CN108535521B - Four-wire resistance-adjusting probe card - Google Patents
Four-wire resistance-adjusting probe card Download PDFInfo
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- CN108535521B CN108535521B CN201810443863.4A CN201810443863A CN108535521B CN 108535521 B CN108535521 B CN 108535521B CN 201810443863 A CN201810443863 A CN 201810443863A CN 108535521 B CN108535521 B CN 108535521B
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- resistor
- probe
- circuit board
- group
- probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention relates to a testing device of an electronic component, in particular to a four-wire resistance-adjusting probe card. Comprises at least one resistor group; a plurality of probes; wherein one end of each probe is connected to the resistor group; a circuit board; the resistor groups are connected with the circuit board. The invention has the advantages of no need of changing the original program of the equipment for measurement, reduced cost, reduced line connection, reduced measurement error, no need of a switching card, reduced manufacturing cost of the switching card, and convenient use for workers, and solves the problem of difficult resistance adjustment of the resistor in the prior art.
Description
Technical Field
The invention relates to a testing device of an electronic component, in particular to a four-wire resistance-adjusting probe card.
Background
Aiming at the resistance adjustment of a special chip resistor, such as exclusion, attenuator and the like, the prior art adopts a complex writing software program or adopts a switching card to adjust the resistance, and the prior art has the defects that: 1. the cost of the writing program is high; 2. the adapter card increases the circuit, leads to measuring error big, and adapter card preparation is loaded down with trivial details moreover, uses inconveniently. 3. Is not beneficial to the operation of staff for the streamlined production.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a four-wire resistance-adjusting probe card which does not change the line connection, does not need a switching card and has low cost.
In order to solve the technical problems, the technical scheme of the invention is as follows: a four-wire resistance-adjusting probe card,
comprises at least one resistor group;
a plurality of probes; wherein one end of each probe is connected to the resistor group;
a circuit board; the resistor groups are connected with the circuit board.
Preferably, each resistor group consists of 3 resistors and comprises a first resistor, a second resistor and a third resistor, and the first resistor, the second resistor and the third resistor are sequentially arranged on the circuit board.
Preferably, the number of the probes arranged on the first resistor, the second resistor and the third resistor in each resistor group is 2, and the probes are symmetrically arranged.
Preferably, the distance between the probe arranged on the first resistor and the probe arranged on the second resistor is 1.21mm, and the distance between the probe arranged on the second resistor and the probe arranged on the third resistor is 0.7 mm.
Preferably, 25 resistor groups are arranged on the circuit board, and the distance between each resistor group is set to be 1.91 mm.
Preferably, the distance between the probes is 1.03 mm.
The four-wire resistance-adjusting probe card has the following advantages: 1. the original program of the equipment is not required to be changed, and the cost is reduced. 2. The circuit connection is reduced, the measurement error is reduced, the adapter card is not needed, and the manufacturing cost of the adapter card is reduced. 3. The complex resistance trimming is changed into the conventional resistance trimming, so that the use of workers is facilitated. 4. The problem of difficult resistance adjustment of resistance among the prior art is solved.
Drawings
FIG. 1 is a schematic diagram of a four-wire trimming probe card according to the present invention;
fig. 2 is a schematic diagram of an internal structure of a four-wire resistance trimming probe card according to the present invention.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
As shown in fig. 1-2, a four-wire resistance trimming probe card of the present invention,
comprises at least one resistor group 1;
a plurality of probes 2; one end of each probe 2 is connected to the resistor group 1;
a circuit board 3; the resistor groups 1 are all connected with the circuit board 3.
Further, each group of resistor groups 1 is composed of 3 resistors, and includes a first resistor 11, a second resistor 12, and a third resistor 13, where the first resistor 11, the second resistor 12, and the third resistor 13 are sequentially arranged on the circuit board 3.
Furthermore, the number of the probes 2 arranged on the first resistor 11, the second resistor 12 and the third resistor 13 of each resistor group 1 is 2, and the probes 2 are symmetrically arranged.
Further, the distance between the probe 2 arranged on the first resistor 11 and the probe 2 arranged on the second resistor 12 is 1.21mm, and the distance between the probe 2 arranged on the second resistor 12 and the probe 2 arranged on the third resistor 13 is 0.7 mm.
Further, 25 resistor groups 1 are arranged on the circuit board 3, and the distance between each resistor group 1 is set to be 1.91 mm.
Further, the up-down distance between the probes 2 is 1.03 mm.
Specifically, each probe 2 is connected with a pipeline, the rear end of the pipeline is connected with a corresponding interface (con1 … … con8), and as the number of the probes 2 on the first resistor 11, the second resistor 12 and the third resistor 13 of each resistor group 1 is 2, the number of the probes 2 is 100, each probe 2 (hereinafter referred to as pad) is marked as 1-100, wherein 24 pads of 1 and 3 … … 47 are sequentially connected to con1, 24 pads of 1 and 3 … … are sequentially connected to con 3583, 49 is connected to con2, 51 and 53 … … 97 are sequentially connected to con3, and 49 is connected to con 4; 2. 24 pads 4 … … 48 are connected to con5, 49 is connected to con6, 52, 54 … … 98 and 98 are connected to con7 and 100 is connected to con8, when the left resistance is measured, only odd numbered con1, con2, con3 and con4 are connected, when the right resistance is measured, the odd numbered con5, con6, com7 and con8 are switched, and when the transverse resistance is measured, only con1, con2, con5 and con6 are needed to be connected for measurement.
It is to be understood that the described embodiments are merely a few embodiments of the invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Claims (1)
1. A four-wire resistance-adjusting probe card is characterized in that:
comprises at least one resistor group (1);
a plurality of probes (2); one end of each probe (2) is connected to the resistor group (1);
a circuit board (3); the resistor groups (1) are connected with the circuit board (3);
the distance between each group of resistor groups (1) is set to be 1.91 mm;
each group of resistor groups (1) consists of 3 resistors and comprises a first resistor (11), a second resistor (12) and a third resistor (13), wherein the first resistor (11), the second resistor (12) and the third resistor (13) are sequentially arranged on the circuit board (3);
2 probes (2) arranged on the first resistor (11), the second resistor (12) and the third resistor (13) of each resistor group (1) are symmetrically arranged;
the distance between the probe (2) arranged on the first resistor (11) and the probe (2) arranged on the second resistor (12) is 1.21mm, and the distance between the probe (2) arranged on the second resistor (12) and the probe (2) arranged on the third resistor (13) is 0.7 mm;
the vertical distance between the probes (2) is 1.03 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810443863.4A CN108535521B (en) | 2018-05-10 | 2018-05-10 | Four-wire resistance-adjusting probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810443863.4A CN108535521B (en) | 2018-05-10 | 2018-05-10 | Four-wire resistance-adjusting probe card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108535521A CN108535521A (en) | 2018-09-14 |
| CN108535521B true CN108535521B (en) | 2021-05-28 |
Family
ID=63475840
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810443863.4A Active CN108535521B (en) | 2018-05-10 | 2018-05-10 | Four-wire resistance-adjusting probe card |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108535521B (en) |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7307433B2 (en) * | 2004-04-21 | 2007-12-11 | Formfactor, Inc. | Intelligent probe card architecture |
| CN201440146U (en) * | 2009-08-11 | 2010-04-21 | 中芯国际集成电路制造(上海)有限公司 | Probe card |
| JP5296117B2 (en) * | 2010-03-12 | 2013-09-25 | 東京エレクトロン株式会社 | Probe device |
| CN201845028U (en) * | 2010-10-16 | 2011-05-25 | 中芯国际集成电路制造(上海)有限公司 | Probe card |
| CN103267940B (en) * | 2013-05-06 | 2016-08-10 | 上海华岭集成电路技术股份有限公司 | Multimode parallel test system |
| CN105067991A (en) * | 2015-08-10 | 2015-11-18 | 宁波华远电子科技有限公司 | Circuit board detection device and detection method |
| EP3385726B1 (en) * | 2017-04-07 | 2024-01-10 | Melexis Technologies NV | Kelvin connection with positional accuracy |
-
2018
- 2018-05-10 CN CN201810443863.4A patent/CN108535521B/en active Active
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| Publication number | Publication date |
|---|---|
| CN108535521A (en) | 2018-09-14 |
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