CN108614287B - Ionization chamber detector capable of realizing on-line measurement of beam uniformity - Google Patents
Ionization chamber detector capable of realizing on-line measurement of beam uniformity Download PDFInfo
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- CN108614287B CN108614287B CN201810283713.1A CN201810283713A CN108614287B CN 108614287 B CN108614287 B CN 108614287B CN 201810283713 A CN201810283713 A CN 201810283713A CN 108614287 B CN108614287 B CN 108614287B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2935—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using ionisation detectors
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Abstract
The invention relates to an ionization chamber detector capable of realizing on-line measurement of beam uniformity, which comprises an ionization chamber shell, an ionization chamber inner core unit, an entrance window and an exit window, wherein the ionization chamber inner core unit consists of two high-voltage poles and a signal set, and the signal set is positioned between the two high-voltage poles; the signal electrode is composed of a first one-dimensional section measuring unit and a second one-dimensional section measuring unit which are respectively formed on the front surface and the back surface of the electrode film, and the first one-dimensional section measuring unit and the second one-dimensional section measuring unit are respectively used for measuring one-dimensional beam profiles in the horizontal direction and the vertical direction. According to the invention, two one-dimensional section measuring units are formed on the front surface and the back surface of one electrode film, so that the cost is greatly saved, the mechanical part is simplified, the quality and the thickness of the detector are reduced, and the manufacturing cost is reduced.
Description
Technical Field
The invention belongs to the technical field of heavy ion (or proton) tumor treatment technology or beam irradiation effect test, and particularly relates to an ionization chamber detector capable of realizing on-line beam uniformity measurement.
Background
In the prior art, a mesh detector (SEM grid) composed of wires based on the secondary electron principle can also realize beam profile measurement, but is only suitable for the case of large beam intensity. When the flow intensity is low, the detector based on the ionization chamber principle is used, the amplification effect on the beam flow intensity signal is achieved, the weak flow measurement can be achieved, and the application range is wider. The collector has a pixel type and a strip type according to the geometric shape of the collector, the pixel type detector has higher requirement on the number of electronic channels, the cost is increased, and the strip type can meet the basic one-dimensional profile measurement and reduce the electronic requirement. However, the current stripe type performs stripe division in two directions on two electrode films, respectively, increasing the cost and mechanical complexity of the detector.
Disclosure of Invention
The invention aims to provide an ionization chamber detector capable of realizing on-line measurement of beam uniformity so as to simplify mechanical complexity and reduce manufacturing cost.
The invention provides an ionization chamber detector capable of realizing on-line measurement of beam uniformity, which comprises an ionization chamber shell, an ionization chamber inner core unit, an incidence window and an exit window, wherein the ionization chamber inner core unit consists of two high-voltage poles and a signal set, and the signal set is positioned between the two high-voltage poles;
the signal electrode is composed of a first one-dimensional section measuring unit and a second one-dimensional section measuring unit which are respectively formed on the front surface and the back surface of the electrode film, and the first one-dimensional section measuring unit and the second one-dimensional section measuring unit are respectively used for measuring one-dimensional beam profiles in the horizontal direction and the vertical direction.
Further, the high voltage electrode, the signal collector, the entrance window and the exit window are made of thin materials.
Further, the electrode film is a polyimide substrate.
Further, the manufacturing method of the signal pole comprises the following steps:
plating metal layers on two sides of a polyimide substrate, dividing the metal layers into strip-shaped one-dimensional section measuring units by using photoetching or PCB technology, and enabling the first one-dimensional section measuring unit and the second one-dimensional section measuring unit to be perpendicular to each other.
Further, the high voltage electrode is an aluminum-plated organic thin film.
Further, the ionization chamber shell is made of an irradiation-resistant material.
By means of the scheme, the ionization chamber detector capable of realizing on-line measurement of beam uniformity forms two one-dimensional section measurement units on the front side and the back side of one electrode film, so that cost is greatly saved, a mechanical part is simplified, quality and thickness of the detector are reduced, and manufacturing cost is reduced.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical solutions of the present invention more clearly understood and to implement them in accordance with the contents of the description, the following detailed description is given with reference to the preferred embodiments of the present invention and the accompanying drawings.
Drawings
FIG. 1 is a schematic structural diagram of an ionization chamber core unit of an ionization chamber detector capable of realizing on-line measurement of beam uniformity.
Detailed Description
The following detailed description of embodiments of the present invention is provided in connection with the accompanying drawings and examples. The following examples are intended to illustrate the invention but are not intended to limit the scope of the invention.
Referring to fig. 1, the present embodiment provides an ionization chamber detector capable of realizing on-line beam uniformity measurement, including an ionization chamber housing, an ionization chamber inner core unit, an entrance window and an exit window, where the ionization chamber inner core unit (based on a flat plate type ionization chamber) is composed of two high voltage poles 1 and a signal set, the signal set is located between the two high voltage poles 1, and taking the case where a negative high voltage is loaded on a high voltage pole, an electric field is directed to the high voltage pole from the signal set.
The signal electrode is composed of a first one-dimensional section measuring unit 22 and a second one-dimensional section measuring unit 23 respectively formed on the front and back surfaces of the electrode film 21, and the first one-dimensional section measuring unit 22 and the second one-dimensional section measuring unit 23 are respectively used for measuring one-dimensional beam profiles in the horizontal direction and the vertical direction.
According to the ionization chamber detector, the two one-dimensional section measuring units are formed on the front surface and the back surface of one electrode film, so that the cost is greatly saved, the mechanical part is simplified, the quality and the thickness of the detector are reduced, and the manufacturing cost is reduced.
In this embodiment, the high voltage electrode, the signal collector, the entrance window and the exit window are made of thin materials to reduce the thickness and the overall mass of the detector.
In this embodiment, the signal electrode is formed by a photolithography technique or a flexible circuit board technique, metal layers are plated on both sides of a polyimide substrate (electrode film), the metal layers are divided into strip-shaped collectors (one-dimensional profile measuring units) by a photolithography technique or a PCB technique, and front and back strips (the first one-dimensional profile measuring unit 22 and the second one-dimensional profile measuring unit 23) are perpendicular to each other, so that the measurement of two one-dimensional beam profiles in the horizontal and vertical directions is realized.
In this embodiment, the high voltage electrode 1 is an organic thin film (PET film) with a thickness of several micrometers plated with aluminum, which functions to conduct electricity, thereby forming a uniform electric field in the working region.
In this embodiment, the ionization chamber housing is made of radiation-resistant material (radiation-resistant ionization chamber), can be used for beam measurement, has almost negligible influence on beam quality, and can be used in front of a target station or a treatment room.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, it should be noted that, for those skilled in the art, many modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.
Claims (4)
1. An ionization chamber detector capable of realizing on-line measurement of beam uniformity is characterized by comprising an ionization chamber shell, an ionization chamber inner core unit, an entrance window and an exit window, wherein the ionization chamber inner core unit consists of two high-voltage poles and a signal pole, and the signal pole is positioned between the two high-voltage poles;
the signal electrode is composed of a first one-dimensional section measuring unit and a second one-dimensional section measuring unit which are respectively formed on the front surface and the back surface of the electrode film, and the first one-dimensional section measuring unit and the second one-dimensional section measuring unit are respectively used for measuring one-dimensional beam profiles in the horizontal direction and the vertical direction; the electrode film is a polyimide substrate;
the manufacturing method of the signal pole comprises the following steps:
plating metal layers on two surfaces of the polyimide substrate, dividing the metal layers into strip-shaped one-dimensional section measuring units by using photoetching or PCB technology, and enabling the first one-dimensional section measuring unit and the second one-dimensional section measuring unit to be perpendicular to each other.
2. The ionization chamber detector of claim 1, wherein the high voltage electrode, the signal electrode, the entrance window and the exit window are made of thin materials.
3. The ionization chamber detector capable of realizing on-line beam current uniformity measurement according to claim 2, wherein the high-voltage electrode is an aluminum-plated organic thin film.
4. The ionization chamber detector capable of realizing on-line beam current uniformity measurement according to claim 2, wherein the ionization chamber shell is made of an irradiation-resistant material.
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| CN110286403B (en) * | 2019-07-09 | 2020-11-03 | 中国科学院近代物理研究所 | Detector and method for collecting two-dimensional beam profile by staggered charges |
| CN110879409B (en) * | 2019-11-20 | 2021-06-01 | 中国科学院近代物理研究所 | Detector for monitoring density distribution of wide charged particle beams in real time |
| CN111282161B (en) * | 2020-02-28 | 2021-12-28 | 合肥中科离子医学技术装备有限公司 | Beam diagnosis system of proton treatment device |
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| EP2105763A1 (en) * | 2008-03-29 | 2009-09-30 | Ion Beam Applications S.A. | Device and method for measuring characteristics of an ion beam |
| CN201707443U (en) * | 2010-06-13 | 2011-01-12 | 中国科学院近代物理研究所 | Detector for heavy ion beam current transverse dose distribution measurement |
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| CN203674156U (en) * | 2013-12-31 | 2014-06-25 | 中国原子能科学研究院 | Ionization chamber for diagnosing low-energy proton beam |
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| US20100265078A1 (en) * | 2009-04-20 | 2010-10-21 | Integrated Sensors, Llc | Plasma panel based ionizing-particle radiation detector |
| CN101900826B (en) * | 2010-06-13 | 2012-10-03 | 中国科学院近代物理研究所 | Heavy ion beam current transverse dosage distribution measuring detector and two-dimensional imaging method thereof |
| US9551795B2 (en) * | 2013-03-15 | 2017-01-24 | Integrated Sensors, Llc | Ultra-thin plasma radiation detector |
| CN104090292B (en) * | 2014-06-13 | 2018-02-06 | 中国科学院近代物理研究所 | Position sensitive detector for the diagnosis of higher-energy heavy ion beam current |
| CN105738940B (en) * | 2016-04-26 | 2019-02-05 | 西北核技术研究所 | A kind of detector for beam profile uniformity on-line measurement |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2105763A1 (en) * | 2008-03-29 | 2009-09-30 | Ion Beam Applications S.A. | Device and method for measuring characteristics of an ion beam |
| CN201707443U (en) * | 2010-06-13 | 2011-01-12 | 中国科学院近代物理研究所 | Detector for heavy ion beam current transverse dose distribution measurement |
| CN103353605A (en) * | 2013-07-02 | 2013-10-16 | 中国科学院近代物理研究所 | Cross calibration method used for online beam monitoring detector in three-dimensional spot scanning beam distribution |
| CN203674156U (en) * | 2013-12-31 | 2014-06-25 | 中国原子能科学研究院 | Ionization chamber for diagnosing low-energy proton beam |
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