CN216956256U - Chip performance test equipment - Google Patents

Chip performance test equipment Download PDF

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Publication number
CN216956256U
CN216956256U CN202123128542.1U CN202123128542U CN216956256U CN 216956256 U CN216956256 U CN 216956256U CN 202123128542 U CN202123128542 U CN 202123128542U CN 216956256 U CN216956256 U CN 216956256U
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China
Prior art keywords
bottom plate
fixed mounting
chip performance
plate
rod
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CN202123128542.1U
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Chinese (zh)
Inventor
吴锋
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Zhuhai Huarui Automation Technology Co ltd
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Zhuhai Huarui Automation Technology Co ltd
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Abstract

The utility model discloses chip performance testing equipment in the technical field of chips, which comprises a bottom plate, wherein a protective box is fixedly mounted at the top of the bottom plate, a guide plate is fixedly mounted at the top of the bottom plate, a sliding block is slidably connected inside the protective box, a placing plate is fixedly connected to one side, away from the protective box, of the sliding block, a gasket is movably connected to the top of the placing plate, an electric telescopic rod is fixedly mounted on the inner wall of the protective box, a connecting rod is fixedly mounted on the inner top wall of the protective box, a limiting plate is fixedly connected to the bottom of the connecting rod, and a detection probe is fixedly mounted at the bottom of the limiting plate. The utility model has the beneficial effects that: through the electric telescopic handle operation, remove the regulation to the position of placing the board, the chip is placed in the inside of gasket, and rethread limiting plate and test probe's cooperation is used, thereby has reached through above-mentioned structure and is convenient for to the effect that the chip detected to lieing in gasket top chip detection.

Description

Chip performance test equipment
Technical Field
The utility model relates to the technical field of chips, in particular to a chip performance testing device.
Background
A chip is an integrated circuit, which is called a microcircuit, microchip, chip/chip is a way in electronics to miniaturize the circuit and is often manufactured on the surface of a semiconductor wafer.
In the process of implementing the application, the inventor finds that at least the following problems exist in the technology: in the prior art, the existing chips are widely used, but some chips may not be tested before being installed and used, so that the possible problems of the chips may not be found, and the qualification rate of the chips is greatly reduced.
Therefore, a chip performance testing device is proposed to solve the above problems.
SUMMERY OF THE UTILITY MODEL
The present invention is directed to a chip performance testing apparatus, so as to solve the problems mentioned in the background art.
In order to achieve the purpose, the utility model provides the following technical scheme: the utility model provides a chip performance test equipment, includes the bottom plate, the top fixed mounting of bottom plate has the protective housing, the top fixed mounting of bottom plate has the guide tablet, the inside sliding connection of protective housing has the slider, the board is placed to one side fixedly connected with that the protective housing was kept away from to the slider, the top swing joint who places the board has the gasket, the inner wall fixed mounting of protective housing has electric telescopic handle, the interior roof fixed mounting of protective housing has the connecting rod, the bottom fixedly connected with limiting plate of connecting rod, the bottom fixed mounting of limiting plate has test probe.
As a still further scheme of the utility model: the spout has been seted up to the internal surface of protective housing, the inside of spout and the both sides laminating of slider through setting up the spout, have realized increasing the stability that the slider removed.
As a still further scheme of the utility model: the top threaded connection of gasket has the self-tapping screw, the surface of self-tapping screw and the top threaded connection who places the board through setting up the self-tapping screw, have realized being convenient for to the rigidity of gasket.
As a still further scheme of the utility model: the top of guard box is rotated and is connected with the rotary rod, the top fixed mounting of rotary rod has the display screen, display screen and test probe electric connection, the both sides fixed mounting of rotary rod has the stress bar, through setting up rotary rod and display screen, has realized being convenient for observe test quantity.
As a still further scheme of the utility model: the round hole has been seted up at the top of guard box, the diameter of round hole equals with the diameter of rotary rod, through setting up the round hole, has realized increasing rotary rod pivoted stability.
As a still further scheme of the utility model: the top fixed mounting of bottom plate has the stopper, the internal thread of bottom plate is connected with the threaded rod, the surface of threaded rod and the inner wall threaded connection of stopper have realized adjusting the height of bottom plate through setting up stopper and threaded rod.
As a still further scheme of the utility model: the bottom fixed mounting of threaded rod has the cushion, the bottom fixedly connected with sucking disc of cushion through setting up cushion and sucking disc, has realized the stability of bottom when guaranteeing the device operation.
Compared with the prior art, the utility model has the beneficial effects that: the chip on the top of the gasket is detected by matching the limiting plate and the detection probe, and the effect of facilitating chip detection is achieved through the structure; the bottom of the bottom plate is adjusted to a proper position by the aid of the limiting blocks and the threaded rods in a matched mode, the bottom of the device is improved in stability by the aid of the cushion blocks and the suckers in a matched mode, and accordingly the bottom of the device is convenient to locate.
Drawings
FIG. 1 is a schematic perspective view of the present invention;
FIG. 2 is a schematic view of the electric telescopic rod of the present invention;
FIG. 3 is a schematic view of the structure of the inspection probe of the present invention;
fig. 4 is a schematic view of the rotating rod structure of the present invention.
In the figure: 1. a base plate; 2. a protective box; 3. a guide plate; 4. a slider; 5. placing the plate; 6. a gasket; 7. an electric telescopic rod; 8. a chute; 9. self-tapping screw; 10. a connecting rod; 11. a limiting plate; 12. detecting a probe; 13. rotating the rod; 14. a display screen; 15. a circular hole; 16. a stress beam; 17. a limiting block; 18. a threaded rod; 19. cushion blocks; 20. and (4) sucking discs.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1 to 4, in an embodiment of the present invention, a chip performance testing apparatus includes a bottom plate 1, a protective box 2 is fixedly installed on a top of the bottom plate 1, two guiding plates 3 are fixedly installed on the top of the bottom plate 1, the two guiding plates 3 are symmetrically distributed around a central axis of the bottom plate 1, a sliding block 4 is slidably connected inside the protective box 2, the two sliding blocks 4 are symmetrically distributed around the central axis of the protective box 2, a placing plate 5 is fixedly connected to a side of the sliding block 4 away from the protective box 2, the placing plate 5 is located at a side adjacent to the sliding block 4, a gasket 6 is movably connected to a top of the placing plate 5, the gasket 6 is mainly made of rubber and has certain elasticity, an electric telescopic rod 7 is fixedly installed on an inner wall of the protective box 2, the electric telescopic rod 7 is provided with two electric telescopic rods, the two electric telescopic rods 7 are symmetrically distributed around the central axis of the protective box 2, 7 operation backs of electric telescopic handle, place the position that board 5 drove gasket 6 and adjust, the interior roof fixed mounting of protective housing 2 has connecting rod 10, the bottom fixedly connected with limiting plate 11 of connecting rod 10, limiting plate 11 is provided with threely, three connecting rod 10 is located the interior roof evenly distributed of protective housing 2, the bottom fixed mounting of limiting plate 11 has test probe 12, place board 5 and remove to limiting plate 11 behind under, test probe 12 detects the chip that is located gasket 6.
The inner surface of the protective box 2 is provided with two sliding chutes 8, the two sliding chutes 8 are symmetrically distributed by taking the central axis of the protective box 2 as a center, the inner part of each sliding chute 8 is attached to two sides of each sliding block 4, and the sliding blocks 4 are attached to the sliding chutes 8 to increase the moving stability of the placing plate 5; the top of the gasket 6 is in threaded connection with a self-tapping screw 9, the outer surface of the self-tapping screw 9 is in threaded connection with the top of the placing plate 5, and the gasket 6 is fixed on the top of the placing plate 5 through the self-tapping screw 9; the top of the protection box 2 is rotatably connected with a rotating rod 13, the rotating rod 13 is located at the center of the top of the protection box 2, a display screen 14 is fixedly installed at the top of the rotating rod 13, the display screen 14 is electrically connected with the detection probe 12, stress rods 16 are fixedly installed on two sides of the rotating rod 13, and after acting force is applied to the stress rods 16, the rotating rod 13 drives the display screen 14 to rotate, so that the display screen 14 is adjusted to a proper angle; round hole 15 has been seted up at the top of guard box 2, and the diameter of round hole 15 equals with the diameter of rotary rod 13, and the outside looks adaptation of the inside of round hole 15 and stress bar 16, round hole 15 make rotary rod 13 stably rotate.
The top of the bottom plate 1 is fixedly provided with limiting blocks 17, the four limiting blocks 17 are arranged, the four limiting blocks 17 are uniformly distributed on the top of the bottom plate 1, threaded rods 18 are connected to the inner portion of the bottom plate 1 in a threaded mode, the number of the threaded rods 18 is equal to that of the limiting blocks 17, the outer surfaces of the threaded rods 18 are connected with the inner walls of the limiting blocks 17 in a threaded mode, and the tops of the threaded rods 18 move to the inner portions of the limiting blocks 17, so that the height of the bottom plate 1 is adjusted; the bottom of threaded rod 18 is fixed with cushion 19, and the quantity of cushion 19 equals the quantity of threaded rod 18, and the bottom fixedly connected with sucking disc 20 of cushion 19, the quantity of cushion 19 equals the quantity of sucking disc 20, and cushion 19 supports sucking disc 20, thereby sucking disc 20 and the bottom contact of detection room increase the stability of bottom plate 1 bottom.
The working principle of the utility model is as follows: when the device is used, firstly, the electric telescopic rod 7 is operated, after the placing plate 5 is subjected to thrust, the slide block 4 enables the placing plate 5 to stably move, so that the placing plate 5 is moved to the side of the protective casing 2 remote from the electric telescopic rod 7, the gasket 6 is fixed on the top of the placing plate 5 using the tapping screw 9, the worker places the chip inside the gasket 6, and then the electric telescopic rod 7 is operated again, the placing plate 5 is moved in a direction close to the electric telescopic rod 7, so that the central point of the placing plate 5 and the central point of the limiting plate 11 are positioned on the same axis, so that the detecting probe 12 is positioned right above the chip, after the detecting probe 12 is operated, the chip is irradiated, so that the chip is tested, the stress rod 16 is driven to rotate, the rotating rod 13 drives the display screen 14 to rotate, the display screen 14 is adjusted to a proper angle, and the effect of facilitating detection of the chip is achieved through the structure.
After bottom plate 1 removed the detection room, the height of adjusting threaded rod 18 for the bottom of bottom plate 1 is in balanced state, and sucking disc 20 further increases bottom plate 1's stability with the bottom contact back that detects the room, and cushion 19 is to the nearly support of threaded rod 18, thereby guarantees the stability of device operation, thereby has reached the effect of being convenient for to device bottom location through above-mentioned structure.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered as the technical solution of the present invention and the inventive concept with equivalent alternatives or modifications within the scope of the present invention.

Claims (7)

1. A chip performance test equipment, includes bottom plate (1), its characterized in that: the utility model discloses a safety protection box, including bottom plate (1), bottom plate (2), top fixedly mounted has guide tablet (3) of bottom plate (1), the inside sliding connection of protection box (2) has slider (4), one side fixedly connected with that protection box (2) were kept away from in slider (4) places board (5), the top swing joint who places board (5) has gasket (6), the inner wall fixed mounting of protection box (2) has electric telescopic handle (7), the interior roof fixed mounting of protection box (2) has connecting rod (10), the bottom fixedly connected with limiting plate (11) of connecting rod (10), the bottom fixed mounting of limiting plate (11) has test probe (12).
2. The chip performance testing apparatus of claim 1, wherein: the inner surface of the protective box (2) is provided with a sliding groove (8), and the inner part of the sliding groove (8) is attached to the two sides of the sliding block (4).
3. The chip performance testing apparatus of claim 2, wherein: the top threaded connection of gasket (6) has self-tapping screw (9), the surface of self-tapping screw (9) and the top threaded connection who places board (5).
4. The chip performance testing apparatus of claim 3, wherein: the top of guard box (2) is rotated and is connected with rotary rod (13), the top fixed mounting of rotary rod (13) has display screen (14), display screen (14) and test probe (12) electric connection, the both sides fixed mounting of rotary rod (13) has stress bar (16).
5. The chip performance testing apparatus of claim 4, wherein: round hole (15) have been seted up at the top of guard box (2), the diameter of round hole (15) equals with the diameter of rotary rod (13).
6. The chip performance testing apparatus of claim 1, wherein: the top fixed mounting of bottom plate (1) has stopper (17), the internal thread of bottom plate (1) is connected with threaded rod (18), the surface of threaded rod (18) and the inner wall threaded connection of stopper (17).
7. The chip performance testing apparatus of claim 6, wherein: the bottom fixed mounting of threaded rod (18) has cushion (19), the bottom fixedly connected with sucking disc (20) of cushion (19).
CN202123128542.1U 2021-12-13 2021-12-13 Chip performance test equipment Active CN216956256U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202123128542.1U CN216956256U (en) 2021-12-13 2021-12-13 Chip performance test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202123128542.1U CN216956256U (en) 2021-12-13 2021-12-13 Chip performance test equipment

Publications (1)

Publication Number Publication Date
CN216956256U true CN216956256U (en) 2022-07-12

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202123128542.1U Active CN216956256U (en) 2021-12-13 2021-12-13 Chip performance test equipment

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CN (1) CN216956256U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115646862A (en) * 2022-12-27 2023-01-31 镇江矽佳测试技术有限公司 Chip testing machine capable of automatically marking dead spots

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115646862A (en) * 2022-12-27 2023-01-31 镇江矽佳测试技术有限公司 Chip testing machine capable of automatically marking dead spots
CN115646862B (en) * 2022-12-27 2023-03-14 镇江矽佳测试技术有限公司 Chip testing machine capable of automatically marking dead pixel

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