pattern horizontal direction deviates primary optical axis distance；Φ 2 is diffraction pattern water
Square to deviate primary optical axis angle；γ is entrance slit vertical direction and primary optical axis angle.
Design optical system
Grating diffration equation is：
Ν m λ=cos (γ) (sin (α+φ 1)+(sin (β+φ 2)))
N is grating line density, and λ is lambda1-wavelength, and m is optical grating diffraction level.
On primary optical axis, γ=0 Φ 1=Φ 1=, grating diffration equation is：
Ν m λ=sin α+sin β
When entrance slit is a vertical slit, γ ≠ 0, but φ 1=0, while γ with height variation without
Disconnected variation, this results in φ 2 constantly to change, leads to Spectral line bend, and the length of slit is longer, and diffraction pattern deviates center and gets over
Far, curvature is bigger.Grating equation is at this time：
Ν m λ=cos (γ) (sin α+(sin (β+φ 2)))
A set of VPH transmission-type gratings spectrometer is designed, incident brachium f1=135mm is emitted arm f2=85mm, centre wavelength
λ=653.288nm, grating line density N=2163l/mm, diffraction time m=+1, grating incident angle α=45 °, the system measure
Spectral line bend as shown in Fig. 2, Spectral line bend is very serious, influence very much user and use.
The Spectral line bend of the system is detected, is checked with theoretical value, judges the performance of system, Spectral line bend value
It coincide very much with calculated value.
The present invention is characterized by the design of curved slit, detailed description below.
In order to ensure that difraction spectrum is not bent, then need to ensure φ 2=0, it, can be incident by changing according to grating equation
The angle of slit is realized, therefore can realize the Spectral line bend of VPH transmission-type spectrometers by designing curved slit
Correction.Grating equation is represented by this time：
Ν m λ=cos (γ) (sin (α+φ 1)+sin β)
Spectral line bend correction is carried out using curved slit, good calibration result may be implemented, as shown in figure 5, especially suitable
For VPH transmission-type grating spectrometers, the bearing calibration is simple, without carrying out larger change to whole system, does not influence system
Performance does not need a large amount of data processing yet.
Claims (1)
1. a kind of Spectral line bend of VPH transmission-types spectrometer corrects system, it is characterised in that：System includes that system includes incident narrow
(20), collimation lens set (30), VPH gratings (10), focus lens group (40) and CCD (50) are stitched, incident light is through entrance slit
VPH transmission-type spectrometers are entered, are collimated by collimation lens set, are then divided through VPH optical grating diffractions, diffraction light focus lamp is poly-
Coke to CCD imaging units, incident light meets following formula by optical grating diffraction focusing：Ν m λ=cos (γ) (sin (α+φ 1)+
Sin β), wherein α is grating incident angle, and β is optical grating diffraction angle, and φ 1 is that entrance slit horizontal direction deviates primary optical axis angle, γ
For entrance slit vertical direction and primary optical axis angle, N is grating line density, and λ is lambda1-wavelength, and m is optical grating diffraction level.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810817928.7A CN108663119A (en) | 2018-07-23 | 2018-07-23 | A kind of Spectral line bend correction system of VPH transmission-types spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810817928.7A CN108663119A (en) | 2018-07-23 | 2018-07-23 | A kind of Spectral line bend correction system of VPH transmission-types spectrometer |
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| Publication Number | Publication Date |
|---|---|
| CN108663119A true CN108663119A (en) | 2018-10-16 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201810817928.7A Withdrawn CN108663119A (en) | 2018-07-23 | 2018-07-23 | A kind of Spectral line bend correction system of VPH transmission-types spectrometer |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140022615A1 (en) * | 2012-07-13 | 2014-01-23 | The University Of North Carolina At Chapel Hill | Curved volume phase holographic (vph) diffraction grating with tilted fringes and spectrographs using same |
| CN103557939A (en) * | 2013-09-26 | 2014-02-05 | 中国科学院安徽光学精密机械研究所 | Small-sized echelette grating spectrometer |
| CN104034419A (en) * | 2014-05-05 | 2014-09-10 | 中国科学院长春光学精密机械与物理研究所 | Imaging spectrometer system capable of correcting bending of spectral line and correction method thereof |
| CN208520480U (en) * | 2018-07-23 | 2019-02-19 | 安徽创谱仪器科技有限公司 | A kind of Spectral line bend correction system of VPH transmission-type spectrometer |
-
2018
- 2018-07-23 CN CN201810817928.7A patent/CN108663119A/en not_active Withdrawn
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140022615A1 (en) * | 2012-07-13 | 2014-01-23 | The University Of North Carolina At Chapel Hill | Curved volume phase holographic (vph) diffraction grating with tilted fringes and spectrographs using same |
| CN103557939A (en) * | 2013-09-26 | 2014-02-05 | 中国科学院安徽光学精密机械研究所 | Small-sized echelette grating spectrometer |
| CN104034419A (en) * | 2014-05-05 | 2014-09-10 | 中国科学院长春光学精密机械与物理研究所 | Imaging spectrometer system capable of correcting bending of spectral line and correction method thereof |
| CN208520480U (en) * | 2018-07-23 | 2019-02-19 | 安徽创谱仪器科技有限公司 | A kind of Spectral line bend correction system of VPH transmission-type spectrometer |
Non-Patent Citations (2)
| Title |
|---|
| 杨皓琨: "基于衍射光栅和探测器阵列的光谱检测研究", 《中国优秀硕士学位论文全文数据库（基础科学辑）》, no. 8, pages 6 * |
| 陈洪福等: "消谱线弯曲棱镜-光栅型成像光谱仪设计", 《光学学报》, vol. 34, no. 9, pages 0922004 - 3 * |
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