CN108520714B - Test method and system supporting multiple working modes of OLED screen - Google Patents

Test method and system supporting multiple working modes of OLED screen Download PDF

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CN108520714B
CN108520714B CN201810257995.8A CN201810257995A CN108520714B CN 108520714 B CN108520714 B CN 108520714B CN 201810257995 A CN201810257995 A CN 201810257995A CN 108520714 B CN108520714 B CN 108520714B
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oled screen
control
signal generator
chip
signal
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CN108520714A (en
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肖君军
夏大学
刘品德
陈显锋
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Suzhou Jiazhicai Optoelectronics Technology Co ltd
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Suzhou Jiazhicai Optoelectronics Technology Co ltd
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Physics & Mathematics (AREA)
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Abstract

The invention discloses a test method and a test system supporting multiple working modes of an OLED screen, and the test method and the test system comprise a test platform, wherein the test platform comprises a PC control end, at least two OLED screen signal generators and the OLED screen; each OLED screen signal generator is in communication connection with the PC control end, and the output end of each OLED screen signal generator is connected with the input end of an OLED screen; the PC control end is used for sending a control signal, a control instruction and an image signal to the OLED screen signal generator; the control signal comprises an ID number for identifying the OLED screen signal generator; the OLED screen signal generator comprises: the network control chip is used for analyzing a control signal from the PC control end; the FPGA driving chip is used for generating an image driving signal of a required interface protocol; and the memory chip is used for storing the image signals which are stored in advance and work in the off-line mode.

Description

Test method and system supporting multiple working modes of OLED screen
Technical Field
The invention belongs to the field of photoelectricity, particularly relates to a test method and a test system for an OLED screen, and particularly relates to a test method and a test system for supporting multiple working modes of the OLED screen.
Background
An Organic Light-Emitting Diode (OLED) is also called an Organic electroluminescent display or an Organic Light-Emitting semiconductor. It was found in the laboratory in 1979 by professor deng dunqingyun, chinese. The OLED display technology has the advantages of self-luminescence, wide viewing angle, almost infinite contrast, low power consumption, extremely high reaction speed and the like, and is widely applied to the field of display screens.
The OLED signal generator is a common test device in OLED display module production, is used to provide power and image signals required for driving a display screen, and is widely used in initial research and development tests and large-scale mass shipment tests.
At present, the traditional signal generator often only supports one situation of online or offline test, or the situation that a plurality of signal generators can not work on online and offline simultaneously. However, the actual working sites for OLED panel manufacturers to research, develop, test and produce tests are not consistent, and these several working modes are all needed, which results in poor testing efficiency and convenience of the conventional signal generator.
In view of this, in order to solve the problem, the present invention provides a testing method supporting multiple operating modes of an OLED panel.
Disclosure of Invention
The invention provides a test method supporting multiple working modes of an OLED screen, and aims to solve the problems of low efficiency and poor convenience caused by the fact that a plurality of signal generators cannot work in an online mode or an offline mode during detection in the prior art.
In order to achieve the purpose, the invention adopts the technical scheme that: a test method supporting multiple working modes of an OLED screen is characterized in that a test platform is set up in advance, and the test platform comprises a PC control end, at least two OLED screen signal generators and at least two OLED screens; each OLED screen signal generator is in communication connection with the PC control end, and the output end of each OLED screen signal generator is connected with the input end of an OLED screen;
the PC control end is used for sending a control signal, a control instruction and an image signal to the OLED screen signal generator so as to control one or more OLED screen signal generators; the control signal comprises an ID number for identifying the OLED screen signal generator;
the OLED screen signal generator comprises:
the network control chips are used for analyzing control signals from the PC control end, and each network control chip comprises a unique ID number;
the FPGA driving chip is used for generating an image driving signal of a required interface protocol and analyzing a working mode in a control instruction from the PC control end;
the storage chip is used for storing image signals which are stored in advance and work in an off-line mode;
when the test platform works, the test platform is used for operating according to the following steps:
firstly, switching on a power supply to ensure that each device in a test platform works normally;
secondly, the PC control end sends a control signal to at least one OLED screen signal generator;
thirdly, a network control chip of the OLED screen signal generator analyzes a control signal sent by a PC control end; when the network control chip detects that the ID number in the control signal is the same as the ID number of the network control chip, the corresponding OLED screen signal generator starts a response, establishes connection with the PC control end and goes to the fourth step;
when the network control chip detects that the ID number in the control signal is different from the ID number of the network control chip, the corresponding OLED screen signal generator is not connected with the PC control end, and then the sixth step is carried out;
fourthly, after the OLED screen signal generator is successfully connected with the PC control end, the FPGA driving chip analyzes the working mode in the control instruction;
fifthly, if the work mode analyzed by the FPGA driving chip is an online mode, the FPGA driving chip receives an image signal from a PC control end and transmits the image signal to a corresponding OLED screen; if the working mode analyzed by the FPGA driving chip is the off-line mode, switching to the sixth step;
and sixthly, reading the image signals pre-stored in the storage chip by the FPGA driving chip and transmitting the image signals to the corresponding OLED screen.
The relevant content in the above technical solution is explained as follows:
1. in the above scheme, the memory chip is a Flash memory chip.
2. In the above scheme, the step of analyzing the working mode by the FPGA driver chip is as follows: and a resolution protocol is agreed in advance, and the FPGA driving chip analyzes the working mode in the control instruction according to the resolution protocol.
3. In the above scheme, the image signals are respectively from a PC control terminal or stored in a memory, and are transmitted to the OLED screen to be displayed on the OLED screen.
4. In the above solution, although the test method and system for supporting multiple operating modes of the OLED panel are disclosed in the invention, the test method and system can be used for other test methods and systems for supporting multiple operating modes of the AMOLED panel.
In order to achieve the purpose, the invention adopts another technical scheme that: a test system supporting multiple working modes of an OLED screen comprises a test platform, wherein the test platform comprises a PC control end, at least two OLED screen signal generators and at least two OLED screens; each OLED screen signal generator is in communication connection with the PC control end, and the output end of each OLED screen signal generator is connected with the input end of an OLED screen;
the PC control end is used for sending a control signal, a control instruction and an image signal to the OLED screen signal generator so as to control one or more OLED screen signal generators; the control signal comprises an ID number for identifying the OLED screen signal generator;
the OLED screen signal generator comprises:
the network control chips are used for analyzing control signals from the PC control end, and each network control chip comprises a unique ID number;
the FPGA driving chip is used for generating an image driving signal of a required interface protocol and analyzing a working mode in a control instruction from the PC control end;
and the memory chip is used for storing the image signals which are stored in advance and work in the off-line mode.
1. In the above scheme, the memory chip is a Flash memory chip.
2. In the above scheme, the image signals are respectively from a PC control terminal or stored in a memory, and are transmitted to the OLED screen to be displayed on the OLED screen.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
compared with the prior art, the invention can meet the requirements of different application scenes such as production, research and development and the like, can conveniently switch the test modes in an off-line mode and an on-line mode, can independently operate in different modes when a plurality of signal generators work simultaneously, and improves the test efficiency.
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FIG. 1 is a schematic block diagram of a test system supporting multiple operating modes of an OLED panel according to this embodiment;
fig. 2 is a flowchart of a testing method for supporting multiple operating modes of an OLED display according to this embodiment.
Detailed Description
The invention is further described with reference to the following figures and examples:
example (b): test system supporting multiple working modes of OLED screen
Referring to fig. 1, the testing platform comprises a PC control terminal, N OLED panel signal generators, and N OLED panels.
And each OLED screen signal generator is in communication connection with the PC control end, and the output end of each OLED screen signal generator is connected with the input end of an OLED screen.
The PC control end is used for sending a control signal, a control instruction and an image signal to the OLED screen signal generator so as to control one or more OLED screen signal generators; the control signal includes an ID number for identifying the OLED screen signal generator.
The OLED screen signal generator comprises a power supply control part, an image signal driving part and a communication part for exchanging instructions with an external PC (personal computer) end, and can work and test the OLED display module on line with the PC control end (in an on-line mode) and independently work and test the OLED display module (in an off-line mode); it is also possible to operate a mixture of multiple signal generators in off-line as well as on-line modes.
The communication part for exchanging instructions with an external PC terminal adopts network control chips for analyzing control signals from the PC control terminal, and each network control chip comprises a unique ID number. The image signal driving part adopts an FPGA driving chip and is used for generating an image driving signal of a required interface protocol and analyzing a working mode in a control instruction from a PC control end. The device also comprises a memory chip used for storing the image signals which are stored in advance and work in the off-line mode. In this embodiment, the memory chip is a Flash memory chip.
Referring to fig. 2, a test method supporting multiple operating modes of an OLED display is implemented by using the test platform, and during operation, the test platform operates according to the following steps:
and firstly, switching on a power supply to ensure that each device in the test platform works normally.
And secondly, the PC control end sends a control signal to at least one OLED screen signal generator.
Thirdly, a network control chip of the OLED screen signal generator analyzes a control signal sent by a PC control end; and when the network control chip detects that the ID number in the control signal is the same as the ID number of the network control chip, the corresponding OLED screen signal generator starts a response, establishes connection with the PC control end and shifts to the fourth step.
And when the network control chip detects that the ID number in the control signal is different from the ID number of the network control chip, the corresponding OLED screen signal generator is not connected with the PC control end, and then the sixth step is carried out.
And fourthly, after the OLED screen signal generator is successfully connected with the PC control end, the FPGA driving chip analyzes the working mode in the control instruction.
And fifthly, after the FPGA driving chip analyzes the instruction of the working mode, determining whether the image signal is from an external PC control terminal or a Flash memory. If the work mode analyzed by the FPGA driving chip is an online mode, the FPGA driving chip receives an image signal from a PC control end and transmits the image signal to a corresponding OLED screen; and if the working mode analyzed by the FPGA driving chip is the off-line mode, switching to the sixth step.
And sixthly, reading the image signals pre-stored in the Flash memory chip by the FPGA driving chip and transmitting the image signals to the corresponding OLED screen.
In the embodiment, a self-checking process of a working mode is added on the traditional signal generator, the working mode can be switched by a control computer connected with the working mode through an instruction, and the working mode is operated in an off-line mode by default under the condition of no instruction. Each signal generator is added with a unique ID number, so that the same computer is used for controlling a plurality of signal generators, the working modes of the signal generators are switched through instructions, and the control is independent.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered within the protection scope of the present invention.

Claims (5)

1. A test method supporting multiple working modes of an OLED screen is characterized in that: the method comprises the steps that a test platform is set up in advance, and the test platform comprises a PC control end, at least two OLED screen signal generators and at least two OLED screens; each OLED screen signal generator is in communication connection with the PC control end, and the output end of each OLED screen signal generator is connected with the input end of an OLED screen;
the PC control end is used for sending a control signal, a control instruction and an image signal to the OLED screen signal generator so as to control one or more OLED screen signal generators; the control signal comprises an ID number for identifying the OLED screen signal generator;
the OLED screen signal generator comprises:
the network control chips are used for analyzing control signals from the PC control end, and each network control chip comprises a unique ID number;
the FPGA driving chip is used for generating an image driving signal of a required interface protocol and analyzing a working mode in a control instruction from the PC control end;
the storage chip is used for storing image signals which are stored in advance and work in an off-line mode;
when the test platform works, the test platform is used for operating according to the following steps:
firstly, switching on a power supply to ensure that each device in a test platform works normally;
secondly, the PC control end sends a control signal to at least one OLED screen signal generator;
thirdly, a network control chip of the OLED screen signal generator analyzes a control signal sent by a PC control end; when the network control chip detects that the ID number in the control signal is the same as the ID number of the network control chip, the corresponding OLED screen signal generator starts a response, establishes connection with the PC control end and goes to the fourth step;
when the network control chip detects that the ID number in the control signal is different from the ID number of the network control chip, the corresponding OLED screen signal generator is not connected with the PC control end, and then the sixth step is carried out;
fourthly, after the OLED screen signal generator is successfully connected with the PC control end, the FPGA driving chip analyzes the working mode in the control instruction;
fifthly, if the work mode analyzed by the FPGA driving chip is an online mode, the FPGA driving chip receives an image signal from a PC control end and transmits the image signal to a corresponding OLED screen; if the working mode analyzed by the FPGA driving chip is the off-line mode, switching to the sixth step;
and sixthly, reading the image signals pre-stored in the storage chip by the FPGA driving chip and transmitting the image signals to the corresponding OLED screen.
2. The test method supporting multiple working modes of the OLED screen according to claim 1, wherein: the memory chip adopts a Flash memory chip.
3. The test method supporting multiple working modes of the OLED screen according to claim 1, wherein: the step of analyzing the working mode by the FPGA driving chip is as follows: and a resolution protocol is agreed in advance, and the FPGA driving chip analyzes the working mode in the control instruction according to the resolution protocol.
4. The test system supporting the test method of the multiple working modes of the OLED screen according to claim 1, characterized in that: the device comprises a test platform, a signal generator and a signal processing module, wherein the test platform comprises a PC control end, at least two OLED screen signal generators and at least two OLED screens; each OLED screen signal generator is in communication connection with the PC control end, and the output end of each OLED screen signal generator is connected with the input end of an OLED screen;
the PC control end is used for sending a control signal, a control instruction and an image signal to the OLED screen signal generator; the control signal comprises an ID number for identifying the OLED screen signal generator;
the PCOLED screen signal generator includes:
the network control chips are used for analyzing control signals from the PC control end, and each network control chip comprises a unique ID number;
the FPGA driving chip is used for generating an image driving signal of a required interface protocol and analyzing a working mode in a control instruction from the PC control end;
and the memory chip is used for storing the image signals which are stored in advance and work in the off-line mode.
5. The test system supporting the test method of the multiple working modes of the OLED screen according to claim 4, wherein: the memory chip adopts a Flash memory chip.
CN201810257995.8A 2018-03-27 2018-03-27 Test method and system supporting multiple working modes of OLED screen Active CN108520714B (en)

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CN112419945A (en) * 2019-08-23 2021-02-26 陕西坤同半导体科技有限公司 Display test system and test method
CN112382230A (en) * 2020-10-19 2021-02-19 深圳匠明科技有限公司 LED driving circuit, data processing method, device and system and display equipment

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CN205692545U (en) * 2016-06-17 2016-11-16 深圳贝力佳电子科技有限公司 A kind of screen test equipment
CN106445817A (en) * 2016-09-09 2017-02-22 网易(杭州)网络有限公司 Test data processing method, apparatus and system
CN107424553A (en) * 2017-09-22 2017-12-01 深圳市华星光电技术有限公司 Scan drive circuit plate and display device

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CN205692545U (en) * 2016-06-17 2016-11-16 深圳贝力佳电子科技有限公司 A kind of screen test equipment
CN106445817A (en) * 2016-09-09 2017-02-22 网易(杭州)网络有限公司 Test data processing method, apparatus and system
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