CN108572305B - Method and device for automatically debugging static operating point of amplifier - Google Patents
Method and device for automatically debugging static operating point of amplifier Download PDFInfo
- Publication number
- CN108572305B CN108572305B CN201710151113.5A CN201710151113A CN108572305B CN 108572305 B CN108572305 B CN 108572305B CN 201710151113 A CN201710151113 A CN 201710151113A CN 108572305 B CN108572305 B CN 108572305B
- Authority
- CN
- China
- Prior art keywords
- amplifier
- debugged
- resistor
- external circuit
- drain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Amplifiers (AREA)
Abstract
The invention relates to the technical field of electronics, in particular to a method and a device for automatically debugging a static operating point of an amplifier. The method comprises the following steps: when the fact that the debugged amplifier needs to be debugged at the static working point is determined, the gate voltage value of the debugged amplifier is adjusted, the output voltage value of the external circuit corresponding to the gate voltage value of the debugged amplifier is obtained, the drain current value of the debugged amplifier is calculated, and when the drain current value of the debugged amplifier is judged to meet the preset condition, the fact that the debugged amplifier is debugged at the static working point is determined to be completed. By adopting the method, the static working point of the amplifier can be automatically debugged, the debugging is not limited to be carried out only by professional debugging personnel, the debugging process is simple, the time and the human resource required by the debugging are reduced, and the debugging efficiency is further improved.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a method and a device for automatically debugging a static operating point of an amplifier.
Background
With the continuous development of scientific technology, the application of the amplifier in practice is more and more extensive. For the gaas or gan amplifier, a gate voltage is required to be configured on the gate to adjust the quiescent point of the gaas or gan amplifier, and the quiescent point of each gaas or gan amplifier needs to be adjusted.
In the prior art, the following method is usually adopted to adjust the quiescent operating point of the gaas or gan amplifier. Fig. 1 is a schematic diagram illustrating a method for adjusting a quiescent operating point of an amplifier in the prior art. In the process of debugging the quiescent operating point of a gallium arsenide or gallium nitride amplifier, firstly, a resistor RA between a drain power supply and a drain of the amplifier needs to be disconnected, and an ammeter is connected into a drain circuit; then, controlling a Digital-to-Analog Converter (DAC) to output different grid voltages, and completing debugging of the static working point of the amplifier when determining that the drain current meets the requirements of the amplifier; finally, the resistor RA is re-soldered.
However, the method for debugging the static operating point of the amplifier needs a professional debugging person to perform the debugging operation, and the debugging step of the static operating point of the amplifier is complicated, the debugging efficiency is not high, and a lot of time and labor are consumed.
In summary, it is necessary to design a new method and device for debugging the quiescent operating point of an amplifier to overcome the drawbacks and deficiencies of the prior art.
Disclosure of Invention
The embodiment of the invention provides a method and a device for automatically debugging a static working point of an amplifier, which are used for solving the problems of complicated debugging steps of the static working point of the amplifier, and low debugging efficiency caused by consumption of a large amount of time and labor in the prior art.
The embodiment of the invention provides the following specific technical scheme:
an apparatus for automatically debugging the quiescent point of an amplifier at least comprises a calculation controller, a digital-to-analog converter, a debugged amplifier drain power supply, a current detection resistor, an external circuit and an analog-to-digital converter,
the calculation controller is respectively connected with the digital-to-analog converter, the debugged amplifier drain power supply and the analog-to-digital converter, and is used for configuring the digital-to-analog converter, controlling the on-off of the debugged amplifier drain power supply, calculating the debugged amplifier drain current based on data fed back by the analog-to-digital converter, and determining that the debugged amplifier static working point is debugged when the debugged amplifier drain current is judged to be equal to a preset static current;
the digital-to-analog converter is connected with the grid electrode of the debugged amplifier and is used for adjusting the grid electrode voltage of the debugged amplifier based on the configuration of the calculation controller;
the drain electrode power supply of the debugged amplifier is respectively connected with the current detection resistor and the first node of the external circuit and is used for providing power supply voltage for the drain electrode of the debugged amplifier;
the current detection resistor is respectively connected with the drain electrode of the debugged amplifier and a second node of the external circuit;
the external circuit is connected with the analog-to-digital converter and used for obtaining corresponding output voltage according to the input of a first node and a second node of the external circuit;
and the analog-to-digital converter is used for performing analog-to-digital conversion on the basis of the output voltage obtained by the external circuit and feeding back the converted data to the control calculator.
Optionally, the external circuit further includes a first resistor, a second resistor, a third resistor, a fourth resistor, and an operational amplifier, wherein,
the non-inverting input end of the operational amplifier is connected with a first node of the operational amplifier through a first resistor, and the non-inverting input end of the operational amplifier is grounded through a second resistor;
the inverting input end of the operational amplifier is connected with the second node of the operational amplifier through a third resistor, and the inverting input end of the operational amplifier is connected with the output end of the operational amplifier through a fourth resistor.
Optionally, the first resistor and the third resistor have the same resistance;
the second resistor and the fourth resistor have the same resistance value.
Optionally, the current detection resistor is a precision resistor.
A method of automatically debugging a quiescent operating point of an amplifier, comprising:
when the fact that the debugged amplifier needs to be debugged at a static working point is determined, adjusting the gate voltage value of the debugged amplifier;
acquiring an output voltage value of an external circuit corresponding to the grid voltage of the debugged amplifier, calculating the drain current value of the debugged amplifier, and judging whether the drain current value of the debugged amplifier meets a preset condition;
and when the drain electrode current value of the debugged amplifier is judged to meet the preset condition, determining that the debugging of the static working point of the debugged amplifier is finished.
Optionally, after determining that the debugged amplifier needs to perform static operating point debugging, before adjusting the gate voltage of the debugged amplifier, the method further includes:
setting an initial value of the gate voltage of the debugged amplifier.
Optionally, setting an initial value of the gate voltage of the debugged amplifier specifically includes:
determining a minimum gate voltage value that the debugged amplifier can withstand;
configuring a digital-to-analog converter connected to a gate of the debuggee amplifier so that an initial output voltage value of the digital-to-analog converter is equal to a minimum gate voltage value which can be borne by the debuggee amplifier;
setting the initial output voltage value of the digital-to-analog converter as the initial value of the gate voltage of the debugged amplifier.
Optionally, obtaining an output voltage value of an external circuit corresponding to the gate voltage of the debugged amplifier, and calculating a drain current value of the debugged amplifier, specifically including:
performing analog-to-digital conversion processing on the output voltage of the external circuit based on an analog-to-digital converter connected with the output end of the external circuit to obtain the output voltage value of the external circuit;
and calculating the drain current value of the debugged amplifier based on the output voltage value of the external circuit.
Optionally, when it is determined that the drain current value of the debugged amplifier meets the preset condition, determining that the debugging of the static operating point of the debugged amplifier is completed, specifically including:
determining the quiescent operating current of the debugged amplifier;
and when the drain current of the debugged amplifier is judged to be equal to the static working current, determining that the debugging of the static working point of the debugged amplifier is finished.
Optionally, further comprising:
and monitoring the drain current of the debugged amplifier in real time, and reducing the gate voltage of the debugged amplifier and/or turning off the drain power supply of the debugged amplifier when the drain current of the debugged amplifier is judged to be larger than a set threshold value.
The invention has the following beneficial effects:
in summary, in the embodiment of the present invention, in the process of debugging the quiescent operating point of the amplifier, when it is determined that the debugged amplifier needs to perform the quiescent operating point debugging, the gate voltage value of the debugged amplifier is adjusted, the output voltage value of the external circuit corresponding to the gate voltage value of the debugged amplifier is obtained, the drain current value of the debugged amplifier is calculated, and when it is determined that the drain current value of the debugged amplifier meets the preset condition, it is determined that the debugging of the quiescent operating point of the debugged amplifier is completed. By adopting the method, the static working point of the amplifier can be automatically debugged, the debugging is not limited to be carried out only by professional debugging personnel, the debugging process is simple, the time and the human resource required by the debugging are reduced, and the debugging efficiency is further improved.
Drawings
FIG. 1 is a diagram illustrating a method for adjusting a quiescent operating point of an amplifier according to the prior art;
FIG. 2 is a schematic diagram of a circuit for debugging a quiescent point of an amplifier according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of an external circuit according to an embodiment of the present invention;
fig. 4 is a detailed flowchart of a method for automatically adjusting the quiescent operating point of an amplifier according to an embodiment of the present invention.
Detailed Description
The method aims to solve the problems that the debugging steps of the static working point of the amplifier are complicated, a large amount of time and labor are consumed, and therefore the debugging efficiency is not high in the prior art. The embodiment of the invention provides a method and a device for automatically debugging a static operating point of an amplifier. The method comprises the following steps: when the fact that the debugged amplifier needs to be debugged at the static working point is determined, the gate voltage value of the debugged amplifier is adjusted, the output voltage value of the external circuit corresponding to the gate voltage value of the debugged amplifier is obtained, the drain current value of the debugged amplifier is calculated, and when the drain current value of the debugged amplifier is judged to meet the preset condition, the fact that the debugged amplifier is debugged at the static working point is determined to be completed.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The scheme of the present invention will be described in detail by way of specific examples, but the present invention is not limited to the following examples.
Referring to fig. 2, a schematic circuit structure of an auto-debugging amplifier quiescent operating point according to an embodiment of the present invention at least includes a calculation controller 20, a digital-to-analog converter 21, a debugged amplifier drain power supply 22, a current detection resistor 23, an external circuit 24, and an analog-to-digital converter 25, wherein,
and the calculation controller 20 is connected with the digital-to-analog converter 21, the debugged amplifier drain power supply 22 and the analog-to-digital converter 25, and is configured to configure the digital-to-analog converter 21, control on/off of the debugged amplifier drain power supply 22, calculate the debugged amplifier drain current based on data fed back by the analog-to-digital converter 25, and determine that the debugged amplifier static operating point is debugged when the debugged amplifier drain current is determined to be equal to the preset static current.
And a digital-to-analog converter 21 connected to the gate of the debugged amplifier for adjusting the debugged amplifier gate voltage based on the configuration of the calculation controller 20.
And the drain power supply 22 of the debugged amplifier is respectively connected with the current detection resistor 23 and a first node of the external circuit 24 and used for providing power supply voltage for the drain of the debugged amplifier.
And the current detection resistor 23 is respectively connected with the drain of the debugged amplifier and the second node of the external circuit 24, and preferably, the current detection resistor 23 is a precision resistor.
And the external circuit 24 is connected with the analog-to-digital converter 25 and is used for obtaining corresponding output voltage according to the input of the first node and the second node of the external circuit 24.
And the analog-to-digital converter 25 is configured to perform analog-to-digital conversion based on the output voltage obtained by the external circuit 24, and feed back the converted data to the control calculator 20.
Referring to fig. 3, in the embodiment of the present invention, a circuit structure of the external circuit 24 is schematically illustrated. Specifically, the external circuit 24 includes a first resistor 30, a second resistor 31, a third resistor 32, a fourth resistor 33 and an operational amplifier 34, wherein,
the non-inverting input of the operational amplifier 34 is connected to the first node of the operational amplifier 34 through the first resistor 30, and the non-inverting input of the operational amplifier 34 is connected to ground through the second resistor 31.
The inverting input terminal of the operational amplifier 34 is connected to the second node of the operational amplifier 34 through the third resistor 32, and the inverting input terminal of the operational amplifier 34 is connected to the output terminal of the operational amplifier 34 through the fourth resistor 33.
Preferably, the first resistor 30 and the third resistor 32 have the same resistance, and the second resistor 31 and the fourth resistor 33 have the same resistance.
Referring to fig. 4, in the embodiment of the present invention, a detailed flow of a method for automatically debugging a quiescent operating point of an amplifier is as follows:
step 400: and when the debugged amplifier is determined to need to be debugged at the static operating point, adjusting the gate voltage of the debugged amplifier.
In practical applications, when step 400 is executed, when an amplifier static operating point debugging instruction is received, it is determined that the amplifier to be debugged needs to perform static operating point debugging.
However, before adjusting the gate voltage value of the debugged amplifier, it is further required to preset an initial value of the gate voltage of the debugged amplifier, specifically, first, a minimum voltage value that can be borne by the gate of the debugged amplifier is determined; then, configuring a Digital to analog converter (DAC) connected to the gate of the debuggee amplifier, so that the initial output voltage value of the DAC is equal to the minimum voltage value that can be borne by the gate of the debuggee amplifier; and finally, setting the initial output voltage value of the DAC as the initial value of the gate voltage of the debugged amplifier.
For example, assuming that the amplifier to be debugged is a gaas amplifier, the minimum voltage value that the gate of the gaas amplifier can withstand is determined to be-10 v, and then the output voltage of the dac connected to the gate of the gaas amplifier is set to-10 v, where the output voltage of the dac is the gate voltage value of the gaas amplifier.
The amplifier gate voltage is negative, namely the amplifier gate voltage value is less than or equal to 0. Then, in the embodiment of the present invention, when the amplifier gate voltage is 0 v, the gate voltage is the maximum.
For example, assuming that the amplifier to be debugged is a gaas amplifier and the initial gate voltage of the gaas amplifier is-5 v, if the gaas gate voltage is raised from-5 v to-4 v, it is determined that the gaas gate voltage is increased.
Further, the drain power supply of the debugged amplifier is turned on to obtain the power supply voltage of the drain of the debugged amplifier, wherein the power supply voltage passes through the current detection resistor to obtain the reduced drain voltage of the debugged amplifier.
Step 410: and acquiring an output voltage value of an external circuit corresponding to the grid voltage of the debugged amplifier, calculating the drain current value of the debugged amplifier, and judging whether the drain current value of the debugged amplifier meets a preset condition.
In practical applications, the gate voltage of the debugged amplifier may change the resistance between the drain and the source of the debugged amplifier, where the larger the gate voltage of the debugged amplifier is, the smaller the internal resistance of the debugged amplifier is, the smaller the total resistance between the drain and the source of the debugged amplifier is, so that the output voltage of the external circuit is increased, and further the drain current of the debugged amplifier is increased.
In the embodiment of the present invention, first, the gate voltage of the debugged amplifier is set to the minimum voltage value that the gate of the debugged amplifier can bear, and certainly, the gate voltage of the amplifier is a voltage less than or equal to 0 volt; then, increasing the gate voltage value of the debugged amplifier according to a fixed step length, simultaneously performing operational amplification processing on the voltage difference between two ends of a current detection resistor by using an external circuit after the gate voltage value of the debugged amplifier is increased once, and calculating the output voltage value of the external circuit by using an Analog to Digital Converter (ADC) connected with the output end of the external circuit; and finally, calculating the drain current of the debugged amplifier based on the output voltage value of the external circuit, a first resistor, a second resistor, a third resistor, a fourth resistor and a current detection resistor, wherein the first resistor and the third resistor have the same resistance value, and the second resistor and the fourth resistor have the same resistance value.
For example, assuming that the amplifier to be debugged is a gaas amplifier, the minimum voltage value that the gate of the gaas amplifier can bear is-10 v, the resistance of the current detection resistor is 1 ohm, and assuming that the first resistor and the third resistor included in the external circuit have the same resistance (i.e., R1 ═ R3 ═ 10 kohm), and the second resistor and the fourth resistor have the same resistance (i.e., R2 ═ R4 ═ 5 kohm), then in the initial stage, the DAC connected to the gate of the gaas amplifier needs to be adjusted so that the output voltage of the DAC is-10 v, and of course, the output voltage of the DAC is the gate voltage of the gaas amplifier; then, increasing the voltage value of the gallium arsenide grid according to a preset step length, using an external circuit to perform operational amplification processing on the voltage difference between two ends of a current detection resistor, outputting an analog quantity voltage signal V for expressing the output voltage by an output end of a finishing circuit, and inputting the analog quantity voltage signal into an ADC (analog-to-digital converter) connected with the output end of the external circuit for analog-to-digital conversion processing to obtain the output voltage value of the external circuit, wherein the output voltage value of the external circuit is 300 millivolts; and finally, calculating the drain current of the gallium arsenide amplifier by using an external circuit output voltage, a first resistor (a third resistor) and a second resistor (a fourth resistor): i is (300mV/1 Ω) × (10k Ω/5k Ω), and is known to be 600 mA.
In the embodiment of the present invention, when the gate voltage value of the debugged amplifier is the minimum voltage value that can be borne by the gate of the debugged amplifier, at this time, the drain current of the debugged amplifier is the minimum, and the size of the gate voltage adjustment step of the debugged amplifier may be preset according to needs, which is not described herein again.
Step 420: and when the drain current of the debugged amplifier is judged to meet the preset condition, determining that the debugging of the static working point of the debugged amplifier is finished.
In practical applications, in the embodiment of the present invention, when step 420 is executed, it is determined whether the drain current of the debugged amplifier is equal to the static operating current of the debugged amplifier, and when the drain current of the debugged amplifier is determined to be equal to the static operating current of the debugged amplifier, it is determined that the debugging of the static operating point of the debugged amplifier is completed.
Specifically, whether the drain current of the debugged amplifier is the same as the static working current of the debugged amplifier is judged, and if the drain current of the debugged amplifier is judged to be equal to the static working current of the debugged amplifier, the current gate voltage value of the debugged amplifier is recorded and maintained, and the completion of debugging of the static working point of the debugged amplifier is determined.
For example, assuming that the amplifier to be debugged is a gaas amplifier, the initial value of the gate voltage of the gaas amplifier is-5 v, and at this time, the drain current of the corresponding gaas amplifier is the minimum, and assuming that 0, the quiescent current of the gaas amplifier is 200 ma. Then, when the gate voltage of the gallium arsenide amplifier is increased to-3 v, the gallium arsenide amplifier static operating point is determined to be debugged by obtaining the output voltage of the external circuit corresponding to the gate voltage of the gallium arsenide amplifier and calculating that the drain current of the gallium arsenide amplifier is equal to the static operating current (i.e. 200 ma) of the gallium arsenide amplifier.
If the drain current of the debugged amplifier is not equal to the quiescent operating current of the debugged amplifier, the gate voltage of the gallium arsenide amplifier is continuously increased, and corresponding calculation processing is performed to obtain a corresponding drain current until the drain current of the gallium arsenide amplifier is equal to the quiescent operating current of the gallium arsenide amplifier, which is not described herein again.
For example, assuming that the amplifier to be debugged is a gaas amplifier, the initial value of the gate voltage of the gaas amplifier is-8 v, and at this time, the drain current of the corresponding gaas amplifier is the minimum, and assuming that 0, the quiescent current of the gaas amplifier is 400 ma. Then, when the gate voltage of the gallium arsenide amplifier is increased to-5 v, by obtaining the output voltage of the external circuit corresponding to the gate voltage of the gallium arsenide amplifier and calculating the drain current of the gallium arsenide amplifier to be 200 ma, the drain current of the gallium arsenide amplifier is smaller than the static working current of the gallium arsenide amplifier (i.e. 200 ma < 400 ma), the gate voltage of the gallium arsenide amplifier is continuously increased, and corresponding calculation processing is performed to obtain the corresponding drain current, and whether the drain current of the gallium arsenide amplifier is the same as the static working current is judged.
Further, in practical applications, during a normal operation of the debugged amplifier, the debugged amplifier may be overloaded and/or overheated, and at this time, the drain current of the debugged amplifier may increase and exceed a normal range value, so that the debugged amplifier may be burned out due to an excessive drain current of the debugged amplifier. In the embodiment of the invention, because the drain current of the debugged amplifier can be monitored in real time, when the drain current of the debugged amplifier is judged to be larger than the set threshold value, the grid voltage of the debugged amplifier is reduced and/or the drain power supply of the debugged amplifier is turned off.
Specifically, in the normal working process of the debugged amplifier, an analog-to-digital converter connected to an output end of an external circuit is used to read an output voltage value of the external circuit in real time, calculate a drain current of the debugged amplifier based on the output voltage value of the external circuit, and determine whether the drain current of the debugged amplifier is greater than a set threshold, where when determining that the drain current of the debugged amplifier is greater than the set threshold, the method includes, but is not limited to, performing any one or a combination of the following two operations:
the first operation is: the gate voltage value of the debugged amplifier is reduced to reduce the drain current of the debugged amplifier so as to avoid the debugged amplifier from being burnt, and preferably, a drain current overload warning can be further sent.
For example, assuming that the amplifier to be debugged is a gallium arsenide amplifier, a threshold value is set to be 600 milliamperes for the drain current of the gallium arsenide amplifier, an output voltage value of an external circuit obtained after conversion by an analog-to-digital converter is read in real time, the drain current of the gallium arsenide amplifier in normal operation is calculated, and when the drain current of the gallium arsenide amplifier is determined to be greater than 600 milliamperes, the gate voltage of the gallium arsenide amplifier is reduced, and a warning of drain current overload is sent.
The second operation is: and turning off the drain power supply of the debugged amplifier to turn off the operational amplifier, thereby avoiding the debugged amplifier from being burnt.
For example, assuming that the amplifier to be debugged is a gallium arsenide amplifier, a threshold value is set to be 600 milliamperes for the drain current of the gallium arsenide amplifier, an output voltage value of an external circuit obtained after conversion by an analog-to-digital converter is read in real time, the drain current of the gallium arsenide amplifier in normal operation is calculated, and when the drain current of the gallium arsenide amplifier is determined to be greater than 600 milliamperes, a drain power supply of the gallium arsenide amplifier is turned off to turn off the gallium arsenide amplifier and send an alarm of drain current overload.
Furthermore, if a plurality of debugged amplifiers exist on one circuit board, the plurality of debugged amplifiers can be debugged at the static operating points in sequence by adopting an ADC and switch mode, so that the hardware cost is reduced, and the operation performance of each debugged amplifier can be ensured.
For example, if the circuit board is provided with the debugged amplifier 1, the debugged amplifier 2, and the debugged amplifier 3, and only one ADC is installed, when the static operating point of the debugged amplifier 1 needs to be debugged, the switch between the debugged amplifier 1 and the ADC is closed, and the static operating point of the debugged amplifier 1 is debugged.
In summary, in the embodiment of the present invention, in the process of debugging the quiescent operating point of the amplifier, when it is determined that the debugged amplifier needs to perform the quiescent operating point debugging, the gate voltage value of the debugged amplifier is adjusted, the output voltage value of the external circuit corresponding to the gate voltage value of the debugged amplifier is obtained, the drain current value of the debugged amplifier is calculated, and when it is determined that the drain current value of the debugged amplifier meets the preset condition, it is determined that the debugging of the quiescent operating point of the debugged amplifier is completed. By adopting the method, the static working point of the amplifier can be automatically debugged, the debugging is not limited to be carried out only by professional debugging personnel, the debugging process is simple, the time and the human resource required by the debugging are reduced, and the debugging efficiency is further improved.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various modifications and variations can be made in the embodiments of the present invention without departing from the spirit or scope of the embodiments of the invention. Thus, if such modifications and variations of the embodiments of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to encompass such modifications and variations.
Claims (8)
1. An apparatus for automatically debugging the quiescent point of an amplifier at least comprises a calculation controller, a digital-to-analog converter, a debugged amplifier drain power supply, a current detection resistor, an external circuit and an analog-to-digital converter,
the calculation controller is respectively connected with the digital-to-analog converter, the debugged amplifier drain power supply and the analog-to-digital converter, and is used for configuring the digital-to-analog converter, controlling the on-off of the debugged amplifier drain power supply, calculating the debugged amplifier drain current based on data fed back by the analog-to-digital converter, and determining that the debugged amplifier static working point is debugged when the debugged amplifier drain current is judged to be equal to a preset static current;
the digital-to-analog converter is connected with the grid electrode of the debugged amplifier and is used for adjusting the grid electrode voltage of the debugged amplifier based on the configuration of the calculation controller;
the drain electrode power supply of the debugged amplifier is respectively connected with the current detection resistor and the first node of the external circuit and is used for providing power supply voltage for the drain electrode of the debugged amplifier;
the current detection resistor is respectively connected with the drain electrode of the debugged amplifier and a second node of the external circuit;
the external circuit is connected with the analog-to-digital converter and used for obtaining corresponding output voltage according to the input of a first node and a second node of the external circuit;
and the analog-to-digital converter is used for performing analog-to-digital conversion on the basis of the output voltage obtained by the external circuit and feeding back the converted data to the computing controller.
2. The apparatus of claim 1, wherein the external circuit further comprises a first resistor, a second resistor, a third resistor, a fourth resistor, and an operational amplifier, wherein,
the non-inverting input end of the operational amplifier is connected with a first node of the operational amplifier through a first resistor, and the non-inverting input end of the operational amplifier is grounded through a second resistor;
the inverting input end of the operational amplifier is connected with the second node of the operational amplifier through a third resistor, and the inverting input end of the operational amplifier is connected with the output end of the operational amplifier through a fourth resistor.
3. The apparatus of claim 2, wherein the first and third resistors are the same resistance;
the second resistor and the fourth resistor have the same resistance value.
4. The apparatus of any of claims 1-3, wherein the current sensing resistor is a precision resistor.
5. A method for automatically adjusting a quiescent operating point of an amplifier, comprising:
determining a minimum gate voltage value that can be borne by a debugged amplifier;
configuring a digital-to-analog converter connected to a gate of the debuggee amplifier so that an initial output voltage value of the digital-to-analog converter is equal to a minimum gate voltage value which can be borne by the debuggee amplifier;
setting an initial output voltage value of the digital-to-analog converter as an initial value of the gate voltage of the debugged amplifier;
when the fact that the debugged amplifier needs to be debugged at a static working point is determined, adjusting the gate voltage value of the debugged amplifier;
acquiring an output voltage value of an external circuit corresponding to the grid voltage of the debugged amplifier, calculating the drain current value of the debugged amplifier, and judging whether the drain current value of the debugged amplifier meets a preset condition;
and when the drain electrode current value of the debugged amplifier is judged to meet the preset condition, determining that the debugging of the static working point of the debugged amplifier is finished.
6. The method of claim 5, wherein obtaining an external circuit output voltage value corresponding to the gate voltage of the debugged amplifier and calculating the drain current value of the debugged amplifier comprises:
performing analog-to-digital conversion processing on the output voltage of the external circuit based on an analog-to-digital converter connected with the output end of the external circuit to obtain the output voltage value of the external circuit;
and calculating the drain current value of the debugged amplifier based on the output voltage value of the external circuit.
7. The method of claim 5, wherein determining that the debugging of the static operating point of the debugged amplifier is completed when it is determined that the drain current value of the debugged amplifier satisfies a preset condition, specifically comprises:
determining the quiescent operating current of the debugged amplifier;
and when the drain current of the debugged amplifier is judged to be equal to the static working current, determining that the debugging of the static working point of the debugged amplifier is finished.
8. The method of claim 5, further comprising:
and monitoring the drain current of the debugged amplifier in real time, and reducing the gate voltage of the debugged amplifier and/or turning off the drain power supply of the debugged amplifier when the drain current of the debugged amplifier is judged to be larger than a set threshold value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710151113.5A CN108572305B (en) | 2017-03-14 | 2017-03-14 | Method and device for automatically debugging static operating point of amplifier |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710151113.5A CN108572305B (en) | 2017-03-14 | 2017-03-14 | Method and device for automatically debugging static operating point of amplifier |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108572305A CN108572305A (en) | 2018-09-25 |
| CN108572305B true CN108572305B (en) | 2020-04-14 |
Family
ID=63577235
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710151113.5A Active CN108572305B (en) | 2017-03-14 | 2017-03-14 | Method and device for automatically debugging static operating point of amplifier |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108572305B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110661501B (en) * | 2019-08-29 | 2021-09-24 | 电子科技大学 | Automatic locking circuit for setting quiescent point of power amplifier |
| CN114094949A (en) * | 2021-11-12 | 2022-02-25 | 中国电子科技集团公司第二十九研究所 | Universal amplifier initialization circuit, device and method |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IL125022A (en) * | 1998-06-21 | 2001-09-13 | Israel Bar David | Methods and apparatus for adaptive adjustment of feed-forward linearized amplifiers |
| CN104698360B (en) * | 2013-12-06 | 2017-12-05 | 北京北广科技股份有限公司 | The adjustment method of power amplifier module |
-
2017
- 2017-03-14 CN CN201710151113.5A patent/CN108572305B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN108572305A (en) | 2018-09-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA2858701A1 (en) | Fault location system and method for distribution network | |
| CN103268144A (en) | Power monitoring device and overcurrent protection method | |
| CN108572305B (en) | Method and device for automatically debugging static operating point of amplifier | |
| CN103092246B (en) | Power supply monitoring system and method | |
| TW201606473A (en) | Power system and control device | |
| CN104954935B (en) | Audio device and its control method | |
| CN110988563B (en) | UPS (uninterrupted Power supply) fault detection method, device, equipment and storage medium | |
| CN110046083B (en) | Automatic gray level release method and device | |
| US20180267567A1 (en) | Operation mode determination circuit and method thereof | |
| CN108886267B (en) | Circuit control method and device in remote power supply system, remote power supply and system | |
| US20160226241A1 (en) | Hotswap operations for programmable logic devices | |
| CN111817332A (en) | Method and device for power coordination control of direct current transmission system and storage medium | |
| CN115113058A (en) | Following method for displaying SOC value of battery and related device | |
| KR102151417B1 (en) | Smooth vi mode crossover method at compliance limit threshold | |
| CN112834898A (en) | Method, device and equipment for testing stability of power supply chip of storage equipment | |
| CN109292573B (en) | Brake coil detection method, device, equipment and storage medium | |
| CN111322233A (en) | Sampling circuit and method for improving precision, compressor and air conditioning equipment | |
| CN110389249B (en) | Detection device | |
| CN111064174A (en) | Voltage adaptation method, device and storage medium | |
| US9823295B2 (en) | Battery simulator | |
| CN110112699B (en) | Method and system for powering up chip again after power supply is interrupted momentarily | |
| CN112732498A (en) | Test method, device, equipment and storage medium for simulating single-point power-on and power-off of equipment | |
| CN111030121B (en) | Method and system for obtaining power grid load flow distribution after ultrahigh voltage power grid disconnection | |
| CN110173805B (en) | Air conditioner and communication control method and device thereof | |
| CN107482724B (en) | Charging control method and device and computer readable storage medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20220609 Address after: 100085 1st floor, building 1, yard 5, Shangdi East Road, Haidian District, Beijing Patentee after: DATANG MOBILE COMMUNICATIONS EQUIPMENT Co.,Ltd. Patentee after: Shanghai Datang Mobile Communication Equipment Co., Ltd Address before: 100083 No. 29, Haidian District, Beijing, Xueyuan Road Patentee before: DATANG MOBILE COMMUNICATIONS EQUIPMENT Co.,Ltd. |