CN108509208A - A kind of OTP probes positioning device - Google Patents
A kind of OTP probes positioning device Download PDFInfo
- Publication number
- CN108509208A CN108509208A CN201810296579.9A CN201810296579A CN108509208A CN 108509208 A CN108509208 A CN 108509208A CN 201810296579 A CN201810296579 A CN 201810296579A CN 108509208 A CN108509208 A CN 108509208A
- Authority
- CN
- China
- Prior art keywords
- otp
- test platform
- head
- face plate
- pops
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/60—Software deployment
- G06F8/61—Installation
- G06F8/63—Image based installation; Cloning; Build to order
Abstract
The invention discloses a kind of OTP probe positioning devices, including test platform, multiple limited blocks, returning face plate and OTP probes;Multiple limited blocks are mounted on test platform and surround the rest area for placing LCM, multiple limited blocks can move on test platform, returning face plate is mounted on test platform and can renovate on rest area turnablely, OTP probes are mounted on returning face plate, are renovated OTP probes under state and are located at rest area centre position;In the present invention, the OTP probe positioning devices proposed, OTP probes are located in probe locating slot, when returning face plate covers on rest area, OTP probes are in rest area centre position, do not need operator and OTP probes are moved to rest area centre position manually, have foolproof function, and then burning failure caused by avoiding OTP probe positions inaccuracy, improve the yields of LCM finished products.
Description
Technical field
The present invention relates to LCM production equipment fields more particularly to a kind of OTP probe positioning devices.
Background technology
It needs to give product I C burning OTP values, current operation with probe placement to product intermediate region before LCM finished product tests
Flow be operating personnel by probe placement to finished product with this burning, however in actual mechanical process, operator will pop one's head in
Meaning is placed, and is not placed on the intermediate region of LCM finished products, need to be reprocessed so as to cause burning failure product, is caused unnecessary
Loss, and existing probe is exposed outside, is easily damaged.
Invention content
To solve technical problem present in background technology, the present invention proposes a kind of OTP probes positioning device.
A kind of OTP probes positioning device proposed by the present invention, including test platform, multiple limited blocks, returning face plate and OTP
Probe;Multiple limited blocks are mounted on test platform and surround the rest area for placing LCM, and multiple limited blocks can be flat in test
It is moved on platform, returning face plate is mounted on test platform and can renovate on rest area turnablely, and OTP probes are mounted on returning face plate
On, OTP probes are located at rest area centre position in the state that returning face plate is located on rest area.
Preferably, probe locating slot is offered on returning face plate, OTP probes are mounted in probe locating slot.
Preferably, returning face plate is made of transparent material.
Preferably, test platform is equipped with axle bed, and returning face plate is equipped with connecting shaft, and connecting shaft is mounted on axle bed.
Preferably, the limit flip angle of returning face plate is 90 ° -180 °.
Preferably, waist-shaped hole is offered on multiple limited blocks, bolt penetrates waist-shaped hole and connect with test platform.
Preferably, multiple limited blocks include two groups, respectively first group of limited block and second group of limited block, first group of limit
Block is arranged in parallel on test platform, and second group of limited block is arranged in parallel on test platform, the arrangement side of first group of limited block
It is vertically arranged to the arranged direction with second group of limited block.
Preferably, the edge that test platform is located at rest area has the first notch.
Preferably, test platform includes testing cassete, and test circuit is equipped in testing cassete.
Preferably, the second notch is offered on two side bodies of testing cassete.
In the present invention, the OTP probe positioning devices proposed, OTP probes are located in probe locating slot, work as returning face plate
It covers when on rest area, OTP probes are in rest area centre position, do not need operator and OTP probes are moved to placement manually
Area centre position has foolproof function, and then burning failure caused by avoiding OTP probe positions inaccuracy, improves LCM finished products
Yields.
Description of the drawings
Fig. 1 is a kind of structural schematic diagram of OTP probes positioning device proposed by the present invention.
Specific implementation mode
As shown in FIG. 1, FIG. 1 is a kind of structural schematic diagrams of OTP probes positioning device proposed by the present invention.
Referring to Fig.1, a kind of OTP probes positioning device proposed by the present invention, including 1, four limited block 2 of test platform,
Returning face plate 3 and OTP probes 4;
Test platform 1 includes a testing cassete, and testing cassete is internally provided with test circuit, is opened on the shell of the both sides of testing cassete
Equipped with the second notch 12, member's finger easy to operation, which is put in the second notch 12, moves testing cassete, four 2 L-shaped installations of limited block
On test platform 1, the rest area for placing LCM finished products is surrounded, when LCM finished products are placed on rest area, the phase of LCM finished products
Adjacent both sides are born against on two limited blocks 2;It is further fixed on two axle beds on test platform 1 and is located at rest area side, turns over
Connecting shaft on flap 3 is installed in rotation on axle bed, and when returning face plate 3 goes to horizontality, returning face plate 3 is located at rest area
Top, OTP probes 4 are mounted on returning face plate 3 and are connect with the test circuit inside testing cassete, when returning face plate 3 is located at rest area
When top, OTP probes 4 are located at rest area centre position.
Since the size of different model LCM finished products differs, after LCM finished products are placed on rest area, OTP probes 4 are not necessarily
It is located exactly at the centre position of LCM finished products, thus four limits in the present embodiment can move, it is that four limited blocks 2, which divide,
One group of limited block 21 and second group of limited block 22, first group of limited block 21 and second group of limited block 22 are two limited blocks 2, the
Two 2 moving directions of limited block in one group of limited block 21 are identical, two 2 moving directions of limited block in second group of limited block 22
Identical, the moving direction of first group of limited block 21 and second group of limited block 22 is vertically arranged, specifically, on each limited block 2
It opens up there are two waist-shaped hole, bolt penetrates waist-shaped hole and connect with test platform 1, the length side of first group of 21 waist-shaped hole of limited block
It is vertically arranged to the length direction with second group of limited block 22, loosering a bolt can push limited block 2 to move, therefore, mobile the
One group of limited block 21 and second group of limited block 22 may be implemented LCM finished products along its it is horizontal and vertical move, adjust LCM finished products in
Between position to OTP probe 4 immediately below.
In the present embodiment, in order to protect OTP probes 4, probe locating slot 31,4 peace of OTP probes are offered on returning face plate 3
In probe locating slot 31, after which stops using, returning face plate 3 is gone into horizontal position, OTP probes 4 are reversed 3 volume of plate
Test platform 1 is closed, and is played a very good protection.
For the ease of observing burning process, note abnormalities phenomenon in time, and returning face plate 3 is made of transparent material, this implementation
Using PMMA materials in example;The limit flip angle of returning face plate 3 is 150 ° in the present embodiment, naturally it is also possible to it is 90 °,
100 °, 110 °, 120 °, 130 °, 140 °, 160 °, 170 °, 180 °.
The edge that test platform 1 is located at rest area has the first notch 11, member easy to operation to pick and place LCM products.
Power switch and burning switch are additionally provided on test platform 1, test circuit, which is powered, after power switch is opened opens, and burns
Burning starts after record switch is opened.
In the specific work process of the OTP probe positioning devices of the present embodiment, LCM finished products are first put into rest area, are twisted
Bolt on loose limited block 2, mobile limited block 2 make the centre position of LCM finished products be located exactly at immediately below OTP probes 4, then will
Bolt is tightened, and the overturning of returning face plate 3 to horizontal position opens the power switch on test platform 1, presses burning according to prompt and open
It closes, after the completion of waiting for burning, removes LCM products.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto,
Any one skilled in the art in the technical scope disclosed by the present invention, according to the technique and scheme of the present invention and its
Inventive concept is subject to equivalent substitution or change, should be covered by the protection scope of the present invention.
Claims (10)
- The positioning device 1. a kind of OTP pops one's head in, which is characterized in that including test platform (1), multiple limited blocks (2), returning face plate (3) and OTP pops one's head in (4);Multiple limited blocks (2) are mounted on test platform (1) and surround the rest area for placing LCM, and Multiple limited blocks (2) can move on test platform (1), and returning face plate (3) is mounted on test platform (1) and can turn over turnablely It covers on rest area, OTP pops one's head in (4) on returning face plate (3), and OTP pops one's head in the state that returning face plate (3) is located on rest area (4) it is located at rest area centre position.
- The positioning device 2. OTP according to claim 1 pops one's head in, which is characterized in that it is fixed that probe is offered on returning face plate (3) Position slot (31), OTP pop one's head in (4) in probe locating slot (31).
- The positioning device 3. OTP according to claim 1 pops one's head in, which is characterized in that returning face plate (3) uses transparent material system At.
- The positioning device 4. OTP according to claim 1 pops one's head in, which is characterized in that test platform (1) is equipped with axle bed, Returning face plate (3) is equipped with connecting shaft, and connecting shaft is mounted on axle bed.
- The positioning device 5. OTP according to claim 1 pops one's head in, which is characterized in that the limit flip angle of returning face plate (3) It is 90 ° -180 °.
- The positioning device 6. OTP according to claim 1 pops one's head in, which is characterized in that offer waist on multiple limited blocks (2) Type hole, bolt penetrate waist-shaped hole and are connect with test platform (1).
- The positioning device 7. OTP according to claim 1 pops one's head in, which is characterized in that multiple limited blocks (2) include two groups, Respectively first group of limited block (21) and second group of limited block (22), first group of limited block (21) are parallel on test platform (1) Arrangement, second group of limited block (22) are arranged in parallel on test platform (1), the arranged direction and second of first group of limited block (21) The arranged direction of group limited block (22) is vertically arranged.
- The positioning device 8. OTP according to claim 1 pops one's head in, which is characterized in that test platform (1) is located at rest area Edge has the first notch (11).
- The positioning device 9. OTP according to claim 1 pops one's head in, which is characterized in that test platform (1) includes testing cassete, Test circuit is equipped in testing cassete.
- The positioning device 10. OTP according to claim 9 pops one's head in, which is characterized in that opened up on two side bodies of testing cassete There is the second notch (12).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201810296579.9A CN108509208A (en) | 2018-03-30 | 2018-03-30 | A kind of OTP probes positioning device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201810296579.9A CN108509208A (en) | 2018-03-30 | 2018-03-30 | A kind of OTP probes positioning device |
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CN108509208A true CN108509208A (en) | 2018-09-07 |
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CN201810296579.9A Pending CN108509208A (en) | 2018-03-30 | 2018-03-30 | A kind of OTP probes positioning device |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2175761C2 (en) * | 1999-06-08 | 2001-11-10 | Государственный научно-исследовательский институт физических проблем им. Ф.В. Лукина | Method for measuring surface relief by means of scanning probe type microscope |
CN204632307U (en) * | 2015-04-15 | 2015-09-09 | 深圳市立德通讯器材有限公司 | The automatic burning of display screen module VCOM detects all-in-one |
CN205193103U (en) * | 2015-10-30 | 2016-04-27 | 惠州凯尔光电有限公司 | OTP burns record tool |
CN206741471U (en) * | 2017-04-21 | 2017-12-12 | 华显光电技术(惠州)有限公司 | OTP recording clamps |
-
2018
- 2018-03-30 CN CN201810296579.9A patent/CN108509208A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2175761C2 (en) * | 1999-06-08 | 2001-11-10 | Государственный научно-исследовательский институт физических проблем им. Ф.В. Лукина | Method for measuring surface relief by means of scanning probe type microscope |
CN204632307U (en) * | 2015-04-15 | 2015-09-09 | 深圳市立德通讯器材有限公司 | The automatic burning of display screen module VCOM detects all-in-one |
CN205193103U (en) * | 2015-10-30 | 2016-04-27 | 惠州凯尔光电有限公司 | OTP burns record tool |
CN206741471U (en) * | 2017-04-21 | 2017-12-12 | 华显光电技术(惠州)有限公司 | OTP recording clamps |
Non-Patent Citations (1)
Title |
---|
邓中华;张庆利;唐智辉;韦应靖;金成赫;吴凯;: "可携式放射源定向测量仪探头设计", 核电子学与探测技术, no. 08 * |
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