CN108535103A - A kind of superconducting thin film mechanical characteristic measuring device and method based on Meisser effect - Google Patents
A kind of superconducting thin film mechanical characteristic measuring device and method based on Meisser effect Download PDFInfo
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- CN108535103A CN108535103A CN201810213416.XA CN201810213416A CN108535103A CN 108535103 A CN108535103 A CN 108535103A CN 201810213416 A CN201810213416 A CN 201810213416A CN 108535103 A CN108535103 A CN 108535103A
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- 239000010409 thin film Substances 0.000 title claims abstract description 49
- 230000000694 effects Effects 0.000 title claims abstract description 45
- 238000000034 method Methods 0.000 title claims abstract description 23
- 230000001105 regulatory effect Effects 0.000 claims abstract description 12
- 239000004020 conductor Substances 0.000 claims description 16
- 238000005259 measurement Methods 0.000 claims description 13
- 230000005291 magnetic effect Effects 0.000 claims description 9
- 230000008569 process Effects 0.000 claims description 9
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 6
- 239000003302 ferromagnetic material Substances 0.000 claims description 6
- 238000002474 experimental method Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 238000000605 extraction Methods 0.000 claims description 3
- 230000005294 ferromagnetic effect Effects 0.000 claims description 3
- 229910052742 iron Inorganic materials 0.000 claims description 3
- 239000007787 solid Substances 0.000 claims 2
- 238000007789 sealing Methods 0.000 claims 1
- 238000012360 testing method Methods 0.000 abstract description 3
- 238000005516 engineering process Methods 0.000 description 5
- 238000011160 research Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 239000002887 superconductor Substances 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 210000000515 tooth Anatomy 0.000 description 2
- 238000000429 assembly Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/005—Electromagnetic means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0262—Shape of the specimen
- G01N2203/0278—Thin specimens
- G01N2203/0282—Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes
Abstract
The invention discloses a kind of superconducting thin film mechanical characteristic measuring device and method based on Meisser effect, are related to superconducting thin film mechanical property testing technical field.The measuring device includes main platform body, stress sensing device assembly, magnet positions regulating system and sample caging system.Stress sensing device assembly is arranged in sample stage main body, and sample to be tested is placed in stress sensing device assembly, and magnet positions regulating system and sample caging system are arranged in sample stage main body.Method using the measuring device includes mainly eight steps.Using the device can be directly Nano grade to thickness, the mechanical characteristic of the even up to superconducting thin film sample of monoatomic layer thickness measures, and traditional mechanical pick-up device is substituted using piezoceramic transducer, mechanical quantity is changed into electrical quantities to measure, simplify experimental implementation, the precision for improving conventional efficient and mechanical meaurement improves the accuracy of experimental result.
Description
Technical field
The present invention relates to superconducting thin film mechanical property testing technical field more particularly to a kind of surpassing based on Meisser effect
Lead thin film mechanics characteristic measuring device and method.
Background technology
Two major classes can be divided into about the basic research of superconductor at present, one kind is to find to have higher superconduction critical temperature etc.
The new superconduction material of critical parameter, another kind of is the mechanism studied superconductor and generate superconducting phenomenon.Superconducting thin film is for upper
The research for stating two major classes has both sides advantage：One contributes to utilize the interfacial effect from substrate, seeks quality higher,
That is the superconduction system with more high-critical temperature, critical current or critical magnetic field；Second is that high-precision doping is helped to realize, and
The mechanism of high-temperature superconductor is explored using the experimental facilities of various surface-sensitives.And work as in the research process to various superconducting thin films
In, the measurement to its superconducting characteristic is essential.It is real currently with the tradition of Meisser effect research superconduction mechanical characteristic
Test that equipment is directed to is all large sample, and mechanical meaurement technology used mainly relies on mechanical pick-up device, therefore its measurement sensitivity
It is not high, it is difficult to realize the accurate measurement to the mechanical characteristic of film sample.
Therefore, those skilled in the art is dedicated to developing a kind of superconducting thin film mechanical characteristic survey based on Meisser effect
Device and method is measured, can be directly Nano grade to thickness, be even up to the power of the superconducting thin film sample of monoatomic layer thickness
It learns characteristic to measure, and mechanical quantity is changed into electrical quantities and is measured, simplify experimental implementation, improve conventional efficient, carry
The precision of high mechanical meaurement improves the accuracy of experimental result.
Invention content
In view of the drawbacks described above of the prior art, the technical problems to be solved by the invention include two aspects, first, solving
Traditional superconducting thin film mechanical characteristic measuring device can not study the Micromechanics characteristic of superconducting thin film, can not study superconducting thin film
The problems such as superconducting transition temperature；Second is that substituting traditional mechanical pick-up device using suitable sensor, mechanical quantity is changed into
Electrical quantities measure, to improve the precision of mechanical meaurement.
To achieve the above object, the present invention provides a kind of, and the superconducting thin film mechanical characteristic based on Meisser effect measures dress
It sets, including main platform body, stress sensing device assembly, magnet positions regulating system and sample caging system；
The main platform body includes cold bench main body, sample stage main body, 12 sustainable electrode screw holes and four sample stages
Support screw hole；
The stress sensing device assembly includes force sensor and force sensor contact conductor；
The magnet positions regulating system is horizontally-supported including at least four fixed screws, magnet vertical support frame, magnet
Frame, magnet positions control handle, magnet lifting gear, magnet fixed platform, the first magnet and the second magnet；
The sample caging system includes six samples limit parts, six limited screws, six stop nuts and six
Limit card slot；
The stress sensing device assembly is arranged in the sample stage main body, and sample to be tested is placed in the stress sensing
In device assembly, the magnet vertical support frame fixation is set to stand in the sample stage main body by the fixed screw, it is described
Sample caging system is arranged in the sample stage main body.
Further, the main platform body, the fixed screw, the magnet fixed platform, the magnet lifting gear,
The magnet vertical support frame, the magnet horizontal shore, the sample caging system all have rigidity.
Further, sample stage main body described in the cold bench body supports, 12 sustainable electrode screw holes are around institute
The central axis for stating cold bench main body is uniformly distributed, central axis of the four sample stages support screw hole around the sample stage main body
It is uniformly distributed, the sample stage main body supports screw hole to be mutually connected in one with the cold bench main body by four sample stages
It rises.
Further, the sample stage main body is made of Heat Conduction Material, has thermal conductivity, conducive to will be produced in measurement process
Raw heat is conducted in time to the cold bench main body；The outer wall of the cold bench main body has screw thread, is matched with the screw thread of cold lid,
Convenient for ultrahigh vacuum seal.
Further, the force sensor contact conductor is connected directly with the force sensor, the stress sensing
The extraction wire part of device contact conductor is connect with external equipment, so that the mechanical information data that will be measured are passed by the stress
Sensor contact conductor is sent to the external equipment and is handled；The force sensor is piezoceramic transducer.
Further, the magnet horizontal shore is mutually perpendicular to be connected with the magnet vertical support frame, the magnet
Lifting gear runs through the magnet horizontal shore, and the magnet fixed platform is fixed on magnet lifting gear lower end,
The magnet positions control handle is arranged on the magnet horizontal shore, and the magnet positions control handle has gear
The edge of structure, the gear structure has gear tooth, and the magnet lifting gear and the magnet fixed platform are described
It is vertically moved up and down under the driving of gear structure, makes the vertical of the magnet lifting gear and the magnet fixed platform
Position is adjustable；The magnet fixed platform is made of ferromagnetic material, to adsorb first magnet and second magnet；It is described
First magnet and second magnet are arranged to adjust height according to the required relative distance with the sample to be tested.
Further, the placement direction of first magnet and second magnet on the contrary, first magnet the poles S court
Outside, outwardly, first magnet and second magnet are by with ferromagnetic ferromagnetic material system for the poles N of second magnet
At the magnetic field for generating some strength so that Meisser effect occurs in the sample to be tested in ultra low temperature state.
Further, six limit card slots are arranged on the corresponding position of the sample stage body upper surface, institute
The head for stating six limited screws is embedded in respectively in corresponding six limit card slots, the front end of the limit card slot
To the moving range that rear end is the limited screw, the tail portion of six limited screws is placed through the institute of corresponding position respectively
State the cavity of six sample limit piece surfaces；The periphery of the limited screw have helicitic texture, the stop nut it is interior
There is circle helicitic texture, the outside of the stop nut to have gear structure, the helicitic texture of the limited screw and the limit
The helicitic texture of position nut matches, and the limited screw is made to be fixed in the limit card slot；Six stop nuts point
It does not complement one another and tightens with six limited screws of corresponding position, to make six samples limit part fix respectively
In the top of six limit card slots positioned at corresponding position.
Further, part is rectangular is symmetrically distributed in around the sample to be tested for six samples limit, described
On two long side directions of the rectangular area around sample to be tested, two limits zero are respectively arranged along long side described in each
On two short side directions of the rectangular area around the sample to be tested, one is respectively arranged along short side described in each for part
The limit part, six limits part limit institute from the four edges direction of the rectangular area around the sample to be tested
The scope of activities of sample to be tested is stated, and there is certain moving range.
The present invention also provides the superconducting thin film mechanical characteristic measuring devices based on Meisser effect described in a kind of application
Method includes the following steps：
The sample to be tested is placed on the force sensor by step 1；
Step 2, the front and back adjusting in the limit card slot by the limited screw, until the sample limits part
Spacing between front end and the sample to be tested reaches required distance；
Sample limit part is fixed on the upper surface of the sample stage main body using the stop nut by step 3
In plane, and above the limit card slot；
Step 4, repeating said steps two and the step 3 so recycle, until six samples limit part is complete
Portion is fixed；
Step 5 adjusts the magnet positions control handle, until the magnet lifting gear is by placement direction opposite
First magnet and second magnet are adjusted to right over the sample to be tested, and make first magnet and described second
Distance of the magnet away from the sample to be tested reaches desired height；
Step 6, in the cold bench main body by described the superconducting thin film mechanical characteristic measuring device based on Meisser effect
Heat sink is sealed and connected, reaches institute inside the superconducting thin film mechanical characteristic measuring device based on Meisser effect
Need temperature；
Step 7 obtains the mechanical characteristic number measured by the force sensor by the force sensor contact conductor
According to；
Step 8, repeating said steps five, the step 6 and the step 7, to carry out multiple mechanical characteristic measurement,
So cycle, until having surveyed total data needed for experiment.
Compared with prior art, advantageous effects of the invention include following three aspect：
(1) present invention is different from determining the conventional method of superconduction critical temperature using electric principle, but is imitated based on Meisner
It answers principle to determine the superconduction critical temperature of superconducting thin film sample by magnetic principle, solves traditional superconducting thin film mechanical characteristic and measure
Device can not study the Micromechanics characteristic of sample to be tested and the problem of superconduction critical temperature, can be directly nanoscale to thickness
Not, the mechanical characteristic for being even up to the superconducting thin film of monoatomic layer thickness measures.The present invention looks for another way, and provides one kind
Novel experimental considerations, enormously simplifies operating process, improves conventional efficient.
(2) traditional mechanical pick-up device is substituted using piezoceramic transducer in the present invention, mechanical quantity is changed into electricity
Amount measures, then by small electrical signals measuring technique ripe on the market, greatly improves the precision of mechanical meaurement.
(3) it is sealed by cold bench main body, makes a kind of superconducting thin film power based on Meisser effect proposed by the present invention
Characteristic measuring device is learned in ultra-high vacuum environment, to the cut-out superconducting thin film mechanics based on Meisser effect
Characteristic measuring device and extraneous heat transfer, reduce influence of the extraneous heat transfer to measurement result, improve experimental result
Accuracy.
The technique effect of the design of the present invention, concrete structure and generation is described further below with reference to attached drawing, with
It is fully understood from the purpose of the present invention, feature and effect.
Description of the drawings
Fig. 1 be one of a kind of superconducting thin film mechanical characteristic measuring device based on Meisser effect proposed by the present invention compared with
The schematic diagram of good embodiment；
Fig. 2 be one of a kind of superconducting thin film mechanical characteristic measuring device based on Meisser effect proposed by the present invention compared with
The sectional view of good embodiment；
Fig. 3 be one of a kind of superconducting thin film mechanical characteristic measuring device based on Meisser effect proposed by the present invention compared with
Another sectional view of good embodiment.
Wherein, 1- main platform bodies, 2- samples to be tested, 3- stress sensing device assemblies, 4- magnet positions regulating systems, 5- samples
Caging system, 101- cold bench main bodys, 102- sample stage main bodys, 103- can support electrode screw hole, and 104- sample stages support screw hole,
301- force sensors, 302- force sensor contact conductors, 401- magnet vertical support frames, 402- fixed screws, 403- magnetic
Iron level supporting rack, 404- magnet positions control handles, 405- magnet lifting gears, 406- magnet fixed platforms, 407- first
Magnet, the second magnet of 408-, 501- samples limit part, 502- limited screws, 503- stop nuts, 504- limit card slots.
Specific implementation mode
Multiple preferred embodiments that the present invention is introduced below with reference to Figure of description, keep its technology contents more clear and just
In understanding.The present invention can be emerged from by many various forms of embodiments, and protection scope of the present invention not only limits
The embodiment that Yu Wenzhong is mentioned.
In the accompanying drawings, the identical component of structure is indicated with same numbers label, everywhere the similar component of structure or function with
Like numeral label indicates.The size and thickness of each component shown in the drawings are to be arbitrarily shown, and there is no limit by the present invention
The size and thickness of each component.In order to keep diagram apparent, some places suitably exaggerate the thickness of component in attached drawing.
Fig. 1 be one of a kind of superconducting thin film mechanical characteristic measuring device based on Meisser effect proposed by the present invention compared with
The schematic diagram of good embodiment, as shown in Figure 1, a kind of superconducting thin film mechanical characteristic measuring device based on Meisser effect includes flat
Platform main body 1, stress sensing device assembly 3, magnet positions regulating system 4 and sample caging system 5.Sample to be tested 2 be placed in by
On force sensor module 3.
As shown in Figures 2 and 3, main platform body 1 includes cold bench main body 101, the sustainable electricity of sample stage main body 102,12
Pole screw hole 103 and four sample stages support screw hole 104.Cold bench main body 101 supports the sustainable electricity of sample stage main body 102,12
Pole screw hole 103 is uniformly distributed around the central axis of cold bench main body 101, and four sample stages support screw hole 104 around sample stage main body 102
Central axis be uniformly distributed.Sample stage main body 102 is individually fabricated first, is then passed through four sample stages and is supported screw holes
104 make sample stage main body 102 mutually be fixed together with cold bench main body 101.Sample stage main body 102 is made of Heat Conduction Material,
With conductive force, the heat generated in measurement process can be conducted in time to cold bench main body 101.101 outer wall of cold bench main body has
There is screw thread, matched with the screw thread of cold lid, is conducive to that cold lid is coordinated to carry out ultrahigh vacuum seal.
Stress sensing device assembly 3 includes force sensor 301 and force sensor contact conductor 302.Wherein, stress sensing
Device contact conductor 302 is connected directly with force sensor 301, the extraction wire part of force sensor contact conductor 302 with it is outer
Portion's equipment connection, so that mechanical information data transmission to the external equipment that will be measured in measurement process is handled.
Magnet positions regulating system 4 includes at least four fixed screws 402, magnet vertical support frame 401, magnet level branch
Support 403, magnet positions control handle 404, magnet lifting gear 405, magnet fixed platform 406, the first magnet 407 and second
Magnet 408.Magnet vertical support frame 401 is fixed in sample stage main body 102 by fixed screw 402, magnet horizontal shore 403
It is mutually perpendicular to be connected with magnet vertical support frame 401, magnet lifting gear 405 runs through magnet horizontal shore 403.Magnet is fixed
Platform 406 is arranged on 405 lower end of magnet lifting gear, and magnet positions control handle 404 is arranged on magnet horizontal shore
On 403, it to be used for the vertical position of regulating magnet lifting gear 405.Magnet positions control handle 404 has gear structure, the tooth
The edge of wheel construction has multiple gear tooths so that magnet lifting gear 405 and magnet fixed platform 406 are in gear structure
Magnet lifting gear 405 and the vertical position of magnet fixed platform 406 can be kept adjustable with vertical shift under driving.Magnet is fixed
Platform 406 is made of ferromagnetic material, has the function of adsorption magnet, first magnet 407 He opposite for adsorbing placement direction
Second magnet 408.The placement direction of first magnet 407 and the second magnet 408 on the contrary, the poles S of the first magnet 407 outwardly, second
The poles N of magnet 408 are outwardly.First magnet 407 and the second magnet 408 are made by with ferromagnetic ferromagnetic material, for producing
The magnetic field of raw some strength so that Meisser effect occurs in the sample to be tested 2 in ultra low temperature state.First magnet 407 and
Two magnet 408 are suspended from the surface of sample to be tested 2, and height is adjustable.By regulating magnet position control handle 404, to adjust
The vertical position of magnet lifting gear 405 and magnet fixed platform 406, to adjust the first magnet 407 and the second magnet 408
Just so that the relative position of two blocks of magnet and sample to be tested 2 reaches required degree.
Sample caging system 5 includes that six samples limit the stop nut 503 of limited screw 502, six of part 501, six
With six limit card slots 504.Six limit card slots 504 are arranged on the corresponding position of 102 upper surface of sample stage main body, six
The head of limited screw 502 is embedded in respectively in corresponding six limit card slots 504, also, the front end of limit card slot 504
To the moving range that rear end is limited screw 502, to increase the moving range that sample limits part 501.Six limited screws
502 tail portion is placed through the cavity on six samples limit part, 501 surface of corresponding position respectively.Outside limited screw 502
It encloses with helicitic texture, for the inner ring of stop nut 503 with helicitic texture, the outside of stop nut 503 has gear structure, limit
The helicitic texture of position screw 502 is matched with the helicitic texture of stop nut 503, and limited screw 502 can be made to be fixed on limiting card
In slot 504.It is tightened by the way that six stop nuts 503 complement one another with six limited screws 502 respectively, thus by six samples
Limit part 501 is separately fixed at the top of six limit card slots 504 positioned at corresponding position.Six samples limit part 501
It is rectangular to be symmetrically distributed in around sample to be tested 2, on two long side directions of the rectangular area around sample to be tested 2, along every
One long side is respectively arranged two limit parts 501, on two short side directions of the rectangular area around sample to be tested 2, edge
Each short side is respectively arranged a limit part 501, therefore six limit parts 501 can be from the rectangle around sample to be tested 2
The scope of activities of sample to be tested 2 is limited on the direction of the four edges in region, and there is certain moving range, it is to be measured to increase
The specification limit that sample 2 allows.
Main platform body 1, fixed screw 402, magnet fixed platform 406, magnet lifting gear 405, magnet vertical support frame
401, magnet horizontal shore 403 and sample caging system 5 all have rigidity.
The mechanical characteristic measuring device of traditional superconducting thin film can only study the macromechanical property of superconducting sample, can not study
Its micromechanics, makes troubles to operation.In a preferred embodiment of the present invention, piezoceramic transducer is selected to make
For force sensor 301, force sensor 301 is in direct contact with sample to be tested 2, and the mechanical information measured in measurement process is led to
It crosses force sensor contact conductor 302 and is sent to external equipment in time, to carry out follow-up data processing.It is utilized in the present invention
Piezoceramic transducer substitutes traditional mechanical pick-up device, and by small electrical signals measuring technique ripe on the market, significantly
Improve the precision that experiment measures.In addition, the present invention is based on Meisser effect principle, superconducting thin film sample can be determined by magnetic principle
The superconduction critical temperature of product, and different from determining the conventional method of superconduction critical temperature using electric principle, it is to look for another way, carries
A kind of novel experimental considerations has been supplied, operating process has been simplified, shortens experimental period, improve conventional efficient.
In addition, cold bench main body 101 can match with other external workbenches, the function of whole cooling heating is realized, and
The screw thread of 101 outer wall of cold bench main body can match with mating cold lid, make proposed by the present invention a kind of based on Meisser effect
Superconducting thin film mechanical characteristic measuring device is in ultra-high vacuum environment, to which cut-out is described super based on Meisser effect
Thin film mechanics characteristic measuring device and extraneous heat transfer are led, influence of the extraneous heat transfer to measurement result is reduced.
A kind of method packet of superconducting thin film mechanical characteristic measuring device using proposed by the present invention based on Meisser effect
Include following steps：
Sample to be tested 2 is placed on force sensor 301 by step 1；
Step 2, the front and back adjusting in the limit card slot 504 by limited screw 502, until sample limits part 501
Spacing between front end and sample to be tested 2 reaches required distance；
Step 3, the upper surface that sample limit part 501 is fixed on to sample stage main body 102 using stop nut 503 are put down
On the corresponding position of face, and positioned at the top of limit card slot 504；
Step 4, repeating said steps two and the step 3 so recycle, until six sample limit parts 501 are complete
Portion is fixed；
Step 5, regulating magnet position control handle 404, until magnet lifting gear 405 by placement direction it is opposite the
One magnet 407 and the second magnet 408 are adjusted at the certain altitude right over sample to be tested 2, make the first magnet 407 and the second magnetic
Distance of the iron 408 away from sample to be tested 2 reaches desired height；
Step 6, in cold bench main body 101 by described the superconducting thin film mechanical characteristic measuring device based on Meisser effect
Heat sink is sealed and connected, reaches institute inside the superconducting thin film mechanical characteristic measuring device based on Meisser effect
Need temperature；
Step 7 obtains the mechanical characteristic number measured by force sensor 301 by force sensor contact conductor 302
According to；
Step 8, repeating said steps five, the step 6 and the step 7, to carry out multiple mechanical characteristic measurement,
So cycle, until having surveyed total data needed for experiment.
The measuring device and method solution of a kind of superconducting thin film mechanical characteristic based on Meisser effect provided by the present invention
Traditional superconducting thin film mechanical characteristic measuring device of having determined can not study the Micromechanics characteristic and superconduction critical temperature of sample to be tested
Problem, enormously simplify operating process, improve conventional efficient.It is substituted using piezoceramic transducer in the present invention traditional
Mechanical quantity is changed into electrical quantities and measured by mechanical pick-up device, then by small electrical signals measuring technique ripe on the market,
Greatly improve the precision of mechanical meaurement.
The preferred embodiment of the present invention has been described in detail above.It should be appreciated that the ordinary skill of this field is without wound
The property made labour, which according to the present invention can conceive, makes many modifications and variations.Therefore, all technician in the art
Pass through the available technology of logical analysis, reasoning, or a limited experiment on the basis of existing technology under this invention's idea
Scheme, all should be in the protection domain being defined in the patent claims.
Claims (10)
1. a kind of superconducting thin film mechanical characteristic measuring device based on Meisser effect, which is characterized in that including main platform body, by
Force sensor module, magnet positions regulating system and sample caging system；
The main platform body includes cold bench main body, sample stage main body, 12 sustainable electrode screw holes and four sample stage supports
Screw hole；
The stress sensing device assembly includes force sensor and force sensor contact conductor；
The magnet positions regulating system includes at least four fixed screws, magnet vertical support frame, magnet horizontal shore, magnetic
Iron position control handle, magnet lifting gear, magnet fixed platform, the first magnet and the second magnet；
The sample caging system includes that six samples limit part, six limited screws, six stop nuts and six limits
Card slot；
The stress sensing device assembly is arranged in the sample stage main body, and sample to be tested is placed in the force sensor group
On part, the magnet vertical support frame fixation is set to stand in the sample stage main body by the fixed screw, the sample
Caging system is arranged in the sample stage main body.
2. the superconducting thin film mechanical characteristic measuring device based on Meisser effect as described in claim 1, which is characterized in that institute
State main platform body, the fixed screw, the magnet fixed platform, the magnet lifting gear, the magnet vertical support frame,
The magnet horizontal shore, the sample caging system all have rigidity.
3. the superconducting thin film mechanical characteristic measuring device based on Meisser effect as described in claim 1, which is characterized in that institute
State sample stage main body described in cold bench body supports, central axis of the 12 sustainable electrode screw holes around the cold bench main body
It is uniformly distributed, four sample stages support screw hole is uniformly distributed around the central axis of the sample stage main body, the sample stage
Main body supports screw hole to be mutually fixed together with the cold bench main body by four sample stages.
4. the superconducting thin film mechanical characteristic measuring device based on Meisser effect as described in claim 1, which is characterized in that institute
Sample stage main body is stated to be made of Heat Conduction Material, have thermal conductivity, conducive to by generated in measurement process heat conduct in time to
The cold bench main body；The outer wall of the cold bench main body has screw thread, is matched with the screw thread of cold lid, is convenient for ultrahigh vacuum seal.
5. the superconducting thin film mechanical characteristic measuring device based on Meisser effect as described in claim 1, which is characterized in that institute
It states force sensor contact conductor to be connected directly with the force sensor, the extraction wire of the force sensor contact conductor
Part is connect with external equipment, so that the mechanical information data that will be measured are sent to institute by the force sensor contact conductor
External equipment is stated to be handled；The force sensor is piezoceramic transducer.
6. the superconducting thin film mechanical characteristic measuring device based on Meisser effect as described in claim 1, which is characterized in that institute
It states magnet horizontal shore to be mutually perpendicular to be connected with the magnet vertical support frame, the magnet lifting gear runs through the magnet
Horizontal shore, the magnet fixed platform are fixed on magnet lifting gear lower end, the magnet positions control handle
It is arranged on the magnet horizontal shore, the magnet positions control handle has gear structure, the gear structure
Edge has gear tooth, the magnet lifting gear and the magnet fixed platform perpendicular in the driving lower edge of the gear structure
Histogram moves up and down, and keeps the magnet lifting gear and the vertical position of the magnet fixed platform adjustable；The magnet is solid
Fixed platform is made of ferromagnetic material, to adsorb first magnet and second magnet；First magnet and described second
Magnet is arranged to adjust height according to the required relative distance with the sample to be tested.
7. the superconducting thin film mechanical characteristic measuring device based on Meisser effect as claimed in claim 6, which is characterized in that institute
State the placement direction of the first magnet and second magnet on the contrary, the poles S of first magnet outwardly, the N of second magnet
Outwardly, first magnet and second magnet are made by with ferromagnetic ferromagnetic material for pole, certain strong for generating
The magnetic field of degree so that Meisser effect occurs in the sample to be tested in ultra low temperature state.
8. the superconducting thin film mechanical characteristic measuring device based on Meisser effect as described in claim 1, which is characterized in that institute
It states six limit card slots to be arranged on the corresponding position of the sample stage body upper surface, the head of six limited screws
It is embedded in respectively in corresponding six limit card slots, front end to the rear end of the limit card slot is the limited screw
Moving range, the tail portions of six limited screws is placed through six samples limit parts list of corresponding position respectively
The cavity in face；There is helicitic texture, the inner ring of the stop nut to have helicitic texture, the limit for the periphery of the limited screw
There is gear structure, the helicitic texture of the limited screw and the helicitic texture of the stop nut to match for the outside of position nut
It closes, the limited screw is made to be fixed in the limit card slot；Six stop nuts respectively with corresponding position described six
A limited screw, which complements one another, to be tightened, to make six samples limit part be separately fixed at positioned at described in corresponding position
The top of six limit card slots.
9. the superconducting thin film mechanical characteristic measuring device based on Meisser effect as claimed in claim 8, which is characterized in that institute
It states the limit of six samples part is rectangular and be symmetrically distributed in around the sample to be tested, the rectangle region around the sample to be tested
On two long side directions in domain, two limit parts are respectively arranged along long side described in each, in sample to be tested week
On two short side directions of the rectangular area enclosed, a limit part is respectively arranged along short side described in each, described six
A limit part limits the movable model of the sample to be tested from the four edges direction of the rectangular area around the sample to be tested
It encloses, and there is certain moving range.
10. a kind of superconducting thin film mechanical characteristic measuring device based on Meisser effect of application as described in claim 1-9
Method, which is characterized in that include the following steps：
The sample to be tested is placed on the force sensor by step 1；
Step 2, the front and back adjusting in the limit card slot by the limited screw, until the sample limits the front end of part
Spacing between the sample to be tested reaches required distance；
Sample limit part is fixed on the top surface plane of the sample stage main body using the stop nut by step 3
On, and above the limit card slot；
Step 4, repeating said steps two and the step 3 so recycle, until six samples limit part is all solid
It is fixed；
Step 5 adjusts the magnet positions control handle, until the magnet lifting gear by placement direction it is opposite described in
First magnet and second magnet are adjusted to right over the sample to be tested, and make first magnet and second magnet
Distance away from the sample to be tested reaches desired height；
Step 6, the superconducting thin film mechanical characteristic measuring device sealing based on Meisser effect by described in the cold bench main body
And heat sink is connected, reach required temperature inside the superconducting thin film mechanical characteristic measuring device based on Meisser effect
Degree；
Step 7 obtains the mechanical characteristic data measured by the force sensor by the force sensor contact conductor；
Step 8, repeating said steps five, the step 6 and the step 7, to carry out multiple mechanical characteristic measurement, so
Cycle, until having surveyed total data needed for experiment.
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| CN201810213416.XA CN108535103B (en) | 2018-03-15 | 2018-03-15 | Superconducting film mechanical property measuring device and method based on Mainsna effect |
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| CN108535103B CN108535103B (en) | 2020-07-10 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110429862A (en) * | 2019-08-09 | 2019-11-08 | 哈尔滨工业大学 | A kind of adjustable broadband spoke type piezoelectric energy collecting device |
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| JPS6469005A (en) * | 1987-09-10 | 1989-03-15 | Toshiba Corp | Magnetizing apparatus |
| CN2136470Y (en) * | 1992-07-30 | 1993-06-16 | 东北工学院 | Multifunctional performance tester for high-temp. superconductive material |
| CN105973924A (en) * | 2016-05-05 | 2016-09-28 | 成都君禾天成科技有限公司 | Superconducting material superconductive transition temperature measurement method |
| CN107543752A (en) * | 2017-08-14 | 2018-01-05 | 上海理工大学 | Nano-hardness tester special fixture |
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2018
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| JPS6469005A (en) * | 1987-09-10 | 1989-03-15 | Toshiba Corp | Magnetizing apparatus |
| CN2136470Y (en) * | 1992-07-30 | 1993-06-16 | 东北工学院 | Multifunctional performance tester for high-temp. superconductive material |
| CN105973924A (en) * | 2016-05-05 | 2016-09-28 | 成都君禾天成科技有限公司 | Superconducting material superconductive transition temperature measurement method |
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| CN110429862A (en) * | 2019-08-09 | 2019-11-08 | 哈尔滨工业大学 | A kind of adjustable broadband spoke type piezoelectric energy collecting device |
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| CN108535103B (en) | 2020-07-10 |
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