CN108627730A - A kind of detecting system and method for handle electrode - Google Patents

A kind of detecting system and method for handle electrode Download PDF

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Publication number
CN108627730A
CN108627730A CN201810357456.1A CN201810357456A CN108627730A CN 108627730 A CN108627730 A CN 108627730A CN 201810357456 A CN201810357456 A CN 201810357456A CN 108627730 A CN108627730 A CN 108627730A
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China
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electrode
oxide
semiconductor
metal
handle
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Chinese (zh)
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苏阿娜
雷斌
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Sichuan Feixun Information Technology Co Ltd
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Sichuan Feixun Information Technology Co Ltd
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Priority to CN201810357456.1A priority Critical patent/CN108627730A/en
Publication of CN108627730A publication Critical patent/CN108627730A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

The invention discloses a kind of detecting system of handle electrode and method, detecting system includes handle electrode and testing agency, and the handle electrode includes conducting wire and electrode slice, and one end of the conducting wire is electrically connected with one end of corresponding electrode slice, and the testing agency includes:Control unit and metal-oxide-semiconductor, the other end of the electrode slice is electrically connected with the drain electrode of the metal-oxide-semiconductor, the IO control ports electrical connection corresponding in described control unit of the grid of the metal-oxide-semiconductor, the source electrode ground connection of the metal-oxide-semiconductor, the other end of the conducting wire are electrically connected with described control unit.The detecting system of the handle electrode of the present invention not only can easily detect the connection line between the electrode slice of handle electrode and conducting wire, but also detection efficiency is high.

Description

A kind of detecting system and method for handle electrode
Technical field
The invention belongs to Human fat balance technical field, more particularly to the detecting system and method for a kind of handle electrode.
Background technology
With the improvement of people's life quality, smart home is universal, people are also higher and higher to the quality requirement of life, So that the electronic instrument checked people's physical condition is also widely used, such as human body can be measured simultaneously The Human fat balance etc. of weight, fat and moisture.
Currently, in order to more accurately measure the fat content and muscle rate of partes corporis humani position, in four traditional electrode bodies It is equipped with a handle electrode on fat scale, sets on handle electrode there are four electrode slice, by conducting wire by four electrode slices on scale It is electrically connected respectively with four electrode slices on handle electrode.Since wire quality is irregular and there are manual assembly behaviour Make the influence of the factors such as improper, connection line is susceptible to the bad working condition such as open circuit, short circuit.Therefore, in process of production, The connection line state to handle electrode and conducting wire is needed to be detected.And existing detection method be usually by scale, conducting wire and After handle electrode three connects, then by way of actual use it is whether normal to detect connection line, such mode is not only It is inconvenient for operation, and detection efficiency is low.
Invention content
The object of the present invention is to provide a kind of detecting system of handle electrode and methods, not only can easily detect handle electricity Connection line between the electrode slice and conducting wire of pole, and detection efficiency is high.
Technical solution provided by the invention is as follows:
A kind of detecting system of handle electrode, including handle electrode and testing agency, the handle electrode include conducting wire and Electrode slice, one end of the conducting wire are electrically connected with one end of corresponding electrode slice, and the testing agency includes:Control unit and Metal-oxide-semiconductor, the other end of the electrode slice are electrically connected with the drain electrode of the metal-oxide-semiconductor, the grid and described control unit of the metal-oxide-semiconductor Upper corresponding IO control ports electrical connection, the source electrode ground connection of the MOS pipes, the other end and described control unit of the conducting wire Electrical connection.
Further, the electrode slice is identical with the quantity of the metal-oxide-semiconductor, and is two or more, the grid of each metal-oxide-semiconductor Corresponding with described control unit IO control ports correspond electrical connection respectively for pole, the drain electrode of each metal-oxide-semiconductor respectively with it is corresponding Electrode slice correspond electrical connection, the source electrode of each metal-oxide-semiconductor is grounded respectively.
Further, further include clamping device, the clamping device includes body, upper die and lower die, the upper mold and institute Lower die is stated to be separately positioned on the body, the upper mold be located at the top of the lower die and can closer or far from the lower die, The upper mold is equipped with the first accommodating cavity compatible with the handle electrode close to the side of the lower die, and the lower die is close to institute The side for stating upper mold is equipped with the second accommodating cavity compatible with the handle electrode.
Further, the clamping device further includes elastic component, and the elastic component is located at the lower section of the lower die, the bullet Property part one end be arranged on the body, one far from the upper mold in the lower die is arranged in the other end of the elastic component Side.
Further, the testing agency further includes probe, and one end of each probe and the drain electrode of the metal-oxide-semiconductor are electrically connected It connects, and the other end of each probe is electrically connected with the electrode slice.
Further, the detection circuit further includes resistance, one end IO corresponding with described control unit of the resistance Control port is electrically connected, and the other end of the resistance is electrically connected with the source electrode of the metal-oxide-semiconductor.
Further, the detection circuit further includes indicator light, and each indicator light is corresponding with described control unit respectively Signal transmission port is electrically connected.
The present invention also provides a kind of methods of the detecting system for handle electrode, including step:
S100 described control units control the metal-oxide-semiconductor conducting;
Whether the drain electrode that S200 described control units detect the metal-oxide-semiconductor is low level, if so, step S300 is executed, if It is not to execute step S400;
S300 judges the circuit between the electrode slice and conducting wire of the handle electrode for open circuit;
S400 judges whether the circuit between the electrode slice and conducting wire of the handle electrode is short-circuit, if so, executing step S500, if it is not, executing step S600;
S500 judges that the circuit between the electrode slice and conducting wire of the handle electrode is short circuit;
S600 judges that the circuit between the electrode slice and conducting wire of the handle electrode is access.
Further, the step S400 is specifically included:When the quantity of the electrode slice is one, the handle is judged Whether the circuit between the electrode slice and conducting wire of electrode is short-circuit, if so, step S500 is executed, if it is not, step S600 is executed, when The electrode slice is identical with the quantity of the metal-oxide-semiconductor, and when being two or more, judges the more than two of the handle electrode Whether the circuit between electrode slice and conducting wire intersects short circuit, if so, step S500 is executed, if it is not, executing step S600.
Further, when between the electrode slice and conducting wire for judging the handle electrode open lines or when short circuit, instruction Lamp extinguishes.
Compared with prior art, the beneficial effects of the present invention are:Electrode slice, conducting wire, control unit and metal-oxide-semiconductor form inspection Survey time road, when work, control unit sends out the break-make of low and high level control metal-oxide-semiconductor, when control unit exports high level to metal-oxide-semiconductor Source electrode when, measure loop open, control unit acquire metal-oxide-semiconductor drain electrode voltage, when the voltage value be 0 when, judgement electricity Open lines between pole piece and conducting wire further judge the circuit between electrode slice and conducting wire when the voltage value is not 0 Whether short circuit then judges that the circuit between electrode slice and conducting wire is normal if short circuit does not occur;It, can using above-mentioned detecting system Easily the connection line of electrode slice and conducting wire is detected, it is not only easy to operate, and also detection efficiency is high.
Description of the drawings
Below by a manner of clearly understandable, preferred embodiment is described with reference to the drawings, to a kind of above-mentioned characteristic, technology Feature, advantage and its realization method are further described.
Fig. 1 is a kind of detection of the detecting system of handle electrode of first, second, third and fourth, five, six, seven embodiments of the invention The circuit diagram of mechanism;
Fig. 2 is that a kind of circuit of the testing agency of the detecting system of handle electrode of second, five, seven embodiments of the invention is former Reason figure;
Fig. 3 be the present invention third and fourth, the main view of the clamping device of the detecting system of handle electrodes of five embodiments a kind of Figure;
Fig. 4 be the present invention third and fourth, the side view of the clamping device of the detecting system of handle electrodes of five embodiments a kind of Figure;
Fig. 5 is a kind of flow diagram of the method for detecting system for handle electrode of sixth embodiment of the invention;
Fig. 6 is a kind of flow diagram of the method for detecting system for handle electrode of seventh embodiment of the invention.
Drawing reference numeral explanation:
10, handle electrode;11, conducting wire;12, electrode slice;121, first electrode sheet;122, second electrode sheet;20, detection machine Structure;21, metal-oxide-semiconductor;211, the first metal-oxide-semiconductor;212, the second metal-oxide-semiconductor;22, probe;30, clamping device;31, body;32, upper mold; 321, the first accommodating cavity;33, lower die;331, the second accommodating cavity;34, elastic component;PA, IO control port;PA1, the first IO are controlled Port;PA2, the 2nd IO control ports;PA3, the 3rd IO control ports;PA4, the 4th IO control ports.
Specific implementation mode
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, control is illustrated below The specific implementation mode of the present invention.It should be evident that drawings in the following description are only some embodiments of the invention, for For those of ordinary skill in the art, without creative efforts, other are can also be obtained according to these attached drawings Attached drawing, and obtain other embodiments.
To make simplified form, part related to the present invention is only schematically shown in each figure, they are not represented Its practical structures as product.In addition, so that simplified form is easy to understand, there is identical structure or function in some figures Component only symbolically depicts one of those, or has only marked one of those.Herein, "one" is not only indicated " only this ", can also indicate the situation of " more than one ".
According to first embodiment provided by the invention, as shown in Figure 1,
A kind of detecting system of handle electrode, including handle electrode (not shown in figure 1) and testing agency 20, handle electrode (not shown in figure 1) includes conducting wire 11 and electrode slice 12, and one end of conducting wire 11 is electrically connected with one end of corresponding electrode slice 12, inspection Surveying mechanism 20 includes:The other end of control unit and metal-oxide-semiconductor 21, electrode slice 12 is electrically connected with the drain D of metal-oxide-semiconductor 21, such as Fig. 1 Shown, the drain D of metal-oxide-semiconductor 21 is electrically connected by port a with the other end of electrode slice 12, the grid G of metal-oxide-semiconductor 21 and the control Corresponding IO control ports PA electrical connections on unit processed, the source S ground connection of metal-oxide-semiconductor 21, the other end and control unit of conducting wire 11 Electrical connection.
Specifically, the Human fat balance with handle electrode needs to use conducting wire 11 by handle electrode in actual use Electrode slice 12 is electrically connected with the electrode slice on scale ontology, and conducting wire 11 can be connecting line earphone identical with handle electrode quantity Line, the both ends of earphone cable are respectively Earphone joint, and the Earphone joint of one end is inserted into compatible with Earphone joint on handle electrode In earpiece holes, the Earphone joint of the other end is inserted on scale ontology in earpiece holes compatible with Earphone joint, to realize ontology scale On electrode slice and the electrode slice 12 on handle electrode be electrically connected.The detecting system of the handle electrode of the present invention is to detect The state of connection line between electrode slice 12 on handle electrode and conducting wire 11.Control unit, metal-oxide-semiconductor 21,12 and of electrode slice Conducting wire 11 forms a measure loop by above-mentioned connection relation.Control unit is a chip, the chip used in the present invention Other chip models also can be used in model STM32F105, certain program.
When work, when control unit exports source S of the high level to metal-oxide-semiconductor 21 by corresponding IO control ports PA, inspection Survey time road open, control unit acquire metal-oxide-semiconductor 21 drain D voltage, when the voltage value be 0 when, judgement electrode slice 12 with Open lines between conducting wire 11 further judge the circuit between electrode slice 12 and conducting wire 11 when the voltage value is not 0 Whether short circuit then judges that the circuit between electrode slice 12 and conducting wire 11 is normal if short circuit does not occur.When detection, it is only necessary to will lead Line 11 is electrically connected and testing goal can be realized with control unit and metal-oxide-semiconductor 21 respectively with electrode slice 12, eliminates cumbersome switch Machine operates so that operating process is simple and convenient, and detection efficiency is high.As shown in Figure 1, going back one 4.7k of parallel connection on MOS pipes 21 Resistance R, to play the role of current limliting.
According to second embodiment provided by the invention, as illustrated in fig. 1 and 2,
A kind of detecting system of handle electrode, including handle electrode (being not shown in Fig. 1 and Fig. 2) and testing agency 20, hand Handle electrode includes conducting wire 11 and electrode slice 12, and one end of conducting wire 11 is electrically connected with one end of corresponding electrode slice 12, testing agency 20 include:The other end of control unit and metal-oxide-semiconductor 21, electrode slice 12 is electrically connected with the drain D of metal-oxide-semiconductor 21, the grid of metal-oxide-semiconductor 21 G IO control ports PA electrical connections corresponding in control unit, the source S ground connection of metal-oxide-semiconductor 21, the other end of conducting wire 11 and control Unit is electrically connected.
Electrode slice 12 is identical with the quantity of the metal-oxide-semiconductor 21, and is two or more, the grid G point of each metal-oxide-semiconductor 21 Not IO control port PA corresponding with control unit corresponds electrical connection, the drain Ds of each MOS pipes 21 respectively by a1, The port a2, a3 and a4 corresponds with corresponding electrode slice 12 and is electrically connected, and the source S of each metal-oxide-semiconductor 21 is grounded respectively.
Specifically, when the quantity of electrode slice 12 is multiple, the quantity of metal-oxide-semiconductor 21 and the quantity of electrode slice 12 want identical, And corresponding IO control ports PA also must want identical with the quantity of electrode slice 12 in control unit, 11 domestic demand of conducting wire is arranged more Connecting line, the quantity of connecting line are greater than the quantity of electrode slice 12.When electrode slice 12, metal-oxide-semiconductor 21, corresponding IO in control unit The quantity of control port PA is identical and when being multiple, the connection of every connecting line and electrode slice 12 and control unit in conducting wire 11 Relational graph is no longer shown one by one in fig. 2 referring to Fig. 1.For example, when the quantity of electrode slice 12 is four, metal-oxide-semiconductor 21 and control IO control ports PA on unit processed is also four, and the connecting line in conducting wire 11 needs to be more than four, as shown in Fig. 2, four IO Control port PA is respectively the first IO control ports PA1, the 2nd IO control ports PA2, the 3rd IO control ports PA3 and the 4th IO Control port PA4, four metal-oxide-semiconductors 21 are respectively the first metal-oxide-semiconductor 211, the second metal-oxide-semiconductor 212, third metal-oxide-semiconductor 213 and the 4th MOS Pipe 214, if five connecting lines built in conducting wire 11, wherein one is ground wire, remaining four a pair of with four electrode slices 12 1 respectively It should be electrically connected.When the quantity of electrode slice 12 is four, testing principle is identical as the testing principle of an electrode slice 12, i.e., and the One IO control ports PA1 is connect with the grid G 1 of the first metal-oxide-semiconductor 211, and the source S 1 of the first metal-oxide-semiconductor 211 is grounded, the first metal-oxide-semiconductor 211 drain D1 by being connect with first electrode sheet 121 by port a1, the first connecting line of conducting wire 11 respectively with control unit With first electrode sheet 121 connect, i.e., the grid G 1 of the first IO control ports PA1 and the first metal-oxide-semiconductor 211, first electrode sheet 121 and First connecting line is sequentially connected electrically first detecting back for the circuit to be formed between detection first electrode sheet 121 and the first connecting line Road;Similarly, the 2nd IO control ports PA2, the grid of the second metal-oxide-semiconductor 212, second electrode sheet 122 and the second connecting line are electric successively Connection forms the second measure loop of the circuit between detection second electrode sheet 122 and the second connecting line, similarly forms third electricity Between the third measure loop and the 4th electrode slice 124 and the 4th connecting line of circuit between pole piece 123 and third connecting line Circuit the 4th measure loop.It individually works between wherein each measure loop.Meanwhile as shown in figure 4, the first MOS The current-limiting resistance R1 that an in parallel resistance is 4.7K on pipe 211, the current-limiting resistance that a resistance in parallel is 4.7K on the second metal-oxide-semiconductor 212 R2, the current-limiting resistance R3 that a resistance in parallel is 4.7K on third metal-oxide-semiconductor 213, a resistance in parallel is 4.7K on the 4th metal-oxide-semiconductor 214 Current-limiting resistance R4.
When measure loop works, control unit exports high level to corresponding respectively by corresponding IO control ports PA The source S of metal-oxide-semiconductor 21 makes corresponding measure loop open, i.e., IO control ports PA1 and IO control port PA2 exports height respectively Level is to the source S of the source S and MOS pipes 212 of corresponding metal-oxide-semiconductor 211, and IO control port PA3 and IO control ports PA4 When not exporting high level, the first measure loop and second electrode sheet of the circuit between first electrode sheet 121 and the first connecting line 122 and the second measure loop of the second circuit between connecting line open, the line between third electrode slice 123 and third connecting line 4th measure loop of the circuit between the third measure loop and the 4th electrode slice 124 and the 4th connecting line on road is not turned on. Control unit acquires the voltage of the drain D of corresponding metal-oxide-semiconductor 21 respectively, when the level point is 0, judgement electrode slice 12 and conducting wire 11 Between open lines, when the level point is not 0, further judge corresponding measure loop whether with other measure loops hair It is raw to intersect short circuit, short circuit does not such as occur, then judges that the electrode slice 12 in the road measure loop and the circuit between conducting wire 11 are normal.
3rd embodiment provided by the invention, as shown in Fig. 1,3 and 4,
A kind of detecting system of handle electrode, including handle electrode 10 and testing agency 20, handle electrode 10 include conducting wire 11 and electrode slice 12, one end of conducting wire 11 is electrically connected with one end of corresponding electrode slice 12, and testing agency 20 includes:Control unit It is electrically connected with the drain D of metal-oxide-semiconductor 21 with the other end of metal-oxide-semiconductor 21, electrode slice 12, in the grid G and control unit of metal-oxide-semiconductor 21 Corresponding IO control ports PA electrical connections, the source S ground connection of metal-oxide-semiconductor 21, the other end of conducting wire 11 are electrically connected with control unit.
Detecting system further includes clamping device 30, and clamping device 30 includes body 31, upper mold 32 and lower die 33, upper mold 32 Be separately positioned on body 31 with the lower die 33, upper mold 32 be located at the top of lower die 33 and can closer or far from lower die 33, on Mould 32 is equipped with first accommodating cavity 321 compatible with handle electrode 10 close to the side of lower die 33, and lower die 33 is close to the upper mold 32 side is equipped with second accommodating cavity 331 compatible with handle electrode 10.
Specifically, when detection, handle electrode 10 can be placed in the second accommodating cavity 331 of lower die 33, then upper mold 32 It is moved towards lower die 33, upper mold 32 is made to be closed with lower die 33, the top half of handle electrode 10 is arranged in the first accommodating cavity 321 Interior, the lower half portion of handle electrode 10 is arranged in the second accommodating cavity 331, and handle electrode 10 is fixed, detection is facilitated Circuit between the electrode slice 12 and conducting wire 11 of handle electrode 10.
Fourth embodiment provided by the invention, as shown in Fig. 1,3 and 4,
A kind of detecting system of handle electrode, including handle electrode 10 and testing agency 20, handle electrode 10 include conducting wire 11 and electrode slice 12, one end of conducting wire 11 is electrically connected with one end of corresponding electrode slice 12, and testing agency 20 includes:Control unit It is electrically connected with the drain D of metal-oxide-semiconductor 21 with the other end of metal-oxide-semiconductor 21, electrode slice 12, in the grid G and control unit of metal-oxide-semiconductor 21 Corresponding IO control ports PA electrical connections, the source S ground connection of metal-oxide-semiconductor 21, the other end of conducting wire 11 are electrically connected with control unit.
Detecting system further includes clamping device 30, and clamping device 30 includes body 31, upper mold 32 and lower die 33,32 He of upper mold The lower die 33 is separately positioned on body 31, and upper mold 32 is located at the top of lower die 33 and can be closer or far from lower die 33, upper mold 32 are equipped with first accommodating cavity 321 compatible with handle electrode 10 close to the side of lower die 33, and lower die 33 is close to the upper mold 32 Side be equipped with second accommodating cavity 331 compatible with handle electrode 10.
The clamping device 30 further includes elastic component 34, and the elastic component 34 is located at the lower section of the lower die 33, the bullet Property part 34 one end be arranged on the body 31, the setting of the other end of the elastic component 34 is in the lower die 33 far from described The side of mould 32.
The testing agency 20 further includes probe 22, and one end of probe 22 is electrically connected with the drain D of the metal-oxide-semiconductor 21, and The other end of probe 22 is electrically connected with the electrode slice 12.
Probe 22 is located at the lower section of lower die 33, and one end of probe 22 is arranged on body 31, and the other end of probe 22 passes through Lower die 33, and can be slided with respect to lower die 33.
Specifically, when actually detected, handle electrode 10 can be placed in the second accommodating cavity 331 of lower die 33, upper mold 32 It is moved towards lower die 33, after upper mold 32 and 33 contact closure of lower die so that it is accommodating that the lower half portion of handle electrode 10 is located at second In chamber 331, the top half of handle electrode 10 is located in the first accommodating cavity 321, while upper mold 32 and lower die 33 are closed will under Mould 33 is pressed downward, and elastic component 34 is made to shrink, and elastic component 34 can be spring, and when spring contraction, probe 22 stretches out lower die 33 and and hand Electrode slice 12 on handle electrode 10 contacts.One earpiece holes can be set on body 31, which is electrically connected with control unit, One end of conducting wire 11 is inserted into the earpiece holes on body 31, you can so that conducting wire 11 is realized with control unit and is electrically connected, conducting wire 11 The other end be electrically connected with electrode slice 12, electrode slice 12 is electrically connected by probe 22 with the drain D of MOS pipes 21, with formed detection Circuit.Upper mold 32 can be driven by the cylinder, and rectilinear elbow folder can also be arranged in upper mold 32, with realize upper mold 32 closer or far from Lower die 33.By being arranged above-mentioned clamping device 30, when detection, the second accommodating cavity that handle electrode 10 need to be only put into lower die 33 In 331, starting switch is pressed, so that upper mold 32 is moved down and is closed with lower die 33, probe 22 stretches out lower die 33 leads with electrode slice 12 It is logical, so that control unit, metal-oxide-semiconductor 21, electrode slice 12 and conducting wire 11 is formed test loop, you can detection operation is completed, it is easy to operate, And it is efficient.
5th embodiment provided by the invention, as shown in Fig. 1,2,3 and 4,
A kind of detecting system of handle electrode, including handle electrode 10 and testing agency 20, handle electrode 10 include conducting wire 11 and electrode slice 12, one end of conducting wire 11 is electrically connected with one end of corresponding electrode slice 12, and testing agency 20 includes:Control unit It is electrically connected with the drain D of metal-oxide-semiconductor 21 with the other end of metal-oxide-semiconductor 21, electrode slice 12, in the grid G and control unit of metal-oxide-semiconductor 21 Corresponding IO control ports PA electrical connections, the source S ground connection of metal-oxide-semiconductor 21, the other end of conducting wire 11 are electrically connected with control unit.
Electrode slice 12 is identical with the quantity of metal-oxide-semiconductor 21, and is two or more, the grid G of each metal-oxide-semiconductor 21 respectively with The corresponding IO control ports PA of control unit corresponds electrical connection, the drain Ds of each MOS pipes 21 respectively with corresponding electrode Piece 12 corresponds electrical connection, and the source S of each metal-oxide-semiconductor 21 is grounded respectively.
Detecting system further includes clamping device 30, and clamping device 30 includes body 31, upper mold 32 and lower die 33,32 He of upper mold Lower die 33 is separately positioned on body 31, and upper mold 32 is located at the top of lower die 33 and can be leaned on closer or far from lower die 33, upper mold 32 The side of nearly lower die 33 is equipped with first accommodating cavity 321 compatible with handle electrode 10, and lower die 33 is set close to the side of upper mold 32 There is second accommodating cavity 331 compatible with handle electrode 10.
Clamping device 30 further includes elastic component 34, and elastic component 34 is located at the lower section of lower die 33, one end setting of elastic component 34 On body 31, the other end of elastic component 34 is arranged in side of the lower die 33 far from upper mold 32.
Testing agency 20 further includes probe 22, and one end of each probe 22 is electrically connected with the drain D of metal-oxide-semiconductor 21, and each The other end of probe 22 is electrically connected with electrode slice 12.
Specifically, when the quantity of electrode slice 12 is four, the quantity of probe 22 is also four, one end of four probes 22 Be electrically connected respectively with the drain D of four metal-oxide-semiconductors 21 one-to-one correspondence, the other ends of four probes 22 respectively with four electrode slices 12 Correspond electrical connection.
It is two groups that wherein four electrode slices 12, which are divided to, and two arrays of electrodes piece 12 is arranged along the axially symmetric of handle electrode 10 in handle On electrode 10, two electrode slices 12 in every group of electrode slice 12 are set gradually along the axial direction of handle electrode 10.Two probes 22 In upper mold 32 close to the one side of lower die 33, other two probe 22 is located at the lower section of lower die 33, is located at two of 33 lower section of lower die One end of probe 22 is separately positioned on body 31, and the other end of two probes 22 is each passed through lower die 33, and can be with respect to lower die 33 slidings.Upper mold 32 is moved towards lower die 33, when making upper mold 32 and 33 contact closure of lower die, upper and lower four probes 22 respectively with Four electrode slices 12 electrical connection on handle electrode 10, forms four measure loops, to complete to four electrode slices 12 and conducting wire The wireline inspection between four connecting lines in 11.
Sixth embodiment provided by the invention, as described in figures 1 and 5,
A method of being used for the detecting system of handle electrode, including step:
S100 described control units control the metal-oxide-semiconductor 21 and are connected;
Whether the drain electrode that S200 described control units detect the metal-oxide-semiconductor 21 is low level, if so, step S300 is executed, If it is not, executing step S400;
S300 judges the circuit between the electrode slice 12 of the handle electrode and conducting wire 11 for open circuit;
S400 judges whether the circuit between the electrode slice 12 of the handle electrode and conducting wire 11 is short-circuit, if so, executing step Rapid S500, if it is not, executing step S600;
S500 judges the circuit between the electrode slice 12 of the handle electrode and conducting wire 11 for short circuit;
S600 judges the circuit between the electrode slice 12 of the handle electrode and conducting wire 11 for access.
Specifically, the Human fat balance with handle electrode 10 is needed using conducting wire 11 that handle is electric in actual use The electrode slice 12 of pole 10 is electrically connected with the electrode slice on scale ontology, and conducting wire 11 can be connecting line and 10 quantity phase of handle electrode The both ends of same earphone cable, earphone cable are respectively Earphone joint, and the Earphone joint of one end is inserted on handle electrode 10 to be connect with earphone In compatible earpiece holes, the Earphone joint of the other end is inserted on scale ontology in earpiece holes compatible with Earphone joint, with Realize being electrically connected for electrode slice and the electrode slice 12 on handle electrode 10 on ontology scale.The detection of the handle electrode 10 of the present invention System is to detect the state of the connection line between the electrode slice 12 on handle electrode 10 and conducting wire 11.Control unit, MOS Pipe 21, electrode slice 12 and conducting wire 11 form a measure loop by above-mentioned connection relation.Control unit is a chip, the present invention Other chip models also can be used in the model STM32F105 of the middle chip used, certain program.
When work, when control unit exports source S of the high level to metal-oxide-semiconductor 21 by corresponding IO control ports PA, inspection Survey time road open, control unit acquire metal-oxide-semiconductor 21 drain D voltage, when the voltage value be 0 when, judgement electrode slice 12 with Open lines between conducting wire 11 further judge the circuit between electrode slice 12 and conducting wire 11 when the voltage value is not 0 Whether short circuit then judges that the circuit between electrode slice 12 and conducting wire 11 is normal if short circuit does not occur.When detection, it is only necessary to will lead Line 11 is electrically connected and testing goal can be realized with control unit and metal-oxide-semiconductor 21 respectively with electrode slice 12, eliminates cumbersome switch Machine operates so that operating process is simple and convenient, and detection efficiency is high.As shown in Figure 1, going back one 4.7k of parallel connection on MOS pipes 21 Resistance R, to play the role of current limliting.
7th embodiment provided by the invention, as shown in Fig. 1,2 and 6,
A method of being used for the detecting system of handle electrode, including step:
S100 described control units control the metal-oxide-semiconductor 21 and are connected;
Whether the drain electrode that S200 described control units detect the metal-oxide-semiconductor 21 is low level, if so, step S300 is executed, If it is not, executing step S400;
S300 judges the circuit between the electrode slice 12 of the handle electrode and conducting wire 11 for open circuit;
S400 judges the electrode slice 12 and conducting wire 11 of the handle electrode when the quantity of the electrode slice 12 is one Between circuit it is whether short-circuit, if so, step S500 is executed, if it is not, step S600 is executed, when the electrode slice 12 and described The quantity of metal-oxide-semiconductor 21 is identical, and when being two or more, judges the more than two electrode slices 12 and conducting wire of the handle electrode Whether the circuit between 11 intersects short circuit, if so, step S500 is executed, if it is not, executing step S600;
S500 judges the circuit between the electrode slice 12 of the handle electrode and conducting wire 11 for short circuit;
S600 judges the circuit between the electrode slice 12 of the handle electrode and conducting wire 11 for access.
Specifically, such as when the quantity of electrode slice 12 be four when, control unit by corresponding IO control ports PA successively Source electrode open detection circuit of the high level to metal-oxide-semiconductor 21 is exported, control unit acquires the electricity of the drain electrode of corresponding metal-oxide-semiconductor 21 respectively It is flat, when the level point is 0, the open lines between electrode slice 12 and conducting wire 11 are judged, when the level point is not 0, into one Step judges whether the road measure loop occurs to intersect short circuit with other measure loops, does not occur such as to intersect short circuit, then judges the road Circuit between electrode slice 12 in measure loop and conducting wire 11 is normal.When detection, instruction can also be added in testing agency 20 Lamp and buzzer, when judge the road handle electrode 10 electrode slice 12 and conducting wire 11 between open lines or short circuit when, the road Indicator light extinguishes on circuit, and buzzer sounds, to remind the exception of tester's circuit.
As shown in fig. 6, when the quantity such as electrode slice 12 is four, four measure loops, i.e. the first IO control terminals can be formed Grid G, first electrode sheet 121 and the first connecting line of mouth PA1 and the first metal-oxide-semiconductor 211 are sequentially connected electrically to form the first electricity of detection First measure loop of the circuit between pole piece 121 and the first connecting line;Similarly, detection second electrode sheet 122 and second is formed Second measure loop of the circuit between connecting line, the third detection of the circuit between third electrode slice 123 and third connecting line 4th measure loop of the circuit between circuit and the 4th electrode slice 124 and the 4th connecting line.If the first measure loop, When any circuit in two measure loops, third measure loop and the 4th measure loop is opened a way, then measure loop is corresponded to Indicator light extinguishes, while buzzer sends out sound;If occurring intersecting short circuit between the first measure loop and the second measure loop, The indicator light of first measure loop and the second measure loop goes out, similarly, if going out between the second measure loop and third measure loop Now intersect short circuit, then the indicator light of the second measure loop and third measure loop goes out, the second measure loop and the 4th measure loop Between occur intersect short circuit, then the indicator light of the second measure loop and the 4th measure loop goes out;If the instruction of all measure loops Lamp all light, and buzzer is not rung, then proves that handle electrode 10 is good, handle electrode 10 detects qualification.
It should be noted that above-described embodiment can be freely combined as needed.The above is only the preferred of the present invention Embodiment, it is noted that for those skilled in the art, in the premise for not departing from the principle of the invention Under, several improvements and modifications can also be made, these improvements and modifications also should be regarded as protection scope of the present invention.

Claims (10)

1. a kind of detecting system of handle electrode, including handle electrode and testing agency, the handle electrode include conducting wire and electricity One end of pole piece, one end of the conducting wire and corresponding electrode slice is electrically connected, which is characterized in that the testing agency includes:Control Unit and metal-oxide-semiconductor processed, the other end of the electrode slice are electrically connected with the drain electrode of the metal-oxide-semiconductor, the grid of the metal-oxide-semiconductor with it is described Corresponding IO control ports electrical connection in control unit, the source electrode ground connection of the metal-oxide-semiconductor, the other end of the conducting wire and the control Unit electrical connection processed.
2. according to the detecting system for the handle electrode that claim 1 quantity is stated, which is characterized in that the electrode slice and described Metal-oxide-semiconductor it is identical, and be two or more, the grid of each metal-oxide-semiconductor IO control ports corresponding with described control unit respectively Electrical connection is corresponded, the drain electrode of each metal-oxide-semiconductor is corresponded with corresponding electrode slice respectively to be electrically connected, the source of each metal-oxide-semiconductor Pole is grounded respectively.
3. according to the detecting system of claims 1 or 2 any one of them handle electrode, which is characterized in that further include clamping machine Structure, the clamping device include body, upper die and lower die, and the upper mold and the lower die are separately positioned on the body, institute Upper mold is stated to be located at the top of the lower die and can be equipped with close to the side of the lower die closer or far from the lower die, the upper mold The first accommodating cavity compatible with the handle electrode, the lower die are equipped with and the handle electrode close to the side of the upper mold Compatible second accommodating cavity.
4. the detecting system of handle electrode according to claim 3, which is characterized in that the clamping device further includes elasticity Part, the elastic component are located at the lower section of the lower die, and one end of the elastic component is arranged on the body, the elastic component The other end is arranged in side of the lower die far from the upper mold.
5. the detecting system of handle electrode according to claim 4, which is characterized in that the testing agency further includes visiting Needle, one end of each probe are electrically connected with the drain electrode of the metal-oxide-semiconductor, and the other end of each probe is electrically connected with the electrode slice It connects.
6. according to the detecting system of claims 1 or 2 any one of them handle electrode, which is characterized in that the detection circuit Further include resistance, the IO control ports electrical connection corresponding with described control unit of one end of the resistance, the resistance it is another End is electrically connected with the source electrode of the metal-oxide-semiconductor.
7. according to the detecting system of claims 1 or 2 any one of them handle electrode, which is characterized in that the detection circuit Further include indicator light, the signal transmission port electrical connection corresponding with described control unit respectively of each indicator light.
8. a kind of method of the detecting system of handle electrode, which is characterized in that apply claim 1-7 any one of them handles The detecting system of electrode, including step:
S100 described control units control the metal-oxide-semiconductor conducting;
Whether the drain electrode that S200 described control units detect the metal-oxide-semiconductor is low level, if so, step S300 is executed, if it is not, Execute step S400;
S300 judges the circuit between the electrode slice and conducting wire of the handle electrode for open circuit;
S400 judges whether the circuit between the electrode slice and conducting wire of the handle electrode is short-circuit, if so, step S500 is executed, if It is not to execute step S600;
S500 judges that the circuit between the electrode slice and conducting wire of the handle electrode is short circuit;
S600 judges that the circuit between the electrode slice and conducting wire of the handle electrode is access.
9. according to the method described in claim 8, it is characterized in that, the step S400 is specifically included:When the electrode slice When quantity is one, judge whether the circuit between the electrode slice and conducting wire of the handle electrode is short-circuit, if so, executing step S500, if it is not, step S600 is executed, when the electrode slice is identical with the quantity of the metal-oxide-semiconductor, and is two or more, Judge whether the circuit between more than two electrode slices of the handle electrode and conducting wire intersects short circuit, if so, executing step S500, if it is not, executing step S600.
10. according to the method described in claim 8, it is characterized in that, when judge the handle electrode electrode slice and conducting wire it Between open lines or short circuit when, indicator light extinguish.
CN201810357456.1A 2018-04-20 2018-04-20 A kind of detecting system and method for handle electrode Pending CN108627730A (en)

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CN101109769A (en) * 2006-07-20 2008-01-23 微探测株式会社 Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same
CN103157737A (en) * 2013-03-21 2013-06-19 广东富华工程机械制造有限公司 U-type bolt preforming device
CN103364675A (en) * 2012-03-30 2013-10-23 海洋王(东莞)照明科技有限公司 Wire disconnection detecting circuit and wire disconnection detecting device
CN105137260A (en) * 2015-08-19 2015-12-09 深圳市中兴物联科技有限公司 Circuit for detecting the state of active antenna
CN105414308A (en) * 2016-01-25 2016-03-23 广州市全德机械科技有限公司 Manufacturing method and equipment for breaking joints of sealing ring
CN105955524A (en) * 2016-04-20 2016-09-21 厦门天马微电子有限公司 Touch screen and detection method thereof, and touch display
CN206183269U (en) * 2016-08-05 2017-05-24 深圳华大久康科技有限公司 Handle mounting structure
CN206199985U (en) * 2016-11-07 2017-05-31 彭开华 Mould used by reverse gear shifting fork

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101109769A (en) * 2006-07-20 2008-01-23 微探测株式会社 Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same
CN103364675A (en) * 2012-03-30 2013-10-23 海洋王(东莞)照明科技有限公司 Wire disconnection detecting circuit and wire disconnection detecting device
CN103157737A (en) * 2013-03-21 2013-06-19 广东富华工程机械制造有限公司 U-type bolt preforming device
CN105137260A (en) * 2015-08-19 2015-12-09 深圳市中兴物联科技有限公司 Circuit for detecting the state of active antenna
CN105414308A (en) * 2016-01-25 2016-03-23 广州市全德机械科技有限公司 Manufacturing method and equipment for breaking joints of sealing ring
CN105955524A (en) * 2016-04-20 2016-09-21 厦门天马微电子有限公司 Touch screen and detection method thereof, and touch display
CN206183269U (en) * 2016-08-05 2017-05-24 深圳华大久康科技有限公司 Handle mounting structure
CN206199985U (en) * 2016-11-07 2017-05-31 彭开华 Mould used by reverse gear shifting fork

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