CN108599726B - Both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis method - Google Patents

Both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis method Download PDF

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CN108599726B
CN108599726B CN201810367553.9A CN201810367553A CN108599726B CN 108599726 B CN108599726 B CN 108599726B CN 201810367553 A CN201810367553 A CN 201810367553A CN 108599726 B CN108599726 B CN 108599726B
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solar cell
junction
sub
laser
cascade
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CN108599726A (en
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窦鹏程
冯国斌
张检民
师宇斌
李云鹏
徐作冬
张震
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Northwest Institute of Nuclear Technology
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    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02SGENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10Testing of PV devices, e.g. of PV modules or single PV cells
    • H02S50/15Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Abstract

The present invention provides a kind of both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis methods, to solve the problems, such as that existing analysis method cannot achieve sub- PN junction performance quantitative analysis.The dark spectral response and external quantum efficiency for obtaining formula stacked solar cell, cascade solar cell in both ends to be studied first are composed, then it establishes the system of linear equations of sub- PN junction parallel resistance and it is solved, analyze each sub- PN junction parallel resistance situation of change in damage from laser front and back, in conjunction with its contacting with PN junction physical quantity inside, both ends formula stacked solar cell, cascade solar cell internal injury is analyzed.

Description

Both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis method
Technical field
The present invention relates to a kind of both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis methods.
Background technique
Both ends formula stacked solar cell, cascade solar cell is a kind of efficient solar battery, is by by the single junction cell of several different materials It is connected in series, to realize the efficient utilization of solar spectrum, improves its transfer efficiency.
There are mainly two types of the methods that both ends formula stacked solar cell, cascade solar cell damage from laser situation is analyzed and evaluated at present:
The first: it is defeated to be calculated open-circuit voltage, short circuit current, maximum using I-V characteristic of the device under illumination condition The parameters such as power and fill factor out, so that device performance degree of impairment be analyzed and evaluated;
Second: using means such as quantum efficiency spectrum, electroluminescence spectrums, analyzing sub- PN junction performance change situation, and then right The rapid wear characteristic of sub- PN junction carries out qualitative analysis.2014, appoints and climb et al. through this two kinds of means, realize the three knot GaAs sun Rapid wear specificity analysis under the sub- PN junction high temperature of battery, referring to document, " Ren Pan, Wu Lingyuan, Wang Weiping wait high temperature to lead to three knots too Positive electricity pond electroluminescence spectrum changes [J] laser and optoelectronics progress, 2014,51 (12): 121602. (REN Pan, WU Lingyuan,WANG Weiping.Change of Electroluminescence Spectra of Solar Cells Caused by Heating[J].Laser&Optoelectronics Progress.2014,51(12):121602.)”。
Above method has certain deficiency: first method can not analyze the performance of sub- PN junction;Second of side Method although available sub- PN junction rapid wear characteristic, but it can not be quantitatively described.
Summary of the invention
The present invention is intended to provide a kind of both ends formula stacked solar cell, cascade solar cell laser-induced damage based on dark spectral response point Analysis method can be used for carrying out calculating analysis to the sub- PN junction parallel resistance of device before and after laser irradiation, to solve existing analysis method The problem of cannot achieve sub- PN junction performance quantitative analysis.
Basic principle design of the invention is:
The dark spectral response and quantum efficiency for obtaining formula stacked solar cell, cascade solar cell in both ends to be studied first are composed, and sub- PN is then established It ties the system of linear equations of parallel resistance and it is solved, each sub- PN junction parallel resistance situation of change before and after analysis damage from laser, knot Its contacting with PN junction physical quantity inside is closed, both ends formula stacked solar cell, cascade solar cell internal injury is analyzed.
The technical solution of the invention is as follows:
Both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis method provided by the invention, is characterized in that, packet Include following steps:
1) before and after measurement laser irradiation, dark spectral response characteristic in the sub- PN junction absorption bands of both ends formula stacked solar cell, cascade solar cell; The dark spectral response characteristic includes peak response open-circuit voltage, peak response short circuit current and corresponding dark quantum efficiency;
Before and after setting laser irradiation, peak response open-circuit voltage is respectively ViAnd Vi', peak response short circuit current be respectively IiAnd Ii', corresponding dark quantum efficiency is DEQEiAnd DEQEi′;
Wherein, i represents the serial number of sub- PN junction, i=1, and 2, n;
2) before and after measurement laser irradiation, maximum external quantum efficiency in the sub- PN junction absorption bands of both ends formula stacked solar cell, cascade solar cell, It is denoted as EQE respectivelyiAnd EQEi′;
3) measurement result in step 1) and step 2) is combined, according to following formula, is established before and after laser irradiation respectively, sub- PN junction is simultaneously Join the system of linear equations of resistance, specific as follows:
4) sub- PN junction parallel resistance solution vector R after predose is obtained by the equations of step 3)sh={ Rsh,1, Rsh,2..., Rsh,nAnd Rsh'={ Rsh,1', Rsh,2' ..., Rsh,n′};
5) sub- PN junction parallel resistance value after predose that step 4) obtains is compared, obtains laser irradiation rear and front end Anyon PN junction performance change in formula stacked solar cell, cascade solar cell.
Further, performance change judgment criterion is in step 5) described above:
RshThen defect density is reduced to increase, on the contrary RshIncrease then defect density to reduce.
Further, dark spectral response refers to the photoelectric respone size under monochromatic light irradiation, if response short circuit current is ISC, incident intensity Q, dark spectral response be DSR, h be Planck's constant, q is electron charge, λ is incident monochromatic wavelength, secretly Quantum efficiency expression are as follows:
Beneficial effects of the present invention:
The method of the present invention is simple, principle is reliable, realizes laser irradiation rear and front end formula stacked solar cell, cascade solar cell neutron PN junction The acquisition of parallel resistance, by comparison predose after sub- PN junction parallel resistance size, can be to PN junction after damage from laser inside The analysis of defect density situation of change, to realize the quantitative description of solar cell PN junction rapid wear characteristic eventually.
Detailed description of the invention
Fig. 1 is flow chart of the invention;
Fig. 2 is that formula stacked solar cell, cascade solar cell half-light in both ends composes response theory;
Fig. 3 is the dark quantum efficiency of three-junction solar battery before and after laser irradiation;
Fig. 4 is three-junction solar battery external quantum efficiency before and after laser irradiation;
Specific embodiment
Present invention will be further explained below with reference to the attached drawings and specific embodiments.
Referring to Fig. 1, the both ends formula stacked solar cell, cascade solar cell laser-induced damage provided by the present invention based on dark spectral response Analysis method specifically includes the following steps:
Step 1: before and after measurement laser irradiation, dark spectral response characteristic in the sub- PN junction absorption bands of three-junction solar battery, note Peak response open-circuit voltage is respectively ViAnd Vi', peak response short circuit current is respectively IiAnd Ii', corresponding dark quantum efficiency is DEQEiAnd DEQEi', wherein i represents the serial number of sub- PN junction, i=1, and 2,3;Measurement result is referring to Fig. 3;
Step 2: before and after measurement laser irradiation, maximum external quantum efficiency in the sub- PN junction absorption bands of three-junction solar battery, point EQE is not denoted as itiAnd EQEi', measurement result participates in Fig. 4;
Step 3: in conjunction with measurement result in step 1 and step 2, being based on dark spectral response output principle, establish laser respectively After predose, the system of linear equations of sub- PN junction parallel resistance is specific as follows:
Note: the foundation of equation group depends on the size relation between EQE and DEQE.As EQE > DEQE, show to measure Output electric current when DEQE is smaller, i.e., is tested battery photovoltage and open-circuit voltage sizableness at this time;When EQE=DEQE ≠ 0 When, output electric current is larger when showing to measure DEQE, i.e., is tested sub- PN junction photovoltage at this time and is less than its open-circuit voltage, therefore is approximate Think half when its size is open circuit;As EQE=DEQE=0, show to be tested sub- PN junction entirely ineffective, it is small to be equivalent to one Resistance takes 10 Ω herein.
Step 4: sub- PN junction parallel resistance solution vector R after obtaining predose is solved by step 3sh={ Rsh,1, Rsh,2, Rsh,3And Rsh'={ Rsh,1', Rsh,2', Rsh,3′};
Step 5: sub- PN junction parallel resistance value after predose that step 4) obtains being compared, before and after obtaining laser irradiation Anyon PN junction performance change in three-junction solar battery.
In the present embodiment, laser-induced damage analysis has been carried out to three-junction solar battery sample using method of the invention, Result is analyzed referring to table 1.
Table 1
(note: increase after the irradiation of middle battery parallel resistance be due to measurement accuracy not enough caused by deviation, but its magnitude is become Change does not have an impact.)
R after comparison predosesh,iVariation discovery, Rsh,1There is the reduction of nearly 3 magnitudes, shows that pushing up inside battery lacks It falls into and increases;Rsh,2With Rsh,3Do not occur the variation in magnitude, show in, bottom cell performance degradation it is unobvious.
Theoretical foundation of the invention:
1, ideal PN junction diode current-voltage correlation formula are as follows:
In formula, V is diode both end voltage, and n is Diode Ideality Factor, IsFor diode reverse saturation current, IDFor stream Through diode current;kBFor Boltzmann constant, T is environment temperature, and q is electronic charge.
Relationship between the output Current Voltage of both ends formula stacked solar cell, cascade solar cell and each sub- PN junction Current Voltage are as follows:
Iout=Ii,
Wherein IoutWith VoutThe respectively output electric current and voltage of both ends formula stacked solar cell, cascade solar cell, IiWith ViRespectively i-th The output electric current and voltage of sub- PN junction.
2, dark measurement of spectral response principle and physical meaning:
The both ends dark spectral response of formula stacked solar cell, cascade solar cell refers to its photoelectric respone size under monochromatic light irradiation.It is general By the response short circuit current I of deviceSCIts dark spectral response (DSR), dark quantum efficiency are defined as with the ratio of incident intensity Q (DEQE) expression formula is as follows:
Wherein h is Planck's constant, and q is electron charge, and λ is incident monochromatic wavelength.Response current physical meaning is explained It is as follows:
When a monochromic beam is incident on both ends formula stacked solar cell, cascade solar cell surface, then some matched son can be absorbed wherein Photovoltage V is generated in PN junctioni, due to the additional zero-bias of device at this time, will lead to that generate one at remaining PN junction both ends big Small and ViEqual reverse biased, thus generate conducting electric current and be output to device both ends, size ISC(referring to attached drawing 2), then ViWith ISCRatio be in reverse-biased under the conditions of sub- PN junction parallel resistance the sum of series connection.Therefore, by battery half-light Spectrum response voltage ViWith response current ISCThe measurement of two parameter can realize the analysis of sub- PN junction parallel resistance.
3, PN junction parallel resistance RshFor a circuit level equivalent parameters, for analyzing PN junction leakage current, including PN junction The leakage current of internal leakage current and knot edge.
The generation of leakage current is mainly derived from the recombination current inside PN junction, and the power and defect density of recombination current It is positively correlated.Defect density is bigger, then it is stronger to correspond to complex effect, causes photogenerated current to reduce, is equivalent to parallel resistance RshDrop It is low.Therefore pass through analysis equivalent parallel resistance RshVariation, defect density situation of change in PN junction can be obtained.

Claims (3)

1. a kind of both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis method, which comprises the following steps:
1) before and after measurement laser irradiation, dark spectral response characteristic in the sub- PN junction absorption bands of both ends formula stacked solar cell, cascade solar cell;It is described Dark spectral response characteristic includes peak response open-circuit voltage, peak response short circuit current and corresponding dark quantum efficiency;
Before and after setting laser irradiation, peak response open-circuit voltage is respectively ViAnd Vi', peak response short circuit current be respectively IiWith Ii', corresponding dark quantum efficiency is DEQEiAnd DEQEi′;
Wherein, i represents the serial number of sub- PN junction, i=1, and 2, n;
2) before and after measurement laser irradiation, maximum external quantum efficiency in the sub- PN junction absorption bands of both ends formula stacked solar cell, cascade solar cell, respectively It is denoted as EQEiAnd EQEi′;
3) measurement result in step 1) and step 2) is combined, according to following formula, is established before and after laser irradiation respectively, sub- PN junction electricity in parallel The system of linear equations of resistance, specific as follows:
4) sub- PN junction parallel resistance solution vector R after predose is obtained by the equations of step 3)sh={ Rsh,1, Rsh,2..., Rsh,nAnd Rsh'={ Rsh,1', Rsh,2' ..., Rsh,n′};
5) sub- PN junction parallel resistance value after predose that step 4) obtains is compared, it is folded obtains laser irradiation rear and front end formula Anyon PN junction performance change in layer solar cell.
2. both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis method according to claim 1, it is characterised in that: described Performance change judgment criterion is in step 5):
RshThen defect density is reduced to increase, on the contrary RshIncrease then defect density to reduce.
3. both ends formula stacked solar cell, cascade solar cell laser-induced damage analysis method according to claim 1, it is characterised in that: half-light Spectrum response refers to the photoelectric respone size under monochromatic light irradiation, if response short circuit current is ISC, incident intensity Q, half-light spectrum Response be DSR, h be Planck's constant, q is electron charge, λ is incident monochromatic wavelength, dark quantum efficiency expression are as follows:
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1564013A (en) * 2004-04-22 2005-01-12 上海交通大学 Testing method for effective diffusion length of solar cell
CN102866163A (en) * 2012-09-06 2013-01-09 中国科学院上海光学精密机械研究所 Apparatus and method for detecting laser injury
CN104882512A (en) * 2014-05-12 2015-09-02 江西瑞晶太阳能科技有限公司 Method for increasing parallel resistance of crystalline silicon battery piece
JP2016149890A (en) * 2015-02-13 2016-08-18 国立研究開発法人産業技術総合研究所 Evaluation method and evaluation device for solar cell
CN107290637A (en) * 2017-06-09 2017-10-24 西北核技术研究所 Single PN kink type device laser-induced damage analysis method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1564013A (en) * 2004-04-22 2005-01-12 上海交通大学 Testing method for effective diffusion length of solar cell
CN102866163A (en) * 2012-09-06 2013-01-09 中国科学院上海光学精密机械研究所 Apparatus and method for detecting laser injury
CN104882512A (en) * 2014-05-12 2015-09-02 江西瑞晶太阳能科技有限公司 Method for increasing parallel resistance of crystalline silicon battery piece
JP2016149890A (en) * 2015-02-13 2016-08-18 国立研究開発法人産業技術総合研究所 Evaluation method and evaluation device for solar cell
CN107290637A (en) * 2017-06-09 2017-10-24 西北核技术研究所 Single PN kink type device laser-induced damage analysis method

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