CN108490012B - Dual particle photographing apparatus and method based on laser-generated X-rays and protons - Google Patents

Dual particle photographing apparatus and method based on laser-generated X-rays and protons Download PDF

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Publication number
CN108490012B
CN108490012B CN201810331761.3A CN201810331761A CN108490012B CN 108490012 B CN108490012 B CN 108490012B CN 201810331761 A CN201810331761 A CN 201810331761A CN 108490012 B CN108490012 B CN 108490012B
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proton
laser
rays
ray
detector
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CN108490012A (en
Inventor
张天奎
于明海
吴玉迟
贺书凯
滕建
卢峰
朱斌
闫永宏
董克攻
谭放
杨月
范伟
李纲
辛建婷
谷渝秋
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Laser Fusion Research Center China Academy of Engineering Physics
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Laser Fusion Research Center China Academy of Engineering Physics
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2206Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
    • G01N23/2208Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of a secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/071Investigating materials by wave or particle radiation secondary emission combination of measurements, at least 1 secondary emission
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00Energy generation of nuclear origin
    • Y02E30/10Nuclear fusion reactors

Abstract

The invention discloses a double-particle photographing device based on X-rays and protons generated by laser, comprising an ultrafast laser beam; a reflecting mirror, wherein the laser beam reflected by the ultrafast laser beam is converged at one point; a metal target, on which the reflected laser beam is incident, to generate an X-ray, a proton beam, and an electron beam; the positioning block is positioned behind the metal target; the proton beam detector is positioned behind the positioning block and is used for detecting and recording a proton image shot by the proton beam; a deflection magnet for deflecting the proton beam and the electron beam; and the X-ray detector is positioned behind the deflection magnet and is used for detecting and recording X-ray images shot by X-rays. The device is easy to obtain, the combination and placement are convenient, and the device can be used for shooting objects, so that the measurement of objects with different substance densities and electromagnetic field information carried by the objects can be completed in one detection.

Description

Dual particle photographing apparatus and method based on laser-generated X-rays and protons
Technical Field
The invention relates to the technical field of detection, in particular to a double-particle photographing device and a method based on X-rays and protons generated by laser.
Background
Nondestructive testing requirements using X-rays are commonly found in the fields of industrial production, homeland security, material research and development, basic scientific research, and the like. At present, for detecting objects with different material densities, the electron energy and the target material are required to be changed to obtain X-rays with different energies, and detection images with clear areas with different material densities are obtained for multiple times, so that the defects of time consumption, high economic cost and the like of detection exist. In particular, in the dynamic process of extremely severe material density change, through measurement of different times, the detection result with consistent process is difficult to obtain due to the characteristic of low repetition. In addition, strong electromagnetic field structures are generated in the evolution of some dynamic processes, and X rays cannot detect the field structures, so that detection tools for basic scientific research processes are lacked. The lack of detection of objects with different densities through multiple detection and electromagnetic field structures influences the wide application of nondestructive detection technology in material research and development and basic scientific research.
Disclosure of Invention
The invention aims to solve the technical problems and provide a double-particle photographing device based on X-rays and protons generated by laser, wherein all devices in the device are easy to obtain, and the combination and placement are convenient.
In order to achieve the above purpose, the technical scheme adopted by the invention is as follows:
a dual particle photographing apparatus based on X-rays and protons generated by a laser, comprising an ultrafast laser beam;
the reflecting mirror is an arc reflecting mirror, and after the ultrafast laser beam horizontally enters the reflecting mirror, the reflected laser beam is converged at one point;
a metal target located on the side of the reflecting mirror where the reflected laser beam is located, the reflected laser beam being incident on the metal target and generating X-rays, proton beams and electron beams by laser plasma interactions;
the positioning block is positioned behind the metal target, namely in the emergent direction of the metal target, so that X-rays and proton beams can conveniently shoot objects after the positioning block is replaced;
the proton beam detector is positioned behind the positioning block and is used for detecting and recording a proton image shot by the proton beam;
the deflection magnet is positioned behind the proton detector and is used for deflecting the proton beam and the electron beam;
and the X-ray detector is positioned behind the deflection magnet and is used for detecting and recording X-ray images shot by X-rays.
Specifically, the centers of the metal target, the positioning block, the proton detector, the deflection magnet and the X-ray detector are positioned on the same axis.
More specifically, the ultrafast laser beam refers to an ultrashort pulse emitted by an ultrashort pulse laser, and the ultrashort pulse laser refers to a pulse laser with a pulse width of 100ps or less.
Meanwhile, the invention also provides a method for photographing the object based on the equipment, which can play an important advantage of single-shot transient photographing, obtain an X-ray image and a proton image of the object by photographing, further provide key research information such as object density, electromagnetic field and the like, and is an important means for deeply understanding scientific research.
In order to achieve the above purpose, the technical scheme adopted by the invention is as follows:
specifically, a dual particle radiography method based on laser-generated X-rays and protons is: generating X-rays and proton beams through laser plasma interaction; the object is photographed in the flight of X-rays and proton beams, a proton image is recorded by a proton detector, and the proton detector is insensitive to the X-rays due to strong penetrability of the X-rays, electrons and the like, so that no image of the X-rays and the like is recorded on the proton detector; the proton beam, electron beam, etc. are deflected by the deflection magnet, only the X-rays are unaffected, and the X-ray image is recorded by the X-ray detector.
Because the X-ray irradiation is sensitive to objects with relatively high substance density, the proton irradiation is sensitive to objects with relatively low substance density and charged magnetic field distribution, and the combination of the X-ray image and the proton image can carry out photographic measurement on the objects in a large substance density range and measure the electromagnetic field information carried by the objects. In addition, since the time pulse width of the X-ray source and the proton source generated by the ultrafast laser is only tens of picoseconds, even if the photographic object is dynamic (i.e., the information such as the object's substance density distribution, electromagnetic field distribution, etc. changes with time), an image at the transient time can be obtained.
Compared with the prior art, the invention has the following beneficial effects:
the invention provides a new measuring device for nondestructive testing of objects with different substance densities, which has the advantages that all the adopted devices are very easy to obtain, the operation error is small, the operation is convenient, the device can provide high-contrast photographic images of objects with different substance densities in one measurement, and gives out electromagnetic field information, in particular provides a transient measuring means with comprehensive information for scientific research with low repeatability of each process, and can effectively reduce the time and economic cost required by research. In addition, for dynamic process evolution such as material dynamic process, physical and chemical dynamic process and the like, the X-ray and proton double-particle photographing technology generated by laser can play important advantages of single-shot transient photographing, provide key research information such as density, electromagnetic field and the like, and provide an important means for scientific research and deep understanding.
Drawings
FIG. 1 is a schematic diagram of the apparatus of the present invention;
FIG. 2 is a proton beam photograph taken of a metal in an example;
fig. 3 is an X-ray photograph taken of a metal in an example.
Wherein, the names corresponding to the reference numerals are:
1-ultrafast laser beam, 2-reflector, 3-metal target, 4-positioning block, 5-proton detector, 6-deflection magnet and 7-X-ray detector.
Detailed Description
The invention will be further illustrated by the following description and examples, which include but are not limited to the following examples.
The embodiment provides a double-particle photographing device based on X-rays and protons generated by laser, which is formed by combining and placing various existing components in a specific way, and can achieve the purpose of completing measurement of objects with different substance densities and electromagnetic field information carried by the objects in one detection. The photographing apparatus comprises an ultrafast (i.e. ultra-short time pulse) laser beam 1, a reflecting mirror 2, a metal target 3, a proton detector 5 (recording a proton image), a deflection magnet 6, an X-ray detector 7 (recording an X-ray image), and in addition, a positioning block 4 for positioning the object, which is convenient for photographing the object and enables the object to have a better photographing effect, only needs to replace the positioning block during photographing.
Specifically, as shown in fig. 1, the ultrafast laser beam 1 refers to an ultrashort pulse emitted by an ultrashort pulse laser, and the ultrashort pulse laser refers to a pulse laser with a pulse width of 100ps or less; the pulse laser is horizontally arranged and emits an ultrafast laser beam 1 horizontally leftwards; the reflecting mirror 2 is an arc reflecting mirror, and after the ultrafast laser beam horizontally enters the reflecting mirror, the reflected laser beam is converged at one point; the metal target is positioned on the right side of the reflecting mirror, and the position of the metal target is on or near the collecting point of the reflected laser beam, and when the reflected laser beam is incident on the metal target, X rays, proton beams and electron beams are generated through laser plasma interaction; the positioning block is positioned on the right side of the metal target, namely in the emergent direction of the metal target, and the distance between the positioning block and the metal target can be adjusted according to specific conditions, so long as the proton detector and the X-ray detector can shoot complete images; the proton detector 5 is positioned on the right of the positioning block and is used for detecting and recording a proton image shot by the proton beam; the deflection magnet 6 is positioned at the right of the proton detector and is used for deflecting proton beams and electron beams; the X-ray detector 7 is positioned on the right of the deflection magnet and is used for detecting and recording X-ray images taken by X-rays. For the convenience of shooting and the convenience of equipment placement (i.e. installation), the centers of the metal target 3, the positioning block 4, the proton detector 5, the deflection magnet 6 and the X-ray detector 7 are positioned on the same horizontal line.
The working principle of the device of the embodiment is as follows: in the process of double-particle photography of X-rays and protons generated by laser, an ultrafast laser beam is incident on a metal target through a reflecting mirror, and X-rays, electron beams and proton beams are generated through laser plasma interaction; the object is photographed in the flight of X-rays and proton beams, a proton image is recorded by a proton detector, and the proton detector is insensitive to the X-rays due to strong penetrability of the X-rays, electrons and the like, so that no image of the X-rays and the like is recorded on the proton detector; the proton beam, electron beam, etc. are deflected by the deflection magnet, only the X-rays are unaffected, and the X-ray image is recorded by the X-ray detector. The object with relatively high substance density is sensitive to X-rays, the object with relatively low substance density is sensitive to the object with charged magnetic field distribution, and the object in a large substance density range can be subjected to photogrammetry by combining an X-ray image and a proton image, and electromagnetic field information carried by the object is measured. In addition, since the time pulse width of the X-ray source and the proton source generated by the ultrafast laser is only tens of picoseconds, even if the photographic object is dynamic (i.e., the information such as the object's substance density distribution, electromagnetic field distribution, etc. changes with time), an image at the transient time can be obtained.
The photographing method of the above apparatus will be described in detail below taking photographing of a shock wave propagation process (a typical dynamic process) of a metallic material as an example.
The components in the equipment are placed and installed in the mode, then an ultra-short pulse laser is started to generate a laser beam, the laser and a metal target act to generate X rays, the X rays carry out perspective photographing on the propagation process of the metal material shock wave, and a proton beam photo shown in figure 2 and an X ray photo shown in figure 3 are obtained.
As can be seen from fig. 2 and 3, the X-ray radiation is sensitive to the bottom region of the material shock wave propagation process (corresponding to high mass density) and the proton photography is sensitive to the top region of the shock wave propagation process (corresponding to low mass density), and a combination of the X-ray image and the proton image can take photographic measurements of objects over a wide range of mass densities. And simultaneously, when the electromagnetic field exists, the electromagnetic field information carried by the object can be measured.
The above embodiment is only one of the preferred embodiments of the present invention, and should not be used to limit the scope of the present invention, but all the insubstantial modifications or color changes made in the main design concept and spirit of the present invention are still consistent with the present invention, and all the technical problems to be solved are included in the scope of the present invention.

Claims (2)

1. A dual particle photographing apparatus based on X-rays and protons generated by laser, characterized in that,
comprises an ultrafast laser beam (1);
the reflecting mirror (2) is an arc reflecting mirror, and after the ultrafast laser beam horizontally enters the reflecting mirror, the reflected laser beam is converged at one point;
a metal target (3) located on the side of the mirror where the reflected laser beam is located, the reflected laser beam being incident on the metal target and generating X-rays, proton beams and electron beams by laser plasma interactions;
the positioning block (4) is positioned behind the metal target, namely in the emergent direction of the metal target, so that X-rays and proton beams can conveniently shoot objects after the positioning block is replaced;
the proton detector (5) is positioned behind the positioning block and is used for detecting and recording a proton image shot by the proton beam;
a deflection magnet (6) located behind the proton detector for deflecting the proton beam, the electron beam;
an X-ray detector (7) located behind the deflection magnet for detecting and recording X-ray images taken by X-rays;
the centers of the metal target (3), the positioning block (4), the proton detector (5), the deflection magnet (6) and the X-ray detector (7) are positioned on the same axis;
the method for using the laser-generated X-ray and proton-based dual-particle photographing apparatus comprises the following steps: after a positioning block is replaced by an object, the object is photographed by the double-particle photographing device based on X-rays and protons generated by laser, and ultra-fast laser beams are reflected by a reflecting mirror and then are incident on a metal target, and the X-rays and the proton beams are generated through laser plasma interaction; taking a picture of an object in the flight of X-rays and proton beams, and recording a proton image by a proton detector; the proton beam and the electron beam are deflected by the deflection magnet, and an X-ray image is recorded by the X-ray detector.
2. The laser-generated X-ray and proton based dual particle photographing apparatus according to claim 1, wherein the ultra-fast laser beam (1) refers to an ultra-short time pulse emitted by an ultra-short pulse laser, which refers to a pulse laser having a pulse width of 100ps or less.
CN201810331761.3A 2018-04-13 2018-04-13 Dual particle photographing apparatus and method based on laser-generated X-rays and protons Active CN108490012B (en)

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CN109903878B (en) * 2019-03-04 2024-02-13 中国工程物理研究院激光聚变研究中心 Laser proton framing camera
CN116754431B (en) * 2023-08-18 2023-11-17 中国工程物理研究院激光聚变研究中心 Transient proton fluorescence detection system
CN116773562B (en) * 2023-08-22 2023-11-10 中国工程物理研究院激光聚变研究中心 Double-particle high-space-time resolution backlight photographing method and device based on single-beam laser

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US20170128747A1 (en) * 2010-04-16 2017-05-11 James P. Bennett Proton - x-ray dual/double exposure imaging apparatus and method of use thereof
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US9269524B1 (en) * 2014-01-14 2016-02-23 Sandia Corporation 3D target array for pulsed multi-sourced radiography
CN208155903U (en) * 2018-04-13 2018-11-27 中国工程物理研究院激光聚变研究中心 The sub- camera installation of double grains based on X-ray and proton that laser generates

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