CN108490339A - A kind of chip testing attachment device - Google Patents
A kind of chip testing attachment device Download PDFInfo
- Publication number
- CN108490339A CN108490339A CN201810217745.1A CN201810217745A CN108490339A CN 108490339 A CN108490339 A CN 108490339A CN 201810217745 A CN201810217745 A CN 201810217745A CN 108490339 A CN108490339 A CN 108490339A
- Authority
- CN
- China
- Prior art keywords
- sliding block
- connect
- cylinder
- connecting plate
- pin insertion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of chip testing attachment device, described device includes：Connecting plate, multiple sliding blocks, multiple collets, multiple pin insertion ends, transmission line；The connecting plate upper surface is equipped with sliding slot, multiple sliding blocks are equipped in sliding slot, sliding block is corresponded with pin insertion end, and pin insertion end lower end is connect by collets with sliding block across sliding slot, transmission line one end is connect with bottom in pin insertion end, the connecting pin connection of the transmission line other end and connecting plate；Sliding block is made of electromagnet, and connecting plate is made of metal, and sliding block is connect by switching with power supply, realizes device reasonable design, versatility is preferable, improves testing efficiency, reduces the technique effect of testing cost.
Description
Technical field
The present invention relates to chip fields, and in particular, to a kind of chip testing attachment device.
Background technology
Chip, English are Chip；Chipset is Chipset.Chip generally refers to the carrier of integrated circuit, and integrated electricity
Road after design, manufacture, encapsulation, test as a result, the typically one independent entirety that can be used immediately." chip " and
" integrated circuit " the two words often mix use, for example in everybody usual discussion topic, IC design and chip are set
What meter was said is a meaning, and chip industry, integrated circuit industry, IC industries are also often a meaning.In fact, the two words
It is related, also has any different.Integrated circuit entity will often exist in the form of chip, be to emphasize because of the integrated circuit of narrow sense
Circuit itself, for example, it is simple to only there are five the phaseshift oscillators that element is joined together to form, when it is also presented on drawing
When, we can also be its integrated circuit, and when we will be by this small integrated circuit come when application, it must be with
Independent one piece of material object, or be embedded into the integrated circuit of bigger, rely on chip to play his effect；Integrated circuit is more
The design of weight circuit and placement-and-routing, the integrated of chip more accentuator circuit, production and encapsulation.And the integrated circuit of broad sense, when relating to
Can also include the relevant various meanings of chip and when to industry (being different from other industry).
Chip is frequently necessary to be tested, and chip, which needs to insert pins into test lead when being tested, to be tested, by
Different in the model of chip, the number and spacing of pin are also different, this cause test when, need different connecting pins into
Row connection, versatility is poor, reduces the efficiency of test, improves testing cost.
Invention content
The present invention provides a kind of chip testing attachment devices, solve existing chip testing attachment device versatility
Poor technical problem realizes device reasonable design, and versatility is preferable, improves testing efficiency, reduces testing cost
Technique effect.
For achieving the above object, this application provides a kind of chip testing attachment device, described device includes：
Connecting plate, multiple sliding blocks, multiple collets, multiple pin insertion ends, transmission line；The connecting plate upper surface is equipped with
Sliding slot, sliding slot is interior to be equipped with multiple sliding blocks, and sliding block is corresponded with pin insertion end, and pin insertion end lower end passes through exhausted across sliding slot
Edge block is connect with sliding block, and transmission line one end is connect with bottom in pin insertion end, the connecting pin of the transmission line other end and connecting plate
Connection；Sliding block is made of electromagnet, and connecting plate is made of metal, and sliding block is connect by switching with power supply.
Wherein, the principle of the present invention is：When needing to test chip, the pin of test chip is inserted into pin
In insertion end, is established and connected using transmission line, since multiple pin insertion ends can be moved using sliding block in sliding slot, Ke Yishi
The movement of existing multiple pin insertion ends, and then number and spacing that chip pin is inserted into pin insertion end can be adjusted, work as adjustment
It to after suitable position and spacing, turns on the switch so that electromagnet, which is powered, generates magnetic force so that sliding block adsorbs sliding slot, carries out
Fixed, anti-sliding stop carries out chip testing, is turned off the switch after the completion of test, different chip testing can be used, to pin
Number and spacing all have versatility.
Further, sliding slot side is equipped with multiple first positioning holes, and sliding block is equipped with second location hole, and locating pin is inserted into the
One and second location hole in sliding block is fixed.When electromagnetic adsorption solid failure, can be fixed using fixing glue.
Further, connection plate surface is equipped with insulating protective sleeve.
Further, pin insertion end includes：The first cylinder and the second cylinder, the first cylinder and the second cylinder both ends are
Openning shape, the first cylinder lower end are connect with the second cylinder upper end, and the second cylinder lower end is connect with sliding block, are equipped with and are used in the middle part of sliding block
The through-hole that transmission line passes through, the first cylinder are made of soft rubber.
Further, described device further includes corrugated flexible hose and vacuum cup, and corrugated flexible hose one end connects with connecting plate side
It connects, the corrugated flexible hose other end is connect with vacuum cup.Chip can be consolidated using vacuum cup absorption chip.
One or more technical solution provided by the present application, has at least the following technical effects or advantages：
It solves the poor technical problem of existing chip testing attachment device versatility, realizes device reasonable design,
Versatility is preferable, improves testing efficiency, reduces the technique effect of testing cost.
Description of the drawings
Attached drawing described herein is used for providing further understanding the embodiment of the present invention, constitutes one of the application
Point, do not constitute the restriction to the embodiment of the present invention；
Fig. 1 is the structural schematic diagram of the application core built-in testing attachment device.
Specific implementation mode
The present invention provides a kind of chip testing attachment devices, solve existing chip testing attachment device versatility
Poor technical problem realizes device reasonable design, and versatility is preferable, improves testing efficiency, reduces testing cost
Technique effect.
To better understand the objects, features and advantages of the present invention, below in conjunction with the accompanying drawings and specific real
Mode is applied the present invention is further described in detail.It should be noted that in the case where not conflicting mutually, the application's
Feature in embodiment and embodiment can be combined with each other.
Many details are elaborated in the following description to facilitate a thorough understanding of the present invention, still, the present invention may be used also
Implemented with being different from the other modes being described herein in range using other, therefore, protection scope of the present invention is not by under
The limitation of specific embodiment disclosed in face.
Referring to FIG. 1, this application provides a kind of chip testing attachment device, described device includes：
Connecting plate 1, multiple sliding blocks 2, multiple collets 3, multiple pin insertion ends 4, transmission line 5；The connecting plate upper table
Face is equipped with sliding slot 6, and multiple sliding blocks are equipped in sliding slot, and sliding block is corresponded with pin insertion end, and pin insertion end lower end, which passes through, to be slided
Slot is connect by collets with sliding block, and transmission line one end is connect with bottom in pin insertion end, the transmission line other end and connecting plate
Connecting pin connection；Sliding block is made of electromagnet, and connecting plate is made of metal, and sliding block is connect by switch 7 with power supply 8.
Wherein, the principle of the present invention is：When needing to test chip, the pin of test chip is inserted into pin
In insertion end, is established and connected using transmission line, since multiple pin insertion ends can be moved using sliding block in sliding slot, Ke Yishi
The movement of existing multiple pin insertion ends, and then number and spacing that chip pin is inserted into pin insertion end can be adjusted, work as adjustment
It to after suitable position and spacing, turns on the switch so that electromagnet, which is powered, generates magnetic force so that sliding block adsorbs sliding slot, carries out
Fixed, anti-sliding stop carries out chip testing, is turned off the switch after the completion of test, different chip testing can be used, to pin
Number and spacing all have versatility.
Further, sliding slot side is equipped with multiple first positioning holes, and sliding block is equipped with second location hole, and locating pin is inserted into the
One and second location hole in sliding block is fixed.When electromagnetic adsorption solid failure, can be fixed using fixing glue.
Further, connection plate surface is equipped with insulating protective sleeve.
Further, pin insertion end includes：The first cylinder and the second cylinder, the first cylinder and the second cylinder both ends are
Openning shape, the first cylinder lower end are connect with the second cylinder upper end, and the second cylinder lower end is connect with sliding block, are equipped with and are used in the middle part of sliding block
The through-hole that transmission line passes through, the first cylinder are made of soft rubber.
Further, described device further includes corrugated flexible hose and vacuum cup, and corrugated flexible hose one end connects with connecting plate side
It connects, the corrugated flexible hose other end is connect with vacuum cup.Chip can be consolidated using vacuum cup absorption chip.
Although preferred embodiments of the present invention have been described, it is created once a person skilled in the art knows basic
Property concept, then additional changes and modifications may be made to these embodiments.So it includes excellent that the following claims are intended to be interpreted as
It selects embodiment and falls into all change and modification of the scope of the invention.
Obviously, various changes and modifications can be made to the invention without departing from essence of the invention by those skilled in the art
God and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies
Within, then the present invention is also intended to include these modifications and variations.
Claims (5)
1. a kind of chip testing attachment device, which is characterized in that described device includes：
Connecting plate, multiple sliding blocks, multiple collets, multiple pin insertion ends, transmission line；The connecting plate upper surface, which is equipped with, to be slided
Slot, sliding slot is interior to be equipped with multiple sliding blocks, and sliding block is corresponded with pin insertion end, and pin insertion end lower end passes through insulation across sliding slot
Block is connect with sliding block, and transmission line one end is connect with bottom in pin insertion end, and the connecting pin of the transmission line other end and connecting plate connects
It connects；Sliding block is made of electromagnet, and connecting plate is made of metal, and sliding block is connect by switching with power supply.
2. chip testing attachment device according to claim 1, which is characterized in that it is fixed that sliding slot side is equipped with multiple first
Position hole, sliding block are equipped with second location hole, and locating pin is inserted into the first and second location holes and sliding block is fixed.
3. chip testing attachment device according to claim 1, which is characterized in that connection plate surface is equipped with insulation protection
Set.
4. chip testing attachment device according to claim 1, which is characterized in that pin insertion end includes：First circle
Cylinder and the second cylinder, the first cylinder and the second cylinder both ends are openning shape, and the first cylinder lower end is connect with the second cylinder upper end,
The second cylinder lower end is connect with sliding block, is equipped in the middle part of sliding block and is used for transmission the through-hole that line passes through, the first cylinder uses soft rubber
It is made.
5. chip testing attachment device according to claim 1, which is characterized in that described device further includes corrugated flexible hose
And vacuum cup, corrugated flexible hose one end are connect with connecting plate side, the corrugated flexible hose other end is connect with vacuum cup.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810217745.1A CN108490339A (en) | 2018-03-16 | 2018-03-16 | A kind of chip testing attachment device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810217745.1A CN108490339A (en) | 2018-03-16 | 2018-03-16 | A kind of chip testing attachment device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108490339A true CN108490339A (en) | 2018-09-04 |
Family
ID=63339486
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810217745.1A Withdrawn CN108490339A (en) | 2018-03-16 | 2018-03-16 | A kind of chip testing attachment device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108490339A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114578216A (en) * | 2022-04-30 | 2022-06-03 | 南昌耀德精密五金有限公司 | Conducting device for chip test |
-
2018
- 2018-03-16 CN CN201810217745.1A patent/CN108490339A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114578216A (en) * | 2022-04-30 | 2022-06-03 | 南昌耀德精密五金有限公司 | Conducting device for chip test |
| CN114578216B (en) * | 2022-04-30 | 2022-07-15 | 南昌耀德精密五金有限公司 | Conducting device for chip test |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WW01 | Invention patent application withdrawn after publication | ||
| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20180904 |